CN107966625A - Measurement system and method for measurement - Google Patents
Measurement system and method for measurement Download PDFInfo
- Publication number
- CN107966625A CN107966625A CN201711187635.7A CN201711187635A CN107966625A CN 107966625 A CN107966625 A CN 107966625A CN 201711187635 A CN201711187635 A CN 201711187635A CN 107966625 A CN107966625 A CN 107966625A
- Authority
- CN
- China
- Prior art keywords
- measuring equipment
- controller
- control instruction
- time
- electronic devices
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
Abstract
The present invention discloses a kind of method for measurement, including：One first control instruction is provided to one first measuring equipment in the first batch time with a controller；One second control instruction is provided in the second lot time be different from the second lot time to one second measuring equipment, the first batch time with the controller；One first metric data of an electronic devices under test is obtained according to first control instruction with first measuring equipment；And one second metric data of the electronic devices under test is obtained according to second control instruction with second measuring equipment.Invention additionally discloses a kind of measurement system.
Description
Technical field
The present invention is on a kind of measurement system and method for measurement, particularly a kind of measurement system with a variety of measuring equipments
With method for measurement.
Background technology
In the past in the heat dissipation test of the project of progress, tester can go temperature in measurement system platform, voltage, electric current,
The data such as wind speed or rotation speed of the fan.Since the feature of system platform is maked rapid progress with complexity, tester's the desired amount is surveyed
Point position and port number demand it is also more and more more, therefore generally require more different types of measuring instruments to reach test
Demand.
But the different incidental genuine software programs of measuring instrument are usually just for single measuring instrument, therefore, if
Want two instruments of control, tester may may require that with many motors control device (such as laptop) individually to control
Different measuring instruments.Such as measuring instrument B1 is controlled with control device A1, and control measuring instrument with control device A2
B2, etc..In the case, if there was only separate unit control device in laboratory, tester constantly must just control this
Device dismounting processed is between different measuring instruments.Therefore, as the increase of test event, testing cost are also constantly lifted.
The content of the invention
The invention reside in a kind of measurement system and method for measurement is provided, to overcome conventional testing cost must be with test item
The problem of mesh increase.
The invention discloses a kind of method for measurement, including：One first control is provided in the first batch time with a controller
System instruction is to one first measuring equipment；One second control instruction is provided to one second amount in the second lot time with the controller
Device is surveyed, which is different from the second lot time；With first measuring equipment according to first control instruction
Obtain one first metric data of an electronic devices under test；And obtained with second measuring equipment according to second control instruction
One second metric data of the electronic devices under test.
The invention discloses a kind of measurement system, and to be measured to an electronic devices under test, which includes：
One first measuring equipment, is for electrically connecting to the electronic devices under test, which selects according to one first control instruction
Obtain to selecting property one first metric data of the electronic devices under test；One second measuring equipment, is for electrically connecting to the electricity to be measured
Sub-device, second measuring equipment are measured according to one second control instruction optionally obtains the electronic devices under test one second
Data；And a controller, be electrically connected first measuring equipment and second measuring equipment, the controller produce this
One control instruction and second control instruction, and the controller first controls this in different time points according to a batch procedure
Instruction is supplied to first measuring equipment and second measuring equipment with second control instruction.
The explanation of explanation and following embodiment above with respect to present invention to demonstrate and explain the present invention
Spirit and principle, and claims of the present invention is provided and is further explained.
Brief description of the drawings
Fig. 1 is the step flow chart of the method for measurement according to depicted in one embodiment of the invention.
Fig. 2 is the functional block diagram of the measuring equipment according to depicted in one embodiment of the invention.
Fig. 3 A are the schematic diagram of the first stage when measurement system according to depicted in one embodiment of the invention is measured.
Fig. 3 B are the schematic diagram of the second stage when measurement system according to depicted in one embodiment of the invention is measured.
Fig. 3 C are the schematic diagram of the phase III when measurement system according to depicted in one embodiment of the invention is measured.
Fig. 3 D are the schematic diagram of the fourth stage when measurement system according to depicted in one embodiment of the invention is measured.
Wherein, reference numeral：
1 measurement system
12 controllers
14 first measuring equipments
16 second measuring equipments
DUT electronic devices under test
Embodiment
The open following detailed features and advantage for describing the present invention in detail in embodiments, its content are enough to make ability
The technical staff in domain understands the technology contents of the present invention and implements according to this, and is wanted according to content disclosed in this specification, right
Book and attached drawing are asked, those skilled in the art can be readily understood upon the relevant purpose of the present invention and advantage.Following embodiment is
The viewpoint of the present invention is further described, but it is non-anyways to limit scope of the invention.
Fig. 1 is refer to, Fig. 1 is the step flow chart of the method for measurement according to depicted in one embodiment of the invention.Such as Fig. 1 institutes
Show, in step S101, one first control instruction is provided to one first measuring equipment in the first batch time with a controller.
In step s 103, one second control instruction is provided in the second lot time measure dress to one second with the controller
Put, the first batch time is different from the second lot time.In step S105, with the first measuring equipment according to the first control instruction
Obtain one first metric data of an electronic devices under test.In step s 107, referred to the second measuring equipment according to the second control
Order obtains one second metric data of electronic devices under test.
Please with reference to Fig. 2, Fig. 2 is the functional block diagram of the measuring equipment according to depicted in one embodiment of the invention.Such as
Shown in Fig. 2, measurement system 1 has controller 12, the first measuring equipment 14 and the second measuring equipment 16.Controller 12 is electrical respectively
Connect the first measuring equipment 14 and the second measuring equipment 16.Controller 12 be, for example, computer or other with operational capability
Machine.First measuring equipment 14 and the second measuring equipment 16 are different types of measuring equipment.First measuring equipment 14 and second
Measuring equipment 16 may, for example, be data logger (data logger), fan board (fan board) or can be used to capture wind
The acquisition circuitry of speed meter information.Citing demonstration is above are only, but is not limited.In this measure the first measuring equipment 14 and the second amount
Survey device 16 to illustrate, right those skilled in the art after readding this specification it should be appreciated that controller 12 can be electrically connected in detail
Many more than two measuring equipment.
In one embodiment, controller 12 is electrically connected the first measuring equipment 14 and the second amount by RS232 serial ports
Survey device 16.Controller 12 is producing the first control instruction and the second control instruction.And controller 12 is according to a batch procedure
And it is supplied to the first measuring equipment 14 and second to measure the first control instruction and the second control instruction respectively in different time points
Device 16.Wherein, batch procedure is indicating what information is supplied to external device (ED) by controller 12 at time point in what.More specifically
For, controller 12 is, for example, that the first control instruction is supplied to the first measuring equipment 14, and controller in the first batch time
12 be, for example, that the second control instruction is supplied to the second measuring equipment 16 in the second lot time.In in practice, the batch
Program can be the software program developed by LabVIEW.
When the first measuring equipment 14 receives the first control instruction, the first measuring equipment 14 is according to the first control instruction pair
Electronic devices under test DUT is tested, and obtains the first metric data of electronic devices under test DUT.Similarly, when second measures
When device 16 receives the second control instruction, the second measuring equipment 16 according to the second control instruction to electronic devices under test DUT into
Row test, and obtain the second metric data of electronic devices under test DUT.
In one embodiment, controller 12 also in the 3rd batch time provide one capture instruction to the first measuring equipment 14 with
Second measuring equipment 16, the first metric data is provided to controller 12 to activate the first measuring equipment 14 according to instruction is captured, and
Activate the second measuring equipment 16 and provide the second metric data to controller 12.Wherein the 3rd batch time is for example later than first batch
Time and it is later than the second lot time.
Among a kind of way, user can estimate the first measuring equipment 14 and the second measuring equipment 16 generally to electricity to be measured
The time that sub-device DUT is measured, and terminate in the first measuring equipment 14 and the second measuring equipment 16 to electronic devices under test
After the measurement of DUT, instruction controller 12 is provided to capture and instructed to the first measuring equipment 14 and the second measuring equipment 16, so that the
One measuring equipment 14 and the second measuring equipment 16 provide the first metric data and the second metric data to controller 12 respectively.
In another way, the batch procedure is except can be indicating controller 12 in when providing the first control
System instruction is given outside the first measuring equipment 14 and the second measuring equipment 16 with the second control instruction, and the batch procedure can also
To indicate controller 12 in when provide acquisition instruction to the first measuring equipment 14 and the second measuring equipment 16.Whereby, user
As long as the good all measurement plans of planning, are just able to make controller 12 be automatically completed all measurements by batch procedure.
Fig. 3 A are refer to, Fig. 3 A are the first rank when the measurement system according to depicted in one embodiment of the invention is measured
The schematic diagram of section.As shown in Figure 3A, in this stage, control device 12 as earlier mentioned in different time points by the first control instruction with
Second control instruction is respectively supplied to the first measuring equipment 14 and the second measuring equipment 16.
Fig. 3 B are refer to, Fig. 3 B are the second-order when measurement system according to depicted in one embodiment of the invention is measured
The schematic diagram of section.As shown in Figure 3B, controlled respectively according to first in this stage, the first measuring equipment 14 and the second measuring equipment 16
Instruction measures electronic devices under test DUT with the second control instruction, and the first measuring equipment 14 and the second measuring equipment 16
The first metric data of electronic devices under test DUT and second is obtained with the second control instruction according to the first control instruction respectively to measure
Data.
Fig. 3 C are refer to, Fig. 3 C are the 3rd rank when the measurement system according to depicted in one embodiment of the invention is measured
The schematic diagram of section.As shown in Figure 3 C, in this stage, controller 12 provide as earlier mentioned acquisition instruction to the first measuring equipment 14 with
Second measuring equipment 16.
Fig. 3 D are refer to, Fig. 3 D are the fourth order when measurement system according to depicted in one embodiment of the invention is measured
The schematic diagram of section.As shown in Figure 3D, in this stage, the first measuring equipment 14 and the foundation acquisition as earlier mentioned of the second measuring equipment 16
Instruction provides first metric data and the second metric data to controller 12.
In summary described, method for measurement provided by the present invention passes through in different batch time point from measurement system system
Different measuring equipments indescribably is given for control instruction, so as to allow different measuring equipments to the same electronic devices under test amount of progress
Survey.The different measuring equipments can obtain corresponding metric data from same electronic devices under test respectively.Whereby, this hair
Bright provided method for measurement can fill electronics to be measured by the same controller different measuring equipments of driving from measuring equipment
Put and measured.Moreover, during measurement, user simultaneously need not be as ago changed line configuring, greatly just again and again
Profit testing process.On the other hand, engineer can be by the demand of customization, to continue to expand the port number to be tested.
Additionally due to the operation of each instrument of parallel processing, each instrument receives alone instruct acquisition data respectively, and middle wait
Buffer time can share together, without adding up, also increase the efficiency of acquisition data.In addition captured down by program
The data come can inspect all numbers of channel, and to arrange data will also be easier into report, will not be as different notes before
The data that this computer or different time points are captured come from different subreports and cause to obscure.
Although the present invention is disclosed as above with foregoing embodiment, so it is not limited to the present invention.This hair is not being departed from
In bright spirit and scope, carried out by change and retouch, belong to the present invention scope of patent protection.Defined on the present invention
Protection domain refer to appended claims.
Claims (9)
- A kind of 1. method for measurement, it is characterised in that including：One first control instruction is provided to one first measuring equipment in the first batch time with a controller；One second control instruction is provided to one second measuring equipment in the second lot time with the controller, during the first batch Between be different from the second lot time；One first metric data of an electronic devices under test is obtained according to first control instruction with first measuring equipment；AndOne second metric data of the electronic devices under test is obtained according to second control instruction with second measuring equipment.
- 2. method for measurement according to claim 1, it is characterised in that further include：An acquisition is provided with the controller in one the 3rd batch time to instruct to first measuring equipment and second measuring equipment, 3rd batch time is later than first batch time and the second lot time；Offer first metric data is instructed to give the controller according to the acquisition with first measuring equipment；AndOffer second metric data is instructed to give the controller according to the acquisition with second measuring equipment.
- A kind of 3. measurement system, to be measured to an electronic devices under test, it is characterised in that the measurement system includes：One first measuring equipment, is for electrically connecting to the electronic devices under test, which refers to according to one first control Order optionally obtains one first metric data of the electronic devices under test；One second measuring equipment, is for electrically connecting to the electronic devices under test, which refers to according to one second control Order optionally obtains one second metric data of the electronic devices under test；AndOne controller, is electrically connected first measuring equipment and second measuring equipment, which produces first control System instruction and second control instruction, and the controller is according to a batch procedure and in different time points by first control instruction First measuring equipment and second measuring equipment are supplied to second control instruction.
- 4. measurement system according to claim 3, it is characterised in that the controller provided in the first batch time this One control instruction gives one first measuring equipment.
- 5. measurement system according to claim 3, it is characterised in that the controller provided in the second lot time this Two control instructions give one second measuring equipment, which is different from the second lot time.
- 6. measurement system according to claim 3, it is characterised in that the controller also provide an acquisition instruct to this first Measuring equipment and second measuring equipment, offer first metric data is instructed to activate first measuring equipment according to the acquisition The controller is given, and activates second measuring equipment second metric data is provided and give the controller.
- 7. measurement system according to claim 6, it is characterised in that the controller provides this in one the 3rd batch time and picks First measuring equipment and second measuring equipment are given in instruction fetch.
- 8. measurement system according to claim 7, it is characterised in that the 3rd batch time is later than the first batch time With the second lot time.
- 9. measurement system according to claim 3, it is characterised in that the controller is electric to pass through RS-232 serial ports Property connects first measuring equipment and second measuring equipment.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201711187635.7A CN107966625A (en) | 2017-11-24 | 2017-11-24 | Measurement system and method for measurement |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201711187635.7A CN107966625A (en) | 2017-11-24 | 2017-11-24 | Measurement system and method for measurement |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN107966625A true CN107966625A (en) | 2018-04-27 |
Family
ID=62000528
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201711187635.7A Pending CN107966625A (en) | 2017-11-24 | 2017-11-24 | Measurement system and method for measurement |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN107966625A (en) |
Citations (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN1924519A (en) * | 2005-09-02 | 2007-03-07 | 鸿富锦精密工业（深圳）有限公司 | Multiple point measuring system and method |
| CN201438204U (en) * | 2009-03-25 | 2010-04-14 | 佛山市顺德区顺达电脑厂有限公司 | Automation measurement system of electronic component |
| CN102230849A (en) * | 2009-11-24 | 2011-11-02 | 鸿富锦精密工业（深圳）有限公司 | Fan testing system and method |
| CN102419726A (en) * | 2010-09-28 | 2012-04-18 | 致茂电子(苏州)有限公司 | Method and system for testing dispersed configuration of programs |
| CN105699826A (en) * | 2016-04-06 | 2016-06-22 | 中国电子科技集团公司第十三研究所 | Microwave device automatic testing system and method |
-
2017
- 2017-11-24 CN CN201711187635.7A patent/CN107966625A/en active Pending
Patent Citations (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN1924519A (en) * | 2005-09-02 | 2007-03-07 | 鸿富锦精密工业（深圳）有限公司 | Multiple point measuring system and method |
| CN201438204U (en) * | 2009-03-25 | 2010-04-14 | 佛山市顺德区顺达电脑厂有限公司 | Automation measurement system of electronic component |
| CN102230849A (en) * | 2009-11-24 | 2011-11-02 | 鸿富锦精密工业（深圳）有限公司 | Fan testing system and method |
| CN102419726A (en) * | 2010-09-28 | 2012-04-18 | 致茂电子(苏州)有限公司 | Method and system for testing dispersed configuration of programs |
| CN105699826A (en) * | 2016-04-06 | 2016-06-22 | 中国电子科技集团公司第十三研究所 | Microwave device automatic testing system and method |
Non-Patent Citations (1)
| Title |
|---|
| 上海市半导体器件科学技术情报协作网: "《国外集成电路测试自动化 半导体器件生产自动化专辑》", 30 September 1977 * |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| CN104614668A (en) | Circuit board testing system | |
| CN202033663U (en) | Programmable logic controller (PLC) control function detecting system of printed circuit board | |
| CN110446932A (en) | The hardware testing of robot assisted | |
| FI126901B (en) | Method and system for testing an electronic unit | |
| CN102156255A (en) | A method of and an arrangement for testing connections on a printed circuit board | |
| WO2010061523A1 (en) | Testing method and program product used therein | |
| CN108427093A (en) | A kind of calibrating and measuring system and method for watt-hour meter automatic verification device | |
| CN107783069A (en) | The on-line calibration system and method for DC measurement in integrated circuit test system | |
| CN104375024A (en) | In-situ self-inspection and metering device and method of automatic test system | |
| CN107038697A (en) | Method and system for diagnosing semiconductor crystal wafer | |
| JP2018170418A5 (en) | ||
| TW201522999A (en) | System for testing slots according to test vectors and method thereof | |
| CN106225992A (en) | Based on pressure transmitter Performance Test System and method | |
| CN100511622C (en) | Method for emending output current by amending semiconductor pin test voltage | |
| CN107966625A (en) | Measurement system and method for measurement | |
| JP6644577B2 (en) | Testing system | |
| CN117007097A (en) | Sensor temperature calibration method, device, system, electronic equipment and medium | |
| US20190137566A1 (en) | System Level Health Monitoring in Test Systems | |
| CN108562813A (en) | A kind of test device of SiC Mosfet electrical properties | |
| CN107643476A (en) | A kind of Profibus insulated bus performance test methods based on virtual instrument technique | |
| CN104977483A (en) | Test apparatus, test system, and test method | |
| CN103809144B (en) | Transformation ratio tester verification system and detecting method thereof | |
| Otomański et al. | The application of the LabVIEW environment to evaluate the accuracy of alternating voltage measurements | |
| CN112006709A (en) | Labview-based automatic exposure testing system and method for X-ray high-voltage generator | |
| JP2004061448A (en) | Detection method for multi-drop wiring failure and multi-drop wiring system |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| PB01 | Publication | ||
| PB01 | Publication | ||
| SE01 | Entry into force of request for substantive examination | ||
| SE01 | Entry into force of request for substantive examination | ||
| WD01 | Invention patent application deemed withdrawn after publication |
Application publication date: 20180427 |
|
| WD01 | Invention patent application deemed withdrawn after publication |