TWI732288B - Conduction device for electrical testing - Google Patents

Abstract

A conduction device for electrical testing is suitable for connecting a drive module with multiple contacts to perform electrical testing, and includes a testing unit and a conversion unit connected to the testing unit. The test unit includes a plurality of substrates extending along a first axis, and a plurality of conductive elements arranged between adjacent substrates and extending outwardly. The conversion unit is connected to the conductive parts and is used to adjust the positional relationship of the conductive parts electrically connected to the contacts. The conversion unit includes a plurality of positions on the opposite sides of the conductive parts and corresponding to the contacts respectively. Point of transfer point. Through the conversion effect of the conversion unit, the drive module can be matched to make the conduction device of the electrical test directly applicable to the distribution and relative positions of the contacts.

Description

Conduction device for electrical testing

The invention relates to an electrical testing equipment, in particular to a conductive device for electrical testing.

Referring to FIG. 1, there is an existing electrical testing device 9, which is suitable for testing an electronic component 900 such as an integrated circuit, a wafer, etc., and includes a base 91 made of metal, and a plurality of The spring probe 92 in the base 91. The spring probe 92 is electrically connected to the electronic component 900 to perform various tests.

Due to the rapid development of high-tech industries in recent years, as the demands of related industries increase, the components under test that must be tested are naturally becoming more sophisticated and complex, and the types are also quite diversified. If the electrical testing device 9 is used to perform the test, since the spring probes 92 are arranged in parallel and spaced axially, the distance D between the opposite ends of the adjacent spring probes 92 is the same, so if you want to respond to various positions When distributing electrical contacts, it is necessary to redesign the position and distribution of the spring probes 92 according to various components to be tested, which not only consumes huge design and manufacturing costs, but also specializes the electrical testing The device 9 cannot cope with other types of components to be tested.

Therefore, the purpose of the present invention is to provide a conductive device that can be freely adjusted to meet the test requirements to correspond to the electrical test of the distance and position distribution of each contact.

Therefore, the conduction device for electrical testing of the present invention is suitable for connecting a driving module with multiple contacts to perform electrical testing, and includes a testing unit and a conversion unit connected to the testing unit.

The test unit includes a plurality of substrates and a plurality of conductive elements. Each substrate extends along a first axial direction, and has two end surfaces located at two opposite ends in the first axial direction, and two surfaces respectively connected to opposite sides of the end surfaces, and the substrates are parallel to each other with the surfaces The two adjacent substrates are arranged at intervals, and an installation space is defined by the interval between every two adjacent substrates. The conductive elements extend from the installation spaces along a second axis perpendicular to the first axis, and are arranged at intervals along the first axis.

The conversion unit is connected to the conductive parts of the test unit and is used to adjust the positional relationship of the conductive parts electrically connected to the contacts. The conversion unit includes a plurality of conductive parts located on opposite sides of the conductive parts, respectively Corresponding to the transfer point of these contacts.

The effect of the present invention is that the test unit and the conversion unit can be designed to cooperate with the electronic component to be tested and the drive module respectively, so when the conversion unit is connected to the test unit, it can be based on the distance between the contacts, The distribution position produces the effect of adjustment and conversion, so that the electrical connection relationship formed between the conductive parts and the switching points can be applied to the electrical test requirements of the electronic components to be tested.

Before the present invention is described in detail, it should be noted that in the following description, similar elements are denoted by the same numbers.

Referring to FIGS. 2, 3, and 4, a first embodiment of a conductive device for electrical testing of the present invention is suitable for connecting a driving module 1 with a plurality of contacts 11 to perform electrical testing, and includes a The test unit 2, and a conversion unit 3 connected to the test unit 2.

The test unit 2 includes a plurality of substrates 21, a plurality of conductive members 22, a plurality of electrical connection members 23, and a plurality of conductive members 24. It should be explained first that the test unit 2 can meet the test requirements or the type of the component to be tested, select an appropriate number of the substrates 21 to form a specific type of carrier substrate, and by arranging the conductive elements 22, the The electrical connection piece 23 and the conducting pieces 24 form a test circuit that matches the component to be tested. The following is only a description of a few representative implementation types, and is not limited to the modular test circuit that the test unit 2 can constitute.

Each substrate 21 extends along a first axis X1, and has two end surfaces 211 located at two opposite ends in the first axis X1, two surfaces 212 respectively connected to opposite sides of the end surfaces 211, and one along the The first axis X1 is located in the center and penetrates the holes 219 of the surfaces 212. The substrates 21 are arranged at intervals in a direction in which the surfaces 212 are parallel to each other, and every two adjacent substrates 21 define an installation space 200 at intervals. The conductive elements 22 extend from the installation spaces 200 along a second axis X2 perpendicular to the first axis X1, and are arranged at intervals along the first axis X1. In the first embodiment, the conductive members 24 are respectively disposed in the holes 219 and are electrically connected to each other, and the electrical connection members 23 are installed at two opposite ends of each installation space 200, and It is flush with the end surfaces 211 of the substrates 21.

The conversion unit 3 is connected to the conductive parts 22 of the test unit 2 and is used to adjust the positional relationship of the conductive parts 22 electrically connected to the contacts 11, and the conversion unit 3 includes a plurality of parts connected integrally to the The adjustment member 31 of the conductive member 22 and a plurality of connecting points 39 located on the opposite side of the conductive member 22 and corresponding to the contacts 11 respectively. Wherein, each switching point 39 of the conversion unit 3 is generally a hemispherical metal element.

Referring to FIG. 5 in conjunction with FIG. 3, each conductive member 22 has an elastic portion 221 that extends in an arc along the second axis X2 and is inclined in a direction toward the hole 219, and a contact end away from the conversion unit 3 P. The connecting points 39 are respectively located at one end of the adjusting member 31 opposite to the contact ends P, and there is a distance L1 between the contact ends P of at least two adjacent conductive members 22 and the corresponding connecting points The distance L2 of 39 is different. That is to say, in order to respond to the components to be tested with complicated circuit configuration and electrical connection point distribution, the bending type of the adjusting members 31 of the conversion unit 3 can be used to make the contact ends of the elastic parts 221 The distance L1 between P is smaller than the distance L2 between the transition points 39, and the distance L2 between the adjacent elastic portions 221 and the adjacent transition points 39 is adjusted differently, that is, the electric The displacement in the distance between the connection points facilitates the design of multiple devices to be tested, thereby improving the versatility of the first embodiment.

Referring to FIG. 6 and in conjunction with FIG. 5, when the first embodiment is used, the conductive members 22 of the test unit 2 can cooperate with the component under test 81 to form the required electrical connection, and the conversion unit 3 passes through the The bending type of the adjusting member 31 can ensure that the connecting points 39 connected to the adjusting member 31 are connected to the contacts 11 of the driving module 1, so that the driving module 1 can be driven by the The module 1 drives an electrical test, and performs an electrical test on the component under test 81.

7 and 8, it is a second embodiment of a conductive device for electrical testing of the present invention. The difference between the second embodiment and the first embodiment is that each adjustment member 31 of the conversion unit 3 has a The bending portion 311 is bent and extended along the second axial direction X2 in a direction opposite to the conductive members 22. In other words, the bending portions 311 of the adjusting members 31 can be flexible due to their bending, and can produce a contact effect like a pogo pin, and perform different contact modes such as scraping, pressing, etc. Electrical test of action. As shown in FIG. 8, through the bending type of the adjusting members 31, the distance L1 between the contact ends P and the distance L2 between the transition points 39 can also be displaced, thereby achieving cooperation. Adjustment of test requirements.

Refer to FIG. 9, which is a third embodiment of a conductive device for electrical testing of the present invention. The difference between the third embodiment and the first embodiment is that the conversion unit 3 further includes a plurality of conductive devices connected to the conductive devices. The connecting piece 22 is a straight rod-shaped connecting piece 32, and an adapter plate 33 for connecting the connecting pieces 32 and suitable for connecting to the drive module 1, and the connecting points 39 are located in the connecting pieces. Piece 32 on. The adapter board 33 can modularly design the internal circuit. Through the connection of the connectors 32, corresponding adjustments can be formed corresponding to the driving module 1, thereby improving the versatility of the third embodiment. .

10 and 11, it is a fourth embodiment of a conductive device for electrical testing of the present invention. The difference between the fourth embodiment and the third embodiment is that each connecting member 32 of the conversion unit 3 has two The extension sections 321 are spaced apart from each other along the first axis X1 and can be deformed toward each other. Due to the feature that the extension sections 321 can be deformed toward each other, they can be connected to the adapter plate 33 in a direct plug-in connection manner, and positioned by the elastic restoring force of the extension sections 321. The adapter board 33 can be designed with a plurality of electrical contact points 331 that can be electrically connected to other components. When the test unit 2 is indeed connected to the adapter board 33 of the conversion unit 3, it can pass through as shown in FIG. 12 The conversion unit 3 is definitely connected to the drive module 1 to perform an electrical test on the component under test 81 through the electrical path formed by the test unit 2 and the conversion unit 3.

In summary, the conduction device for electrical testing of the present invention can adjust the electrical contact position and distance of the electrical circuit through the conversion unit 3 to meet the testing requirements, without the need to re-manufacture a complete testing device. By means of modular connection, necessary adjustments are achieved to adapt to different components under test 81 or drive modules 1, effectively improving the versatility of the test, so the purpose of the invention can indeed be achieved.

However, the above are only examples of the present invention. When the scope of implementation of the present invention cannot be limited by this, all simple equivalent changes and modifications made in accordance with the scope of the patent application of the present invention and the content of the patent specification still belong to This invention patent covers the scope.

1: drive module 11: Contact 2: test unit 21: substrate 211: end face 212: Surface 219: Hole 22: conductive parts 23: Electrical connection 24: lead-through 3: Conversion unit 31: Adjusting parts 311: Bending part 32: connecting piece 321: Extension 33: adapter board 331: Electrical contact 39: transfer point 81: component under test P: contact end L1: distance L2: distance X1: first axis X2: second axis

Other features and effects of the present invention will be clearly presented in the embodiments with reference to the drawings, in which: Figure 1 is a cross-sectional view illustrating an existing electrical testing device; Fig. 2 is a perspective exploded view illustrating a first embodiment of a conductive device for electrical testing of the present invention; Figure 3 is a partially enlarged side view illustrating a test unit and a conversion unit of the first embodiment; Fig. 4 is a top view showing the plurality of conductive elements of the test unit in conjunction with Fig. 3; Figure 5 is a schematic diagram illustrating the conversion effect of the conversion unit; FIG. 6 is a schematic diagram illustrating the case of performing a test using the first embodiment; FIG. 7 is a partial enlarged side view similar to FIG. 3, illustrating a second embodiment of the conductive device for electrical testing of the present invention; FIG. 8 is a schematic diagram similar to FIG. 5, illustrating the conversion effect of the conversion unit of the second embodiment; Fig. 9 is an exploded side view illustrating a third embodiment of a conductive device for electrical testing of the present invention; Fig. 10 is an exploded side view illustrating a fourth embodiment of a conductive device for electrical testing of the present invention; Figure 11 is a side view illustrating the conversion unit of the fourth embodiment; and Fig. 12 is a schematic diagram illustrating the case of performing a test using this fourth embodiment.

1: drive module

11: Contact

2: test unit

21: substrate

211: end face

212: Surface

219: Hole

22: conductive parts

23: Electrical connection

24: lead-through

3: Conversion unit

39: transfer point

X1: first axis

X2: second axis

Claims (9)

A conduction device for electrical testing, suitable for connecting a drive module with multiple contacts to perform electrical testing, and includes: a testing unit including multiple substrates, each substrate extending along a first axis , And has two end faces located at two opposite ends in the first axial direction, and two surfaces respectively connected to the opposite sides of the end faces, the substrates are arranged at intervals in a direction parallel to each other, and every two adjacent substrates The interval defines an installation space, and a plurality of conductive elements extend from the installation spaces along a second axis perpendicular to the first axis and are arranged at intervals along the first axis. Each conductive element has a Contact end; and a conversion unit connected to the conductive parts of the test unit and used to adjust the positional relationship of the conductive parts electrically connected to the contacts. The conversion unit includes a plurality of units respectively connected to the The adjustment parts of the conductive parts and a plurality of adjustment parts are located on the opposite sides of the conductive parts, and are respectively located at one end of the adjustment parts opposite to the contact ends and correspond to the transition points of the equal contacts. The conductive device for electrical testing according to claim 1, wherein the distance between the contact ends of at least two adjacent conductive members is different from the distance between the corresponding transition points. The conduction device for electrical testing according to claim 2, wherein each switching point of the conversion unit is a hemispherical metal element. The conduction device for electrical testing according to claim 2, wherein each adjustment member of the conversion unit has a direction along the second axial direction opposite to the conductive members The direction of the bend and extend the bending part. The conduction device for electrical testing according to claim 1, wherein the conversion unit further includes a plurality of connecting members integrally connected to the conductive members, and a connecting member for plugging in and suitable for connecting to the conductive member. For the transfer board of the drive module, the transfer points are located on the connectors. The conduction device for electrical testing according to claim 5, wherein each connecting member of the conversion unit has two extension sections that are spaced from each other along the first axial direction and can be deformed toward each other. The conduction device for electrical testing according to claim 1, wherein each substrate has a hole located in the center along the first axis and passing through the surfaces, and the test unit further includes a plurality of holes respectively disposed in the holes And they are electrically connected conductive parts. The conductive device for electrical testing according to claim 7, wherein each conductive member of the test unit has an elastic portion that extends in an arc along the second axis and is inclined in a direction toward the hole. The conduction device for electrical testing according to claim 1, wherein the test unit further includes a plurality of electrical connectors installed at two opposite ends of each installation space and flush with the end surfaces of the substrates.

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