CN104614668A - Circuit board testing system - Google Patents
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Abstract
本发明公开了一种电路板测试系统,属于电子测量领域,其包括零槽控制器、PXI总线、PXI测试模块、测试接口以及被测电路板,所述零槽控制器用于所述测量试验台的控制、信号交互以及数据处理,PXI测试模块用于根据对被测电路板功能特性指标及参数进行测量,所述PXI总线用于所述零槽控制器与所述PXI测试模块之间的信号传输,所述测试接口用于安放所述被测电路板,所述零槽控制器通过所述PXI总线控制所述PXI测试模块对固定在所述测试接口上的所述被测电路板进行故障诊断和性能测试。本发明提供的电路板测试系统,能实现对PCB电路板的整体功能和性能的自动测试,且能够向测量人员提供测量报告,不仅测量周期短,而且测量结果精准。
The invention discloses a circuit board testing system, which belongs to the field of electronic measurement, and comprises a zero-slot controller, a PXI bus, a PXI test module, a test interface and a tested circuit board, and the zero-slot controller is used for the measurement test bench control, signal interaction and data processing, the PXI test module is used to measure the functional characteristic indicators and parameters of the tested circuit board, and the PXI bus is used for the signal between the zero slot controller and the PXI test module transmission, the test interface is used to place the circuit board under test, and the zero slot controller controls the PXI test module through the PXI bus to troubleshoot the circuit board under test fixed on the test interface Diagnostics and performance testing. The circuit board testing system provided by the present invention can realize automatic testing of the overall function and performance of the PCB circuit board, and can provide measurement reports to measurement personnel, not only has a short measurement period, but also has accurate measurement results.
Description
技术领域technical field
本发明涉及电子测量领域,尤其涉及一种电路板测试系统。The invention relates to the field of electronic measurement, in particular to a circuit board testing system.
背景技术Background technique
PXI(PCI extensions for instrumentation)是指面向仪器系统的PCI扩展,是一种基于PC机的测量和自动化平台。CAN总线(Controller Area Network)是控制器局域网的简称,是国际上应用最为广泛的现场总线之一。GPIB总线(General-Purpose Interface Bus)是指通用接口总线,大多数台式仪器都是通过GPIB线以及GPIB接口与PC机相连。PXI (PCI extensions for instrumentation) refers to PCI extensions for instrumentation systems, and is a PC-based measurement and automation platform. CAN bus (Controller Area Network) is the abbreviation of Controller Area Network, and it is one of the most widely used field buses in the world. GPIB bus (General-Purpose Interface Bus) refers to the general-purpose interface bus. Most desktop instruments are connected to PCs through GPIB lines and GPIB interfaces.
在组装每块PCB电路板的过程中都需要进行测试,以保证PCB电路能正常工作,如:电机驱动控制器就需要对其性能与功能进行大量测试,传统上会使用一些分离的测量仪器,由人工逐一的进行测量,读取指针数据,随后将采集的数据归纳分析,最终得出PCB电路板各项性能参数是否符合要求的结论。In the process of assembling each PCB circuit board, testing is required to ensure that the PCB circuit can work normally. For example, a motor drive controller needs to conduct a large number of tests on its performance and functions. Traditionally, some separate measuring instruments are used. Manually measure one by one, read the pointer data, and then summarize and analyze the collected data, and finally draw a conclusion whether the various performance parameters of the PCB circuit board meet the requirements.
对于上述的测量方法,不仅测量时需要多人配合测量,测量周期长,人工成本高,测量效率低,而且由于测量人员的水平或操作环境的限制,难免会出现错读、误读以及忘读数据的情况,测量精度较低,甚至对于个别PCB电路板的测量未能反映出PCB电路板的真实性能参数。For the above-mentioned measurement method, not only many people are required to cooperate with the measurement, the measurement period is long, the labor cost is high, and the measurement efficiency is low, but also due to the level of the measurement personnel or the limitation of the operating environment, it is inevitable that there will be misreading, misreading and forgetting to read. In the case of data, the measurement accuracy is low, and even the measurement of individual PCB circuit boards fails to reflect the real performance parameters of the PCB circuit board.
发明内容Contents of the invention
为了克服现有技术的缺陷,本发明所要解决的技术问题在于提出一种电路板测试系统,能实现对PCB电路板的整体功能和性能的自动测试,且能够向测量人员提供测量报告,不仅测量周期短,而且测量结果精准。In order to overcome the defects of the prior art, the technical problem to be solved by the present invention is to propose a circuit board testing system, which can realize automatic testing of the overall function and performance of the PCB circuit board, and can provide measurement reports to the measurement personnel, not only measuring The cycle time is short and the measurement results are accurate.
为达此目的,本发明采用以下技术方案:For reaching this purpose, the present invention adopts following technical scheme:
本发明提供的一种电路板测试系统,包括零槽控制器、PXI总线、PXI测试模块、测试接口以及被测电路板,所述零槽控制器用于所述测量试验台的控制、信号交互以及数据处理,PXI测试模块用于根据对被测电路板功能特性指标及参数进行测量,所述PXI总线用于所述零槽控制器与所述PXI测试模块之间的信号传输,所述测试接口用于安放所述被测电路板,且将所述被测电路板与所述PXI测试模块电导通,所述零槽控制器通过所述PXI总线控制所述PXI测试模块对固定在所述测试接口上的所述被测电路板进行故障诊断和性能测试。A circuit board testing system provided by the present invention includes a zero-slot controller, a PXI bus, a PXI test module, a test interface, and a tested circuit board, and the zero-slot controller is used for the control, signal interaction and Data processing, the PXI test module is used to measure the functional characteristic indicators and parameters of the tested circuit board, the PXI bus is used for signal transmission between the zero slot controller and the PXI test module, and the test interface It is used to place the tested circuit board, and electrically connect the tested circuit board with the PXI test module, and the zero slot controller controls the PXI test module to be fixed on the test board through the PXI bus. The tested circuit board on the interface performs fault diagnosis and performance test.
本发明的进一步技术方案,所述PXI测试模块包括:Further technical scheme of the present invention, described PXI test module comprises:
一个或者多个数字采集模块,用于采集所述被测电路板输出的检测信号。One or more digital collection modules are used to collect detection signals output by the circuit board under test.
数字激励响应卡,用于多路数字信号的测试与控制。Digital stimulus response card for testing and controlling multiple digital signals.
电压同步输出模块,用于向所述测试接口输出多路电压。The voltage synchronous output module is used to output multiple voltages to the test interface.
多用表模块,用于通过所述测试接口测量所述被测电路板的直流电压、直流电流、交流电压、交流电流或者电阻。The multimeter module is used to measure the DC voltage, DC current, AC voltage, AC current or resistance of the tested circuit board through the test interface.
通信模块,用于所述测试接口与所述PXI总线之间的数据交互和通信。The communication module is used for data interaction and communication between the test interface and the PXI bus.
一个或者多个矩阵开关模块,用于控制所述测试接口与所述PXI总线之间的信号流向和电流向。One or more matrix switch modules are used to control the signal flow and current flow between the test interface and the PXI bus.
一个或者多个数字采集模块、数字激励响应卡、电压同步输出模块、多用表模块、通信模块以及一个或者多个矩阵开关模块相互并联,一个或者多个数字采集模块、数字激励响应卡、电压同步输出模块、多用表模块、通信模块以及一个或者多个矩阵开关模块的一端均与所述PXI总线电性连接,另一端均与所述测试接口电性连接。One or more digital acquisition modules, digital stimulus response cards, voltage synchronization output modules, multimeter modules, communication modules and one or more matrix switch modules are connected in parallel, and one or more digital acquisition modules, digital stimulus response cards, voltage synchronization One end of the output module, the multimeter module, the communication module and one or more matrix switch modules are all electrically connected to the PXI bus, and the other ends are all electrically connected to the test interface.
本发明的进一步技术方案,所述通信模块包括:In a further technical solution of the present invention, the communication module includes:
CAN总线模块,用于所述测试接口与所述PXI总线之间的分布式控制或者实时控制的串行通信。The CAN bus module is used for serial communication of distributed control or real-time control between the test interface and the PXI bus.
1553B总线模块,用于所述测试接口与所述PXI总线之间的分布处理、集中控制以及实时响应的时分串行通信。The 1553B bus module is used for time-division serial communication of distributed processing, centralized control and real-time response between the test interface and the PXI bus.
RS232串口模块,用于给所述测试接口提供多个独立的串行通道。The RS232 serial port module is used to provide multiple independent serial channels for the test interface.
RS485串口模块,用于给所述测试接口提供多个独立的联网串行通道。The RS485 serial port module is used to provide multiple independent networking serial channels for the test interface.
CAN总线模块、1553B总线模块、RS232串口模块以及RS485串口模块相互并联,CAN总线模块、1553B总线模块、RS232串口模块以及RS485串口模块的一端均与所述PXI总线电性连接,另一端均与所述测试接口电性连接。The CAN bus module, the 1553B bus module, the RS232 serial port module and the RS485 serial port module are connected in parallel with each other. One end of the CAN bus module, the 1553B bus module, the RS232 serial port module and the RS485 serial port module are electrically connected to the PXI bus, and the other ends are connected to the The above test interface is electrically connected.
本发明的进一步技术方案:所述PXI测试模块还包括边界扫描模块,所述边界扫面模块用于在调试状态下对所述零槽控制器的输入和输出进行相应观察和控制,其一端与所述PXI总线电性连接,其另一端与所述测试接口电性连接。A further technical solution of the present invention: the PXI test module also includes a boundary scan module, the boundary scan module is used to observe and control the input and output of the zero-slot controller in the debugging state, one end of which is connected to the The PXI bus is electrically connected, and its other end is electrically connected to the test interface.
本发明的进一步技术方案,所述电路板测试系统还包括GPIB总线,所述GPIB总线与所述PXI总线电性连接。In a further technical solution of the present invention, the circuit board testing system further includes a GPIB bus, and the GPIB bus is electrically connected to the PXI bus.
本发明的进一步技术方案:所述GPIB总线与所述测试接口之间可选择性的连接程控电源、台式电源、任意波发生器、多个示波器、逻辑分析仪、电子负载、温度传感器以及仿真器中的一个或者多个。A further technical solution of the present invention: a programmable power supply, a desktop power supply, an arbitrary wave generator, a plurality of oscilloscopes, a logic analyzer, an electronic load, a temperature sensor and an emulator can be selectively connected between the GPIB bus and the test interface one or more of.
本发明的进一步技术方案:所述测试接口包括夹具、与所述夹具相配套的适配器盒。A further technical solution of the present invention: the test interface includes a fixture and an adapter box matched with the fixture.
本发明的进一步技术方案:所述适配器包括连接器、接收器、第一外箱、第二外箱以及夹具框架,所述连接器固定在所述夹具框架的内部,所述接收器固定在所述第二外箱的内部,所述夹具框架位于所述第一外箱和所述第二外箱之间,所述第一外箱与所述第二外箱固定连接。A further technical solution of the present invention: the adapter includes a connector, a receiver, a first outer box, a second outer box, and a clamp frame, the connector is fixed inside the clamp frame, and the receiver is fixed on the The inside of the second outer box, the clamp frame is located between the first outer box and the second outer box, and the first outer box is fixedly connected to the second outer box.
本发明的进一步技术方案:所述夹具包括位于所述适配器盒外部的连接器插座和适配板、位于所述连接器插座一侧的延伸接口以及与所述适配器盒电性连接的探笔,所述适配板上设有用于固定所述被测电路板的插座。A further technical solution of the present invention: the fixture includes a connector socket and an adapter board located outside the adapter box, an extension interface located on one side of the connector socket, and a probe electrically connected to the adapter box, The adapter board is provided with a socket for fixing the tested circuit board.
本发明的进一步技术方案,所述电路板测试系统还包括:In a further technical solution of the present invention, the circuit board testing system also includes:
测试数据交换平台,用于数据的交换。The test data exchange platform is used for data exchange.
测量程序开发平台,用于建立测试项目和测量步骤。Measurement program development platform for establishing test items and measurement steps.
测量程序执行平台,用于对所述被测电路板自动或者半自动测试。The measurement program execution platform is used for automatic or semi-automatic testing of the circuit board under test.
故障咨询平台,用于发现被测电路板故障时,转入故障诊断模式。The fault consultation platform is used to switch to the fault diagnosis mode when a fault is found on the circuit board under test.
系统管理平台,用于管理所述测试数据交换平台、所述测量程序开发平台、所述测量程序执行平台以及故障咨询平台。The system management platform is used to manage the test data exchange platform, the measurement program development platform, the measurement program execution platform and the fault consultation platform.
本发明的有益效果为:The beneficial effects of the present invention are:
本发明提供的测量实验台,通过零槽控制器、PXI总线、PXI测试模块、测试接口构成一个综合测量系统,该系统具有测量开发、测量仿真、测量执行、故障诊断以及系统自检等功能,在测试接口固定被测电路板后,能够实现被测电路板整体功能和性能的自动测试,测量过程中无需人工干预,可以选择自动检测或者人机交互的方式对被测电路板进行测量。该综合测量提供集成的测试程序集开发环境,并具有执行系统级和插件板级的能力,满足对分机和模块的测试需求,且该综合测量系统还具有板级故障诊断功能。此外,该综合测量系统还预留了GPIB接口和扩展空间,能够外接GPIB总线和其他模块,方便用户自行集成逻辑分析仪、台式示波器以及其它设备。The measurement test bench provided by the present invention constitutes a comprehensive measurement system through the zero-slot controller, PXI bus, PXI test module, and test interface. The system has functions such as measurement development, measurement simulation, measurement execution, fault diagnosis, and system self-inspection. After the circuit board under test is fixed on the test interface, the automatic test of the overall function and performance of the circuit board under test can be realized. There is no need for manual intervention during the measurement process, and the circuit board under test can be measured in the way of automatic detection or human-computer interaction. The comprehensive measurement provides an integrated test program set development environment, and has the ability to execute system level and plug-in board level to meet the test requirements for extensions and modules, and the comprehensive measurement system also has a board-level fault diagnosis function. In addition, the comprehensive measurement system also reserves GPIB interface and expansion space, which can be connected to GPIB bus and other modules, so that users can integrate logic analyzers, desktop oscilloscopes and other equipment by themselves.
附图说明Description of drawings
图1是本发明具体实施方式提供的电路板测试系统的结构图;Fig. 1 is the structural diagram of the circuit board testing system that the specific embodiment of the present invention provides;
图2是本发明具体实施方式提供的GPIB总线的连接关系图;Fig. 2 is the connection diagram of the GPIB bus that the specific embodiment of the present invention provides;
图3是本发明具体实施方式提供的测试平台的结构图;Fig. 3 is the structural diagram of the test platform that the specific embodiment of the present invention provides;
图4是本发明具体实施方式提供的测试数据交换平台的结构图;Fig. 4 is the structural diagram of the test data exchange platform that the specific embodiment of the present invention provides;
图5是本发明具体实施方式提供的测量程序开发平台的结构图;Fig. 5 is a structural diagram of a measurement program development platform provided by a specific embodiment of the present invention;
图6是本发明具体实施方式提供的测量程序执行平台的结构图;6 is a structural diagram of a measurement program execution platform provided by a specific embodiment of the present invention;
图7是本发明具体实施方式提供的适配器盒的结构图;Fig. 7 is a structural diagram of an adapter box provided by a specific embodiment of the present invention;
图8是本发明具体实施方式提供的夹具的结构图。Fig. 8 is a structural diagram of a clamp provided by a specific embodiment of the present invention.
图中:In the picture:
1、零槽控制器;2、PXI总线;4、测试接口;5、被测电路板;31、数字采集模块;32、数字激励响应卡;33、电压同步输出模块;34、多用表模块;36、矩阵开关模块;351、CAN总线模块;352、1553B总线模块;353、RS232串口模块;354、RS485串口模块;6、GPIB总线;61、程控电源;62、台式电源;63、任意波发生器;64、示波器;65、逻辑分析仪;66、电子负载;67、温度传感器;68、仿真器;71、连接器;72、接收器;73、第一外箱;74、第二外箱;75、夹具框架;81、连接器插座;82、延伸接口;83、适配板;84、插座;000、测试数据交换平台;001、被测电路板物理布局图单元;002、被测电路板逻辑关系图单元;003、网表转换器单元;004、被测电路板实物图标识单元;100、测量程序开发平台;101、测试项目管理单元;102、故障树编辑器单元;103、接口适配器定义单元;104、虚拟仪表软面板单元;200、测量程序执行平台;201、测试执行管理单元;202、测试数据管理单元;300、故障咨询平台;400、系统管理平台;11、显示器;12、键盘;13、开关。1. Zero slot controller; 2. PXI bus; 4. Test interface; 5. Tested circuit board; 31. Digital acquisition module; 32. Digital stimulus response card; 33. Voltage synchronization output module; 34. Multimeter module; 36. Matrix switch module; 351. CAN bus module; 352. 1553B bus module; 353. RS232 serial port module; 354. RS485 serial port module; 6. GPIB bus; 61. Program-controlled power supply; 62. Desktop power supply; 63. Arbitrary wave generation 64, oscilloscope; 65, logic analyzer; 66, electronic load; 67, temperature sensor; 68, emulator; 71, connector; 72, receiver; 73, the first outer box; 74, the second outer box ;75, fixture frame; 81, connector socket; 82, extension interface; 83, adapter board; 84, socket; 000, test data exchange platform; 001, physical layout unit of circuit board under test; 002, circuit under test Board logical relationship diagram unit; 003, netlist converter unit; 004, physical map identification unit of the tested circuit board; 100, measurement program development platform; 101, test project management unit; 102, fault tree editor unit; 103, interface Adapter definition unit; 104, virtual instrument soft panel unit; 200, measurement program execution platform; 201, test execution management unit; 202, test data management unit; 300, fault consultation platform; 400, system management platform; 11, display; 12 , keyboard; 13, switch.
具体实施方式Detailed ways
下面结合附图并通过具体实施方式来进一步说明本发明的技术方案。The technical solutions of the present invention will be further described below in conjunction with the accompanying drawings and through specific implementation methods.
如图1所示,本实施例一中提供的一种电路板测试系统,测量实验台包括零槽控制器1、PXI总线2、PXI测试模块、测试接口4、被测电路板5、显示器11、键盘12、开关13以及机柜。其中,零槽控制器1用于测量试验台的控制、信号交互以及数据处理,即零槽控制器1能够对其他模块,如:PXI总线2及PXI测试模块,进行控制,且对来源与PXI测试模块的数据进行分析处理,再将测量结果通过显示器11显示。PXI测试模块用于根据对被测电路板5功能特性指标及参数进行测量,可以根据用户的需要对PXI测试模块的组成进行选择,实现对不同被测电路板5的检测,PXI测试模块检测到来自测试接口4的数据通过PXI总线2传输至零槽控制器1中。PXI总线2用于零槽控制器1与PXI测试模块之间的信号传输,以便零槽控制器1与PXI测试模块进行信号交互。测试接口4用于安放被测电路板5,且将被测电路板5与PXI测试模块电导通,便于PXI测试模块对被测电路板5的性能参数指标进行测试。键盘12用于人机互动的过程中测量人员输入指令。开关13用于测量实验台的开机和关机,通常在开关13接通后,测量试验台中的零槽控制器1会发出控制指令运行自检程序,检测整个测量试验台的运行状态是否正常。零槽控制器1、PXI总线2以及PXI测试模块均位于机柜的内部,测试接口4和开关13位于机柜上,显示器11和键盘12可位于机柜上,也可以使用其他PC机的显示器11和键盘12。As shown in Fig. 1, a kind of circuit board test system provided in the present embodiment one, the measurement test bench includes zero slot controller 1, PXI bus 2, PXI test module, test interface 4, tested circuit board 5, display 11 , keyboard 12, switch 13 and cabinet. Among them, the zero-slot controller 1 is used for the control, signal interaction and data processing of the test bench, that is, the zero-slot controller 1 can control other modules, such as: PXI bus 2 and PXI test module, and control the source and PXI The data of the test module is analyzed and processed, and then the measurement result is displayed on the display 11 . The PXI test module is used to measure the functional characteristic indicators and parameters of the tested circuit board 5. The composition of the PXI test module can be selected according to the needs of the user to realize the detection of different tested circuit boards 5. The PXI test module detects Data from the test interface 4 is transmitted to the zero-slot controller 1 through the PXI bus 2 . The PXI bus 2 is used for signal transmission between the zero-slot controller 1 and the PXI test module, so that the zero-slot controller 1 and the PXI test module perform signal interaction. The test interface 4 is used to place the circuit board 5 under test, and electrically connect the circuit board 5 under test with the PXI test module, so that the PXI test module can test the performance parameter index of the circuit board 5 under test. The keyboard 12 is used for measuring personnel to input instructions during the process of human-computer interaction. Switch 13 is used for starting and shutting down of the measurement test bench. Usually, after the switch 13 is turned on, the zero-slot controller 1 in the measurement test bench will issue a control command to run a self-check program to detect whether the operating state of the entire measurement test bench is normal. The zero-slot controller 1, the PXI bus 2 and the PXI test module are all located inside the cabinet, the test interface 4 and the switch 13 are located on the cabinet, the display 11 and the keyboard 12 can be located on the cabinet, and the display 11 and keyboard of other PCs can also be used 12.
优选的,零槽控制器1的型号为PXI-8106,是一种PXI总线嵌入式控制器,故对于这种型号的零槽控制器1,可以取消PXI总线2,该零槽控制器1具有1个以太网接口、ExpressCard插槽、2个高速USB端口以及GPIB接口。Preferably, the model of the zero-slot controller 1 is PXI-8106, which is a PXI bus embedded controller, so for the zero-slot controller 1 of this model, the PXI bus 2 can be canceled, and the zero-slot controller 1 has 1 Ethernet interface, ExpressCard slot, 2 high-speed USB ports, and GPIB interface.
实际使用时,零槽控制器1通过PXI总线2控制PXI测试模块对固定在测试接口4上的被测电路板5进行故障诊断和性能测试。对被测电路板5进行检测时可以采用自动检测的方式和人机互动的方式,通过零槽控制器1对所测数据进行判断,给出“合格(通过)”或者“不合格(不通过)”的结论。In actual use, the zero-slot controller 1 controls the PXI test module through the PXI bus 2 to perform fault diagnosis and performance test on the tested circuit board 5 fixed on the test interface 4 . When detecting the circuit board 5 under test, automatic detection and human-computer interaction can be adopted, and the measured data can be judged by the zero-slot controller 1, and "qualified (passed)" or "failed (failed)" can be given. )" conclusion.
如图2所示,进一步的,PXI测试模块包括三个数字采集模块31、数字激励响应卡32、电压同步输出模块33、多用表模块34、通信模块以及两个矩阵开关模块36。As shown in FIG. 2 , further, the PXI test module includes three digital acquisition modules 31 , a digital stimulus response card 32 , a voltage synchronization output module 33 , a multimeter module 34 , a communication module and two matrix switch modules 36 .
数字采集模块31的个数可以根据电路板的不同而合理选择,可以为一个、两个或者多个,可以通过测试接口4采集被测电路板5输出的检测信号。数字采集模块31可以为A/D模块,其型号为PXI-2010,通道数为4路,采样率为2MS/s,14位分辨率,输入电压范围为-10V~+10V。The number of digital acquisition modules 31 can be reasonably selected according to different circuit boards, and can be one, two or more, and the detection signal output by the circuit board 5 under test can be collected through the test interface 4 . The digital acquisition module 31 can be an A/D module, the model of which is PXI-2010, the number of channels is 4, the sampling rate is 2MS/s, the resolution is 14 bits, and the input voltage range is -10V~+10V.
数字激励响应卡32具有48路数字激励/相应通道,兼容TTL电平,每个通道可以独立编程,操作模式有总线读写和自动猝发,最大猝发速率为40MSa/s,数字激励响应卡32用于多路数字信号的测试与控制。Digital stimulus response card 32 has 48 digital stimulus/corresponding channels, compatible with TTL level, each channel can be programmed independently, the operation mode has bus read and write and automatic burst, the maximum burst rate is 40MSa/s, and is used for digital stimulus response card 32 In the test and control of multiple digital signals.
电压同步输出模块33,型号为PXI-6733,其具有8通道高速模拟同步输出,1MS/s采样率,16位分辨率,用于向测试接口4输出多路电压,输出范围为±10V。The voltage synchronous output module 33, model PXI-6733, has 8 channels of high-speed analog synchronous output, 1MS/s sampling rate, 16-bit resolution, and is used to output multiple voltages to the test interface 4, with an output range of ±10V.
多用表模块34,型号为PXI-4071,测量精度为7.5位读数分辨率,最大电压测量范围为用于±300V,最大电流测量范围为±3A,最大电阻测量范围为100MΩ,多用表模块34可以通过测试接口4测量被测电路板5的直流电压、直流电流、交流电压、交流电流或者电阻。Multimeter module 34, the model is PXI-4071, the measurement accuracy is 7.5 digits of reading resolution, the maximum voltage measurement range is ±300V, the maximum current measurement range is ±3A, the maximum resistance measurement range is 100MΩ, the multimeter module 34 can The DC voltage, DC current, AC voltage, AC current or resistance of the tested circuit board 5 is measured through the test interface 4 .
矩阵开关模块36用于控制测试接口4与PXI总线2之间的信号流向和电流向,其包括大电流矩阵开关模块和普通矩阵开关模块,其数量可以为一个或者多个。其中,大电流矩阵开关模块型号为40-550-002,矩阵配置为4x8(1线),最大电流为5A,最大电压为35V;普通矩阵开关模块型号为DSR-SWITCH,矩阵配置为4x12(2线),最大电压为100VDC,最大电流为500mA,宽带为10MHz。The matrix switch module 36 is used to control the signal flow and current direction between the test interface 4 and the PXI bus 2, and it includes a large current matrix switch module and a common matrix switch module, and the number can be one or more. Among them, the model of the high-current matrix switch module is 40-550-002, the matrix configuration is 4x8 (1 wire), the maximum current is 5A, and the maximum voltage is 35V; the model of the ordinary matrix switch module is DSR-SWITCH, and the matrix configuration is 4x12 (2 line), the maximum voltage is 100VDC, the maximum current is 500mA, and the bandwidth is 10MHz.
如图1所示,优选的,三个数字采集模块31、数字激励响应卡32、电压同步输出模块33、多用表模块34、通信模块以及两个矩阵开关模块36相互并联,三个数字采集模块31、数字激励响应卡32、电压同步输出模块33、多用表模块34、通信模块以及两个矩阵开关模块36的一端均与PXI总线2电性连接,另一端均与测试接口4电性连接。As shown in Figure 1, preferably, three digital acquisition modules 31, digital stimulus response card 32, voltage synchronous output module 33, multimeter module 34, communication module and two matrix switch modules 36 are connected in parallel with each other, three digital acquisition modules 31. One end of the digital stimulus response card 32, the voltage synchronization output module 33, the multimeter module 34, the communication module and two matrix switch modules 36 are electrically connected to the PXI bus 2, and the other ends are electrically connected to the test interface 4.
通信模块,用于测试接口4与PXI总线2之间的数据交互和通信,能够实现测试接口4处固定的被测电路板5与零槽控制器1之间的通信。The communication module is used for data interaction and communication between the test interface 4 and the PXI bus 2, and can realize the communication between the circuit board 5 under test fixed at the test interface 4 and the zero-slot controller 1.
通信模块包括CAN总线模块351、1553B总线模块352、RS232串口模块353以及RS485串口模块354。The communication module includes a CAN bus module 351 , a 1553B bus module 352 , an RS232 serial port module 353 and an RS485 serial port module 354 .
CAN总线模块351用于测试接口4与PXI总线2之间的分布式控制或者实时控制的串行通信,其型号为Cpct-7841,通道数为2路,CAN控制器型号为SJA1000,CAN收发器型号为82C250/251,隔离电压为2500Vrms。CAN bus module 351 is used for distributed control or real-time control serial communication between test interface 4 and PXI bus 2, its model is Cpct-7841, the number of channels is 2, CAN controller model is SJA1000, CAN transceiver The model is 82C250/251, and the isolation voltage is 2500Vrms.
1553B总线模块352用于测试接口4与PXI总线2之间的分布处理、集中控制以及实时响应的时分串行通信。The 1553B bus module 352 is used for time-division serial communication of distributed processing, centralized control and real-time response between the test interface 4 and the PXI bus 2 .
RS232串口模块353,型号为PXI-8430/2,传输波特率为57b/s至1,000kb/s可变的标准和非标准波特率,128B传输并接收FIFO,具有2个独立的串口通道,RS232串口模块353用于给测试接口4提供多个独立的串行通道。RS232 serial port module 353, the model is PXI-8430/2, the transmission baud rate is 57b/s to 1,000kb/s variable standard and non-standard baud rate, 128B transmission and reception FIFO, with 2 independent serial port channels , the RS232 serial port module 353 is used to provide multiple independent serial channels for the test interface 4 .
RS485串口模块354,型号为PXI-8431/2,传输波特率为57b/s至3,000kb/s可变的标准和非标准波特率,128B传输并接收FIFO,可选的4线与2线收发器模式,适用于全双工和半双工通信,用于给测试接口4提供多个独立的联网串行通道。RS485 serial port module 354, the model is PXI-8431/2, the transmission baud rate is 57b/s to 3,000kb/s variable standard and non-standard baud rate, 128B transmission and reception FIFO, optional 4 lines and 2 Line transceiver mode, suitable for full-duplex and half-duplex communication, used to provide multiple independent networked serial channels for test interface 4.
CAN总线模块351、1553B总线模块352、RS232串口模块353以及RS485串口模块354相互并联,CAN总线模块351、1553B总线模块352、RS232串口模块353以及RS485串口模块354的一端均与PXI总线2电性连接,另一端均与测试接口4电性连接。CAN bus module 351, 1553B bus module 352, RS232 serial port module 353 and RS485 serial port module 354 are connected in parallel with each other. connected, and the other end is electrically connected to the test interface 4.
进一步的,PXI测试模块还包括边界扫描模块,边界扫描模块为JTAG边界扫描模块及测试系统,其具有32位PXI/c PCI总线接口,可调的JTAG信号终端,能够进行自动信号偏差控制及处理不同的电缆和电路板的配置,通过JTAG连接器可给目标元件供应电源。边界扫面模块用于在调试状态下对所述零槽控制器1的输入和输出进行相应观察和控制,其一端与所述PXI总线2电性连接,其另一端与所述测试接口4电性连接。Further, the PXI test module also includes a boundary scan module, the boundary scan module is a JTAG boundary scan module and a test system, which has a 32-bit PXI/c PCI bus interface, an adjustable JTAG signal terminal, and can perform automatic signal deviation control and processing Depending on the cable and board configuration, power can be supplied to the target components through the JTAG connector. The boundary scan module is used to observe and control the input and output of the zero-slot controller 1 in the debugging state, one end of which is electrically connected to the PXI bus 2, and the other end is electrically connected to the test interface 4. sexual connection.
通过零槽控制器1、PXI总线2、PXI测试模块、测试接口4构成一个综合测量系统,该综合测量系统具有测量开发、测量仿真、测量执行、故障诊断以及系统自检等功能。A comprehensive measurement system is formed by zero-slot controller 1, PXI bus 2, PXI test module, and test interface 4. The comprehensive measurement system has the functions of measurement development, measurement simulation, measurement execution, fault diagnosis, and system self-inspection.
如图2所示,进一步的,电路板测试系统还包括GPIB总线6,GPIB总线6与PXI总线2电性连接。GPIB总线6与测试接口4之间可选择性的连接程控电源61、台式电源62、任意波发生器63、多个示波器64、逻辑分析仪65、电子负载66、温度传感器67以及仿真器68中的一个或者多个,即可以根据用户的需要和被测电路板5的不同,选择程控电源61、台式电源62、任意波发生器63、多个示波器64、逻辑分析仪65、电子负载66、温度传感器67以及仿真器68中的一个或者多个设置在GPIB总线6与测试接口4之间。由此可见,本申请提供的电路板测试系统预留了GPIB接口和扩展空间,能够外接GPIB总线和其他模块,方便用户自行集成上述设备。As shown in FIG. 2 , further, the circuit board testing system further includes a GPIB bus 6 , and the GPIB bus 6 is electrically connected to the PXI bus 2 . Between the GPIB bus 6 and the test interface 4, a programmable power supply 61, a desktop power supply 62, an arbitrary wave generator 63, a plurality of oscilloscopes 64, a logic analyzer 65, an electronic load 66, a temperature sensor 67 and an emulator 68 can be selectively connected. One or more, that is, according to the needs of the user and the difference of the circuit board 5 to be tested, a programmable power supply 61, a desktop power supply 62, an arbitrary wave generator 63, multiple oscilloscopes 64, a logic analyzer 65, an electronic load 66, One or more of the temperature sensor 67 and the emulator 68 are arranged between the GPIB bus 6 and the test interface 4 . It can be seen that the circuit board testing system provided by the present application reserves a GPIB interface and expansion space, and can be externally connected to the GPIB bus and other modules, which is convenient for users to integrate the above-mentioned devices by themselves.
如图7所示,测试接口4包括夹具和适配器盒,适配器盒与夹具相配套。As shown in FIG. 7 , the test interface 4 includes a fixture and an adapter box, and the adapter box is matched with the fixture.
适配器包括连接器71、接收器72、第一外箱73、第二外箱74以及夹具框架75,连接器71位于第一外箱73的一侧,且固定在夹具框架75的内部,接收器72固定在第二外箱74的内部,夹具框架75位于第一外箱73和第二外箱74之间,夹具框架75插接在第二外箱74上的插槽内,第一外箱73与第二外箱74固定连接。连接器71也可以是被测电路板电缆,夹具通过连接器71和接收器72将PXI测试模块与被测电路板5电性连接。The adapter includes a connector 71, a receiver 72, a first outer box 73, a second outer box 74 and a clamp frame 75, the connector 71 is located on one side of the first outer box 73, and is fixed inside the clamp frame 75, and the receiver 72 is fixed on the inside of the second outer case 74, the clamp frame 75 is located between the first outer case 73 and the second outer case 74, the clamp frame 75 is inserted in the slot on the second outer case 74, the first outer case 73 is fixedly connected with the second outer case 74. The connector 71 can also be a cable of the circuit board under test, and the fixture electrically connects the PXI test module and the circuit board 5 under test through the connector 71 and the receiver 72 .
如图8所示,夹具包括连接器插座81、延伸接口82、适配板83以及探笔85,连接器插座81位于适配器盒的外部,若干延伸接口82位于适配板83的外延部位,适配板83位于适配器盒的一侧,探笔85与适配器盒电性连接,适配板83上设有用于固定被测电路板5的插座84。对被测电路板5进行测试时,被测电路板5所需的激励通过连接器插座81、适配板83上的延伸接口82提供,配合探笔85,根据操作界面上的提示,通过人机互动的方式,实现对被测电路板5的测试。As shown in Figure 8, the fixture includes a connector socket 81, an extension interface 82, an adapter plate 83, and a probe 85. The connector socket 81 is located outside the adapter box, and several extension interfaces 82 are located on the extension of the adapter plate 83. The matching board 83 is located on one side of the adapter box, the probe 85 is electrically connected with the adapter box, and the adapter board 83 is provided with a socket 84 for fixing the tested circuit board 5 . When testing the circuit board 5 under test, the excitation required by the circuit board 5 under test is provided through the connector socket 81 and the extension interface 82 on the adapter board 83, and cooperates with the probe 85, according to the prompt on the operation interface, through the human The test of the circuit board 5 under test is realized in a machine-interactive manner.
如图3所示,电路板测试系统还包括由测试数据交换平台000、测量程序开发平台100、测量程序执行平台200、故障咨询平台300以及系统管理平台400组成的测试集成环境,即测试平台,该测试集成环境为软件环境,指导电路板测试系统进行测试程序集开发、测试执行、故障诊断以及系统自检等功能。As shown in Figure 3, the circuit board test system also includes a test integration environment composed of a test data exchange platform 000, a measurement program development platform 100, a measurement program execution platform 200, a fault consultation platform 300 and a system management platform 400, that is, a test platform, The test integration environment is a software environment, which guides the circuit board test system to perform functions such as test program development, test execution, fault diagnosis, and system self-inspection.
如图4所示,进一步的,由于整个测试集成环境涉及大量数据的输入与输出,故需要采用测试数据交换平台000,该平台用于数据的交换,包括被测电路板5实物图数据的交换、测试集成环境各单元之间的数据交换、符合EDIF200的网表数据格式的输入与输出数据的交换,测试集成环境与办公软件之间的数据交换,测试数据交换平台000包括被测电路板物理布局图单元001、被测电路板逻辑关系图单元002、网表转换器单元003以及被测电路板实物图标识单元004。As shown in Figure 4, further, since the entire test integration environment involves the input and output of a large amount of data, it is necessary to adopt a test data exchange platform 000, which is used for data exchange, including the exchange of the physical map data of the tested circuit board 5 , Data exchange between units in the test integration environment, exchange of input and output data conforming to the netlist data format of EDIF200, data exchange between the test integration environment and office software, test data exchange platform 000 including the physical circuit board under test Layout diagram unit 001, circuit board logic diagram unit 002 under test, netlist converter unit 003, and circuit board physical diagram identification unit 004 under test.
如图5所示,进一步的,测量程序开发平台100用于建立测试项目和测量步骤。测量程序开发平台100能以画图、填表格、选择、手工编程等方式辅助开发人员完成测试程序的开发,建立测试项目和测试步骤,实现测试代码的产生和测试库的编译。测量程序开发平台100包括测试项目管理单元101、故障树编辑器单元102、接口适配器定义单元103以及虚拟仪表软面板单元104。故测量程序开发平台100具体可完成测试项目文件的建立、测试步骤的描述、基于虚拟仪表软面板单元的测量代码的开发等。As shown in FIG. 5 , further, the measurement program development platform 100 is used to establish test items and measurement steps. The measurement program development platform 100 can assist developers to complete the development of the test program by means of drawing, filling in forms, selection, manual programming, etc., establish test items and test steps, and realize the generation of test codes and the compilation of test libraries. The measurement program development platform 100 includes a test item management unit 101 , a fault tree editor unit 102 , an interface adapter definition unit 103 and a virtual instrument soft panel unit 104 . Therefore, the measurement program development platform 100 can specifically complete the establishment of test project files, the description of test steps, and the development of measurement codes based on the virtual instrument soft panel unit.
如图6所示,进一步的,测量程序执行平台200用于对被测电路板5自动或者半自动测试,测量程序执行平台200包括测试执行管理单元201和测试数据管理单元202,实际测量过程中,测量程序执行平台200借助各个PXI测试模块或者仪器的驱动程序,按照测试人员设定的流程,辅助测试人员完成对被测电路板5自动/半自动测试。As shown in FIG. 6 , further, the measurement program execution platform 200 is used for automatic or semi-automatic testing of the circuit board under test 5. The measurement program execution platform 200 includes a test execution management unit 201 and a test data management unit 202. During actual measurement, The measurement program execution platform 200 assists the tester to complete the automatic/semi-automatic test of the circuit board under test 5 according to the procedure set by the tester by means of the driver program of each PXI test module or instrument.
故障咨询平台300用于发现被测电路板5故障时,转入故障诊断模式。具体的,故障咨询平台300能够利用故障树以交互方式辅助测试人员完成故障定位。该平台主要解决在测试执行过程中,发现被测电路板5故障时,转入故障诊断模式,并将故障定位到被测电路板5或某个模块的故障节点或故障器件。The fault consulting platform 300 is used to switch to the fault diagnosis mode when a fault is found on the circuit board 5 under test. Specifically, the fault consulting platform 300 can use the fault tree to assist testers to complete fault location in an interactive manner. The platform mainly solves the problem of switching to the fault diagnosis mode when a fault is found on the circuit board 5 under test during the test execution process, and locating the fault to the faulty node or device of the circuit board 5 under test or a certain module.
系统管理平台400,用于管理测试数据交换平台000、测量程序开发平台100、测量程序执行平台200以及故障咨询平台300。The system management platform 400 is used to manage the test data exchange platform 000 , the measurement program development platform 100 , the measurement program execution platform 200 and the fault consultation platform 300 .
本发明是通过优选实施例进行描述的,本领域技术人员知悉,在不脱离本发明的精神和范围的情况下,可以对这些特征和实施例进行各种改变或等效替换。本发明不受此处所公开的具体实施例的限制,其他落入本申请的权利要求内的实施例都属于本发明保护的范围。The present invention has been described through preferred embodiments, and those skilled in the art know that various changes or equivalent substitutions can be made to these features and embodiments without departing from the spirit and scope of the present invention. The present invention is not limited by the specific embodiments disclosed here, and other embodiments falling within the claims of the present application all belong to the protection scope of the present invention.
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