CN104614668A - Circuit board testing system - Google Patents
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- CN104614668A CN104614668A CN201510089024.3A CN201510089024A CN104614668A CN 104614668 A CN104614668 A CN 104614668A CN 201510089024 A CN201510089024 A CN 201510089024A CN 104614668 A CN104614668 A CN 104614668A
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Abstract
Description
Technical field
The present invention relates to electronic surveying field, particularly relate to a kind of circuit board testing system.
Background technology
PXI (PCI extensions for instrumentation) refers to that the PCI towards instrument system expands, and is a kind of measurement based on PC and robotization platform.CAN (Controller Area Network) is the abbreviation of controller local area network, is one of fieldbus be most widely used in the world.Gpib bus (General-Purpose Interface Bus) refers to general purpose interface bus, and most of desk-top instrument is all be connected with PC by GPIB line and gpib interface.
All need to test in the process of the every block PCB of assembling, to ensure that PCB circuit can normally work, as: motor drive controller just needs to test in a large number its performance and function, some surveying instruments be separated can be used traditionally, measured by artificial carrying out one by one, reading pointer data, the Data induction analysis will gathered subsequently, finally draws the whether satisfactory conclusion of PCB various performance parameters.
For above-mentioned measuring method, many people conjunction measuring is needed when not only measuring, measuring period is long, cost of labor is high, measurement efficiency is low, and due to the level of survey crew or the restriction of operating environment, there will be the situation mispronouncing, misread and forget read data unavoidably, measuring accuracy is lower, even fails to reflect the actual performance parameter of PCB for the measurement of indivedual PCB.
Summary of the invention
In order to overcome the defect of prior art, technical matters to be solved by this invention is to propose a kind of circuit board testing system, can realize the allomeric function of PCB and the automatic test of performance, and measurement report can be provided to survey crew, not only measuring period is short, and measurement result is accurate.
For reaching this object, the present invention by the following technical solutions:
A kind of circuit board testing system provided by the invention, comprise Zero greeve controller, PXI bus, PXI test module, test interface and circuit-under-test plate, described Zero greeve controller is used for the control of described measuring test-bed, mutual and the data processing of signal, PXI test module is used for according to measuring circuit-under-test plate functional characteristic index and parameter, described PXI bus is used for the Signal transmissions between described Zero greeve controller and described PXI test module, described test interface is used for laying described circuit-under-test plate, and described circuit-under-test plate and described PXI test module are conducted, described Zero greeve controller carries out fault diagnosis and performance test by PXI test module described in described PXI bus marco to the described circuit-under-test plate be fixed on described test interface.
Further technical scheme of the present invention, described PXI test module comprises:
One or more digital collection module, for gathering the detection signal that described circuit-under-test plate exports.
Digital actuation response card, for test and the control of multiply digital signals.
Voltage synchronous output module, for described test interface output multi-channel voltage.
Multimeter module, for measuring the DC voltage of described circuit-under-test plate, DC current, alternating voltage, alternating current or resistance by described test interface.
Communication module, for the data interaction between described test interface and described PXI bus with communicate.
One or more matrix switch module, flow to for the signal controlled between described test interface and described PXI bus and electric current to.
One or more digital collection module, digital actuation respond card, voltage synchronous output module, multimeter module, communication module and one or more matrix switch module are parallel with one another, one end of one or more digital collection module, digital actuation response card, voltage synchronous output module, multimeter module, communication module and one or more matrix switch module is all electrically connected with described PXI bus, and the other end is all electrically connected with described test interface.
Further technical scheme of the present invention, described communication module comprises:
CAN module, for the distributed AC servo system between described test interface and described PXI bus or the real-time serial communication controlled.
1553B bus module, for the time-division serial communication of distribution process, centralized control and the real-time response between described test interface and described PXI bus.
RS232 serial port module, provides multiple independently serial-port for giving described test interface.
RS485 serial port module, provides multiple serial-port of independently networking for giving described test interface.
CAN module, 1553B bus module, RS232 serial port module and RS485 serial port module are parallel with one another, one end of CAN module, 1553B bus module, RS232 serial port module and RS485 serial port module is all electrically connected with described PXI bus, and the other end is all electrically connected with described test interface.
Further technical scheme of the present invention: described PXI test module also comprises boundary scan module, described boundary scan module is used for carrying out corresponding observation and control to the input and output of described Zero greeve controller in a debug state, its one end and described PXI bus are electrically connected, and its other end and described test interface are electrically connected.
Further technical scheme of the present invention, described circuit board testing system also comprises gpib bus, and described gpib bus and described PXI bus are electrically connected.
Further technical scheme of the present invention: be optionally connected in programmable power supply, desk-top power supply, Arbitrary Waveform Generator, multiple oscillograph, logic analyser, electronic load, temperature sensor and emulator between described gpib bus with described test interface one or more.
Further technical scheme of the present invention: the box adapter that described test interface comprises fixture, matches with described fixture.
Further technical scheme of the present invention: described adapter comprises connector, receiver, the first outer container, the second outer container and jig frame, described connector is fixed on the inside of described jig frame, described receiver is fixed on the inside of described second outer container, described jig frame is between described first outer container and described second outer container, and described first outer container is fixedly connected with described second outer container.
Further technical scheme of the present invention: described fixture comprises the connector body and adaptation board, the extension interface being positioned at described connector body side and the probe pen be electrically connected with described box adapter that are positioned at described box adapter outside, described adaptation board is provided with the socket for fixing described circuit-under-test plate.
Further technical scheme of the present invention, described circuit board testing system also comprises:
Test data switching plane, for the exchange of data.
Process of measurement development platform, for setting up test event and measuring process.
Process of measurement performs platform, for the automatic or semi-automatic test to described circuit-under-test plate.
Trouble diagnose platform, during for finding circuit-under-test plate fault, proceeds to fault diagnosis model.
System management platform, for managing described test data switching plane, described process of measurement development platform, described process of measurement execution platform and Trouble diagnose platform.
Beneficial effect of the present invention is:
Experiments of measuring platform provided by the invention, an Integrated Measurement System is formed by Zero greeve controller, PXI bus, PXI test module, test interface, this system has measurement exploitation, measures emulation, measures the functions such as execution, fault diagnosis and System self-test, after test interface fixes circuit-under-test plate, the automatic test of circuit-under-test slab integral function and performance can be realized, without the need to manual intervention in measuring process, the mode of detection or man-machine interaction automatically can be selected to measure circuit-under-test plate.This composite measurement provides integrated test program set development environment, and has the ability of executive system level and board level, meet the testing requirement to extension set and module, and this Integrated Measurement System also has plate level fault diagnosis functions.In addition, this Integrated Measurement System has also reserved gpib interface and extending space, can external gpib bus and other modules, facilitates user's integrated logic analyzer, desk-top oscillograph and miscellaneous equipment voluntarily.
Accompanying drawing explanation
Fig. 1 is the structural drawing of the circuit board testing system that the specific embodiment of the invention provides;
Fig. 2 is the annexation figure of the gpib bus that the specific embodiment of the invention provides;
Fig. 3 is the structural drawing of the test platform that the specific embodiment of the invention provides;
Fig. 4 is the structural drawing of the test data switching plane that the specific embodiment of the invention provides;
Fig. 5 is the structural drawing of the process of measurement development platform that the specific embodiment of the invention provides;
Fig. 6 is the structural drawing of the process of measurement execution platform that the specific embodiment of the invention provides;
Fig. 7 is the structural drawing of the box adapter that the specific embodiment of the invention provides;
Fig. 8 is the structural drawing of the fixture that the specific embodiment of the invention provides.
In figure:
1, Zero greeve controller; 2, PXI bus; 4, test interface; 5, circuit-under-test plate; 31, digital collection module; 32, digital actuation response card; 33, voltage synchronous output module; 34, multimeter module; 36, matrix switch module; 351, CAN module; 352,1553B bus module; 353, RS232 serial port module; 354, RS485 serial port module; 6, gpib bus; 61, programmable power supply; 62, desk-top power supply; 63, Arbitrary Waveform Generator; 64, oscillograph; 65, logic analyser; 66, electronic load; 67, temperature sensor; 68, emulator; 71, connector; 72, receiver; 73, the first outer container; 74, the second outer container; 75, jig frame; 81, connector body; 82, interface is extended; 83, adaptation board; 84, socket; 000, test data switching plane; 001, circuit-under-test plate physical layout unit; 002, circuit-under-test plate logic relation picture unit; 003, net table converter unit; 004, circuit-under-test plate pictorial diagram identify unit; 100, process of measurement development platform; 101, test event administrative unit; 102, Fault-tree editor device unit; 103, interface adapter definition unit; 104, virtual instrument softpanel unit; 200, process of measurement performs platform; 201, test execution management unit; 202, test data administrative unit; 300, Trouble diagnose platform; 400, system management platform; 11, display; 12, keyboard; 13, switch.
Embodiment
Technical scheme of the present invention is further illustrated by embodiment below in conjunction with accompanying drawing.
As shown in Figure 1, a kind of circuit board testing system provided in the present embodiment one, experiments of measuring platform comprises Zero greeve controller 1, PXI bus 2, PXI test module, test interface 4, circuit-under-test plate 5, display 11, keyboard 12, switch 13 and rack.Wherein, Zero greeve controller 1 is mutual and data processing for the control of measuring test-bed, signal, namely Zero greeve controller 1 can to other modules, as: PXI bus 2 and PXI test module, control, and to source and the data analysis process of PXI test module, then measurement result is shown by display 11.PXI test module is used for according to measuring circuit-under-test plate 5 functional characteristic index and parameter, can according to user need the composition of PXI test module is selected, realize the detection to different circuit-under-test plate 5, PXI test module detects that the data from test interface 4 are transferred in Zero greeve controller 1 by PXI bus 2.PXI bus 2 for the Signal transmissions between Zero greeve controller 1 and PXI test module so that Zero greeve controller 1 and PXI test module to carry out signal mutual.Circuit-under-test plate 5 and PXI test module for laying circuit-under-test plate 5, and conduct by test interface 4, are convenient to the performance parameter index of PXI test module to circuit-under-test plate 5 and test.Keyboard 12 is for survey crew input instruction in the process of human-computer interaction.Switch 13 is for the startup and shutdown of experiments of measuring platform, and usually after switch 13 is connected, the Zero greeve controller 1 in measuring test-bed can send steering order and run self-check program, and whether the running status detecting whole measuring test-bed is normal.Zero greeve controller 1, PXI bus 2 and PXI test module are all positioned at the inside of rack, and test interface 4 and switch 13 are positioned on rack, and display 11 and keyboard 12 can be positioned on rack, also can use display 11 and the keyboard 12 of other PCs.
Preferably, the model of Zero greeve controller 1 is PXI-8106, it is a kind of PXI bus embedded type controller, therefore for the Zero greeve controller 1 of this model, can cancel PXI bus 2, this Zero greeve controller 1 has 1 Ethernet interface, ExpressCard slot, 2 high speed USB ports and gpib interface.
During actual use, Zero greeve controller 1 carries out fault diagnosis and performance test by PXI bus 2 control PXI test module to the circuit-under-test plate 5 be fixed on test interface 4.The mode of mode and the human-computer interaction automatically detected can be adopted when circuit-under-test plate 5 is detected, by Zero greeve controller 1, surveyed data are judged, provide the conclusion of " qualified (passing through) " or " defective (not passing through) ".
As shown in Figure 2, further, PXI test module comprises three digital acquisition modules 31, digital actuation response card 32, voltage synchronous output module 33, multimeter module 34, communication module and two matrix switch modules 36.
The number of digital collection module 31 can according to the difference of circuit board choose reasonable, can be one, two or more, can gather by test interface 4 detection signal that circuit-under-test plate 5 exports.Digital collection module 31 can be A/D module, and its model is PXI-2010, and port number is 4 tunnels, and sampling rate is 2MS/s, 14 bit resolutions, and input voltage range is-10V ~+10V.
Digital actuation response card 32 has 48 railway digital excitation/respective channel, compatible Transistor-Transistor Logic level, each passage can independently be programmed, and operator scheme has bus read and write and automatically burst, maximum burst speed is 40MSa/s, and digital actuation response card 32 is for the test of multiply digital signals and control.
Voltage synchronous output module 33, model is PXI-6733, and it has 8 passage High Speed Analog synchronism output, 1MS/s sampling rate, 16 bit resolutions, and for test interface 4 output multi-channel voltage, output area is ± 10V.
Multimeter module 34, model is PXI-4071, measuring accuracy is 7.5 place reading resolution, maximum voltage measurement range is for ± 300V, maximum current measurement range is ± 3A, maximum resistance measurement range is 100M Ω, and multimeter module 34 can measure the DC voltage of circuit-under-test plate 5, DC current, alternating voltage, alternating current or resistance by test interface 4.
Matrix switch module 36 flow to for the signal controlled between test interface 4 and PXI bus 2 and electric current to, it comprises big current matrix switch module and ordinary channel switch module, and its quantity can be one or more.Wherein, big current matrix switch module model is 40-550-002, and matrix configuration is 4x8 (1 line), and maximum current is 5A, and maximum voltage is 35V; Ordinary channel switch module model is DSR-SWITCH, and matrix configuration is 4x12 (2 line), and maximum voltage is 100VDC, and maximum current is 500mA, and broadband is 10MHz.
As shown in Figure 1, preferably, three digital acquisition modules 31, digital actuation response card 32, voltage synchronous output module 33, multimeter module 34, communication module and two matrix switch modules 36 are parallel with one another, one end of the response of three digital acquisition modules 31, digital actuation card 32, voltage synchronous output module 33, multimeter module 34, communication module and two matrix switch modules 36 is all electrically connected with PXI bus 2, and the other end is all electrically connected with test interface 4.
Communication module, for the data interaction between test interface 4 and PXI bus 2 with communicate, the communication between the circuit-under-test plate 5 fixed at test interface 4 place and Zero greeve controller 1 can be realized.
Communication module comprises CAN module 351,1553B bus module 352, RS232 serial port module 353 and RS485 serial port module 354.
CAN module 351 is for the distributed AC servo system between test interface 4 and PXI bus 2 or the real-time serial communication controlled, its model is Cpct-7841, and port number is 2 tunnels, and CAN controller model is SJA1000, CAN transceiver model is 82C250/251, and isolation voltage is 2500Vrms.
1553B bus module 352 is for the time-division serial communication of the distribution process between test interface 4 and PXI bus 2, centralized control and real-time response.
RS232 serial port module 353, model is PXI-8430/2, Transmission bit rate is 57b/s to 1, the standard that 000kb/s is variable and non-standard baud rate, 128B transmits and receives FIFO, have 2 independently serial ports passages, RS232 serial port module 353 provides multiple independently serial-port for giving test interface 4.
RS485 serial port module 354, model is PXI-8431/2, Transmission bit rate is 57b/s to 3, the standard that 000kb/s is variable and non-standard baud rate, 128B transmits and receives FIFO, optional 4 lines and 2 line transceiver patterns, be applicable to full and half duplex communication, provides multiple serial-port of independently networking for giving test interface 4.
CAN module 351,1553B bus module 352, RS232 serial port module 353 and RS485 serial port module 354 are parallel with one another, one end of CAN module 351,1553B bus module 352, RS232 serial port module 353 and RS485 serial port module 354 is all electrically connected with PXI bus 2, and the other end is all electrically connected with test interface 4.
Further, PXI test module also comprises boundary scan module, boundary scan module is jtag boundary scan module and test macro, it has 32 PXI/c pci bus interfaces, adjustable JTAG Signal Terminal, the control of automatic signal deviation can be carried out and process different cables and the configuration of circuit board, power supply can be supplied to object component by JTAG connector.Boundary scan module is used for carrying out corresponding observation and control to the input and output of described Zero greeve controller 1 in a debug state, and its one end and described PXI bus 2 are electrically connected, and its other end and described test interface 4 are electrically connected.
Form an Integrated Measurement System by Zero greeve controller 1, PXI bus 2, PXI test module, test interface 4, this Integrated Measurement System has measurement exploitation, measures emulation, measures the functions such as execution, fault diagnosis and System self-test.
As shown in Figure 2, further, circuit board testing system also comprises gpib bus 6, and gpib bus 6 and PXI bus 2 are electrically connected.Programmable power supply 61 is optionally connected between gpib bus 6 with test interface 4, desk-top power supply 62, Arbitrary Waveform Generator 63, multiple oscillograph 64, logic analyser 65, electronic load 66, one or more in temperature sensor 67 and emulator 68, namely can according to the difference of the needs of user and circuit-under-test plate 5, select programmable power supply 61, desk-top power supply 62, Arbitrary Waveform Generator 63, multiple oscillograph 64, logic analyser 65, electronic load 66, one or more in temperature sensor 67 and emulator 68 is arranged between gpib bus 6 and test interface 4.As can be seen here, the circuit board testing system that the application provides has reserved gpib interface and extending space, can external gpib bus and other modules, facilitates user's integrated the said equipment voluntarily.
As shown in Figure 7, test interface 4 comprises fixture and box adapter, and box adapter matches with fixture.
Adapter comprises connector 71, receiver 72, first outer container 73, second outer container 74 and jig frame 75, connector 71 is positioned at the side of the first outer container 73, and be fixed on the inside of jig frame 75, receiver 72 is fixed on the inside of the second outer container 74, jig frame 75 is between the first outer container 73 and the second outer container 74, jig frame 75 is plugged in the slot on the second outer container 74, and the first outer container 73 is fixedly connected with the second outer container 74.Connector 71 also can be circuit-under-test plate cable, and PXI test module and circuit-under-test plate 5 are electrically connected by connector 71 and receiver 72 by fixture.
As shown in Figure 8, fixture comprises connector body 81, extends interface 82, adaptation board 83 and probe pen 85, connector body 81 is positioned at the outside of box adapter, some extension interfaces 82 are positioned at the extension position of adaptation board 83, adaptation board 83 is positioned at the side of box adapter, probe pen 85 and box adapter are electrically connected, and adaptation board 83 is provided with the socket 84 for fixing circuit-under-test plate 5.When circuit-under-test plate 5 is tested, excitation needed for circuit-under-test plate 5 is provided by the extension interface 82 on connector body 81, adaptation board 83, coordinates probe pen 85, according to the prompting on operation interface, by the mode of human-computer interaction, realize the test to circuit-under-test plate 5.
As shown in Figure 3, circuit board testing system also comprises the test integration environment be made up of test data switching plane 000, process of measurement development platform 100, process of measurement execution platform 200, Trouble diagnose platform 300 and system management platform 400, i.e. test platform, this test integration environment is software environment, instructs circuit board testing system to carry out the functions such as test program set exploitation, test execution, fault diagnosis and System self-test.
As shown in Figure 4, further, because whole test integration environment relates to the constrained input of mass data, therefore need to adopt test data switching plane 000, this platform is used for the exchange of data, comprise the exchange of circuit-under-test plate 5 pictorial diagram data, exchanges data between each unit of test integration environment, meet the exchange of the constrained input data of the netlist data form of EDIF200, exchanges data between test integration environment and office software, test data switching plane 000 comprises circuit-under-test plate physical layout unit 001, circuit-under-test plate logic relation picture unit 002, net table converter unit 003 and circuit-under-test plate pictorial diagram identify unit 004.
As shown in Figure 5, further, process of measurement development platform 100 is for setting up test event and measuring process.Process of measurement development platform 100 can complete the exploitation of test procedure with mode auxiliary development personnel such as picture, lattice of filling in a form, selection, manual programmings, set up test event and testing procedure, realize the generation of test code and the compiling of test library.Process of measurement development platform 100 comprises test event administrative unit 101, Fault-tree editor device unit 102, interface adapter definition unit 103 and virtual instrument softpanel unit 104.Therefore process of measurement development platform 100 specifically can complete the foundation of test event file, the description of testing procedure, the exploitation etc. based on the measurement code of virtual instrument softpanel unit.
As shown in Figure 6, further, process of measurement performs platform 200 for the automatic or semi-automatic test to circuit-under-test plate 5, process of measurement performs platform 200 and comprises test execution management unit 201 and test data administrative unit 202, in actual measurement process, process of measurement performs the driver of platform 200 by each PXI test module or instrument, and according to the flow process of tester's setting, subtest personnel complete the automatic/semi-automatic test of circuit-under-test plate 5.
When Trouble diagnose platform 300 is for finding circuit-under-test plate 5 fault, proceed to fault diagnosis model.Concrete, Trouble diagnose platform 300 can utilize fault tree interactively subtest personnel complete localization of fault.This platform mainly solves in measuring executing process, when finding circuit-under-test plate 5 fault, proceeds to fault diagnosis model, and by localization of fault to the malfunctioning node of circuit-under-test plate 5 or certain module or defective device.
System management platform 400, performs platform 200 and Trouble diagnose platform 300 for management testing data interchange platform 000, process of measurement development platform 100, process of measurement.
The present invention is described by preferred embodiment, and those skilled in the art know, without departing from the spirit and scope of the present invention, can carry out various change or equivalence replacement to these characteristic sum embodiments.The present invention is not by the restriction of specific embodiment disclosed herein, and other embodiments fallen in the claim of the application all belong to the scope of protection of the invention.
Claims (10)
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Application publication date: 20150513 |