CN109085493A - embedded module test system and method - Google Patents
embedded module test system and method Download PDFInfo
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- CN109085493A CN109085493A CN201811057453.2A CN201811057453A CN109085493A CN 109085493 A CN109085493 A CN 109085493A CN 201811057453 A CN201811057453 A CN 201811057453A CN 109085493 A CN109085493 A CN 109085493A
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/282—Testing of electronic circuits specially adapted for particular applications not provided for elsewhere
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/28—Provision in measuring instruments for reference values, e.g. standard voltage, standard waveform
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R19/00—Arrangements for measuring currents or voltages or for indicating presence or sign thereof
- G01R19/25—Arrangements for measuring currents or voltages or for indicating presence or sign thereof using digital measurement techniques
- G01R19/2506—Arrangements for conditioning or analysing measured signals, e.g. for indicating peak values ; Details concerning sampling, digitizing or waveform capturing
- G01R19/2509—Details concerning sampling, digitizing or waveform capturing
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- Engineering & Computer Science (AREA)
- General Engineering & Computer Science (AREA)
- Test And Diagnosis Of Digital Computers (AREA)
Abstract
The invention discloses a kind of embedded module test system and methods, including host computer, programmable power supply and control panel, control panel is configured with DC voltage Acquisition Circuit and AC voltage sampling module, the direct current of board under test and alternating voltage are acquired respectively, it is configured with analog AC charging simultaneously, DC charging guidance circuit interface and AC charging guidance circuit interface, each interface is connected with host computer, receive the control command of host computer, and according to the connection circuit of order conducting the corresponding interface and board under test, host computer is connected with programmable power supply, the voltage output of programmable power supply is connect with control panel；Host computer is configured as receiving test instruction, and the acquisition information uploaded to control panel is calibrated, and the voltage or state uploaded according to board under test obtains direct current, exchange or/and the steering voltage of board under test.
Description
Technical field
The present invention relates to a kind of embedded module test system and methods.
Background technique
Electric car charging technique passes through the development of many years, and the embedded hardware module demand inside charging equipment is increasingly
More, performance requirement is increasingly stringenter, and how to carry out complete test analysis to each embedded hardware module of charging equipment, more next
It is more important.
And present embedded hardware mostly carries out functional test in systems, if corresponding function can be completed, is considered as
Test passes through, and cannot do complete test to the performance of product.
Summary of the invention
The present invention to solve the above-mentioned problems, proposes a kind of embedded module test system and method, the present invention can
Realization carries out comprehensive test to embedded module circuit function.
To achieve the goals above, the present invention adopts the following technical scheme:
A kind of embedded module test system, including host computer, programmable power supply and control panel, in which:
The control panel is configured with DC voltage Acquisition Circuit and AC voltage sampling module, respectively to board under test
Direct current and alternating voltage are acquired, at the same be configured with analog AC charging, DC charging guidance circuit interface is filled with exchanging
Conductance draws circuit interface, and each interface is connected with host computer, receives the control command of host computer, and the corresponding interface is connected according to order
With the connection circuit of board under test；
The host computer is connected with programmable power supply, and the voltage output of programmable power supply is connect with control panel；
The host computer, be configured as receive test instruction, to control panel upload acquisition information calibrate, according to
The voltage or state that drafting board uploads, obtain direct current, exchange or/and the steering voltage of board under test.
Further, the DC voltage of acquisition is uploaded to host computer, host computer by the DC voltage acquisition module in real time
Programmable power supply is sent and is ordered, voltage is raised to setting value, and confirm to the voltage of acquisition, when voltage is met the requirements
Afterwards, host computer issues the order for opening voltage interface to control panel, until the voltage stabilization that the embedded voltage of board under test uploads
Afterwards, host computer calibrates the calibration factor of acquisition module.
Further, ferroelectric memory is provided in the board under test to store the coefficient of AD conversion, host computer is read
The voltage for AD conversion coefficient and the board under test acquisition that ferroelectricity stores in board under test, the voltage that control panel is uploaded is as standard electric
Pressure removes the calibration factor for calculating board under test, and this coefficient is written in board under test ferroelectric memory.
Further, the programmable power supply is sequentially output out of its input voltage range at interval of certain voltage value, on
Position machine records the voltage in each point of board under test, and analytical error range.
Further, in analysis, if normal voltage subtracts the absolute values of board under test collection voltages divided by normal voltage,
Then think to meet error range in the range of setting.
Further, the alternating voltage of acquisition is uploaded to host computer by the AC voltage sampling module in real time, upper
The alternating voltage module for the voltage calibration board under test that machine is uploaded according to control panel.
Further, be provided in the board under test ferroelectric memory storage AD conversion coefficient, host computer read to
The voltage for AD conversion coefficient and the board under test acquisition that ferroelectricity stores in drafting board, the voltage that control panel is uploaded as normal voltage,
The calibration factor of calculating board under test is removed, and this coefficient is written in board under test ferroelectric memory.
Further, the direct current steering voltage measurement interface is connect with host computer, and host computer is led according to timing to direct current
Draw the order that voltage measurement interface issues investment resistance, control panel puts into the resistance of different resistance values, host computer according to timing respectively
When control panel puts into resistance, according to the state that board under test plate uploads, the steering voltage that analysis board under test measures is carried out.
Because direct current steering voltage only has tri- kinds of states of 12V, 6V, 4V, control panel provides normal voltage；The ferroelectricity of board under test
Memory stores the coefficient of AD conversion, and host computer can read the AD conversion coefficient and board under test that ferroelectric memory stores in board under test
The voltage of acquisition removes design factor according to the voltage of normal voltage and board under test acquisition, and board under test ferroelectricity is written in this coefficient
In memory.
After the completion of calibration, different resistance of the host computer according to investment, the guidance circuit connection of resistance and board under test, realization
Different partial pressure combinations, host computer can be combined according to different partial pressures, according to the error range under the different voltages of formulation, analysis
Within the acceptable range whether the voltage of board under test acquisition.
Further, the AC charging guidance circuit interface is connected to host computer, and host computer is according to timing to control panel
The order of investment resistance is issued, control panel puts into the resistance of different resistance values according to timing respectively, and host computer puts into electricity in control panel
When resistance, according to the state that board under test uploads, the steering voltage that analysis board under test measures is carried out.
Exchange steering voltage only has tri- kinds of states of 12V, 6V, 4V, and control panel provides normal voltage；Ferroelectricity in board under test is deposited
Reservoir stores the coefficient of AD conversion, and the AD conversion coefficient and board under test that host computer reads ferroelectric memory storage in board under test acquire
Voltage, design factor is gone with the voltage with board under test acquisition according to normal voltage, and this coefficient write-in board under test ferroelectricity is deposited
In reservoir.
After the completion of calibration, different resistance of the host computer according to investment, the guidance circuit connection of resistance and board under test, realization
Different partial pressure combinations, host computer can be combined according to different partial pressures, according to the error range under the different voltages of formulation, analysis
Within the acceptable range whether the voltage of board under test acquisition.
Board under test has PT1000 temperature sensing circuit, and PT1000 is platinum resistance thermometer sensor, and as the temperature rises, resistance can rise
It is high.Analog temperature interface circuit is exactly several resistance values in PT1000 resistance value variable range, the circuit of composition.
Test method based on above system, control panel provide normal voltage；Ferroelectric memory in board under test stores AD
The coefficient of conversion, host computer read the voltage of the AD conversion coefficient of ferroelectric memory storage and board under test acquisition in board under test, root
Design factor is removed according to normal voltage and the voltage with board under test acquisition, and this coefficient is written in board under test ferroelectric memory；
After the completion of calibration, different resistance of the host computer according to investment, the guidance circuit connection of resistance and board under test, realization
Different partial pressure combinations, host computer can be combined according to different partial pressures, according to the error range under the different voltages of formulation, analysis
Within the acceptable range whether the voltage of board under test acquisition.
Compared with prior art, the invention has the benefit that
1, the present invention can be realized the comprehensive test to module, and analyze corresponding performance.
Detailed description of the invention
The accompanying drawings constituting a part of this application is used to provide further understanding of the present application, and the application's shows
Meaning property embodiment and its explanation are not constituted an undue limitation on the present application for explaining the application.
Fig. 1 is system summary structure block diagram；
Fig. 2 is the control panel analog voltage Acquisition Circuit in the present embodiment；
Fig. 3 is that the calibration of control panel direct current steering voltage and resistance in the present embodiment put into circuit；
Specific embodiment:
The invention will be further described with embodiment with reference to the accompanying drawing.
It is noted that following detailed description is all illustrative, it is intended to provide further instruction to the application.Unless another
It indicates, all technical and scientific terms used herein has usual with the application person of an ordinary skill in the technical field
The identical meanings of understanding.
It should be noted that term used herein above is merely to describe specific embodiment, and be not intended to restricted root
According to the illustrative embodiments of the application.As used herein, unless the context clearly indicates otherwise, otherwise singular
Also it is intended to include plural form, additionally, it should be understood that, when in the present specification using term "comprising" and/or " packet
Include " when, indicate existing characteristics, step, operation, device, component and/or their combination.
In the present invention, term for example "upper", "lower", "left", "right", "front", "rear", "vertical", "horizontal", " side ",
The orientation or positional relationship of the instructions such as "bottom" is to be based on the orientation or positional relationship shown in the drawings, only to facilitate describing this hair
Bright each component or component structure relationship and the relative of determination, not refer in particular to either component or element in the present invention, cannot understand
For limitation of the present invention.
In the present invention, term such as " affixed ", " connected ", " connection " be shall be understood in a broad sense, and indicate may be a fixed connection,
It is also possible to be integrally connected or is detachably connected；It can be directly connected, it can also be indirectly connected through an intermediary.For
The related scientific research of this field or technical staff can determine the concrete meaning of above-mentioned term in the present invention as the case may be,
It is not considered as limiting the invention.
This system forms detecting and analysing system by host computer, control panel, board under test, attachment device.This system can be to CAN
The communication success rate of communication line, message protocol are analyzed；The calibration analysis of 0-1000V voltage acquisition module；Alternating voltage is adopted
Collect modular calibration；AC charging, the steering voltage analysis of DC charging.
The hardware platform of control panel uses the STM32F105 hardware platform of Cortex-M3 series, this hardware platform has two
Road CAN interface.There is 0-1000V voltage collection circuit on control panel；Analog AC charging, DC charging guidance circuit interface；
Analog temperature circuit interface.After the corresponding module of upper computer selecting, host computer can be sent accordingly by CAN mouthfuls to control panel
Corresponding interface is connected by attachment device with board under test after receiving order for order, control panel.The outer of control panel is with direct current
Voltage interface, alternating voltage interface etc..Each voltage acquisition module of control panel will do it precision calibration before use.
Host computer is to turn the CAN mouth for being connected to central control board by USB in PC machine, and the CAN mouth of control panel is connected to
The CAN mouth of board under test, to form CAN bus route, 120 ohm of build-out resistor connect respectively USB turn CAN box end with it is to be measured
CAN mouthfuls of ends of plate.When testing board under test CAN communication, host computer can send to board under test according to communication protocol and order, and record to be measured
The response time of plate, route message success rate.It realizes and the embedded hardware module with CAN port communications is tested.
Testing range, calibration voltage first is arranged at upper computer software interface, such as setting in the measurement of DC voltage acquisition module
Range is 0-1000V, calibration voltage 500V.There is DC voltage Acquisition Circuit on control panel, the DC voltage of acquisition is real-time
It is uploaded to host computer.Host computer can send programmable power supply and order, and voltage is raised to 500V, and pass through control panel voltage acquisition
Voltage confirmed that after voltage is met the requirements, host computer issues the order for opening voltage interface to control panel, until to be measured
After the voltage stabilization that the embedded voltage of plate uploads, host computer calibrates the calibration factor of acquisition module.After the completion of calibration, meeting
Programmable power supply is sequentially output from the interval 0V-1000V 10V, host computer can record the voltage in each point of board under test, and
Analytical error range.
The measurement of AC voltage sampling module, in this option of upper computer selecting, host computer sends order to control panel and opens this
Interface.There is AC voltage sampling circuit on control panel, the alternating voltage of acquisition can be uploaded to host computer in real time.Host computer meeting
According to the alternating voltage module for the voltage calibration board under test that control panel uploads.
The measurement of direct current steering voltage, in this option of upper computer selecting, host computer sends order to control panel and opens this interface,
Host computer can according to timing to control panel issue investment resistance order, control panel can be put into respectively according to timing 333 ohm,
500 ohm, 1000 ohm of resistance.When putting into 500 Ohmic resistance, the Acquisition Circuit for leading board under test can be carried out school by host computer
It is quasi-.Host computer, according to the state that board under test plate uploads, can carry out the guiding that analysis board under test measures when control panel puts into resistance
Voltage.
Exchange steering voltage measurement, upper computer selecting this, host computer to control panel send order open this interface, on
Position chance according to timing to control panel issue investment resistance order, control panel can be put into respectively according to timing 1000 ohm,
3000 ohm of resistance.Host computer, according to the state that board under test uploads, carries out analysis board under test and surveys when control panel puts into resistance
The steering voltage obtained.
The present embodiment can carry out marginal testing and comprehensive test, specific: marginal testing such as direct current collection voltages
For the range of 0-1000V, test macro can test in 0V, 1000V, 1001V；
Comprehensive test may be tested more preferably with gamut, if direct current acquisition voltage range is 0-1000V, be provided with 0-
The voltage of 1000V is tested.
Fig. 2 is DC voltage Acquisition Circuit, and the voltage of this Acquisition Circuit is uploaded to host computer as normal voltage in real time, on
Position machine removes the voltage of calibration board under test as standard.R12, R13 form bleeder circuit, and the voltage of 0-1000V is assigned to 0-
3.3V；U5A is voltage follower；U5B is reversed feedback amplifier；U26 is linear isolation optocoupler；U6 is voltage follower；Pass through
The pin that 0-1000V voltage is converted to 0-3.3V to singlechip chip is AD converted by this chain of circuits.Another way also rises
The negative 1000V voltage of 0- is only AD converted by identical effect.
Fig. 3 is that resistance puts into circuit and direct current stake steering voltage Acquisition Circuit, and steering voltage Acquisition Circuit plays two aspects
Effect, one acquisition investment resistance after partial pressure, be uploaded to host computer in real time；Two confirmation resistance are put into successfully.U59A,U59B,
U58, U64A etc. form voltage collection circuit, and U59A is voltage follower, and U 59B is feedback amplifier, and U58 is linear isolation light
Coupling, U64 are voltage followers, and R123 and R121 form bleeder circuit.0-12V voltage is converted into 0- by a series of circuit
The pin of 3.3V to singlechip chip is AD converted.By dragging down the pin 2 of U11, U12 optocoupler, make pin 3 and pin 4 it
Between be connected, divider resistance is put into.
Certainly, Fig. 2 and Fig. 3 is only a kind of embodiment of corresponding Acquisition Circuit, can also there is other embodiments.
Direct current steering voltage measurement interface is connect with host computer, and host computer measures interface to direct current steering voltage according to timing
The order of investment resistance is issued, control panel puts into the resistance of different resistance values according to timing respectively, and host computer puts into electricity in control panel
When resistance, according to the state that board under test plate uploads, the steering voltage that analysis board under test measures is carried out.
Because direct current steering voltage only has tri- kinds of states of 12V, 6V, 4V, control panel provides normal voltage (4V)；Board under test
Ferroelectric memory stores the coefficient of AD conversion, host computer can read AD conversion coefficient that ferroelectric memory in board under test stores with to
The voltage of drafting board acquisition removes design factor according to the voltage of normal voltage and board under test acquisition, and board under test is written in this coefficient
In ferroelectric memory.
After the completion of calibration, different resistance of the host computer according to investment, the guidance circuit connection of resistance and board under test, realization
Different partial pressure combinations, host computer can be combined according to different partial pressures, according to the error range under the different voltages of formulation, analysis
Within the acceptable range whether the voltage of board under test acquisition.
AC charging guidance circuit interface is connected to host computer, and host computer issues investment resistance to control panel according to timing
Order, control panel put into the resistance of different resistance values according to timing respectively, and host computer is when control panel puts into resistance, according to board under test
The state of upload carries out the steering voltage that analysis board under test measures.
Exchange steering voltage only has tri- kinds of states of 12V, 6V, 4V, and control panel provides normal voltage (4V)；Iron in board under test
Electrical storage stores the coefficient of AD conversion, and host computer reads the AD conversion coefficient and board under test of ferroelectric memory storage in board under test
The voltage of acquisition removes design factor according to normal voltage and the voltage with board under test acquisition, and board under test iron is written in this coefficient
In electrical storage.
After the completion of calibration, different resistance of the host computer according to investment, the guidance circuit connection of resistance and board under test, realization
Different partial pressure combinations, host computer can be combined according to different partial pressures, according to the error range under the different voltages of formulation, analysis
Within the acceptable range whether the voltage of board under test acquisition.
Board under test has PT1000 temperature sensing circuit, and PT1000 is platinum resistance thermometer sensor, and as the temperature rises, resistance can rise
It is high.Analog temperature interface circuit is exactly several resistance values in PT1000 resistance value variable range, the circuit of composition.
The foregoing is merely preferred embodiment of the present application, are not intended to limit this application, for the skill of this field
For art personnel, various changes and changes are possible in this application.Within the spirit and principles of this application, made any to repair
Change, equivalent replacement, improvement etc., should be included within the scope of protection of this application.
Above-mentioned, although the foregoing specific embodiments of the present invention is described with reference to the accompanying drawings, not protects model to the present invention
The limitation enclosed, those skilled in the art should understand that, based on the technical solutions of the present invention, those skilled in the art are not
Need to make the creative labor the various modifications or changes that can be made still within protection scope of the present invention.
Claims (10)
1. a kind of embedded module test system, it is characterized in that: including host computer, programmable power supply and control panel, in which:
The control panel is configured with DC voltage Acquisition Circuit and AC voltage sampling module, respectively to the direct current of board under test
It is acquired with alternating voltage, while being configured with analog AC charging, DC charging guidance circuit interface and AC charging and leading
Draw circuit interface, each interface is connected with host computer, receive the control command of host computer, and according to order conducting the corresponding interface with to
The connection circuit of drafting board；
The host computer is connected with programmable power supply, and the voltage output of programmable power supply is connect with control panel；
The host computer is configured as receiving test instruction, and the acquisition information uploaded to control panel is calibrated, according to board under test
The voltage or state of upload obtain direct current, exchange or/and the steering voltage of board under test.
2. a kind of embedded module test system as described in claim 1, it is characterized in that: the DC voltage acquisition module,
The DC voltage of acquisition is uploaded to host computer in real time, host computer sends programmable power supply and orders, voltage is raised to setting value,
And the voltage of acquisition is confirmed, after voltage is met the requirements, host computer issues the order for opening voltage interface to control panel,
After the voltage stabilization that the embedded voltage of board under test uploads, host computer calibrates the calibration factor of acquisition module.
3. a kind of embedded module test system as claimed in claim 2, it is characterized in that: being provided with ferroelectricity in the board under test
For memory to store the coefficient of AD conversion, host computer reads the AD conversion coefficient of ferroelectricity storage and board under test acquisition in board under test
Voltage, the voltage that control panel is uploaded remove the calibration factor for calculating board under test as normal voltage, and the write-in of this coefficient is to be measured
In plate ferroelectric memory.
4. a kind of embedded module test system as described in claim 1, it is characterized in that: the programmable power supply is inputted from it
It is sequentially output in voltage range at interval of certain voltage value, host computer records the voltage in each point of board under test, and analyzes
Error range.
5. a kind of embedded module test system as claimed in claim 4, it is characterized in that: in analysis, if normal voltage subtracts
It goes the absolute value of board under test collection voltages divided by normal voltage, then thinks to meet error range in the range of setting.
6. a kind of embedded module test system as described in claim 1, it is characterized in that: the AC voltage sampling module will
The alternating voltage of acquisition is uploaded to host computer, the alternating current for the voltage calibration board under test that host computer is uploaded according to control panel in real time
Die block.
7. a kind of embedded module test system as claimed in claim 6, it is characterized in that: being provided with ferroelectricity in the board under test
Memory stores the coefficient of AD conversion, and host computer reads the electricity of the AD conversion coefficient of ferroelectricity storage and board under test acquisition in board under test
Pressure, the voltage that control panel is uploaded removes the calibration factor for calculating board under test as normal voltage, and board under test is written in this coefficient
In ferroelectric memory.
8. a kind of embedded module test system as described in claim 1, it is characterized in that: the direct current steering voltage measurement connects
Mouth is connect with host computer, and host computer issues the order of investment resistance, control panel according to timing to direct current steering voltage measurement interface
Put into the resistance of different resistance values respectively according to timing, host computer is when control panel puts into resistance, according to the shape of board under test plate upload
State carries out the steering voltage that analysis board under test measures.
Because direct current steering voltage only has tri- kinds of states of 12V, 6V, 4V, control panel provides normal voltage；The ferroelectricity of board under test stores
Device stores the coefficient of AD conversion, what the AD conversion coefficient and board under test that host computer reads ferroelectric memory storage in board under test acquired
Voltage removes design factor according to the voltage of normal voltage and board under test acquisition, and board under test ferroelectric memory is written in this coefficient
In.
After the completion of calibration, different resistance of the host computer according to investment, the guidance circuit connection of resistance and board under test, realization difference
Partial pressure combination, host computer combines according to different partial pressure, according to the error range under the different voltages of formulation, analyzes board under test
Within the acceptable range whether the voltage of acquisition.
9. a kind of embedded module test system as described in claim 1, it is characterized in that: the AC charging guidance circuit connects
Mouth is connected to host computer, and host computer issues the order of investment resistance according to timing to control panel, and control panel is thrown respectively according to timing
Enter the resistance of different resistance values, host computer, according to the state that board under test uploads, carries out analysis board under test when control panel puts into resistance
The steering voltage measured.
10. a kind of test method based on embedded module test system as claimed in any one of claims 1-9 wherein, feature
Be: control panel provides normal voltage；The coefficient of ferroelectric memory storage AD conversion in board under test, host computer are read in board under test
The AD conversion coefficient of ferroelectric memory storage and the voltage of board under test acquisition, go according to the voltage that normal voltage is acquired with board under test
Design factor, and this coefficient is written in board under test ferroelectric memory；
After the completion of calibration, different resistance of the host computer according to investment, the guidance circuit connection of resistance and board under test, realization difference
Partial pressure combination, host computer combines according to different partial pressure, according to the error range under the different voltages of formulation, analyzes board under test
Within the acceptable range whether the voltage of acquisition.
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| CN108445317A (en) * | 2018-03-12 | 2018-08-24 | 南瑞集团有限公司 | A kind of electric vehicle electrically-charging equipment testing inspection system and test method |
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