CN112304569A - EMCCD refrigeration testing arrangement - Google Patents
EMCCD refrigeration testing arrangement Download PDFInfo
- Publication number
- CN112304569A CN112304569A CN202011024216.3A CN202011024216A CN112304569A CN 112304569 A CN112304569 A CN 112304569A CN 202011024216 A CN202011024216 A CN 202011024216A CN 112304569 A CN112304569 A CN 112304569A
- Authority
- CN
- China
- Prior art keywords
- emccd
- cooling water
- dustcoat
- test jig
- refrigeration
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
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- 238000012360 testing method Methods 0.000 title claims abstract description 50
- 238000005057 refrigeration Methods 0.000 title claims abstract description 20
- 239000000498 cooling water Substances 0.000 claims abstract description 25
- 238000012545 processing Methods 0.000 claims abstract description 14
- 230000000694 effects Effects 0.000 abstract description 3
- 238000003825 pressing Methods 0.000 description 8
- 230000017525 heat dissipation Effects 0.000 description 3
- 238000003384 imaging method Methods 0.000 description 3
- 238000000034 method Methods 0.000 description 3
- 230000000149 penetrating effect Effects 0.000 description 3
- 238000010586 diagram Methods 0.000 description 2
- 238000011056 performance test Methods 0.000 description 2
- 238000001816 cooling Methods 0.000 description 1
- 230000007547 defect Effects 0.000 description 1
- 238000005538 encapsulation Methods 0.000 description 1
- 238000011156 evaluation Methods 0.000 description 1
- 230000003287 optical effect Effects 0.000 description 1
- 238000012536 packaging technology Methods 0.000 description 1
- 239000004065 semiconductor Substances 0.000 description 1
- 230000035945 sensitivity Effects 0.000 description 1
- 238000012546 transfer Methods 0.000 description 1
Images
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01M—TESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
- G01M11/00—Testing of optical apparatus; Testing structures by optical methods not otherwise provided for
-
- F—MECHANICAL ENGINEERING; LIGHTING; HEATING; WEAPONS; BLASTING
- F25—REFRIGERATION OR COOLING; COMBINED HEATING AND REFRIGERATION SYSTEMS; HEAT PUMP SYSTEMS; MANUFACTURE OR STORAGE OF ICE; LIQUEFACTION SOLIDIFICATION OF GASES
- F25B—REFRIGERATION MACHINES, PLANTS OR SYSTEMS; COMBINED HEATING AND REFRIGERATION SYSTEMS; HEAT PUMP SYSTEMS
- F25B21/00—Machines, plants or systems, using electric or magnetic effects
- F25B21/02—Machines, plants or systems, using electric or magnetic effects using Peltier effect; using Nernst-Ettinghausen effect
Abstract
The invention provides an EMCCD refrigeration testing device, which is characterized in that: it includes dustcoat (1), be equipped with test jig (2) in dustcoat (1), be connected with light source (2) on dustcoat (1) on test jig (2), it has gone into still to have corresponded complex cooling water with test jig (2) and has advanced pipe (3) and cooling water exit tube (4) on dustcoat (1), it is equipped with control valve (3 a) to advance to manage (3) to advance at the cooling water, still be equipped with in dustcoat (1) the outside with test jig (2), light source (2) and control valve (3 a) form signal connection complex data processing control unit (5). The device has the advantages of simple structure, convenience in use and good test effect, and can be used for testing the EMCCD at a stable low temperature.
Description
The technical field is as follows:
the invention relates to the field of CCD (charge coupled device) testing, in particular to an EMCCD refrigeration testing device.
Background art:
the invention relates to the technical field of EMCCD test, in particular to an EMCCD refrigeration test system comprising a refrigerator and a temperature sensor.
An Electron multiplying CCD (EMCCD) is a great breakthrough in the field of low-light-level imaging, signal charges are amplified in the transfer process by embedding a controllable gain register, so that all-solid-state imaging is realized, the EMCCD has the characteristics of high sensitivity and high frame frequency, the signal-to-noise ratio is seriously influenced by temperature, the lower the temperature is, the smaller the noise of a dark signal is, the larger the Electron multiplying gain is, and the higher the signal-to-noise ratio is. Therefore, the performance of the EMCCD can be greatly improved.
At present, the EMCCD mostly adopts a refrigeration packaging technology, wherein semiconductor refrigeration (TEC) is a technology widely adopted for refrigerating EMCCD chips. The EMCCD that adopts refrigeration encapsulation generally needs its work to go on under 0 ℃ or lower fixed temperature when testing, because during the refrigeration of refrigeration piece, the back can produce the heat, if in time go out the heat conduction, will seriously influence the performance of refrigeration piece for the operating temperature of EMCCD chip can not keep under the constant temperature. The traditional EMCCD refrigeration test can adopt the mode that the device is placed in a high-temperature box and a low-temperature box, but the connecting line is very long, and the performance test and evaluation of the EMCCD at a high frame frequency are influenced.
The invention content is as follows:
the invention aims to overcome the defects in the prior art, and provides an EMCCD refrigeration testing device.
The application provides the following technical scheme:
the utility model provides an EMCCD refrigeration testing arrangement which characterized in that: the test jig comprises an outer cover, a test jig is arranged in the outer cover, a light source is connected in the outer cover above the test jig, a cooling water inlet pipe and a cooling water outlet pipe which are matched with the test jig correspondingly are also led in the outer cover, a control valve is arranged on the cooling water inlet pipe, and a data processing control unit which is matched with the test jig, the light source and the control valve in an electric signal connection mode is also arranged outside the outer cover.
On the basis of the technical scheme, the following further technical scheme can be provided:
the testing frame comprises a bottom plate, two sockets which are correspondingly matched with pins of the EMCCD device are arranged on the bottom plate, a heat exchanger which is connected and matched with a cooling water inlet pipe and a cooling water outlet pipe is arranged between the sockets, a pressing plate is arranged on the heat exchanger, lock bolts which are connected with the bottom plate are arranged at two ends of the pressing plate, and springs are sleeved on the lock bolts between the pressing plate and the bottom plate in a penetrating manner.
The data processing control unit comprises an upper computer, a testing machine and a TEC controller.
The invention has the advantages that:
the device has the advantages of simple structure, convenience in use and good test effect, and can be used for testing the EMCCD at a stable low temperature. Particularly, the heat dissipation of the EMCCD during refrigeration work is realized by adopting a water-cooling heat dissipation mode, the heat dissipation effect is good, and the EMCCD performance test at the temperature of minus 20 ℃ can be realized.
Description of the drawings:
FIG. 1 is a schematic structural view of the present invention;
FIG. 2 is a schematic diagram of the EMCCD assembled on the test rack 2;
fig. 3 is a schematic diagram of the exploded structure of fig. 2.
The specific implementation mode is as follows:
as shown in fig. 1-3, an EMCCD refrigeration testing device includes an outer cover 1, a testing frame 2 is arranged in the outer cover 1, a light source 1a is connected to the outer cover 1 on the testing frame 2, and the light source 1a is an electric lamp capable of adjusting light intensity in the prior art.
The test jig 2 comprises a rectangular bottom plate 2a, and two sockets 2b correspondingly matched with pins of the EMCCD device are arranged in the middle of the bottom plate 2 a. The two sockets 2b are distributed at intervals along the width direction of the bottom plate 2a, and a group of slots 2k correspondingly matched with pins 6a of the EMCCD device 6 to be tested are distributed on the side wall of the outer side of each socket 2 b.
A heat exchanger 2c distributed along the length direction of the bottom plate 2a is inserted between the two sockets, and two side walls of the heat exchanger 2c are respectively contacted with the inner side walls of different sockets 2 b. A cooling water inlet 2h is arranged at one end part of one side of the heat exchanger 2c, and a cooling water outlet 2g is arranged at the other end of the same side of the heat exchanger 2 c.
The top of the heat exchanger 2c is provided with a pressing plate 2d which is distributed in parallel along the bottom plate 2a, the end parts of the two ends of the pressing plate 2d are all provided with bolts 2e connected with the bottom plate 2a in a penetrating way, and a spring 2f is also sleeved on the lock plunger 2e between the pressing plate 2d and the bottom plate 2a in a penetrating way. The pressing plate 2d and the heat exchanger 2c can also be of an integrated structure.
A cooling water inlet pipe 3 communicated with a cooling water inlet 2h and a cooling water outlet pipe 4 communicated with a cooling water outlet 2g are respectively led into the outer cover 1, and a control valve 3a for controlling the flow is also arranged on the cooling water inlet pipe 3 at the outer side of the outer cover 1.
The outer side of the outer cover 1 is provided with a data processing control unit 5, and the control unit 5 forms electric signal connection and matching with the test rack 2, the light source 1a and the control valve 3a through cables. The data processing control unit 5 comprises an upper computer 5a, a testing machine 5b and a TEC controller 5 c.
The working process is as follows:
firstly, an EMCCD device 6 to be detected is placed on the pressing plate 2d, so that pins 6a on two sides of the EMCCD device 6 are respectively inserted into the slots 2k of the corresponding sockets 2b and attached to the slot walls.
Then, the cooling water inlet pipe 3 is communicated with the cooling water inlet 2h, the cooling water outlet pipe 4 is communicated with the cooling water outlet 2g, and then a plug of a cable on the data processing control unit 5 is connected with the socket inside the bottom plate 2a, so that the bottom plate 2a, the socket 2b and the EMCCD device 6 are matched with the data processing control unit 5 in an electric signal connection mode. And the plug of another cable on the data processing control unit 5 is communicated with the light source 1a and is electrically connected with the light source.
Then with the dustcoat back-off on test jig 2 to isolated outside light has avoided the interference of external light signal when testing.
An upper computer 5a in the data processing control unit 5 provides a power supply signal, a pulse driving signal and an optical signal for the EMCCD device 6 placed on the test frame 2 through a control test machine 5b, meanwhile, the test machine 5b processes an output signal of the EMCCD device 6 and feeds the processed output signal back to the upper computer 5a, and the upper computer 5a performs imaging display and data processing on the received signal. Meanwhile, the upper computer 5a sends an electric signal to the light source 1a through the control testing machine 5b to control the intensity of the released light.
An upper computer 5a in the data processing control unit 5 provides a refrigeration control signal and a temperature sensor control signal for an EMCCD device placed on the placing test frame 2 through controlling a TEC controller 5c, and meanwhile, the TEC controller 5c feeds back the working temperature value of the EMCCD device to the upper computer 5 a.
The upper computer 5a in the data processing control unit 5 controls the opening and closing size of the control valve 3a according to the data fed back by the TEC controller 5c and the testing machine 5b to further control the flow rate of the cooling water, thereby controlling the temperature of the EMCCD device (for convenience of view, cables communicated with the control valve 3a are not shown in the figure).
Claims (3)
1. The utility model provides an EMCCD refrigeration testing arrangement which characterized in that: it includes dustcoat (1), be equipped with test jig (2) in dustcoat (1), it has light source (1 a) to connect in dustcoat (1) of test jig (2) top, it has cooling water who corresponds complex with test jig (2) to advance pipe (3) and cooling water exit tube (4) still to let in on dustcoat (1), it is equipped with control valve (3 a) to advance pipe (3) at the cooling water, still be equipped with in dustcoat (1) the outside with test jig (2), light source (1 a) and control valve (3 a) form signal connection complex data processing control unit (5).
2. An EMCCD refrigeration testing device according to claim 1, wherein: test jig (2) include bottom plate (2 a), be equipped with two on bottom plate (2 a) and correspond complex socket (2 b) with EMCCD device pin, be equipped with between socket (2 b) and advance pipe (3) and cooling water exit tube (4) with the cooling water and be connected complex heat exchanger (2 c), be equipped with clamp plate (2 d) on heat exchanger (2 c), be equipped with set bar (2 e) of being connected with bottom plate (2 a) at clamp plate (2 d) both ends, wear to overlap on set bar (2 e) between clamp plate (2 d) and bottom plate (2 a) and have spring (2 f).
3. An EMCCD refrigeration testing device according to claim 1, wherein: the data processing control unit (5) comprises an upper computer (5 a), a testing machine (5 b) and a TEC controller (5 c).
Priority Applications (1)
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CN202011024216.3A CN112304569A (en) | 2020-09-25 | 2020-09-25 | EMCCD refrigeration testing arrangement |
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CN202011024216.3A CN112304569A (en) | 2020-09-25 | 2020-09-25 | EMCCD refrigeration testing arrangement |
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Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN113794847A (en) * | 2021-09-23 | 2021-12-14 | 华东光电集成器件研究所 | Multi-channel adjustable pulse signal source for electron multiplication CCD |
Citations (9)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2006033031A (en) * | 2004-07-12 | 2006-02-02 | Casio Comput Co Ltd | Portable image photography system |
US20060151796A1 (en) * | 2002-10-10 | 2006-07-13 | Hiroya Kobayashi | Photo-detection device and manufacturing method thereof |
CN103196947A (en) * | 2013-04-01 | 2013-07-10 | 上海理工大学 | Thermoelectric performance measuring device and measuring method of thermoelectric refrigeration chip |
CN103698105A (en) * | 2013-12-25 | 2014-04-02 | 浙江大学 | Vacuum water-cooling testing device |
CN104062990A (en) * | 2014-07-22 | 2014-09-24 | 徐云鹏 | Noise reduction and temperature control system based on semiconductor refrigeration mechanism |
CN207675846U (en) * | 2017-12-25 | 2018-07-31 | 珠海蓝网电气设备有限公司 | A kind of measurement jig of high frequency transformer |
CN208433308U (en) * | 2018-08-01 | 2019-01-25 | 无锡新畅电子有限公司 | High-pressure installation is made in a kind of transformer mark |
CN209117777U (en) * | 2018-11-15 | 2019-07-16 | 深圳市沃肯达科技有限公司 | A kind of high-precision high frequency transformer probe tester |
CN110456250A (en) * | 2019-09-16 | 2019-11-15 | 中国科学技术大学 | A kind of measurement method and measuring device of TEC refrigeration performance |
-
2020
- 2020-09-25 CN CN202011024216.3A patent/CN112304569A/en active Pending
Patent Citations (9)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US20060151796A1 (en) * | 2002-10-10 | 2006-07-13 | Hiroya Kobayashi | Photo-detection device and manufacturing method thereof |
JP2006033031A (en) * | 2004-07-12 | 2006-02-02 | Casio Comput Co Ltd | Portable image photography system |
CN103196947A (en) * | 2013-04-01 | 2013-07-10 | 上海理工大学 | Thermoelectric performance measuring device and measuring method of thermoelectric refrigeration chip |
CN103698105A (en) * | 2013-12-25 | 2014-04-02 | 浙江大学 | Vacuum water-cooling testing device |
CN104062990A (en) * | 2014-07-22 | 2014-09-24 | 徐云鹏 | Noise reduction and temperature control system based on semiconductor refrigeration mechanism |
CN207675846U (en) * | 2017-12-25 | 2018-07-31 | 珠海蓝网电气设备有限公司 | A kind of measurement jig of high frequency transformer |
CN208433308U (en) * | 2018-08-01 | 2019-01-25 | 无锡新畅电子有限公司 | High-pressure installation is made in a kind of transformer mark |
CN209117777U (en) * | 2018-11-15 | 2019-07-16 | 深圳市沃肯达科技有限公司 | A kind of high-precision high frequency transformer probe tester |
CN110456250A (en) * | 2019-09-16 | 2019-11-15 | 中国科学技术大学 | A kind of measurement method and measuring device of TEC refrigeration performance |
Non-Patent Citations (2)
Title |
---|
田大垒等: "基于热电制冷的大功率LED散热性能分析", 《电子与封装》 * |
钱月红: "EMCCD光电性能参数测试方法研究", 《中国优秀硕士学位论文全文数据库(电子期刊)信息科技辑》 * |
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN113794847A (en) * | 2021-09-23 | 2021-12-14 | 华东光电集成器件研究所 | Multi-channel adjustable pulse signal source for electron multiplication CCD |
CN113794847B (en) * | 2021-09-23 | 2023-05-09 | 华东光电集成器件研究所 | Multi-path adjustable pulse signal source for electron multiplication CCD |
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Application publication date: 20210202 |
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