CN106896318A - Direct Digital Frequency Synthesizers circuit dynamic parameter testing system and method - Google Patents
Direct Digital Frequency Synthesizers circuit dynamic parameter testing system and method Download PDFInfo
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- CN106896318A CN106896318A CN201710186346.9A CN201710186346A CN106896318A CN 106896318 A CN106896318 A CN 106896318A CN 201710186346 A CN201710186346 A CN 201710186346A CN 106896318 A CN106896318 A CN 106896318A
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/317—Testing of digital circuits
- G01R31/31706—Testing of digital circuits involving differential digital signals, e.g. testing differential signal circuits, using differential signals for testing
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/317—Testing of digital circuits
- G01R31/3181—Functional testing
- G01R31/319—Tester hardware, i.e. output processing circuits
- G01R31/31903—Tester hardware, i.e. output processing circuits tester configuration
- G01R31/31905—Interface with the device under test [DUT], e.g. arrangements between the test head and the DUT, mechanical aspects, fixture
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- General Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
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Abstract
The invention discloses a kind of DDS circuit dynamic parameter testing system and method, the method includes：Test system is input into test vector corresponding with DDS circuit function to the DUT board for being provided with DDS circuit to be tested, and controls the power supply of phase noise cancellation signal generator high and low noise to generate clock signal and the voltage that DUT board needs；DUT board exports output signal corresponding with test vector under control of the clock signal, spectrum analyzer and phase noise tester produce corresponding data after the signal is received and return to test system, test system is compared using sampled data and the number range for pre-setting, and determines whether DDS circuit is qualified.The present invention successfully carries out automatic test to DDS circuit, solves test problem during traditional manual test DDS circuit dynamic parameter, substantially increases the testing efficiency of DDS circuit dynamic parameter, has saved testing cost.
Description
Technical field
The present invention relates to Direct Digital Frequency Synthesizers（Chinese：Direct digital synthesizer, referred to as：
DDS）Circuit dynamic parametric test field, more particularly to a kind of DDS circuit dynamic parametric test method and system.
Background technology
With the raising of Digital Signal Processing and digital circuit operating rate, and required for system sensitivity etc.
Continuous improvement, at a high speed, the index of high-precision DDS be proposed requirement very high.Especially in radar, communication, electronics
The electronic systems such as confrontation need to realize high performance index, when DDS gradually embodies the relative bandwidth that it has very wide, frequency conversion
Between extremely short, frequency resolution is very high, output phase is continuous, exportable wideband orthogonal signal, programmable and totally digitilized structure just
In the superior function such as integrated.
But the test of DDS circuit dynamic parameter but turns into a problem, current test system at present（Including state granddad
The evaluation board for providing is provided）Can only all meet manually to test, manual test had not only expended time but also labor intensive, and manually surveyed
Amount is judged it is difficult to ensure that circuit uniformity, inefficiency, it is difficult to meet the demand of DDS circuit batch testing, therefore very urgent
A kind of effective automatization test system and method is needed to instruct the test of DDS circuit dynamic parameter.
The content of the invention
During in correlation technique because manually testing DDS circuit dynamic parameter, it is difficult to ensure that circuit is consistent
Property, so the demand for being difficult to meet DDS circuit batch testing problem, surveyed the invention provides a kind of DDS circuit dynamic parameter
Test system and method.
What the present invention was achieved through the following technical solutions：
In a first aspect, the invention provides a kind of DDS circuit dynamic parameter testing system, DDS circuit dynamic parameter testing system
Including test system, DUT（Full name：Device under test, Chinese：Equipment in test）Plate, mutually hot-tempered signal source high, low noise
Acoustic-electric source, spectrum analyzer and phase noise tester, wherein：Test system is connected by SMA wire and Pin68 lines with DUT board
Connect, test system is also connected with spectrum analyzer and phase noise tester respectively by SMA wire；DUT board by SMA wire with
Mutually hot-tempered signal source connection high, DUT board is also connected by electric power connection line with low noise power supply；Test system passes through GPIB (full name：
General-Purpose Interface Bus, Chinese：General purpose interface bus) respectively with the mutually hot-tempered signal source of height, low noise acoustic-electric
The connection of source, spectrum analyzer and phase noise tester；Test system is electric with the DDS circuit to be tested of setting in DUT board
Property connection.
Optionally, DUT board also includes the interface board, test private jack, the first transformer, second that are connected with test system
The configuration circuit of transformer and DUT board, is test for DDS circuit and is placed on test private jack, and electric with interface board
Property connection, DDS circuit is electrically connected with the first transformer and the second transformer respectively, and the first transformer electrically connects with interface board
Connect.
Optionally, test system includes digital board, High Frequency Analog Switch card, main frame and display screen, wherein：Digiboard
Card is electrically connected with the interface board in DUT, and the second transformer is electrically connected with High Frequency Analog Switch card.
Optionally, test system can be NI（Full name：national instrument）System.
Second aspect, present invention also offers a kind of DDS circuit dynamic parametric test method, the method is applied to first party
Face or the optional technical scheme of first aspect are provided in DDS circuit dynamic parameter testing system, and the method includes：
To DUT board input test vector, test vector is the test function to DDS circuit to be tested in DUT board to test system
The signal that emulation is obtained；
Test system control mutually hot-tempered signal source high produces the clock signal that DUT board needs, and control low noise power supply produces DUT board institute
The voltage for needing；
DUT board works in the presence of voltage and clock signal, to test system output output letter corresponding with test vector
Number；
Test system is switched over by High Frequency Analog Switch to output signal, and the signal after switching is separately input into frequency spectrum point
Analyzer and phase noise tester；
Spectrum analyzer and phase noise tester are adopted to the respective signal for producing respectively after receiving the signal after switching
Sample, the data back for obtaining that will sample is to test system；
The data output test result that test system is obtained according to sampling.
Optionally, spectrum analyzer is sampled to the signal after switching, obtains first kind sampled data, and the first kind is adopted
Sample data back is sampled to test system, phase noise tester to the signal after switching, obtains Equations of The Second Kind sampled data,
Equations of The Second Kind sampled data is returned into test system；
Test system judges whether the first kind sampled data for receiving is located in the first preset range, judges second for receiving
Whether class sampled data is located in the second preset range, and export result of determination.
Optionally, test system is after judging whether the first kind sampled data that receives is located in the first preset range,
First kind result of determination is obtained, first kind result of determination is preserved；
Test system obtains Equations of The Second Kind and sentences after whether the Equations of The Second Kind sampled data for judging to receive is located in the second preset range
Determine result, keep Equations of The Second Kind result of determination.
Optionally, first kind result of determination and Equations of The Second Kind result of determination are saved as predetermined format by test system.
Optionally, the predetermined format is text formatting, chart format or phonetic matrix etc..
Optionally, test system is not located in the first preset range in the first kind sampled data for judging to receive, or,
When the Equations of The Second Kind sampled data for judging to receive is not located in the second preset range, then first kind result of determination, first are exported
Class result of determination is used to indicate DDS circuit unqualified；
Test system is located in the first preset range in the first kind sampled data for judging to receive, and judges second for receiving
Class sampled data is located at when in the second preset range, then export Equations of The Second Kind result of determination, and Equations of The Second Kind result of determination is used to indicate DDS
Circuit is qualified.
The present invention compared with prior art, has the advantage that and at least include：
The power supply of phase noise cancellation signal generator high, spectrum analyzer, phase noise tester, low noise is controlled using test system,
The test automation of DDS circuit dynamic parameter is realized, the problem of traditional manual test is successfully solved；The testing scheme is effective
Shorten the circuit test time, save cost of labor, be successfully realized DDS circuit batch production.
It should be appreciated that the general description of the above and detailed description hereinafter are only exemplary, this can not be limited
Invention.
Brief description of the drawings
Accompanying drawing herein is merged in specification and constitutes the part of this specification, shows and meets implementation of the invention
Example, and be used to explain principle of the invention together with specification.
Fig. 1 is the structural representation of the DDS circuit dynamic parameter testing system of offer in one embodiment of the invention；
Fig. 2 is the schematic diagram of the signal flow direction of offer in one embodiment of the invention.
Specific embodiment
Here exemplary embodiment will be illustrated in detail, its example is illustrated in the accompanying drawings.Following description is related to
During accompanying drawing, unless otherwise indicated, the same numbers in different accompanying drawings represent same or analogous key element.Following exemplary embodiment
Described in implementation method do not represent and the consistent all implementation methods of the present invention.Conversely, they be only with it is such as appended
The example of the consistent apparatus and method of some aspects being described in detail in claims, of the invention.
The dynamic parameter being only capable of manually to DDS circuit at present is tested, it is difficult to meet DDS circuit batch testing
Demand, is directed to this, and the invention provides a kind of DDS circuit dynamic parametric test method, it can be realized to DDS circuit dynamic
The test automation of parameter, and then batch production to realize DDS circuit provides possibility.
Fig. 1 is the structural representation of the DDS circuit dynamic parameter testing system of offer in one embodiment of the invention, should
DDS circuit dynamic parameter testing system includes test system 110, DUT board 120, mutually hot-tempered signal source 130, low noise power supply high
140th, spectrum analyzer 150 and phase noise tester 160.
Additionally, in order to ensure test system 110 and DUT board 120, spectrum analyzer 150 and phase noise tester 160
Connection, DDS circuit dynamic parameter testing system can also include the special Pin68 lines of some GPIB, test and some
Special SMA wire.Can such as include that four GPIB, the special Pin68 lines of test, three SMA wires are some.
The annexation of each device includes in DDS circuit dynamic parameter testing system：Test system 110 by SMA wire with
And Pin68 lines are connected with DUT board 120, test system 110 also by SMA wire respectively with spectrum analyzer 150 and phase noise
Tester 160 is connected；DUT board 120 is connected by SMA wire with the mutually hot-tempered signal source 130 of height, and DUT board 120 also passes through electric power connection line
It is connected with low noise power supply 140；Test system 110 by GPIB respectively with the mutually hot-tempered signal source 130 of height, low noise power supply 140, frequently
Spectrometer 150 and phase noise tester 160 are connected, the to be tested DDS that sets interior with DUT board 120 of test system 110
Circuit is electrically connected with.
In a kind of possible implementation, DUT board 120 except including DDS circuit to be tested, can also include with
The interface board of the connection of test system 110, the configuration for testing private jack, the first transformer, the second transformer and DUT board 120
Circuit, is test for DDS circuit and is placed on test private jack, and is electrically connected with interface board, and DDS circuit is respectively with the
One transformer and the second transformer are electrically connected with, and the first transformer is electrically connected with interface board.
In a kind of possible implementation, test system 110 includes digital board（The such as number of model PCI6551
Letter stencil card, High Frequency Analog Switch card（The High Frequency Analog Switch card of such as model PXI-2597）, main frame and display screen etc., be
Realize automatic test, the main frame in test system 110 can with it is supporting be provided with send instructions under and perform it is predetermined
The application program of instruction, such as application program Labview.
Corresponding, each device annexation is：Digiboard card passes through PCI（Full name：Peripheral Component
Interconnect, Chinese：External equipment interconnection bus）Slot is connected with main frame, and digiboard card passes through Pin68 lines and DUT board
120 are connected, and High Frequency Analog Switch card is connected by SMA wire with DUT plates 120, and main frame passes through GPIB and phase noise cancellation signal source high, frequency
Spectrometer 150, phase noise tester 160, low noise power supply 140 are connected, and DUT board 120 passes through SMA wire and phase noise cancellation signal high
Source 130, spectrum analyzer 150, phase noise tester 160 are connected, and DUT board 120 passes through electric power connection line and low noise power supply
140 are connected.
In actual test, phase noise cancellation signal source 130 high can be made an uproar simulation signal generator from SMB100A types phase high, frequency spectrum point
Analyzer 150 can be surveyed from N9030A type spectrum analyzers, phase noise tester 160 from E5500 types phase noise
Examination instrument, low noise power supply 140 can select E3631 type power supplys.
Optionally, digital board can obtain the test vector according to the functional simulation for simulating DDS circuit to be tested.
When needing the different DDS circuits of test, or needing to test the different function of DDS circuit, can correspond to tested at emulation to
Amount, DUT board 120 is inputed to by digital board by the test vector of emulation.
Optionally, the main frame and display screen in test system 110 can be that all-in-one, or independent two set
It is standby.
The DDS circuit dynamic parametric test method that the present invention is provided is illustrated with reference to Fig. 1, the method is included such as
Lower step：
S1, test system 110 are to the input test of DUT board 120 vector.
Optionally, the digiboard card in test system 110 is vectorial to the input test of DUT board 120 by Pin68 lines.Here
Test vector be the signal obtained to the emulation of the test function of DDS circuit to be tested in DUT board 120.
Voltage needed for S2, the control generation DUT board 120 of low noise power supply 140 of test system 110, control mutually hot-tempered signal high
Clock signal needed for the generation of source 130 DUT board 120.
Optionally, being provided with main frame in test system 110 can perform pre-programmed application program, such as
Labview, the application program can perform associative operation according to preset program order, such as, the is sent to low noise power supply 140
One instruction so that the voltage needed for the generation DUT board 120 of low noise power supply 140；Also such as, to height mutually hot-tempered signal source 130 transmission the
Two instructions so that the clock signal needed for the mutually hot-tempered generation of signal source 130 DUT board 120 high.
In actual applications, step S1 can be first carried out, then performs step S2, or, step S2 can be first carried out, then hold
Row step S1, or, step S1 and step S2 is performed side by side, the priority execution in the present embodiment not to step S1 and step S2 is suitable
Sequence is defined.
S3, DUT board 120 work in the presence of the voltage and the clock signal, to the output of test system 110 and the survey
Try vectorial corresponding output signal.
Because DUT board 120 is connected 140 connections with low noise power supply by electric power connection line, therefore low noise power supply 140 exists
After voltage needed for producing DUT board 120, corresponding voltage can be provided to DUT board 120；Corresponding, DUT board 12 is in low noise
The operating at voltages that power supply 140 is input into it.
Because DUT board 120 is connected by SMA wire with the mutually hot-tempered signal source 130 of height, therefore mutually hot-tempered signal source 130 high is being produced
After clock signal needed for DUT board 120, corresponding clock signal can be input into DUT board 120；Corresponding, DUT board 120 is in height
Worked under the clock signal that mutually hot-tempered signal source 130 is input into it.
The test vector of the input of test system 110 is have received due to DUT board 120, therefore can be in low noise power supply 140
In the presence of the clock signal that the voltage of offer and mutually hot-tempered signal source 130 high are provided, produce corresponding defeated to the test vector
Go out signal.DUT board 120 is exported the output signal to test system 110 by SMA wire.
Shown in Figure 2, in DUT board 120, clock signal first passes around DUT after DUT board 120 is input to
The first transformer in plate 120 is switched over, and the differential signal for obtaining will be switched to be input into DDS to be tested to DUT board 120
Circuit, DDS circuit to be tested outputs signal to the second transformation in DUT board 120 according to test vector and the differential signal
Device, the High Frequency Analog Switch to test system 110 is exported after the signal switching that the second transformer will be obtained by Pin68 lines,
Signal after the second transformer switches is the output signal that above-mentioned DUT board 120 is exported.
High Frequency Analog Switch in S4, test system 110 switches over the output signal that DUT board 120 is exported, and will switch
The signal for obtaining afterwards is separately input into spectrum analyzer 150 and phase noise tester 160.
Alternatively, in actual applications, it is also possible to which the height being connected with the second transformer is directly set in DUT board 120
Frequency relay, so, the high frequency relay in signal output to DUT board 120 after the signal switching that the second transformer will be obtained；
High frequency relay switches over the signal that DUT board 120 is exported, and the signal obtained after switching is separately input into spectrum analyzer
150 and phase noise tester 160.
S5, spectrum analyzer 150 and phase noise tester 160 are received after the signal after the switching respectively to each self-produced
Raw signal is sampled, and the data back for obtaining that will sample is to test system 110.
Optionally, the signal after 150 pairs of switchings of spectrum analyzer is sampled, and obtains first kind sampled data, by
One class sampled data returns to test system 110.
Optionally, the signal after 160 pairs of switchings of phase noise tester is sampled, and obtains Equations of The Second Kind sampled data,
Equations of The Second Kind sampled data is returned into test system 110.
The data output test result that S6, test system 110 are obtained according to the sampling.
Optionally, test system 110 judges whether the first kind sampled data for receiving is located in the first preset range, sentences
Whether the Equations of The Second Kind sampled data for receiving surely is located in the second preset range, and export result of determination.Here first for being said
Preset range and the second preset range are the qualified corresponding critical fields of DDS circuit that test system 110 pre-sets.
Optionally, the first preset range and the second preset range can pre-set in the application program of main frame.
Further, test system 110 is not located in the first preset range in the first kind sampled data for judging to receive,
Or, when the Equations of The Second Kind sampled data for judging to receive is not located in the second preset range, then first kind result of determination is exported,
First kind result of determination is used to indicate the DDS circuit unqualified.
Test system 110 is located in the first preset range in the first kind sampled data for judging to receive, and judges to receive
The Equations of The Second Kind sampled data for arriving is located at when in the second preset range, then export Equations of The Second Kind result of determination, and Equations of The Second Kind result of determination is used
In indicating, the DDS circuit is qualified.
Optionally, when whether test system 110 is located at the first preset range in the first kind sampled data for judging to receive
It is interior, first kind result of determination can be obtained, and first kind result of determination is preserved.Optionally, the first kind can be judged to tie
Fruit saves as text formatting, or extended formatting, such as chart format, phonetic matrix etc..
Similar, when whether test system 110 is located at the second preset range in the Equations of The Second Kind sampled data for judging to receive
It is interior, Equations of The Second Kind result of determination can be obtained, and Equations of The Second Kind result of determination is preserved.Optionally, Equations of The Second Kind can be judged to tie
Fruit saves as text formatting, or extended formatting.
Optionally, test system 110 is outputing test result（Such as first kind result of determination or Equations of The Second Kind result of determination）
When, can on a display screen show test result, it is also possible to output test result by modes such as voice broadcasts.Citing comes
Say, test system 110 can be shown on the software interface of autonomous Design on a display screen test result, it is aobvious according to test result
Show qualified prompt message or unqualified prompt message, the content of text of specific prompt message can be according to the content of test result
It is configured, such as first kind result of determination can be shown as " PASS ", Equations of The Second Kind result of determination can be shown as " FAIL ".
In sum, DDS circuit dynamic parametric test method provided in an embodiment of the present invention, is controlled high using test system
Phase noise cancellation signal generator, spectrum analyzer, phase noise tester, the power supply of low noise, realize the survey of DDS circuit dynamic parameter
Examination automation, successfully solves the problem of traditional manual test；The testing scheme effectively shortens the circuit test time, saves
Cost of labor, is successfully realized DDS circuit batch production.
Those skilled in the art after specification and the invention invented here of practice is considered, will readily occur to it is of the invention its
Its embodiment.The application is intended to any modification of the invention, purposes or adaptations, these modifications, purposes or
Person's adaptations follow general principle of the invention and the common knowledge in the art do not invented including the present invention
Or conventional techniques.Description and embodiments are considered only as exemplary, and true scope and spirit of the invention are by following
Claim is pointed out.
It should be appreciated that the invention is not limited in the precision architecture being described above and be shown in the drawings, and
And can without departing from the scope carry out various modifications and changes.The scope of the present invention is only limited by appended claim.
Claims (7)
1. a kind of Direct Digital Frequency Synthesizers DDS circuit dynamic parameter testing system, it is characterised in that the DDS circuit is moved
State parameter test system includes test system, DUT board, mutually hot-tempered signal source high, low noise power supply, spectrum analyzer and phase noise
Tester, wherein：
The test system is connected by SMA wire and Pin68 lines with the DUT board, and the test system is also by SMA wire point
It is not connected with the spectrum analyzer and the phase noise tester；The DUT board passes through SMA wire and the mutually hot-tempered letter of the height
Number source connection, the DUT board is also connected by electric power connection line with the low noise power supply；The test system is connect by general
Mouth bus GPIB makes an uproar with the mutually hot-tempered signal source of the height, the low noise power supply, the spectrum analyzer and the phase respectively
Sound test instrument is connected；
The test system is electrically connected with the DDS circuit to be tested of setting in the DUT board.
2. DDS circuit dynamic parameter testing system according to claim 1, it is characterised in that the DUT board also include with
The interface board of test system connection, test private jack, the first transformer, the second transformer and the DUT board are matched somebody with somebody
Circuits, the DDS circuit that is test for is placed on the test private jack, and is electrically connected with the interface board,
The DDS circuit is electrically connected with first transformer and second transformer respectively, first transformer with it is described
Interface board is electrically connected with.
3. DDS circuit dynamic parameter testing system according to claim 2, it is characterised in that the test system includes
Digital board, High Frequency Analog Switch card, main frame and display screen, wherein：
Interface board in the digital board and the DUT is electrically connected with, second transformer and the High Frequency Analog Switch
Card is electrically connected with.
4. a kind of Direct Digital Frequency Synthesizers DDS circuit dynamic parametric test method, it is characterised in that being applied to right such as will
Ask in the DDS circuit dynamic parameter testing system described in 3, the DDS circuit dynamic parametric test method includes as follows：
To DUT board input test vector, the test vector is to be tested in the DUT board to the test system
The signal that the test function emulation of DDS circuit is obtained；
The test system controls the clock signal that the mutually hot-tempered signal source of the height produces the DUT board to need, and controls the low noise
Voltage needed for the acoustic-electric source generation DUT board；
The DUT board works in the presence of the voltage and the clock signal, to the test system output with it is described
The corresponding output signal of test vector；
The test system is switched over by High Frequency Analog Switch to the output signal, and the signal after switching is input into respectively
To the spectrum analyzer and the phase noise tester；
The spectrum analyzer and the phase noise tester are produced to respective respectively after receiving the signal after the switching
Signal sampled, the data back that obtains of sampling is to the test system；
The test system is according to the data output test result sampled and obtain.
5. DDS circuit dynamic parametric test method according to claim 4, it is characterised in that
The spectrum analyzer to switching after the signal sample, first kind sampled data is obtained, by the first kind
Sampled data returns to the test system, phase noise tester to switching after the signal sample, obtain second
Class sampled data, the test system is returned to by the Equations of The Second Kind sampled data；
The test system judges whether the first kind sampled data for receiving is located in the first preset range, what judgement was received
Whether Equations of The Second Kind sampled data is located in the second preset range, and export result of determination.
6. DDS circuit dynamic parametric test method according to claim 5, it is characterised in that the test system is being sentenced
After whether the first kind sampled data for receiving surely is located in the first preset range, first kind result of determination is obtained, preserve described
First kind result of determination；
The test system obtains second after whether the Equations of The Second Kind sampled data for judging to receive is located in the second preset range
Class result of determination, keeps Equations of The Second Kind result of determination.
7. DDS circuit dynamic parametric test method according to claim 5, it is characterised in that the test system is being sentenced
Surely the first kind sampled data for receiving is not located in first preset range, or, judge receive described in
Equations of The Second Kind sampled data is not located at when in second preset range, then export first kind result of determination, and the first kind judges
Result is used to indicate the DDS circuit unqualified；
The test system is located in first preset range in the first kind sampled data for judging to receive, and is judged
The Equations of The Second Kind sampled data for receiving is located at when in second preset range, then export Equations of The Second Kind result of determination, described
Equations of The Second Kind result of determination is used to indicate the DDS circuit qualified.
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Cited By (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN107861049A (en) * | 2017-11-10 | 2018-03-30 | 中国电子科技集团公司第四十研究所 | Circuit board automatic adjusting and testing method and system based on LabVIEW and frequency spectrograph complete machine platform |
| CN110988655A (en) * | 2019-12-17 | 2020-04-10 | 北京振兴计量测试研究所 | Device, system and method for detecting full-band signal quality of microwave chip |
| CN111025374A (en) * | 2019-12-13 | 2020-04-17 | 中国电子科技集团公司第五十八研究所 | DDS device neutron effect evaluation system |
| CN113238140A (en) * | 2021-05-08 | 2021-08-10 | 中国电子科技集团公司第五十八研究所 | Automatic detection system capable of positioning DDS internal fault |
| CN115695657A (en) * | 2022-10-28 | 2023-02-03 | 广州芯德通信科技股份有限公司 | Method, device and system for detecting low-noise power supply of voice gateway by utilizing frequency spectrum test |
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