CN112130054A - Testing arrangement of server management board - Google Patents
Testing arrangement of server management board Download PDFInfo
- Publication number
- CN112130054A CN112130054A CN202010882662.1A CN202010882662A CN112130054A CN 112130054 A CN112130054 A CN 112130054A CN 202010882662 A CN202010882662 A CN 202010882662A CN 112130054 A CN112130054 A CN 112130054A
- Authority
- CN
- China
- Prior art keywords
- board
- testing device
- box body
- management board
- test
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 238000012360 testing method Methods 0.000 title claims abstract description 80
- 239000000523 sample Substances 0.000 claims abstract description 16
- 210000001503 joint Anatomy 0.000 claims abstract description 6
- 230000004044 response Effects 0.000 claims description 3
- 238000010586 diagram Methods 0.000 description 4
- 230000000903 blocking effect Effects 0.000 description 3
- 238000012423 maintenance Methods 0.000 description 3
- 230000002159 abnormal effect Effects 0.000 description 2
- 230000009471 action Effects 0.000 description 2
- 230000008901 benefit Effects 0.000 description 2
- 230000000694 effects Effects 0.000 description 2
- 238000000034 method Methods 0.000 description 2
- 238000012986 modification Methods 0.000 description 2
- 230000004048 modification Effects 0.000 description 2
- 238000003860 storage Methods 0.000 description 2
- 230000009286 beneficial effect Effects 0.000 description 1
- 230000008859 change Effects 0.000 description 1
- 230000007547 defect Effects 0.000 description 1
- 230000006870 function Effects 0.000 description 1
- 230000014509 gene expression Effects 0.000 description 1
- 238000004519 manufacturing process Methods 0.000 description 1
- 238000005259 measurement Methods 0.000 description 1
- 230000003287 optical effect Effects 0.000 description 1
- 238000003825 pressing Methods 0.000 description 1
- 230000008569 process Effects 0.000 description 1
- 238000006467 substitution reaction Methods 0.000 description 1
- 238000010998 test method Methods 0.000 description 1
- 230000007704 transition Effects 0.000 description 1
Images
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2801—Testing of printed circuits, backplanes, motherboards, hybrid circuits or carriers for multichip packages [MCP]
- G01R31/2806—Apparatus therefor, e.g. test stations, drivers, analysers, conveyors
- G01R31/2808—Holding, conveying or contacting devices, e.g. test adapters, edge connectors, extender boards
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/04—Housings; Supporting members; Arrangements of terminals
- G01R1/0408—Test fixtures or contact fields; Connectors or connecting adaptors; Test clips; Test sockets
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2801—Testing of printed circuits, backplanes, motherboards, hybrid circuits or carriers for multichip packages [MCP]
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2801—Testing of printed circuits, backplanes, motherboards, hybrid circuits or carriers for multichip packages [MCP]
- G01R31/2806—Apparatus therefor, e.g. test stations, drivers, analysers, conveyors
Landscapes
- Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- General Engineering & Computer Science (AREA)
- Tests Of Electronic Circuits (AREA)
Abstract
The invention discloses a testing device of a server management board, which comprises the following components: a box body; the fixing piece is arranged on the first surface of the box body; the test board is arranged on the fixing part and provided with a plurality of groups of probes; the sliding rail is arranged on the first surface of the box body; the carrier plate is connected to the slide rail in a sliding mode, is configured for placing the management plate to be tested and responds to the fact that the carrier plate slides to a preset position along the slide rail, and the multiple groups of high-density connectors of the management plate to be tested are respectively in butt joint with the multiple groups of probes; and the power supply is configured to supply power to the test board and the management board to be tested. The scheme provided by the invention aims at the probes of the management board and the high-density connector, solves the plug-in test of the high-density multi-pin connector on the management board, and can be conveniently and quickly maintained and replaced after problems occur.
Description
Technical Field
The present invention relates to the field of testing, and more particularly, to a testing apparatus for a server management board.
Background
During production testing of a server PCBA (Printed Circuit Board Assembly), a test management Board is required. The test action of inserting the high-density connector exists in the process of testing the management board, the steps of connecting cables, assembling management and the like are needed, if the high-density connector is inserted manually, time and labor are consumed, working hours are influenced, probes on the management board can be damaged, and the hidden danger of scrapping the board card exists.
Disclosure of Invention
In view of this, an object of the embodiments of the present invention is to provide a testing apparatus for a server management board, which can facilitate plugging and unplugging of high-density connectors of the management board into a testing board by setting positions of the management board and the testing board, thereby greatly reducing time consumption, reducing scrap caused by improper plugging and unplugging of the high-density connectors, and facilitating later maintenance.
In view of the above object, an aspect of the embodiments of the present invention provides a testing apparatus for a server management board, including the following components:
a box body;
the fixing piece is arranged on the first surface of the box body;
the test board is arranged on the fixing part and provided with a plurality of groups of probes;
the sliding rail is arranged on the first surface of the box body;
the carrier plate is connected to the slide rail in a sliding mode, is configured to place a management board to be tested, and responds to the fact that the carrier plate slides to a preset position along the slide rail, and enables the multiple groups of high-density connectors of the management board to be tested to be in butt joint with the multiple groups of probes respectively; and
and the power supply is configured to supply power to the test board and the management board to be tested.
In some embodiments, the test device further comprises:
the first clamping hand comprises a first stopping part, and the first stopping part is positioned at one end, close to the carrier plate, of the first clamping hand.
In some embodiments, the first stopping portion is configured to shift a position on the slide rail with the transition of the first clamping state.
In some embodiments, the first gripper comprises a first hand-held portion configured to slide the first stop on the guide rail in a second direction in response to the first hand-held portion moving in a first direction.
In some embodiments, the test device further comprises:
the fan plate is connected with the test board and arranged on the first surface of the box body.
In some embodiments, the test device further comprises:
the fans are connected with the fan plate and arranged on the first surface of the box body.
In some embodiments, the test device further comprises:
the second clamping hand comprises a second stopping part, and the second stopping part is positioned at one end, close to the fan, of the second clamping hand.
In some embodiments, the test device further comprises:
the indicating lamp is arranged on the first surface of the box body and is configured for indicating whether the fan is normal or not.
In some embodiments, the test device further comprises:
the handle, the handle setting is in the side of box.
In some embodiments, the test device further comprises:
the cable fixing piece comprises a concave portion, the cable fixing piece is arranged on the first surface of the box body, and the cable fixing piece is configured for limiting a cable of the testing device in the concave portion.
The invention has the following beneficial technical effects: through setting up the position of management board and survey test panel, can make the high density connector of management board to inserting survey test panel and become easily, significantly reduced consuming time to the improper plug that has reduced the high density connector leads to the fact scrap, do benefit to the later maintenance moreover.
Drawings
In order to more clearly illustrate the embodiments of the present invention or the technical solutions in the prior art, the drawings used in the description of the embodiments or the prior art will be briefly described below, and it is obvious that the drawings in the following description are only some embodiments of the present invention, and it is obvious for those skilled in the art that other embodiments can be obtained by using the drawings without creative efforts.
FIG. 1 is a schematic diagram of an embodiment of a testing apparatus for a server management board according to the present invention;
FIG. 2 is a schematic view of the test board of FIG. 1 viewed from direction b;
fig. 3 is a schematic diagram of a management board to be tested.
Detailed Description
In order to make the objects, technical solutions and advantages of the present invention more apparent, the following embodiments of the present invention are described in further detail with reference to the accompanying drawings.
It should be noted that all expressions using "first" and "second" in the embodiments of the present invention are used for distinguishing two entities with the same name but different names or different parameters, and it should be noted that "first" and "second" are merely for convenience of description and should not be construed as limitations of the embodiments of the present invention, and they are not described in any more detail in the following embodiments.
In view of the above object, a first aspect of the embodiments of the present invention provides an embodiment of a testing apparatus for a server management board. Fig. 1 is a schematic diagram illustrating an embodiment of a testing apparatus for a server management board according to the present invention. As shown in fig. 1, an embodiment of the present invention includes the following components:
a box body 1; a fixing member 2 provided on a first surface of the case 1; the test board 3 is arranged on the fixing part 2, and a plurality of groups of probes are arranged on the test board 3; a slide rail 4 disposed on a first surface of the case 1; the carrier plate 5 is connected to the slide rail 4 in a sliding manner, is configured to place a management board a to be tested, and responds to the fact that the carrier plate 5 slides to a preset position along the slide rail 4, and the multiple groups of high-density connectors of the management board a to be tested are respectively in butt joint with the multiple groups of probes; and a power supply 6 configured to supply power to said test board 3 and to said management board a to be tested.
The fixing member 2 may be disposed perpendicular to the first surface of the housing, the test board 3 may be disposed on the fixing member 2, and the high-density connector needs to be perpendicular to the plane of the slide rail 4. The manner in which the carrier boards 5 are arranged may be determined according to the position and orientation of the high-density connectors of the management board a to be tested, for example, the carrier boards 5 may be arranged perpendicular to the slide rails 4, and the bodies of the carrier boards 5 are all parallel to the slide rails 4. The "preset position" refers to a position where the probes of the management board a to be tested can be mated with the high-density connectors of the test board 3, and may also be a position where the probes slide to the topmost end of the slide rail 4 near one end of the test board 3. "10010" in fig. 1 represents the model of the management board a to be tested.
FIG. 2 shows a schematic view of the test plate of FIG. 1 viewed from direction b; fig. 3 shows a schematic diagram of a management board under test. As shown in fig. 2 and 3, the test board 3 includes first and second probes 31 and 32, and the plurality of management boards a to be tested include first and second high-density connectors a1 and a2, respectively. The first probe 31 may be mated with the second high-density connector a2 and the second probe 32 may be mated with the first high-density connector a 1.
In some embodiments, the test device further comprises: the first clamping hand 7, the first clamping hand 7 comprises a first stopping portion 71, and the first stopping portion 71 is located at one end of the first clamping hand 7 close to the carrier plate 5.
In some embodiments, the first stopping portion 71 is configured to switch the position on the slide rail 4 with the switching of the state of the first clamping hand 7.
In some embodiments, the first gripper 7 includes a first hand holding portion 72, and the first gripper 7 is configured to slide the first blocking portion 71 on the guide rail 4 in a second direction in response to the first hand holding portion 72 moving in a first direction. For example, when the first handheld portion 72 moves downward, the first blocking portion 71 is pushed to slide toward the direction of the test board 3, and when the first handheld portion 72 moves upward, the first blocking portion 71 is driven to slide away from the test board 3.
In some embodiments, the test device further comprises: the fan plate 81, the fan plate 81 with test panel 3 is connected, the fan plate 81 sets up the first surface of box 1.
In some embodiments, the test device further comprises: and a plurality of fans 82, wherein the plurality of fans 82 are connected with the fan plate 81, and the plurality of fans 82 are arranged on the first surface of the box body 1. The management board is connected with the test board, and the test board is connected with the fan board, realizes the effect through management board control fan.
In some embodiments, the test device further comprises: a second gripper 9, wherein the second gripper 9 includes a second stopping portion 91, and the second stopping portion 91 is located at an end of the second gripper 9 close to the fan 82. In general, the second hand-held part of the second gripper is kept in a horizontal state, the second stopping part can fix the fan and the fan board, and when the fan or the fan board is abnormal and needs to be replaced, the second hand-held part of the second gripper can be moved upwards, so that the fan and the fan board can be moved for replacement.
In some embodiments, the test device further comprises: and the indicator light 11 is arranged on the first surface of the box body 1, and is configured to indicate whether the fan 82 is normal or not. After the test is started, if the fan normally runs, the indicator light is turned on, if the indicator light is turned off, the problem of whether the indicator light is the problem of the fan or not is firstly eliminated, and if the indicator light is not the problem, the fan is marked to be possibly abnormal.
In some embodiments, the test device further comprises: and the handle 12 is arranged on the side surface of the box body 1. In some cases, it may be desirable to carry the test device, and the handle may be provided to better carry the test device.
In some embodiments, the test device further comprises: and a cable holder 13, wherein the cable holder 13 includes a recess, and the cable holder 13 is disposed on the first surface of the box 1 and configured to limit the cable of the testing device in the recess.
The test method comprises the following steps: two management boards to be tested are placed into the vertical carrier plate, the first hand-held parts of the two first clamping hands are pressed down, the high-density connector of the management board to be tested is inserted into the test board, and the test is started. And (5) after the test is finished, restoring the handheld parts of the two first clamping hands, and taking out the management board to be tested. If the condition of looper appears in many times high density connector test, perhaps appear when the fan board is unusual and the fan is unusual, need change and survey test panel, fan board or fan, can conveniently adjust tool internals in time through the handheld portion of second of pressing down the second tong, convenient saving time.
According to the embodiment of the invention, the positions of the management board and the test board are set, so that the high-density connector of the management board can be in right butt joint with the probe of the test board, the scrappage caused by plugging and unplugging of the high-density connector is reduced, the later maintenance is facilitated, the defects of bent pins, hole site damage and the like caused by plugging and unplugging of the high-density connector are reduced, and by designing a jig, the quick butt joint can be effectively realized, the speed measurement of a fan can be managed, and the test operation efficiency is improved.
The foregoing is an exemplary embodiment of the present disclosure, but it should be noted that various changes and modifications could be made herein without departing from the scope of the present disclosure as defined by the appended claims. The functions, steps and/or actions of the method claims in accordance with the disclosed embodiments described herein need not be performed in any particular order. Furthermore, although elements of the disclosed embodiments of the invention may be described or claimed in the singular, the plural is contemplated unless limitation to the singular is explicitly stated.
It should be understood that, as used herein, the singular forms "a", "an" and "the" are intended to include the plural forms as well, unless the context clearly supports the exception. It should also be understood that "and/or" as used herein is meant to include any and all possible combinations of one or more of the associated listed items.
The numbers of the embodiments disclosed in the embodiments of the present invention are merely for description, and do not represent the merits of the embodiments.
It will be understood by those skilled in the art that all or part of the steps for implementing the above embodiments may be implemented by hardware, or may be implemented by a program instructing relevant hardware, and the program may be stored in a computer-readable storage medium, and the above-mentioned storage medium may be a read-only memory, a magnetic disk or an optical disk, etc.
Those of ordinary skill in the art will understand that: the discussion of any embodiment above is meant to be exemplary only, and is not intended to intimate that the scope of the disclosure, including the claims, of embodiments of the invention is limited to these examples; within the idea of an embodiment of the invention, also technical features in the above embodiment or in different embodiments may be combined and there are many other variations of the different aspects of the embodiments of the invention as described above, which are not provided in detail for the sake of brevity. Therefore, any omissions, modifications, substitutions, improvements, and the like that may be made without departing from the spirit and principles of the embodiments of the present invention are intended to be included within the scope of the embodiments of the present invention.
Claims (10)
1. A test apparatus for a server management board, comprising:
a box body;
the fixing piece is arranged on the first surface of the box body;
the test board is arranged on the fixing part and provided with a plurality of groups of probes;
the sliding rail is arranged on the first surface;
the carrier plate is connected to the slide rail in a sliding mode, is configured to place a management board to be tested, and responds to the fact that the carrier plate slides to a preset position along the slide rail, and enables the multiple groups of high-density connectors of the management board to be tested to be in butt joint with the multiple groups of probes respectively; and
and the power supply is configured to supply power to the test board and the management board to be tested.
2. The testing device of claim 1, further comprising:
the first clamping hand comprises a first stopping part, and the first stopping part is positioned at one end, close to the carrier plate, of the first clamping hand.
3. The testing device of claim 2, wherein the first stopping portion is configured to shift a position on the sliding rail with the shift of the first clamping state.
4. The testing device of claim 3, wherein the first gripper comprises a first hand-held portion, the first gripper configured to slide the first stop on the rail in a second direction in response to the first hand-held portion moving in a first direction.
5. The testing device of claim 1, further comprising:
the fan plate is connected with the test board and arranged on the first surface of the box body.
6. The testing device of claim 5, further comprising:
the fans are connected with the fan plate and arranged on the first surface of the box body.
7. The testing device of claim 6, further comprising:
the second clamping hand comprises a second stopping part, and the second stopping part is positioned at one end, close to the fan, of the second clamping hand.
8. The testing device of claim 7, further comprising:
the indicating lamp is arranged on the first surface of the box body and is configured for indicating whether the fan is normal or not.
9. The testing device of claim 1, further comprising:
the handle, the handle setting is in the side of box.
10. The testing device of claim 1, further comprising:
the cable fixing piece comprises a concave portion, the cable fixing piece is arranged on the first surface of the box body, and the cable fixing piece is configured for limiting a cable of the testing device in the concave portion.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202010882662.1A CN112130054B (en) | 2020-08-28 | 2020-08-28 | Testing arrangement of server management board |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202010882662.1A CN112130054B (en) | 2020-08-28 | 2020-08-28 | Testing arrangement of server management board |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| CN112130054A true CN112130054A (en) | 2020-12-25 |
| CN112130054B CN112130054B (en) | 2022-12-27 |
Family
ID=73847644
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN202010882662.1A Active CN112130054B (en) | 2020-08-28 | 2020-08-28 | Testing arrangement of server management board |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN112130054B (en) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN114062903A (en) * | 2021-12-17 | 2022-02-18 | 深圳市微特精密科技股份有限公司 | Multi-mode compatibility testing device for HSBP (high speed Back Board) and PCIE Switch board |
Citations (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN103969539A (en) * | 2013-01-30 | 2014-08-06 | 鸿富锦精密工业（深圳）有限公司 | Testing device |
| US20170003317A1 (en) * | 2013-11-26 | 2017-01-05 | Tyco Electronics Uk Ltd. | Balunless test fixture |
| CN108051732A (en) * | 2018-01-15 | 2018-05-18 | 歌尔股份有限公司 | A kind of test device of integrated circuit plate |
| CN110456109A (en) * | 2019-08-22 | 2019-11-15 | 珠海市运泰利自动化设备有限公司 | A kind of novel test equipment |
| CN111090018A (en) * | 2019-12-27 | 2020-05-01 | 苏州浪潮智能科技有限公司 | Testing device for server fan board |
-
2020
- 2020-08-28 CN CN202010882662.1A patent/CN112130054B/en active Active
Patent Citations (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN103969539A (en) * | 2013-01-30 | 2014-08-06 | 鸿富锦精密工业（深圳）有限公司 | Testing device |
| US20170003317A1 (en) * | 2013-11-26 | 2017-01-05 | Tyco Electronics Uk Ltd. | Balunless test fixture |
| CN108051732A (en) * | 2018-01-15 | 2018-05-18 | 歌尔股份有限公司 | A kind of test device of integrated circuit plate |
| CN110456109A (en) * | 2019-08-22 | 2019-11-15 | 珠海市运泰利自动化设备有限公司 | A kind of novel test equipment |
| CN111090018A (en) * | 2019-12-27 | 2020-05-01 | 苏州浪潮智能科技有限公司 | Testing device for server fan board |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN114062903A (en) * | 2021-12-17 | 2022-02-18 | 深圳市微特精密科技股份有限公司 | Multi-mode compatibility testing device for HSBP (high speed Back Board) and PCIE Switch board |
Also Published As
| Publication number | Publication date |
|---|---|
| CN112130054B (en) | 2022-12-27 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| CN215986161U (en) | Test fixture and test device | |
| CN106294047B (en) | Testing tool and testing method for hard disk backboard | |
| CN112130054B (en) | Testing arrangement of server management board | |
| CN203324442U (en) | Rapid pluggable test fixture | |
| CN208092197U (en) | A kind of PCBA automatization test systems | |
| CN109959841B (en) | Automatic detecting and marking device for RS232 serial port line crossing direct connection type | |
| CN108072831A (en) | Complete machine detection device and detection method | |
| CN215297588U (en) | Comprehensive test platform for brushless direct current motor circuit board | |
| CN217034166U (en) | Battery monitoring module firmware downloading and detecting device | |
| CN217133309U (en) | Needle dial jig for testing circuit board | |
| CN216991503U (en) | PDU test inserts frock soon | |
| CN215728313U (en) | Board card plug-pull mechanism and aging test cabinet | |
| CN210401627U (en) | RS232 serial port line crossing direct connection type automatic detection and marking device | |
| CN209878944U (en) | FCT and ICT two-in-one test fixture for real insertion test | |
| CN210669115U (en) | Functional module ization switch board and produce line and add voltage system | |
| CN213813854U (en) | BMS module detection device and test fixture thereof | |
| CN221174715U (en) | Automatic aging test carrier for being compatible with multiple LED power supplies | |
| CN207650354U (en) | Complete machine detection device | |
| CN211878120U (en) | Fixing device for detecting printed circuit board | |
| CN214278369U (en) | Motor component function test board | |
| CN207720151U (en) | Complete machine detection device | |
| CN219575185U (en) | fVT detection device of hard disk opposite-plug structure | |
| CN218300505U (en) | Floating adapter device and automatic test system of connector | |
| CN219980781U (en) | Test fixture of photovoltaic power generation monitoring device | |
| CN218364339U (en) | Be used for PCBA integrated circuit board test mounting fixture |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| PB01 | Publication | ||
| PB01 | Publication | ||
| SE01 | Entry into force of request for substantive examination | ||
| SE01 | Entry into force of request for substantive examination | ||
| GR01 | Patent grant | ||
| GR01 | Patent grant |