CN219777811U - Impedance testing device - Google Patents
Impedance testing device Download PDFInfo
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- CN219777811U CN219777811U CN202321216189.9U CN202321216189U CN219777811U CN 219777811 U CN219777811 U CN 219777811U CN 202321216189 U CN202321216189 U CN 202321216189U CN 219777811 U CN219777811 U CN 219777811U
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- 238000012360 testing method Methods 0.000 title claims abstract description 156
- 238000005070 sampling Methods 0.000 claims abstract description 32
- 239000000523 sample Substances 0.000 claims description 15
- 238000006243 chemical reaction Methods 0.000 claims description 3
- 230000001360 synchronised effect Effects 0.000 claims description 2
- BXLICFUSUZPSHT-UHFFFAOYSA-N 1-(4-chlorophenyl)-3-fluoropropan-2-amine Chemical compound FCC(N)CC1=CC=C(Cl)C=C1 BXLICFUSUZPSHT-UHFFFAOYSA-N 0.000 abstract 1
- 238000000034 method Methods 0.000 description 7
- 238000001514 detection method Methods 0.000 description 5
- 238000005476 soldering Methods 0.000 description 2
- ATJFFYVFTNAWJD-UHFFFAOYSA-N Tin Chemical compound [Sn] ATJFFYVFTNAWJD-UHFFFAOYSA-N 0.000 description 1
- 230000009286 beneficial effect Effects 0.000 description 1
- 238000004891 communication Methods 0.000 description 1
- 238000013480 data collection Methods 0.000 description 1
- 238000010586 diagram Methods 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- 238000012545 processing Methods 0.000 description 1
Abstract
The utility model discloses an impedance testing device, comprising: the system comprises a current source, a first gating module, a second gating module, a sampling module and a control module, wherein the current source comprises a plurality of output ends and is used for outputting a plurality of test currents to the first gating module, the first gating module is electrically connected with the second gating module and is used for providing a plurality of test ports and a plurality of corresponding test channels, and the control module is used for outputting a first control signal to the current source and controlling the sizes of the test currents of the current source; outputting a second control signal to the first gating module for switching one or more of the plurality of test currents to one or more of the plurality of test channels as needed; and outputting a third control signal to switch one of the test signals of the test channel to the sampling module. The utility model provides an impedance testing device for testing the impedance of FPCA, which has simple operation steps and convenient use, and can realize multi-channel random switching test by adopting MUX.
Description
Technical Field
The present utility model relates to the field of testing. And more particularly to an impedance testing apparatus.
Background
In the prior art, when testing the impedance between two points of a device, the impedance test is inaccurate due to the problems of poor contact of a connecting test point and the like, and the FPCA test points are more and need to be tested one by one, so that the problems of slow corresponding time of a control circuit and long data collection time possibly exist, and meanwhile, the contact probe for test needs to be cleaned, maintained and replaced regularly after a certain time of test, so that the operation is inconvenient.
Therefore, it is necessary to provide an impedance testing device to solve the problem that FPCA has many testing points and needs to be tested one by one.
Disclosure of Invention
In order to overcome the above disadvantages, an object of the present utility model is to provide an impedance testing apparatus, comprising: the system comprises a current source, a first gating module, a second gating module, a sampling module and a control module,
the current source includes a plurality of output terminals for outputting a plurality of test currents to the first gating module,
the first gating module and the second gating module are electrically connected and are used for providing a plurality of test ports and a plurality of corresponding test channels,
the control module is used for outputting a first control signal to the current source and controlling the magnitude of each test current of the current source; outputting a second control signal to the first gating module for switching one or more of the plurality of test currents to one or more of the plurality of test channels as needed; and outputting a third control signal to switch one of the test signals of the test channel to the sampling module.
Optionally, each test port is electrically connected to a pogo pin probe, and is used for applying a test current corresponding to the test channel to each test point of the tested circuit board, and sensing a test signal.
Optionally, the test device further comprises a calibration circuit electrically connected with one of the test channels, the calibration circuit comprises a current detection resistor, and the test error is obtained by collecting voltages of the current detection resistor under different test currents.
Optionally, the sampling module is an analog-to-digital conversion module, and is configured to convert and amplify an input test signal and transmit the test signal to the control module.
Optionally, the test device further includes a fixed signal input to one of the test channels, and the second strobe module outputs the fixed signal and one of the test signals to the sampling module based on the third control signal.
Optionally, the control module includes a first control terminal connected to the controlled terminal of the current source, a second control terminal connected to the controlled terminal of the first gating module, and a third control terminal connected to the controlled terminal of the second gating module.
Optionally, the current source includes first multiplexing outputs respectively connected to the first multiplexing inputs of the first gating module.
Optionally, the second multiplexing output ends of the first gating module are respectively connected with the second multiplexing input ends of the second gating module, and are respectively connected with a plurality of pogo pin probes.
Optionally, the input end of the sampling module is connected with the output end of the second gating module, and the output end of the sampling module is connected with the input end of the control chip.
Optionally, the first control signal, the second control signal and the third control signal are synchronous control signals.
The beneficial effects of the utility model are as follows:
the utility model provides a testing device for testing the impedance of FPCA, which has the advantages of simple operation steps, convenient use, multi-channel random switching test by adopting MUX, random expansion of MUX, further realization of test range compared with the prior art that only a single channel can be tested, automatic test and judgment of impedance among multiple points are realized, the circuit comprises a calibration function, sampling calibration is carried out through different precision resistors, test precision is ensured, and the use requirement of a user for testing the impedance of FPCA is met.
Drawings
The following describes the embodiments of the present utility model in further detail with reference to the drawings.
Fig. 1 shows a framework diagram of a test apparatus provided by the utility model.
Detailed Description
In order to more clearly illustrate the present utility model, the present utility model will be further described with reference to preferred embodiments and the accompanying drawings. Like parts in the drawings are denoted by the same reference numerals. It is to be understood by persons skilled in the art that the following detailed description is illustrative and not restrictive, and that this utility model is not limited to the details given herein.
One embodiment of the present utility model provides a testing apparatus, as shown in fig. 1, including:
a current source, a first gating module (MUX 1), a second gating module (MUX 2), a sampling module (ADC) and a control Module (MCU),
the current source comprises a plurality of output terminals for outputting a plurality of test currents to the first gating module (MUX 1),
the first gating module (MUX 1) and the second gating module (MUX 2) are electrically connected for providing a plurality of test ports and a corresponding plurality of test channels,
the control Module (MCU) is used for outputting a first control signal to the current source and controlling the magnitude of each test current of the current source; outputting a second control signal to the first gating module (MUX 1) for switching one or more of the plurality of test currents to one or more of the plurality of test channels as required; and outputs a third control signal to switch one of the test signals of the test channel to a sampling module (ADC).
The utility model is used for testing the FPCA (flexible printed circuit board element soldering tin or assembly) impedance, has simple operation steps and convenient use, can realize multi-channel random switching test by adopting the MUX, can be arbitrarily expanded, further realizes the test range compared with the prior art that only a single channel can be tested, realizes the automatic test and judgment of the impedance among multiple points, comprises a calibration function in a circuit, performs sampling calibration through different precise resistors, ensures the test precision and meets the use requirement.
FPCA is an acronym for Flexible Printed Circuit Assembly, that is, FPC component soldering or assembly. FPC is a short for flexible board (FLEXIBLE PRINTED CIRCUIT), and is called a flexible printed circuit board.
In particular, the method comprises the steps of,
the control Module (MCU) sends a first control signal to enable the current source to provide one test current or a plurality of different test currents;
simultaneously, the control Module (MCU) sends a second control signal to control the first gating module (MUX 1) to switch one or more of the test currents to one or more of the test channels;
the test ports are respectively and electrically connected with the pogo pin probes, and are used for applying the test currents corresponding to the test channels to the test points of the tested circuit board and sensing test signals;
the pogo pin probe contacts a point to be tested, and a test signal (voltage signal) of the point to be tested is sensed and transmitted to a second gating module (MUX 2);
the control Module (MCU) sends a third control signal to switch one of the test signals (voltage signals) of the test channel to the sampling module;
the sampling module converts and amplifies an input test signal and transmits the test signal to the control module;
and the control module compares the test signal with the standard signal, reads and converts a comparison result through a program, and sends the comparison result to the upper computer, and the upper computer software displays the test result.
In a specific embodiment, each test port is electrically connected to a pogo pin probe, and is used for applying a test current corresponding to a test channel to each test point of the tested circuit board and sensing a test signal.
In a specific embodiment, the impedance testing device comprises at least one pogo pin probe,
if the impedance testing device comprises M test channels, then M pogo pin probes are included,
the pogo pin probe is used for contacting each test point of the tested circuit board and transmitting the voltage signal of the sensed point to be tested to the second gating module (MUX 2).
In a specific embodiment, the test device further comprises a calibration circuit electrically connected to one of the test channels, the calibration circuit comprising a current sensing resistor, and the test error is obtained by collecting voltages of the current sensing resistor at different test currents.
Specifically, the calibration circuit comprises a calibration function, sampling calibration is carried out through different current detection resistors, the testing precision is ensured, and the use requirement is met.
And detecting errors of voltages at two ends of the current detection resistor under different currents through a preset current detection resistor, obtaining a test error, and calibrating an actual test voltage.
In a specific embodiment, the sampling module is an analog-to-digital conversion module, and is configured to convert and amplify an input test signal and transmit the converted test signal to the control module.
In a specific embodiment, the impedance testing apparatus further comprises a programmable current source selection circuit connected between the control module and the current source connection.
In a specific embodiment, the test device further includes a fixed signal input to one of the test channels, and the second gating module outputs the fixed signal and one of the test signals to the sampling module based on the third control signal; and the sampling module transmits the fixed signal and the test signal to the control module for comparison to obtain a test result.
In a specific embodiment, the control module includes a first control terminal connected to the controlled terminal of the current source, a second control terminal connected to the controlled terminal of the first gating module, and a third control terminal connected to the controlled terminal of the second gating module.
The second multiplexing output ends of the first gating module are respectively connected with the second multiplexing input ends of the second gating module and are respectively connected with a plurality of pogo pin probes.
The input end of the sampling module is connected with the output end of the second gating module, and the output end of the sampling module is connected with the input end of the control chip.
In a specific embodiment, the current source includes first multiplexing outputs respectively connected to the first multiplexing inputs of the first gating module.
In a specific embodiment, the impedance testing device further includes an upper computer connected to the control module, and configured to display a comparison result of the fixed signal and the voltage signal processed by the control module.
Specifically, the software of the upper computer runs, so that the upper computer displays test results under different currents, and judges the pass or fail to realize automatic test and judgment.
In a specific embodiment, the control module is a micro control unit, and a program for processing the signal collected by the sampling module is stored in the micro control unit.
In a specific embodiment, the impedance testing apparatus includes a plurality of first gating modules and a plurality of second gating modules,
the control module is used for respectively sending second control signals to the plurality of first gating modules, switching one or more of a plurality of test currents to one or more of a plurality of test channels according to the requirement, so that different test currents output by the current source are switched to different pogo pins (probes),
and the sampling module is also used for respectively transmitting a third control signal to the plurality of second gating modules, and the third control signal is used for switching one of the test signals of the test channel to the sampling module.
In one possible implementation of the present utility model,
the control module is characterized in that a first control end is connected with a first controlled end of the current source, a second control end is connected with the first controlled end of the first gating module, and a third control end is connected with the first controlled end of the second gating module;
the current source comprises N paths of output ends, and the N paths of output ends are connected with N paths of input ends of the first gating module;
the M paths of output ends of the first gating module are respectively connected with the M paths of input ends of the second gating module and the input ends of the M probes;
the first input end of the sampling module is connected with the first output end of the second gating module, and the first output end of the sampling module is connected with the first input end of the control module;
the fixed signal GND is connected with the standard signal input end of the second gating module, or the fixed signal GND is connected with one of the M paths of output ends of the first gating module and the M paths of input ends of the second gating module;
in a specific embodiment, the first gating module outputs a test current, and the second gating module outputs a pogo pin (probe) to collect a voltage signal of a point to be tested.
The utility model provides a testing device for testing the impedance of an FPC, which has the advantages of simple operation steps, convenient use, realization of multi-channel random switching test by adopting a MUX, random expansion of the MUX, further realization of the testing range compared with the prior art that only a single channel can be tested, realization of automatic testing and judgment of the impedance among multiple points, inclusion of a calibration function in a circuit, sampling calibration by different precision resistors, assurance of testing precision and satisfaction of use requirements.
In the description of the present utility model, it should be noted that the azimuth or positional relationship indicated by the terms "upper", "lower", etc. are based on the azimuth or positional relationship shown in the drawings, and are merely for convenience of describing the present utility model and simplifying the description, and are not indicative or implying that the apparatus or element in question must have a specific azimuth, be constructed and operated in a specific azimuth, and thus should not be construed as limiting the present utility model. Unless specifically stated or limited otherwise, the terms "mounted," "connected," and "coupled" are to be construed broadly, and may be, for example, fixedly connected, detachably connected, or integrally connected; can be mechanically or electrically connected; can be directly connected or indirectly connected through an intermediate medium, and can be communication between two elements. The specific meaning of the above terms in the present utility model can be understood by those of ordinary skill in the art according to the specific circumstances.
It is further noted that in the description of the present utility model, relational terms such as first and second, and the like are used solely to distinguish one entity or action from another entity or action without necessarily requiring or implying any actual such relationship or order between such entities or actions. Moreover, the terms "comprises," "comprising," or any other variation thereof, are intended to cover a non-exclusive inclusion, such that a process, method, article, or apparatus that comprises a list of elements does not include only those elements but may include other elements not expressly listed or inherent to such process, method, article, or apparatus. Without further limitation, an element defined by the phrase "comprising one … …" does not exclude the presence of other like elements in a process, method, article, or apparatus that comprises the element.
It should be understood that the foregoing examples of the present utility model are provided merely for clearly illustrating the present utility model and are not intended to limit the embodiments of the present utility model, and that various other changes and modifications may be made therein by one skilled in the art without departing from the spirit and scope of the present utility model as defined by the appended claims.
Claims (10)
1. An impedance testing device, comprising: the system comprises a current source, a first gating module, a second gating module, a sampling module and a control module,
the current source includes a plurality of output terminals for outputting a plurality of test currents to the first gating module,
the first gating module and the second gating module are electrically connected and are used for providing a plurality of test ports and a plurality of corresponding test channels,
the control module is used for outputting a first control signal to the current source and controlling the magnitude of each test current of the current source; outputting a second control signal to the first gating module for switching one or more of the plurality of test currents to one or more of the plurality of test channels as needed; and outputting a third control signal to switch one of the test signals of the test channel to the sampling module.
2. The test device of claim 1, wherein each test port is electrically connected to a pogo pin probe for applying a test current corresponding to a test channel to each test point of the circuit board under test and sensing a test signal.
3. The test device of claim 1, further comprising a calibration circuit electrically connected to one of the test channels, the calibration circuit comprising a current sensing resistor, the test error being obtained by collecting voltages of the current sensing resistor at different test currents.
4. The test device of claim 1, wherein the sampling module is an analog-to-digital conversion module, and is configured to convert and amplify an input test signal and transmit the converted test signal to the control module.
5. The test device of claim 1, further comprising a fixed signal input to one of the test channels, the second gating module outputting one of the test signals and the fixed signal to the sampling module based on a third control signal.
6. The test device of claim 1, wherein the control module comprises a first control terminal coupled to the controlled terminal of the current source, a second control terminal coupled to the controlled terminal of the first gating module, and a third control terminal coupled to the controlled terminal of the second gating module.
7. The test device of claim 6, wherein the current source includes first multiplexing outputs respectively connected to the first multiplexing inputs of the first gating module.
8. The test device of claim 7, wherein the second multiplexing output of the first gating module is connected to the second multiplexing input of the second gating module, respectively, and to a plurality of pogo pin probes, respectively.
9. The test device of claim 7, wherein the input of the sampling module is coupled to the output of the second gating module and the output of the sampling module is coupled to the input of the control chip.
10. The test device of claim 1, wherein the first control signal, the second control signal, and the third control signal are synchronous control signals.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202321216189.9U CN219777811U (en) | 2023-05-19 | 2023-05-19 | Impedance testing device |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202321216189.9U CN219777811U (en) | 2023-05-19 | 2023-05-19 | Impedance testing device |
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| Publication Number | Publication Date |
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| CN219777811U true CN219777811U (en) | 2023-09-29 |
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| CN202321216189.9U Active CN219777811U (en) | 2023-05-19 | 2023-05-19 | Impedance testing device |
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