CN201796119U - Programmable digital integrated circuit alternating-current parameter testing system - Google Patents
Programmable digital integrated circuit alternating-current parameter testing system Download PDFInfo
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- CN201796119U CN201796119U CN2010202423900U CN201020242390U CN201796119U CN 201796119 U CN201796119 U CN 201796119U CN 2010202423900 U CN2010202423900 U CN 2010202423900U CN 201020242390 U CN201020242390 U CN 201020242390U CN 201796119 U CN201796119 U CN 201796119U
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Abstract
The utility model provides a programmable digital integrated circuit alternating-current parameter testing system, which comprises a programmable power source, an oscilloscope, a tested device module, a signal source, a control computer and a testing mainboard. The programmable power source is connected with the tested device module so as to provide testing power to the tested device module and is also connected with the control computer, the oscilloscope detects test signals of the testing mainboard via a probe and is connected with the control computer to transmit the test signals, the tested device module is connected with the tested device module and the testing mainboard respectively so as to realize data interactive transmission, and the signal source is connected with the testing mainboard to provide time test signals for the testing mainboard. The integrated circuit alternating-current parameter testing system is universal, and can be used for universal and specific tests for different types of test objects, thereby reducing product cost and increasing test precision and test efficiency.
Description
Technical field
The utility model relates to high-precision test macro of a kind of digital integrated circuit alternating-current parameter and method, particularly a kind of programmable digital integrated circuit alternating current parameter testing system and method.
Background technology
At present, GB/T 17574 (semiconductor devices integrated circuit second portion: specified test digital integrated circuit) is abideed by in the test of digital integrated circuit, this method of testing is the outline of digital integrated circuit method of testing, science, measuring accuracy is also the highest, but the AC parameter test of this method of testing defined will be used signal source, oscillograph or time test instrument, and the general method of testing that adopts of current automatic integrated circuit tester (ATE) is: the mode of high-frequency signal step-by-step counting, for example: test is during the rise time, method with step-by-step counting, a high-frequency impulse is just arranged, behind the magnitude of voltage that runs into setting, begin counting, behind the magnitude of voltage that runs into another setting, finish, if the cycle of this pulse is M (ns), so, always amounted to number in this process N time, the rise time is exactly M*N (ns).
According to the requirement of GB/T 17574, the rise time should be in the test of 20% and 80% place of high-low level, and the magnitude of voltage of setting 20% place is 0.5V, begin counting from 0.5V, the cycle of each pulse is 1NS, if counted 12 times, to the magnitude of voltage 4.2V at 80% place by, the rise time is 12NS, so this method of testing is relevant with frequency and sampled point, frequency is high more, measuring accuracy is also high more, and at present, the general frequency of homemade ATE is lower, and import ATE price height should not generally use; Sampled point should be determined by the number percent (20%, 80%) of high-low level, but in the ATE test, by point of fixed potential (0.5V, 4.2V) decision, this has also caused the increase of test error, and the exchange time test error of common homemade ATE is up to 10nS-20nS.
And the equipment that can test in enormous quantities is very expensive, and each test macro and method of testing exist and be difficult to blanket problem, and not possessing for various types of tested objects provides general test.
Summary of the invention
The purpose of this utility model is the shortcoming that overcomes above-mentioned prior art, a kind of programmable digital integrated circuit alternating current parameter testing system is provided, make the alternating-current measurement system of integrated circuit possess versatility, can be dissimilar tested objects general and specific test is provided, thereby realize reducing cost of products, improve the purpose of measuring accuracy and testing efficiency.
For reaching above-mentioned technique effect, the present invention adopts following technical scheme:
A kind of programmable digital integrated circuit alternating current parameter testing system, this system comprises:
Programmable power supply and measured device module are connected to tested module provides testing power supply, links to each other with control computer;
An oscillograph detects the test signal of testing host by popping one's head in, and is connected transmitted test signal with control computer;
A measured device module connects respectively and by side device and testing host, carries out the mutual transmission of data;
Signal source and testing host are connected to testing host provides the clock test signal;
A control computer connects testing host, programmable power supply and oscillograph;
It is characterized in that this system also comprises a testing host, this mainboard comprises: mainboard chip, decoding scheme, signal source relay matrix, test channel relay matrix, signal processing circuit, power supply dial, decoding scheme, mainboard chip and control computer are carried out data interaction, and the control decoding scheme is controlled relay matrix and circuit.
Preferable, described control computer parallel port control main board chip, described mainboard chip adopts the AT89C51 chip, and the measured device module can be selected according to the number of pin of measured device.Testing host connects a pilot lamp, and this system that is used to show test results can edit test procedure temporarily, also can edit test procedure in advance and call at any time, can adjust test parameter in the test procedure.
The beneficial effects of the utility model:
Test macro of the present utility model makes the alternating-current measurement system of integrated circuit possess versatility, can be dissimilar tested objects general and specific test is provided, thereby realize reducing cost of products, improves the purpose of measuring accuracy and testing efficiency.
Description of drawings
Fig. 1 is the synoptic diagram of a kind of embodiment of the present utility model.
Fig. 2 is the synoptic diagram of a kind of testing host of the present utility model.
Embodiment
To shown in Figure 2, it is a kind of programmable digital integrated circuit alternating current parameter testing system that the utility model proposes as Fig. 1, and it comprises that a programmable power supply 2 and measured device module 7 are connected to tested module testing power supply is provided, and links to each other with control computer 1;
An oscillograph 4 passes through the test signal that probe 6 detects testing hosts 5, and is connected transmitted test signal with control computer 1;
A measured device module 7 connects respectively and by side device 8 and testing host 5, carries out the mutual transmission of data;
A signal source 3 is connected to testing host 5 with testing host 5 provides the clock test signal;
A control computer 1 connects testing host 5 and programmable power supply 2 and oscillograph 4, and to it
A testing host comprises AT89C51 chip 9, decoding scheme 10, signal source relay matrix 12, passage relay matrix 13, signal processing circuit 14, pilot lamp 11, power supply dial 16, wherein, the function of AT89C51 chip 9 is and control computer 1 interaction data, and control decoding scheme 10, signal source relay matrix 12 and passage relay matrix 13 and other circuit are controlled.
At first write the measured device title, set testing procedure and testing sequence, the parameter of test, comprise that the parameter such as special time of time delay, switching time, rise time, fall time, Time Created, retention time, resolving time, output enabled time, output disabled time, storer and frequency, cycle, high-low level, dutycycle, amplitude, peak-to-peak value measure all parameters that oscillographs such as positive negative pulse stuffing width, burst width can be measured automatically; When testing each time, must select test channel and fill in supply voltage, signal source frequency, level, the title of test parameter should be corresponding one by one with the oscillograph test parameter, control these CALCULATION OF PARAMETERS, computing method have: add, subtract, take advantage of, remove, on average, root mean square, exponential relationship, logarithmic relationship, tangent, cotangent, sinusoidal, cosine etc., during calculating, can call measured value, also can directly set fixed value, the logical relation that can also use during calculating has: with, or, non-, or it is non-, with non-etc., in program, the parameter area criterion is set, and by judging that parameter forms measurement result, after above the setting, form test procedure, write finish after, preserve test procedure at assigned address, when test, directly call; Software output is to be used for showing qualified (green light) or lost efficacy by (red light) on the pilot lamp of testing host, and test parameter and result of calculation are kept in the enactment document of computing machine.
Computing machine is according to setting program, behind the signal that obtains beginning to test, the supply voltage that is fit to is added to the power end of measured device, the signal characteristic of signal source is determined by the signal source relay 12 of computer settings, AT89C51 chip 9 is controlled decoding schemes 10 afterwards, close the corresponding relay in the corresponding passage relay matrix 13, be added to the input end of measured device by relay 12 in the signal source 3 signal sources of input end, output terminal relay in the while close passage relay matrix 13, output adds load, oscillograph relay in the closing passage relay matrix 13 successively, by popping one's head in 6, oscillograph 4 just can monitor corresponding input, output signal, whenever close the oscillograph relay No. one time, just measure once input, output signal, control computer 1 also writes down test parameter one time, because the measurement of oscillograph 4 is real-time, therefore, computer monitoring to data change, so the data setting of computer recording is to measure 10 times mean value, thereby realize the test assignment of oscillograph to AC signal, test result is kept in the computing machine by the data of integrated software invocation oscillograph software.
Above-described only is preferred embodiment of the present utility model.Should be understood that for the person of ordinary skill of the art, under technology enlightenment provided by the utility model,, can also make other equivalent modifications and improvement, also should be considered as protection domain of the present utility model as the common practise of this area.
Claims (4)
1. programmable digital integrated circuit alternating current parameter testing system, this system comprises:
Programmable power supply and measured device module are connected to tested module provides testing power supply, links to each other with control computer;
An oscillograph detects the test signal of testing host by popping one's head in, and is connected transmitted test signal with control computer;
A measured device module connects respectively and by side device and testing host, carries out the mutual transmission of data;
Signal source and testing host are connected to testing host provides the clock test signal;
A control computer connects testing host, programmable power supply and oscillograph, and it is controlled;
It is characterized in that this system also comprises a testing host, this mainboard comprises: mainboard chip, decoding scheme, signal source relay matrix, test channel relay matrix, signal processing circuit, power supply dial, decoding scheme, mainboard chip and control computer are carried out data interaction, and the control decoding scheme is controlled relay matrix and circuit.
2. according to the described a kind of programmable digital integrated circuit alternating current parameter testing system of claim 1, it is characterized in that described control computer parallel port control main board chip.
3. according to the described a kind of programmable digital integrated circuit alternating current parameter testing system of claim 1, it is characterized in that described mainboard chip adopts the AT89C51 chip.
4. according to the described a kind of programmable digital integrated circuit alternating current parameter testing system of claim 1, it is characterized in that described testing host connects a pilot lamp, be used to show test results.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN2010202423900U CN201796119U (en) | 2010-06-26 | 2010-06-26 | Programmable digital integrated circuit alternating-current parameter testing system |
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| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN2010202423900U CN201796119U (en) | 2010-06-26 | 2010-06-26 | Programmable digital integrated circuit alternating-current parameter testing system |
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| CN201796119U true CN201796119U (en) | 2011-04-13 |
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| CN2010202423900U Expired - Lifetime CN201796119U (en) | 2010-06-26 | 2010-06-26 | Programmable digital integrated circuit alternating-current parameter testing system |
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Cited By (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN101865946A (en) * | 2010-06-26 | 2010-10-20 | 天水天光半导体有限责任公司 | Alternating current parameter testing system and method of programmable digital integrated circuit |
| CN105510663A (en) * | 2015-11-27 | 2016-04-20 | 中国电子科技集团公司第五十八研究所 | Automatic acquisition and testing method for high-amplitude differential signal |
| CN108627726A (en) * | 2018-07-23 | 2018-10-09 | 桂林电子科技大学 | A kind of test device and its test method of simulated power cyclic curve |
| CN109085493A (en) * | 2018-09-11 | 2018-12-25 | 山东鲁能智能技术有限公司 | embedded module test system and method |
| CN115792768A (en) * | 2023-01-04 | 2023-03-14 | 俐玛光电科技(北京)有限公司 | Monitoring method and device for integrated circuit test and electronic equipment |
-
2010
- 2010-06-26 CN CN2010202423900U patent/CN201796119U/en not_active Expired - Lifetime
Cited By (7)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN101865946A (en) * | 2010-06-26 | 2010-10-20 | 天水天光半导体有限责任公司 | Alternating current parameter testing system and method of programmable digital integrated circuit |
| CN105510663A (en) * | 2015-11-27 | 2016-04-20 | 中国电子科技集团公司第五十八研究所 | Automatic acquisition and testing method for high-amplitude differential signal |
| CN105510663B (en) * | 2015-11-27 | 2018-10-02 | 中国电子科技集团公司第五十八研究所 | A kind of automation collection test method applied to amplitude differential signal |
| CN108627726A (en) * | 2018-07-23 | 2018-10-09 | 桂林电子科技大学 | A kind of test device and its test method of simulated power cyclic curve |
| CN108627726B (en) * | 2018-07-23 | 2020-04-03 | 桂林电子科技大学 | Testing device and testing method for simulating power cycle curve |
| CN109085493A (en) * | 2018-09-11 | 2018-12-25 | 山东鲁能智能技术有限公司 | embedded module test system and method |
| CN115792768A (en) * | 2023-01-04 | 2023-03-14 | 俐玛光电科技(北京)有限公司 | Monitoring method and device for integrated circuit test and electronic equipment |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| C14 | Grant of patent or utility model | ||
| GR01 | Patent grant | ||
| AV01 | Patent right actively abandoned |
Granted publication date: 20110413 Effective date of abandoning: 20120725 |