TWI773402B - Improving pin test coverage rate system for boundary scan test and method thereof - Google Patents
Improving pin test coverage rate system for boundary scan test and method thereof Download PDFInfo
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一種測試系統及其方法,尤其是指一種透過不同的測試針板分別對可進行邊界掃描測試且具備電源供應的腳位與不能進行邊界掃描測試且不具備電源供應的腳位進行測試的提高邊界掃描測試的腳位測試涵蓋率系統及其方法。 A test system and method thereof, in particular to an improved boundary for testing the pins that can perform boundary scan testing and have power supply and the pins that cannot perform boundary scan testing and do not have power supply through different test pin boards. Foot test coverage system and method for scan test.
現有的邊界掃描互連測試工作站是提供對待測試電路板上的邊界掃描元件進行測試,通過邊界掃描檢測程式所建立的邊界掃描鏈,以實現在邊界掃描檢測程式進行資料分析與處理,最終形成腳位互連狀態的故障判據。 The existing boundary scan interconnection test workstation is to test the boundary scan components on the circuit board to be tested, and the boundary scan chain established by the boundary scan detection program is used to realize the data analysis and processing in the boundary scan detection program, and finally form the pin Failure criteria for bit interconnect status.
現有的邊界掃描互連測試工作站可以對於待測試電路板上的各個連接器與邊界掃描晶片互聯測試,可以檢測結構性的故障,例如:故障、短路、開路…等。 The existing boundary scan interconnection testing workstation can test the interconnection between each connector on the circuit board to be tested and the boundary scan wafer, and can detect structural faults, such as: fault, short circuit, open circuit, etc.
現有的邊界掃描互連測試工作站的核心技術即是利用邊界掃描測試技術,然而邊界掃描測試技術是需要在待測線路的兩端皆具備邊界掃描晶片且邊界掃描晶片具備可以控制的移位暫存器(cell),然而對於待測線路的 一端無邊界掃描晶片或是邊界掃描晶片沒有可以控制的移位暫存器將無法依據現有邊界掃描測試技術進行測試。 The core technology of the existing boundary scan interconnect test station is to use the boundary scan test technology. However, the boundary scan test technology requires boundary scan wafers at both ends of the line to be tested and the boundary scan wafers have a controllable shift temporary storage. cell, but for the line under test A boundary scan wafer at one end or a boundary scan wafer without a controllable shift register cannot be tested according to the existing boundary scan test technology.
除此之外,在邊界掃描互連測試工作站對待測試電路板進行測試時,待測試電路板是需要有電源供應時進行測試,邊界掃描互連測試工作站仍存在有無法進行待測試電路板不具電源供應時測試的問題。 In addition, when testing the circuit board to be tested at the boundary scan interconnection test station, the circuit board to be tested needs to be tested when there is a power supply. Issues with provisioning tests.
綜上所述,可知先前技術中長期以來一直存在現有待測試電路板採用邊界掃描測試僅能測得具備電源供應且可控移位暫存器的邊界掃描晶片各腳位檢測的問題,因此有必要提出改進的技術手段,來解決此一問題。 To sum up, it can be seen that there has been a problem in the prior art that the boundary scan test of the existing circuit board under test can only measure the detection of each pin of a boundary scan chip with a power supply and a controllable shift register. It is necessary to propose improved technical means to solve this problem.
有鑒於先前技術存在現有待測試電路板採用邊界掃描測試僅能測得具備電源供應且可控移位暫存器的邊界掃描晶片各腳位檢測的問題,本發明遂揭露一種提高邊界掃描測試的腳位測試涵蓋率系統及其方法,其中: 本發明所揭露的提高邊界掃描測試的腳位測試涵蓋率系統,適用於邊界掃描互連測試工作站的檢測,其包含:待檢測電路板、第一測試針板以及第二測試針板。 In view of the problem in the prior art that the boundary scan test of the existing circuit board under test can only measure the detection of each pin of a boundary scan chip with a power supply and a controllable shift register, the present invention discloses a method to improve the boundary scan test. Foot test coverage system and method thereof, wherein: The system for improving the footprint test coverage of the boundary scan test disclosed in the present invention is suitable for the detection of the boundary scan interconnection test station, and includes: a circuit board to be tested, a first test pin board and a second test pin board.
待檢測電路板由邊界掃描互連測試工作站設定有多個待檢測測點,待檢測測點無法透過邊界掃描互連測試進行檢測;第一測試針板具有多個第一測試針腳,第一測試針腳分別與待檢測測點位置對應,透過邊界掃描互連測試工作站的夾具壓合使第一測試針腳分別與對應的待檢測測點形成電性連接;及第二測試針板提供邊界掃描互連測試工作站對待檢測電路板的邊界掃描元件進行邊界掃描互連測試。 The circuit board to be tested is set with a plurality of test points to be tested by the boundary scan interconnection test station, and the test points to be tested cannot be tested by the boundary scan interconnection test; the first test pin board has a plurality of first test pins, the first test point is The pins are respectively corresponding to the positions of the test points to be detected, and the first test pins are respectively electrically connected with the corresponding test points to be detected by pressing the clamps of the boundary scan interconnection test workstation; and the second test pin board provides the boundary scan interconnection The test station performs boundary scan interconnection tests on the boundary scan components of the circuit board to be tested.
其中,邊界掃描互連測試工作站分別與第一測試針板以及第二測試針板形成電性連接,邊界掃描互連測試工作站自第一測試針板得到待檢測測點對應的檢測訊號,並依據檢測訊號判定是否導通,邊界掃描互連測試工作站透過第二測試針板得到待檢測電路板的邊界掃描元件的邊界掃描互連測試結果,邊界掃描互連測試工作站將檢測訊號的導通判定結果與邊界掃描互連測試結果統整並生成檢測結果。 The boundary scan interconnection test station is electrically connected with the first test needle board and the second test needle board respectively, and the boundary scan interconnection test station obtains the detection signal corresponding to the test point to be detected from the first test needle board, and according to The detection signal determines whether it is connected, and the boundary scan interconnection test station obtains the boundary scan interconnection test result of the boundary scan element of the circuit board to be tested through the second test pin board. Scan interconnect test results are consolidated and inspection results are generated.
本發明所揭露的提高邊界掃描測試的腳位測試涵蓋率方法,其包含下列步驟: 首先,邊界掃描互連測試工作站設定待檢測電路板上的多個待檢測測點,待檢測測點無法透過邊界掃描互連測試進行檢測;接著,提供具有多個第一測試針腳的第一測試針板,第一測試針板具有多個第一測試針腳,第一測試針腳分別與待檢測測點位置對應;接著,測試針板透過邊界掃描互連測試工作站的夾具壓合使第一測試針腳分別與對應的待檢測測點形成電性連接;接著,第二測試針板提供邊界掃描互連測試工作站對待檢測電路板的邊界掃描元件進行邊界掃描互連測試;接著,邊界掃描互連測試工作站分別與第一測試針板以及第二測試針板形成電性連接;接著,邊界掃描互連測試工作站自第一測試針板得到待檢測測點對應的檢測訊號,並依據檢測訊號判定是否導通;接著,邊界掃描互連測試工作站透過第二測試針板得到待檢測電路板的邊界掃描元件的邊界掃描互連測試結果;最後,邊界掃描互連測試工作站將檢測訊號的導通判定結果與邊界掃描互連測試結果統整並生成檢測結果。 The method disclosed by the present invention for improving the coverage ratio of a boundary scan test pin position comprises the following steps: First, the boundary scan interconnect test station sets a plurality of test points to be tested on the circuit board to be tested, and the test points to be tested cannot be tested through the boundary scan interconnect test; then, a first test with a plurality of first test pins is provided Needle board, the first test needle board has a plurality of first test pins, the first test pins are respectively corresponding to the positions of the test points to be detected; then, the test pin board is connected by the boundary scan to the clamp of the test station and presses together to make the first test pins respectively form an electrical connection with the corresponding test points to be detected; then, the second test pin board provides a boundary scan interconnection test station to perform boundary scan interconnection tests on the boundary scan elements of the circuit board to be detected; then, the boundary scan interconnection test station respectively form an electrical connection with the first test needle board and the second test needle board; then, the boundary scan interconnection test station obtains the detection signal corresponding to the test point to be detected from the first test needle board, and determines whether it is connected according to the detection signal; Next, the boundary scan interconnection test station obtains the boundary scan interconnection test result of the boundary scan element of the circuit board to be tested through the second test needle board; finally, the boundary scan interconnection test station compares the conduction determination result of the detection signal with the boundary scan interconnection test result. Integrate test results and generate test results.
本發明所揭露的系統及方法如上,與先前技術之間的差異在於邊界掃描互連測試工作站分別與第一測試針板以及第二測試針板形成電性連 接,邊界掃描互連測試工作站自第一測試針板得到待檢測測點對應的檢測訊號,並依據檢測訊號判定是否導通,邊界掃描互連測試工作站透過第二測試針板得到待檢測電路板的邊界掃描元件的邊界掃描互連測試結果,邊界掃描互連測試工作站將檢測訊號的導通判定結果與邊界掃描互連測試結果統整並生成檢測結果。 The system and method disclosed in the present invention are as described above. The difference between the system and the method disclosed in the present invention is that the boundary scan interconnection test station is electrically connected to the first test pin board and the second test pin board, respectively. Then, the boundary scan interconnection test station obtains the detection signal corresponding to the test point to be detected from the first test needle board, and determines whether it is connected according to the detection signal, and the boundary scan interconnection test station obtains the test signal of the circuit board to be detected through the second test needle board. The boundary scan interconnection test result of the boundary scan element, the boundary scan interconnection test station integrates the conduction determination result of the detection signal and the boundary scan interconnection test result and generates the detection result.
透過上述的技術手段,本發明可以達成提高邊界掃描測試的腳位測試涵蓋率的技術功效。 Through the above-mentioned technical means, the present invention can achieve the technical effect of improving the coverage rate of the pin position test of the boundary scan test.
100:邊界掃描互連測試工作站 100: Boundary Scan Interconnect Test Station
10:待檢測電路板 10: PCB to be tested
11:待檢測測點 11: Measuring point to be detected
12:邊界掃描元件 12: Boundary Scan Components
13:邊界掃描腳位 13: Boundary scan pin
20:第一測試針板 20: The first test pin board
21:第一測試針腳 21: First test pin
30:第二測試針板 30: Second test pin board
31:第二測試針腳 31: Second test pin
步驟101:邊界掃描互連測試工作站設定待檢測電路板上的多個待檢測測點,待檢測測點無法透過邊界掃描互連測試進行檢測 Step 101: The boundary scan interconnection test workstation sets a plurality of test points to be tested on the circuit board to be tested, and the test points to be tested cannot be detected through the boundary scan interconnection test
步驟102:提供具有多個第一測試針腳的第一測試針板,第一測試針板具有多個第一測試針腳,第一測試針腳分別與待檢測測點位置對應 Step 102: Provide a first test pin board with a plurality of first test pins, the first test pin board has a plurality of first test pins, and the first test pins correspond to the positions of the test points to be detected respectively
步驟103:測試針板透過邊界掃描互連測試工作站的夾具壓合使第一測試針腳分別與對應的待檢測測點形成電性連接 Step 103: The test pin board is pressed together by the clamps of the boundary scan interconnection test workstation so that the first test pins are respectively electrically connected with the corresponding test points to be tested
步驟104:第二測試針板提供邊界掃描互連測試工作站對待檢測電路板的邊界掃描元件進行邊界掃描互連測試 Step 104: The second test needle board provides a boundary scan interconnection test station to perform boundary scan interconnection test on the boundary scan elements of the circuit board to be tested
步驟105:邊界掃描互連測試工作站分別與第一測試針板以及第二測試針板形成電性連接 Step 105: The boundary scan interconnection test station forms electrical connections with the first test pin board and the second test pin board respectively
步驟106:邊界掃描互連測試工作站自第一測試針板得到待檢測測點對應的檢測訊號,並依據檢測訊號判定是否導通 Step 106: The boundary scan interconnection test station obtains the detection signal corresponding to the test point to be detected from the first test needle board, and determines whether it is connected according to the detection signal
步驟107:邊界掃描互連測試工作站透過第二測試針板得到待檢測電路板的邊界掃描元件的邊界掃描互連測試結果 Step 107: The boundary scan interconnection test workstation obtains the boundary scan interconnection test result of the boundary scan element of the circuit board to be tested through the second test needle board
步驟108:邊界掃描互連測試工作站將檢測訊號的導通判定結果與邊界掃描互連測試結果統整並生成檢測結果 Step 108: The boundary scan interconnection test workstation integrates the conduction determination result of the detection signal with the boundary scan interconnection test result and generates the detection result
第1圖繪示為本發明提高邊界掃描測試的腳位測試涵蓋率系統的系統方塊圖。 FIG. 1 is a system block diagram of the system for improving the coverage of the pin test for boundary scan test according to the present invention.
第2圖繪示為本發明提高邊界掃描測試的腳位測試涵蓋率的連接架構示意圖。 FIG. 2 is a schematic diagram of the connection structure of the present invention to improve the coverage of the pin test of the boundary scan test.
第3A圖以及第3B圖繪示為本發明提高邊界掃描測試的腳位測試涵蓋率方法的方法流程圖。 FIG. 3A and FIG. 3B are method flowcharts of the method for improving the coverage of the pin test of the boundary scan test according to the present invention.
以下將配合圖式及實施例來詳細說明本發明的實施方式,藉此對本發明如何應用技術手段來解決技術問題並達成技術功效的實現過程能充分理解並據以實施。 The embodiments of the present invention will be described in detail below with the drawings and examples, so as to fully understand and implement the implementation process of how the present invention applies technical means to solve technical problems and achieve technical effects.
以下首先要說明本發明所揭露的提高邊界掃描測試的腳位測試涵蓋率系統,並請參考「第1圖」所示,「第1圖」繪示為本發明提高邊界掃描測試的腳位測試涵蓋率系統的系統方塊圖。 In the following, firstly, the system for improving the coverage rate of the boundary scan test disclosed by the present invention will be explained, and please refer to the "Figure 1". System block diagram of the coverage system.
本發明所揭露的提高邊界掃描測試的腳位測試涵蓋率系統,其包含:適用於邊界掃描互連測試工作站100的檢測,其包含:待檢測電路板10、第一測試針板20以及第二測試針板30。
The system for improving the footprint test coverage of the boundary scan test disclosed in the present invention includes: suitable for the detection of the boundary scan
請參考「第2圖」所示,「第2圖」繪示為本發明提高邊界掃描測試的腳位測試涵蓋率的連接架構示意圖。 Please refer to "FIG. 2". "FIG. 2" is a schematic diagram of the connection structure of the present invention to improve the coverage of the pin test of the boundary scan test.
待檢測電路板10由邊界掃描互連測試工作站100設定有多個待檢測測點11,邊界掃描互連測試工作站100則是將無法透過邊界掃描互連測試進行檢測的電子線路中,進行待檢測測點11的設定,被設定的待檢測測點11即是提供對電子線路的導通進行檢測之用。
The
第一測試針板20具有多個第一測試針腳21,第一測試針腳21分別與待檢測測點11位置對應,亦即不同型號的待檢測電路板10對於第一測試針板20中多個第一測試針腳21的設置位置可以是不相同、可以是部分相同且部分不相同,也可以是完全相同。
The first
在邊界掃描互連測試工作站100依據待檢測電路板10選用對應的第一測試針板20後,邊界掃描互連測試工作站100藉由夾具的壓合使第一測試針板20的第一測試針腳21分別與待檢測電路板10中對應的待檢測測點11形成電性連接。
After the boundary scan
由於不同型號的待檢測電路板10因邊界掃描晶片、連接器…等的設置的位置不同,使得邊界掃描互連測試工作站100亦是需要選取與待檢測電
路板10相對應的第二測試針板30,藉以使得第二測試針板30提供邊界掃描互連測試工作站100對待檢測電路板10的邊界掃描元件進行邊界掃描互連測試,邊界掃描互連測試工作站100透過第二測試針板30對待檢測電路板10的邊界掃描元件進行邊界掃描互連測試的測試過程請參考現有技術的說明,本發明不再進行贅述。
Since the positions of the boundary scan wafers, connectors, etc. are different for different types of
邊界掃描互連測試工作站100分別與第一測試針板20以及第二測試針板30形成電性連接,邊界掃描互連測試工作站100可以透過由第一測試針板20的第一測試針腳21所延伸的線材形成電性連接,或是第一測試針板20的第一測試針腳21藉由第一測試針板20的線路設計連接到連接器,再透過連接線與連接器的連接使邊界掃描互連測試工作站100與第一測試針板20形成電性連接,第二測試針板30是透過連接器與連接線彼此相連使邊界掃描互連測試工作站100與第二測試針板30形成電性連接。
The boundary scan
在邊界掃描互連測試工作站100藉由夾具的壓合使第一測試針板20的第一測試針腳21分別與待檢測電路板10中對應的待檢測測點11形成電性連接時,邊界掃描互連測試工作站100即可自第一測試針板20接收待檢測測點11的電子訊號,將接收到的待檢測測點11的電子訊號轉換為待檢測測點11對應的檢測訊號,使邊界掃描互連測試工作站100可以依據自第一測試針板20所得到待檢測測點11對應的檢測訊號以判定是否導通。
When the boundary scan
值得注意的是,在邊界掃描互連測試工作站100藉由夾具的壓合使第一測試針板20的第一測試針腳21分別與待檢測電路板10中對應的待檢測測點11形成電性連接時,待檢測電路板10此時是未獲得電源供應。
It is worth noting that the
接著,邊界掃描互連測試工作站100會將第二測試針板30替換第一測試針板20,第二測試針板30的第二測試針腳31與邊界掃描元件12的邊界掃描腳位13形成電性連接,使邊界掃描互連測試工作站100透過第二測試針板30得到待檢測電路板10的邊界掃描元件12的邊界掃描互連測試結果,值得注意的是,邊界掃描互連測試工作站100透過第二測試針板30得到待檢測電路板10的邊界掃描元件的邊界掃描互連測試結果時,待檢測電路板10此時是獲得電源供應。
Next, the boundary scan
接著,邊界掃描互連測試工作站100即可將檢測訊號的導通判定結果與邊界掃描互連測試結果統整並生成檢測結果。
Then, the boundary scan
接著,以下將以第一個實施例來說明本發明第一實施態樣的運作系統與方法,並請同時參考「第1圖」以及「第2圖」所示,「第2圖」繪示為本發明提高邊界掃描測試的腳位測試涵蓋率方法的方法流程圖。 Next, the operation system and method of the first embodiment of the present invention will be described below with the first embodiment, and please refer to the "1st Figure" and the "2nd Figure" at the same time, and the "2nd Figure" shows It is a method flow chart of the method for improving the coverage rate of the pin position test of the boundary scan test according to the present invention.
首先,邊界掃描互連測試工作站設定待檢測電路板上的多個待檢測測點,待檢測測點無法透過邊界掃描互連測試進行檢測(步驟101);接著,提供具有多個第一測試針腳的第一測試針板,第一測試針板具有多個第一測試針腳,第一測試針腳分別與待檢測測點位置對應(步驟102);接著,測試針板透過邊界掃描互連測試工作站的夾具壓合使第一測試針腳分別與對應的待檢測測點形成電性連接(步驟103);接著,第二測試針板提供邊界掃描互連測試工作站對待檢測電路板的邊界掃描元件進行邊界掃描互連測試(步驟104);接著,邊界掃描互連測試工作站分別與第一測試針板以及第二測試針板形成電性連接(步驟105);接著,邊界掃描互連測試工作站自第一測試針板得到待檢測測點對應的檢測訊號,並依據檢測訊號判定是否導通(步驟 106);接著,邊界掃描互連測試工作站透過第二測試針板得到待檢測電路板的邊界掃描元件的邊界掃描互連測試結果(步驟107);最後,邊界掃描互連測試工作站將檢測訊號的導通判定結果與邊界掃描互連測試結果統整並生成檢測結果(步驟108)。 First, the boundary scan interconnect test station sets a plurality of test points to be tested on the circuit board to be tested, and the test points to be tested cannot be tested by the boundary scan interconnect test (step 101 ); then, a plurality of first test pins are provided. The first test pin board, the first test pin board has a plurality of first test pins, the first test pins are respectively corresponding to the positions of the test points to be detected (step 102); The clamps are pressed together so that the first test pins are respectively electrically connected with the corresponding test points to be tested (step 103 ); then, the second test pin board provides a boundary scan interconnection test station to perform boundary scan on the boundary scan elements of the circuit board to be tested Interconnection test (step 104); then, the boundary scan interconnection test station forms electrical connections with the first test pin board and the second test pin board respectively (step 105); then, the boundary scan interconnection test station from the first test The needle board obtains the test signal corresponding to the test point to be tested, and determines whether it is connected according to the test signal (step 106); then, the boundary scan interconnection test station obtains the boundary scan interconnection test result of the boundary scan element of the circuit board to be tested through the second test needle board (step 107); finally, the boundary scan interconnection test station will detect the signal The turn-on determination results are integrated with the boundary scan interconnect test results to generate a test result (step 108).
綜上所述,可知本發明與先前技術之間的差異在於邊界掃描互連測試工作站分別與第一測試針板以及第二測試針板形成電性連接,邊界掃描互連測試工作站自第一測試針板得到待檢測測點對應的檢測訊號,並依據檢測訊號判定是否導通,邊界掃描互連測試工作站透過第二測試針板得到待檢測電路板的邊界掃描元件的邊界掃描互連測試結果,邊界掃描互連測試工作站將檢測訊號的導通判定結果與邊界掃描互連測試結果統整並生成檢測結果。 From the above, it can be seen that the difference between the present invention and the prior art is that the boundary scan interconnection test station forms electrical connections with the first test pin board and the second test needle board respectively, and the boundary scan interconnection test station is tested from the first test pin board. The needle board obtains the test signal corresponding to the test point to be tested, and determines whether it is connected according to the test signal. The boundary scan interconnection test station obtains the boundary scan interconnection test result of the boundary scan element of the circuit board to be tested through the second test needle board. The scan interconnection test station integrates the conduction determination result of the test signal with the boundary scan interconnection test result and generates the test result.
藉由此一技術手段可以來解決先前技術所存在現有待測試電路板採用邊界掃描測試僅能測得具備電源供應且可控移位暫存器的邊界掃描晶片各腳位檢測的問題,進而達成提高邊界掃描測試的腳位測試涵蓋率的技術功效。 This technical means can solve the problem existing in the prior art that the boundary scan test of the existing circuit board to be tested can only measure the detection of each pin of a boundary scan chip with a power supply and a controllable shift register, thereby achieving Technical efficacy to improve pin test coverage for boundary scan testing.
雖然本發明所揭露的實施方式如上,惟所述的內容並非用以直接限定本發明的專利保護範圍。任何本發明所屬技術領域中具有通常知識者,在不脫離本發明所揭露的精神和範圍的前提下,可以在實施的形式上及細節上作些許的更動。本發明的專利保護範圍,仍須以所附的申請專利範圍所界定者為準。 Although the embodiments disclosed in the present invention are as above, the above-mentioned contents are not used to directly limit the scope of the patent protection of the present invention. Anyone with ordinary knowledge in the technical field to which the present invention pertains can make some changes in the form and details of the implementation without departing from the spirit and scope of the present invention. The scope of patent protection of the present invention shall still be defined by the scope of the appended patent application.
100:邊界掃描互連測試工作站 100: Boundary Scan Interconnect Test Station
10:待檢測電路板 10: PCB to be tested
20:第一測試針板 20: The first test pin board
30:第二測試針板 30: Second test pin board
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