CN112799120B - Dual-channel electrostatic analyzer for synchronous measurement of ions and electrons - Google Patents
Dual-channel electrostatic analyzer for synchronous measurement of ions and electrons Download PDFInfo
- Publication number
- CN112799120B CN112799120B CN201911106108.8A CN201911106108A CN112799120B CN 112799120 B CN112799120 B CN 112799120B CN 201911106108 A CN201911106108 A CN 201911106108A CN 112799120 B CN112799120 B CN 112799120B
- Authority
- CN
- China
- Prior art keywords
- electrode
- hemispherical
- channel
- electrostatic analyzer
- electrostatic
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Active
Links
- 150000002500 ions Chemical class 0.000 title claims abstract description 82
- 238000005259 measurement Methods 0.000 title claims description 22
- 230000001360 synchronised effect Effects 0.000 title description 5
- 238000000926 separation method Methods 0.000 claims abstract description 16
- 230000009977 dual effect Effects 0.000 claims description 15
- 238000004458 analytical method Methods 0.000 claims description 8
- 230000004907 flux Effects 0.000 claims description 8
- 230000005684 electric field Effects 0.000 claims description 6
- 230000003321 amplification Effects 0.000 claims description 5
- 238000003199 nucleic acid amplification method Methods 0.000 claims description 5
- 238000004891 communication Methods 0.000 claims description 2
- 238000012216 screening Methods 0.000 claims description 2
- 238000001514 detection method Methods 0.000 abstract description 26
- 239000002245 particle Substances 0.000 description 10
- 230000035945 sensitivity Effects 0.000 description 5
- 239000000463 material Substances 0.000 description 4
- 241000282414 Homo sapiens Species 0.000 description 3
- 239000004642 Polyimide Substances 0.000 description 2
- 238000004364 calculation method Methods 0.000 description 2
- 238000013461 design Methods 0.000 description 2
- 238000010586 diagram Methods 0.000 description 2
- 230000007613 environmental effect Effects 0.000 description 2
- 238000000034 method Methods 0.000 description 2
- 229920001721 polyimide Polymers 0.000 description 2
- 238000012545 processing Methods 0.000 description 2
- XAGFODPZIPBFFR-UHFFFAOYSA-N aluminium Chemical compound [Al] XAGFODPZIPBFFR-UHFFFAOYSA-N 0.000 description 1
- 229910052782 aluminium Inorganic materials 0.000 description 1
- 238000013459 approach Methods 0.000 description 1
- 230000009286 beneficial effect Effects 0.000 description 1
- DMFGNRRURHSENX-UHFFFAOYSA-N beryllium copper Chemical compound [Be].[Cu] DMFGNRRURHSENX-UHFFFAOYSA-N 0.000 description 1
- 230000015572 biosynthetic process Effects 0.000 description 1
- 230000008859 change Effects 0.000 description 1
- 230000007547 defect Effects 0.000 description 1
- 238000011161 development Methods 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 238000007429 general method Methods 0.000 description 1
- 238000000691 measurement method Methods 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- 230000008569 process Effects 0.000 description 1
- 229920006395 saturated elastomer Polymers 0.000 description 1
- 230000000007 visual effect Effects 0.000 description 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
- G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
- G01T1/29—Measurement performed on radiation beams, e.g. position or section of the beam; Measurement of spatial distribution of radiation
- G01T1/2907—Angle determination; Directional detectors; Telescopes
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
- G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
- G01T1/29—Measurement performed on radiation beams, e.g. position or section of the beam; Measurement of spatial distribution of radiation
- G01T1/2914—Measurement of spatial distribution of radiation
Landscapes
- Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- General Physics & Mathematics (AREA)
- High Energy & Nuclear Physics (AREA)
- Molecular Biology (AREA)
- Spectroscopy & Molecular Physics (AREA)
- Electron Tubes For Measurement (AREA)
Abstract
The invention relates to the technical field of space physics and space environment detection, in particular to a dual-channel electrostatic analyzer for synchronously measuring ions and electrons, which comprises the following components: an electrostatic deflection device, a track guiding device, a double-channel hemispherical electrostatic analyzer, a separation electrode device, a signal pre-amplifying device, an electronic processor (17) and a device shell (1); the device shell (1) is arranged on the electronic processor (17) and is internally provided with an electrostatic deflection device, a track guiding device, a double-channel hemispherical electrostatic analyzer, a separation electrode device and a signal pre-amplifying device; a track guiding device is arranged below the electrostatic deflection device and is connected with the track guiding device; the double-channel hemispherical electrostatic analyzer is arranged below the track guiding device and is connected with the track guiding device; the separation electrode device and the signal pre-amplifying device are sequentially arranged below the two-channel hemispherical electrostatic analyzer and are connected with the electronic processor through a cable.
Description
Technical Field
The invention belongs to the technical field of space physics and space environment detection, and particularly relates to a dual-channel electrostatic analyzer for synchronously measuring ions and electrons.
Background
Currently, charged ions and electrons are present everywhere in the earth space, the interplanetary, and other planetary spaces of the solar system. These charged particles are one of the main environmental elements in space, and the charged particles can interact with an on-orbit spacecraft to cause various spatial environmental effects such as charge and discharge. The detection of charged particles can be used to study fundamental physical problems of human interest, such as how low energy particles accelerate to high energy particles, how the sun affects the formation and dissipation of the planetary atmosphere, etc. The solution of the problems is helpful for human to know and understand the unknown world, and also provides guarantee for the safe development of various aerospace activities of human beings. Charged particle detection is a necessary detection item for space environment detection, such as European space office CLUSTER satellite, american MMS satellite, mars Express of European space office, and American MAVEN, which are all provided with an ion detector and an electronic detector for detecting ions and electrons.
Currently, the general methods for low energy ion and electron measurement are: the direction and energy of the incident particles are analyzed by using an electrostatic analysis method, and then the signals are amplified by using a microchannel plate and output to electronic processing, so that the energy, direction and flux information of the particles are obtained. The measurement methods of low-energy ions and electrons are basically consistent. However, because of the different polarities of the charges of the ions and electrons, ion detection and electron detection are usually used as two independent detection devices, and a single-channel electrostatic analyzer structure is adopted. This approach results in a larger overall weight and power consumption of the instrument. On small satellite detection platforms, particularly deep space detection oriented satellite platforms, the weight and power consumption of the instruments carried by the small satellite detection platforms are required to be as small as possible so as to reduce the emission cost. Thus, the use of separate two devices for separate measurement of ions and electrons has limited its application to small satellite platforms.
Disclosure of Invention
The invention aims to solve the defects of the prior method, provides a dual-channel electrostatic analyzer for synchronously measuring ions and electrons, solves the technical problem that the detection of low-energy ions and electrons in the prior space cannot be integrated into one device, particularly relates to a dual-channel hemispherical electrostatic analyzer, can integrate the measurement functions of the ions and electrons in one device, realizes the synchronous measurement of the ions and electrons, greatly reduces the weight and the power consumption of the device, improves the miniaturization level of a space low-energy particle detection instrument, and expands the application field of the low-energy particle detection instrument.
In order to achieve the above purpose, the invention provides a dual-channel electrostatic analyzer for synchronously measuring ions and electrons, which solves the technical problem of synchronously measuring the ions and electrons in one device in space environment detection.
The dual channel electrostatic analyzer includes: the device comprises an electrostatic deflection device, a track guiding device, a double-channel hemispherical electrostatic analyzer, a separation electrode device, a signal pre-amplification device, an electronic processor and a device shell;
the device shell is arranged on the electronic processor and is internally provided with an electrostatic deflection device, a track guiding device, a double-channel hemispherical electrostatic analyzer, a separation electrode device and a signal pre-amplifying device; the lower part of the electrostatic deflection device is arranged on the track guiding device and is connected with the track guiding device; the double-channel hemispherical electrostatic analyzer is arranged below the track guiding device and is connected with the track guiding device; the separation electrode device and the signal pre-amplifying device are sequentially arranged below the two-channel hemispherical electrostatic analyzer and are connected with the electronic processor through a cable.
As one of the improvements of the above-described aspects, the electrostatic deflection device includes: an upper deflector plate and a lower deflector plate; the upper deflection plate is of a bowl-shaped structure, a bowl opening is upward, and an opening is formed in the bottom of the upper deflection plate; the lower deflection plate is in a vase bottleneck-shaped structure, and the bottleneck of the lower deflection plate is upward; the upper deflection plate and the lower deflection plate are two arc plates which are symmetrically arranged and have a section of 45 degrees, and an incident channel is formed;
wherein ions and electrons in any direction within a range of 90 degrees are simultaneously incident along an incident channel by the voltage applied by the upper deflection plate and the lower deflection plate.
As one of the improvements of the technical scheme, the incident channel formed by the upper deflection plate and the lower deflection plate is in a circumferential horn-shaped structure, and the opening of the circumferential horn-shaped structure faces to the device shell; the included angle between the symmetrical center line of the upper deflection plate and the lower deflection plate and the upper edge line of the electronic processor is 45 degrees.
As one of the improvements of the above-described aspects, the trajectory guide includes: an upper electrode, a middle electrode and a lower electrode;
the upper electrode and the lower electrode are respectively positioned at the upper and lower positions of the middle electrode; the three parts form a cylindrical space with openings at the upper end and the lower end; the upper electrode is arranged at the bottom opening of the upper deflection plate; the lower electrode is arranged above the double-channel hemispherical electrostatic analyzer, and a first opening and a second opening are formed in the upper part and the lower part of the cylindrical space; the upper electrode can be high-voltage, the middle electrode and the lower electrode are grounded, a specific electric field is formed, and ions and electrons emitted by the electrostatic deflection device are introduced into the double-channel electrostatic analyzer which is positioned at the rear end of the double-channel electrostatic analyzer and connected with the rear end of the double-channel electrostatic analyzer.
As one of the improvements of the above technical solution, the dual-channel hemispherical electrostatic analyzer is configured to perform energy analysis on ions and electrons entering the electrostatic analyzer by using a voltage applied by the dual-channel hemispherical electrostatic analyzer, and screen and output ions and electrons with energy corresponding to the value of the voltage, which are emitted from different channels respectively;
wherein, binary channels hemisphere electrostatic analysis ware includes: an outer hemispherical electrode, a middle hemispherical electrode and an inner hemispherical electrode;
the middle hemispherical electrode is positioned between the outer hemispherical electrode and the inner hemispherical electrode; the middle hemispherical electrode and the outer hemispherical electrode and the inner hemispherical electrode form an outer channel and an inner channel for deflecting ions and electrons respectively; the step scanning voltage is applied to the middle hemispherical electrode, the outer hemispherical electrode and the inner hemispherical electrode are grounded, a periodically-changing electric field is formed between the middle hemispherical electrode and the outer hemispherical electrode and between the middle hemispherical electrode and the inner hemispherical electrode respectively, ions and electrons with energy corresponding to the numerical value of the step scanning voltage are screened and output, and the screened and output ions and electrons are emitted along the corresponding outer channel and inner channel respectively.
As one of the improvements of the technical scheme, the outer hemispherical electrode, the middle hemispherical electrode and the inner hemispherical electrode are hemispherical electrodes; the outside channel and the inside channel are both bowl-shaped structures with downward openings in the circumferential direction, and the tops of the bowl-shaped structures are provided with openings.
As one of the improvements of the above technical means, the separation electrode means includes: an outer ring electrode and an inner ring electrode; the outer ring electrode and the inner ring electrode are of annular structures;
the voltage polarity of the outer ring electrode is the same as that of the middle hemispherical electrode; the voltage polarity of the inner ring electrode is opposite to that of the middle hemispherical electrode.
As one of the improvements of the above technical solutions, the signal pre-amplifying device includes: an outer ring microchannel plate, an inner ring microchannel plate, an outer ring anode and an inner ring anode;
the outer ring microchannel plate is provided with an outer ring electrode, which is used for amplifying the charge signal of the ions output by the outer channel of the electrostatic analyzer, outputting a corresponding charge pulse signal and receiving the charge pulse signal by an outer ring anode which is positioned below the outer ring microchannel plate and is separated by a certain distance;
the inner ring microchannel plate is provided with an inner ring electrode which is used for amplifying the electric charge signal of the electrons output by the inner side channel of the electrostatic analyzer, outputting a corresponding electric charge pulse signal and receiving the electric charge pulse signal by an inner ring anode which is positioned below the inner ring microchannel plate and is separated by a certain distance;
the outer ring anode and the inner ring anode are used for collecting corresponding charge pulse signals and respectively input to the electronic processor through cables.
As one of the improvements of the above technical solutions, the electronic processor includes: the system comprises a signal pre-amplifying circuit, a high-voltage circuit, a low-voltage circuit, a power supply system, an interface circuit and an FPGA processor;
the signal pre-amplifying circuit is used for amplifying corresponding charge pulse signals output by the outer ring anode and the inner ring anode through a connected cable to obtain amplified ionic electric signals and electronic electric signals;
the FPGA processor is used for combining and calculating pulse count in unit time with voltage data applied by the electrostatic analyzer and voltage data applied by the electrostatic deflection device according to the obtained amplified ionic electric signals and electronic electric signals to obtain energy, direction and flux information of ions and electrons;
the high-voltage circuit is used for providing multiple paths of high voltages required; wherein the multi-path high voltage further comprises: positive high pressure and negative high pressure;
the low-voltage circuit is used for controlling the operation of the whole electronic processor in cooperation with the FPGA, and the low-voltage circuit is communicated with the outside through the FPGA control interface circuit and can be used for communicating with a satellite bus; the high voltage circuit outputs the required high voltage through the FPGA and the DA converter.
The power supply system is used for supplying power.
Compared with the prior art, the invention has the beneficial effects that:
the invention fully integrates the ion and electron measurement, synchronously realizes the ion and electron measurement in one device, greatly reduces the weight and power consumption requirements of the instrument, and has wide application requirements in the space detection field with tension resources such as weight, power consumption and the like, in particular in the deep space detection field.
Drawings
FIG. 1 is a schematic cross-sectional view of a dual channel electrostatic analyzer for simultaneous ion and electron measurement according to the present invention;
FIG. 2 is a schematic view of three-dimensional cross-sectional structure of a dual channel electrostatic analyzer for simultaneous ion and electron measurement according to the present invention;
FIG. 3 is a schematic diagram of a dual channel electrostatic analyzer of the present invention mounted on a satellite platform for simultaneous ion and electron measurement;
fig. 4 is a schematic diagram of the structure of an electronic processor of a dual channel electrostatic analyzer for simultaneous ion and electron measurement according to the present invention.
Reference numerals:
1. device housing 2, upper deflector plate
3. Lower deflection plate 4, upper electrode
5. Middle electrode 6, bottom electrode
7. Outer hemispherical electrode 8, middle hemispherical electrode
9. Inner hemispherical electrode 10, outer ring electrode
11. Inner ring electrode 12 and outer ring microchannel plate
13. Inner ring microchannel plate 14 and outer ring anode
15. Inner ring anode 15, inner ring anode
16. Cable 17, electronics processor
18. First opening 19, second opening
Detailed Description
The invention will now be further described with reference to the accompanying drawings.
As shown in FIG. 1, the invention provides a dual-channel electrostatic analyzer for synchronously measuring ions and electrons, which solves the problem that the existing space low-energy ion and electron detection equipment cannot finish synchronous measurement of ions and electrons in a single equipment, and adopts the design of the dual-channel hemispherical electrostatic analyzer to realize synchronous measurement of ions and electrons; the voltage setting of the track guiding device is utilized to change the detection sensitivity of the instrument, so that the detection dynamic range is enlarged; the design of double separation electrodes is utilized to fully separate ions and electronic signals, so that mutual interference is avoided.
The dual channel electrostatic analyzer includes: an electrostatic deflection device, a track guiding device, a two-channel hemispherical electrostatic analyzer, a separation electrode device, a signal pre-amplification device, an electronic processor 17 and a device housing 1;
the device shell 1 is arranged on the electronic processor 17 and is internally provided with an electrostatic deflection device, a track guiding device, a double-channel hemispherical electrostatic analyzer, a separation electrode device and a signal pre-amplifying device; the lower part of the electrostatic deflection device is arranged on the track guiding device and is connected with the track guiding device; the double-channel hemispherical electrostatic analyzer is arranged below the track guiding device and is connected with the track guiding device; the separation electrode device and the signal pre-amplifying device are sequentially arranged below the two-channel hemispherical electrostatic analyzer and are connected with the electronic processor through a cable.
The electrostatic deflection device is used for expanding a pitch angle detection view field and introducing ions and electrons incident from a space into the track guiding device;
wherein the electrostatic deflection device comprises: an upper deflector plate 2 and a lower deflector plate 3; the upper deflection plate 2 is of a bowl-shaped structure, a bowl opening is upward, and an opening is formed in the bottom of the upper deflection plate; the lower deflection plate 3 is in a vase bottleneck-shaped structure, and the bottleneck of the lower deflection plate is upward;
the upper deflection plate 2 and the lower deflection plate 3 are two symmetrically arranged arc plates with a section of 45 degrees, and an incident channel is formed; wherein ions and electrons in any direction within a range of 90 ° are simultaneously incident along an incident path by the voltages applied by the upper deflector plate 2 and the lower deflector plate 3. Wherein, the incident channel formed by the upper deflection plate 2 and the lower deflection plate 3 is in a circumferential horn-shaped structure, and the opening of the circumferential horn-shaped structure faces the device shell 1 and outwards for introducing electrons and ions.
The included angle between the symmetrical center line of the upper deflection plate 2 and the lower deflection plate 3 and the upper side line of the electronic processor 17 is 45 degrees, so that the measurement of the 2 pi visual fields of ions and electrons can be realized.
The track guiding device is used for introducing ions and electrons incident from the space and introducing the ions and electrons into the double-channel hemispherical electrostatic analyzer, and changing the detection sensitivity of the instrument by applying voltage to the double-channel hemispherical electrostatic analyzer so as to enlarge the detection dynamic range of the instrument;
wherein the trajectory guide includes: an upper electrode 4, a middle electrode 5 and a lower electrode 6;
the upper electrode 4 and the lower electrode 6 are respectively positioned at the upper and lower positions of the middle electrode 5; the three parts form a cylindrical space with openings at the upper end and the lower end; the upper electrode 4 is arranged at the bottom opening of the upper deflection plate 2; the lower electrode 6 is arranged above the double-channel hemispherical electrostatic analyzer, and a first opening 18 and a second opening 19 are arranged at the upper end and the lower end of the cylindrical space; the upper electrode 4 can be high-voltage, the middle electrode 5 and the lower electrode 6 are grounded, a specific electric field is formed to introduce ions and electrons emitted by the electrostatic deflection device into the double-channel electrostatic analyzer connected at the rear end of the double-channel electrostatic analyzer, and meanwhile, the number of the ions and electrons passing through the upper electrode 4 can be controlled by adjusting the high-voltage value of the upper electrode 4, so that the detection sensitivity of the instrument is changed. The instrument has the highest sensitivity when the electrode 4 is not energized for low flux ion and electron measurements. The electrode 4 will reduce the sensitivity of the instrument after being applied with voltage, which is used for measuring ions and electrons with higher flux, preventing the instrument from being saturated.
Wherein, the outlets of the circumferential incidence channels formed by the upper deflection plate 2 and the lower deflection plate 3 which are positioned at the two sides of the track guiding device are respectively communicated with the first opening 18; the second opening 19 is in communication with the dual channel electrostatic analyzer inlet;
the dual-channel hemispherical electrostatic analyzer is used for carrying out energy analysis on ions and electrons entering the electrostatic analyzer through the voltage applied by the dual-channel hemispherical electrostatic analyzer, screening and outputting the ions and electrons with energy corresponding to the value of the voltage, and respectively emitting the ions and the electrons from different channels;
wherein, binary channels hemisphere electrostatic analysis ware includes: an outer hemispherical electrode 7, a middle hemispherical electrode 8 and an inner hemispherical electrode 9;
the middle hemispherical electrode 8 is positioned between the outer hemispherical electrode 7 and the inner hemispherical electrode 9; an outer channel and an inner channel for deflecting ions and electrons are formed between the middle hemispherical electrode 8 and the outer hemispherical electrode 7 and between the middle hemispherical electrode 8 and the inner hemispherical electrode 9 respectively; by applying a step scan voltage to the middle hemispherical electrode 8, the outer hemispherical electrode 7 and the inner hemispherical electrode 9 are grounded, and periodically varying electric fields are formed between the middle hemispherical electrode 8 and the outer hemispherical electrode 7, and between the middle hemispherical electrode 8 and the inner hemispherical electrode 9, respectively, ions and electrons having energies corresponding to the values of the step scan voltage are screened out, and the screened-out ions and electrons are emitted along the corresponding outer and inner channels, respectively.
Wherein, the outer hemispherical electrode 7, the middle hemispherical electrode 8 and the inner hemispherical electrode 9 are hemispherical electrodes. The outer channel and the inner channel are of a bowl-shaped structure with downward openings in the circumferential direction, and the top of the bowl-shaped structure is provided with an opening; the third opening 20 and the fourth opening 21 are provided at the top of the outer channel and the inner channel and communicate.
At this time, a voltage of a specific magnitude only allows ions and electrons of a specific energy to pass through the respective channels, thereby performing energy analysis on the incident ions and electrons, respectively. Ions and electrons can pass from different channels depending on the polarity of the stepped scan voltage applied by the middle hemispherical electrode 8.
The separation electrode device is used for fully separating screened and output ions and electrons in the emission of the dual-channel hemispherical electrostatic analyzer by utilizing the inner electrode and the outer electrode with different polarities, so that mutual interference of signals is avoided;
wherein the separation electrode device comprises: an outer ring electrode 10 and an inner ring electrode 11; the outer ring electrode 10 and the inner ring electrode 11 are of annular structures;
the voltage polarity of the outer ring electrode 10 is the same as that of the middle hemispherical electrode 8; the voltage polarity of the inner ring electrode 11 is opposite to that of the middle hemispherical electrode 8; the distance between the outer ring electrode 10 and the inner ring electrode 11 and the outlet of the dual-channel hemispherical electrostatic analyzer is about 15mm, so that the electrostatic analyzer can fully separate outgoing ions and electrons, and mutual interference of signals is avoided.
The signal pre-amplifying device is used for amplifying the separated charge signals of the ions and the electrons by utilizing the micro-channel plate respectively and outputting corresponding charge pulse signals;
wherein the signal pre-amplification means comprises: an outer ring microchannel plate 12, an inner ring microchannel plate 13, an outer ring anode 14 and an inner ring anode 15;
the outer ring microchannel plate 12 is provided with an outer ring electrode 10 for amplifying the charge signal of the ions output by the outer channel of the electrostatic analyzer, outputting a corresponding charge pulse signal, and receiving the charge pulse signal by an outer ring anode 14 which is positioned below the outer ring microchannel plate 12 and is separated by a certain distance;
the inner ring microchannel plate 13 is provided with an inner ring electrode 11 for amplifying an electric charge signal of electrons output by an inner side channel of the electrostatic analyzer, outputting a corresponding electric charge pulse signal, and receiving the electric charge pulse signal by an inner ring anode 15 which is positioned below the inner ring microchannel plate 13 and is separated by a certain distance;
the outer ring anode 14 and the inner ring anode 15 are used for collecting corresponding charge pulse signals and respectively input to the electronic processor 17 through the cable 16.
The electronic processor is used for respectively processing the corresponding charge pulse signals output by the signal pre-amplifying device and respectively obtaining the direction, energy and flux information of ions and electrons;
as shown in fig. 3, the electronic processor 17 includes: the system comprises a signal pre-amplifying circuit, a high-voltage circuit, a low-voltage circuit, a power supply system, an interface circuit and an FPGA processor;
the signal pre-amplifying circuit is used for amplifying corresponding charge pulse signals output by the outer ring anode 14 and the inner ring anode 15 through a connected cable 16 to obtain amplified ionic electric signals and electronic electric signals;
the FPGA processor is used for combining and calculating pulse count in unit time with voltage data applied by the electrostatic analyzer and voltage data applied by the electrostatic deflection device according to the obtained amplified ionic electric signals and electronic electric signals to obtain energy, direction and flux information of ions and electrons;
the direction information of the ions comprises an azimuth angle and a pitch angle of the ions; the electronic direction information includes an electronic azimuth angle and a pitch angle. Because the anode is of an annular structure, the azimuth angle of ions and the azimuth angle of electrons are obtained by the circumferential position of an electric signal on the anode, and the pitch angle of the ions and the pitch angle of the electrons are obtained by calculation through the voltage value applied to the upper deflection plate 2 of the electrostatic deflection device; the flux information of the ions and electrons can be obtained by counting the number of the electric signals collected on the anode in unit time. The above calculation processes are all obtained by using the prior art known in the art.
The high-voltage circuit is used for providing multiple paths of high voltages required; wherein the multi-path high voltage further comprises: positive high pressure and negative high pressure;
the low-voltage circuit is used for controlling the operation of the whole electronic processor 17 in cooperation with the FPGA, and the low-voltage circuit is communicated with the outside through the FPGA control interface circuit and can be used for communicating with a satellite bus; the high voltage circuit outputs the required high voltage through the FPGA and the DA converter.
The power supply system is used for supplying power to the whole device.
The device housing 1 is used for providing a mounting platform.
The upper deflection plate 2, the lower deflection plate 3, the upper electrode 4, the middle hemispherical electrode 8, the outer ring electrode 10, the inner ring electrode 11, the outer ring microchannel plate 12, the inner ring microchannel plate 13, the outer ring anode 14 and the inner ring anode 15 can be all insulated by polyimide materials.
The upper deflection plate 2, the lower deflection plate 3, the upper electrode 4, the middle hemispherical electrode 8, the outer ring electrode 10, the inner ring electrode 11, the outer ring microchannel plate 12, the inner ring microchannel plate 13, the outer ring anode 14 and the inner ring anode 15 are fixed with the device shell 1 through polyimide materials.
The middle electrode 5, the lower electrode 6, the outer hemisphere electrode 7 and the inner hemisphere electrode 9 can be directly fixed with the device housing 1.
The outer ring electrode 10, the inner ring electrode 11, the outer ring anode 14 and the inner ring anode 15 are made of beryllium copper materials.
The measuring device based on the above-described structure, except for the outer ring electrode 10, the inner ring electrode 11, the outer ring microchannel plate 12, the inner ring microchannel plate 13, the outer ring anode 14, the inner ring anode 15, the cable 16, and the electronic processor 17, all the other components shown in fig. 1 are made of an aluminum material.
As shown in FIG. 2, the dual-channel electrostatic analyzer for simultaneously measuring space ions and electrons is embedded on the satellite surface, the part above the dual-channel hemispherical electrostatic analyzer (including the dual-channel hemispherical electrostatic analyzer) extends out of the satellite surface, a detection window is far away from the satellite surface as far as possible, interference of the charged state of the satellite surface on measurement is reduced, and meanwhile, an electronic processor 17 is arranged in a satellite cabin, so that the temperature control of the working environment of the electronic processor is facilitated.
Finally, it should be noted that the above embodiments are only for illustrating the technical solution of the present invention and are not limiting. Although the present invention has been described in detail with reference to the embodiments, it should be understood by those skilled in the art that modifications and equivalents may be made thereto without departing from the spirit and scope of the present invention, which is intended to be covered by the appended claims.
Claims (8)
1. A dual channel electrostatic analyzer for simultaneous ion and electron measurement, comprising: an electrostatic deflection device, a track guiding device, a double-channel hemispherical electrostatic analyzer, a separation electrode device, a signal pre-amplifying device, an electronic processor (17) and a device shell (1);
the device shell (1) is arranged on the electronic processor (17) and is internally provided with an electrostatic deflection device, a track guiding device, a double-channel hemispherical electrostatic analyzer, a separation electrode device and a signal pre-amplifying device; a track guiding device is arranged below the electrostatic deflection device and is connected with the track guiding device; the double-channel hemispherical electrostatic analyzer is arranged below the track guiding device and is connected with the track guiding device; the separation electrode device and the signal pre-amplification device are sequentially arranged below the double-channel hemispherical electrostatic analyzer and are connected with the electronic processor through a cable;
the dual-channel hemispherical electrostatic analyzer is used for carrying out energy analysis on ions and electrons entering the electrostatic analyzer through the voltage applied by the dual-channel hemispherical electrostatic analyzer, screening and outputting the ions and electrons with energy corresponding to the value of the voltage, and respectively emitting the ions and the electrons from different channels;
wherein, binary channels hemisphere electrostatic analysis ware includes: an outer hemispherical electrode (7), a middle hemispherical electrode (8) and an inner hemispherical electrode (9);
the middle hemispherical electrode (8) is positioned between the outer hemispherical electrode (7) and the inner hemispherical electrode (9); an outer channel and an inner channel for deflecting ions and electrons are formed between the middle hemispherical electrode (8) and the outer hemispherical electrode (7) and between the middle hemispherical electrode (9) and the inner hemispherical electrode; the step scanning voltage is applied to the middle hemispherical electrode (8), the outer hemispherical electrode (7) and the inner hemispherical electrode (9) are grounded, periodically-changing electric fields are respectively formed between the middle hemispherical electrode (8) and the outer hemispherical electrode (7) and between the middle hemispherical electrode (8) and the inner hemispherical electrode (9), ions and electrons with energy corresponding to the value of the step scanning voltage are screened out, and the screened-out ions and electrons are emitted along the corresponding outer channel and inner channel respectively.
2. The dual channel electrostatic analyzer of claim 1, wherein the electrostatic deflection means comprises: an upper deflector plate (2) and a lower deflector plate (3); the upper deflection plate (2) is of a bowl-shaped structure, a bowl opening of the upper deflection plate is upward, and an opening is formed in the bottom of the upper deflection plate; the lower deflection plate (3) is in a vase bottleneck-shaped structure, and the bottleneck of the lower deflection plate is upward; the upper deflection plate (2) and the lower deflection plate (3) are two arc plates which are symmetrically arranged and have a section of 45 degrees, and an incident channel is formed;
wherein, the upper deflection plate (2) and the lower deflection plate (3) scan ions and electrons in any direction within the range of 90 degrees through the voltage applied by the upper deflection plate (2) and the lower deflection plate (3) and simultaneously enter along the incident channel.
3. The dual channel electrostatic analyzer for simultaneous ionic and electronic measurement according to claim 2, wherein the incident channel formed by the upper deflector plate (2) and the lower deflector plate (3) is of a circumferential horn-like structure, and the opening of the horn-like structure faces the device housing (1); the included angle between the symmetrical center line of the upper deflection plate (2) and the lower deflection plate (3) and the upper edge line of the electronic processor (17) is 45 degrees.
4. The dual channel electrostatic analyzer of claim 1, wherein the trajectory guide comprises: an upper electrode (4), a middle electrode (5) and a lower electrode (6);
the upper electrode (4) and the lower electrode (6) are respectively positioned at the upper and lower positions of the middle electrode (5); the three parts form a cylindrical space with openings at the upper end and the lower end; the upper electrode (4) is arranged at the bottom opening of the upper deflection plate (2); the lower electrode (6) is arranged above the dual-channel hemispherical electrostatic analyzer, and a first opening (18) and a second opening (19) are arranged on the upper part and the lower part of the cylindrical space; the upper electrode (4) is high in voltage, the middle electrode (5) and the lower electrode (6) are grounded, a specific electric field is formed, and ions and electrons emitted by the electrostatic deflection device are introduced into the double-channel hemispherical electrostatic analyzer connected with the rear end of the double-channel hemispherical electrostatic analyzer.
5. The dual channel electrostatic analyzer for simultaneous ionic and electronic measurement according to claim 1, wherein the outer hemispherical electrode (7), the middle hemispherical electrode (8) and the inner hemispherical electrode (9) are hemispherical electrodes; the outside channel and the inside channel are both bowl-shaped structures with downward openings in the circumferential direction, and the tops of the bowl-shaped structures are provided with openings.
6. The dual channel electrostatic analyzer of simultaneous ion and electron measurement of claim 1, wherein the split electrode device comprises: an outer ring electrode (10) and an inner ring electrode (11); the outer ring electrode (10) and the inner ring electrode (11) are of annular structures;
the voltage polarity of the outer ring electrode (10) is the same as that of the middle hemispherical electrode (8); the voltage polarity of the inner ring electrode (11) is opposite to that of the middle hemispherical electrode (8).
7. The dual channel electrostatic analyzer of claim 1, wherein said signal pre-amplification means comprises: an outer ring microchannel plate (12), an inner ring microchannel plate (13), an outer ring anode (14) and an inner ring anode (15);
the outer ring microchannel plate (12) is provided with an outer ring electrode (10) for amplifying charge signals of ions output by an outer side channel of the electrostatic analyzer, outputting corresponding charge pulse signals and receiving the corresponding charge pulse signals by an outer ring anode (14) which is positioned below the outer ring microchannel plate (12) and is separated by a certain distance;
an inner ring electrode (11) is arranged on the inner ring microchannel plate (13) and is used for amplifying a charge signal of electrons output by an inner side channel of the electrostatic analyzer, outputting a corresponding charge pulse signal and receiving the charge pulse signal by an inner ring anode (15) which is positioned below the inner ring microchannel plate (13) and is separated by a certain distance;
the outer ring anode (14) and the inner ring anode (15) are used for collecting corresponding charge pulse signals and respectively input to the electronic processor (17) through the cable (16).
8. The dual channel electrostatic analyzer of simultaneous ion and electron measurement according to claim 1, wherein said electronic processor (17) comprises: the system comprises a signal pre-amplifying circuit, a high-voltage circuit, a low-voltage circuit, a power supply system, an interface circuit and an FPGA processor;
the signal pre-amplifying circuit is used for amplifying corresponding charge pulse signals output by the outer ring anode (14) and the inner ring anode (15) through a connected cable (16) to obtain amplified ionic electric signals and electronic electric signals;
the FPGA processor is used for combining and calculating pulse count in unit time with voltage data applied by the dual-channel hemispherical electrostatic analyzer and voltage data applied by the electrostatic deflection device according to the obtained amplified ionic electric signals and electronic electric signals to obtain energy, direction and flux information of ions and electrons;
the high-voltage circuit is used for providing multiple paths of high voltages required; wherein the multi-path high voltage further comprises: positive high pressure and negative high pressure;
the low-voltage circuit is used for controlling the operation of the whole electronic processor (17) by matching with the FPGA processor, and comprises a control interface circuit for controlling the communication with the outside through the FPGA processor, and can be used for communicating with a satellite bus; the FPGA processor and the DA converter are used for enabling the high-voltage circuit to output the required high voltage;
the power supply system is used for supplying power.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201911106108.8A CN112799120B (en) | 2019-11-13 | 2019-11-13 | Dual-channel electrostatic analyzer for synchronous measurement of ions and electrons |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201911106108.8A CN112799120B (en) | 2019-11-13 | 2019-11-13 | Dual-channel electrostatic analyzer for synchronous measurement of ions and electrons |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| CN112799120A CN112799120A (en) | 2021-05-14 |
| CN112799120B true CN112799120B (en) | 2024-03-22 |
Family
ID=75803149
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201911106108.8A Active CN112799120B (en) | 2019-11-13 | 2019-11-13 | Dual-channel electrostatic analyzer for synchronous measurement of ions and electrons |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN112799120B (en) |
Families Citing this family (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN113438786B (en) * | 2021-05-17 | 2022-12-06 | 中国科学院国家空间科学中心 | Device for collecting space thermal plasma |
| FR3136105A1 (en) * | 2022-05-25 | 2023-12-01 | Centre National d'Études Spatiales | Mono-polarization detector of positive and negative plasma particles |
Citations (38)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| DE2162808A1 (en) * | 1970-12-18 | 1972-07-06 | Du Pont | Energy analysis of charged particles |
| US4078301A (en) * | 1974-11-27 | 1978-03-14 | U.S. Philips Corporation | Method of manufacturing a deflection coil for a cathode ray tube |
| CN87103626A (en) * | 1986-05-19 | 1988-06-01 | Vg仪器集团有限公司 | Electron spectrometer |
| WO2004030025A1 (en) * | 2002-09-24 | 2004-04-08 | Ciphergen Biosystems, Inc. | Electric sector time-of-flight tandem mass spectrometer |
| CN2788348Y (en) * | 2005-04-22 | 2006-06-14 | 北京中科信电子装备有限公司 | Scan deflexion device |
| CN1906728A (en) * | 2003-12-04 | 2007-01-31 | 日新意旺机械股份公司 | Ion beam apparatus |
| CN101777481A (en) * | 2003-06-13 | 2010-07-14 | 艾克塞利斯技术公司 | hybrid magnetic/electrostatic deflector for ion implantation systems |
| CN201655741U (en) * | 2009-12-29 | 2010-11-24 | 聚光科技(杭州)股份有限公司 | Device improving detection efficiency of 3D ion trap |
| CN201751976U (en) * | 2010-03-12 | 2011-02-23 | 中微半导体设备(上海)有限公司 | Processing device with plasma |
| JP2011228069A (en) * | 2010-04-16 | 2011-11-10 | Ulvac Japan Ltd | Time-of-flight secondary ion mass spectrometer using gas cluster ion beam |
| CN102298096A (en) * | 2010-06-25 | 2011-12-28 | 中国科学院电子学研究所 | Three-dimensional electric field sensor in air |
| CN102334180A (en) * | 2009-01-02 | 2012-01-25 | 瓦里安半导体设备公司 | Techniques for independently controlling deflection, deceleration, and focus of an ion beam |
| CN102353971A (en) * | 2011-06-29 | 2012-02-15 | 中国科学院空间科学与应用研究中心 | Miniaturized low energy ion detector with low power consumption |
| CN102651301A (en) * | 2012-05-23 | 2012-08-29 | 复旦大学 | Mass spectrometer with linear ion storage and time-of-flight mass analyzer connected in series |
| CN103201821A (en) * | 2010-09-08 | 2013-07-10 | 株式会社岛津制作所 | Time-of-flight mass spectrometer |
| CN103262205A (en) * | 2010-12-14 | 2013-08-21 | 塞莫费雪科学（不来梅）有限公司 | Ion detection |
| CN103675883A (en) * | 2013-12-06 | 2014-03-26 | 中国科学院空间科学与应用研究中心 | Low-pollution spatial medium-energy electron detector based on magnetic deflection technique |
| CN103713306A (en) * | 2013-12-19 | 2014-04-09 | 中国科学院西安光学精密机械研究所 | Device for detecting micro channel plate dark counts |
| CN103852780A (en) * | 2012-12-04 | 2014-06-11 | 中国科学院空间科学与应用研究中心 | Solar X-ray detector with wide field angle and high energy spectrum resolution |
| WO2014110699A1 (en) * | 2013-01-16 | 2014-07-24 | 中国科学院大连化学物理研究所 | Codirectional dual-channel time-of-flight mass spectrometer |
| CN104011832A (en) * | 2011-10-21 | 2014-08-27 | 株式会社岛津制作所 | Mass analyser, mass spectrometer and associated methods |
| CN105277996A (en) * | 2014-07-21 | 2016-01-27 | 中国科学院空间科学与应用研究中心 | Spatial neutral atom imaging apparatus |
| CN105301088A (en) * | 2015-04-01 | 2016-02-03 | 中国原子能科学研究院 | Accelerator mass spectrometer with simultaneous isotope measurement function |
| CN105719942A (en) * | 2014-12-05 | 2016-06-29 | 中国科学院大连化学物理研究所 | High dynamic range detector for flight time mass spectrum |
| CN105717377A (en) * | 2014-12-03 | 2016-06-29 | 中国科学院空间科学与应用研究中心 | Satellite difference potential measuring apparatus |
| CN105738941A (en) * | 2014-12-12 | 2016-07-06 | 中国科学院空间科学与应用研究中心 | Space energy particle energy spectrum measurement device based on electrostatic deflection |
| CN105990089A (en) * | 2015-01-29 | 2016-10-05 | 中国科学院空间科学与应用研究中心 | Measurement device used for space ions and neutral atoms |
| CN106568832A (en) * | 2016-10-31 | 2017-04-19 | 中国科学院国家空间科学中心 | Sensor apparatus for measuring energy and component of space thermal plasma |
| CN106610501A (en) * | 2015-10-26 | 2017-05-03 | 中国科学院国家空间科学中心 | Compact push-broom geospace neutral atom observation device |
| CN106700196A (en) * | 2016-11-11 | 2017-05-24 | 哈尔滨理工大学 | Nanocomposite material for inhibiting space charge by regulating and controlling micro scale structure through electric field |
| CN107359104A (en) * | 2017-06-14 | 2017-11-17 | 中国科学院地质与地球物理研究所 | A kind of magnetic substance spectralyzer couples conversion equipment with dual ion sources |
| CN108089064A (en) * | 2016-11-21 | 2018-05-29 | 中国科学院大连化学物理研究所 | A kind of device and method for measuring pulsed ionizing beam pulse width |
| CN108106670A (en) * | 2017-12-15 | 2018-06-01 | 北京卫星环境工程研究所 | Low Earth Orbit space environment and the integrated detection system of effect |
| CN108475616A (en) * | 2016-01-15 | 2018-08-31 | 株式会社岛津制作所 | Orthogonal acceleration time-of-flight type mass spectrometer |
| CN108538699A (en) * | 2018-05-14 | 2018-09-14 | 北京卫星环境工程研究所 | Mass spectrum-high-rise neutral atmosphere the detection device of power spectrum integration |
| CN109192642A (en) * | 2018-08-30 | 2019-01-11 | 中国科学院国家空间科学中心 | A kind of pulsar X-ray simulation source radiating coherence |
| CN109216149A (en) * | 2018-09-21 | 2019-01-15 | 合肥工业大学 | A kind of new spatial low energy ion energy spectrometer device based on electrostatic deflection |
| CN110308476A (en) * | 2019-07-31 | 2019-10-08 | 北京大学 | A kind of particle radiation detection method and detection device |
Family Cites Families (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP3386048B2 (en) * | 2000-12-14 | 2003-03-10 | 株式会社島津製作所 | Ion trap type mass spectrometer |
| US6867414B2 (en) * | 2002-09-24 | 2005-03-15 | Ciphergen Biosystems, Inc. | Electric sector time-of-flight mass spectrometer with adjustable ion optical elements |
| US7148472B2 (en) * | 2004-02-28 | 2006-12-12 | Ngx, Inc. | Aerosol mass spectrometer for operation in a high-duty mode and method of mass-spectrometry |
| US7838824B2 (en) * | 2007-05-01 | 2010-11-23 | Virgin Instruments Corporation | TOF-TOF with high resolution precursor selection and multiplexed MS-MS |
-
2019
- 2019-11-13 CN CN201911106108.8A patent/CN112799120B/en active Active
Patent Citations (38)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| DE2162808A1 (en) * | 1970-12-18 | 1972-07-06 | Du Pont | Energy analysis of charged particles |
| US4078301A (en) * | 1974-11-27 | 1978-03-14 | U.S. Philips Corporation | Method of manufacturing a deflection coil for a cathode ray tube |
| CN87103626A (en) * | 1986-05-19 | 1988-06-01 | Vg仪器集团有限公司 | Electron spectrometer |
| WO2004030025A1 (en) * | 2002-09-24 | 2004-04-08 | Ciphergen Biosystems, Inc. | Electric sector time-of-flight tandem mass spectrometer |
| CN101777481A (en) * | 2003-06-13 | 2010-07-14 | 艾克塞利斯技术公司 | hybrid magnetic/electrostatic deflector for ion implantation systems |
| CN1906728A (en) * | 2003-12-04 | 2007-01-31 | 日新意旺机械股份公司 | Ion beam apparatus |
| CN2788348Y (en) * | 2005-04-22 | 2006-06-14 | 北京中科信电子装备有限公司 | Scan deflexion device |
| CN102334180A (en) * | 2009-01-02 | 2012-01-25 | 瓦里安半导体设备公司 | Techniques for independently controlling deflection, deceleration, and focus of an ion beam |
| CN201655741U (en) * | 2009-12-29 | 2010-11-24 | 聚光科技(杭州)股份有限公司 | Device improving detection efficiency of 3D ion trap |
| CN201751976U (en) * | 2010-03-12 | 2011-02-23 | 中微半导体设备(上海)有限公司 | Processing device with plasma |
| JP2011228069A (en) * | 2010-04-16 | 2011-11-10 | Ulvac Japan Ltd | Time-of-flight secondary ion mass spectrometer using gas cluster ion beam |
| CN102298096A (en) * | 2010-06-25 | 2011-12-28 | 中国科学院电子学研究所 | Three-dimensional electric field sensor in air |
| CN103201821A (en) * | 2010-09-08 | 2013-07-10 | 株式会社岛津制作所 | Time-of-flight mass spectrometer |
| CN103262205A (en) * | 2010-12-14 | 2013-08-21 | 塞莫费雪科学（不来梅）有限公司 | Ion detection |
| CN102353971A (en) * | 2011-06-29 | 2012-02-15 | 中国科学院空间科学与应用研究中心 | Miniaturized low energy ion detector with low power consumption |
| CN104011832A (en) * | 2011-10-21 | 2014-08-27 | 株式会社岛津制作所 | Mass analyser, mass spectrometer and associated methods |
| CN102651301A (en) * | 2012-05-23 | 2012-08-29 | 复旦大学 | Mass spectrometer with linear ion storage and time-of-flight mass analyzer connected in series |
| CN103852780A (en) * | 2012-12-04 | 2014-06-11 | 中国科学院空间科学与应用研究中心 | Solar X-ray detector with wide field angle and high energy spectrum resolution |
| WO2014110699A1 (en) * | 2013-01-16 | 2014-07-24 | 中国科学院大连化学物理研究所 | Codirectional dual-channel time-of-flight mass spectrometer |
| CN103675883A (en) * | 2013-12-06 | 2014-03-26 | 中国科学院空间科学与应用研究中心 | Low-pollution spatial medium-energy electron detector based on magnetic deflection technique |
| CN103713306A (en) * | 2013-12-19 | 2014-04-09 | 中国科学院西安光学精密机械研究所 | Device for detecting micro channel plate dark counts |
| CN105277996A (en) * | 2014-07-21 | 2016-01-27 | 中国科学院空间科学与应用研究中心 | Spatial neutral atom imaging apparatus |
| CN105717377A (en) * | 2014-12-03 | 2016-06-29 | 中国科学院空间科学与应用研究中心 | Satellite difference potential measuring apparatus |
| CN105719942A (en) * | 2014-12-05 | 2016-06-29 | 中国科学院大连化学物理研究所 | High dynamic range detector for flight time mass spectrum |
| CN105738941A (en) * | 2014-12-12 | 2016-07-06 | 中国科学院空间科学与应用研究中心 | Space energy particle energy spectrum measurement device based on electrostatic deflection |
| CN105990089A (en) * | 2015-01-29 | 2016-10-05 | 中国科学院空间科学与应用研究中心 | Measurement device used for space ions and neutral atoms |
| CN105301088A (en) * | 2015-04-01 | 2016-02-03 | 中国原子能科学研究院 | Accelerator mass spectrometer with simultaneous isotope measurement function |
| CN106610501A (en) * | 2015-10-26 | 2017-05-03 | 中国科学院国家空间科学中心 | Compact push-broom geospace neutral atom observation device |
| CN108475616A (en) * | 2016-01-15 | 2018-08-31 | 株式会社岛津制作所 | Orthogonal acceleration time-of-flight type mass spectrometer |
| CN106568832A (en) * | 2016-10-31 | 2017-04-19 | 中国科学院国家空间科学中心 | Sensor apparatus for measuring energy and component of space thermal plasma |
| CN106700196A (en) * | 2016-11-11 | 2017-05-24 | 哈尔滨理工大学 | Nanocomposite material for inhibiting space charge by regulating and controlling micro scale structure through electric field |
| CN108089064A (en) * | 2016-11-21 | 2018-05-29 | 中国科学院大连化学物理研究所 | A kind of device and method for measuring pulsed ionizing beam pulse width |
| CN107359104A (en) * | 2017-06-14 | 2017-11-17 | 中国科学院地质与地球物理研究所 | A kind of magnetic substance spectralyzer couples conversion equipment with dual ion sources |
| CN108106670A (en) * | 2017-12-15 | 2018-06-01 | 北京卫星环境工程研究所 | Low Earth Orbit space environment and the integrated detection system of effect |
| CN108538699A (en) * | 2018-05-14 | 2018-09-14 | 北京卫星环境工程研究所 | Mass spectrum-high-rise neutral atmosphere the detection device of power spectrum integration |
| CN109192642A (en) * | 2018-08-30 | 2019-01-11 | 中国科学院国家空间科学中心 | A kind of pulsar X-ray simulation source radiating coherence |
| CN109216149A (en) * | 2018-09-21 | 2019-01-15 | 合肥工业大学 | A kind of new spatial low energy ion energy spectrometer device based on electrostatic deflection |
| CN110308476A (en) * | 2019-07-31 | 2019-10-08 | 北京大学 | A kind of particle radiation detection method and detection device |
Non-Patent Citations (4)
| Title |
|---|
| A simulation analysis of systematic errors in ion arrival angle and drift velocity from the satellite borne ion drift meter;Yubo Feng et al.;Advances in Space Research;第1958-1964页 * |
| SMILE卫星低能离子分析仪的设计与仿真;苏斌;孔令高;张爱兵;;宇航学报(第03期);第347-354页 * |
| 一种2π视场高分辨热等离子体分析仪设计与仿真;苏斌 等;《宇航学报》;第40卷(第5期);第604-610页 * |
| 二次电子发射特性测量装置的研究与进展;苗光辉;崔万照;杨晶;张恒;;空间电子技术(第01期);第25-32页 * |
Also Published As
| Publication number | Publication date |
|---|---|
| CN112799120A (en) | 2021-05-14 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| CN105990089B (en) | A kind of measurement apparatus for space ion and neutral atom | |
| McComas et al. | Interstellar mapping and acceleration probe (IMAP): A new NASA mission | |
| EP2301062B1 (en) | Detection of positive and negative ions | |
| CN112799120B (en) | Dual-channel electrostatic analyzer for synchronous measurement of ions and electrons | |
| US9070542B2 (en) | Selective ionization using high frequency filtering of reactive ions | |
| CN111487483B (en) | Compact type space charged particle detector structure based on microchannel plate | |
| US9006678B2 (en) | Non-radioactive ion source using high energy electrons | |
| US5401965A (en) | Secondary ion mass spectrometer for analyzing positive and negative ions | |
| JP2021061226A (en) | Inorganic mass analyzer | |
| CN109950127A (en) | A kind of electric spray ion source auxiliary enhancement device | |
| US20180082829A1 (en) | Retarding potential type energy analyzer | |
| CN103123325B (en) | High-resolution electron energy loss spectrometer for energy and momentum two-dimensional analyses | |
| US20230411134A1 (en) | Tapered magnetic ion transport tunnel for particle collection | |
| CN103311087A (en) | Ion deflection transmission system | |
| CN117074804A (en) | Space charged particle and neutral particle integrated detection device | |
| WO2015085651A1 (en) | Quadrupole rod mass analysis device for bidirectional introduction and transmission of ions | |
| CN210897194U (en) | Ion signal detection device for time-of-flight mass spectrometer | |
| WO1998036268A1 (en) | Charged particle analysis | |
| CN116953761A (en) | Multilayer nested electrostatic analyzer | |
| Su et al. | The bipolar charge plasma spectrometer (BCPS) based on the 2π-field-of-view double-channel electrostatic analyzer | |
| Desai et al. | An integrated time-of-flight versus residual energy subsystem for a compact dual ion composition experiment for space plasmas | |
| Long et al. | High spatial resolution and high brightness ion beam probe for in-situ elemental and isotopic analysis | |
| CN214374478U (en) | Ion signal detection device for sector magnetic field mass spectrometer | |
| CN110911264A (en) | Ion signal detection device and method for time-of-flight mass spectrometer | |
| Korth et al. | The heavy ion analyser PICCA for the comet Halley fly-by with Giotto |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| PB01 | Publication | ||
| PB01 | Publication | ||
| SE01 | Entry into force of request for substantive examination | ||
| SE01 | Entry into force of request for substantive examination | ||
| GR01 | Patent grant | ||
| GR01 | Patent grant |