CN112698057A - Conduction device for electrical property test - Google Patents
Conduction device for electrical property test Download PDFInfo
- Publication number
- CN112698057A CN112698057A CN201911011982.3A CN201911011982A CN112698057A CN 112698057 A CN112698057 A CN 112698057A CN 201911011982 A CN201911011982 A CN 201911011982A CN 112698057 A CN112698057 A CN 112698057A
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- Prior art keywords
- conductive
- conversion unit
- test
- electrical testing
- axial direction
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- 238000012360 testing method Methods 0.000 title claims abstract description 82
- 238000006243 chemical reaction Methods 0.000 claims abstract description 31
- 239000000758 substrate Substances 0.000 claims abstract description 20
- 238000005452 bending Methods 0.000 claims description 8
- 238000009434 installation Methods 0.000 claims description 6
- 239000002184 metal Substances 0.000 claims description 4
- 238000000034 method Methods 0.000 claims 1
- 230000000694 effects Effects 0.000 abstract description 5
- 239000000523 sample Substances 0.000 description 5
- 238000010586 diagram Methods 0.000 description 4
- 230000009286 beneficial effect Effects 0.000 description 2
- 230000000149 penetrating effect Effects 0.000 description 2
- 238000006073 displacement reaction Methods 0.000 description 1
- 238000004519 manufacturing process Methods 0.000 description 1
- 238000007790 scraping Methods 0.000 description 1
- 230000001131 transforming effect Effects 0.000 description 1
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Classifications
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/04—Housings; Supporting members; Arrangements of terminals
- G01R1/0408—Test fixtures or contact fields; Connectors or connecting adaptors; Test clips; Test sockets
- G01R1/0416—Connectors, terminals
Abstract
A conduction device for electrical test is suitable for connecting a driving module with a plurality of contacts to execute the electrical test, and comprises a test unit and a conversion unit connected with the test unit. The test unit comprises a plurality of substrates extending along a first axial direction and a plurality of conducting pieces which are arranged between the adjacent substrates and arranged at intervals and extend outwards. The conversion unit is connected to the conductive piece and used for adjusting the position relation that the conductive piece is electrically conducted to the contact, and the conversion unit comprises a plurality of switching points which are positioned on the opposite side of the conductive piece and respectively correspond to the contact. Through the conversion effect of the conversion unit, the conduction device for the electrical test can be directly suitable for the distribution and the relative position of the contact by matching with the driving module.
Description
Technical Field
The present invention relates to electrical testing devices, and more particularly to a conductive device for electrical testing.
Background
Referring to fig. 1, a conventional electrical testing apparatus 9 is adapted to test an electronic device 900, such as an integrated circuit, a wafer, etc., and includes a base 91 made of metal and a plurality of spring probes 92 disposed in the base 91. Electrical connections are made to the electronic component 900 through the spring probes 92 for performing various tests.
In recent years, the high-tech industry has been developed rapidly, and with the increasing demands of the related industries, the devices to be tested have naturally become more precise and more complex, and the types thereof are also diversified. If the electrical testing apparatus 9 is used to perform testing, the spring probes 92 are axially arranged in parallel at intervals, and the intervals D between the opposite ends of the adjacent spring probes 92 are the same, so that when the electrical contacts are adapted to electrical contacts with various positions and distribution patterns, the positions and the distribution of the spring probes 92 need to be redesigned according to various different components to be tested, which consumes huge design and manufacturing costs, and the specialized electrical testing apparatus 9 cannot be adapted to other types of components to be tested.
Disclosure of Invention
The invention aims to provide a conducting device for electrical test, which can be freely adjusted according to test requirements so as to correspond to the distribution of the distance and the position of each contact. The conduction device for electrical test is suitable for connecting a driving module with a plurality of contacts to execute electrical test, and comprises a test unit and a conversion unit connected with the test unit.
The test unit comprises a plurality of substrates and a plurality of conductive pieces. Each substrate extends along a first axial direction and is provided with two end faces positioned at two opposite ends in the first axial direction and two surfaces respectively jointed with two opposite sides of the end faces, the substrates are arranged at intervals in the direction that the surfaces are parallel to each other, and an installation space is defined by every two adjacent substrates at intervals. The conductive pieces extend from the installation space along a second axial direction perpendicular to the first axial direction and are arranged at intervals along the first axial direction.
The conversion unit is connected to the conductive piece of the test unit and used for adjusting the position relation that the conductive piece is electrically conducted to the contact, and the conversion unit comprises a plurality of switching points which are located on the opposite side of the conductive piece and respectively correspond to the contact.
The object of the present invention and the technical problems solved thereby can be further achieved by the following technical measures.
Preferably, in the conduction device for electrical testing, each of the conductive members has a contact end far away from the conversion unit, the conversion unit further includes a plurality of adjustment members integrally connected to the conductive members, the switching points are respectively located at an end of the adjustment member opposite to the contact ends, and a distance between the contact ends of at least two adjacent conductive members is different from a distance between the corresponding switching points. Preferably, in the conducting device for electrical testing, each of the transfer points of the converting unit is a hemispherical metal element.
Preferably, each adjusting member of the converting unit has a bending portion bending and extending along the second axial direction in a direction opposite to the conductive member.
Preferably, in the conduction device for electrical testing, the conversion unit further includes a plurality of connecting members respectively integrally connected to the conductive members, and a connection board for the connecting members to be inserted and connected to the driving module, and the connection point is located on the connecting member.
Preferably, each of the connectors of the converting unit has two extending sections spaced apart from each other along the first axial direction and capable of deforming in a direction toward each other.
Preferably, each of the substrates has a hole centrally located along the first axial direction and penetrating the surface, and the test unit further includes a plurality of conductive members respectively disposed in the holes and electrically connected to each other.
Preferably, each conductive member of the testing unit has an elastic portion extending in an arc shape along the second axial direction and inclining toward the hole.
Preferably, the test unit further includes a plurality of electrical connectors mounted at two opposite ends of each mounting space and flush with the end surfaces of the substrate respectively. The invention has the beneficial effects that: the testing unit and the conversion unit can be designed by respectively matching with the electronic element to be tested and the driving module, so that when the conversion unit is connected to the testing unit, the conversion effect can be adjusted according to the distance and the distribution position of the contact points, and the electrical connection relation formed between the conductive piece and the switching point can be suitable for the electrical testing requirement of the electronic element to be tested.
Drawings
FIG. 1 is a cross-sectional view illustrating a conventional electrical testing apparatus;
FIG. 2 is an exploded perspective view illustrating a first embodiment of the conductive device for electrical testing of the present invention;
FIG. 3 is a partially enlarged side view illustrating a test unit and a converting unit of the first embodiment;
FIG. 4 is a top view illustrating the plurality of conductive members of the test unit in conjunction with FIG. 3;
FIG. 5 is a diagram illustrating the conversion effect of the conversion unit;
FIG. 6 is a diagram illustrating a case where a test is performed using the first embodiment;
FIG. 7 is an enlarged, fragmentary, side view similar to FIG. 3, illustrating a second embodiment of the conductive device for electrical testing of the present invention;
FIG. 8 is a diagram similar to FIG. 5 illustrating the conversion effect of the conversion unit of the second embodiment;
FIG. 9 is an exploded side view of a third embodiment of the conductive device for electrical testing of the present invention;
FIG. 10 is an exploded side view of a fourth embodiment of the conductive device for electrical testing of the present invention;
fig. 11 is a side view illustrating the conversion unit of the fourth embodiment; and
fig. 12 is a diagram illustrating a case where a test is performed using the fourth embodiment.
Detailed Description
The invention is described in detail below with reference to the following figures and examples:
referring to fig. 2, 3 and 4, a first embodiment of the conduction apparatus for electrical testing according to the present invention is adapted to be connected to a driving module 1 having a plurality of contacts 11 to perform electrical testing, and includes a testing unit 2 and a transforming unit 3 connected to the testing unit 2.
The test unit 2 includes a plurality of substrates 21, a plurality of conductive members 22, a plurality of electrical connectors 23, and a plurality of conductive members 24. It should be noted that the testing unit 2 can select a proper number of the substrates 21 to form a specific type of carrier substrate according to the testing requirement or the type of the device to be tested, and form a testing circuit according to the device to be tested by configuring the conductive members 22, the electrical connection members 23, and the conductive members 24. The following description is only about some representative embodiments, and is not intended to limit the modular test circuit that the test unit 2 can constitute.
Each base plate 21 extends along a first axial direction X1, and has two end surfaces 211 at two opposite ends in the first axial direction X1, two surfaces 212 respectively engaging two opposite sides of the end surfaces 211, and a hole 219 centrally located along the first axial direction X1 and penetrating through the surfaces 212. The substrates 21 are arranged at intervals in a direction in which the surfaces 212 are parallel to each other, and an installation space 200 is defined by every two adjacent substrates 21 at intervals. The conductive members 22 extend from the mounting space 200 along a second axial direction X2 perpendicular to the first axial direction X1 and are spaced along the first axial direction X1. In the first embodiment, the conductive elements 24 are respectively disposed in the holes 219 and electrically connected to each other, and the electrical connection elements 23 are mounted at two opposite ends of each mounting space 200 and are respectively flush with the end surface 211 of the substrate 21.
The conversion unit 3 is connected to the conductive member 22 of the testing unit 2 and is configured to adjust a positional relationship that the conductive member 22 is electrically conducted to the contact 11, and the conversion unit 3 includes a plurality of adjusting members 31 integrally connected to the conductive member 22, and a plurality of switching points 39 located on opposite sides of the conductive member 22 and corresponding to the contact 11. Each switching point 39 of the conversion unit 3 is a metal element having a hemispherical shape.
Referring to fig. 5 in conjunction with fig. 3, each conductive member 22 has an elastic portion 221 extending along the second axial direction X2 in an arc shape and inclined in a direction toward the hole 219, and a contact end P away from the converting unit 3. The switching points 39 are respectively located at one end of the adjusting member 31 opposite to the contact end P, and a distance L1 between the contact ends P of at least two adjacent conductive members 22 is different from a distance L2 between the corresponding switching points 39. That is, in order to adapt to a device under test with a complicated circuit configuration and distribution of electrical connection points, the distance L1 between the contact ends P of the elastic part 221 can be smaller than the distance L2 between the connection points 39 by the bending shape of the adjusting part 31 of the converting unit 3, so that different adjustments of the distance L2 between the adjacent elastic part 221 and the adjacent connection point 39, that is, displacement in the distance of the electrical connection points, can be achieved, which is beneficial to matching with diversified device under test designs, thereby improving the versatility of the first embodiment.
Referring to fig. 6 and fig. 5, when the first embodiment is used, the conductive member 22 of the testing unit 2 can be matched with the device 81 to be tested to form a required electrical connection, and the bending shape of the adjusting member 31 of the converting unit 3 can ensure that the switching point 39 connected to the adjusting member 31 is indeed connected with the contact 11 of the driving module 1, so that the driving module 1 can drive an electrical test to perform the electrical test on the device 81 to be tested.
Referring to fig. 7 and 8, a second embodiment of the conducting device for electrical testing according to the present invention is shown, wherein the difference between the second embodiment and the first embodiment is: each adjusting member 31 of the converting unit 3 has a bending portion 311 extending along the second axial direction X2 in a direction opposite to the conductive member 22. That is, the bending portion 311 of the adjusting member 31 can be bent to have elasticity, and can generate a contact effect like a pogo pin, so as to perform electrical tests such as scraping, pressing and the like in different types of contact modes. As shown in fig. 8, the bending pattern of the adjusting member 31 also allows the distance L1 between the contact ends P and the distance L2 between the transfer points 39 to be shifted, thereby achieving adjustment according to the test requirements.
Referring to fig. 9, a third embodiment of the conducting device for electrical testing according to the present invention is shown, wherein the difference between the third embodiment and the first embodiment is: the conversion unit 3 further includes a plurality of straight rod-shaped connecting members 32 integrally connected to the conductive members 22, and a switching board 33 for connecting the connecting members 32, and adapted to be connected to the driving module 1, wherein the switching point 39 is located on the connecting members 32. The adapter plate 33 can modularly design an internal circuit, and through the connection of the connecting member 32, the adjustment of the correspondence can be formed corresponding to the driving module 1, thereby improving the versatility of the third embodiment.
Referring to fig. 10 and 11, a fourth embodiment of a conducting device for electrical testing according to the present invention is shown, wherein the difference between the fourth embodiment and the third embodiment is: each connecting element 32 of the conversion unit 3 has two extensions 321 spaced apart from each other along the first axial direction X1 and capable of being deformed in a direction towards each other. Due to the property that the extension segments 321 can deform toward each other, the adapter plate 33 can be connected in a direct plug-in connection and can be positioned by the elastic restoring force of the extension segments 321. A plurality of electrical contacts 331 capable of electrically connecting with other devices may be designed on the adaptor board 33, and when the testing unit 2 is indeed connected to the adaptor board 33 of the converting unit 3, it can be indeed connected to the driving module 1 through the converting unit 3 as shown in fig. 12, so as to perform an electrical test on the device 81 to be tested through an electrical path formed by the testing unit 2 and the converting unit 3.
Claims (9)
1. A conduction device for electrical test is suitable for connecting a driving module with a plurality of contacts to execute the electrical test; the method is characterized in that: the conducting device for electrical testing comprises:
a test unit comprising
Multiple substrates each extending along the first axial direction and having two
End faces at opposite ends in the first axial direction, and two engaging portions
Surfaces of the two opposite sides of the end face, with which the substrates are connected to each other
The substrates are arranged in parallel at intervals, and every two adjacent substrates are defined at intervals
An installation space, and
a plurality of conductive members extending from the installation space in a direction perpendicular to the first axis
A second axial extension and spaced along the first axial extension; and
the conversion unit is connected to the conductive piece of the test unit and used for adjusting the position relation that the conductive piece is electrically conducted on the contact, and the conversion unit comprises a plurality of switching points which are positioned on the opposite side of the conductive piece and respectively correspond to the contact.
2. The conductive apparatus for electrical testing of claim 1, wherein: each conducting piece is provided with a contact end far away from the conversion unit, the conversion unit further comprises a plurality of adjusting pieces which are respectively and integrally connected with the conducting pieces, the switching points are respectively positioned at one ends of the adjusting pieces opposite to the contact ends, and the distance between the contact ends of at least two adjacent conducting pieces is different from the distance between the corresponding switching points.
3. The conductive apparatus for electrical testing of claim 1, wherein: each switching point of the switching unit is a hemispherical metal element.
4. The conductive apparatus for electrical testing of claim 1, wherein: each adjusting piece of the conversion unit is provided with a bending part which is bent and extended along the second axial direction in a direction opposite to the conductive piece.
5. The conductive apparatus for electrical testing of claim 1, wherein: the conversion unit further comprises a plurality of connecting pieces which are respectively and integrally connected with the conductive pieces, and a switching board which is used for the connection of the connecting pieces and is suitable for being connected with the driving module, and the switching point is positioned on the connecting pieces.
6. The conductive apparatus for electrical testing of claim 1, wherein: each connecting piece of the conversion unit is provided with two extension sections which are mutually spaced along the first axial direction and can generate deformation in the direction towards each other.
7. The conductive apparatus for electrical testing of claim 1, wherein: each substrate is provided with a hole which is positioned at the center along the first axial direction and penetrates through the surface, and the test unit further comprises a plurality of conducting pieces which are respectively arranged in the holes and are electrically connected with each other.
8. The conductive apparatus for electrical testing of claim 1, wherein: each conductive piece of the test unit is provided with an elastic part which inclines towards the hole along the second axial direction and extends in an arc shape.
9. The conductive apparatus for electrical testing of claim 1, wherein: the test unit further comprises a plurality of electric connectors which are arranged at two opposite ends of each installation space and are respectively flush with the end faces of the substrates.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201911011982.3A CN112698057A (en) | 2019-10-23 | 2019-10-23 | Conduction device for electrical property test |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201911011982.3A CN112698057A (en) | 2019-10-23 | 2019-10-23 | Conduction device for electrical property test |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN112698057A true CN112698057A (en) | 2021-04-23 |
Family
ID=75505021
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201911011982.3A Pending CN112698057A (en) | 2019-10-23 | 2019-10-23 | Conduction device for electrical property test |
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| Country | Link |
|---|---|
| CN (1) | CN112698057A (en) |
Citations (7)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US20050221633A1 (en) * | 2004-03-30 | 2005-10-06 | Wildes Douglas G | High-density connection between multiple circuit boards |
| TW200834779A (en) * | 2007-01-29 | 2008-08-16 | Advantest Corp | Testing apparatus and probe card |
| TW200841026A (en) * | 2007-04-12 | 2008-10-16 | Advanced Semiconductor Eng | A detecting device |
| CN203930724U (en) * | 2013-11-19 | 2014-11-05 | 恒颢科技股份有限公司 | Touch substrate and test probe |
| CN109557444A (en) * | 2017-09-26 | 2019-04-02 | 颖崴科技股份有限公司 | The test method of wafer scale electronic building brick |
| TWI668451B (en) * | 2018-06-25 | 2019-08-11 | 高天星 | Conduction device |
| CN110325866A (en) * | 2017-02-24 | 2019-10-11 | 泰克诺探头公司 | Vertrical probe measuring head with improved frequency performance |
-
2019
- 2019-10-23 CN CN201911011982.3A patent/CN112698057A/en active Pending
Patent Citations (7)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US20050221633A1 (en) * | 2004-03-30 | 2005-10-06 | Wildes Douglas G | High-density connection between multiple circuit boards |
| TW200834779A (en) * | 2007-01-29 | 2008-08-16 | Advantest Corp | Testing apparatus and probe card |
| TW200841026A (en) * | 2007-04-12 | 2008-10-16 | Advanced Semiconductor Eng | A detecting device |
| CN203930724U (en) * | 2013-11-19 | 2014-11-05 | 恒颢科技股份有限公司 | Touch substrate and test probe |
| CN110325866A (en) * | 2017-02-24 | 2019-10-11 | 泰克诺探头公司 | Vertrical probe measuring head with improved frequency performance |
| CN109557444A (en) * | 2017-09-26 | 2019-04-02 | 颖崴科技股份有限公司 | The test method of wafer scale electronic building brick |
| TWI668451B (en) * | 2018-06-25 | 2019-08-11 | 高天星 | Conduction device |
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