CN112946536B - Crimping detection device and detection method - Google Patents
Crimping detection device and detection method Download PDFInfo
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- CN112946536B CN112946536B CN202110126888.3A CN202110126888A CN112946536B CN 112946536 B CN112946536 B CN 112946536B CN 202110126888 A CN202110126888 A CN 202110126888A CN 112946536 B CN112946536 B CN 112946536B
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/50—Testing of electric apparatus, lines, cables or components for short-circuits, continuity, leakage current or incorrect line connections
- G01R31/66—Testing of connections, e.g. of plugs or non-disconnectable joints
- G01R31/68—Testing of releasable connections, e.g. of terminals mounted on a printed circuit board
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2801—Testing of printed circuits, backplanes, motherboards, hybrid circuits or carriers for multichip packages [MCP]
- G01R31/2806—Apparatus therefor, e.g. test stations, drivers, analysers, conveyors
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2801—Testing of printed circuits, backplanes, motherboards, hybrid circuits or carriers for multichip packages [MCP]
- G01R31/2806—Apparatus therefor, e.g. test stations, drivers, analysers, conveyors
- G01R31/2808—Holding, conveying or contacting devices, e.g. test adapters, edge connectors, extender boards
Abstract
The crimping detection device comprises a crimping head and at least one crimping detection unit, wherein the crimping head is used for crimping an element to be detected, the crimping head comprises a crimping head interface and a crimping head body, the crimping head interface is arranged on the crimping head body and is used for connecting the interface to be detected of the element to be detected, and the crimping head interface comprises a plurality of pins which are respectively connected with all the pins in the interface to be detected during crimping; the at least one crimping detection unit is connected with at least one preset pin in the crimping head interface so as to detect the crimping state of the crimping head and the element to be detected. The crimping detection device of the embodiment of the application can accurately detect and judge the crimping condition of the crimping head and the element to be detected, is accurate in detection and judgment, reduces misjudgment, and can avoid damage to the display panel caused by testing due to the fact that the display panel is not well crimped.
Description
Technical Field
The present disclosure relates to the field of semiconductor device detection technologies, and in particular, to a crimping detection apparatus and a crimping detection method.
Background
With the increasingly higher automation degree of the display panel process, the display panel is generally subjected to an automatic crimping lighting test after being bound. The current test mode has the condition of misjudgment or no judgment, and if the direct lighting test is not well performed by pressure welding, irreversible damage such as display panel line burn can be caused, and the display panel is damaged.
Disclosure of Invention
In view of this, embodiments of the present disclosure mainly provide a crimping detection apparatus and a detection method, so as to improve accuracy of crimping test determination.
In order to solve the technical problem, the application adopts a technical scheme that: a crimping detection device comprises a crimping head and at least one crimping detection unit, wherein the crimping head is used for crimping an element to be detected, the crimping head comprises a crimping head interface and a crimping head body, the crimping head interface is arranged on the crimping head body and used for connecting the interface to be detected of the element to be detected, and the crimping head interface comprises a plurality of pins so as to be connected with the pins in the interface to be detected respectively during crimping; the at least one crimping detection unit is connected with at least one preset pin in the crimping head interface so as to detect the crimping state of the crimping head and the element to be detected.
The crimping detection device comprises two crimping detection units which are respectively connected with two preset pins in a crimping head interface so as to detect the crimping state of the crimping head and the element to be detected.
The pins of the crimping connector interface are distributed in at least one row, and the two preset pins are respectively positioned in two end regions of the same row of crimping connector interface or two diagonal regions where diagonals of the plurality of rows of crimping connector interfaces are positioned.
The pins of the crimping connector interface are distributed in two rows, and the two preset pins are respectively positioned in two diagonal areas where diagonals of the two rows of crimping connector interfaces are positioned.
Wherein, crimping detection element includes: the voltage input end is used for receiving an input voltage signal; one end of the impedance element is connected with the voltage input end, and the other end of the impedance element is connected with a preset pin; the detection end is connected to a node between the connection impedance element and the preset pin, so that the detection end obtains a corresponding detection voltage signal when the compression joint and the element to be detected are in a compression joint state.
The preset pins are grounding pins so as to be connected with corresponding grounding pins in the interface to be tested during crimping.
When the detection voltage signal obtained by the detection end is the ground level, the crimping detection device detects that the crimping head and the element to be detected are correctly crimped; when the detection voltage signal obtained by the detection terminal is not at ground level, the crimping detection device detects that the crimping head and the element to be detected are in error crimping.
When the detection voltage signal is equal to the input voltage signal, the crimping detection device detects that a preset pin in the crimping connector interface is not connected to a corresponding grounding pin in the interface to be detected; when the detection voltage signal is larger than the ground level and smaller than the input voltage signal, the crimping detection device detects that the preset pin in the crimping connector interface is connected to the non-grounding pin in the interface to be detected.
The crimping detection device further comprises a testing device, and the testing device is connected with the crimping head interface so as to test the element to be tested through the crimping head interface when the crimping head is detected to be correctly crimped on the element to be tested.
The element to be tested is a connector connected with the display panel.
The connector is located on the flexible circuit board and connected with the display panel through the flexible circuit board.
The application also includes a second technical scheme, and a crimping detection method includes: the method comprises the steps that a component to be detected is crimped by using a crimping head in the crimping detection device, wherein the crimping head comprises a crimping head interface and a crimping head body, the crimping head interface is arranged on the crimping head body and is used for connecting the interface to be detected of the component to be detected, and the crimping head interface comprises a plurality of pins which are respectively connected with all the pins in the interface to be detected during crimping; and detecting the crimping state of the crimping head and the element to be detected by using a crimping detection unit in the crimping detection device, wherein the crimping detection unit is connected with a preset pin in a crimping head interface.
When the detection voltage signal obtained by the crimping detection unit is the ground level, the crimping connector and the component to be tested are determined to be correctly crimped; when the detected voltage signal obtained by the pressing detection unit is not the ground level, the pressing head and the element to be pressed are determined to be in error pressing connection.
The beneficial effect of this application is: different from the prior art, the crimping detection device provided by the embodiment of the application can be connected with the to-be-detected interface of the to-be-detected element by arranging the crimping detection unit, and the crimping detection unit is connected with the preset pins of the crimping head interface, so that the crimping state of the pins of the crimping head interface can be detected, whether the pins of the crimping head interface are warped or not and staggered when the pins of the crimping head interface are crimped to the to-be-detected interface of the to-be-detected element can be judged, the detection judgment is accurate, the misjudgment is reduced, and the damage to the display panel can be avoided.
Drawings
Fig. 1 is a schematic structural diagram of a crimping detection device and an element to be tested in a non-crimped state according to an embodiment of the present application;
FIG. 2 is a schematic structural diagram of a crimping detection device according to an embodiment of the present application;
FIG. 3 is a schematic circuit diagram of a crimping detection device according to an embodiment of the present application;
FIG. 4 is a schematic view of a crimp head interface according to another embodiment of the present application;
FIG. 5 is a schematic diagram of an equivalent circuit of a crimping detection apparatus according to an embodiment of the present application;
FIG. 6 is a schematic diagram of an equivalent circuit of a crimp detection apparatus according to another embodiment of the present application;
FIG. 7 is a schematic diagram of an equivalent circuit of a crimp detection apparatus according to still another embodiment of the present application;
FIG. 8 is a schematic structural diagram of a crimping inspection apparatus and a device under test according to an embodiment of the present application;
fig. 9 is a schematic flowchart of a crimping detection method according to an embodiment of the present application.
Detailed Description
The technical solutions in the embodiments of the present application will be clearly and completely described below with reference to the drawings in the embodiments of the present application.
The embodiment of the present application provides a crimping detection apparatus, as shown in fig. 1 and fig. 2, including a crimping head 10 and at least one crimping detection unit 20, where the crimping head 10 is used to crimp an element 30 to be detected, where the crimping head 10 includes a crimping head interface 11 and a crimping head body 12, the crimping head interface 11 is disposed on the crimping head body 12 and is used to connect an interface 31 to be detected of the element 30 to be detected, where the crimping head interface 11 includes a plurality of pins 111 to connect with the pins 111 in the interface 31 to be detected respectively when in crimping; at least one crimping detection unit 20 is connected with at least one predetermined pin in the crimping head interface 11 to detect the crimping state of the crimping head 10 and the component 30 to be tested.
The crimping detection device in the embodiment of the present application can connect the interface 31 to be tested of the component 30 to be tested by setting the crimping connector interface 11, and can detect the crimping state of the pin 111 of the crimping connector interface 11 by setting the crimping detection unit 20 and connecting the crimping detection unit 20 to the predetermined pin of the crimping connector interface 11, for example, it can be determined whether the pin 111 of the crimping connector interface 11 is crimped to the interface 31 to be tested of the component 30 to be tested, and whether the pin 111 of the crimping connector interface 11 is crimped and dislocated, so as to determine whether the crimping connector 10 is well crimped with the component 30 to be tested.
In the present example, as shown in fig. 3, the crimping detection apparatus includes two crimping detection units 20, which are respectively connected to two predetermined pins in the crimping head interface 11 to detect the crimping state of the crimping head 10 and the device under test 30. By providing two crimping detection units 20, the accuracy of determining whether the crimping head 10 and the device under test 30 are crimped can be improved. In other embodiments, the crimping detection unit 20 may also be one, and is connected to a predetermined pin in the crimping head interface 11 to detect the crimping state of the crimping head 10 and the component 30 to be tested; among them, a predetermined pin is preferably provided to the pin at the end edge of the crimp head interface 11, for example, pin a or pin F or pin D as shown in fig. 3; of course, the predetermined pin may be a pin disposed in the middle region of the crimp head interface 11, such as pin B, pin C, or pin E. In another embodiment, the number of the crimping detection units 20 may be more than three, for example, three, four, five, etc., and may be pins at any position in the crimping head interface 11, or may be pins including an end portion of the crimping head interface 11.
In an embodiment of the present application, the pins 111 of the crimp connector interface 11 are distributed in at least one row, and two predetermined pins are respectively located in two end regions of the same row of crimp connector interfaces 11 or two diagonal regions where diagonals of the rows of crimp connector interfaces 11 are located. Specifically, in one embodiment, the pins 111 of the crimp interface 11 are distributed in a row, and two predetermined pins are respectively located at two end regions of the row of crimp interfaces 11. In another embodiment, the pins 111 of the crimp head interface 11 may also be in two rows, and two predetermined pins are located at two end regions of the same row of crimp head interface 11, for example, as shown in fig. 2, the two predetermined pins are pin D and pin F, respectively.
In another embodiment, the pins 111 of the crimp head interface 11 are in two rows, and the two predetermined pins are located in two diagonal regions of the crimp head interface 11. Generally, the crimp head interface 11 has a rectangular, square, or other structural configuration, and by connecting two predetermined pins in the crimp head interface 11 with the two crimp detection units 20, the accuracy of determining whether the crimp head 10 and the component 30 to be crimped are crimped well can be improved. In the embodiment of the present application, the two predetermined pins are located in two diagonal regions where a diagonal of the crimp connector interface 11 is located, the two predetermined pins are not limited to the diagonal of the crimp connector interface 11, but are located in the diagonal regions where the diagonal is located, and the size of the diagonal regions is not limited, as shown in fig. 3, the two predetermined pins are pin a and pin F, respectively. By positioning two predetermined pins in two diagonal regions where a diagonal of the crimping head interface 11 is located, for example, as shown in fig. 3, the pin a is located in an upper left corner region, and the pin F is located in a lower right corner region, detection of the crimping head interface 11 from four directions, i.e., up, down, left, and right, can be achieved, so that accuracy of judging whether the crimping head 10 and the component 30 to be tested are well crimped is improved, and misjudgment is reduced.
The crimping head 10 is not well crimped, and two conditions generally exist, in the first condition, the pin 111 of the crimping head 10 tilts, so that the pin 111 of the crimping head 10 is not crimped to the interface 31 to be tested of the element 30 to be tested, and the conventional method is adopted to judge that misjudgment with a high probability occurs according to the cylinder stroke in the mechanical alignment crimping process; in the second case, the pin 111 of the crimping head 10 is misaligned with the interface 31 to be tested of the device 30 to be tested, and at this time, the cylinder stroke in the conventional mechanical alignment crimping process cannot be tested, and at this time, if the performance test is directly performed on the display panel 33 under the misaligned condition, the test failure or inaccurate test is easily caused, and even the display panel is damaged.
When two preset pins are adopted in the embodiment of the application, the test accuracy can be improved, and particularly, under the condition that one preset pin is not detected, the crimping condition can be determined in an auxiliary manner through the detection of the other preset pin.
In the first case, by setting two predetermined pins, for example, when the two predetermined pins are respectively located in the two end regions of the row of the crimp head interfaces 11, the crimping condition of the crimp head interfaces 11 can be detected from the two ends; or the two predetermined pins are located in two diagonal regions of the diagonal of the crimping connector interface 11, the crimping condition of the crimping connector interface 11 and the element to be tested 30 can be detected from four directions, namely, up, down, left and right. Specifically, when one predetermined pin is correctly pressed against the device 30 to be tested and the other predetermined pin is suspended, the pressing detection unit 30 detects that the predetermined pin is in a suspended state, and the pressing head is determined to be in a suspended state in pressing against the device 30 to be tested, which is an erroneous pressing. The two preset pins are arranged in this way, so that the misjudgment that the crimping head and the element to be tested 30 are correctly crimped due to the fact that only one preset pin is used for good crimping can be avoided, and the possibility of misjudgment can be reduced by setting the two preset pins and accurately judging whether the crimping head interface 11 and the element to be tested 30 are correctly crimped.
In the second case, when the crimping dislocation occurs to one predetermined pin, the dislocation also occurs to other pins 111 in sequence, another predetermined pin in the embodiment of the present application is selected from the region where the diagonal of the crimping head interface 11 is located, and at this time, another predetermined pin is suspended due to the dislocation of the first pin, so that the crimping dislocation condition of the crimping head interface can be determined in an auxiliary manner, and the accuracy of monitoring the crimping condition of the crimping head detection device is improved.
In the embodiment of the present application, as shown in fig. 3, the crimping detection unit 20 includes: a voltage input terminal 21, an impedance element 22 and a detection terminal 23, wherein the voltage input terminal 21 is used for receiving an input voltage signal; one end of the impedance element 22 is connected with the voltage input end 21, and the other end is connected with a preset pin; the detecting terminal 23 is connected to a node between the impedance device 22 and a predetermined pin, so that the detecting terminal 23 obtains a corresponding detecting voltage signal when the press-connecting head 10 and the device 30 to be tested are in a press-connecting state. The crimping detection unit 20 of the embodiment of the application is provided with the voltage input end 21, so that the crimping detection unit 20 obtains a voltage signal, and the impedance element 22 is provided to obtain different detection voltage signals under different conditions through the detection end 23, so that the crimping condition is determined through the detected different detection voltage signals.
In the embodiment of the present application, the predetermined pin is a ground pin to connect a corresponding ground pin in the interface 31 to be tested during the crimping. By setting the predetermined pin as the grounding pin, the detection of the crimping detection unit 20 can be facilitated, and meanwhile, when the crimping detection unit 20 is connected with the grounding pin, the crimping detection unit 20 does not affect the connection between other non-grounding pins and the non-grounding pin of the interface to be tested 31 of the component to be tested 30 and the transmission of signals.
In the embodiment of the present application, as shown in fig. 2 and fig. 3, the crimp connector interface 11 includes six ground pins a, B, C, D, E, and F, in the embodiment of the present application, the ground pins a, B, and C are disposed at intervals, the ground pins D, E, and F are disposed at intervals, and the ground pins a, B, and C and the ground pins D, E, and F are respectively disposed on two sides of the crimp connector interface 11. In the embodiment of the present application, the ground pin a and the ground pin F are located in two diagonal regions where diagonals of the crimp head interface 11 are located. The above is merely an example, and in other embodiments, the number of the ground pins may be other. In the embodiment of the present application, the ground pins located at two ends of the diagonal line and located at two side edges are preferred, in other embodiments, two ground pins in two diagonal regions where the diagonal line of the crimp connector interface 11 is located may also be located at the ground pins M and N as shown in fig. 4, where other non-ground pins are further located between the ground pin M and the side edge, in other embodiments, other non-ground pins are further located between the ground pin N and the side edge, or other non-ground pins are simultaneously located between the ground pins M and N and the side edge, and these embodiments may also achieve the purpose of detecting and determining whether the crimp is good to the greatest extent.
In the embodiment of the present application, when the detection voltage signal obtained by the detection terminal 23 is ground, the crimping detection device detects that the crimping head 10 is correctly crimped with the device under test 30; when the detection voltage signal obtained by the detection terminal 23 is not at ground level, the press-connection detection device detects that the press-connection head 10 and the device 30 to be tested are in error press-connection. In the embodiment of the present application, whether the crimping head 10 is crimped on the device to be tested is correct or not is fed back by detecting the voltage signal, so that the crimping state can be fed back intelligently, and whether the lighting test of the display panel 33 is performed or not is determined.
As shown in fig. 3, the embodiment of the present application takes the detected voltage signal at the ground pin a as an example for explanation. In the embodiment of the present application, if the ground pin a of the crimp head 10 is correctly crimped with the component to be tested 30, the equivalent circuit at the point a is a circuit as shown in fig. 5, where a, B, C, D, and E represent ground pins of the crimp head interface 11, a ', B ', C ', D ', and E ' represent ground pins of the interface to be tested 31 of the component to be tested 30, and the ground pins of the interface to be tested 31 of the component to be tested 30 correspond to the ground pins of the crimp head interface 11 one to one.
In the embodiment of the present application, as shown in fig. 5, the input voltage signal received by the voltage input terminal 21 is U =3.3V, and if the compression joint 10 correctly compresses the device to be detected 30, the detection voltage signal obtained by the detection terminal 23 (at the position corresponding to the point a) is at the ground level and the voltage is at 0V. Similarly, as shown in fig. 1 and 4, if the grounding pin F of the press head 10 is correctly pressed to the device 30 to be detected, the detection voltage signal obtained by the detection terminal 23 (corresponding to the F point) is at the ground level, and the voltage is 0V.
When the predetermined number of pins is two, and the predetermined number of pins is the grounding pin a and the grounding pin F as shown in fig. 3 and fig. 5, respectively, and the detection voltage signals obtained by the detection terminal 23 (corresponding to the points a and F) are all 0V, it can be detected that the crimping head 10 is correctly crimped to the device 30 to be tested.
In another embodiment, if the predetermined pin is one, for example, the grounding pin a, when the detection voltage signal obtained by the detection terminal 23 (at the corresponding position of the point a) is 0V, it can be detected that the pressing head 10 is correctly pressed against the device under test 30. In other embodiments, if the number of the predetermined pins is more than three, and the detection voltage signals obtained by all the detection terminals 23 are 0V, it can be detected that the pressing head 10 is correctly pressed against the device 30.
When the crimping shape is not good, that is, the crimping head 10 and the device under test 30 are erroneously crimped, there are two cases:
(1) suspending a preset pin in the crimping connector interface 11; taking a predetermined pin as a ground pin A as an example for explanation, an equivalent link circuit at the point A is shown in FIG. 6, and a voltage input terminal 21When the received input voltage signal is U =3.3V, the detection terminal 23 (at the position corresponding to point a) obtains a detection voltage signal U 1 =3.3V, then U 1 > 0V. That is, when the detected voltage signal is equal to the input voltage signal of the voltage input terminal 21, it indicates that the predetermined pin in the crimp connector interface 11 is floating.
(2) A preset pin in the pressure joint interface 11 is connected with a non-grounding pin in the interface 31 to be tested; taking the predetermined pin as the ground pin a for illustration, the equivalent link circuit at point a is shown in fig. 7, where R is the resistance of the impedance element 22, and R' is the in-plane load of the product. When the input voltage signal received by the voltage input terminal 21 is U =3.3V, the detection terminal 23 (corresponding to the a point) obtains the detection voltage signal U 2 = R '/(R + R'). Times.3.3V, in which case U is added 2 > 0V. That is, when the detected voltage signal is smaller than the input voltage signal and greater than zero, it indicates that the predetermined pin in the crimp connector interface 11 is connected to the non-grounded pin in the interface to be tested 31, and the pin 111 in the crimp connector interface 11 is misaligned when connected to the pin 111 in the interface to be tested 31.
In the above two cases, when the detection voltage signal obtained by the detection terminal 23 is greater than 0V and is not at ground level, the press-connection detection device detects that the press-connection head 10 and the device to be tested 30 are in error press-connection. And the reason of poor pressure connection can be judged according to the value range of the detection voltage signal obtained by the detection terminal 23.
Specifically, in the embodiment of the present application, when the detected voltage signal is equal to the input voltage signal, the crimping detection device detects that the predetermined pin in the crimping head interface 11 is not connected to the corresponding ground pin in the interface to be detected 31, and at this time, the crimping detection device detects that the predetermined pin in the crimping head interface 11 is suspended; when the detection voltage signal is greater than the ground level and less than the input voltage signal, the crimping detection device detects that the predetermined pin in the crimping connector interface 11 is connected to the non-grounded pin in the interface to be tested 31. When the detection voltage signal is approximately equal to the input voltage signal, the crimping detection device detects that the predetermined pin in the crimping connector interface 11 is suspended and is not connected with the corresponding grounding pin in the interface 31 to be detected. The embodiment of the application can also estimate the position of poor crimping, when the detection voltage signal is greater than the ground level and less than the input voltage signal, the crimping detection device detects that the preset pin in the crimping connector interface 11 is connected with the non-grounded pin in the interface 31 to be detected, and can estimate the overall dislocation condition of the crimping connector interface 11 according to the dislocation condition of the preset pin for crimping to assist in determining the position of poor crimping. For example, when the pin 111 is suspended at the point a detecting terminal 23 and the point F detecting terminal 23 detects that the pin 111 is normally crimped, it can be determined that the position with poor crimping is at the grounding pin a; when the grounding pin a of the point a detecting terminal 23 is connected to the non-grounding pin of the interface 31 to be detected, and the grounding pin F of the point F detecting terminal 23 is floating, the whole is dislocated when the pressure welding head interface 11 is in pressure welding.
In the embodiment of the present application, as shown in fig. 8, the crimping detection apparatus further includes a testing apparatus 40, and the testing apparatus 40 is connected to the crimping head interface 11, so as to perform a performance test on the component 30 to be tested through the crimping head interface 11 when detecting that the crimping head 10 is correctly crimped on the component 30 to be tested. The testing device 40 in the embodiment of the present application is the lighting testing device 40, and when the pressure welding head 10 is detected to be correctly pressed against the device to be tested 30, the lighting testing device 40 automatically or manually tests a product, for example, a mura (uneven display) condition of the display panel 33. The irreversible damage to the display panel 33, such as the circuit burn of the display panel 33, caused by the lighting test when the crimping head 10 is actually not crimped to the device 30 under test correctly, is avoided.
In the embodiment of the present application, as shown in fig. 1 and 8, the device under test 30 is a connector connected to the display panel 33. Preferably, the connector is located on a flexible circuit board, and the display panel 33 is connected through the flexible circuit board. In other embodiments, the connector may be located on a rigid circuit board, and the display panel 33 may be connected through the rigid circuit board. In the embodiment of the present application, the pins 111 of the connector correspond to the pins 111 of the crimp head interface 11 one to one, for example, the pins 111 in the crimp head interface 11 and the pins 111 in the interface 31 to be tested are completely consistent, that is, the types and the positions of the pins 111 in the crimp head interface 11 and the pins 111 in the interface 31 to be tested are the same.
The present application further includes a second technical solution, where a crimping detection method adopts the crimping detection apparatus of the foregoing embodiment to perform detection, specifically as follows, as shown in fig. 9, the method includes:
s100: the component 30 to be tested is crimped by using a crimp head 10 in a crimp detection device, wherein the crimp head 10 comprises a crimp head interface 11 and a crimp head body 12, the crimp head interface 11 is arranged on the crimp head body 12 to connect an interface 31 to be tested of the component 30 to be tested, and the crimp head interface 11 comprises a plurality of pins 111 to be respectively connected with the pins 111 in the interface 31 to be tested when being crimped.
S200: the crimping state of the crimping head 10 and the component 30 to be tested is detected by a crimping detection unit 20 in the crimping detection device, wherein the crimping detection unit 20 is connected with a predetermined pin in the crimping head interface 11.
In the embodiment of the present application, the crimping detection method detects the crimping state of the pin 111 of the crimping head interface 11 through the crimping detection unit 20, so as to determine whether the crimping head interface 11 is well crimped with the interface of the to-be-tested component 30, in the embodiment of the present application, the tilting condition of the crimping head interface 11 and the dislocation condition of the crimping head interface 11 and the interface of the to-be-tested component 30 can be detected, the crimping detection method is simple and has high accuracy, and the damage of the display panel 33 caused by the fact that the display panel 33 is not well crimped for testing can be avoided.
In the embodiment of the present application, the predetermined pin is a ground pin, and when the detection voltage signal obtained by the crimping detection unit 20 is a ground level, it is determined that the crimping head 10 and the device under test 30 are correctly crimped; when the detection voltage signal obtained by the press detection unit 20 is not ground, it is determined that the press head 10 and the dut 30 are erroneously pressed. By judging the level of the detected voltage signal, it can be judged whether the crimping head 10 is correctly crimped on the device 30 to be tested, and the judgment method is simple and accurate.
The above embodiments are merely examples and are not intended to limit the scope of the present disclosure, and all modifications, equivalents, and flow charts using the contents of the specification and drawings of the present disclosure or those directly or indirectly applied to other related technical fields are intended to be included in the scope of the present disclosure.
Claims (11)
1. A crimp detection device, comprising:
a crimp head for crimping an element to be tested, wherein the crimp head comprises: the connector comprises a crimping connector interface and a crimping connector body, wherein the crimping connector interface is arranged on the crimping connector body and is used for connecting an interface to be tested of the element to be tested, and the crimping connector interface comprises a plurality of pins so as to be respectively connected with each pin in the interface to be tested during crimping;
at least one crimping detection unit connected with at least one preset pin in the crimping connector interface so as to detect the crimping state of the crimping connector and the element to be detected;
the crimping detection unit includes:
a voltage input for receiving an input voltage signal;
one end of the impedance element is connected with the voltage input end, and the other end of the impedance element is connected with the preset pin;
the detection end is connected to a node between the impedance element and the preset pin, so that when the crimping head and the element to be detected are in a crimping state, the detection end obtains a corresponding detection voltage signal.
2. The crimp detection device according to claim 1, wherein the crimp detection device comprises two crimp detection units respectively connected to two predetermined pins in the crimp head interface to detect a crimping state of the crimp head and the component to be tested;
the pins of the crimping connector interface are distributed in at least one row, and the two preset pins are respectively positioned in two end regions of the same row of crimping connector interface or two diagonal regions where diagonals of the plurality of rows of crimping connector interfaces are positioned.
3. The crimp detection device according to claim 2,
the pins of the crimping connector interface are distributed in two rows, and the two preset pins are respectively positioned in two diagonal areas where diagonals of the two rows of crimping connector interfaces are positioned.
4. The crimp detection device of claim 2, wherein the predetermined pin is a ground pin to connect a corresponding ground pin in the interface under test when crimped.
5. The crimping detection device of claim 4, wherein when the detection voltage signal obtained by the detection terminal is ground, the crimping detection device detects that the crimping head is correctly crimped with the device under test;
when the detection voltage signal obtained by the detection end is not the ground level, the crimping detection device detects that the crimping head and the element to be detected are in error crimping.
6. The apparatus of claim 5, wherein when the detected voltage signal is equal to the input voltage signal, the apparatus detects the predetermined pin in the crimp head interface as not being connected to a corresponding ground pin in the interface under test;
when the detected voltage signal is larger than the ground level and smaller than the input voltage signal, the crimping detection device detects that the preset pin in the crimping connector interface is connected to a non-grounding pin in the interface to be detected.
7. The crimp detection device according to claim 1, further comprising:
and the testing device is connected with the crimping connector interface so as to carry out performance testing on the element to be tested through the crimping connector interface when detecting that the crimping connector is correctly crimped with the element to be tested.
8. The crimp detection device according to claim 1, wherein the element to be tested is a connector connected to a display panel.
9. The crimp detection device of claim 8, wherein the connector is located on a flexible circuit board and connects the display panel through the flexible circuit board.
10. A crimp detection method, comprising:
the method for detecting the crimping of the component to be tested by using the crimping head in the crimping detection device according to any one of claims 1 to 9, wherein the crimping head comprises a crimping head interface and a crimping head body, the crimping head interface is arranged on the crimping head body to connect the interface to be tested of the component to be tested, the crimping head interface comprises a plurality of pins to be respectively connected with the pins in the interface to be tested when in crimping;
detecting the crimping state of the crimping head and the element to be detected by using a crimping detection unit in the crimping detection device, wherein the crimping detection unit is connected with a preset pin in the crimping head interface.
11. The method according to claim 10, wherein the predetermined pin is a ground pin, and when the detection voltage signal obtained by the press detection unit is ground, it is determined that the press head is correctly pressed against the device under test;
when the detection voltage signal obtained by the crimping detection unit is not the ground level, determining that the crimping head and the element to be tested are in error crimping.
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| CN202110126888.3A CN112946536B (en) | 2021-01-29 | 2021-01-29 | Crimping detection device and detection method |
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| Publication number | Priority date | Publication date | Assignee | Title |
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| US5197186A (en) * | 1990-05-29 | 1993-03-30 | Amp Incorporated | Method of determining the quality of a crimped electrical connection |
| JP2000284312A (en) * | 1999-03-31 | 2000-10-13 | Optrex Corp | Terminal connection device of liquid crystal display panel |
| JP3669348B2 (en) * | 2002-07-18 | 2005-07-06 | 松下電器産業株式会社 | Electronic component crimping apparatus and electronic component crimping method |
| JP2004340800A (en) * | 2003-05-16 | 2004-12-02 | Advanced Display Inc | Inspection method, manufacturing method and inspection device of liquid crystal display device |
| CN103200788B (en) * | 2013-04-10 | 2016-08-03 | 合肥京东方光电科技有限公司 | A kind of crimp head and compression bonding apparatus |
| CN204008941U (en) * | 2014-06-24 | 2014-12-10 | 威海职业学院 | Multicore cable terminal compression joint quality precise detection device |
| CN104035000B (en) * | 2014-06-24 | 2017-06-27 | 威海职业学院 | Multicore cable terminal compression joint quality precise detection device and detection method |
| CN106596719A (en) * | 2016-12-02 | 2017-04-26 | 国网北京市电力公司 | Method, device and system for detecting pressure welding quality |
| CN107966271A (en) * | 2017-12-08 | 2018-04-27 | 昆山精讯电子技术有限公司 | A kind of display panel measurement jig |
| CN109061915B (en) * | 2018-08-08 | 2024-01-26 | 苏州凌云光工业智能技术有限公司 | Automatic crimping mechanism of general LCD module lamp |
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