CN105548771A - LTCC filter testing board and testing clamping tool - Google Patents
LTCC filter testing board and testing clamping tool Download PDFInfo
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- CN105548771A CN105548771A CN201610035436.3A CN201610035436A CN105548771A CN 105548771 A CN105548771 A CN 105548771A CN 201610035436 A CN201610035436 A CN 201610035436A CN 105548771 A CN105548771 A CN 105548771A
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- 238000012360 testing method Methods 0.000 title claims abstract description 216
- 239000000758 substrate Substances 0.000 claims abstract description 33
- RYGMFSIKBFXOCR-UHFFFAOYSA-N Copper Chemical compound [Cu] RYGMFSIKBFXOCR-UHFFFAOYSA-N 0.000 claims description 23
- 229910052802 copper Inorganic materials 0.000 claims description 23
- 239000010949 copper Substances 0.000 claims description 23
- 238000003825 pressing Methods 0.000 claims description 13
- 238000001514 detection method Methods 0.000 claims description 10
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- 230000008054 signal transmission Effects 0.000 abstract 4
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Classifications
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/04—Housings; Supporting members; Arrangements of terminals
- G01R1/0408—Test fixtures or contact fields; Connectors or connecting adaptors; Test clips; Test sockets
- G01R1/0425—Test clips, e.g. for IC's
Abstract
The invention discloses an LTCC filter testing board, and the testing board comprises a substrate, a first grounding layer, a second grounding layer, a third grounding layer, and a signal transmission layer. The first grounding layer is disposed on a first surface of the substrate, and the second and third grounding layers and the signal transmission layer are disposed on a second surface of the substrate in a mutually insulated manner, thereby forming a coplanar waveguide structure. The second and third grounding layers are respectively in electrical connection with the first grounding layer through a grounding layer connection hole. Two ends of each of the second and third grounding layers are respectively connected with a negative input end and a negative output end. Two ends of the signal transmission layer are respectively provided with a signal input end and a signal output end. Parts, located at centers of the signal input and output ends, of the signal transmission layer are provided with binding pads. The bonding pads are electrically connected with a to-be-measured LTCC filter. The testing error of the testing board is small, and the testing frequency range is larger. The invention also relates to an LTCC filter testing clamping tool.
Description
Technical field
The present invention relates to technical field of electronic device test, particularly relate to a kind of LTCC filters to test plate and test fixture.
Background technology
LTCC (LowTemperatureCo-firedCeramic, LTCC) wave filter is a kind of frequency-selecting device being applicable to microwave frequency band, is widely used in the fields such as microwave communication, radar navigation, satellite communication and automotive electronics.In recent years, along with the growth requirement of machine system Highgrade integration, miniaturization, LTCC wave filter is little with its volume, the electrical consistance of microwave frequency band is good, high reliability and obtaining is applied widely.LTCC wave filter is the monolithic structure electronic component (using frequency range to cover DC-40GHz) adopting low temperature co-fired technology to prepare, its common termination electrode number has 4,6,8,10 etc. respectively, comprise three types termination electrode: input end, output and ground, the width of termination electrode is minimum reaches 0.5mm, thus makes difficulty of test large.
The product test of traditional DC-6GHz frequency range, there is larger test error in the test fixture of use, especially test frequency range is larger with the product test error of super band at 1GHz.
Summary of the invention
Based on this, be necessary to provide a kind of test error little and the LTCC filters to test plate that test frequency scope is larger.
A kind of LTCC filters to test fixture is also provided.
A kind of LTCC filters to test plate, comprise substrate, described substrate comprises first surface and relative with described first surface second; Described test board also comprises the first ground plane, the second ground plane, the 3rd ground plane and signal transmitting layer; Described first ground plane is arranged on the first surface of described substrate; Described second ground plane, described 3rd ground plane and described signal transmitting layer mutually insulated are arranged on described second; Described signal transmitting layer is arranged at the centre position of described second; Described second ground plane and described 3rd ground plane are arranged at described signal transmitting layer both sides respectively, form coplanar waveguide structure; Described second ground plane, described 3rd ground plane and described substrate are also provided with ground plane connecting hole; Described second ground plane, described 3rd ground plane are electrically connected with described first ground plane respectively by described ground plane connecting hole; Described second ground plane and described 3rd ground plane two ends are provided with negative input end, negative output terminal respectively; The two ends of described signal transmitting layer are respectively arranged with signal input part and signal output part; One end of described signal input part, described negative input end are used for being connected with the first coaxial connector; The other end of described signal input part extends to described signal output part; One end of described signal output part, described negative output terminal are used for being connected with the second coaxial connector; The other end of described signal output part extends to described signal input part; The middle position described signal transmitting layer being positioned at described signal input part and signal output part is provided with pad; Described pad is used for being electrically connected with LTCC wave filter to be tested.
Wherein in an embodiment, described pad is also provided with vertical conductive structure; Described vertical conductive structure is conduction state in the vertical direction guaranteeing described pad, and in state of insulation in horizontal direction.
Wherein in an embodiment, described vertical conductive structure is vertical conductive adhesive.
Wherein in an embodiment, described first ground plane, described second ground plane, described 3rd ground plane and described signal transmitting layer are layers of copper; Described second ground plane and described 3rd ground plane do not arrange negative input end, the region of negative output terminal is coated with insulation course; The region described signal transmitting layer not being arranged pad, signal input part and signal output part is coated with insulation course.
A kind of LTCC filters to test fixture, comprises base and is arranged at the test bracket on described base; Described test bracket is provided with test pressing and test jacking gear; Described test fixture also comprise earthing device, test board as described in aforementioned any embodiment and as described in the first coaxial connector and as described in the second coaxial connector; First ground plane of described test board is electrically connected with described earthing device and removably connects; Described first coaxial connector and described second coaxial connector are respectively used to be connected with radio frequency vector network analyzer; Described test jacking gear moves up and down for controlling described test pressing, thus the conducting realized between LTCC wave filter to be measured and test board controls.
Wherein in an embodiment, described first coaxial connector and described second coaxial connector are sub-miniature A connector.
Wherein in an embodiment, also comprise detection calibration plate; The structure of described detection calibration plate is identical with test board except the pad do not arranged for connecting with LTCC wave filter to be measured; Described detection calibration plate is used for the test value of calibration testing plate.
Wherein in an embodiment, described earthing device is ground connection copper billet, and described ground connection copper billet arranges screw connecting hole; Described ground connection copper billet is connected by screw hole and is connected with base and described test board respectively.
Wherein in an embodiment, the side that described ground connection copper billet is connected with described test board is set to staircase structure.
Wherein in an embodiment, also comprise the testing cover plate be arranged on described test board second; Described testing cover plate is " work " character form structure; The centre position of described testing cover plate is provided with pickup groove, to locate LTCC wave filter to be measured.
Above-mentioned LTCC filters to test plate and test fixture, the first ground plane in test board, the second ground plane and the 3rd ground plane connect as a whole by ground plane connecting hole, and unification is drawn out to earth terminal, thus realizes minimizing of test error.Further, the substrate in test board, the second ground plane being arranged at substrate second, the 3rd ground plane and signal transmitting layer form coplanar waveguide structure, make test board can be applicable to higher test frequency, and test loss is less, and stability is better.
Accompanying drawing explanation
Fig. 1 is the structure diagram of the LTCC filters to test plate in an embodiment;
Fig. 2 is the schematic top plan view of the LTCC filters to test plate in Fig. 1;
Fig. 3 is the schematic top plan view of the detection calibration plate for calibrating the test board in Fig. 1;
Fig. 4 is the front view of the LTCC filters to test fixture in an embodiment;
Fig. 5 is the side view of the test fixture in Fig. 4;
Fig. 6 is the structural representation of the base in Fig. 4;
Fig. 7 is the structural representation of base under another visual angle in Fig. 4;
Fig. 8 is the structural representation of the testing cover plate in Fig. 4.
Embodiment
In order to make object of the present invention, technical scheme and advantage clearly understand, below in conjunction with drawings and Examples, the present invention is further elaborated.Should be appreciated that specific embodiment described herein only in order to explain the present invention, be not intended to limit the present invention.
A kind of LTCC filters to test plate, in LTCC filters to test process, to realize the test function of LTCC wave filter S parameter.S parameter also claims scattering parameter, comprises straight-through S parameter and reflection S parameter.Straight-through S parameter comprises reverse transfer coefficient S 12 and forward transmission coefficient S21.Straight-through S parameter is for reflecting the insertion loss of equipment.Reflection S parameter comprises input reflection system S11 and output reflection coefficient S22, for the return loss of characterization device.Fig. 1 is the structure diagram of the LTCC filters to test plate (hereinafter referred to as test board) in an embodiment, and Fig. 2 is then the schematic diagram of the top planes of test board in Fig. 1.See Fig. 1 and Fig. 2, this test board is the pcb board adopting high-frequency ceramic material to make by covering process for copper, and it comprises substrate 110, first ground plane 120, second ground plane 132, the 3rd ground plane 134 and signal transmitting layer 140.Wherein, the second ground plane 132, the 3rd ground plane 134 are all as ground-electrode, and signal transmitting layer 140 is as signal input/output electrode.
In the present embodiment, substrate 110 is rectangular parallelepiped, and is insulating medium layer.The material of substrate 110 is high-frequency ceramic material, and test frequency can at more than 6GHz.The material of substrate 110 can set according to test frequency.For the following test board of test frequency 6GHz, substrate 110 adopts FR4 sheet material.If test frequency is greater than 6GHz, then high-frequency ceramic material generally to be selected as baseplate material.Substrate 110 comprises first surface (i.e. the lower surface of substrate 110) and second relative with first surface (i.e. the upper surface of substrate 110).
First ground plane 120 covers the lower surface of whole substrate 110.Second ground plane 132, the 3rd ground plane 134 and signal transmitting layer 140 are arranged at the upper surface of substrate 110.In the present embodiment, substrate 110, first ground plane 120, second ground plane 132 and the 3rd ground plane 134 are provided with multiple ground plane connecting hole 136.Second ground plane 132 is connected with the first ground plane 120 respectively by ground plane connecting hole 136 with the 3rd ground plane 134, is drawn out to earth terminal, thus realizes minimizing of test error after forming an entirety.In the present embodiment, first ground plane 120, second ground plane 132 and the grounding connection hole 138 the 3rd ground plane 134 is also provided with for being connected with the earthing device on test fixture, thus be electrically connected with the earthing device on test fixture by grounding connection hole 138.In the present embodiment, the first ground plane 120, second ground plane 132, the 3rd ground plane 134 and signal transmitting layer 140 are layers of copper.Layers of copper has good electric conductivity, thus whole test board is had be electrically connected performance preferably.Signal transmitting layer 140 is arranged at the centre position of substrate 110 and the length direction along substrate 110 is arranged.Second ground plane 132 and the 3rd ground plane 134 are symmetricly set in the both sides of signal transmitting layer 140, thus form coplanar waveguide structure.The test frequency of traditional filters to test plate is at about 5GHz.The beta version with coplanar waveguide structure then can be applicable to higher test frequency, can up to 20GHz even more than.Further, adopt the test board of coplanar waveguide structure, its loss is less, and stability is better.
Particularly, the two ends of the second ground plane 132 and the 3rd ground plane 134 are provided with negative input end 152 and negative output terminal 154 respectively.The two ends of signal transmitting layer 140 are respectively arranged with signal input part (being also positive input terminal) 142 and signal output part (being also positive output end) 144.One end of signal input part 142 is with negative input end 152 for being connected with the first coaxial connector, and the other end of signal input part 142 extends to signal output part 144, and extends to the centre position near substrate 110.One end of signal output part 144 is with negative output terminal 154 for being connected with the second coaxial connector, and the other end of signal input part 144 extends to signal input part 142, and extends to the centre position of substrate 110.Middle position signal transmitting layer 140 being positioned at signal input part 142 and signal output part 144 is also provided with pad 146.Pad 146 is for being electrically connected with LTCC wave filter to be tested.In the present embodiment, the width of the one end near pad 146 on signal input part 142 and signal output part 144 broadens, thus guarantees that ground connection is good.Pad 146 is also provided with vertical conductive structure (not shown).Vertical conductive structure can be vertical conductive adhesive, to guarantee the vertical direction on pad 146 can realize good conducting by applying less pressure, and in the horizontal direction in state of insulation.Conducting resinl conductance is good, and contact resistance is very little, has obvious advantage, can reduce test error to greatest extent than the test of traditional employing spring-loaded contact.In the present embodiment, region green oil substrate 110 upper surface not being arranged link (input end and output terminal) and pad 146 is coated with one deck solder mask 148 (also can be called insulation course).
Baseplate material in test board, characteristic impedance value (can be 50 Ω, 75 Ω or 100 Ω etc.) and size can have an impact to scattering parameter, thus the filtering parameter precision of impact test.The size that affects of test board mainly comprises the thickness H of substrate 110, the width W of electrode wiring (being also signal transmitting layer 140) and thickness T and the spacing G between the second ground plane 132 and signal transmitting layer 140 (being also ground-electrode and input/output electrode).By adjusting above-mentioned four parameters of test board, can realize adjusting the scattering parameter of test board, with satisfied different filter parameter accuracy requirement.Above-mentioned four critical sizes can pass through simulation software (as HFSS, ADS or AppCAD etc.) simulation analysis and obtain.
Below with HFSS (HighFrequencyStructureSimulator, high-frequency structure emulate) for example is to determining that the preparation process of test board is described.
Step 1, carries out characteristic impedance theoretical analysis and co-planar waveguide three dimensional joint element.According to filters to test plate matching properties impedance (general employing 50 Ω, also have 75 Ω, 100 Ω etc.) requirement, simulation software is drawn co-planar waveguide 3 d structure model, comprise baseplate material and select (this place selection low-loss high-frequency stupalith), the thickness T of substrate thickness H, electrode wiring and the spacing G of width W, input/output electrode and ground-electrode, and the variable set up (see Fig. 1,2) such as connecting hole population size.
Step 2, boundary model modeling, boundary condition design.Relation draws boundary model in certain proportion, and boundary model must be included co-planar waveguide model interior, arranges boundary condition, selects microwave border.
Step 3, incentive condition is arranged.Draw energized plane, arranging incentive condition is 50 Ω characteristic impedances.
Step 4, sweep frequency is arranged.Arrange sweep frequency, the test frequency in the present embodiment requires to reach 20GHz, and therefore sweep frequency arranges 100KHz ~ 20GHz.
Step 5, variable set up and analysis.Based on co-planar waveguide theory, set H, T, W, G etc. (Fig. 1) variable respectively, variable analysis condition is set.
Step 6, simulation run, interpretation of result, optimization.According to the trend of each variable change, targetedly the carrying out of above variable is adjusted, make straight-through loss parameter S12, S21 farthest close to 0 (namely making signal transmitting procedure almost noenergy loss in PCB test board), make reflection loss parameter S11, S22 is less than-30dB respectively, be less than-40dB, namely make signal transmitting procedure almost noenergy reflection in test board.
Step 7, optimization completes, and parameter extraction, test board make.
When the parameters such as S12, S21, S11, S22 all meet the demands, extract H, T, W, G equidimension parameter, adopt pcb board manufacture craft to carry out test board making.For reducing the systematic error that test board is introduced to greatest extent, make supporting detection calibration plate, for thru calibration, as shown in Figure 3 simultaneously.The structure of detection calibration plate is substantially identical with the structure of test board, is only not arrange pad 146, because pad 146 is negligible on straight-through S parameter impact, so do not arrange pad 146.When actual PCB test board makes, also need apply one deck solder mask (also claiming insulation course) for the place green oil on upper layers of copper (the second ground plane 132, the 3rd ground plane 134 and signal transmitting layer 140) beyond pad 146.
Above-mentioned LTCC filters to test plate, the first ground plane 110, second ground plane 132 in test board and the 3rd ground plane 134 connect as a whole by ground plane connecting hole 136, and unification is drawn out to earth terminal, thus realizes minimizing of test error.And, substrate 110 in test board, the second ground plane 132 being arranged at substrate 110 second, the 3rd ground plane 134 and signal transmitting layer 140 form coplanar waveguide structure, make test board can be applicable to higher test frequency, and test loss is less, stability is better.And above-mentioned test board adopts vertical conductive adhesive as the interface unit of pad and LTCC wave filter to be measured, conducting resinl conductance is good, contact resistance is very little, has obvious advantage than the test of traditional employing spring-loaded contact, can less test error to greatest extent.
Present invention also offers a kind of LTCC filters to test fixture, for fixing LTCC wave filter to be measured.Fig. 4 is the front view of the LTCC filters to test fixture (hereinafter referred to as test fixture) in an embodiment, and Fig. 5 is the side view of the test fixture in Fig. 4.See Fig. 4 and Fig. 5, this test fixture comprises base 402, earthing device 404, test board 406, first coaxial connector 408, second coaxial connector 410, testing cover plate 412, test bracket 414, test pressing 416 and test jacking gear 418.
Base 402 adopts metal material to make, and is a part for test fixture bottommost.Base 402 is for playing support, stabilizing clip and ensureing the effects such as ground connection is good.In the present embodiment, four strong points 403 are also provided with below base 402.Four strong points 403 are used for adjusting test fixture level.
In the present embodiment, earthing device 404 is ground connection copper billet.Ground connection copper billet is solid metal block, and its structure as shown in Figure 6 and Figure 7.Two end faces up and down of ground connection copper billet are all provided with screw connecting hole 610.Ground connection copper billet lower end is connected by screw hole and is fixedly connected with base 402, and the screw connecting hole of ground connection copper billet upper surface is preformed hole, for being connected with the first ground plane of test board 406.Ground connection copper billet is good for ensureing the ground connection of test fixture, to reduce the impact of outer signals on the test of reflection S parameter.In the present embodiment, the side that ground connection copper billet is connected with test board is set to staircase structure, thus its ground connection is good, and supports the use with test board 406.
Test board 406 is the core of this test fixture, and the test function that LTCC filtering S joins needs to be realized by this test board.Test board 406 adopts the test plate structure in aforementioned any embodiment.First coaxial connector 408 is connected with radio frequency vector network analyzer by concentric cable after being connected with the input end on test board 406, output terminal with the second coaxial connector 410.In the present embodiment, the first coaxial connector 408 and the second coaxial connector 410 are sub-miniature A connector, in other examples, also can be sub-miniature B connector, sub-miniature C connector and BNC connector etc.This test board 406 realizes being connected with other parts of test fixture by input end, output terminal, pad, grounding connection hole, ground plane connecting hole etc.The signal input part of test board 406 and the input/output signal of signal output part are provided by radio frequency vector network analyzer.Radio frequency vector network analyzer exports, input end connects into a closed-loop path respectively by two sub-miniature A connectors of test cable and test board 406.Radio frequency vector network analyzer output terminal exports a signal and arrives test board 406 by wave filter product via test cable, and this signal has straight-through and reflection two states.Through connect signal continues the other end getting back to forward radio frequency vector network analyzer, and reflected signal reflexes to the output terminal of radio frequency vector network analyzer.Radio frequency vector network analyzer, by the analysis to output signal, through connect signal, reflected signal, realizes the test of wave filter.In one embodiment, test fixture also comprises detection calibration plate.
Testing cover plate 412 is arranged at the one side that test board 406 is connected with LTCC to be measured.The structure of testing cover plate 412 as shown in Figure 8.Testing cover plate 412 is " work " character form structure, thus matches with the structure of test board 406.The centre position of testing cover plate 412 is provided with pickup groove 710.Pickup groove 710 is for locating LTCC wave filter to be measured.The structure of pickup groove 710 and the structure of wave filter of testing cover plate 412 match.Surrounding testing cover plate 412 being positioned at pickup groove 710 is also formed with shallow slot structure 720, to facilitate the assembling of wave filter.Testing cover plate 412 is also provided with multiple connecting hole 730.Testing cover plate 412 is connected with ground connection copper billet through the grounding connection hole on connecting hole 730, test board 406 by metallic screw.Particularly, sub-miniature A connector in the link welding of test board 406, above its pad, placing one deck vertical conductive adhesive, (vertical direction can realize good conducting by applying less pressure, horizontal direction is state of insulation), on vertical conductive adhesive and test board plate, 406 sides add testing cover plate 412, adopt metallic screw (ensureing that test board 406 ground connection is good) to be fixed on ground connection copper billet by grounding connection hole, realize the connection in test fixture of test board.
Test bracket 414 is fixed on base 402.Test jacking gear 418 and test pressing 416 are all fixed on test bracket 414.Test jacking gear 418 moves up and down for controlling test pressing 416, thus the conducting realized between LTCC wave filter to be measured and test board 406 controls.Particularly, test jacking gear 418 is spanner structure, i.e. test lifting spanner.Test pressing 416 adopts animi resin material to make, and directly over the pad being installed on test board 406, presses down and applies certain pressure to product, realize product and connect conducting in test board 406 during test products.Test pressing 416 is connected on test pressing axle 417, and mounting spring (not shown) in test pressing axle 417, is connected to one end of test lifting spanner by test bracket 414.When product is in state to be tested, pull-up test lifting spanner, spring is upspring, and test pressing rises unsettled.During test products, drop-down test lifting spanner, by the conduction of spring force, test pressing 416 is depressed into product upper surface to be tested, product is stressed to be delivered on vertical conductive adhesive, conducting resinl conducting, thus realizes test.
Above-mentioned test fixture have test frequency up to 20GHz, test error is little, stability is high, consistance is good, assemble and use the series of advantages such as simple and practical.Above-mentioned test fixture can be applied in the test to electrical properties such as LTCC low-pass filter, LTCC Hi-pass filter, LTCC bandpass filter and relevant microwave filters, and in wave filter automatic fraction collector test macro core component, be also applicable to the test macros such as microwave electron element, radio-frequency (RF) component.
Each technical characteristic of the above embodiment can combine arbitrarily, for making description succinct, the all possible combination of each technical characteristic in above-described embodiment is not all described, but, as long as the combination of these technical characteristics does not exist contradiction, be all considered to be the scope that this instructions is recorded.
The above embodiment only have expressed several embodiment of the present invention, and it describes comparatively concrete and detailed, but can not therefore be construed as limiting the scope of the patent.It should be pointed out that for the person of ordinary skill of the art, without departing from the inventive concept of the premise, can also make some distortion and improvement, these all belong to protection scope of the present invention.Therefore, the protection domain of patent of the present invention should be as the criterion with claims.
Claims (10)
1. a LTCC filters to test plate, comprises substrate, and described substrate comprises first surface and relative with described first surface second; It is characterized in that, described test board also comprises the first ground plane, the second ground plane, the 3rd ground plane and signal transmitting layer; Described first ground plane is arranged on the first surface of described substrate; Described second ground plane, described 3rd ground plane and described signal transmitting layer mutually insulated are arranged on described second; Described signal transmitting layer is arranged at the centre position of described second; Described second ground plane and described 3rd ground plane are arranged at described signal transmitting layer both sides respectively, form coplanar waveguide structure; Described second ground plane, described 3rd ground plane and described substrate are also provided with ground plane connecting hole; Described second ground plane, described 3rd ground plane are electrically connected with described first ground plane respectively by described ground plane connecting hole; Described second ground plane and described 3rd ground plane two ends are provided with negative input end, negative output terminal respectively; The two ends of described signal transmitting layer are respectively arranged with signal input part and signal output part; One end of described signal input part, described negative input end are used for being connected with the first coaxial connector; The other end of described signal input part extends to described signal output part; One end of described signal output part, described negative output terminal are used for being connected with the second coaxial connector; The other end of described signal output part extends to described signal input part; The middle position described signal transmitting layer being positioned at described signal input part and signal output part is provided with pad; Described pad is used for being electrically connected with LTCC wave filter to be tested.
2. LTCC filters to test plate according to claim 1, is characterized in that, described pad is also provided with vertical conductive structure; Described vertical conductive structure is conduction state in the vertical direction guaranteeing described pad, and in state of insulation in horizontal direction.
3. LTCC filters to test plate according to claim 2, is characterized in that, described vertical conductive structure is vertical conductive adhesive.
4. LTCC filters to test plate according to claim 1, is characterized in that, described first ground plane, described second ground plane, described 3rd ground plane and described signal transmitting layer are layers of copper;
Described second ground plane and described 3rd ground plane do not arrange negative input end, the region of negative output terminal is coated with insulation course; The region described signal transmitting layer not being arranged pad, signal input part and signal output part is coated with insulation course.
5. a LTCC filters to test fixture, comprises base and is arranged at the test bracket on described base; Described test bracket is provided with test pressing and test jacking gear; It is characterized in that, described test fixture also comprises earthing device, as arbitrary in Claims 1 to 4 as described in test board and as described in the first coaxial connector and as described in the second coaxial connector; First ground plane of described test board is electrically connected with described earthing device and removably connects; Described first coaxial connector and described second coaxial connector are respectively used to be connected with radio frequency vector network analyzer; Described test jacking gear moves up and down for controlling described test pressing, thus the conducting realized between LTCC wave filter to be measured and test board controls.
6. LTCC filters to test fixture according to claim 5, is characterized in that, described first coaxial connector and described second coaxial connector are sub-miniature A connector.
7. LTCC filters to test fixture according to claim 5, is characterized in that, also comprise detection calibration plate; The structure of described detection calibration plate is identical with test board except the pad do not arranged for connecting with LTCC wave filter to be measured; Described detection calibration plate is used for the test value of calibration testing plate.
8. LTCC filters to test fixture according to claim 5, is characterized in that, described earthing device is ground connection copper billet, and described ground connection copper billet arranges screw connecting hole; Described ground connection copper billet is connected by screw hole and is connected with base and described test board respectively.
9. LTCC filters to test fixture according to claim 8, is characterized in that, the side that described ground connection copper billet is connected with described test board is set to staircase structure.
10. LTCC filters to test fixture according to claim 5, is characterized in that, also comprises the testing cover plate be arranged on described test board second; Described testing cover plate is " work " character form structure; The centre position of described testing cover plate is provided with pickup groove, to locate LTCC wave filter to be measured.
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| CN201610035436.3A CN105548771B (en) | 2016-01-19 | 2016-01-19 | LTCC filters to test plate and test fixture |
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| CN201610035436.3A CN105548771B (en) | 2016-01-19 | 2016-01-19 | LTCC filters to test plate and test fixture |
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Cited By (15)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN106771687A (en) * | 2016-12-22 | 2017-05-31 | 华讯方舟科技（湖北）有限公司 | A kind of device and method for testing the noise after microwave product assembling CAP |
| CN107703439A (en) * | 2017-09-22 | 2018-02-16 | 郑州云海信息技术有限公司 | A kind of automation signal loss test device |
| CN107870251A (en) * | 2017-11-22 | 2018-04-03 | 深圳振华富电子有限公司 | A kind of control circuit of voltage ageing screening fixture and fixture |
| CN108105541A (en) * | 2017-11-30 | 2018-06-01 | 深圳华远微电科技有限公司 | A kind of SAW filter check device pedestal |
| CN109283413A (en) * | 2018-11-08 | 2019-01-29 | 浙江嘉科电子有限公司 | A kind of Novel Filter calibration matching test device |
| CN109406843A (en) * | 2018-12-12 | 2019-03-01 | 江苏贝孚德通讯科技股份有限公司 | A kind of debugging clamper and adjustment method of dielectric waveguide filter |
| CN109459634A (en) * | 2018-11-07 | 2019-03-12 | 深圳振华富电子有限公司 | SMD components test module |
| CN109813734A (en) * | 2017-11-20 | 2019-05-28 | 成都恩驰微波科技有限公司 | A kind of sheeting electromagnetic parameter testing device and method |
| CN110231527A (en) * | 2019-06-13 | 2019-09-13 | 广东国华新材料科技股份有限公司 | A kind of test fixture and its test method of dielectric waveguide filter |
| CN110716128A (en) * | 2019-10-29 | 2020-01-21 | 广州兴森快捷电路科技有限公司 | PCB loss test method |
| CN111596105A (en) * | 2020-06-30 | 2020-08-28 | 瑞声精密制造科技(常州)有限公司 | Test fixture of dielectric waveguide filter |
| CN111722045A (en) * | 2020-06-30 | 2020-09-29 | 瑞声精密制造科技(常州)有限公司 | Test tool for dielectric waveguide filter |
| CN111983265A (en) * | 2020-08-20 | 2020-11-24 | 中电科仪器仪表有限公司 | LTCC filter test board and test device |
| CN112182997A (en) * | 2020-09-04 | 2021-01-05 | 曙光信息产业(北京)有限公司 | Scattering parameter determination method and device, computer equipment and storage medium |
| CN116520137A (en) * | 2023-06-27 | 2023-08-01 | 北京智芯微电子科技有限公司 | Low-noise chip pin interference measurement auxiliary device and measurement system |
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| CN106771687A (en) * | 2016-12-22 | 2017-05-31 | 华讯方舟科技（湖北）有限公司 | A kind of device and method for testing the noise after microwave product assembling CAP |
| CN106771687B (en) * | 2016-12-22 | 2023-11-24 | 深圳市华讯方舟卫星产业科技有限公司 | Device and method for testing noise of microwave product after CAP assembly |
| CN107703439A (en) * | 2017-09-22 | 2018-02-16 | 郑州云海信息技术有限公司 | A kind of automation signal loss test device |
| CN109813734B (en) * | 2017-11-20 | 2021-07-02 | 成都恩驰微波科技有限公司 | Sheet material electromagnetic parameter testing device and method |
| CN109813734A (en) * | 2017-11-20 | 2019-05-28 | 成都恩驰微波科技有限公司 | A kind of sheeting electromagnetic parameter testing device and method |
| CN107870251A (en) * | 2017-11-22 | 2018-04-03 | 深圳振华富电子有限公司 | A kind of control circuit of voltage ageing screening fixture and fixture |
| CN108105541A (en) * | 2017-11-30 | 2018-06-01 | 深圳华远微电科技有限公司 | A kind of SAW filter check device pedestal |
| CN109459634A (en) * | 2018-11-07 | 2019-03-12 | 深圳振华富电子有限公司 | SMD components test module |
| CN109283413A (en) * | 2018-11-08 | 2019-01-29 | 浙江嘉科电子有限公司 | A kind of Novel Filter calibration matching test device |
| CN109406843A (en) * | 2018-12-12 | 2019-03-01 | 江苏贝孚德通讯科技股份有限公司 | A kind of debugging clamper and adjustment method of dielectric waveguide filter |
| CN110231527A (en) * | 2019-06-13 | 2019-09-13 | 广东国华新材料科技股份有限公司 | A kind of test fixture and its test method of dielectric waveguide filter |
| CN110716128A (en) * | 2019-10-29 | 2020-01-21 | 广州兴森快捷电路科技有限公司 | PCB loss test method |
| CN111722045A (en) * | 2020-06-30 | 2020-09-29 | 瑞声精密制造科技(常州)有限公司 | Test tool for dielectric waveguide filter |
| CN111596105A (en) * | 2020-06-30 | 2020-08-28 | 瑞声精密制造科技(常州)有限公司 | Test fixture of dielectric waveguide filter |
| CN111983265A (en) * | 2020-08-20 | 2020-11-24 | 中电科仪器仪表有限公司 | LTCC filter test board and test device |
| CN112182997A (en) * | 2020-09-04 | 2021-01-05 | 曙光信息产业(北京)有限公司 | Scattering parameter determination method and device, computer equipment and storage medium |
| CN112182997B (en) * | 2020-09-04 | 2024-04-12 | 曙光信息产业(北京)有限公司 | Scattering parameter determination method, scattering parameter determination device, computer equipment and storage medium |
| CN116520137A (en) * | 2023-06-27 | 2023-08-01 | 北京智芯微电子科技有限公司 | Low-noise chip pin interference measurement auxiliary device and measurement system |
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