CN105699826A - Microwave device automatic testing system and method - Google Patents
Microwave device automatic testing system and method Download PDFInfo
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- CN105699826A CN105699826A CN201610212597.5A CN201610212597A CN105699826A CN 105699826 A CN105699826 A CN 105699826A CN 201610212597 A CN201610212597 A CN 201610212597A CN 105699826 A CN105699826 A CN 105699826A
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R21/00—Arrangements for measuring electric power or power factor
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R23/00—Arrangements for measuring frequencies; Arrangements for analysing frequency spectra
- G01R23/16—Spectrum analysis; Fourier analysis
Abstract
The invention discloses a microwave device automatic testing system and method and relates to the technical field of electric performance testing devices. The system includes a PC, a switch matrix, a testing instrument and a testing clamp. A plurality of to-be-tested microwave devices are arranged on the testing clamp. Radio input/output interfaces of the to-be-tested microwave devices are respectively connected with radio input/output interfaces in the testing clamp. A testing clamp control signal output terminal of the PC is connected with a control input interface in the testing clamp. The radio input/output interfaces in the testing clamp are connected with radio input/output interfaces of the testing instrument via controlled switches in the switch matrix respectively. A data output interface of the testing instrument is connected with a USB interface of the PC through a USB-to-GPIB wire. A switch control output terminal of the PC is connected with a control input terminal of the switch matrix. According to the invention, through multi-thread data collection and processing, pipelined testing of the microwave devices can be realized, so that testing efficiency is improved substantially.
Description
Technical field
The present invention relates to the test device technique field of electrical property, particularly relate to a kind of microwave component automatic test system and method。
Background technology
The development work of Auto-Test System (ATE) starts from the 1950's, it is therefore an objective to replaces and is accomplished manually the test job become increasingly complex。More perfect ATE just comes out after being combined with electronic computer technology the sixties in 20th century, and along with the outburst in microwave communication market and high speed development。
A set of applicable ATE both can help designer to obtain, collect and analyzing test data, finds out design defect and problem in time, improves design efficiency；Production can be accelerated again and pay speed, reduce human and material resources cost, improve the market competitiveness。
At present, ATE experienced by the differentiation of several generations product, develop to generalization, standardization, networking and intelligentized direction, improve product test efficiency and become focus of the competition, each research institute tries every possible means, but effect is also inconspicuous, just so, domestic and international ATE improves the more and more hotter of the research of product test efficiency。
Summary of the invention
The technical problem to be solved is to provide a kind of microwave component automatic test system and method, carries out data acquisition and processing (DAP) by the multithreading of described system and method, microwave part to be measured can realize flowing water test, substantially increase testing efficiency。
For solving above-mentioned technical problem, the technical solution used in the present invention is: a kind of microwave component automatic test system, it is characterized in that: include PC, switch matrix, test instrunment and test fixture, described test fixture is placed several microwaves part to be measured, the radio frequency input/output interface of microwave part to be measured is connected with the radio frequency input/output interface (1) on test fixture respectively, the test instrunment control output end of described PC turns gpib interface by USB and is connected with the control end of test instrunment, the signal output part of vector network analyzer is connected with the rf input interface on test fixture by switch matrix, radio frequency output interface on described test fixture is connected with the rf inputs mouth of test instrunment respectively through the gate-controlled switch in switch matrix, the data output interface of test instrunment is connected with the data acquisition interface of PC, the on-off control outfan of described PC is connected with the control end of described switch matrix breaker in middle, for controlling the switching of switch。
Further technical scheme is in that: described test fixture includes several test station for placing microwave part to be measured, each described test station is provided with one group of radio frequency input/output interface, and described microwave part to be measured is arranged in described test station by spring and cam。
Further technical scheme is in that: described test instrunment includes audiofrequency spectrometer, energy meter and vector network analyzer。
Accordingly, the invention also discloses a kind of microwave device automatic test approach, it is characterised in that described method comprises the steps:
1) writing data acquisition program and data processor in PC, data acquisition program includes multiple sub-thread-data capture program and main thread data acquisition program；
2) part to be measured for microwave is arranged on test fixture, then according to described Auto-Test System, intrasystem for test device is coupled together；
3) sub-thread-data acquisition is passed under PC, each sub-thread-data acquisition is for by controlling the on off state in switch matrix, realize some test instrunment data acquisition operations to microwave part to be measured, data transmission after collection carries out respective handling to PC, and carries out exporting and showing with certain form；Or hero of biography thread-data acquisition under PC, main thread data acquisition program is for the state by controlling switch matrix breaker in middle, switching microwave part to be measured, make the multiple sub-thread-data capture program in any one microwave part to be measured all ergodic data capture programs in test fixture, data transmission after collection carries out respective handling to PC, and carries out exporting and showing with certain form。
Further technical scheme is in that: described method for test microwave part to be measured operating frequency, spuious, make an uproar mutually, output, noise coefficient, gain, Insertion Loss, standing wave, P-1 and/or isolation。
Further technical scheme is in that: described sub-thread-data capture program includes first, second, and third sub-thread-data capture program, described first sub-thread-data capture program is for realizing audiofrequency spectrometer to microwave part to be measured operating frequency, the spuious and/or data acquisition made an uproar mutually, second sub-thread-data capture program is for realizing the energy meter data acquisition to microwave part output to be measured, and the 3rd sub-thread-data capture program is for realizing the vector network analyzer data acquisition to microwave part noise coefficient to be measured, gain Insertion Loss, standing wave, P-1 and/or isolation。
Adopt and have the beneficial effects that produced by technique scheme: described test system and method carries out data acquisition and processing (DAP) by multithreading, these sub-line journeys can realize microwave part to be measured is carried out data acquisition by its allocated test instrunment simultaneously, the utilization rate of test instrunment is obviously improved, microwave part to be measured can be realized flowing water test, substantially increase testing efficiency。
Accompanying drawing explanation
Fig. 1 is the theory diagram of system of the present invention；
Fig. 2 is the structural representation of test fixture in system of the present invention；
Wherein: 1, radio frequency input/output interface 2, test station。
Detailed description of the invention
Below in conjunction with the accompanying drawing in the embodiment of the present invention, the technical scheme in the embodiment of the present invention is clearly and completely described, it is clear that described embodiment is only a part of embodiment of the present invention, rather than whole embodiments。Based on the embodiment in the present invention, the every other embodiment that those of ordinary skill in the art obtain under not making creative work premise, broadly fall into the scope of protection of the invention。
Elaborate a lot of detail in the following description so that fully understanding the present invention, but the present invention can also adopt other to be different from alternate manner described here to be implemented, those skilled in the art can do similar popularization when without prejudice to intension of the present invention, and therefore the present invention is not by the restriction of following public specific embodiment。
As shown in Figure 1, the invention discloses a kind of microwave component automatic test system, described test system includes PC, switch matrix, test instrunment and test fixture, described test fixture is placed several microwaves part to be measured, described test instrunment can include audiofrequency spectrometer, energy meter and vector network analyzer, can also be the microwave device test instrunment of other kind certainly。As shown in Figure 2, described test fixture includes several for placing the test station 2 of microwave part to be measured and being positioned on station for connecting the radio frequency input/output interface 1 of microwave part to be measured, and described microwave part to be measured is arranged in described test station by spring and cam。
The radio frequency input/output interface of microwave part to be measured is connected with the radio frequency input/output interface 1 on test fixture respectively, the test signal control output end of described PC turns gpib interface and frequency spectrum respectively through USB, energy meter, the control end of the microwave measuring instruments such as vector network analyzer connects, the signal output part of vector network analyzer is connected with the rf input interface on test fixture, radio frequency output interface on described test fixture is connected with the rf inputs mouth of test instrunment respectively through the gate-controlled switch in switch matrix, the data output interface of test instrunment is connected with the data acquisition interface of PC respectively, the on-off control outfan of described PC is connected with the control end of described switch matrix breaker in middle, for controlling the switching of switch。
Accordingly, the invention also discloses a kind of microwave device automatic test approach, described method comprises the steps:
1) writing data acquisition program and data processor in PC, data acquisition program includes multiple sub-thread-data capture program and main thread data acquisition program；
2) part to be measured for microwave is arranged on test fixture, then according to described Auto-Test System, intrasystem for test device is coupled together；
3) sub-thread-data acquisition is passed under PC, each sub-thread-data acquisition is for by controlling the on off state in switch matrix, realize some test instrunment data acquisition operations to microwave part to be measured, data transmission after collection carries out respective handling to PC, and carries out exporting and showing with certain form；Or hero of biography thread-data acquisition under PC, main thread data acquisition program is for the state by controlling switch matrix breaker in middle, switching microwave part to be measured, make the multiple sub-thread-data capture program in any one microwave part to be measured all ergodic data capture programs in test fixture, data transmission after collection carries out respective handling to PC, and carries out exporting and showing with certain form。
Concrete, described sub-thread-data capture program can include first, second, and third sub-thread-data capture program, described first sub-thread-data capture program is for realizing audiofrequency spectrometer to microwave part to be measured operating frequency, the spuious and/or data acquisition made an uproar mutually, second sub-thread-data capture program is for realizing the energy meter data acquisition to microwave part output to be measured, and the 3rd sub-thread-data capture program is for realizing the vector network analyzer data acquisition to microwave part noise coefficient to be measured, gain Insertion Loss, standing wave, P-1 and/or isolation。
Described test system and method carries out data acquisition and processing (DAP) by multithreading, these sub-line journeys can realize microwave part to be measured is carried out data acquisition by its allocated test instrunment simultaneously, the utilization rate of test instrunment is obviously improved, microwave part to be measured can be realized flowing water test, substantially increase testing efficiency。
Claims (6)
1. a microwave component automatic test system, it is characterized in that: include PC, switch matrix, test instrunment and test fixture, described test fixture is placed several microwaves part to be measured, the radio frequency input/output interface of microwave part to be measured is connected with the radio frequency input/output interface (1) on test fixture respectively, the test instrunment control output end of described PC turns gpib interface by USB and is connected with the control end of test instrunment, the signal output part of vector network analyzer is connected with the rf input interface on test fixture by switch matrix, radio frequency output interface on described test fixture is connected with the rf inputs mouth of test instrunment respectively through the gate-controlled switch in switch matrix, the data output interface of test instrunment is connected with the data acquisition interface of PC, the on-off control outfan of described PC is connected with the control end of described switch matrix breaker in middle, for controlling the switching of switch。
2. microwave component automatic test system as claimed in claim 1, it is characterized in that: described test fixture includes several test station (2) for placing microwave part to be measured, each described test station is provided with one group of radio frequency input/output interface (1), and described microwave part to be measured is arranged in described test station by spring and cam。
3. microwave component automatic test system as claimed in claim 1, it is characterised in that: described test instrunment includes audiofrequency spectrometer, energy meter and vector network analyzer。
4. a microwave device automatic test approach, it is characterised in that described method comprises the steps:
1) writing data acquisition program and data processor in PC, data acquisition program includes multiple sub-thread-data capture program and main thread data acquisition program；
2) part to be measured for microwave is arranged on test fixture, then according to Auto-Test System as described in any one in claim 1-3, intrasystem for test device is coupled together；
3) sub-thread-data acquisition is passed under PC, each sub-thread-data acquisition is for by controlling the on off state in switch matrix, realize some test instrunment data acquisition operations to microwave part to be measured, data transmission after collection carries out respective handling to PC, and carries out exporting and showing with certain form；Or hero of biography thread-data acquisition under PC, main thread data acquisition program is for the state by controlling switch matrix breaker in middle, switching microwave part to be measured, make the multiple sub-thread-data capture program in any one microwave part to be measured all ergodic data capture programs in test fixture, data transmission after collection carries out respective handling to PC, and carries out exporting and showing with certain form。
5. microwave device automatic test approach as claimed in claim 4, it is characterised in that: described method for test microwave part to be measured operating frequency, spuious, make an uproar mutually, output, noise coefficient, gain, Insertion Loss, standing wave, P-1 and/or isolation。
6. microwave device automatic test approach as claimed in claim 4, it is characterized in that: described sub-thread-data capture program includes first, second and the 3rd sub-thread-data capture program, described first sub-thread-data capture program is used for realizing audiofrequency spectrometer to microwave part operating frequency to be measured, data acquisition that is spuious and/or that make an uproar mutually, second sub-thread-data capture program is for realizing the energy meter data acquisition to microwave part output to be measured, 3rd sub-thread-data capture program is used for realizing vector network analyzer to microwave part noise coefficient to be measured, gain Insertion Loss, standing wave, the data acquisition of P-1 and/or isolation。
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| CN106445758A (en) * | 2016-11-03 | 2017-02-22 | 南京东恒通信科技有限公司 | System and method for automatically testing microwave products |
| CN106646093A (en) * | 2016-12-28 | 2017-05-10 | 中核核电运行管理有限公司 | Digital quantity input and output test device of digital computer control system |
| CN106771554A (en) * | 2016-12-13 | 2017-05-31 | 深圳市威通科技有限公司 | Multiport microwave device test system and method |
| CN106771687A (en) * | 2016-12-22 | 2017-05-31 | 华讯方舟科技（湖北）有限公司 | A kind of device and method for testing the noise after microwave product assembling CAP |
| CN106885930A (en) * | 2017-02-22 | 2017-06-23 | 郑州云海信息技术有限公司 | Based on the Switching Power Supply guard method of Switching Power Supply automatic test platform and system |
| CN107102200A (en) * | 2017-04-12 | 2017-08-29 | 成都千牛信息技术有限公司 | A kind of multi-magnetron microwave heating equipment Performance Test System and method of testing |
| CN107222270A (en) * | 2017-05-03 | 2017-09-29 | 京信通信技术(广州)有限公司 | Method of testing, test system and the test equipment of communication equipment |
| CN107422199A (en) * | 2017-04-28 | 2017-12-01 | 中国电子科技集团公司第二十九研究所 | A kind of Multi-channel microwave component test system |
| CN107733539A (en) * | 2017-08-21 | 2018-02-23 | 西安空间无线电技术研究所 | A kind of spaceborne multichannel microwave receiver frequency converter test system |
| CN107966625A (en) * | 2017-11-24 | 2018-04-27 | 英业达科技有限公司 | Measurement system and method for measurement |
| CN108120891A (en) * | 2017-12-27 | 2018-06-05 | 成都芯通软件有限公司 | A kind of HFC amplifier reliabilities Auto-Test System |
| CN108470232A (en) * | 2018-01-25 | 2018-08-31 | 南京第五十五所技术开发有限公司 | The automatic detecting and analysing system of microwave components based on flow and method |
| CN108802652A (en) * | 2018-06-08 | 2018-11-13 | 中国电子科技集团公司第四十研究所 | A kind of vector network analyzer internal module test system and test method |
| CN108957282A (en) * | 2018-10-09 | 2018-12-07 | 北京无线电计量测试研究所 | A kind of crystal oscillator electric performance test system |
| CN109885434A (en) * | 2019-01-25 | 2019-06-14 | 华北水利水电大学 | A kind of integrated test system and method for FPGA high speed SerDes interface |
| CN110244145A (en) * | 2019-06-12 | 2019-09-17 | 武汉海创电子股份有限公司 | Digital bounce frequency filter test macro |
| CN110609223A (en) * | 2019-06-25 | 2019-12-24 | 眸芯科技（上海）有限公司 | Automatic test system and method for embedded system |
| CN110824283A (en) * | 2019-11-25 | 2020-02-21 | 伟创力电子技术(苏州)有限公司 | Product testing system based on millimeter wave radio frequency unit |
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| CN106445758A (en) * | 2016-11-03 | 2017-02-22 | 南京东恒通信科技有限公司 | System and method for automatically testing microwave products |
| CN106771554A (en) * | 2016-12-13 | 2017-05-31 | 深圳市威通科技有限公司 | Multiport microwave device test system and method |
| CN106771687A (en) * | 2016-12-22 | 2017-05-31 | 华讯方舟科技（湖北）有限公司 | A kind of device and method for testing the noise after microwave product assembling CAP |
| CN106771687B (en) * | 2016-12-22 | 2023-11-24 | 深圳市华讯方舟卫星产业科技有限公司 | Device and method for testing noise of microwave product after CAP assembly |
| CN106646093A (en) * | 2016-12-28 | 2017-05-10 | 中核核电运行管理有限公司 | Digital quantity input and output test device of digital computer control system |
| CN106885930A (en) * | 2017-02-22 | 2017-06-23 | 郑州云海信息技术有限公司 | Based on the Switching Power Supply guard method of Switching Power Supply automatic test platform and system |
| CN107102200A (en) * | 2017-04-12 | 2017-08-29 | 成都千牛信息技术有限公司 | A kind of multi-magnetron microwave heating equipment Performance Test System and method of testing |
| CN107422199A (en) * | 2017-04-28 | 2017-12-01 | 中国电子科技集团公司第二十九研究所 | A kind of Multi-channel microwave component test system |
| CN107222270B (en) * | 2017-05-03 | 2021-03-30 | 京信通信系统（中国）有限公司 | Test method, test system and test equipment of communication equipment |
| CN107222270A (en) * | 2017-05-03 | 2017-09-29 | 京信通信技术(广州)有限公司 | Method of testing, test system and the test equipment of communication equipment |
| CN107733539A (en) * | 2017-08-21 | 2018-02-23 | 西安空间无线电技术研究所 | A kind of spaceborne multichannel microwave receiver frequency converter test system |
| CN107733539B (en) * | 2017-08-21 | 2021-10-01 | 西安空间无线电技术研究所 | Testing method and system for satellite-borne multi-path microwave receiver/frequency converter |
| CN107966625A (en) * | 2017-11-24 | 2018-04-27 | 英业达科技有限公司 | Measurement system and method for measurement |
| CN108120891A (en) * | 2017-12-27 | 2018-06-05 | 成都芯通软件有限公司 | A kind of HFC amplifier reliabilities Auto-Test System |
| CN108470232A (en) * | 2018-01-25 | 2018-08-31 | 南京第五十五所技术开发有限公司 | The automatic detecting and analysing system of microwave components based on flow and method |
| CN108802652A (en) * | 2018-06-08 | 2018-11-13 | 中国电子科技集团公司第四十研究所 | A kind of vector network analyzer internal module test system and test method |
| CN108957282A (en) * | 2018-10-09 | 2018-12-07 | 北京无线电计量测试研究所 | A kind of crystal oscillator electric performance test system |
| CN108957282B (en) * | 2018-10-09 | 2021-09-10 | 北京无线电计量测试研究所 | Crystal oscillator electrical property test system |
| CN109885434A (en) * | 2019-01-25 | 2019-06-14 | 华北水利水电大学 | A kind of integrated test system and method for FPGA high speed SerDes interface |
| CN109885434B (en) * | 2019-01-25 | 2023-01-31 | 华北水利水电大学 | Integrated test system and method for FPGA high-speed SerDes interface |
| CN110244145A (en) * | 2019-06-12 | 2019-09-17 | 武汉海创电子股份有限公司 | Digital bounce frequency filter test macro |
| CN110609223A (en) * | 2019-06-25 | 2019-12-24 | 眸芯科技（上海）有限公司 | Automatic test system and method for embedded system |
| CN110988512A (en) * | 2019-10-24 | 2020-04-10 | 中国电子产品可靠性与环境试验研究所（（工业和信息化部电子第五研究所）（中国赛宝实验室）） | Microwave device testing system and microwave device testing method |
| CN110824279A (en) * | 2019-11-15 | 2020-02-21 | 上海思源弘瑞自动化有限公司 | Automatic testing system and method for relay protection device |
| CN110824283A (en) * | 2019-11-25 | 2020-02-21 | 伟创力电子技术(苏州)有限公司 | Product testing system based on millimeter wave radio frequency unit |
| CN110988548A (en) * | 2019-12-16 | 2020-04-10 | 航天恒星科技有限公司 | Test method and platform of microwave frequency converter |
| CN110988548B (en) * | 2019-12-16 | 2023-06-06 | 航天恒星科技有限公司 | Test method and platform for microwave frequency converter |
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| CN112305402A (en) * | 2020-02-27 | 2021-02-02 | 青岛众鑫科技有限公司 | Controller special for testing hybrid integrated circuit product |
| CN112305402B (en) * | 2020-02-27 | 2022-12-27 | 青岛众鑫科技有限公司 | Controller special for testing hybrid integrated circuit product |
| CN111487516A (en) * | 2020-04-24 | 2020-08-04 | 中国科学院微电子研究所 | Semiconductor device testing device, method and system |
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| CN117517848A (en) * | 2024-01-05 | 2024-02-06 | 成都威频通讯技术有限公司 | Automatic testing system for microwave assembly |
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Application publication date: 20160622 |