CN106771687B - Device and method for testing noise of microwave product after CAP assembly - Google Patents
Device and method for testing noise of microwave product after CAP assembly Download PDFInfo
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- CN106771687B CN106771687B CN201611201934.7A CN201611201934A CN106771687B CN 106771687 B CN106771687 B CN 106771687B CN 201611201934 A CN201611201934 A CN 201611201934A CN 106771687 B CN106771687 B CN 106771687B
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- 238000012360 testing method Methods 0.000 title claims abstract description 87
- 238000000034 method Methods 0.000 title claims abstract description 21
- 238000004088 simulation Methods 0.000 claims description 29
- 230000010355 oscillation Effects 0.000 claims description 6
- 238000001228 spectrum Methods 0.000 claims description 3
- 230000003068 static effect Effects 0.000 claims description 3
- 230000001105 regulatory effect Effects 0.000 claims 1
- 230000035945 sensitivity Effects 0.000 abstract description 5
- 238000012827 research and development Methods 0.000 abstract description 4
- 239000000047 product Substances 0.000 description 67
- 238000004164 analytical calibration Methods 0.000 description 1
- 238000004458 analytical method Methods 0.000 description 1
- 230000009286 beneficial effect Effects 0.000 description 1
- 239000003990 capacitor Substances 0.000 description 1
- 238000010586 diagram Methods 0.000 description 1
- 238000002955 isolation Methods 0.000 description 1
- 239000002184 metal Substances 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- 239000011265 semifinished product Substances 0.000 description 1
Classifications
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R29/00—Arrangements for measuring or indicating electric quantities not covered by groups G01R19/00 - G01R27/00
- G01R29/26—Measuring noise figure; Measuring signal-to-noise ratio
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/001—Measuring interference from external sources to, or emission from, the device under test, e.g. EMC, EMI, EMP or ESD testing
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- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Electromagnetism (AREA)
- Testing Electric Properties And Detecting Electric Faults (AREA)
Abstract
The invention is suitable for the technical field of microwaves, and provides equipment and a method for testing noise after a microwave product is assembled with a CAP. According to the invention, the noise coefficient value of the microwave product to be tested when the CAP is assembled is tested, so that data reference is provided for the microwave product to test the CAP to signal interference and attenuation, the sensitivity of the electrical characteristics of the microwave product is improved, and meanwhile, the comprehensive test is provided for the research and development of the microwave product and is improved.
Description
Technical Field
The invention belongs to the technical field of microwaves, and particularly relates to equipment and a method for testing noise of microwave products after CAP (capacitor-inductor-capacitor) assembly.
Background
At present, in the microwave industry, a normal microwave product is tested by a direct connection noise analysis test system in a semi-finished product stage, the scheme is limited to bare metal test, but after CAP (dustproof/waterproof cover) is installed, interference and attenuation of satellite signals input by the product are not tested, and because the microwave product finally works under the condition of CAP assembly, the microwave product with the CAP needs to be tested, and frequency closure and attenuation of the signals are verified.
Disclosure of Invention
The invention aims to provide equipment for testing noise of a microwave product after CAP is assembled, and aims to solve the technical problem that the noise test is not carried out on the microwave product with the CAP in the prior art.
The invention is realized in the following way: the device comprises a testing jig, an inherent simulation device, a noise source, a noise analyzer and a power supply, wherein the testing jig is connected with a microwave product to be tested and is used for matching with a microwave product guided wave port to be tested after the CAP is assembled, the inherent simulation device is connected with the microwave product to be tested and is used for providing full-band working switching voltage and switching working frequency for the microwave product to be tested, the noise source is connected with the testing jig, the noise analyzer is respectively connected with the inherent simulation device and the noise source, and the power supply is connected with the inherent simulation device.
Further, the device also comprises a test bracket for fixing the microwave product to be tested, the noise source and the test fixture.
Further, the test support is L-shaped.
Further, the intermediate frequency signal output by the noise analyzer is 10M-3GHz.
Further, the power supply is a direct current power supply.
Further, the power supply provides a direct-current stable voltage of 0V-30V for the inherent simulation device.
Further, the microwave product to be tested is in seamless joint with the test jig.
The invention also provides a method for testing the noise of the microwave product after CAP assembly, comprising the following steps:
A. when testing a low frequency band, the tested frequency range is 950MHz-1950MHz, connecting a microwave product to be tested with an inherent simulation device, fixing the inherent simulation device at the low frequency band, then switching 13/18V, and simultaneously rotating the microwave product to be tested by 90 degrees; when testing a high frequency band, the tested frequency range is 1100MHz-2150MHz, connecting the microwave product to be tested with an inherent simulation device, fixing the inherent simulation device to the high frequency band, then switching 13/18V, and simultaneously rotating the microwave product to be tested by 90 degrees;
B. adjusting the test frequency point of the noise analyzer to be static to the frequency point of the required test signal, and reading the selected frequency point on the noise analyzer;
C. and after the test is finished, comparing the test data with the standard specification.
Further, the method also includes debugging the power supply to between 20V-22V prior to testing.
Further, the method further comprises setting up the noise analyzer prior to testing: firstly, inputting the frequency of an intermediate frequency signal, then inputting the local oscillation frequency of a microwave product to be detected, then inputting the characteristic specification parameters of the microwave product to be detected, and finally inputting the noise value of a noise source to calibrate the instrument.
The device for testing the noise of the microwave product after the CAP is assembled has the following beneficial effects: the method provides data reference for the microwave product test CAP to signal interference and attenuation by testing the noise coefficient value of the microwave product to be tested when the CAP is assembled, improves the sensitivity of the electrical characteristics of the microwave product, and simultaneously provides omnibearing test for the research and development of the microwave product and improves the test.
Drawings
In order to more clearly illustrate the technical solutions of the embodiments of the present invention, the drawings that are needed in the embodiments will be briefly described below, and it is obvious that the drawings in the following description are only some embodiments of the present invention, and other drawings may be obtained according to these drawings without inventive effort for a person skilled in the art.
Fig. 1 is a schematic structural diagram of an apparatus for testing noise of microwave products after CAP assembly according to an embodiment of the present invention.
Detailed Description
The present invention will be described in further detail with reference to the drawings and examples, in order to make the objects, technical solutions and advantages of the present invention more apparent. It should be understood that the specific embodiments described herein are for purposes of illustration only and are not intended to limit the scope of the invention.
It will be understood that when an element is referred to as being "mounted" or "disposed" on another element, it can be directly or indirectly on the other element. When an element is referred to as being "connected to" another element, it can be directly or indirectly connected to the other element.
It should be noted that, in the embodiments of the present invention, terms such as left, right, up, and down are merely relative concepts or references to normal use states of the product, and should not be construed as limiting.
As shown in fig. 1, the device for testing noise after assembling CAP of microwave product provided by the embodiment of the invention provides data reference for interference and attenuation of signals when assembling CAP test of microwave product, and improves sensitivity of electric characteristics of microwave product. Specifically, the apparatus includes a test jig 2, an inherent simulation device 3, a noise source 4, a noise analyzer 5, and a power supply 6. The testing jig 2 is connected with the microwave product 1 to be tested and is used for matching after the CAP is assembled with the wave guide port of the microwave product 1 to be tested; the inherent simulation device 3 is connected with the microwave product 1 to be tested and is used for providing full-band working switching voltage and switching working frequency for the microwave product 1 to be tested; the noise source 4 is connected with the test fixture 2, the noise source 4 is a device capable of generating random continuous frequency spectrum, and has certain output noise power and uniform power spectrum density in a specified frequency band; the noise analyzer 5 is connected with the inherent analog device 3 and the noise source 4 respectively; the power supply 6 is connected to the natural analog device 3 and is used to supply power to the natural analog device 3. In the embodiment of the present invention, the test fixture 2, the inherent simulation device 3, the noise source 4 and the noise analyzer 5 may be all the test fixtures, the inherent simulation devices, the noise source and the noise analyzer commonly used in the prior art. In addition, the connection between the test fixture 2 and the microwave product 1 to be tested, between the inherent simulation device 3 and the microwave product 1 to be tested, between the noise source 4 and the test fixture 2, between the noise analyzer 5 and the inherent simulation device 3 and the noise source 4, and between the power supply 6 and the inherent simulation device 3 may be electrical connection.
According to the embodiment of the invention, the noise coefficient value of the microwave product 1 to be tested is tested when the CAP is assembled, so that data reference is provided for the CAP to be tested on signal interference and attenuation, the sensitivity of the electrical characteristics of the microwave product is improved, and meanwhile, the comprehensive test is provided for the research and development of the microwave product and is improved.
Further, the device for testing the noise of the microwave product after the CAP is assembled according to the embodiment of the present invention further includes a test stand 7, where the test stand 7 is used to fix the microwave product 1 to be tested, the noise source 4 and the test fixture 2, so that the microwave product 1 to be tested does not influence the test result due to shaking during the test, and meanwhile, the microwave product 1 to be tested can be tested in isolation. Preferably, in one embodiment of the present invention, the test stand 7 is L-shaped so as to fix the microwave product 1 to be tested, the noise source 4 and the test fixture 2. Further preferably, the microwave product 1 to be tested, the noise source 4 and the test fixture 2 are all detachably connected to the test bracket 7, so that the test fixture 2 with various different specifications can be assembled according to actual needs to meet test requirements of different microwave products.
Preferably, the noise analyzer 5 used in the embodiment of the present invention outputs a 10M-3GHz intermediate frequency signal, so as to test the noise of the microwave product 1 to be tested.
Preferably, the power supply 6 used in the embodiment of the present invention is a dc power supply. Further preferably, the power supply 6 used in the embodiment of the present invention provides a dc stable voltage of 0V to 30V for the inherent simulation device 3, so as to test noise of the microwave product 1 to be tested.
Preferably, the microwave product 1 to be tested is in seamless joint with the test fixture 2, so that the noise of the microwave product 1 to be tested can be conveniently tested.
The embodiment of the invention also provides a method for testing the noise of the microwave product after the CAP is assembled, which comprises the following steps:
A. when testing a low frequency band, the tested frequency range is 950MHz-1950MHz, connecting the microwave product 1 to be tested with an inherent simulation device 3, fixing the inherent simulation device 3 in the low frequency band, then switching 13/18V, and rotating the microwave product 1 to be tested by 90 degrees while switching 13/18V; when testing a high frequency band, the tested frequency range is 1100MHz-2150MHz, connecting the microwave product 1 to be tested with an inherent simulation device 3, fixing the inherent simulation device 3 in the high frequency band, then switching 13/18V, and rotating the microwave product 1 to be tested by 90 degrees while switching 13/18V;
B. adjusting the test frequency point of the noise analyzer 5 to be static to the frequency point of the required test signal, and reading the selected frequency point on the noise analyzer 5;
C. and after the test is finished, comparing the test data with the standard specification.
Further, the method for testing the noise of the microwave product after CAP assembly according to the embodiment of the present invention further comprises the step of adjusting the power supply 6 to 20V-22V before testing, wherein the voltage provides the pulse voltage for the inherent simulation device 3 and simulates the working voltage of the product.
Further, the method for testing the noise of the microwave product after CAP assembly according to the embodiment of the present invention further includes setting the noise analyzer 5 before the test. Specifically, the settings of the noise analyzer 5 include the following: firstly, inputting an intermediate frequency signal frequency IF, wherein the frequency point is obtained from any frequency point RF set by a signal frequency generator and the local oscillation frequency LO of a microwave product 1 to be detected; then inputting local oscillation frequency LO of a microwave product 1 to be detected, wherein the local oscillation frequency of a normal microwave product in a low frequency band is 9.75GHZ, and the local oscillation frequency in a high frequency band is 10.6GHZ; inputting characteristic specification parameters of the microwave product 1 to be detected; finally, the noise value of the noise source 4 is inputted to perform the instrument calibration.
In summary, according to the embodiment of the invention, the noise coefficient value of the microwave product 1 to be tested when the CAP is assembled is tested, so that the data reference is provided for the microwave product to test the CAP to signal interference and attenuation, the sensitivity of the electrical characteristics of the microwave product is improved, and meanwhile, the omnibearing test is provided for the research and development of the microwave product and is improved.
The foregoing description of the preferred embodiments of the invention is not intended to be limiting, but rather is intended to cover all modifications, equivalents, or alternatives falling within the spirit and principles of the invention.
Claims (9)
1. A method for testing noise after assembling a CAP by a test device, the test device comprising a test fixture connected with a microwave product to be tested and used for matching with a microwave product to be tested after assembling the CAP by a wave guide port of the microwave product to be tested, an inherent simulation device connected with the microwave product to be tested and used for providing full-band operation switching voltage and switching operation frequency for the microwave product to be tested, a noise source connected with the test fixture, a noise analyzer respectively connected with the inherent simulation device and the noise source, and a power supply connected with the inherent simulation device, wherein the noise source is a device capable of generating random continuous frequency spectrum, the method is characterized by comprising the following steps:
A. when testing a low frequency band, the tested frequency range is 950MHz-1950MHz, connecting a microwave product to be tested with an inherent simulation device, fixing the inherent simulation device at the low frequency band, then switching 13/18V, and simultaneously rotating the microwave product to be tested by 90 degrees; when testing a high frequency band, the tested frequency range is 1100MHz-2150MHz, connecting the microwave product to be tested with an inherent simulation device, fixing the inherent simulation device to the high frequency band, then switching 13/18V, and simultaneously rotating the microwave product to be tested by 90 degrees;
B. adjusting the test frequency point of the noise analyzer to be static to the frequency point of the required test signal, and reading the selected frequency point on the noise analyzer;
C. and after the test is finished, comparing the test data with the standard specification.
2. The method of claim 1, further comprising commissioning the power supply to between 20V-22V prior to testing.
3. The method of claim 1, further comprising setting up the noise analyzer prior to testing: firstly, inputting the frequency of an intermediate frequency signal, then inputting the local oscillation frequency of a microwave product to be detected, then inputting the characteristic specification parameters of the microwave product to be detected, and finally inputting the noise value of a noise source to calibrate the instrument.
4. The method of claim 1, wherein the apparatus further comprises a test rack for holding the microwave product to be tested, a noise source, and a test fixture.
5. The method of claim 4, wherein the test rack is L-shaped.
6. The method of claim 1, wherein the intermediate frequency signal output by the noise analyzer is 10M-3GHz.
7. The method of claim 1, wherein the power supply is a dc power supply.
8. The method of claim 1, wherein the power supply provides a dc regulated voltage of 0V-30V to the intrinsic analog device.
9. The method of claim 1, wherein the microwave product to be tested is seamlessly docked with the test fixture.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
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| CN201611201934.7A CN106771687B (en) | 2016-12-22 | 2016-12-22 | Device and method for testing noise of microwave product after CAP assembly |
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| CN201611201934.7A CN106771687B (en) | 2016-12-22 | 2016-12-22 | Device and method for testing noise of microwave product after CAP assembly |
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| CN106771687B true CN106771687B (en) | 2023-11-24 |
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| CN108732433B (en) * | 2018-07-24 | 2024-05-28 | 深圳市华讯方舟光电技术有限公司 | Noise value detection system of microwave frequency converter |
Citations (9)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US4742561A (en) * | 1985-09-10 | 1988-05-03 | Home Box Office, Inc. | Apparatus for generating signals useful for testing the sensitivity of microwave receiving equipment |
| CN101196545A (en) * | 2006-12-07 | 2008-06-11 | 中国科学院半导体研究所 | Device for measuring dielectric characteristics of dielectric material |
| CN101738604A (en) * | 2009-12-18 | 2010-06-16 | 中国科学院空间科学与应用研究中心 | Automatic test system for millimeter wave receiver |
| CN102621470A (en) * | 2012-03-31 | 2012-08-01 | 中国电子科技集团公司第十三研究所 | Method for testing performance of semiconductor microwave power chip packaging shell |
| CN103701481A (en) * | 2013-12-03 | 2014-04-02 | 波达通信设备（广州）有限公司 | Receiving level calibrating method for digital microwave transceiver |
| CN105510648A (en) * | 2016-01-14 | 2016-04-20 | 中国电子科技集团公司第十三研究所 | High-isolation microwave test fixture for ultrahigh-power GaN microwave devices |
| CN105548771A (en) * | 2016-01-19 | 2016-05-04 | 深圳振华富电子有限公司 | LTCC filter testing board and testing clamping tool |
| CN105699826A (en) * | 2016-04-06 | 2016-06-22 | 中国电子科技集团公司第十三研究所 | Microwave device automatic testing system and method |
| CN206431205U (en) * | 2016-12-22 | 2017-08-22 | 华讯方舟科技（湖北）有限公司 | A kind of equipment for the noise for being used to test after microwave product assembling CAP |
Family Cites Families (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US20060223440A1 (en) * | 2005-04-01 | 2006-10-05 | David Stockton | Low frequency noise source and method of calibration thereof |
-
2016
- 2016-12-22 CN CN201611201934.7A patent/CN106771687B/en active Active
Patent Citations (9)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US4742561A (en) * | 1985-09-10 | 1988-05-03 | Home Box Office, Inc. | Apparatus for generating signals useful for testing the sensitivity of microwave receiving equipment |
| CN101196545A (en) * | 2006-12-07 | 2008-06-11 | 中国科学院半导体研究所 | Device for measuring dielectric characteristics of dielectric material |
| CN101738604A (en) * | 2009-12-18 | 2010-06-16 | 中国科学院空间科学与应用研究中心 | Automatic test system for millimeter wave receiver |
| CN102621470A (en) * | 2012-03-31 | 2012-08-01 | 中国电子科技集团公司第十三研究所 | Method for testing performance of semiconductor microwave power chip packaging shell |
| CN103701481A (en) * | 2013-12-03 | 2014-04-02 | 波达通信设备（广州）有限公司 | Receiving level calibrating method for digital microwave transceiver |
| CN105510648A (en) * | 2016-01-14 | 2016-04-20 | 中国电子科技集团公司第十三研究所 | High-isolation microwave test fixture for ultrahigh-power GaN microwave devices |
| CN105548771A (en) * | 2016-01-19 | 2016-05-04 | 深圳振华富电子有限公司 | LTCC filter testing board and testing clamping tool |
| CN105699826A (en) * | 2016-04-06 | 2016-06-22 | 中国电子科技集团公司第十三研究所 | Microwave device automatic testing system and method |
| CN206431205U (en) * | 2016-12-22 | 2017-08-22 | 华讯方舟科技（湖北）有限公司 | A kind of equipment for the noise for being used to test after microwave product assembling CAP |
Non-Patent Citations (2)
| Title |
|---|
| GaN HEMT 器件微波噪声模型参数提取;李静强 等;《半导体器件》;第40卷(第7期);第507-511页 * |
| Phase noise analysis of a tuned-input/tuned-output oscillator based on a GaN HEMT device;M. Hörberg;IEEE;第1118-1121页 * |
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