CN101603979A - Embedded computer electrometric integrated instrument - Google Patents
Embedded computer electrometric integrated instrument Download PDFInfo
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- CN101603979A CN101603979A CNA2008100678160A CN200810067816A CN101603979A CN 101603979 A CN101603979 A CN 101603979A CN A2008100678160 A CNA2008100678160 A CN A2008100678160A CN 200810067816 A CN200810067816 A CN 200810067816A CN 101603979 A CN101603979 A CN 101603979A
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Abstract
The present invention relates to a kind of embedded computer electrometric integrated instrument and comprise control module, input circuit unit and output circuit unit, described control module comprises main processing controller, storer, human-computer interaction interface, and main processing controller connects respectively and control store and human-computer interaction interface; Input circuit unit comprises the input circuit functional module of oscillograph module, spectrum analyzer module, logic analyser module, multimeter module, resistance capacitance inductance measuring meter module, frequency meter module and/or each function instrument of digital IC tester module; Output circuit unit then comprises the signal generator functional module; Control module is undertaken with each module communication of input circuit unit by bus and controls each module work.Electronic measuring instrument of the present invention allows the user realize the function of underlying instruments such as signal generator, oscillograph, logic analyser, spectrum analyzer, frequency meter, digital IC tester, LCR measuring instrument, multimeter, but and each instrumental function concurrent working.
Description
Technical field
The present invention relates to a kind of electric variable testing apparatus, especially a kind of embedded computer electrometric integrated instrument.
Background technology
Existing Universal Electronic Test Instrument is based on discrete instrument, function singleness, no embedded OS, nothing combination expanded function are such as signal generator, oscillograph, logic analyser, spectrum analyzer, frequency meter, digital IC tester, LCR measuring instrument, multimeter etc.During use, often need use the instrument of two or more difference in functionality simultaneously, this makes troubles to the user.
Summary of the invention
Fundamental purpose of the present invention provides a kind of embedded computer electrometric integrated instrument, has realized that by a surveying instrument signal generation, oscillography, logic analysis, spectrum analysis, frequency meter, digital integrated circuit test, LCR measure and/or function of multimeter.
The present invention adopts following technical scheme:
Described embedded computer electrometric integrated instrument comprises control module, input circuit unit and output circuit unit, described control module comprises main processing controller, storer, human-computer interaction interface, and main processing controller connects respectively and control store and human-computer interaction interface; Input circuit unit comprises the input circuit functional module of oscillograph module, spectrum analyzer module, logic analyser module, multimeter module, resistance capacitance inductance measuring meter module, frequency meter module and/or each function instrument of digital IC tester module; Output circuit unit then comprises the signal generator functional module; Control module is undertaken with each module communication of input circuit unit by bus and controls each module work.
Preferably, described main processing controller comprises a programmable logic device (PLD), comprise a control kernel in the described programmable logic device (PLD), in control kernel internal build one multiple task operating system is arranged, it in system an independent process of module creation in the input circuit unit, finish the processing of separately data acquisition, processing and various control informations, create graphical interfaces show process and communication process process simultaneously, utilize between each process that message communicates, swap data.
Preferably, comprise a hardware accelerator in the described control kernel.
Preferably, described oscillograph module and spectrum analyzer module comprise the oscillographic dual input passage of CH1, CH2, ADC conversion, DAC module, Clock management circuit, EXT trigger input circuit and FPGA module, comprise a SOPC interface module in the FPGA module, link to each other with the main control unit parallel bus by the SOPC interface module in the FPGA module.
Preferably, described signal generator module comprises SOPC interface, external memory interface, internal control register, main waveform DDS, modulation waveform DDS, DAC module, external control module, AD7920 interface, AD9755 interface, AD5662 interface.
Preferably, described logic analyser module comprises level comparing unit, level conversion unit, main control unit, display unit, the input analytic signal passes through level comparing unit and level conversion unit pre-service successively, send signal to main control unit, the main control unit processing signals also sends to display unit with result and shows.
Preferably, described frequency meter module comprises microprocessing unit, control circuit unit, low frequency binary channels input block, amplifier unit, converter unit, high frequency input block, high speed field effect transistor amplifier and frequency divider, control circuit unit is controlled low frequency binary channels input block, amplifier unit and converter unit respectively, low frequency binary channels input block is sent to amplifier with low-frequency input signal and amplifies, low frequency signal after the amplification is sent to converter, and the low frequency signal after converter is handled is sent to the equal precision measurement module in the described main control unit; The high frequency input block is sent to high speed field effect transistor amplifier with input signal, is sent to the equal precision measurement module in the described main control unit behind the high-frequency signal process frequency divider frequency division after the amplification.
Preferably, described LCR tester module comprises first test clip, second test clip, the gear switch unit, the resistance measuring unit, inductance measurement unit and microprocessing unit, wherein the gear switch unit connects first test clip and second test clip input signal types at first test clip and second test clip is switched, the signal of gear switch unit output is sent to resistance measuring unit and inductance measurement unit respectively, resistance measuring unit and inductance measurement element output signal are to microprocessing unit, the control of microprocessing unit and described control module communicates, and receives control and sends measurement result.
Preferably, described digital IC tester module comprises test bench unit, pin control circuit matrix unit, CPLD/FPGA modular unit and slave controller unit, wherein pin control circuit matrix unit is sent to from control module after obtaining the data of test bench unit acquisition and sending to CPLD/FPGA modular unit, CPLD/FPGA modular unit deal with data, and the slave controller unit is accepted the control of described control module and result is sent to described control module.
Electronic measuring instrument of the present invention is undertaken and the oscillograph module by bus by control module, the spectrum analyzer module, the logic analyser module, the multimeter module, resistance capacitance inductance measuring meter module, the frequency meter module, the input circuit functional module of each function instrument of digital IC tester module and/or the communication of signal generator functional module, and control described each module work, allow the user realize signal generator, oscillograph, logic analyser, spectrum analyzer, frequency meter, digital IC tester, the LCR measuring instrument, the function of underlying instruments such as multimeter, but and each instrumental function concurrent working.
Description of drawings
Fig. 1 is a module composition diagram of the present invention;
Fig. 2 software block diagram of the present invention;
Fig. 3 oscillograph/spectrum analyzer functional block diagram;
Fig. 4 signal generator functional block diagram;
Fig. 5 logic analyser functional block diagram;
Fig. 6 frequency meter functional block diagram;
Fig. 7 LCR tester function module circuit figure;
Fig. 8 digital IC tester functional block diagram.
The object of the invention, function and advantage will be in conjunction with the embodiments, are described further with reference to accompanying drawing.
Embodiment
The electronic measuring instrument of present embodiment is undertaken and the oscillograph module by bus by control module, the spectrum analyzer module, the logic analyser module, the multimeter module, resistance capacitance inductance measuring meter module, the frequency meter module, the input circuit functional module of each function instrument of digital IC tester module and/or the communication of signal generator functional module, and control described each module work, realize signal generator, oscillograph, logic analyser, spectrum analyzer, frequency meter, digital IC tester, the LCR measuring instrument, the function of underlying instruments such as multimeter.
As depicted in figs. 1 and 2, described embedded computer electrometric integrated instrument comprises main control unit 1, input circuit unit 2 and output circuit unit 3, described control module 1 comprises main processing controller 11, storer 12, human-computer interaction interface 13, and main processing controller 11 connects respectively and control store 12 and human-computer interaction interface 13; Input circuit unit 2 comprises oscillograph module 21, spectrum analyzer module 22, logic analyser module 23, multimeter module 24, resistance capacitance inductance measuring meter module 25, frequency meter module 26 and/or digital IC tester module 27; Output circuit unit 3 comprises signal generator functional module 31; Control module 1 by bus carry out with input circuit unit 2 and/or output circuit unit 3 in each module communication and control each module work.Realize the function of underlying instruments such as signal generator, oscillograph, logic analyser, spectrum analyzer, frequency meter, digital IC tester, LCR measuring instrument, multimeter thus
Present embodiment is taked main control unit and each minute master-salve distributedly controlling jointly of combining of functional module.The FPGA module of main control unit 1 (Field-Programmable Gate Array, field programmable gate array) is as the main processing controller 11 of whole integral instrument, and the processor that uses is 32 soft-core processor Nios of altera corp
II, Nios
The II flush bonding processor is a configurable general RISC flush bonding processor of user, is the processor of a non-MMU.
In order to make the multiple instrument concurrent working of integrated instrument, the user can use multiple instrument simultaneously, and this just requires, and each instrument corresponding control programs is parallel, timely must be handled separately to such an extent that data and user get various operations.The second embodiment of the present invention adopts the embedded OS of multitask, and preferred selection scheme is a μ Clinux system, and it is the derive version of Linux at the processor of non-MMU.Display screen adopts 24 colored TFT liquid crystal displays of 640*480 dot matrix, except have with the similar Keyboard Control of all purpose instrument, native system has also increased the touch-screen control mode, this makes user's more convenient operation, more directly perceived; The expansion storer FLASH chip and SDRAM chip are arranged, platform has also designed USB universal serial bus and network interface, so as with computing machine or net connection.Be every kind of process that the instrumental function module creation is independent in embedded OS, finish the processing of separately data acquisition, processing and various control informations, create graphical interfaces show process and communication process process simultaneously.Utilize between each process that message communicates, swap data.
Get overall performance owing to all have very large data processing amount, its processing speed directly to influence instrument as oscillograph, logic analyser, DDS signal generator or the like.So the third embodiment of the present invention has adopted the Nios of altera corp in embedded OS
II C language is to hardware-accelerated (C2H) compiler, to be converted to hardware accelerator in the FPGA module to the higher ANSI C function of time requirement, to realize with hardware with the function that software is realized, accelerated crucial function call execution speed greatly, promoted software performance.This integral instrument The software μ Clinux system and C2H function of hardware acceleration, the system that makes can stablize, work efficiently.
Among above-mentioned each embodiment, as shown in Figure 3, described oscillograph module and spectrum analyzer module comprise the oscillographic dual input passage of CH1, CH2, ADC conversion, DAC module, Clock management circuit, EXT trigger input circuit and FPGA module, comprise a SOPC interface module in the FPGA module, link to each other with the main control unit parallel bus by the SOPC interface module in the FPGA module.
As shown in Figure 4, described signal generator module comprises SOPC interface, external memory interface, internal control register, main waveform DDS, modulation waveform DDS, DAC module, external control module, AD7920 interface, AD9755 interface, AD5662 interface.
As shown in Figure 5, described logic analyser module comprises level comparing unit, level conversion unit, main control unit, display unit, the input analytic signal passes through level comparing unit and level conversion unit pre-service successively, send signal to main control unit, the main control unit processing signals also sends to display unit with result and shows.
As shown in Figure 6, described frequency meter module comprises microprocessing unit, control circuit unit, low frequency binary channels input block, amplifier unit, converter unit, high frequency input block, high speed field effect transistor amplifier and frequency divider, control circuit unit is controlled low frequency binary channels input block, amplifier unit and converter unit respectively, low frequency binary channels input block is sent to amplifier with low-frequency input signal and amplifies, low frequency signal after the amplification is sent to converter, and the low frequency signal after converter is handled is sent to the equal precision measurement module in the described main control unit; The high frequency input block is sent to high speed field effect transistor amplifier with input signal, is sent to the equal precision measurement module in the described main control unit behind the high-frequency signal process frequency divider frequency division after the amplification.
As shown in Figure 7, described LCR tester module comprises first test clip, second test clip, the gear switch unit, the resistance measuring unit, inductance measurement unit and microprocessing unit, wherein the gear switch unit connects first test clip and second test clip input signal types at first test clip and second test clip is switched, the signal of gear switch unit output is sent to resistance measuring unit and inductance measurement unit respectively, resistance measuring unit and inductance measurement element output signal are to microprocessing unit, the control of microprocessing unit and described control module communicates, and receives control and sends measurement result.
As shown in Figure 8, described digital IC tester module comprises test bench unit, pin control circuit matrix unit, CPLD/FPGA modular unit and slave controller unit, wherein pin control circuit matrix unit is sent to from control module after obtaining the data of test bench unit acquisition and sending to CPLD/FPGA modular unit, CPLD/FPGA modular unit deal with data, and the slave controller unit is accepted the control of described control module and result is sent to described control module.
It now is the workflow of example explanation embedded OS with oscillograph software.Thereby the various parameters that the oscillograph process is provided with according to the user are finished and must be gathered, handle and obtain various measurement parameters and Wave data to be shown data, after the oscillograph process is finished once complete processing procedure at every turn, data after handling are got form with message mail to graphical interfaces show process and communication process process, finished the demonstration of various parameters and the demonstration of waveform by the graphical interfaces show process, the communication process process is provided with according to the user data is sent to the external treatment program by USB, network interface.The communication process process is also monitored the various data of keyboard, touch-screen, USB, network interface simultaneously, is converted to relevant message after the processing and sends to oscillograph process, graphical interfaces show process with the setting of finishing acquisition parameter and the adjustment of graphic presentation.
The oscillograph functional module as shown in Figure 3, select for use EP1C6Q240 to come the control data collection from the FPGA module, utilization designs with Equivalent Sampling Technology in real time that to import bandwidth be the oscillograph of 100MHz, and it mainly is made up of the oscillographic dual input passage of CH1, CH2, ADC conversion, DAC module, Clock management circuit, EXT trigger input circuit, FPGA module section etc.
Oscillographic from the FPGA module design SOPC interface module link to each other with the main control unit parallel bus, be provided with 22 bit address buses, 16 bit data bus and sheet and select write control signal etc. to read, this module is received advanced row decoding after the instruction that main control unit sends, Dui Ying module or function are controlled then, and direct current biasing adjustment, coupling and triggering mode switch to finish, signal amplifies and functions such as decay gain control, data acquisition.From the FPGA module Wave data after the ADC conversion is delivered to main control unit by the data bus of interface module, carry out control store, analysis, call demonstration for show process simultaneously by oscillograph process corresponding among the μ Clinux.
(1) the binary channels input circuit adopts amplifier and relay to realize the adjustment direct current biasing of external input signal, and the handoff functionality of filtering and coupling scheme, the input signal bandwidth is 100MHz, and input reference signal is 5mv～400V, is converted to 100mv～1V and handles for the AD sample circuit.
(2) the DAC module adopts AD1851 to export the DA conversion, and this signal that is the FPGA module is used for controlling the amplifying circuit of each input circuit module amplifies and the decay gain, and adjusts direct current biasing.
(3) the EXT trigger input circuit adopts devices such as high-speed comparator AD96685, LM1881 to convert trigger pip to the square wave trigger pip.Triggering mode can adopt: modes such as scalable level triggers, video triggering, external trigger are arranged.Native system adopts the external hardware triggering mode.Requirements such as the noise suppression that the FPGA module is keyed in according to the size of signal and user, coupling scheme, noise suppression, High frequency filter are controlled trigger circuit.
The shared oscillographic input circuit of spectrum analyzer only carries out spectrum analysis to the signal that collects from the oscillograph input circuit and gets final product on software.
The signal generator functional module as shown in Figure 4, design has modules such as SOPC interface, external memory interface, FPGA inside modules control register, main waveform DDS, modulation waveform DDS, AD1851, external control HC595, AD7920 interface, AD9755 interface, AD5662 interface from FPGA module (Field Programmable GateArray, field programmable gate array).
(1) SOPC interface module: the SPI interface is adopted in communicating by letter of FPGA module and system master making sheet, once transmits 24, high 20 as the address or high 16 as data, low 4 as control; During write operation, write corresponding 20 bit address earlier and write control command, and leave address register in, again 16 bit data are write data and write register, and put data and write and be ready to zone bit, data are pressed the output of read-write memory sequential after, preparation zone bit automatically clears data; During read data, write 20 bit address earlier and write control command, SOPC delays time regular time, wait SOPC interface is read inner read register with 16 bit data, and put data and read to be ready to zone bit, read register and zone bit are combined into 24 bit data, send to SOPC, and SOPC can judge whether correctly data according to zone bit.
(2) external memory interface module: the external SRAM data are read main waveform DDS module, and read and write SRAM by this module by the SOPC interface module, each bus is controlled with triple gate, high 19 bit address of SOPC interface and main waveform DDS are as the address of read-write external SRAM, the 0th bit address as the SRAM32 bit data high 16 with the selection control signal of hanging down 16.
(3) modulation waveform DDS module: adopt FPGA inside modules SRAM stored waveform data, according to the DDS ultimate principle, receive the controlled variable and the control command of FPGA inside modules control register, export the Serial No. of modulation signal during frequency modulation to main waveform DDS, to AD5662 interface output 0, to the Serial No. of AD5662 interface output modulation signal, export 0 during amplitude modulation to main waveform DDS.
(4) main waveform DDS module: the order, parameter control and the digital modulation signals that receive FPGA inside modules control register, adopt FPGA module-external SRAM, built-in frequency divider, according to the DDS ultimate principle, realize the output of main waveform Serial No., Digital Implementation frequency modulation, phase modulation, signals such as FSK, PSK.In low-frequency range, new ticking frequency is
Wherein e be in the DDS of the system core design with frequency control word operational symbol and the relevant coefficient of Phase Accumulator Truncation (rounding) operational symbol, P0=2x (x is a DDS phase accumulator figure place 32), adopt hardware description language (VHDL) with formula to markers
Carry out exporting new sample frequency behind the frequency division, to improve the time domain precision of signal low-frequency range.
(5) FPGA inside modules control register module: the control command and the parameter of each module of storage FPGA inside modules, control the work of each module.
(6) the AD9755 interface is finished 16 bit data and the clock output with main waveform DDS, and the AD5662 interface is delivered to outside AD5662 by 1 16 parallel-to-serial converter of design with the data of modulation waveform DDS.The AD7920 interface receives outside AD7920 input signal by 1 16 bit string of design and converter, transfers serial data to 16 bit parallel data and gives modulation waveform DDS module, as the external modulation data.
(7) AD1851 and external control HC595: design 1 16 parallel-to-serial converter, receive the data of FPGA inside modules control register, control external series DAC AD1851, design 18 parallel-to-serial converter, remove to control the analog switch voltage hold circuit, realize the control of system's direct current biasing and output amplitude by controlling output circuit.
All the other each test function modules of the present invention are identical with existing test module test philosophy, measurement result are sent in the main control unit to focus on this basis, and treatment scheme is identical with above-mentioned oscillograph, repeats no more herein.
The above only is the preferred embodiments of the present invention; be not so limit claim of the present utility model; every equivalent structure or equivalent flow process conversion that utilizes the utility model instructions and accompanying drawing content to be done; or directly or indirectly be used in other relevant technical fields, all in like manner be included in the scope of patent protection of the present utility model.
Claims (9)
1. embedded computer electrometric integrated instrument, it is characterized in that: comprise control module, input circuit unit and output circuit unit, described control module comprises main processing controller, storer, human-computer interaction interface, and main processing controller connects respectively and control store and human-computer interaction interface; Input circuit unit comprises the input circuit functional module of each function instrument such as oscillograph module, spectrum analyzer module, logic analyser module, multimeter module, resistance capacitance inductance measuring meter module, frequency meter module and/or digital IC tester module; Output circuit unit then comprises the signal generator functional module; Control module is undertaken with input circuit unit, each module communication of output circuit unit by bus and controls each module work.
2, embedded computer electrometric integrated instrument as claimed in claim 1, it is characterized in that: described main processing controller comprises a programmable logic device (PLD), comprise a control kernel in the described programmable logic device (PLD), in control kernel internal build one multiple task operating system is arranged, it in system an independent process of module creation in the input circuit unit, finish the processing of separately data acquisition, processing and various control informations, create graphical interfaces show process and communication process process simultaneously, utilize between each process that message communicates, swap data.
3, embedded computer electrometric integrated instrument as claimed in claim 1 or 2 is characterized in that: comprise a hardware accelerator in the described control kernel.
4, embedded computer electrometric integrated instrument as claimed in claim 3, it is characterized in that: described oscillograph module and spectrum analyzer module comprise the oscillographic dual input passage of CH1, CH2, ADC conversion, DAC module, Clock management circuit, EXT trigger input circuit and FPGA module, comprise a SOPC interface module in the FPGA module, link to each other with the main control unit parallel bus by the SOPC interface module in the FPGA module.
5, embedded computer electrometric integrated instrument as claimed in claim 4 is characterized in that: described signal generator module comprises SOPC interface, external memory interface, internal control register, main waveform DDS, modulation waveform DDS, DAC module, external control module, AD7920 interface, AD9755 interface, AD5662 interface.
6, embedded computer electrometric integrated instrument as claimed in claim 5, it is characterized in that: described logic analyser module comprises level comparing unit, level conversion unit, main control unit, display unit, the input analytic signal passes through level comparing unit and level conversion unit pre-service successively, send signal to main control unit, the main control unit processing signals also sends to display unit with result and shows.
7, embedded computer electrometric integrated instrument as claimed in claim 6, it is characterized in that: described frequency meter module comprises microprocessing unit, control circuit unit, low frequency binary channels input block, amplifier unit, converter unit, the high frequency input block, high speed field effect transistor amplifier and frequency divider, control circuit unit is controlled low frequency binary channels input block respectively, amplifier unit and converter unit, low frequency binary channels input block is sent to amplifier with low-frequency input signal and amplifies, low frequency signal after the amplification is sent to converter, and the low frequency signal after converter is handled is sent to the equal precision measurement module in the described main control unit; The high frequency input block is sent to high speed field effect transistor amplifier with input signal, is sent to the equal precision measurement module in the described main control unit behind the high-frequency signal process frequency divider frequency division after the amplification.
8, embedded computer electrometric integrated instrument as claimed in claim 7, it is characterized in that: described LCR tester module comprises first test clip, second test clip, the gear switch unit, the resistance measuring unit, inductance measurement unit and microprocessing unit, wherein the gear switch unit connects first test clip and second test clip input signal types at first test clip and second test clip is switched, the signal of gear switch unit output is sent to resistance measuring unit and inductance measurement unit respectively, resistance measuring unit and inductance measurement element output signal are to microprocessing unit, the control of microprocessing unit and described control module communicates, and receives control and sends measurement result.
9, embedded computer electrometric integrated instrument as claimed in claim 8, it is characterized in that: described digital IC tester module comprises test bench unit, pin control circuit matrix unit, CPLD/FPGA modular unit and slave controller unit, wherein pin control circuit matrix unit is sent to from control module after obtaining the data of test bench unit acquisition and sending to CPLD/FPGA modular unit, CPLD/FPGA modular unit deal with data, and the slave controller unit is accepted the control of described control module and result is sent to described control module.
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| CNA2008100678160A CN101603979A (en) | 2008-06-11 | 2008-06-11 | Embedded computer electrometric integrated instrument |
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| CN102495253A (en) * | 2011-12-12 | 2012-06-13 | 江苏绿扬电子仪器集团有限公司 | Handheld multifunctional parallel-operation measuring device |
| CN102843267A (en) * | 2011-06-22 | 2012-12-26 | 上海固泰科技有限公司 | Method for testing data link layer of MOST (media oriented system transport) bus |
| CN103176043A (en) * | 2011-12-21 | 2013-06-26 | 北京普源精电科技有限公司 | Signal generator with frequency meter and signal processing method |
| CN103278669A (en) * | 2013-05-15 | 2013-09-04 | 西安电子科技大学 | Multifunctional portable experiment device |
| CN103809989A (en) * | 2012-11-08 | 2014-05-21 | 英华达（南京）科技有限公司 | Method for reading complete core log under situation of core collapse of operating system |
| CN104133139A (en) * | 2014-07-30 | 2014-11-05 | 成都天奥测控技术有限公司 | Multifunctional PXI module integration testing instrument and testing method thereof |
| CN108828286A (en) * | 2018-08-30 | 2018-11-16 | 上海澄科电子科技有限公司 | A kind of Electronic Testing integrated instrument and its operation method |
| CN109444588A (en) * | 2018-11-15 | 2019-03-08 | 东南大学 | A kind of LCR measuring system based on FPGA+DDS+PLL |
| CN109460382A (en) * | 2018-09-06 | 2019-03-12 | 国营芜湖机械厂 | A kind of machine carried memory read-write equipment based on SOPC technology |
| CN110174552A (en) * | 2019-05-31 | 2019-08-27 | 昆明理工大学 | A kind of digital double channel frequency response analyzer and test method |
| CN110812693A (en) * | 2019-09-27 | 2020-02-21 | 中国科学院心理研究所 | Multichannel high-frequency non-invasive accurate positioning nerve stimulation system |
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| CN102843267A (en) * | 2011-06-22 | 2012-12-26 | 上海固泰科技有限公司 | Method for testing data link layer of MOST (media oriented system transport) bus |
| CN102495253A (en) * | 2011-12-12 | 2012-06-13 | 江苏绿扬电子仪器集团有限公司 | Handheld multifunctional parallel-operation measuring device |
| CN103176043A (en) * | 2011-12-21 | 2013-06-26 | 北京普源精电科技有限公司 | Signal generator with frequency meter and signal processing method |
| CN103809989A (en) * | 2012-11-08 | 2014-05-21 | 英华达（南京）科技有限公司 | Method for reading complete core log under situation of core collapse of operating system |
| CN103809989B (en) * | 2012-11-08 | 2017-07-11 | 英华达（南京）科技有限公司 | The method that operating system occurs reading complete kernel daily record under core collapse case |
| CN103278669A (en) * | 2013-05-15 | 2013-09-04 | 西安电子科技大学 | Multifunctional portable experiment device |
| CN103278669B (en) * | 2013-05-15 | 2015-07-15 | 西安电子科技大学 | Multifunctional portable experiment device |
| CN104133139A (en) * | 2014-07-30 | 2014-11-05 | 成都天奥测控技术有限公司 | Multifunctional PXI module integration testing instrument and testing method thereof |
| CN108828286A (en) * | 2018-08-30 | 2018-11-16 | 上海澄科电子科技有限公司 | A kind of Electronic Testing integrated instrument and its operation method |
| CN109460382A (en) * | 2018-09-06 | 2019-03-12 | 国营芜湖机械厂 | A kind of machine carried memory read-write equipment based on SOPC technology |
| CN109444588A (en) * | 2018-11-15 | 2019-03-08 | 东南大学 | A kind of LCR measuring system based on FPGA+DDS+PLL |
| CN110174552A (en) * | 2019-05-31 | 2019-08-27 | 昆明理工大学 | A kind of digital double channel frequency response analyzer and test method |
| CN110174552B (en) * | 2019-05-31 | 2023-12-22 | 昆明理工大学 | Digital dual-channel frequency response analyzer and testing method |
| CN110812693A (en) * | 2019-09-27 | 2020-02-21 | 中国科学院心理研究所 | Multichannel high-frequency non-invasive accurate positioning nerve stimulation system |
| CN110812693B (en) * | 2019-09-27 | 2021-08-03 | 中国科学院心理研究所 | Multichannel high-frequency non-invasive accurate positioning nerve stimulation system |
| CN113804992A (en) * | 2020-06-16 | 2021-12-17 | 普源精电科技股份有限公司 | Test function module, multifunctional test system and method |
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Application publication date: 20091216 |