CN112840175A - 用于透明或半透明材料曲面的测量系统 - Google Patents
用于透明或半透明材料曲面的测量系统 Download PDFInfo
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- CN112840175A CN112840175A CN201880098407.9A CN201880098407A CN112840175A CN 112840175 A CN112840175 A CN 112840175A CN 201880098407 A CN201880098407 A CN 201880098407A CN 112840175 A CN112840175 A CN 112840175A
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical techniques
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/95—Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
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Abstract
一种用于透明或半透明材料曲面的测量系统(1),包括:表面处理装置(10)、三维测量装置(20)和第二传送装置;表面处理装置(10)用于对透明或半透明材料的表面进行霜化或雾化,形成霜化或雾化表面,即在透明或半透明材料的表面形成均匀的霜或雾;三维测量装置(20)用于对霜化或雾化后的透明或半透明材料的表面进行三维测量,从而获取测量数据;第二传送装置用于将表面霜化或雾化后的材料传送到三维测量装置(20)。
Description
PCT国内申请,说明书已公开。
Claims (10)
- PCT国内申请,权利要求书已公开。
Applications Claiming Priority (3)
Application Number | Priority Date | Filing Date | Title |
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CN2018111950275 | 2018-10-15 | ||
CN201811195027 | 2018-10-15 | ||
PCT/CN2018/114597 WO2020077709A1 (zh) | 2018-10-15 | 2018-11-08 | 用于透明或半透明材料曲面的测量系统 |
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CN112840175A true CN112840175A (zh) | 2021-05-25 |
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CN201880098407.9A Pending CN112840175A (zh) | 2018-10-15 | 2018-11-08 | 用于透明或半透明材料曲面的测量系统 |
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CN (1) | CN112840175A (zh) |
WO (1) | WO2020077709A1 (zh) |
Citations (8)
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KR950027420A (ko) * | 1994-03-25 | 1995-10-16 | 다떼이시 요시오 | 광학식 감지장치 |
JP2007062219A (ja) * | 2005-08-31 | 2007-03-15 | Canon Inc | 記録装置及び距離検出方法 |
CN104114976A (zh) * | 2011-12-27 | 2014-10-22 | 株式会社Sumco | 氧化硅玻璃坩埚的三维形状测量方法、单晶硅的制造方法 |
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CN105091784A (zh) * | 2015-06-30 | 2015-11-25 | 东莞市盟拓光电科技有限公司 | 用于表面为镜面或透明表面的被测物的三维成像系统 |
CN204831219U (zh) * | 2015-04-27 | 2015-12-02 | 宁波频泰光电科技有限公司 | 手持三维扫描装置和移动终端 |
CN105753334A (zh) * | 2016-02-01 | 2016-07-13 | 广州视睿电子科技有限公司 | 镀膜玻璃及其制备方法 |
CN107388994A (zh) * | 2017-06-14 | 2017-11-24 | 武汉华星光电技术有限公司 | 一种测量多晶硅粗糙度的方法及装置 |
Family Cites Families (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN100573040C (zh) * | 2008-03-17 | 2009-12-23 | 南京航空航天大学 | 物体表面三维轮廓结构光测量系统的标定方法 |
CN203732043U (zh) * | 2013-10-12 | 2014-07-23 | 石泉 | 检测仪以及具有该检测仪的测量系统 |
WO2017148665A1 (en) * | 2016-03-01 | 2017-09-08 | Asml Netherlands B.V. | Metrology apparatus, method of measuring a structure and lithographic apparatus |
CN107131847B (zh) * | 2017-06-15 | 2024-04-09 | 宁波九纵智能科技有限公司 | 一种可应用于3d曲面玻璃面形检测的测量装置及方法 |
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2018
- 2018-11-08 CN CN201880098407.9A patent/CN112840175A/zh active Pending
- 2018-11-08 WO PCT/CN2018/114597 patent/WO2020077709A1/zh active Application Filing
Patent Citations (8)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR950027420A (ko) * | 1994-03-25 | 1995-10-16 | 다떼이시 요시오 | 광학식 감지장치 |
JP2007062219A (ja) * | 2005-08-31 | 2007-03-15 | Canon Inc | 記録装置及び距離検出方法 |
CN104114976A (zh) * | 2011-12-27 | 2014-10-22 | 株式会社Sumco | 氧化硅玻璃坩埚的三维形状测量方法、单晶硅的制造方法 |
CN104729420A (zh) * | 2015-03-24 | 2015-06-24 | 中国科学院上海技术物理研究所 | 一种测量红外焦平面模块低温形变的装置及方法 |
CN204831219U (zh) * | 2015-04-27 | 2015-12-02 | 宁波频泰光电科技有限公司 | 手持三维扫描装置和移动终端 |
CN105091784A (zh) * | 2015-06-30 | 2015-11-25 | 东莞市盟拓光电科技有限公司 | 用于表面为镜面或透明表面的被测物的三维成像系统 |
CN105753334A (zh) * | 2016-02-01 | 2016-07-13 | 广州视睿电子科技有限公司 | 镀膜玻璃及其制备方法 |
CN107388994A (zh) * | 2017-06-14 | 2017-11-24 | 武汉华星光电技术有限公司 | 一种测量多晶硅粗糙度的方法及装置 |
Non-Patent Citations (1)
Title |
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韩伟军等: "无反射蒙砂玻璃", 《玻璃》 * |
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