CN112198419A - Automatic test system for PCB - Google Patents
Automatic test system for PCB Download PDFInfo
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- CN112198419A CN112198419A CN202011145519.0A CN202011145519A CN112198419A CN 112198419 A CN112198419 A CN 112198419A CN 202011145519 A CN202011145519 A CN 202011145519A CN 112198419 A CN112198419 A CN 112198419A
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- 238000012360 testing method Methods 0.000 title claims abstract description 107
- 239000000523 sample Substances 0.000 claims abstract description 30
- 238000004458 analytical method Methods 0.000 claims abstract description 22
- 230000005284 excitation Effects 0.000 claims abstract description 19
- 238000012545 processing Methods 0.000 claims abstract description 7
- 238000006243 chemical reaction Methods 0.000 claims description 21
- 238000001914 filtration Methods 0.000 claims description 9
- 150000003071 polychlorinated biphenyls Chemical class 0.000 abstract description 18
- 238000000034 method Methods 0.000 abstract description 3
- 238000007726 management method Methods 0.000 description 4
- 238000012986 modification Methods 0.000 description 2
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- 230000002093 peripheral effect Effects 0.000 description 2
- 238000012546 transfer Methods 0.000 description 2
- 238000013500 data storage Methods 0.000 description 1
- 238000010586 diagram Methods 0.000 description 1
- 238000009434 installation Methods 0.000 description 1
- 238000011031 large-scale manufacturing process Methods 0.000 description 1
- 238000004806 packaging method and process Methods 0.000 description 1
- 238000013522 software testing Methods 0.000 description 1
- 238000003466 welding Methods 0.000 description 1
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
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Abstract
The invention discloses an automatic test system of PCB, which stores test programs through a test host, can select corresponding test programs according to different PCBs to be tested, sends corresponding test instructions, a direct current source provides corresponding direct current excitation signals to the PCBs to be tested according to the test instructions, the direct current excitation signals are applied to components on the PCBs to be tested through probes on a probe board, meanwhile, a multi-way selector switch switches the probes to be in corresponding off states or on states according to the specific positions of the current components to be tested, finally, response signals measured by the components on the PCBs to be tested are uploaded to a test analysis module through the probes, signal processing and operational analysis are carried out through the test analysis module, and test results are obtained, namely, the test process of the PCBs is controlled by an electronic circuit, compared with the prior art, the automatic test of the PCBs controlled by the circuit can be realized, the test efficiency of the PCB is improved, and the reliability of the test is ensured.
Description
Technical Field
The invention relates to the technical field of test equipment, in particular to an automatic test system for a PCB (printed circuit board).
Background
The PCB is an important electronic component, and almost all electronic devices need to be supported by the PCB, so the PCB is the highest market share among electronic component products all over the world. After welding and packaging each component on the PCB, the components on the PCB need to be tested to ensure that the output PCB is a qualified product, thereby providing guarantee for installation of the PCB or subsequent factory sale of the PCB and the like.
At present, the test of simple PCB board can be accomplished through the manual work, but along with the PCB board is more and more complicated, components and parts on the PCB board are also more and more, and artifical efficiency of software testing is too low, and the human cost is more and more high, has not been suitable for large-scale production, and artifical test introduces all kinds of errors easily moreover, and the reliability is poor.
Disclosure of Invention
In order to solve the technical problems, the invention provides an automatic test system for a PCB, which can realize the automatic test of the PCB controlled by a circuit, improve the test efficiency of the PCB and ensure the test reliability.
The invention provides an automatic test system of a PCB, comprising:
the test host is used for selecting a test program and sending a test instruction;
the direct current source is used for providing a corresponding direct current excitation signal according to the test instruction;
the probe board is provided with a probe for connecting with a component on the PCB to be tested;
the multi-path selector switch is arranged between the direct current source and the probe board and used for switching the probe into an off state or an on state;
and the test analysis module is used for carrying out signal processing and operation analysis on the response signals measured from the components on the PCB to be tested to obtain test results.
Preferably, the direct current source comprises a current source for providing a constant current excitation signal and a voltage source for providing a constant voltage excitation signal.
Preferably, the current source includes a first digital-to-analog converter DAC and a voltage-to-current conversion unit.
Preferably, the voltage source comprises a second digital to analog converter, DAC, and a power management chip.
Preferably, the test analysis module includes a plurality of analog switches, an analog-to-digital conversion unit and a microprocessor, an input end of the plurality of analog switches is connected to the probe, an output end of the plurality of analog switches is connected to an input end of the analog-to-digital conversion unit, and an output end of the analog-to-digital conversion unit is connected to the microprocessor.
Preferably, the test analysis module further includes a filtering unit and a differential amplifying unit, an input end of the filtering unit is connected to an output end of the multi-path analog switch, an output end of the filtering unit is connected to an input end of the differential amplifying unit, and an output end of the differential amplifying unit is connected to an input end of the analog-to-digital conversion unit.
Preferably, the test host is provided with a display screen for displaying the test result.
Preferably, the microprocessor is a single chip microcomputer or an MCU.
The PCB automatic test system provided by the invention stores test programs through the test host, can select corresponding test programs according to different PCBs to be tested, sends corresponding test instructions, the direct current source provides corresponding direct current excitation signals to the PCBs to be tested according to the test instructions, the direct current excitation signals are applied to components on the PCBs to be tested through the probes on the probe plates, meanwhile, the multi-way selector switch switches the probes into corresponding off states or on states according to the specific positions of the current components to be tested, finally, response signals measured by the components on the PCBs to be tested are uploaded to the test analysis module through the probes, signal processing and operational analysis are carried out through the test analysis module, and test results are obtained, namely, the test process of the PCBs is controlled by an electronic circuit, compared with the prior art, the automatic test of the PCBs controlled by the circuit can be realized, the test efficiency of the PCB is improved, and the reliability of the test is ensured.
Drawings
In order to more clearly illustrate the embodiments of the present application or the technical solutions in the prior art, the drawings needed to be used in the description of the embodiments or the prior art will be briefly described below, it is obvious that the drawings in the following description are only some embodiments described in the present application, and other drawings can be obtained by those skilled in the art without creative efforts.
Fig. 1 is a schematic structural diagram of an automatic PCB testing system according to an embodiment of the present invention.
Detailed Description
In order to make those skilled in the art better understand the technical solutions in the present application, the technical solutions in the embodiments of the present application will be clearly and completely described below with reference to the drawings in the embodiments of the present application, and it is obvious that the described embodiments are only a part of the embodiments of the present application, and not all of the embodiments.
It will be understood that when an element is referred to as being "fixed" or "disposed" on another element, it can be directly on the other element or be indirectly disposed on the other element; when an element is referred to as being "connected to" another element, it can be directly connected to the other element or be indirectly connected to the other element.
It will be understood that the terms "length," "width," "upper," "lower," "front," "rear," "left," "right," "vertical," "horizontal," "top," "bottom," "inner," "outer," and the like, as used herein, refer to an orientation or positional relationship indicated in the drawings that is solely for the purpose of facilitating the description and simplifying the description, and do not indicate or imply that the device or element being referred to must have a particular orientation, be constructed and operated in a particular orientation, and thus should not be considered as limiting the present application.
Furthermore, the terms "first", "second" and "first" are used for descriptive purposes only and are not to be construed as indicating or implying relative importance or implicitly indicating the number of technical features indicated. Thus, a feature defined as "first" or "second" may explicitly or implicitly include one or more of that feature. In the description of the present application, the meaning of a plurality of or a plurality of is two or more unless specifically limited otherwise.
It should be understood that the structures, ratios, sizes, and the like shown in the drawings and described in the specification are only used for understanding and reading the contents disclosed in the specification, and are not used for limiting the conditions that the present application can implement, so the present invention has no technical significance, and any structural modification, ratio relationship change or size adjustment should still fall within the scope of the technical content disclosed in the present application without affecting the efficacy and the achievable purpose of the present application.
Referring to fig. 1, an embodiment of the present invention provides an automatic PCB testing system, including:
a test host 100 for selecting a test program and sending a test command;
a dc source 200, configured to provide a corresponding dc excitation signal according to the test instruction;
the probe board 300, the probe board 300 is equipped with the probe used for connecting with the device on the PCB board to be tested;
a multi-way switch 400 disposed between the dc source 200 and the probe card 300 for switching the probe to an off state or an on state;
and the test analysis module 500 is configured to perform signal processing and operation analysis on the response signal measured from the device on the PCB to be tested, so as to obtain a test result.
In the embodiment of the present invention, the test host 100 stores a test program, and can select a corresponding test program according to different PCBs to be tested, and send a corresponding test instruction, the dc source 200 provides a corresponding dc excitation signal to the PCBs to be tested according to the test instruction, the probe board 300 is provided with a probe for connecting to a device on the PCBs to be tested, the mux switch 400 switches the probe to a corresponding off state or on state according to the specific position of the device to be tested, and applies the dc excitation signal to the device on the PCBs to be tested through the probe, and finally, a response signal measured from the device on the PCBs to be tested is uploaded to the test analysis module 500 through the probe, and the test analysis module 500 performs signal processing and operational analysis to obtain a test result, that is, the test process of the PCBs is controlled by an electronic circuit, compared with the prior art, the automatic test of the PCB can be controlled by the circuit, the test efficiency of the PCB is improved, and the test reliability is ensured.
In specific implementation, the test program may be programmed secondarily in the test host 100 according to actual test requirements. Specifically, for a specific test requirement, in the operation interface of the test host 100, the test parameters or the test steps are changed, so that the test requirements of different PCB boards can be met. After the secondary programming, the file can be filed in time and can be directly called next time without programming again.
Specifically, in the above embodiment, the test host 100 is provided with a display screen for displaying the test result. Specifically, the test host 100 is connected with the test analysis module 500, and the test analysis module 500 uploads the test result to the test host 100, and the test result is displayed through the display screen, so that the test result is convenient to check. Optionally, the test host 100 is a PC or an industrial computer, and has a data storage function, so that the test result can be stored, and the next check is facilitated.
Further, in the above embodiment, the dc source 200 includes a current source for providing a constant current excitation signal and a voltage source for providing a constant voltage excitation signal.
Specifically, in the above embodiment, the current source includes the first digital-to-analog converter DAC and the voltage-to-current conversion unit. In this embodiment, the first DAC outputs a corresponding analog voltage V1 according to the test command, and the voltage-current conversion unit converts the analog voltage V1 into an equal-proportion constant current I1. Optionally, the first DAC is a 16-bit DAC, the voltage-current conversion unit is composed of an operational amplifier, an NMOS transistor, and a voltage-current conversion resistor R1, negative feedback is introduced into the operational amplifier, the drain of the NMOS is used as an output terminal, and the current characteristic is controlled by using the NMOS voltage, so that the drain of the NMOS can obtain a constant current excitation signal, I1 is V1/R1. Optionally, a plurality of voltage-current conversion resistors may be provided, and switching among the plurality of voltage-current conversion resistors is performed through the multi-way switch, so that range switching of the output current of the current source is realized. It is understood that, depending on the PCB to be tested, the test host 100 may send different test commands to cause the current source to output corresponding current excitation signals.
Specifically, in the above embodiment, the voltage source includes the second digital-to-analog converter DAC and the power management chip. In this embodiment, the second digital-to-analog converter DAC outputs a corresponding analog voltage according to the test instruction, and the analog voltage is amplified by the power management chip IC, so as to finally provide a constant voltage excitation signal for the PCB to be tested. Optionally, the second digital-to-analog converter DAC is a 10-bit DAC, and the fixed gain of the power management chip IC is 4. It is also understood that, depending on the PCB to be tested, the test host 100 may send different test commands to enable the voltage source to output corresponding voltage excitation signals.
Optionally, in the above embodiment, the dc source 200 may further include a resistance source for providing a constant resistance. Specifically, the resistance source can include a plurality of high accuracy resistance and the multiple transfer switch who is used for switching a plurality of high accuracy resistance, through the high accuracy resistance that sets up a plurality of different resistances, through the multiple transfer switch control, can supply to be surveyed the PCB board test and use.
Further, in the above embodiment, the test analysis module 500 includes a plurality of analog switches, an analog-to-digital conversion unit, and a microprocessor, wherein the input ends of the plurality of analog switches are connected to the probe, the output ends of the plurality of analog switches are connected to the input ends of the analog-to-digital conversion unit, and the output ends of the analog-to-digital conversion unit are connected to the microprocessor.
In the embodiment of the invention, the response signals measured from the components on the PCB to be tested by the probe are gated by the multi-channel analog switch, and are subjected to A/D conversion by the analog-to-digital conversion unit, so that the analog signals are converted into digital signals, and finally, the digital quantity of the response signals is obtained by the microprocessor.
Furthermore, in the above embodiment, the test analysis module 500 further includes a filtering unit and a differential amplifying unit, an input end of the filtering unit is connected to an output end of the multi-channel analog switch, an output end of the filtering unit is connected to an input end of the differential amplifying unit, and an output end of the differential amplifying unit is connected to an input end of the analog-to-digital converting unit.
In the embodiment of the invention, the response signal measured from the component on the PCB to be measured is filtered and amplified before being converted into the digital signal, so that the noise is reduced, the interference is eliminated, and the data processing pressure in the subsequent step can be reduced.
Specifically, in the above embodiments, the microprocessor is specifically a single chip microcomputer or an MCU. In the embodiment of the invention, the single chip microcomputer or the MCU can conveniently integrate interfaces such as A/D conversion, SPI (Serial Peripheral Interface, common Peripheral Interface, UART (Universal Asynchronous Receiver Transmitter), Universal Asynchronous Receiver/Transmitter and the like, and response signals measured by components on a PCB to be measured are converted into digital signals and then can be output to the single chip microcomputer or the MCU through the SPI bus.
The previous description of the disclosed embodiments is provided to enable any person skilled in the art to make or use the present invention. Various modifications to these embodiments will be readily apparent to those skilled in the art, and the generic principles defined herein may be applied to other embodiments without departing from the spirit or scope of the invention. Thus, the present invention is not intended to be limited to the embodiments shown herein but is to be accorded the widest scope consistent with the principles and novel features disclosed herein.
Claims (8)
1. An automatic test system for a PCB board, comprising:
the test host is used for selecting a test program and sending a test instruction;
the direct current source is used for providing a corresponding direct current excitation signal according to the test instruction;
the probe board is provided with a probe for connecting with a component on the PCB to be tested;
the multi-path selector switch is arranged between the direct current source and the probe board and used for switching the probe into an off state or an on state;
and the test analysis module is used for carrying out signal processing and operation analysis on the response signals measured from the components on the PCB to be tested to obtain test results.
2. The PCB board automatic test system of claim 1, wherein the direct current source comprises a current source for providing a constant current excitation signal and a voltage source for providing a constant voltage excitation signal.
3. The PCB board automatic test system of claim 2, wherein the current source comprises a first digital-to-analog converter DAC and a voltage-to-current conversion unit.
4. The PCB board automatic test system of claim 2, wherein the voltage source comprises a second digital-to-analog converter DAC and a power management chip.
5. The automatic PCB testing system of claim 1, wherein the test analysis module comprises a multi-way analog switch, an analog-to-digital conversion unit and a microprocessor, wherein an input end of the multi-way analog switch is connected with the probe, an output end of the multi-way analog switch is connected with an input end of the analog-to-digital conversion unit, and an output end of the analog-to-digital conversion unit is connected with the microprocessor.
6. The automatic PCB testing system of claim 5, wherein the testing and analyzing module further comprises a filtering unit and a differential amplifying unit, wherein an input end of the filtering unit is connected to an output end of the multi-path analog switch, an output end of the filtering unit is connected to an input end of the differential amplifying unit, and an output end of the differential amplifying unit is connected to an input end of the analog-to-digital converting unit.
7. The automatic PCB testing system of claim 1, wherein the testing host is provided with a display screen for displaying the testing result.
8. The PCB board automatic test system of claim 5, wherein the microprocessor is specifically a single chip microcomputer or MCU.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202011145519.0A CN112198419A (en) | 2020-10-23 | 2020-10-23 | Automatic test system for PCB |
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| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202011145519.0A CN112198419A (en) | 2020-10-23 | 2020-10-23 | Automatic test system for PCB |
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| CN112198419A true CN112198419A (en) | 2021-01-08 |
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| CN202011145519.0A Pending CN112198419A (en) | 2020-10-23 | 2020-10-23 | Automatic test system for PCB |
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Cited By (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN113377087A (en) * | 2021-07-01 | 2021-09-10 | 深圳市合信自动化技术有限公司 | Soft switching test device and method |
| CN114047427A (en) * | 2021-10-28 | 2022-02-15 | 国核自仪系统工程有限公司 | Test system of circuit board card |
| CN114878877A (en) * | 2022-06-02 | 2022-08-09 | 中国农业大学 | Probe card and wafer testing method |
| TWI794992B (en) * | 2021-09-24 | 2023-03-01 | 英業達股份有限公司 | System and method for controlling test jig machine continues to operate based on test results |
| CN118688618A (en) * | 2024-08-28 | 2024-09-24 | 惠州市乐亿通科技股份有限公司 | Circuit board testing system and testing method |
Citations (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN109406985A (en) * | 2018-10-08 | 2019-03-01 | 北方电子研究院安徽有限公司 | A kind of PCB analog element Auto-Test System and test method |
-
2020
- 2020-10-23 CN CN202011145519.0A patent/CN112198419A/en active Pending
Patent Citations (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN109406985A (en) * | 2018-10-08 | 2019-03-01 | 北方电子研究院安徽有限公司 | A kind of PCB analog element Auto-Test System and test method |
Cited By (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN113377087A (en) * | 2021-07-01 | 2021-09-10 | 深圳市合信自动化技术有限公司 | Soft switching test device and method |
| TWI794992B (en) * | 2021-09-24 | 2023-03-01 | 英業達股份有限公司 | System and method for controlling test jig machine continues to operate based on test results |
| CN114047427A (en) * | 2021-10-28 | 2022-02-15 | 国核自仪系统工程有限公司 | Test system of circuit board card |
| CN114878877A (en) * | 2022-06-02 | 2022-08-09 | 中国农业大学 | Probe card and wafer testing method |
| CN118688618A (en) * | 2024-08-28 | 2024-09-24 | 惠州市乐亿通科技股份有限公司 | Circuit board testing system and testing method |
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Application publication date: 20210108 |