CN112687785A

CN112687785A - Test fixture structure for LED packaged

Info

Publication number: CN112687785A
Application number: CN202110056570.2A
Authority: CN
Inventors: 范国峰; 洪华
Original assignee: Shenzhen Kerun Optoelectronics Inc
Current assignee: Shenzhen Kerun Optoelectronics Inc
Priority date: 2021-01-15
Filing date: 2021-01-15
Publication date: 2021-04-20
Anticipated expiration: 2041-01-15
Also published as: CN112687785B

Abstract

The invention discloses a test fixture structure used after LED packaging, and relates to the technical field of LED packaging test. Including die holder, last unloading subassembly, guide post, cope match-plate pattern, roof, guide pin bushing, inlay seat and contact pilotage, the mounting groove has been seted up on the die holder, go up unloading subassembly fixed mounting in the mounting groove, the guide post is inlayed in the both ends of die holder, the cope match-plate pattern passes through bolt and roof lock solid connection, the guide pin bushing is inlayed in the both ends of cope match-plate pattern. This test fixture structure that uses after LED encapsulates, will await measuring the LED encapsulation range and place in the support plate, utilize the locating pin on it to coordinate the fabrication hole of LED encapsulation to fix a position, can test when the LED encapsulation in the support plate moves to contact pilotage below, utilize outer elevating system that joins in marriage to drive the contact pilotage on the cope match-plate pattern and move down contact LED encapsulation and carry out the photoelectricity parameter test, this test fixture simple structure, the cost of manufacture is low, and the duplex position design that adopts does benefit to and improves efficiency of software testing.

Description

Test fixture structure for LED packaged

Technical Field

The invention relates to the technical field of LED packaging test, in particular to a test fixture structure used after LED packaging.

Background

In recent years, with the development of the LED industry, an industrial chain with high technical content and wide market prospect is formed in the application aspects of materials, chips, packaging and LED lighting, especially, high-power and high-brightness LED modules have become a competitive hot spot in the international semiconductor lighting and display fields, the packaging process and equipment manufacturing of a new generation of high-power LED modules are the key research points of various LED faucet enterprises and research institutions in the world, the barriers of the core technology of the development of the high-power and high-brightness LED industry are gradually formed, the LED packaging process is a precise assembly manufacturing technology for bonding, fixing and sealing and protecting the chips, meanwhile, different application environments and special application fields also put forward higher requirements on the reliability of the LEDs, and therefore, the aging test of the LEDs is increasingly scaled.

In the method for testing the reliability and service life of electronic products such as LED, promote the test process that the environmental temperature or current intensity can be reliability and life-span, it is a test method to accelerate, to the accelerated test of packaging level, the mode adopted at present is mainly through the circuit interconnection of a plurality of LED packages, test its photoelectric parameter under the temperature of certain time, current load, etc., wherein, eutectic welding technique is one of the most key core techniques in the next generation of flip-chip high-power LED chip packaging process, the quality of eutectic welding technique can influence the luminous efficiency, life-span, heat dispersion and terminal product quality of the high-power LED module directly, the factor quantity is great when the packaging LED tests, must have a kind of frock that can be tested automatically, the traditional test tool structure is not good enough in the aspect of buffer protection at the same time.

Disclosure of Invention

Aiming at the defects of the prior art, the invention provides a test fixture structure used after LED packaging, which aims to improve the test efficiency, enable the test fixture structure to adapt to the test requirements of a large amount of objects, realize automatic operation and reduce labor cost.

In order to achieve the purpose, the invention provides the following technical scheme: a test fixture structure used after LED packaging comprises a lower die holder, an upper feeding and lower feeding assembly, guide posts, an upper die plate, a top plate, guide sleeves, an embedding seat and contact pins, wherein a mounting groove is formed in the lower die holder, the upper feeding and lower feeding assembly is fixedly mounted in the mounting groove, the mounting seats are fixedly arranged at two ends of the inner part of the mounting groove, the guide posts are movably arranged at the top of the mounting seat, the upper die plate is fixedly connected with the top plate through bolts, the guide sleeves are embedded at two ends of the upper die plate, the upper die plate is slidably connected with the lower die holder through the guide sleeves and the guide posts, stepped holes are formed in the upper die plate, the embedding seat is mounted in the stepped holes, the contact pins are embedded in the embedding seat, through grooves positioned on the upper die plate are formed in two sides of the stepped holes, telescopic springs are fixedly arranged in the through grooves, a clamping groove is formed in one side, close to the clamping beads, of the insert seat, and the clamping beads are movably clamped in the clamping groove;

the feeding and discharging assembly comprises a sliding table module and a carrier plate, the carrier plate is arranged on a moving table of the sliding table module, a limiting groove is formed in the carrier plate, and a positioning pin is embedded in the limiting groove;

the utility model discloses a guide rail device, including mount pad, U type frame, buffer spring, guide post, guide block, guide post, guide bar, connecting seat, buffer spring, movable seat, guide block, guide bar, guide block, guide bar, guide.

As a preferred technical scheme of the invention, the lower die holder, the upper template and the top plate are all subjected to chamfering treatment, the lower die holder and the upper template are all of a T-shaped structure, and the lower die holder is provided with a mounting hole.

As a preferred technical scheme of the invention, the guide posts are distributed at the front end and the rear end of the lower die holder, the guide sleeves are distributed at the front end and the rear end of the upper die plate, the guide sleeves are provided with the return springs, and the return springs are sleeved on the guide posts.

As a preferred technical scheme of the invention, one end of the guide rod, which is far away from the guide block, is movably inserted on the first U-shaped frame, and an adjusting spring positioned on the surface of the guide rod is sleeved between the inner side surface of the first U-shaped frame and the guide block.

As a preferred technical scheme of the invention, through holes are formed at two ends of the top plate, and the top ends of the guide posts penetrate to the upper parts of the through holes.

As a preferred technical scheme of the invention, the insert seat is of a step-shaped structure, and at least 2 insert seats are arranged.

As a preferable technical scheme of the invention, the top of the insert seat is provided with an avoiding groove, and the top end of the contact pin extends into the avoiding groove.

As a preferable technical scheme of the invention, the top of the top plate is provided with a line hole, and the line hole corresponds to the position of the insert seat.

As a preferred technical scheme of the invention, the feeding and discharging assembly further comprises a linear guide rail, and the sliding block end of the linear guide rail is connected with the carrier plate.

As a preferred technical scheme of the invention, the number of the limiting grooves in the carrier plate is at least 2, and the limiting grooves correspond to the positions of the embedding seats.

Compared with the prior art, the invention provides a test fixture structure used after LED packaging, which has the following beneficial effects:

1. this test fixture structure that uses after LED encapsulates, will await measuring the LED encapsulation range and place in the support plate, utilize the locating pin on it to coordinate the fabrication hole of LED encapsulation to fix a position, can test when the LED encapsulation in the support plate moves to contact pilotage below, utilize outer elevating system that joins in marriage to drive the contact pilotage on the cope match-plate pattern and move down contact LED encapsulation and carry out the photoelectricity parameter test, this test fixture simple structure, the cost of manufacture is low, and the duplex position design that adopts does benefit to and improves efficiency of software testing.

2. This test fixture structure of using after LED encapsulates, before the test, drives the LED encapsulation in the support plate through the slip table module in the last unloading subassembly and carries out the material loading, and after the test, the LED encapsulation that drives the support plate through the slip table module in the last unloading subassembly carries out the unloading, does benefit to and realizes automatic operation, alleviates the recruitment cost, correspondingly also makes the security promote to some extent.

3. This test fixture structure of using after LED encapsulates, the contact pilotage is preassembled in the cope match-plate pattern through inlaying the seat, through inlaying seat rational arrangement contact pilotage quantity, and the modularized design who adopts, also is favorable to the assembly to can be according to the assembly line processing conditions, the adjustment station makes it can adapt to the test demand of multiple ground, improves the productivity of production line, does benefit to the performance of enterprises.

4. This test fixture structure of using after LED encapsulates, in operation, the guide post can cushion shock attenuation protection, the guide post can carry out the up-and-down motion under buffer spring's effect, make the movable pulley of the connecting rod bottom of guide post both sides can slide from top to bottom simultaneously, drive the guide block and carry out the side-to-side motion under the effect of regulating spring cooperation guide bar, and then reach absorbing purpose, reduce the rigid impact force of test fixture during operation, reach the purpose of buffering protection, moreover, the steam generator is simple in structure.

Drawings

FIG. 1 is a schematic structural diagram of a test fixture structure for use after LED packaging according to the present invention;

FIG. 2 is a side view of a test fixture structure for use after LED packaging according to the present invention;

FIG. 3 is a cross-sectional view of a test fixture structure for use after LED packaging according to the present invention;

FIG. 4 is a top view of a loading and unloading assembly of a test fixture structure for use after LED packaging according to the present invention;

FIG. 5 is a cross-sectional view of a mounting portion of a test fixture structure for use after LED packaging according to the present invention;

FIG. 6 is an enlarged structural view of the part A in FIG. 3 showing a test fixture structure for use after LED packaging according to the present invention;

FIG. 7 is a schematic view of a mounting base structure of a test fixture structure for use after LED packaging according to the present invention;

fig. 8 is an enlarged structural diagram of a portion B in fig. 7 of a test fixture structure for use after LED packaging according to the present invention.

In the figure: 1. a lower die holder; 2. a feeding and discharging assembly; 3. a guide post; 4. mounting a template; 41. a through groove; 42. a tension spring; 43. clamping the beads; 5. a top plate; 6. a guide sleeve; 7. embedding a seat; 71. a card slot; 8. a stylus; 9. mounting grooves; 10. a stepped hole; 11. a sliding table module; 12. a carrier plate; 13. a limiting groove; 14. positioning the pin; 15. mounting holes; 16. a return spring; 17. a via hole; 18. a position avoiding groove; 19. a wire hole; 20. a linear guide rail; 21. a mounting seat; 211. a first U-shaped frame; 212. a U-shaped frame II; 2121. a connecting seat; 2122. a buffer spring; 213. a movable seat; 214. a connecting rod; 215. a sliding wheel; 216. a guide block; 217. a guide bar; 218. the spring is adjusted.

Detailed Description

The technical solutions in the embodiments of the present invention will be clearly and completely described below with reference to the drawings in the embodiments of the present invention, and it is obvious that the described embodiments are only a part of the embodiments of the present invention, and not all of the embodiments. All other embodiments, which can be derived by a person skilled in the art from the embodiments given herein without making any creative effort, shall fall within the protection scope of the present invention.

Referring to fig. 1-8, a test fixture structure for an LED package includes a lower die holder 1, a loading and unloading module 2, a guide post 3, an upper die plate 4, a top plate 5, a guide sleeve 6, an insert seat 7 and a contact pin 8, wherein the lower die holder 1 is provided with a mounting groove 9, the loading and unloading module 2 is fixedly mounted in the mounting groove 9, both ends of the inside of the mounting groove 9 are fixedly provided with a mounting seat 21, the top of the mounting seat 21 is movably provided with the guide post 3, the upper die plate 4 is fixedly connected with the top plate 5 through a bolt, the guide sleeve 6 is embedded at both ends of the upper die plate 4, the upper die plate 4 is slidably connected with the lower die holder 1 through the guide sleeve 6 and the guide post 3, the LED package to be tested is arranged and placed in a carrier plate 12, and is positioned by using a positioning pin14 thereon to cooperate with a process hole of the LED package, when the LED package in the carrier plate, the test fixture has the advantages that the externally-matched lifting mechanism is utilized to drive the contact pins 8 on the upper template 4 to move downwards to contact with the LED package for photoelectric parameter testing, the test fixture is simple in structure and low in manufacturing cost, and the adopted double-station design is favorable for improving the test efficiency, the stepped hole 10 is arranged in the upper template 4, the insert seat 7 is installed in the stepped hole 10, the contact pins 8 are embedded in the insert seat 7, the two sides of the stepped hole 10 are respectively provided with the through grooves 41 on the upper template 4, the telescopic springs 42 are fixedly arranged in the through grooves 41, the clamping beads 43 are fixedly arranged on one sides of the telescopic springs 42, the clamping grooves 71 are arranged on one sides of the insert seat 7 close to the clamping beads 43, the clamping beads 43 are movably clamped in the clamping grooves 71 in the clamping columns 43 and the clamping grooves 71 on the side faces of the insert seat 7, the mounting of the insert seat 7 is further favorable for mounting, simultaneously also be convenient for install and dismantle, contact pilotage 8 is pre-installed in cope match-plate pattern 4 through setting 7, can rationally arrange contact pilotage 8 quantity through setting 7, and the modular design who adopts also is favorable to the assembly to can be according to the assembly line processing conditions, the adjustment station makes it can adapt to the test demand of large volume, improves the productivity of production line, does benefit to the performance of enterprises.

The feeding and discharging assembly 2 comprises a sliding table module 11 and a carrier plate 12, the carrier plate 12 is installed on a moving table of the sliding table module 11, a limit groove 13 is arranged on the carrier plate 12, a positioning pin14 is embedded in the limit groove 13, before testing, the sliding table module 11 in the feeding and discharging assembly 2 drives an LED package in the carrier plate 12 to perform feeding, after testing, the sliding table module 11 in the feeding and discharging assembly 2 drives the LED package of the carrier plate 12 to perform discharging, automatic operation is facilitated, labor cost is reduced, safety is correspondingly improved, two ends of the bottom of an inner cavity of the mounting seat 21 are respectively provided with a U-shaped frame I211, two U-shaped frames II 212 are arranged between the two U-shaped frames I211, the insides of the two U-shaped frames II 212 are respectively and fixedly connected with a buffer spring 2122 through a connecting seat 2121, the top of the buffer spring 2122 is provided with a movable seat 213, the top of the movable seat 213 is fixedly provided with a guide column, the two sides of the bottom of the guide post 3 are both provided with connecting rods 214, the bottom of each connecting rod 214 is provided with a sliding wheel 215, the bottom of each sliding wheel 215 is connected with a guide block 216 in a sliding mode, the bottom of each guide block 216 is movably connected inside a first U-shaped frame 211, one side of each guide block 216 is provided with a guide rod 217, one end, far away from each guide block 216, of each guide rod 217 is movably inserted into the first U-shaped frame 211, and an adjusting spring 218 located on the surface of each guide rod 217 is sleeved between the inner side face of the first U-shaped frame 211 and the corresponding guide block 216. During operation, guide post 3 can cushion the shock attenuation protection, and guide post 3 can carry out the up-and-down motion under buffer spring 2122's effect, makes the movable pulley 215 of the connecting rod 214 bottom of guide post 3 both sides to slide from top to bottom simultaneously, drives guide block 216 and carries out the side-to-side motion under the effect of regulating spring 218 cooperation guide bar 217, and then reaches absorbing purpose, reduces the rigidity impact force of test fixture during operation, reaches the purpose of buffering protection, simple structure.

As a specific technical scheme of this embodiment, the lower die holder 1, the upper template 4 and the top plate 5 are all chamfered, the lower die holder 1 and the upper template 4 are both T-shaped structures, and the lower die holder 1 is provided with a mounting hole 15.

In this embodiment, the chamfer is handled and can be avoided personnel and product on its sharp-pointed outer corner fish tail line, improves its security, and lower bolster 1 is in advance through mounting hole 15 fixed mounting on equipment board, carries out the preparation work before testing.

As a specific technical scheme of this embodiment, the guide posts 3 are distributed at the front and rear ends of the lower die holder 1, and the guide sleeves 6 are distributed at the front and rear ends of the upper die plate 4.

In this embodiment, the upper die plate 4 is connected with the lower die holder 1 through the guide post 3 and the guide sleeve 6, so as to play a role in guiding and positioning, and the lifting motion of the upper die plate 4 is realized through an externally-matched lifting mechanism.

As a specific technical solution of this embodiment, the guide sleeve 6 is provided with a return spring 16, and the return spring 16 is sleeved on the guide post 3.

In this embodiment, the reset spring 16 has a certain resilience, and after being pressed down, the reset spring helps to lift the upper die plate 4, and is matched with the guide column 3 and the guide sleeve 6 for use, so that the stability can be improved.

As a specific technical solution of this embodiment, through holes 17 are opened at two ends of the top plate 5, and the top end of the guide post 3 penetrates above the through holes 17.

In this embodiment, the via hole 17 mainly serves as a clearance so as to facilitate the upper mold plate 4 to move up and down along the track of the guide post 3.

As a specific technical scheme of this embodiment, the insert 7 is in a step-like structure, and the number of the insert 7 is at least 2.

In the embodiment, the stations can be adjusted according to the processing condition of the production line, so that the station can adapt to the requirement of multiple tests, and the productivity of the production line is improved.

As a specific technical solution of this embodiment, the top of the insert 7 is provided with an avoiding groove 18, and the top end of the contact pin 8 extends into the avoiding groove 18.

In this embodiment, the avoiding groove 18 is used for connecting the contact pins 8 with the testing equipment to perform statistical testing parameters, the contact pins 8 are pre-installed in the upper template 4 through the embedding seats 7, and the number of the contact pins 8 can be reasonably arranged through the embedding seats 7.

As a specific technical scheme of the embodiment, the top of the top plate 5 is provided with a line hole 19, and the line hole 19 corresponds to the position of the insert seat 7.

In this embodiment, the wire hole 19 and the avoiding groove 18 have the same function, and are used for facilitating the contact pin 8 to connect with the testing equipment.

As a specific technical solution of this embodiment, the loading and unloading assembly 2 further includes a linear guide 20, and a sliding block end of the linear guide 20 is connected to the carrier 12.

In this embodiment, the linear guide 20 plays a role of guiding, and improves the stability of the carrier plate 12 during moving, so as to avoid shaking or skewing.

As a specific technical solution of this embodiment, at least 2 limiting grooves 13 are formed in the carrier plate 12, and the positions of the limiting grooves 13 correspond to the positions of the insert seat 7.

In the embodiment, the externally-matched lifting mechanism drives the contact pins 8 on the upper template 4 to move downwards to contact with the LED package for photoelectric parameter testing, and the adopted double-station design is favorable for improving the testing efficiency.

The working principle and the using process of the invention are as follows: when the testing jig is used, the LED packages to be tested are arranged and placed in the carrier plate 12, the locating pins 14 on the LED packages are used for locating in cooperation with the fabrication holes of the LED packages, the LED packages in the carrier plate 12 are driven to be loaded through the sliding table module 11 in the loading and unloading assembly 2, the LED packages in the carrier plate 12 can be tested when moving to the lower part of the contact pins 8, the contact pins 8 on the upper template 4 are driven to move downwards to contact with the LED packages through the externally-arranged lifting mechanism for testing photoelectric parameters, when the testing jig works, the guide column 3 can be buffered and protected, the guide column 3 can move up and down under the action of the buffer springs 2122, meanwhile, the sliding wheels 215 at the bottoms of the connecting rods 214 on the two sides of the guide column 3 can slide up and down, the guide block 216 is driven to move left and right under the action of the adjusting springs 218 in cooperation with the guide rods 217, the aim of shock, reach the purpose of buffer protection, moreover, the steam generator is simple in structure, the duplex position design of adoption, do benefit to and improve efficiency of software testing, and contact pilotage 8 is preassembled in cope match-plate pattern 4 through setting 7, can rationally arrange contact pilotage 8 quantity through setting 7, adopt the modularized design, be favorable to the assembly, and can be according to the assembly line processing conditions, the adjustment station, make it can adapt to the test demand of multiple ground, after the test, the LED encapsulation that drives support plate 12 through the slip table module 11 among the last unloading subassembly 2 carries out the unloading, do benefit to and realize automatic operation, lighten the recruitment cost.

In summary, in the test fixture structure for the packaged LEDs, the packaged LEDs to be tested are arranged in the carrier plate 12, and are positioned by the positioning pins 14 thereon in cooperation with the fabrication holes of the packaged LEDs, so that the packaged LEDs in the carrier plate 12 can be tested when the packaged LEDs move to the position below the contact pins 8, and the externally-arranged lifting mechanism is used to drive the contact pins 8 on the upper template 4 to move down to contact the packaged LEDs for testing the photoelectric parameters; before testing, the sliding table module 11 in the feeding and discharging assembly 2 drives the LED package in the carrier plate 12 to be fed, and after testing, the sliding table module 11 in the feeding and discharging assembly 2 drives the LED package of the carrier plate 12 to be discharged, so that automatic operation is realized, labor cost is reduced, and safety is improved correspondingly; contact pilotage 8 is preassembled in cope match-plate pattern 4 through setting up 7, can rationally arrange contact pilotage 8 quantity through setting up 7, and the modular design who adopts also is favorable to the assembly to can be according to the assembly line processing conditions, the adjustment station makes it can adapt to the test demand of multiple ground, improves the productivity of production line, does benefit to the performance of enterprises.

It should be noted that, in this document, terms such as "comprises," "comprising," or any other variation thereof, are intended to cover a non-exclusive inclusion, such that a process, method, article, or apparatus that comprises a list of elements does not include only those elements but may include other elements not expressly listed or inherent to such process, method, article, or apparatus. Without further limitation, an element defined by the phrase "comprising an … …" does not exclude the presence of other identical elements in a process, method, article, or apparatus that comprises the element.

Although embodiments of the present invention have been shown and described, it will be appreciated by those skilled in the art that changes, modifications, substitutions and alterations can be made in these embodiments without departing from the principles and spirit of the invention, the scope of which is defined in the appended claims and their equivalents.

Claims

1. The utility model provides a test fixture structure of using behind LED encapsulation, includes die holder (1), goes up unloading subassembly (2), guide post (3), cope match-plate pattern (4), roof (5), guide pin bushing (6), inlay seat (7) and contact pilotage (8), its characterized in that: the die comprises a lower die holder (1), a mounting groove (9) is formed in the lower die holder (1), a feeding and discharging assembly (2) is fixedly mounted in the mounting groove (9), mounting seats (21) are fixedly arranged at two ends of the interior of the mounting groove (9), a guide post (3) is movably arranged at the top of each mounting seat (21), an upper die plate (4) is in locking connection with a top plate (5) through a bolt, a guide sleeve (6) is embedded at two ends of the upper die plate (4), the upper die plate (4) is in sliding connection with the lower die holder (1) through the guide sleeve (6) and the guide post (3), a stepped hole (10) is formed in the upper die plate (4), an embedding seat (7) is mounted in the stepped hole (10), contact pins (8) are embedded in the embedding seats (7), through grooves (41) on the upper die plate (4) are formed in two sides of the stepped hole (10), and a telescopic spring (42) is fixedly arranged in the, a clamping bead (43) is fixedly arranged on one side of the telescopic spring (42), a clamping groove (71) is formed in one side, close to the clamping bead (43), of the embedded seat (7), and the clamping bead (43) is movably clamped in the clamping groove (71);

the loading and unloading assembly (2) comprises a sliding table module (11) and a carrier plate (12), the carrier plate (12) is installed on a moving table of the sliding table module (11), a limiting groove (13) is formed in the carrier plate (12), and a positioning pin (14) is embedded in the limiting groove (13);

the utility model discloses a bearing device, including mount pad (21), mount pad (21) inner chamber bottom, both ends all are provided with U type frame one (211), two be provided with two U type frame two (212) between U type frame one (211), two the inside of U type frame two (212) all is through connecting seat (2121) fixedly connected with buffer spring (2122), the top of buffer spring (2122) is provided with sliding seat (213), the fixed guide post (3) that is provided with in top of sliding seat (213), the both sides of guide post (3) bottom all are provided with connecting rod (214), the bottom of connecting rod (214) is provided with movable pulley (215), the bottom sliding connection of movable pulley (215) has guide block (216), the bottom swing joint of guide block (216) is in the inside of U type frame one (211), one side of guide block (216) is provided with guide bar (217).

2. The structure of claim 1, wherein the test fixture structure comprises: the lower die holder (1), the upper die plate (4) and the top plate (5) are all subjected to chamfering treatment, the lower die holder (1) and the upper die plate (4) are of T-shaped structures, and the lower die holder (1) is provided with a mounting hole (15).

3. The structure of claim 1, wherein the test fixture structure comprises: the guide post (3) is distributed at the front end and the rear end of the lower die holder (1), the guide sleeve (6) is distributed at the front end and the rear end of the upper die plate (4), the reset spring (16) is installed on the guide sleeve (6), and the reset spring (16) is sleeved on the guide post (3).

4. The structure of claim 1, wherein the test fixture structure comprises: one end of the guide rod (217), which is far away from the guide block (216), is movably inserted into the first U-shaped frame (211), and an adjusting spring (218) which is positioned on the surface of the guide rod (217) is sleeved between the inner side surface of the first U-shaped frame (211) and the guide block (216).

5. The structure of claim 1, wherein the test fixture structure comprises: through holes (17) are formed in the two ends of the top plate (5), and the top end of the guide column (3) penetrates to the upper portion of the through hole (17).

6. The structure of claim 1, wherein the test fixture structure comprises: the embedding seats (7) are of a step-shaped structure, and at least 2 embedding seats (7) are arranged.

7. The structure of claim 1, wherein the test fixture structure comprises: the top of the embedding seat (7) is provided with a avoiding groove (18), and the top end of the contact pin (8) extends into the avoiding groove (18).

8. The structure of claim 1, wherein the test fixture structure comprises: the top of the top plate (5) is provided with a line hole (19), and the line hole (19) corresponds to the position of the embedding seat (7).

9. The structure of claim 1, wherein the test fixture structure comprises: the feeding and discharging assembly (2) further comprises a linear guide rail (20), and the sliding block end of the linear guide rail (20) is connected with the carrier plate (12).

10. The structure of claim 1, wherein the test fixture structure comprises: the number of the limiting grooves (13) in the carrier plate (12) is at least 2, and the positions of the limiting grooves (13) correspond to those of the embedding seats (7).