CN106896318B - Direct Digital Frequency Synthesizers circuit dynamic parameter testing system and method - Google Patents
Direct Digital Frequency Synthesizers circuit dynamic parameter testing system and method Download PDFInfo
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- CN106896318B CN106896318B CN201710186346.9A CN201710186346A CN106896318B CN 106896318 B CN106896318 B CN 106896318B CN 201710186346 A CN201710186346 A CN 201710186346A CN 106896318 B CN106896318 B CN 106896318B
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/317—Testing of digital circuits
- G01R31/31706—Testing of digital circuits involving differential digital signals, e.g. testing differential signal circuits, using differential signals for testing
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/317—Testing of digital circuits
- G01R31/3181—Functional testing
- G01R31/319—Tester hardware, i.e. output processing circuits
- G01R31/31903—Tester hardware, i.e. output processing circuits tester configuration
- G01R31/31905—Interface with the device under test [DUT], e.g. arrangements between the test head and the DUT, mechanical aspects, fixture
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Abstract
The invention discloses a kind of DDS circuit dynamic parameter testing system and methods, this method comprises: test macro inputs test vector corresponding with DDS circuit function to the DUT board for being provided with DDS circuit to be tested, and the power supply for controlling high phase noise cancellation signal generator and low noise generates the clock signal and voltage that DUT board needs；DUT board exports output signal corresponding with test vector under control of the clock signal, spectrum analyzer and phase noise tester generate corresponding data after receiving the signal and return to test macro, test macro is compared using sampled data and pre-set numberical range, determines whether DDS circuit is qualified.The present invention successfully carries out automatic test to DDS circuit, solves test problem when traditional manual test DDS circuit dynamic parameter, substantially increases the testing efficiency of DDS circuit dynamic parameter, saved testing cost.
Description
Technical field
The present invention relates to Direct Digital Frequency Synthesizers (Chinese: direct digital synthesizer, referred to as:
DDS) circuit dynamic parametric test field more particularly to a kind of DDS circuit dynamic parametric test method and system.
Background technique
It is required with the raising of Digital Signal Processing and digital circuit operating rate, and for system sensitivity etc.
Continuous improvement, for high speed, high-precision DDS index be proposed very high requirement.Especially in radar, communication, electronics
The electronic systems such as confrontation need to realize high performance index, when DDS gradually embodies the very wide relative bandwidth that it has, frequency conversion
Between it is extremely short, frequency resolution is very high, output phase is continuous, exportable wideband orthogonal signal, programmable and totally digitilized structure just
In the superior functions such as integrated.
However the test of DDS circuit dynamic parameter but becomes a problem, current test macro (including state granddad at present
The evaluation board provided is provided) it can only all meet and test manually, manual test had not only expended time but also labor intensive, and manually surveyed
Amount judgement is it is difficult to ensure that circuit consistency, inefficiency, it is difficult to meet the needs of DDS circuit batch testing, therefore very urgent
A kind of effective automatization test system and method are needed to instruct the test of DDS circuit dynamic parameter.
Summary of the invention
For in the related technology because by testing manually DDS circuit dynamic parameter when, it is difficult to guarantee that circuit is consistent
Property, and then it is difficult to meet the problem of the needs of DDS circuit batch testing, the present invention provides a kind of surveys of DDS circuit dynamic parameter
Test system and method.
What the present invention was achieved through the following technical solutions:
In a first aspect, the present invention provides a kind of DDS circuit dynamic parameter testing system, DDS circuit dynamic parametric test
System includes test macro, DUT(full name: device under test, Chinese: equipment in test) plate, high mutually hot-tempered signal source,
Low noise power supply, spectrum analyzer and phase noise tester, in which: test macro passes through SMA wire and Pin68 line and DUT
Plate connection, test macro also pass through SMA wire and connect respectively with spectrum analyzer and phase noise tester；DUT board passes through SMA
Line is connect with high mutually hot-tempered signal source, and DUT board also passes through electric power connection line and connect with low noise power supply；Test macro passes through GPIB
(full name: General-Purpose Interface Bus, Chinese: general purpose interface bus) respectively with high mutually hot-tempered signal source, low noise
Acoustic-electric source, spectrum analyzer and phase noise tester connection；The DDS electricity to be tested being arranged in test macro and DUT board
Road is electrically connected.
Optionally, DUT board further includes the interface board connecting with test macro, test private jack, the first transformer, second
The configuration circuit of transformer and DUT board, tested DDS circuit are placed on test private jack, and electric with interface board
Property connection, DDS circuit is electrically connected with the first transformer and the second transformer respectively, and the first transformer electrically connects with interface board
It connects.
Optionally, test macro includes digital board, High Frequency Analog Switch card, host and display screen, in which: digiboard
Card is electrically connected with the interface board in DUT, and the second transformer and High Frequency Analog Switch card are electrically connected.
Optionally, test macro can be NI(full name: national instrument) system.
Second aspect, the present invention also provides a kind of DDS circuit dynamic parametric test method, this method is applied to first party
In face or the provided DDS circuit dynamic parameter testing system of the optional technical solution of first aspect, this method comprises:
For test macro to DUT board input test vector, test vector is the test to DDS circuit to be tested in DUT board
The signal that functional simulation obtains；
The high mutually hot-tempered signal source of test macro control generates the clock signal that DUT board needs, and control low noise power supply generates DUT
Voltage needed for plate；
DUT board works under the action of voltage and clock signal, exports to test macro corresponding with test vector defeated
Signal out；
Test macro switches over output signal by High Frequency Analog Switch, and the signal after switching is separately input into frequency
Spectrum analysis instrument and phase noise tester；
Spectrum analyzer and phase noise tester receive after the signal after switching respectively to the signal respectively generated into
Row sampling, the data back that sampling is obtained is to test macro；
Test macro outputs test result according to the data that sampling obtains.
Optionally, spectrum analyzer samples the signal after switching, obtains first kind sampled data, the first kind is adopted
Sample data back samples the signal after switching to test macro, phase noise tester, obtains the second class sampled data,
Second class sampled data is returned into test macro；
Test macro determines whether the first kind sampled data that receives is located in the first preset range, determines to receive
Whether the second class sampled data is located in the second preset range, and exports judgement result.
Optionally, test macro is after determining whether the first kind sampled data that receives is located in the first preset range,
The first kind is obtained to determine as a result, saving the first kind determines result；
Test macro obtains second after determining whether the second class sampled data received is located in the second preset range
Class determines as a result, the second class is kept to determine result.
Optionally, the first kind is determined that result and the second class determine that result saves as predetermined format by test macro.
Optionally, which is text formatting, chart format or phonetic matrix etc..
Optionally, test macro is not located in the first preset range in the first kind sampled data that judgement receives, alternatively,
When determining that the second class sampled data received is not located in the second preset range, then exports the first kind and determine as a result, first
It is unqualified that class determines that result is used to indicate DDS circuit；
Test macro determining that the first kind sampled data that receives is located in the first preset range, and judgement receives
When second class sampled data is located in the second preset range, then exports the second class and determine as a result, the second class determines result for referring to
Show DDS circuit qualification.
It is included at least compared with prior art, the present invention having the advantage that:
The electricity of high phase noise cancellation signal generator, spectrum analyzer, phase noise tester, low noise is controlled using test macro
The test automation of DDS circuit dynamic parameter is realized in source, successfully solves the problem of traditional manual test；The testing scheme
It effectively shortens the circuit test time, save cost of labor, be successfully realized DDS circuit batch production.
It should be understood that the above general description and the following detailed description are merely exemplary, this can not be limited
Invention.
Detailed description of the invention
The drawings herein are incorporated into the specification and forms part of this specification, and shows and meets implementation of the invention
Example, and be used to explain the principle of the present invention together with specification.
Fig. 1 is the structural schematic diagram of the DDS circuit dynamic parameter testing system provided in one embodiment of the invention；
Fig. 2 is the schematic diagram of the signal flow provided in one embodiment of the invention.
Specific embodiment
Example embodiments are described in detail here, and the example is illustrated in the accompanying drawings.Following description is related to
When attached drawing, unless otherwise indicated, the same numbers in different drawings indicate the same or similar elements.Following exemplary embodiment
Described in embodiment do not represent all embodiments consistented with the present invention.On the contrary, they be only with it is such as appended
The example of device and method being described in detail in claims, some aspects of the invention are consistent.
It is only capable of at present by testing manually the dynamic parameter of DDS circuit, it is difficult to meet DDS circuit batch testing
Demand the present invention provides a kind of DDS circuit dynamic parametric test method, may be implemented to DDS circuit dynamic in view of this
The test automation of parameter, and then to realize that the batch production of DDS circuit provides possibility.
Fig. 1 is the structural schematic diagram of the DDS circuit dynamic parameter testing system provided in one embodiment of the invention, should
DDS circuit dynamic parameter testing system includes test macro 110, DUT board 120, high mutually hot-tempered signal source 130, low noise power supply
140, spectrum analyzer 150 and phase noise tester 160.
In addition, in order to guarantee test macro 110 and DUT board 120, spectrum analyzer 150 and phase noise tester 160
Connection, DDS circuit dynamic parameter testing system can also include several GPIB, test dedicated Pin68 line and several
Dedicated SMA wire.It for example may include that four GPIB, the dedicated Pin68 line of test, three SMA wires are several.
In DDS circuit dynamic parameter testing system the connection relationship of each device include: test macro 110 by SMA wire with
And Pin68 line is connect with DUT board 120, test macro 110 also by SMA wire respectively with spectrum analyzer 150 and phase noise
Tester 160 connects；DUT board 120 is connect by SMA wire with high mutually hot-tempered signal source 130, and DUT board 120 also passes through electric power connection line
It is connect with low noise power supply 140；Test macro 110 by GPIB respectively with high mutually hot-tempered signal source 130, low noise power supply 140, frequently
Spectrum analysis instrument 150 and phase noise tester 160 connect, the DDS to be tested being arranged in test macro 110 and DUT board 120
Circuit is electrically connected.
In one possible implementation, DUT board 120 is in addition to including DDS circuit to be tested, can also include with
The configuration of interface board, test private jack, the first transformer, the second transformer and DUT board 120 that test macro 110 connects
Circuit, tested DDS circuit are placed on test private jack, and are electrically connected with interface board, and DDS circuit is respectively with the
One transformer and the second transformer are electrically connected, and the first transformer and interface board are electrically connected.
In one possible implementation, test macro 110 includes digital board (such as the number of model PCI6551
Letter stencil card, High Frequency Analog Switch card (such as High Frequency Analog Switch card of model PXI-2597), host and display screen etc. are
Realization automatic test, host in test macro 110 can with it is mating be equipped be used to down sending instructions and execute it is predetermined
The application program of instruction, such as application program Labview.
It is corresponding, each device connection relationship are as follows: digiboard card passes through PCI(full name: Peripheral Component
Interconnect, Chinese: external equipment interconnection bus) slot is connected with host, and digiboard card passes through Pin68 line and DUT board
120 are connected, and High Frequency Analog Switch card is connected by SMA wire with DUT plate 120, and host passes through GPIB and high phase noise cancellation signal source, frequency
Spectrum analysis instrument 150, phase noise tester 160, low noise power supply 140 are connected, and DUT board 120 passes through SMA wire and high phase noise cancellation signal
Source 130, spectrum analyzer 150, phase noise tester 160 are connected, and DUT board 120 passes through electric power connection line and low noise power supply
140 are connected.
In actual test, high phase noise cancellation signal source 130 can select the high simulation signal generator of mutually making an uproar of SMB100A type, frequency spectrum point
Analyzer 150 can select N9030A type spectrum analyzer, and phase noise tester 160 can select E5500 type phase noise to survey
Instrument is tried, low noise power supply 140 can select E3631 type power supply.
Optionally, the available test vector according to the functional simulation for simulating DDS circuit to be tested of digital board.?
When needing to test different DDS circuits, or needing to test the different function of DDS circuit, can correspond to tested at emulation to
Amount, inputs to DUT board 120 for the test vector of emulation by digital board.
Optionally, the host in test macro 110 and display screen can be all-in-one machine, are also possible to independent two and set
It is standby.
DDS circuit dynamic parametric test method provided by the invention is illustrated below with reference to Fig. 1, this method includes such as
Lower step:
S1, test macro 110 are to 120 input test vector of DUT board.
Optionally, the digiboard card in test macro 110 passes through Pin68 line to 120 input test vector of DUT board.Here
Test vector be the signal emulated to the test function of DDS circuit to be tested in DUT board 120.
S2, test macro 110 control voltage needed for low noise power supply 140 generates DUT board 120, the high mutually hot-tempered signal of control
Clock signal needed for source 130 generates DUT board 120.
Optionally, pre-programmed application program can be executed by being equipped on host in test macro 110, such as
Labview, which can execute relevant operation according to preset program sequence, for example, sending the to low noise power supply 140
One instruction, so that voltage needed for the generation DUT board 120 of low noise power supply 140；Also for example, to the high mutually hot-tempered transmission of signal source 130 the
Two instructions, so that clock signal needed for the high mutually hot-tempered generation of signal source 130 DUT board 120.
In practical applications, step S1 can be first carried out, then executes step S2, alternatively, step S2 can be first carried out, then is held
Row step S1, alternatively, step S1 and step S2 is executed side by side, it is not suitable to the successively execution of step S1 and step S2 in the present embodiment
Sequence is defined.
S3, DUT board 120 work under the action of the voltage and the clock signal, to the output of test macro 110 and the survey
Try the corresponding output signal of vector.
Since DUT board 120 connect 140 connections by electric power connection line with low noise power supply, low noise power supply 140 exists
After voltage needed for generating DUT board 120, corresponding voltage can be provided to DUT board 120；Corresponding, DUT board 12 is in low noise
The operating at voltages that power supply 140 is inputted to it.
Since DUT board 120 is connect by SMA wire with high mutually hot-tempered signal source 130, high mutually hot-tempered signal source 130 is being generated
After clock signal needed for DUT board 120, corresponding clock signal can be inputted to DUT board 120；Corresponding, DUT board 120 is in height
It works under the clock signal that mutually hot-tempered signal source 130 is inputted to it.
It, can be in low noise power supply 140 since DUT board 120 has received the test vector of the input of test macro 110
Under the action of the clock signal that the voltage of offer and high mutually hot-tempered signal source 130 provide, generate corresponding defeated to the test vector
Signal out.DUT board 120 is exported the output signal to test macro 110 by SMA wire.
Shown in Figure 2, in DUT board 120, clock signal first passes around DUT after being input to DUT board 120
The first transformer in plate 120 switches over, and the differential signal being switched to is input to DDS to be tested in DUT board 120
Circuit, DDS circuit to be tested output signal to the second transformation in DUT board 120 according to test vector and the differential signal
Device, the second transformer are exported by Pin68 line to the High Frequency Analog Switch in test macro 110 after switching obtained signal,
Signal after being switched by the second transformer is the output signal that above-mentioned DUT board 120 exports.
High Frequency Analog Switch in S4, test macro 110 switches over the output signal that DUT board 120 exports, and will switch
The signal obtained afterwards is separately input into spectrum analyzer 150 and phase noise tester 160.
Alternatively, in practical applications, the height being connected with the second transformer can also be set directly in DUT board 120
Frequency relay, in this way, the signal after the second transformer switches obtained signal is exported to the high frequency relay in DUT board 120；
High frequency relay switches over the signal that DUT board 120 exports, and the signal obtained after switching is separately input into spectrum analyzer
150 and phase noise tester 160.
S5, spectrum analyzer 150 and phase noise tester 160 are received after the signal after the switching respectively to each self-produced
Raw signal is sampled, and the data back that sampling is obtained is to test macro 110.
Optionally, spectrum analyzer 150 samples the signal after the switching, obtains first kind sampled data, by
A kind of sampled data returns to test macro 110.
Optionally, phase noise tester 160 samples the signal after the switching, obtains the second class sampled data,
Second class sampled data is returned into test macro 110.
S6, test macro 110 output test result according to the data that the sampling obtains.
Optionally, test macro 110 determines whether the first kind sampled data received is located in the first preset range, sentences
Whether the second class sampled data received surely is located in the second preset range, and exports judgement result.Said here first
Preset range and the second preset range are the corresponding critical fields of DDS circuit of the pre-set qualification of test macro 110.
Optionally, the first preset range and the second preset range can be preset in the application program of host.
Further, test macro 110 is not located in the first preset range in the first kind sampled data that judgement receives,
Alternatively, when determining that the second class sampled data for receiving is not located in the second preset range, then export the first kind determine as a result,
It is unqualified that the first kind determines that result is used to indicate the DDS circuit.
Test macro 110 is located in the first preset range in the first kind sampled data that judgement receives, and determines to receive
When the second class sampled data arrived is located in the second preset range, then exports the second class and determine as a result, the second class determines that result is used
In instruction, the DDS circuit is qualified.
Optionally, when test macro 110 is determining whether the first kind sampled data received is located at the first preset range
It is interior, the first kind can be obtained and determined as a result, and saving first kind judgement result.Optionally, the first kind can be determined to tie
Fruit saves as text formatting or extended formatting, such as chart format, phonetic matrix etc..
Similar, when test macro 110 is determining whether the second class sampled data received is located at the second preset range
It is interior, the second class can be obtained and determined as a result, and saving the second class judgement result.Optionally, the second class can be determined to tie
Fruit saves as text formatting or extended formatting.
Optionally, test macro 110 is in output test result (for example the first kind determines that result or the second class determine result)
When, test result can be shown on a display screen, can also be outputed test result by modes such as voice broadcasts.Citing comes
It says, test macro 110 can show test result on the software interface of autonomous Design on a display screen, aobvious according to test result
Show qualified prompt information or unqualified prompt information, the content of text of specific prompt information can be according to the content of test result
It is configured, for example the first kind determines that result can be shown as " PASS ", the second class determines that result can be shown as " FAIL ".
In conclusion DDS circuit dynamic parametric test method provided in an embodiment of the present invention, is controlled high using test macro
Phase noise cancellation signal generator, spectrum analyzer, phase noise tester, low noise power supply, realize DDS circuit dynamic parameter survey
Examination automation, successfully solves the problem of traditional manual test；The testing scheme effectively shortens the circuit test time, saves
Cost of labor is successfully realized DDS circuit batch production.
Those skilled in the art will readily occur to of the invention its after considering specification and the invention invented here of practice
Its embodiment.This application is intended to cover any variations, uses, or adaptations of the invention, these modifications, purposes or
The common knowledge in the art that person's adaptive change follows general principle of the invention and do not invent including the present invention
Or conventional techniques.The description and examples are only to be considered as illustrative, and true scope and spirit of the invention are by following
Claim is pointed out.
It should be understood that the present invention is not limited to the precise structure already described above and shown in the accompanying drawings, and
And various modifications and changes may be made without departing from the scope thereof.The scope of the present invention is limited only by the attached claims.
Claims (6)
1. a kind of Direct Digital Frequency Synthesizers DDS circuit dynamic parameter testing system, which is characterized in that the DDS circuit is dynamic
State parameter test system includes test macro, DUT board, high mutually hot-tempered signal source, low noise power supply, spectrum analyzer and phase noise
Tester, in which:
The test macro is connect by SMA wire and Pin68 line with the DUT board, and the test macro also passes through SMA wire point
It is not connect with the spectrum analyzer and the phase noise tester；The DUT board passes through SMA wire and the mutually hot-tempered letter of the height
The connection of number source, the DUT board also pass through electric power connection line and connect with the low noise power supply；The test macro is connect by general
Mouth bus GPIB makes an uproar with the mutually hot-tempered signal source of the height, the low noise power supply, the spectrum analyzer and the phase respectively
The connection of sound test instrument；
The DDS circuit to be tested being arranged in the test macro and the DUT board is electrically connected；
Wherein:
For the test macro to the DUT board input test vector, the test vector is to be tested in the DUT board
The signal that the test function of DDS circuit emulates；
The test macro controls the mutually hot-tempered signal source of the height and generates the clock signal that the DUT board needs, and controls the low noise
Voltage needed for acoustic-electric source generates the DUT board；
The DUT board works under the action of the voltage and the clock signal, Xiang Suoshu test macro output with it is described
The corresponding output signal of test vector；
The test macro switches over the output signal by High Frequency Analog Switch, and the signal after switching is inputted respectively
To the spectrum analyzer and the phase noise tester；
The spectrum analyzer and the phase noise tester are generated to respective respectively after receiving the signal after the switching
Signal sampled, will the obtained data back of sampling to the test macro；
The test macro outputs test result according to the obtained data that sample；
The spectrum analyzer samples the signal after switching, obtains first kind sampled data, by the first kind
Sampled data returns to the test macro, and phase noise tester samples the signal after switching, obtains second
The second class sampled data is returned to the test macro by class sampled data；
The test macro determines whether the first kind sampled data received is located in the first preset range, determines to receive
Whether the second class sampled data is located in the second preset range, and exports judgement result.
2. DDS circuit dynamic parameter testing system according to claim 1, which is characterized in that the DUT board further include with
The interface board of the test macro connection tests matching for private jack, the first transformer, the second transformer and the DUT board
Circuits, tested DDS circuit are placed on the test private jack, and are electrically connected with the interface board, described
DDS circuit is electrically connected with first transformer and second transformer respectively, first transformer and the interface
Plate is electrically connected.
3. DDS circuit dynamic parameter testing system according to claim 2, which is characterized in that the test macro includes
Digital board, High Frequency Analog Switch card, host and display screen, in which:
Interface board in the number board and the DUT board is electrically connected, and second transformer is opened with the frequency analog
Outpost is electrically connected.
4. a kind of Direct Digital Frequency Synthesizers DDS circuit dynamic parametric test method, which is characterized in that wanted applied to such as right
In DDS circuit dynamic parameter testing system described in asking 3, the DDS circuit dynamic parametric test method includes the following:
For the test macro to the DUT board input test vector, the test vector is to be tested in the DUT board
The signal that the test function of DDS circuit emulates；
The test macro controls the mutually hot-tempered signal source of the height and generates the clock signal that the DUT board needs, and controls the low noise
Voltage needed for acoustic-electric source generates the DUT board；
The DUT board works under the action of the voltage and the clock signal, Xiang Suoshu test macro output with it is described
The corresponding output signal of test vector；
The test macro switches over the output signal by High Frequency Analog Switch, and the signal after switching is inputted respectively
To the spectrum analyzer and the phase noise tester；
The spectrum analyzer and the phase noise tester are generated to respective respectively after receiving the signal after the switching
Signal sampled, will the obtained data back of sampling to the test macro；
The test macro outputs test result according to the obtained data that sample；
The spectrum analyzer samples the signal after switching, obtains first kind sampled data, by the first kind
Sampled data returns to the test macro, and phase noise tester samples the signal after switching, obtains second
The second class sampled data is returned to the test macro by class sampled data；
The test macro determines whether the first kind sampled data received is located in the first preset range, determines to receive
Whether the second class sampled data is located in the second preset range, and exports judgement result.
5. DDS circuit dynamic parametric test method according to claim 4, which is characterized in that the test macro is being sentenced
After whether the first kind sampled data received surely is located in the first preset range, obtains the first kind and determine as a result, described in preservation
The first kind determines result；
The test macro obtains second after determining whether the second class sampled data received is located in the second preset range
Class determines as a result, saving the second class determines result.
6. DDS circuit dynamic parametric test method according to claim 4, which is characterized in that the test macro is being sentenced
Surely the first kind sampled data received is not located in first preset range, alternatively, described in receiving in judgement
When second class sampled data is not located in second preset range, then exports the first kind and determine as a result, the first kind determines
As a result it is unqualified to be used to indicate the DDS circuit；
The test macro is located in first preset range in the first kind sampled data that judgement receives, and determines
When the second class sampled data received is located in second preset range, then exports the second class and determine as a result, described
It is qualified that second class determines that result is used to indicate the DDS circuit.
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| CN107861049B (en) * | 2017-11-10 | 2019-12-10 | 中国电子科技集团公司第四十一研究所 | Automatic circuit board adjusting and testing method and system based on LabVIEW and spectrometer complete machine platform |
| CN111025374B (en) * | 2019-12-13 | 2023-03-28 | 中国电子科技集团公司第五十八研究所 | DDS device neutron effect evaluation system |
| CN110988655A (en) * | 2019-12-17 | 2020-04-10 | 北京振兴计量测试研究所 | Device, system and method for detecting full-band signal quality of microwave chip |
| CN113238140B (en) * | 2021-05-08 | 2023-11-21 | 中国电子科技集团公司第五十八研究所 | Automatic detection system capable of positioning DDS internal fault |
| CN115695657B (en) * | 2022-10-28 | 2023-07-25 | 广州芯德通信科技股份有限公司 | Detection method, device and system for low-noise power supply by utilizing frequency spectrum to test voice gateway |
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