CN211785653U

CN211785653U - Automatic test equipment for LED (light-emitting diode) board

Info

Publication number: CN211785653U
Application number: CN201922373778.8U
Authority: CN
Inventors: 赖荣红; 陈华坤; 何胜太
Original assignee: Jiangxi Hongyu Circuit Technology Co ltd
Current assignee: Jiangxi Hongyu Circuit Technology Co ltd
Priority date: 2019-12-25
Filing date: 2019-12-25
Publication date: 2020-10-27
Anticipated expiration: 2029-12-25

Abstract

The utility model discloses an automatic test device for LED boards, which belongs to the field of test devices and comprises a device body, a frame, a driving cylinder, a test pressing plate, a probe, a slide rail, a supporting plate and a buffer mechanism; the buffer mechanism comprises a horizontal connecting plate and a buffer bracket; the buffer bracket comprises a spring and a buffer seat; the driving cylinder drives the test pressure plate to move downwards, and when the buffer seat descends to be in contact with a horizontal workbench of the equipment body; the probes are spaced from the LED plate on the supporting plate, when the test pressing plate continues to move downwards until the probes are contacted with the LED plate, the springs are compressed to play a role in buffering contact force of the probes, and the probes are reliably contacted with the LED plate through resilience force of the springs. The accuracy of the test is ensured, the distortion of the probe is effectively avoided, the deformation possibly caused by frequent detection and use of the probe is reduced, the service life of the probe is prolonged, and the stability of the detection is improved.

Description

Automatic test equipment for LED (light-emitting diode) board

Technical Field

The utility model relates to a test equipment field, more specifically relates to an automatic test equipment of LED board.

Background

The FCT test is a test method for providing simulated excitation and load to the LED board to make it work in various design states, thereby obtaining parameters of each state to verify the function of the test target board.

When the conventional LED board test probe is in rigid contact with an LED board through a driving device during detection, the probe is frequently detected and repeatedly subjected to rigid contact detection, so that distortion and deformation can be caused, the service life of the probe is shortened, and the product deviation of a detection result can be caused once the deformation is not found in time. Therefore, effective solutions to solve the above problems need to be proposed.

SUMMERY OF THE UTILITY MODEL

In order to overcome prior art's defect, the utility model discloses an automatic test equipment of LED board, when having LED board test probe to examine time measuring through drive arrangement and LED board rigid contact in the solution technique, the probe frequently detects and relapse rigid contact and detects and use and probably cause distortion, has shortened the service life of probe, in case warp in time not discover the problem that probably leads to the testing result product deviation.

To achieve the purpose, the utility model adopts the following technical proposal:

the utility model provides an automatic test device for LED boards, which comprises a device body for realizing the automatic test of the LED boards;

the device comprises a frame, a driving air cylinder, a test pressing plate, probes, two sliding rails, a supporting plate and a buffer mechanism, wherein the frame is used for fixedly supporting the device body;

the buffer mechanism comprises a horizontal connecting plate and a buffer support, the horizontal connecting plate is positioned on the periphery of the side surface of the test pressure plate and arranged outwards, and the buffer support is elastically connected with the bottom surface of the horizontal connecting plate;

the buffer bracket comprises a spring and a buffer seat, wherein one end of the spring is fixedly connected with the horizontal connecting plate, and the buffer seat is fixedly arranged on the end surface of the bottom of the spring;

the driving cylinder drives the test pressure plate to move downwards, and when the buffer seat descends to be in contact with a horizontal workbench of the equipment body; the probes have a gap with the LED board on the supporting plate, when the test pressing plate continues to move downwards until the probes are contacted with the LED board, the springs are compressed to buffer the contact force of the probes, and the probes are reliably contacted with the LED board through the resilience force of the springs.

Preferably, an accommodating groove is formed in one end, which is in contact with the spring, of the buffer seat.

Preferably, two strip-shaped grooves which are longitudinally arranged are formed in one end, which is far away from the spring, of the buffer seat.

Preferably, the rack further comprises two upright columns vertically arranged; the crossbeam is located the top inboard of stand, the crossbeam with stand welded connection.

Preferably, two symmetrically arranged guide rods are arranged below the cross beam; one end of the guide rod is fixedly connected with the lower end face of the cross beam, and the other end of the guide rod penetrates through the horizontal connecting plate and extends to be fixedly connected with a horizontal workbench of the equipment body.

The utility model has the advantages that:

the utility model discloses an automatic test equipment of LED board, drive the test clamp plate of actuating cylinder drive and move down, and make the buffer seat descend and contact with the horizontal table of the equipment organism; when the test pressing plate continues to move downwards until the probes are contacted with the LED plate, the springs are compressed to buffer the contact force of the probes, and the probes are reliably contacted with the LED plate through the resilience force of the springs; therefore, the accuracy of the test is ensured, the overlarge stress caused by rigid contact when the probe is pressed down and contacted is avoided, the distortion and the deformation of the probe are effectively avoided, the deformation possibly caused by frequent detection and use of the probe is reduced, the service life of the probe is prolonged, and the stability of the detection can be improved.

Drawings

Fig. 1 is a schematic structural diagram of an automated testing apparatus for LED boards according to an embodiment of the present invention;

fig. 2 is a schematic structural diagram of an automatic testing device for LED boards according to an embodiment of the present invention.

In the figure:

1. an equipment body; 2. a frame; 21. a cross beam; 22. a column; 3. a driving cylinder; 4. testing the pressing plate; 5. a probe; 6. a slide rail; 7. a support plate; 8. a buffer mechanism; 81. a horizontal connecting plate; 82. a buffer bracket; 821. a spring; 822. a buffer seat; 8221. an accommodating groove; 8222. a strip-shaped groove; 9. a guide rod.

Detailed Description

The technical solution of the present invention is further explained by the following embodiments with reference to the accompanying drawings.

As shown in fig. 1-2. The utility model provides an automatic test device for LED boards, which comprises a device body 1 for realizing automatic test of LED boards;

the device comprises a machine frame 2, a driving cylinder 3, a testing pressing plate 4, probes 5, two sliding rails 6, a supporting plate 7 and a buffer mechanism 8, wherein the machine frame 2 is used for fixedly supporting the device body 1, the driving cylinder 3 is fixedly arranged on a cross beam 21 of the machine frame 2, the testing pressing plate 4 is fixedly connected with the driving end of the driving cylinder 3, the probes 5 are fixedly arranged on the bottom end face of the testing pressing plate 4 and are uniformly distributed, the two sliding rails 6 are fixedly arranged on a horizontal workbench of the device body 1, the supporting plate 7 is used for bearing an LED plate to be detected and can longitudinally move along the;

the buffer mechanism 8 comprises a horizontal connecting plate 81 which is positioned at the periphery of the side surface of the test pressure plate 4 and is arranged towards the outside, and a buffer support 82 which is elastically connected with the bottom surface of the horizontal connecting plate 81;

the buffer bracket 82 comprises a spring 821 and a buffer seat 822, wherein one end of the spring 821 is fixedly connected with the horizontal connecting plate 81, and the buffer seat 822 is fixedly arranged on the end surface of the bottom of the spring 821;

when the driving cylinder 3 drives the test pressure plate 4 to move downwards and the buffer seat 822 descends to contact with the horizontal workbench of the equipment body 1; the probe 5 has a clearance with the LED board on the supporting plate 7, when the test pressing plate 4 continues to move downwards until the probe 5 is contacted with the LED board, the spring 821 is compressed to play a role of buffering the contact force of the probe 5, and the contact between the probe 5 and the LED board is reliable through the resilience force of the spring 821. Therefore, the accuracy of the test is ensured, the overlarge stress of rigid contact when the probe 5 is pressed down and contacted is avoided, the distortion and deformation of the probe 5 are effectively avoided, the deformation possibly caused by frequent detection and use of the probe 5 is reduced, the service life of the probe 5 is prolonged, and the stability of the detection can be improved; when the single-block detection is completed, the supporting plate 7 can be moved out through manual movement and can slide along the sliding rail 6, so that an operator can take out the LED plate conveniently, and the LED plate is replaced for test detection.

It should be noted that the slide rail 6 may be a dovetail slide rail, the bottom end of the corresponding movable supporting plate 7 is fixedly disposed on a dovetail slider adapted to the dovetail slide rail, and a limiting block (not shown in the drawing) for limiting the separation of the supporting plate 7 from the slide rail 6 is welded on the horizontal working table of the device body 1.

Further, an accommodating recess 8221 is formed at an end of the buffer seat 822, which is in contact with the spring 821. Specifically, the spring 821 is conveniently installed in the receiving recess 8221, and the receiving recess 8221 plays a role in positioning and guiding during assembly.

Further, two strip grooves 8222 are longitudinally formed in the buffer seat 822 and are far away from the end where the spring 821 contacts. Ensuring that the buffer seat 822 and the horizontal workbench of the equipment body 1 realize a better first contact support with each contact surface.

Further, the frame 2 also comprises two upright posts 22 arranged vertically; the crossbeam 21 is located the top inboard of stand 22, and crossbeam 21 and stand 22 welded connection. The connection reliability of the whole of the housing 2 is ensured.

Furthermore, two symmetrically arranged guide rods 9 are arranged below the cross beam 21; one end of the guide rod 9 is fixedly connected with the lower end face of the cross beam 21, and the other end of the guide rod 9 penetrates through the horizontal connecting plate 81 and extends to be fixedly connected with the horizontal workbench of the equipment body 1.

While the invention has been described with reference to a preferred embodiment, it will be understood by those skilled in the art that various changes may be made and equivalents may be substituted for elements thereof without departing from the spirit and scope of the invention. The present invention is not to be limited by the specific embodiments disclosed herein, and other embodiments that fall within the scope of the claims of the present application are intended to be within the scope of the present invention.

Claims

1. An automatic LED board testing device comprises a device body (1) for realizing automatic testing of an LED board; the method is characterized in that:

the device comprises a frame (2) for fixedly supporting the device body (1), a driving cylinder (3) fixedly arranged on a cross beam (21) of the frame (2), a testing pressing plate (4) fixedly connected with a driving end of the driving cylinder (3), uniformly distributed probes (5) fixedly arranged on the bottom end face of the testing pressing plate (4), two sliding rails (6) fixedly arranged on a horizontal workbench of the device body (1), a supporting plate (7) for bearing an LED plate to be detected and capable of longitudinally moving along the sliding rails (6), and a buffer mechanism (8) for buffering the contact force between the probes (5) and the LED plate;

the buffer mechanism (8) comprises a horizontal connecting plate (81) which is arranged at the periphery of the side surface of the test pressing plate (4) and is arranged towards the outside, and a buffer support (82) which is elastically connected with the bottom surface of the horizontal connecting plate (81);

the buffer support (82) comprises a spring (821) and a buffer seat (822), wherein one end of the spring (821) is fixedly connected with the horizontal connecting plate (81), and the buffer seat (822) is fixedly arranged on the end face of the bottom of the spring (821);

the driving cylinder (3) drives the test pressure plate (4) to move downwards, and when the buffer seat (822) descends to be in contact with a horizontal workbench of the equipment body (1); the probe (5) has a clearance with the LED board on the supporting plate (7), when the test pressing plate (4) continues to move downwards until the probe (5) is contacted with the LED board, the spring (821) is compressed to play a role in buffering the contact force of the probe (5), and the probe (5) is reliably contacted with the LED board through the resilience force of the spring (821).

2. The LED board automated testing apparatus of claim 1, wherein:

an accommodating groove (8221) is formed in one end, which is in contact with the spring (821), of the buffer seat (822).

3. The LED board automated testing apparatus of claim 2, wherein:

two strip-shaped grooves (8222) which are longitudinally arranged are formed in one end, which is on the buffer seat (822) and is far away from the contact of the spring (821).

4. The LED board automated testing apparatus of claim 1, wherein:

the frame (2) also comprises two upright posts (22) which are vertically arranged; the cross beam (21) is located on the inner side of the top end of the upright post (22), and the cross beam (21) is connected with the upright post (22) in a welding mode.

5. The LED board automated testing apparatus of claim 1, wherein:

two guide rods (9) which are symmetrically arranged are arranged below the cross beam (21); one end of the guide rod (9) is fixedly connected with the lower end face of the cross beam (21), and the other end of the guide rod (9) penetrates through the horizontal connecting plate (81) and extends to be fixedly connected with a horizontal workbench of the equipment body (1).