CN103311087A - Ion deflection transmission system - Google Patents
Ion deflection transmission system Download PDFInfo
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- CN103311087A CN103311087A CN2013101810957A CN201310181095A CN103311087A CN 103311087 A CN103311087 A CN 103311087A CN 2013101810957 A CN2013101810957 A CN 2013101810957A CN 201310181095 A CN201310181095 A CN 201310181095A CN 103311087 A CN103311087 A CN 103311087A
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Abstract
The invention belongs to the field of a mass spectrometry technology, and particularly relates to an ion deflection transmission system used in a mass spectrum instrument. The system comprises an ion focusing lens group and an ion deflection lens group. The ion focusing lens group is used for enabling ions passing through the ion focusing lens group to be focused in space and enter in the ion deflection lens group. Certain direct current voltage is applied on all electrodes of the ion deflection lens group to form a specific electric field, so that the ions can deflect by about 90 degrees. Uncharged photons and neutral molecules are not affected by electric field force, thus continuing rectilinear propagation. The ion deflection transmission system can achieve effects of eliminating the interference of photons and neutral molecules in mass spectrum analysis and improving the signal-to-noise ratio of the instrument.
Description
Technical field
The invention belongs to technical field of analytical instruments, be specifically related to a kind of ion deflecting transmission system.
Background technology
Inductivity coupled plasma mass spectrometry technology (ICP-MS) is a kind of new analysis and detection technology that 20 century 70s grow up, its principle is to utilize inductively coupled plasma that the element in the sample is gasificated as charged ion, the ion transfer that will be produced by inductively coupled plasma by the ion transfer system is in mass analyzer, by different mass-to-charge ratioes separately, can learn the element that contains in the sample according to analysis result again.Compare with other analytical technologies, ICP-MS has that detection limit is low, and the range of linearity is wide, fast detecting and detect simultaneously the advantages such as multiple element.Its range of application is also more and more wider.
Inductivity coupled plasma mass spectrometry technology (ICP-MS) mainly contains the formations such as inductively coupled plasma ion source, ion transfer system, mass analyzer.The ion transfer system has played the effect that connects ion source and mass analyzer, and its performance has directly determined the important indicators such as the sensitivity of ICP-MS and detectability.
In ICP-MS, the particle that the inductively coupled plasma ion source produces comprises: electronegative electronics, the ion of uncharged photon and neutral particle and positively charged.The ion transfer system not only bears the function of transmission ion, also undertakes the effect that electronics, photon and other neutral molecule disturb of getting rid of simultaneously.In the electric field that each electrode of ion transfer system forms, the ion of positively charged can deflect under the effect of electric field; Electronics is electronegative, will can not be detected with the ion isolation of positively charged in communication process; Photon and neutral molecule are not charged, can only prolong straightline propagation, can collide on the vacuum cavity inwall, are taken away by vacuum pump.So finally can be transferred to the ion that only has positively charged of mass analyzer.
There is the design of oneself in the ion transfer system that uses in the main product of ICP-MS at present, although different, can both realize utilizing the purpose of electric deflection ion.Ion-optic system integral body mainly contains photon Flapper type and 90 degree deflection types.
The photon Flapper type is to place the sheet metal that a positively charged is pressed in the middle of ion lens is coaxial, and the ion of positively charged can be walked around the photon baffle plate and again converge, and electronics, photon and neutral molecule are all stopped to get off by baffle plate, are taken away by vacuum pump afterwards.This structure has been avoided electronics, photon and the neutral molecule in the ICP plasma to enter detector causing interference, but the losses of ions of positively charged is also very large, finally affects signal strength signal intensity.
90 degree deflector types are by electric field deflected ion beam 90 to be spent, and photon and neutral molecule then continue along straightline propagation, collide the vacuum cavity inwall, are taken away by vacuum pump at last.
Summary of the invention
The object of the invention is to propose a kind of ion deflecting 90 degree can transmission, thereby eliminate the interference of photon and neutral molecule, improve the ion deflecting transmission system of detection signal signal to noise ratio,
Ion deflecting transmission system provided by the invention comprises focus lens group and deflection lens group.Described focus lens group be used for to focus on and the transmission ion, and it is comprised of plane or the tubular electrode of a plurality of (for example two, three, four, or more) center drilling.When plane electrode or tubular electrode apply suitable gradient voltage, (for example applying respectively in the accompanying drawings the direct voltage of 70v, 80v, 70v on three plate electrodes of focus lens group 101), can be with the Electric Field Distribution of ion focusing to produce, realize the focusing of ion, and transmission enters the ion deflecting set of lenses.
Described deflection lens group is made of multi-disc (for example two, three, four, or more multi-disc) deflecting electrode, and deflecting electrode adopts electric conducting material, or at the material of semiconductor or insulating material surface gold-plating; Focus lens group and deflection lens group remain on the same center line in the horizontal direction.Each plate electrode in the deflection lens group applies one group of direct voltage (for example applying respectively 65v, 81v and one group of direct voltage of 81v on three plate electrodes in the accompanying drawings), with the specific electric field that forms, makes ion that 90 deflections about spending occur in this electric field.
Among the present invention, the deflecting electrode of described deflection lens group is not subjected to the restriction of shape, size and manufactured materials kind, so long as guarantee that by applying direct voltage ion can deflection.Shape can be the plane, the face of cylinder, anchor ring and other curved surfaces.But manufactured materials can be the material of the surface metal-coated membranes such as material, semi-conducting material and pottery, printed substrate, the macromolecular material of various conductions.
Ion deflecting transmission system of the present invention can be combined with electric spray ion source, also can be combined with various ion sources such as electric bombarding ion source, Atmosphere Pressure Chemical Ionization (APCI), dielectric barrier discharge, fast atom bombardment sources.
Ion deflecting transmission system of the present invention, can be combined with multiple mass analyzer, mass analyzer can be ion strap mass analyzer, also can be quadrupole rod mass analyzer, time of flight mass analyzer, magnetic substance spectralyzer, Fourier transform analyzer, track ion strap mass analyzer etc.
Beneficial effect of the present invention is: can effectively eliminate the interference of photon and neutral molecule, ion is entered in the mass analyzer of next stage through overshoot; Also can be combined with the quadrupole rod mass analyzer, filtering out needs the object ion of research to be transferred in the mass analyzer of next stage, is convenient to further study.
Description of drawings
Fig. 1 is the structural representation of ion deflecting transmission system.
Fig. 2 is the generalized section of deflection lens group section structure.
Fig. 3 is as a result figure of the theoretical modeling of ion deflecting transmission system when doing deflection.
Fig. 4 is the ion deflecting transmission system structure chart under a kind of concrete structure size.
Fig. 5 is the example schematic that the ion deflecting transmission system is used.
Number in the figure: 101-quadrupole rod; The 102-focus lens group; 103-deflection lens group; The 104-detector; The 105-ion strap mass analyzer.201-deflection lens 1; 202-deflection lens 2; 203-deflection lens 3.301-condenser lens 1; 302-condenser lens 2; 303-condenser lens 3; 304-deflection lens 1; 305-deflection lens 2; 306-deflection lens 3.401-condenser lens 1; 402-condenser lens 2; 403-condenser lens 3; 404-deflection lens 1; 405-deflection lens 2; 406-deflection lens 3.
Embodiment
The invention will be further described below in conjunction with drawings and Examples.
Fig. 1 is the ion deflecting transmission system, can realize ion focusing spatially from the ion that ion source produces through focus lens group.When each plate electrode of deflection lens group applies suitable voltage, when applying respectively the direct voltage of 70v, 80v, 70v on deflection lens group three plate electrodes, the deflections of 90 degree can occur in ion.If connect an ion strap mass analyzer at deflection lens group next stage, ion will enter in the ion strap mass analyzer.In ion trap, after supercooling, storage and quality analysis, eject from the Ion Extraction groove, be detected by the detector, and finally be converted into mass signal.By applying specific voltage in the deflection lens group, the charged ion of coming from ion source is deflected enter the next stage mass analyzer.Photon and neutral molecule continue along straightline propagation, can't enter into the mass analyzer of next stage.
Fig. 2 is a kind of example stereogram of deflection lens group structure.The deflection lens group is comprised of three deflecting electrodes, wherein, one plate electrode 201 is that the circular arc plate transition by two less orthogonal flat boards and 1/4th connects and composes, form 90 degree crooked, other two plate electrodes 202 and 203 are plate electrode, these two plate electrodes are mutually vertical, and respectively with less dull and stereotyped parallel of two of electrode 201.Although provided a kind of structure chart of deflection lens group among the figure, specifically a variety of different structures can have been arranged.
Fig. 3 be under the theoretical modeling focus lens group and deflection lens group to the deflection design sketch of ion.The dc voltage value that applies on three plate electrodes of focus lens group is respectively 70v, 80v and 70v; The dc voltage value that applies on three plate electrodes of deflection lens group is respectively 65v, 81v and 81v.
Fig. 4 is the ion deflecting transmission system example under a kind of concrete structure size.Three plate electrodes of focus lens group all are to be 0.5mm by thickness, and center-hole diameter 4.0mm, diameter are that the disk of 10.0mm forms; Distance is 2.5mm between the adjacent disk.The deflection lens group is comprised of three deflecting electrodes, wherein the first electrode is that cylinder by two less flat boards and one 1/4th constitutes, the second plate electrode is the plate electrode of a horizontal positioned, the 3rd cube electrode is a plate electrode of vertically placing, the distance of the first cube electrode and the second cube electrode in the vertical direction is 4.0mm, the first cube electrode and the 3rd cube electrode distance in the horizontal direction are 4.0mm, and the distance of the second cube electrode and the 3rd cube electrode in the vertical direction is 4.0mm; Distance in the horizontal direction between focus lens group and the deflection lens group is 5.5mm.
Fig. 5 is an example with the application as a whole of ion deflecting transmission system.The structure that comprises has: ion source; The sample introduction taper hole; The guiding quadrupole rod; The quadrupole rod mass analyzer; Focus lens group; The deflection lens group; Ion detector; Mass analyzer etc.Sample ions from ion source ionization produces by the sample introduction taper hole, enters ion guides.Focusing and guide function through ion guides enter the quadrupole rod mass analyzer.Screening through the quadrupole rod mass analyzer can make specific ion enter focus lens group, realizes the focusing of ion.At this moment, if do not apply voltage on the deflection lens group, this ion can be detected by detector 1 along rectilinear flight in the deflection lens group, in this case, can utilize testing result to judge whether this ion is exactly the object ion that we need to obtain.If this ion is the ion that we need, can apply specific voltage in the deflection lens group, then this ion can turn 90 degrees the arrival ion strap mass analyzer partially under the effect of deflection lens, stores in ion trap.
Claims (3)
1. an ion deflecting transmission system is characterized in that: comprise ion focusing set of lenses and ion deflecting set of lenses; Described focus lens group is used for focusing on and the transmission ion, it is comprised of plane or the tubular electrode of a plurality of center drillings, when plane electrode or tubular electrode apply suitable gradient voltage, can be with the Electric Field Distribution of ion focusing to produce, realize the focusing of ion, and transmission enters the ion deflecting set of lenses;
Described deflection lens group is made of the multi-disc deflecting electrode, and deflecting electrode adopts electric conducting material, or at the material of semiconductor or insulating material surface gold-plating; Focus lens group and deflection lens group remain on the same center line in the horizontal direction; Each plate electrode in the deflection lens group applies one group of direct voltage, to form specific electric field, makes ion that 90 deflections about spending occur in this electric field.
2. ion deflecting transmission system according to claim 1, it is characterized in that: the deflecting electrode shape of described deflection lens group is the plane, the face of cylinder, anchor ring, or other curved surfaces.
3. ion deflecting transmission system according to claim 1, it is characterized in that: described deflection lens group is comprised of three deflecting electrodes, wherein, first electrode (201) is connected and composed by two less orthogonal flat boards and one 's 1/4th circular arc plate transition, form 90 degree crooked, other two plate electrodes (202,203) are plate electrode, and these two plate electrodes are mutually vertical, and respectively with first electrode (201) in two less dull and stereotyped parallel.
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| Application Number | Priority Date | Filing Date | Title |
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| CN2013101810957A CN103311087A (en) | 2013-05-16 | 2013-05-16 | Ion deflection transmission system |
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| Application Number | Priority Date | Filing Date | Title |
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| CN2013101810957A CN103311087A (en) | 2013-05-16 | 2013-05-16 | Ion deflection transmission system |
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| CN103311087A true CN103311087A (en) | 2013-09-18 |
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Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN104678038A (en) * | 2015-01-08 | 2015-06-03 | 聚光科技(杭州)股份有限公司 | Gas chromatograph-mass spectrometer with double ion sources |
| US9558924B2 (en) | 2014-12-09 | 2017-01-31 | Morpho Detection, Llc | Systems for separating ions and neutrals and methods of operating the same |
| CN112863997A (en) * | 2020-12-31 | 2021-05-28 | 杭州谱育科技发展有限公司 | ICP-MS with particle elimination function |
Citations (5)
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| US5559337A (en) * | 1993-09-10 | 1996-09-24 | Seiko Instruments Inc. | Plasma ion source mass analyzing apparatus |
| US5572022A (en) * | 1995-03-03 | 1996-11-05 | Finnigan Corporation | Method and apparatus of increasing dynamic range and sensitivity of a mass spectrometer |
| JPH10302709A (en) * | 1997-04-28 | 1998-11-13 | Jeol Ltd | Ion introducing device |
| CN1906728A (en) * | 2003-12-04 | 2007-01-31 | 日新意旺机械股份公司 | Ion beam apparatus |
| CN101669027A (en) * | 2007-05-09 | 2010-03-10 | 株式会社岛津制作所 | Charged particle analyzer |
-
2013
- 2013-05-16 CN CN2013101810957A patent/CN103311087A/en active Pending
Patent Citations (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US5559337A (en) * | 1993-09-10 | 1996-09-24 | Seiko Instruments Inc. | Plasma ion source mass analyzing apparatus |
| US5572022A (en) * | 1995-03-03 | 1996-11-05 | Finnigan Corporation | Method and apparatus of increasing dynamic range and sensitivity of a mass spectrometer |
| JPH10302709A (en) * | 1997-04-28 | 1998-11-13 | Jeol Ltd | Ion introducing device |
| CN1906728A (en) * | 2003-12-04 | 2007-01-31 | 日新意旺机械股份公司 | Ion beam apparatus |
| CN101669027A (en) * | 2007-05-09 | 2010-03-10 | 株式会社岛津制作所 | Charged particle analyzer |
Cited By (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US9558924B2 (en) | 2014-12-09 | 2017-01-31 | Morpho Detection, Llc | Systems for separating ions and neutrals and methods of operating the same |
| US10141173B2 (en) | 2014-12-09 | 2018-11-27 | Rapiscan Systems, Inc. | Systems for separating ions and neutrals and methods of operating the same |
| CN104678038A (en) * | 2015-01-08 | 2015-06-03 | 聚光科技(杭州)股份有限公司 | Gas chromatograph-mass spectrometer with double ion sources |
| CN112863997A (en) * | 2020-12-31 | 2021-05-28 | 杭州谱育科技发展有限公司 | ICP-MS with particle elimination function |
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Application publication date: 20130918 |