CN104614668A - Circuit board testing system - Google Patents

Abstract

The invention discloses a circuit board testing system, which belongs to the field of electronic measurement, and comprises a zero-slot controller, a PXI bus, a PXI test module, a test interface and a tested circuit board, and the zero-slot controller is used for the measurement test bench control, signal interaction and data processing, the PXI test module is used to measure the functional characteristic indicators and parameters of the tested circuit board, and the PXI bus is used for the signal between the zero slot controller and the PXI test module transmission, the test interface is used to place the circuit board under test, and the zero slot controller controls the PXI test module through the PXI bus to troubleshoot the circuit board under test fixed on the test interface Diagnostics and performance testing. The circuit board testing system provided by the present invention can realize automatic testing of the overall function and performance of the PCB circuit board, and can provide measurement reports to measurement personnel, not only has a short measurement period, but also has accurate measurement results.

Description

A circuit board testing system

technical field

The invention relates to the field of electronic measurement, in particular to a circuit board testing system.

Background technique

PXI (PCI extensions for instrumentation) refers to PCI extensions for instrumentation systems, and is a PC-based measurement and automation platform. CAN bus (Controller Area Network) is the abbreviation of Controller Area Network, and it is one of the most widely used field buses in the world. GPIB bus (General-Purpose Interface Bus) refers to the general-purpose interface bus. Most desktop instruments are connected to PCs through GPIB lines and GPIB interfaces.

In the process of assembling each PCB circuit board, testing is required to ensure that the PCB circuit can work normally. For example, a motor drive controller needs to conduct a large number of tests on its performance and functions. Traditionally, some separate measuring instruments are used. Manually measure one by one, read the pointer data, and then summarize and analyze the collected data, and finally draw a conclusion whether the various performance parameters of the PCB circuit board meet the requirements.

For the above-mentioned measurement method, not only many people are required to cooperate with the measurement, the measurement period is long, the labor cost is high, and the measurement efficiency is low, but also due to the level of the measurement personnel or the limitation of the operating environment, it is inevitable that there will be misreading, misreading and forgetting to read. In the case of data, the measurement accuracy is low, and even the measurement of individual PCB circuit boards fails to reflect the real performance parameters of the PCB circuit board.

Contents of the invention

In order to overcome the defects of the prior art, the technical problem to be solved by the present invention is to propose a circuit board testing system, which can realize automatic testing of the overall function and performance of the PCB circuit board, and can provide measurement reports to the measurement personnel, not only measuring The cycle time is short and the measurement results are accurate.

For reaching this purpose, the present invention adopts following technical scheme:

A circuit board testing system provided by the present invention includes a zero-slot controller, a PXI bus, a PXI test module, a test interface, and a tested circuit board, and the zero-slot controller is used for the control, signal interaction and Data processing, the PXI test module is used to measure the functional characteristic indicators and parameters of the tested circuit board, the PXI bus is used for signal transmission between the zero slot controller and the PXI test module, and the test interface It is used to place the tested circuit board, and electrically connect the tested circuit board with the PXI test module, and the zero slot controller controls the PXI test module to be fixed on the test board through the PXI bus. The tested circuit board on the interface performs fault diagnosis and performance test.

Further technical scheme of the present invention, described PXI test module comprises:

One or more digital collection modules are used to collect detection signals output by the circuit board under test.

Digital stimulus response card for testing and controlling multiple digital signals.

The voltage synchronous output module is used to output multiple voltages to the test interface.

The multimeter module is used to measure the DC voltage, DC current, AC voltage, AC current or resistance of the tested circuit board through the test interface.

The communication module is used for data interaction and communication between the test interface and the PXI bus.

One or more matrix switch modules are used to control the signal flow and current flow between the test interface and the PXI bus.

One or more digital acquisition modules, digital stimulus response cards, voltage synchronization output modules, multimeter modules, communication modules and one or more matrix switch modules are connected in parallel, and one or more digital acquisition modules, digital stimulus response cards, voltage synchronization One end of the output module, the multimeter module, the communication module and one or more matrix switch modules are all electrically connected to the PXI bus, and the other ends are all electrically connected to the test interface.

In a further technical solution of the present invention, the communication module includes:

The CAN bus module is used for serial communication of distributed control or real-time control between the test interface and the PXI bus.

The 1553B bus module is used for time-division serial communication of distributed processing, centralized control and real-time response between the test interface and the PXI bus.

The RS232 serial port module is used to provide multiple independent serial channels for the test interface.

The RS485 serial port module is used to provide multiple independent networking serial channels for the test interface.

The CAN bus module, the 1553B bus module, the RS232 serial port module and the RS485 serial port module are connected in parallel with each other. One end of the CAN bus module, the 1553B bus module, the RS232 serial port module and the RS485 serial port module are electrically connected to the PXI bus, and the other ends are connected to the The above test interface is electrically connected.

A further technical solution of the present invention: the PXI test module also includes a boundary scan module, the boundary scan module is used to observe and control the input and output of the zero-slot controller in the debugging state, one end of which is connected to the The PXI bus is electrically connected, and its other end is electrically connected to the test interface.

In a further technical solution of the present invention, the circuit board testing system further includes a GPIB bus, and the GPIB bus is electrically connected to the PXI bus.

A further technical solution of the present invention: a programmable power supply, a desktop power supply, an arbitrary wave generator, a plurality of oscilloscopes, a logic analyzer, an electronic load, a temperature sensor and an emulator can be selectively connected between the GPIB bus and the test interface one or more of.

A further technical solution of the present invention: the test interface includes a fixture and an adapter box matched with the fixture.

A further technical solution of the present invention: the adapter includes a connector, a receiver, a first outer box, a second outer box, and a clamp frame, the connector is fixed inside the clamp frame, and the receiver is fixed on the The inside of the second outer box, the clamp frame is located between the first outer box and the second outer box, and the first outer box is fixedly connected to the second outer box.

A further technical solution of the present invention: the fixture includes a connector socket and an adapter board located outside the adapter box, an extension interface located on one side of the connector socket, and a probe electrically connected to the adapter box, The adapter board is provided with a socket for fixing the tested circuit board.

In a further technical solution of the present invention, the circuit board testing system also includes:

The test data exchange platform is used for data exchange.

Measurement program development platform for establishing test items and measurement steps.

The measurement program execution platform is used for automatic or semi-automatic testing of the circuit board under test.

The fault consultation platform is used to switch to the fault diagnosis mode when a fault is found on the circuit board under test.

The system management platform is used to manage the test data exchange platform, the measurement program development platform, the measurement program execution platform and the fault consultation platform.

The beneficial effects of the present invention are:

The measurement test bench provided by the present invention constitutes a comprehensive measurement system through the zero-slot controller, PXI bus, PXI test module, and test interface. The system has functions such as measurement development, measurement simulation, measurement execution, fault diagnosis, and system self-inspection. After the circuit board under test is fixed on the test interface, the automatic test of the overall function and performance of the circuit board under test can be realized. There is no need for manual intervention during the measurement process, and the circuit board under test can be measured in the way of automatic detection or human-computer interaction. The comprehensive measurement provides an integrated test program set development environment, and has the ability to execute system level and plug-in board level to meet the test requirements for extensions and modules, and the comprehensive measurement system also has a board-level fault diagnosis function. In addition, the comprehensive measurement system also reserves GPIB interface and expansion space, which can be connected to GPIB bus and other modules, so that users can integrate logic analyzers, desktop oscilloscopes and other equipment by themselves.

Description of drawings

Fig. 1 is the structural diagram of the circuit board testing system that the specific embodiment of the present invention provides;

Fig. 2 is the connection diagram of the GPIB bus that the specific embodiment of the present invention provides;

Fig. 3 is the structural diagram of the test platform that the specific embodiment of the present invention provides;

Fig. 4 is the structural diagram of the test data exchange platform that the specific embodiment of the present invention provides;

Fig. 5 is a structural diagram of a measurement program development platform provided by a specific embodiment of the present invention;

6 is a structural diagram of a measurement program execution platform provided by a specific embodiment of the present invention;

Fig. 7 is a structural diagram of an adapter box provided by a specific embodiment of the present invention;

Fig. 8 is a structural diagram of a clamp provided by a specific embodiment of the present invention.

In the picture:

1. Zero slot controller; 2. PXI bus; 4. Test interface; 5. Tested circuit board; 31. Digital acquisition module; 32. Digital stimulus response card; 33. Voltage synchronization output module; 34. Multimeter module; 36. Matrix switch module; 351. CAN bus module; 352. 1553B bus module; 353. RS232 serial port module; 354. RS485 serial port module; 6. GPIB bus; 61. Program-controlled power supply; 62. Desktop power supply; 63. Arbitrary wave generation 64, oscilloscope; 65, logic analyzer; 66, electronic load; 67, temperature sensor; 68, emulator; 71, connector; 72, receiver; 73, the first outer box; 74, the second outer box ;75, fixture frame; 81, connector socket; 82, extension interface; 83, adapter board; 84, socket; 000, test data exchange platform; 001, physical layout unit of circuit board under test; 002, circuit under test Board logical relationship diagram unit; 003, netlist converter unit; 004, physical map identification unit of the tested circuit board; 100, measurement program development platform; 101, test project management unit; 102, fault tree editor unit; 103, interface Adapter definition unit; 104, virtual instrument soft panel unit; 200, measurement program execution platform; 201, test execution management unit; 202, test data management unit; 300, fault consultation platform; 400, system management platform; 11, display; 12 , keyboard; 13, switch.

Detailed ways

The technical solutions of the present invention will be further described below in conjunction with the accompanying drawings and through specific implementation methods.

As shown in Fig. 1, a kind of circuit board test system provided in the present embodiment one, the measurement test bench includes zero slot controller 1, PXI bus 2, PXI test module, test interface 4, tested circuit board 5, display 11 , keyboard 12, switch 13 and cabinet. Among them, the zero-slot controller 1 is used for the control, signal interaction and data processing of the test bench, that is, the zero-slot controller 1 can control other modules, such as: PXI bus 2 and PXI test module, and control the source and PXI The data of the test module is analyzed and processed, and then the measurement result is displayed on the display 11 . The PXI test module is used to measure the functional characteristic indicators and parameters of the tested circuit board 5. The composition of the PXI test module can be selected according to the needs of the user to realize the detection of different tested circuit boards 5. The PXI test module detects Data from the test interface 4 is transmitted to the zero-slot controller 1 through the PXI bus 2 . The PXI bus 2 is used for signal transmission between the zero-slot controller 1 and the PXI test module, so that the zero-slot controller 1 and the PXI test module perform signal interaction. The test interface 4 is used to place the circuit board 5 under test, and electrically connect the circuit board 5 under test with the PXI test module, so that the PXI test module can test the performance parameter index of the circuit board 5 under test. The keyboard 12 is used for measuring personnel to input instructions during the process of human-computer interaction. Switch 13 is used for starting and shutting down of the measurement test bench. Usually, after the switch 13 is turned on, the zero-slot controller 1 in the measurement test bench will issue a control command to run a self-check program to detect whether the operating state of the entire measurement test bench is normal. The zero-slot controller 1, the PXI bus 2 and the PXI test module are all located inside the cabinet, the test interface 4 and the switch 13 are located on the cabinet, the display 11 and the keyboard 12 can be located on the cabinet, and the display 11 and keyboard of other PCs can also be used 12.

Preferably, the model of the zero-slot controller 1 is PXI-8106, which is a PXI bus embedded controller, so for the zero-slot controller 1 of this model, the PXI bus 2 can be canceled, and the zero-slot controller 1 has 1 Ethernet interface, ExpressCard slot, 2 high-speed USB ports, and GPIB interface.

In actual use, the zero-slot controller 1 controls the PXI test module through the PXI bus 2 to perform fault diagnosis and performance test on the tested circuit board 5 fixed on the test interface 4 . When detecting the circuit board 5 under test, automatic detection and human-computer interaction can be adopted, and the measured data can be judged by the zero-slot controller 1, and "qualified (passed)" or "failed (failed)" can be given. )" conclusion.

As shown in FIG. 2 , further, the PXI test module includes three digital acquisition modules 31 , a digital stimulus response card 32 , a voltage synchronization output module 33 , a multimeter module 34 , a communication module and two matrix switch modules 36 .

The number of digital acquisition modules 31 can be reasonably selected according to different circuit boards, and can be one, two or more, and the detection signal output by the circuit board 5 under test can be collected through the test interface 4 . The digital acquisition module 31 can be an A/D module, the model of which is PXI-2010, the number of channels is 4, the sampling rate is 2MS/s, the resolution is 14 bits, and the input voltage range is -10V～+10V.

Digital stimulus response card 32 has 48 digital stimulus/corresponding channels, compatible with TTL level, each channel can be programmed independently, the operation mode has bus read and write and automatic burst, the maximum burst rate is 40MSa/s, and is used for digital stimulus response card 32 In the test and control of multiple digital signals.

The voltage synchronous output module 33, model PXI-6733, has 8 channels of high-speed analog synchronous output, 1MS/s sampling rate, 16-bit resolution, and is used to output multiple voltages to the test interface 4, with an output range of ±10V.

Multimeter module 34, the model is PXI-4071, the measurement accuracy is 7.5 digits of reading resolution, the maximum voltage measurement range is ±300V, the maximum current measurement range is ±3A, the maximum resistance measurement range is 100MΩ, the multimeter module 34 can The DC voltage, DC current, AC voltage, AC current or resistance of the tested circuit board 5 is measured through the test interface 4 .

The matrix switch module 36 is used to control the signal flow and current direction between the test interface 4 and the PXI bus 2, and it includes a large current matrix switch module and a common matrix switch module, and the number can be one or more. Among them, the model of the high-current matrix switch module is 40-550-002, the matrix configuration is 4x8 (1 wire), the maximum current is 5A, and the maximum voltage is 35V; the model of the ordinary matrix switch module is DSR-SWITCH, and the matrix configuration is 4x12 (2 line), the maximum voltage is 100VDC, the maximum current is 500mA, and the bandwidth is 10MHz.

As shown in Figure 1, preferably, three digital acquisition modules 31, digital stimulus response card 32, voltage synchronous output module 33, multimeter module 34, communication module and two matrix switch modules 36 are connected in parallel with each other, three digital acquisition modules 31. One end of the digital stimulus response card 32, the voltage synchronization output module 33, the multimeter module 34, the communication module and two matrix switch modules 36 are electrically connected to the PXI bus 2, and the other ends are electrically connected to the test interface 4.

The communication module is used for data interaction and communication between the test interface 4 and the PXI bus 2, and can realize the communication between the circuit board 5 under test fixed at the test interface 4 and the zero-slot controller 1.

The communication module includes a CAN bus module 351 , a 1553B bus module 352 , an RS232 serial port module 353 and an RS485 serial port module 354 .

CAN bus module 351 is used for distributed control or real-time control serial communication between test interface 4 and PXI bus 2, its model is Cpct-7841, the number of channels is 2, CAN controller model is SJA1000, CAN transceiver The model is 82C250/251, and the isolation voltage is 2500Vrms.

The 1553B bus module 352 is used for time-division serial communication of distributed processing, centralized control and real-time response between the test interface 4 and the PXI bus 2 .

RS232 serial port module 353, the model is PXI-8430/2, the transmission baud rate is 57b/s to 1,000kb/s variable standard and non-standard baud rate, 128B transmission and reception FIFO, with 2 independent serial port channels , the RS232 serial port module 353 is used to provide multiple independent serial channels for the test interface 4 .

RS485 serial port module 354, the model is PXI-8431/2, the transmission baud rate is 57b/s to 3,000kb/s variable standard and non-standard baud rate, 128B transmission and reception FIFO, optional 4 lines and 2 Line transceiver mode, suitable for full-duplex and half-duplex communication, used to provide multiple independent networked serial channels for test interface 4.

CAN bus module 351, 1553B bus module 352, RS232 serial port module 353 and RS485 serial port module 354 are connected in parallel with each other. connected, and the other end is electrically connected to the test interface 4.

Further, the PXI test module also includes a boundary scan module, the boundary scan module is a JTAG boundary scan module and a test system, which has a 32-bit PXI/c PCI bus interface, an adjustable JTAG signal terminal, and can perform automatic signal deviation control and processing Depending on the cable and board configuration, power can be supplied to the target components through the JTAG connector. The boundary scan module is used to observe and control the input and output of the zero-slot controller 1 in the debugging state, one end of which is electrically connected to the PXI bus 2, and the other end is electrically connected to the test interface 4. sexual connection.

A comprehensive measurement system is formed by zero-slot controller 1, PXI bus 2, PXI test module, and test interface 4. The comprehensive measurement system has the functions of measurement development, measurement simulation, measurement execution, fault diagnosis, and system self-inspection.

As shown in FIG. 2 , further, the circuit board testing system further includes a GPIB bus 6 , and the GPIB bus 6 is electrically connected to the PXI bus 2 . Between the GPIB bus 6 and the test interface 4, a programmable power supply 61, a desktop power supply 62, an arbitrary wave generator 63, a plurality of oscilloscopes 64, a logic analyzer 65, an electronic load 66, a temperature sensor 67 and an emulator 68 can be selectively connected. One or more, that is, according to the needs of the user and the difference of the circuit board 5 to be tested, a programmable power supply 61, a desktop power supply 62, an arbitrary wave generator 63, multiple oscilloscopes 64, a logic analyzer 65, an electronic load 66, One or more of the temperature sensor 67 and the emulator 68 are arranged between the GPIB bus 6 and the test interface 4 . It can be seen that the circuit board testing system provided by the present application reserves a GPIB interface and expansion space, and can be externally connected to the GPIB bus and other modules, which is convenient for users to integrate the above-mentioned devices by themselves.

As shown in FIG. 7 , the test interface 4 includes a fixture and an adapter box, and the adapter box is matched with the fixture.

The adapter includes a connector 71, a receiver 72, a first outer box 73, a second outer box 74 and a clamp frame 75, the connector 71 is located on one side of the first outer box 73, and is fixed inside the clamp frame 75, and the receiver 72 is fixed on the inside of the second outer case 74, the clamp frame 75 is located between the first outer case 73 and the second outer case 74, the clamp frame 75 is inserted in the slot on the second outer case 74, the first outer case 73 is fixedly connected with the second outer case 74. The connector 71 can also be a cable of the circuit board under test, and the fixture electrically connects the PXI test module and the circuit board 5 under test through the connector 71 and the receiver 72 .

As shown in Figure 8, the fixture includes a connector socket 81, an extension interface 82, an adapter plate 83, and a probe 85. The connector socket 81 is located outside the adapter box, and several extension interfaces 82 are located on the extension of the adapter plate 83. The matching board 83 is located on one side of the adapter box, the probe 85 is electrically connected with the adapter box, and the adapter board 83 is provided with a socket 84 for fixing the tested circuit board 5 . When testing the circuit board 5 under test, the excitation required by the circuit board 5 under test is provided through the connector socket 81 and the extension interface 82 on the adapter board 83, and cooperates with the probe 85, according to the prompt on the operation interface, through the human The test of the circuit board 5 under test is realized in a machine-interactive manner.

As shown in Figure 3, the circuit board test system also includes a test integration environment composed of a test data exchange platform 000, a measurement program development platform 100, a measurement program execution platform 200, a fault consultation platform 300 and a system management platform 400, that is, a test platform, The test integration environment is a software environment, which guides the circuit board test system to perform functions such as test program development, test execution, fault diagnosis, and system self-inspection.

As shown in Figure 4, further, since the entire test integration environment involves the input and output of a large amount of data, it is necessary to adopt a test data exchange platform 000, which is used for data exchange, including the exchange of the physical map data of the tested circuit board 5 , Data exchange between units in the test integration environment, exchange of input and output data conforming to the netlist data format of EDIF200, data exchange between the test integration environment and office software, test data exchange platform 000 including the physical circuit board under test Layout diagram unit 001, circuit board logic diagram unit 002 under test, netlist converter unit 003, and circuit board physical diagram identification unit 004 under test.

As shown in FIG. 5 , further, the measurement program development platform 100 is used to establish test items and measurement steps. The measurement program development platform 100 can assist developers to complete the development of the test program by means of drawing, filling in forms, selection, manual programming, etc., establish test items and test steps, and realize the generation of test codes and the compilation of test libraries. The measurement program development platform 100 includes a test item management unit 101 , a fault tree editor unit 102 , an interface adapter definition unit 103 and a virtual instrument soft panel unit 104 . Therefore, the measurement program development platform 100 can specifically complete the establishment of test project files, the description of test steps, and the development of measurement codes based on the virtual instrument soft panel unit.

As shown in FIG. 6 , further, the measurement program execution platform 200 is used for automatic or semi-automatic testing of the circuit board under test 5. The measurement program execution platform 200 includes a test execution management unit 201 and a test data management unit 202. During actual measurement, The measurement program execution platform 200 assists the tester to complete the automatic/semi-automatic test of the circuit board under test 5 according to the procedure set by the tester by means of the driver program of each PXI test module or instrument.

The fault consulting platform 300 is used to switch to the fault diagnosis mode when a fault is found on the circuit board 5 under test. Specifically, the fault consulting platform 300 can use the fault tree to assist testers to complete fault location in an interactive manner. The platform mainly solves the problem of switching to the fault diagnosis mode when a fault is found on the circuit board 5 under test during the test execution process, and locating the fault to the faulty node or device of the circuit board 5 under test or a certain module.

The system management platform 400 is used to manage the test data exchange platform 000 , the measurement program development platform 100 , the measurement program execution platform 200 and the fault consultation platform 300 .

The present invention has been described through preferred embodiments, and those skilled in the art know that various changes or equivalent substitutions can be made to these features and embodiments without departing from the spirit and scope of the present invention. The present invention is not limited by the specific embodiments disclosed here, and other embodiments falling within the claims of the present application all belong to the protection scope of the present invention.

Claims (10)

1. a circuit board testing system, is characterized in that:

Comprise Zero greeve controller (1), PXI bus (2), PXI test module, test interface (4) and circuit-under-test plate (5);

Described Zero greeve controller (1) is mutual and data processing for the control of described measuring test-bed, signal, PXI test module is used for according to measuring circuit-under-test plate (5) functional characteristic index and parameter, described PXI bus (2) is for the Signal transmissions between described Zero greeve controller (1) and described PXI test module, described circuit-under-test plate (5) and described PXI test module for laying described circuit-under-test plate (5), and conduct by described test interface (4);

Described Zero greeve controller (1) controls described PXI test module by described PXI bus (2) and carries out fault diagnosis and performance test to the described circuit-under-test plate (5) be fixed on described test interface (4).

2. circuit board testing system according to claim 1, is characterized in that,

Described PXI test module comprises:

One or more digital collection module (31), for gathering the detection signal that described circuit-under-test plate (5) exports;

Digital actuation response card (32), for test and the control of multiply digital signals;

Voltage synchronous output module (33), for described test interface (4) output multi-channel voltage;

Multimeter module (34), for measuring the DC voltage of described circuit-under-test plate (5), DC current, alternating voltage, alternating current or resistance by described test interface (4);

Communication module, for the data interaction between described test interface (4) and described PXI bus (2) with communicate;

One or more matrix switch module (36), flow to for the signal controlled between described test interface (4) and described PXI bus (2) and electric current to;

One or more digital collection module (31), digital actuation response card (32), voltage synchronous output module (33), multimeter module (34), communication module and one or more matrix switch module (36) parallel with one another, one or more digital collection module (31), digital actuation response card (32), voltage synchronous output module (33), multimeter module (34), one end of communication module and one or more matrix switch module (36) is all electrically connected with described PXI bus (2), the other end is all electrically connected with described test interface (4).

3. circuit board testing system according to claim 2, is characterized in that,

Described communication module comprises:

CAN module (351), for the distributed AC servo system between described test interface (4) and described PXI bus (2) or the real-time serial communication controlled;

1553B bus module (352), for the time-division serial communication of distribution process, centralized control and the real-time response between described test interface (4) and described PXI bus (2);

RS232 serial port module (353), provides multiple independently serial-port for giving described test interface (4);

RS485 serial port module (354), provides multiple serial-port of independently networking for giving described test interface (4);

CAN module (351), 1553B bus module (352), RS232 serial port module (353) and RS485 serial port module (354) are parallel with one another, one end of CAN module (351), 1553B bus module (352), RS232 serial port module (353) and RS485 serial port module (354) is all electrically connected with described PXI bus (2), and the other end is all electrically connected with described test interface (4).

4. circuit board testing system according to claim 2, is characterized in that,

Described PXI test module also comprises boundary scan module;

Described boundary scan module is used for carrying out corresponding observation and control to the input and output of described Zero greeve controller (1) in a debug state, its one end and described PXI bus (2) are electrically connected, and its other end and described test interface (4) are electrically connected.

5. circuit board testing system according to claim 1, is characterized in that,

Also comprise gpib bus (6);

Described gpib bus (6) and described PXI bus (2) are electrically connected.

6. circuit board testing system according to claim 5, is characterized in that,

Optionally be connected in programmable power supply (61), desk-top power supply (62), Arbitrary Waveform Generator (63), multiple oscillograph (64), logic analyser (65), electronic load (66), temperature sensor (67) and emulator (68) between described gpib bus (6) with described test interface (4) one or more.

7. circuit board testing system according to claim 1, is characterized in that:

The box adapter that described test interface (4) comprises fixture, matches with described fixture.

8. circuit board testing system according to claim 7, is characterized in that:

Described adapter comprises connector (71), receiver (72), the first outer container (73), the second outer container (74) and jig frame (75);

Described connector (71) is fixed on the inside of described jig frame (75), described receiver (72) is fixed on the inside of described second outer container (74), described jig frame (75) is positioned between described first outer container (73) and described second outer container (74), and described first outer container (73) is fixedly connected with described second outer container (74).

9. circuit board testing system according to claim 7, is characterized in that:

Described fixture comprises the connector body (81) and adaptation board (83), the extension interface (82) being positioned at described connector body (81) side and the probe pen (85) be electrically connected with described box adapter that are positioned at described box adapter outside;

Described adaptation board (83) is provided with the socket (84) for fixing described circuit-under-test plate (5).

10. circuit board testing system according to claim 1, is characterized in that, also comprises:

Test data switching plane (000), for the exchange of data;

Process of measurement development platform (100), for setting up test event and measuring process;

Process of measurement performs platform (200), for the automatic or semi-automatic test to described circuit-under-test plate (5);

Trouble diagnose platform (300), during for finding circuit-under-test plate (5) fault, proceeds to fault diagnosis model;

System management platform (400), for managing described test data switching plane (000), described process of measurement development platform (100), described process of measurement execution platform (200) and Trouble diagnose platform (300).