CN112509631A - Batch testing system and method for quality of storage particles, computer equipment and storage medium - Google Patents
Batch testing system and method for quality of storage particles, computer equipment and storage medium Download PDFInfo
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Abstract
The application relates to a batch testing method system, a method, computer equipment and a storage medium for quality of storage particles, wherein the system comprises: the host terminal is connected with the MCU control panel in a USB (universal serial bus), network interface and CAN (controller area network) bus mode and is used for issuing test software and collecting and analyzing test data; the MCU control board is used for distributing the data received from the host computer end to a plurality of serial ports and sending a power supply, serial port data and control signals to the test unit array platform in a golden finger mode; the test unit array platform is used for expanding the number of the serial ports of the multi-path serial ports transmitted by the MCU control board; and the test unit is in butt joint with the test unit array platform through a serial port, receives the specific test task executed by the test software on the storage particles, and transmits the test result back to the host through the serial port. The invention can realize batch test of the storage particles and has good universality and compatibility.
Description
Technical Field
The invention relates to the technical field of solid state disk testing, in particular to a batch testing system and method for quality of storage particles, computer equipment and a storage medium.
Background
With the development of solid state disk technology and the falling of the price of the solid state disk, the application of the solid state disk is more and more popular, and various computer manufacturers make the hard disk in the computer equipment into the SSD to improve the performance of the computer. The performance of the whole hard disk is determined by the quality of a chip of the solid state hard disk, and the storage particles in the solid state hard disk are the key of the quality of the hard disk.
At present, in the traditional technology, as the storage particles such as FLASH, DDR, EMMC and the like are mainly produced by industry factories such as Samsung, Hirschmir, magnesian, modern and the like, downstream electronic manufacturers and independent product developers using the devices do not have the capability of performing quality detection on the storage particles for a moment, and can only detect the particle defects through complete machine detection after the products are produced, so that the production cost is increased. In addition, the storage particles are not detected in an industrialized batch manner in the conventional technology, and the requirement of the industrialized batch detection cannot be met along with the massive application of the storage particles in electronic products, and the conventional storage particle detection system generally has no good universality and expandability, so that the requirement of the rapid batch detection is difficult to meet.
Disclosure of Invention
In view of the above, there is a need to provide a batch test system, method, computer device and storage medium for quality of storage particles.
A batch test system for stored particle quality, the system comprising:
the host terminal is connected with the MCU control panel in a USB (universal serial bus), network interface and CAN (controller area network) bus mode and is used for issuing test software and collecting and analyzing test data;
the MCU control board is used for distributing the data received from the host computer end to a plurality of serial ports and sending a power supply, serial port data and control signals to the test unit array platform in a golden finger mode;
the test unit array platform is used for expanding the number of the serial ports of the multi-path serial ports transmitted by the MCU control board;
and the test unit is in butt joint with the test unit array platform through a serial port, receives the specific test task executed by the test software on the storage particles, and transmits the test result back to the host through the serial port.
In one embodiment, the signals provided to the test cell array platform by the golden finger include: the device comprises a serial port signal, a selection control signal of a Buffer expansion chip, a decoding signal of the Buffer expansion chip and a power supply signal; and defining the name and the sequence of each signal in the golden finger, the total number of PIN PINs and the number of PIN PINs occupied by each signal.
In one embodiment, the specific manner for defining the name, the sequence, the total number of PIN legs, and the number of PIN legs occupied by each signal of the gold finger includes:
UARTn _ RX and UARTn _ TX are defined as serial port signals; UARTn _ A/B/C is respectively defined as a 3-bit decoding signal of a serial port Buffer extension chip; defining the BUFFER _ C as a selection control signal of the BUFFER expansion chip; VCC represents a power supply signal provided to the test cell array platform by a golden finger; GND denotes a power ground reference pin.
In one embodiment, the test unit is connected with the test unit array platform in a pin form, a test power supply and a serial port signal are provided through the pin, and the test unit detects the storage particles in a corresponding mode by using a particle special controller and transmits a test result back to the host through a serial port.
A batch test method for quality of storage particles, the method applied to a batch test system for quality of storage particles as described in any one of the above methods comprises:
the host terminal is connected with the MCU control panel in a USB, network interface and CAN bus mode to issue test software and collect and analyze test data;
the MCU control board distributes the data received from the host computer end to a plurality of serial ports and issues a power supply, serial port data and control signals to the test unit array platform in the form of a golden finger;
the test unit array platform expands the number of the serial ports of the multi-path serial ports transmitted by the MCU control board;
the test unit receives the test software through the serial port to execute specific test tasks on the storage particles, and transmits the test results back to the host through the serial port.
In one embodiment, the method further comprises:
and defining the name and the sequence of each signal in the golden finger, the total number of PIN PINs and the number of PIN PINs occupied by each signal, wherein the signals provided by the golden finger for the test unit array platform comprise serial port signals, selection control signals of a Buffer expansion chip, decoding signals of the Buffer expansion chip and power signals.
In one embodiment, the step of defining the name and the sequence of each signal in the gold finger, the total number of PIN PINs, and the number of PIN PINs occupied by each signal specifically includes:
UARTn _ RX and UARTn _ TX are defined as serial port signals; UARTn _ A/B/C is respectively defined as a 3-bit decoding signal of a serial port Buffer extension chip; defining the BUFFER _ C as a selection control signal of the BUFFER expansion chip; VCC represents a power supply signal provided to the test cell array platform by a golden finger; GND denotes a power ground reference pin.
In one embodiment, the step of the test unit receiving the test software through the serial port to execute a specific test task on the memory particles and transmitting the test result back to the host through the serial port further includes:
and connecting the test unit with the test unit array platform in a pin mode, providing a test power supply and a serial port signal through the pin, detecting the storage particles in a corresponding mode, and transmitting a test result back to the host end through a serial port.
A computer device comprising a memory, a processor and a computer program stored on the memory and executable on the processor, the processor implementing the steps of any of the above methods when executing the computer program.
A computer-readable storage medium, on which a computer program is stored which, when being executed by a processor, carries out the steps of any of the methods described above.
The system, the method, the computer equipment and the storage medium for testing the quality of the storage particles in batches extend a multi-channel serial port array platform in batches through three communication ports (a USB (universal serial bus), a network port and a CAN (controller area network) bus) and an MCU (micro control unit) control board and a Buffer chip, each serial port CAN be connected with an independent testing unit, and after the independent units receive serial port testing instructions, the reliability, the electrical performance, the number of bad blocks and the communication speed of the storage particles CAN be tested according to required modes, so that the industrial requirement for screening the storage particles in batches is met. The general test unit array platform provided by the invention is decoupled from the test units, and the test can be carried out on the platform only by issuing a test scheme of test software through a serial port, so that the general test unit array platform has good universality. In addition, the hardware architecture of the test unit provided by the invention has strong compatibility, and on the premise of unchanging hardware design, the quality detection of different types of particles can be realized only by replacing the SOCKET seats of different particles, so that the defective storage particles are effectively intercepted, the production first pass rate of electronic products is improved, the service life of the electronic products is prolonged, and the production cost is reduced.
Drawings
FIG. 1 is a block diagram of a batch test system for storing grain quality in one embodiment;
FIG. 2 is a system schematic block diagram of a batch test system storing grain quality in one embodiment;
FIG. 3 is a schematic circuit diagram of an MCU control board controller according to an embodiment;
FIG. 4 is a schematic diagram of an embodiment of a circuit for controlling a sheet metal finger by an MCU;
FIG. 5 is an array expansion schematic of a test cell array platform according to one embodiment;
FIG. 6 is a schematic diagram of a serial expansion of an embodiment of a test cell array platform;
FIG. 7 is a diagram illustrating the connection between test cells and a test cell array platform according to one embodiment;
FIG. 8 is a diagram illustrating the definition of a gold finger signal according to one embodiment;
FIG. 9 is a schematic flow diagram of a batch test method for storage particle quality in one embodiment;
FIG. 10 is a diagram showing an internal structure of a computer device according to an embodiment.
Detailed Description
In order to make the objects, technical solutions and advantages of the present application more apparent, the present application is described in further detail below with reference to the accompanying drawings and embodiments. It should be understood that the specific embodiments described herein are merely illustrative of the present application and are not intended to limit the present application.
At present, in the traditional technology, as the storage particles such as FLASH, DDR, EMMC and the like are mainly produced by industry factories such as Samsung, Hirschmir, magnesian, modern and the like, downstream electronic manufacturers and independent product developers using the devices do not have the capability of performing quality detection on the storage particles for a moment, and can only detect the particle defects through complete machine detection after the products are produced, so that the production cost is increased. In addition, the storage particles are not detected in an industrialized batch manner in the conventional technology, and the requirement of the industrialized batch detection cannot be met along with the massive application of the storage particles in electronic products, and the conventional storage particle detection system generally has no good universality and expandability, so that the requirement of the rapid batch detection is difficult to meet.
Based on the above, the invention provides a batch testing system for the quality of storage particles, which aims to solve the capability of common electronic manufacturers and product developers to perform quality detection on the storage particles and can also meet the requirement of industrial batch detection.
In one embodiment, as shown in FIG. 1, there is provided a batch test system for stored particle quality, the system comprising:
the host end is connected with the MCU control panel in a USB, network interface and CAN bus mode and is used for issuing test software and collecting and analyzing test data;
the MCU control board is used for distributing the data received from the host computer to a plurality of serial ports and sending the power supply, the serial port data and the control signal to the test unit array platform in the form of a golden finger;
the test unit array platform is used for expanding the number of the serial ports of the multi-path serial ports transmitted by the MCU control board;
and the test unit is in butt joint with the test unit array platform through a serial port, receives the specific test task executed by the test software on the storage particles, and transmits the test result back to the host computer end through the serial port.
In this embodiment, a bulk test system for quality of storage particles is provided, an overall schematic diagram of the system is shown in fig. 2, and the system can be used for solving a problem of a batch test of storage particles by a common electronic manufacturer in a conventional technology, and specifically includes a host terminal, an MCU control board, a test unit array platform, and a test unit.
In one embodiment, the test unit is connected with the test unit array platform in a pin mode, a test power supply and a serial port signal are provided through the pin, the test unit detects the storage particles in a corresponding mode through the particle special controller, and test results are transmitted back to the host through the serial port.
Specifically, the host may use an industrial computer with a CAN bus to provide functions of issuing test firmware and collecting and analyzing test data. The host end is electrically connected with the MCU control panel through the LAN \ USB \ CAN bus. The MCU control board is connected with the test unit array platform through a pair of serial ports. The MCU control board is used for distributing the data received from the host computer end to a plurality of serial ports and sending the power supply, the serial port data and the control signals to the test unit array platform in the form of a golden finger.
The schematic diagram of the MCU control board is shown in fig. 3 and 4, an SMT32 series MCU is adopted to mainly convert USB/LAN/CAN signals into 8-channel serial port signals, and output related serial port extension control signals, and the test array platform is communicated with the test array platform through a golden finger.
The test unit array platform mainly performs secondary expansion on the number of serial ports of a plurality of paths of serial ports transmitted by the MCU, for example: each serial port can be expanded into at most 16 serial ports by using a Buffer chip, and it can be understood that the required number can be expanded according to actual needs in practical application. In a specific example, the expansion is actually expanded to 5 paths, and the total number is 40 paths, and the schematic block diagram of the array expansion is shown in fig. 5, and includes an expansion module with 8 serial ports. The internal schematic diagram of each serial port expansion module is shown in fig. 6, and the number of the serial ports expanded by each serial port can be expanded by increasing the number of Buffer chips, and the other 7 serial ports are similar. U5 is serial port expansion chip, adopts TI's CD4097BPW chip, and it is 3 position 8 in essence and selects 1 passageway switch, and through the gating signal that MCU provided, only 1 way switch switched on at every turn. The 1 to 5 groups of marks in fig. 6 correspond to 5 groups of extended serial ports and corresponding power ports and fixed positioning ports, and each group of ports is butted with one test unit. Each group of 3 pin row nuts are butted with independent test units.
The testing unit undertakes specific testing tasks on the particles, is in butt joint with the testing unit array platform through the serial port, receives serial port testing software, executes the particle testing tasks, and finally transmits testing results back to the host through the serial port.
Specifically, the test unit module is in butt joint with the test unit array platform by adopting three connectors, the test unit mainly adopts a particle special controller to detect the storage particles in a corresponding mode, the test unit is connected with the array platform by adopting a contact pin, the contact pin provides a test power supply and a serial port signal, and the specific connection relation can be shown in fig. 7.
In the above embodiment, through three communication ports (USB, network port, CAN bus), the MCU control board and the Buffer chip are used to expand the multi-channel serial port array platform in batch, each serial port CAN be connected to an independent test unit, and after the independent unit receives a serial port test instruction, the reliability, electrical performance, number of bad blocks, and communication rate of the storage particles CAN be tested in a desired mode, thereby meeting the industrial requirement of batch screening of the storage particles. The general test unit array platform provided in the embodiment is decoupled from the test units, and the test can be performed on the platform only by using a test scheme of issuing test software through a serial port, so that the general test unit array platform has good universality. In addition, the hardware architecture of the test unit provided in the embodiment has strong compatibility, and on the premise that the hardware design is not changed, the quality detection of different types of particles can be realized only by replacing SOCKET seats of different particles, so that defective storage particles are effectively intercepted, the production throughput and the service life of electronic products are improved, and the production cost is reduced.
In one embodiment, the signals provided to the test cell array platform by the golden finger include: the device comprises a serial port signal, a selection control signal of a Buffer expansion chip, a decoding signal of the Buffer expansion chip and a power supply signal; and defining the name and the sequence of each signal in the golden finger, the total number of PIN PINs and the number of PIN PINs occupied by each signal.
In a specific embodiment, the specific manner of defining the name, the sequence, the total number of PIN PINs, and the number of PIN PINs occupied by each signal in the gold finger includes: UARTn _ RX and UARTn _ TX are defined as serial port signals; UARTn _ A/B/C is respectively defined as a 3-bit decoding signal of a serial port Buffer extension chip; defining the BUFFER _ C as a selection control signal of the BUFFER expansion chip; VCC represents a power supply signal provided to the test cell array platform by a golden finger; GND denotes a power ground reference pin.
The gold finger signal used for communication is defined in the present embodiment. Specifically, in order to realize industrialized application, after the basic serial port is expanded by the MCU control board, the following signals are provided for the serial port test array platform through the golden finger: the device comprises a UART signal, a Buffer extension chip gating control signal, a Buffer extension chip 3-bit decoding channel selection signal and a power supply signal. The signal definition type of the golden finger in the system needs protection; the names and the sequences of the signals in the golden finger, the total number of the PIN PINs, the number of the PIN PINs occupied by the signals and the power supply voltage can be replaced, and the definition type of the golden finger signals is shown in fig. 8.
The UARTn _ RX and the UARTn _ TX represent serial port signals; UARTn _ A/B/C respectively represents a 3-bit decoding signal of a serial port buffer chip; the BUFFER _ C represents a selection control signal of the BUFFER chip. Specifically, on the serial port array test platform, 1 or more Buffer chips may be adopted as needed, and when there are multiple Buffer chips, a BUFFFERn _ C signal is needed to select which chip to perform extended decoding. VCC represents a power supply provided for the serial port array test platform through a golden finger, and the voltage value is not limited; GND represents a power ground reference pin; in order to ensure the reliability of signal transmission and the current through-current capacity, a plurality of gold finger PIN PINs are multiplexed in each type of signal, and the specific number of the PIN PINs is not determined. In addition, the position and the sequence of each type of signal on the gold finger are not limited.
In the above embodiment, the system can simultaneously test 80PCS particles, and 30 sets of hardware systems of the present invention can be installed in one set of chassis, that is, particles above 2400PCS can be simultaneously tested, and thus, the requirement of electronic manufacturers on batch testing of storage particles can be completely met. In addition, the system can effectively intercept defective particles, improve the first production yield and the service life of electronic products, and reduce the production cost.
In one embodiment, as shown in fig. 9, there is provided a batch test method for quality of storage particles, which is applied to the batch test system for quality of storage particles of any of the above embodiments, and includes:
step 902, connecting a host end with an MCU control board in a USB, network interface and CAN bus mode to issue test software and collect and analyze test data;
904, the MCU control board distributes the data received from the host computer to a plurality of serial ports and issues the power supply, the serial port data and the control signal to the test unit array platform in the form of a golden finger;
step 908, the test unit receives the test software through the serial port to execute a specific test task on the memory particles, and transmits the test result back to the host through the serial port.
In one embodiment, the method further comprises: and defining the name and the sequence of each signal in the golden finger, the total number of PIN PINs and the number of PIN PINs occupied by each signal, wherein the signals provided by the golden finger for the test unit array platform comprise serial port signals, selection control signals of a Buffer expansion chip, decoding signals of the Buffer expansion chip and power signals.
In one embodiment, the step of defining the name, the sequence, the total number of PIN legs, and the number of PIN legs occupied by each signal of the gold finger specifically includes: UARTn _ RX and UARTn _ TX are defined as serial port signals; UARTn _ A/B/C is respectively defined as a 3-bit decoding signal of a serial port Buffer extension chip; defining the BUFFER _ C as a selection control signal of the BUFFER expansion chip; VCC represents a power supply signal provided to the test cell array platform by a golden finger; GND denotes a power ground reference pin.
In one embodiment, the step of the test unit receiving the test software through the serial port to execute a specific test task on the memory particles and transmitting the test result back to the host through the serial port further includes: the test unit is connected with the test unit array platform in a pin mode, a test power supply and a serial port signal are provided through the pin, the corresponding mode detection is carried out on the storage particles, and the test result is transmitted back to the host end through the serial port.
For specific definition of the batch test method for the quality of the storage particles, reference may be made to the above definition of the batch test system for the quality of the storage particles, and details are not described herein again.
In one embodiment, a computer device is provided, the internal structure of which may be as shown in FIG. 10. The computer device includes a processor, a memory, and a network interface connected by a system bus. Wherein the processor of the computer device is configured to provide computing and control capabilities. The memory of the computer device comprises a nonvolatile storage medium and an internal memory. The non-volatile storage medium stores an operating system, a computer program, and a database. The internal memory provides an environment for the operation of an operating system and computer programs in the non-volatile storage medium. The network interface of the computer device is used for communicating with an external terminal through a network connection. The computer program is executed by a processor to implement a batch testing method of stored grain quality.
Those skilled in the art will appreciate that the architecture shown in fig. 10 is merely a block diagram of some of the structures associated with the disclosed aspects and is not intended to limit the computing devices to which the disclosed aspects apply, as particular computing devices may include more or less components than those shown, or may combine certain components, or have a different arrangement of components.
In one embodiment, a computer device is provided, comprising a memory, a processor and a computer program stored on the memory and executable on the processor, the processor implementing the steps of the above method embodiments when executing the computer program.
In one embodiment, a computer-readable storage medium is provided, on which a computer program is stored, which, when being executed by a processor, carries out the steps of the above respective method embodiments.
It will be understood by those skilled in the art that all or part of the processes of the methods of the embodiments described above can be implemented by hardware instructions of a computer program, which can be stored in a non-volatile computer-readable storage medium, and when executed, can include the processes of the embodiments of the methods described above. Any reference to memory, storage, database, or other medium used in the embodiments provided herein may include non-volatile and/or volatile memory, among others. Non-volatile memory can include read-only memory (ROM), Programmable ROM (PROM), Electrically Programmable ROM (EPROM), Electrically Erasable Programmable ROM (EEPROM), or flash memory. Volatile memory can include Random Access Memory (RAM) or external cache memory. By way of illustration and not limitation, RAM is available in a variety of forms such as Static RAM (SRAM), Dynamic RAM (DRAM), Synchronous DRAM (SDRAM), Double Data Rate SDRAM (DDRSDRAM), Enhanced SDRAM (ESDRAM), Synchronous Link DRAM (SLDRAM), Rambus Direct RAM (RDRAM), direct bus dynamic RAM (DRDRAM), and memory bus dynamic RAM (RDRAM).
The technical features of the above embodiments can be arbitrarily combined, and for the sake of brevity, all possible combinations of the technical features in the above embodiments are not described, but should be considered as the scope of the present specification as long as there is no contradiction between the combinations of the technical features.
The above-mentioned embodiments only express several embodiments of the present application, and the description thereof is more specific and detailed, but not construed as limiting the scope of the invention. It should be noted that, for a person skilled in the art, several variations and modifications can be made without departing from the concept of the present application, which falls within the scope of protection of the present application. Therefore, the protection scope of the present patent shall be subject to the appended claims.
Claims (10)
1. A batch test system for stored particle quality, the system comprising:
the host terminal is connected with the MCU control panel in a USB (universal serial bus), network interface and CAN (controller area network) bus mode and is used for issuing test software and collecting and analyzing test data;
the MCU control board is used for distributing the data received from the host computer end to a plurality of serial ports and sending a power supply, serial port data and control signals to the test unit array platform in a golden finger mode;
the test unit array platform is used for expanding the number of the serial ports of the multi-path serial ports transmitted by the MCU control board;
and the test unit is in butt joint with the test unit array platform through a serial port, receives the specific test task executed by the test software on the storage particles, and transmits the test result back to the host through the serial port.
2. The batch test system for storage particle quality of claim 1, wherein the signal provided by the golden finger to the test cell array platform comprises: the device comprises a serial port signal, a selection control signal of a Buffer expansion chip, a decoding signal of the Buffer expansion chip and a power supply signal; and defining the name and the sequence of each signal in the golden finger, the total number of PIN PINs and the number of PIN PINs occupied by each signal.
3. The batch test system for the quality of the stored particles according to claim 2, wherein the specific manner for defining the name, the sequence, the total number of PIN PINs and the number of PIN PINs occupied by each signal of the golden finger comprises:
UARTn _ RX and UARTn _ TX are defined as serial port signals; UARTn _ A/B/C is respectively defined as a 3-bit decoding signal of a serial port Buffer extension chip; defining the BUFFER _ C as a selection control signal of the BUFFER expansion chip; VCC represents a power supply signal provided to the test cell array platform by a golden finger; GND denotes a power ground reference pin.
4. The batch test system for the quality of the storage particles as claimed in claim 3, wherein the test unit is connected with the test unit array platform in the form of pins, test power and serial port signals are provided through the pins, the test unit uses a particle-dedicated controller to perform corresponding mode detection on the storage particles and transmits the test result back to the host through the serial port.
5. A batch test method for the quality of stored particles, which is applied to the batch test system for the quality of stored particles according to any one of claims 1 to 4, and comprises the following steps:
the host terminal is connected with the MCU control panel in a USB, network interface and CAN bus mode to issue test software and collect and analyze test data;
the MCU control board distributes the data received from the host computer end to a plurality of serial ports and issues a power supply, serial port data and control signals to the test unit array platform in the form of a golden finger;
the test unit array platform expands the number of the serial ports of the multi-path serial ports transmitted by the MCU control board;
the test unit receives the test software through the serial port to execute specific test tasks on the storage particles, and transmits the test results back to the host through the serial port.
6. The batch test method for storage pellet quality of claim 5, further comprising:
and defining the name and the sequence of each signal in the golden finger, the total number of PIN PINs and the number of PIN PINs occupied by each signal, wherein the signals provided by the golden finger for the test unit array platform comprise serial port signals, selection control signals of a Buffer expansion chip, decoding signals of the Buffer expansion chip and power signals.
7. The batch test method for the quality of the storage particles as claimed in claim 6, wherein the step of defining the name, the sequence, the total number of the PIN PINs and the number of the PIN PINs occupied by each signal of the golden finger specifically comprises:
UARTn _ RX and UARTn _ TX are defined as serial port signals; UARTn _ A/B/C is respectively defined as a 3-bit decoding signal of a serial port Buffer extension chip; defining the BUFFER _ C as a selection control signal of the BUFFER expansion chip; VCC represents a power supply signal provided to the test cell array platform by a golden finger; GND denotes a power ground reference pin.
8. The batch test method for the quality of the storage particles as claimed in claim 7, wherein the step of the test unit receiving the test software through the serial port to execute a specific test task on the storage particles and transmitting the test result back to the host through the serial port further comprises:
and connecting the test unit with the test unit array platform in a pin mode, providing a test power supply and a serial port signal through the pin, detecting the storage particles in a corresponding mode, and transmitting a test result back to the host end through a serial port.
9. A computer device comprising a memory, a processor and a computer program stored on the memory and executable on the processor, characterized in that the steps of the method according to any of claims 5 to 8 are implemented by the processor when executing the computer program.
10. A computer-readable storage medium, on which a computer program is stored, which, when being executed by a processor, carries out the steps of the method of any one of claims 5 to 8.
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| CN114116566A (en) * | 2021-11-29 | 2022-03-01 | 厦门市思芯微科技有限公司 | Serial port expansion system based on multi-path grouping scheduling algorithm |
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