CN108051732A - A kind of test device of integrated circuit plate - Google Patents
A kind of test device of integrated circuit plate Download PDFInfo
- Publication number
- CN108051732A CN108051732A CN201810036196.8A CN201810036196A CN108051732A CN 108051732 A CN108051732 A CN 108051732A CN 201810036196 A CN201810036196 A CN 201810036196A CN 108051732 A CN108051732 A CN 108051732A
- Authority
- CN
- China
- Prior art keywords
- test
- support plate
- integrated circuit
- plate
- drive component
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
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Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2851—Testing of integrated circuits [IC]
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- Engineering & Computer Science (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- General Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Tests Of Electronic Circuits (AREA)
Abstract
The invention discloses a kind of test devices of integrated circuit plate.The test device of the integrated circuit plate includes：First supporting item；The slip support plate being slidably connected on first supporting item；The product to be tested support plate being removably mounted on the slip support plate；First drive component, first drive component are configured to that the slip support plate is driven to be moved to test position；Second drive component, the connector being connected on second drive component；The test board being removably mounted on the connector, test probe is equipped on the test board, second drive component is configured as after the slip support plate is moved to the test position connector being driven mobile to the direction of product to be tested support plate and makes the test probe and the contact on circuit board under test.The invention solves a technical problem be that the test device tested different electronic product integrated circuit plates cannot be general.
Description
Technical field
The present invention relates to product test technical field, more particularly it relates to a kind of test dress of integrated circuit plate
It puts.
Background technology
More and more with the species of consumer electronics product, renewal speed is getting faster, such as mobile phone, game machine, VR
Products such as (virtual realities) are also present with for equipment such as the measurement jigs of electronic product customized development because product renewal can not be sharp again
The phenomenon that using.
In variety classes electronic product, the structure of integrated circuit plate is substantially close, even the ruler of integrated circuit plate
It is very little also close.In the prior art, the test device tested different electronic product integrated circuit plates separately designs processing, also
Cannot be general, add the design process-cycle of measurement jig.
And in the test to integrated circuit plate, though test event is more, test event is different.But in test process
In be typically necessary and turned on product test point contact using testing probe.It, can be to circuit after various test equipments are connected
Plate is tested.
In view of the general character of integrated circuit board test, can not be utilized to reduce the measurement jig caused by model change
The problem of, while also the process-cycle is designed to shorten measurement jig, it is necessary to design a kind of dress for being used to test integrated circuit plate
It puts.
The content of the invention
It is an object of the present invention to provide a kind of new solutions of the test device of integrated circuit plate.
According to an aspect of the invention, there is provided a kind of test device of integrated circuit plate.The test device includes：The
One supporting item；The slip support plate being slidably connected on first supporting item；It is removably mounted on the slip support plate and treats
Survey product support plate；First drive component, first drive component are configured to that the slip support plate is driven to be moved to test position
It puts；Second drive component, the connector being connected on second drive component；The survey being removably mounted on the connector
Test plate (panel), is equipped with test probe on the test board, and second drive component is configured as being moved in the slip support plate
Can drive the direction of the connector to product to be tested support plate mobile after the test position and make the test probe with it is to be measured
Contact on circuit board.
Optionally, further include the test circuit plate being removably mounted on the connector, the test circuit plate by with
Being set to can be connected by the test probe with circuit board under test.
Optionally, the connector is the frame shape of hollow structure, and the test board and the test circuit plate are installed respectively
In the both side surface of the connector.
Optionally, the extemal plate being removably mounted on first supporting item is further included, is set in the extemal plate
There is the interface being electrically connected with the test circuit plate.
Optionally, the location structure of positioning circuit under test Board position is equipped on the product to be tested support plate.
Optionally, guide rail is equipped on first supporting item, first drive component is configured to described in drive
Support plate is slided to slide along the guide rail.
Optionally, further include stop mechanism, the stop mechanism be configured to carry out the slip support plate backstop with
The slip support plate is made only to be parked in the test position.
Optionally, the second supporting item for carrying the product to be tested support plate is equipped on support plate in described slide.
Optionally, matched positioning column and positioning are respectively equipped on the slip support plate and the product to be tested support plate
Hole.
Optionally, first supporting item includes box body and the cover board on the box body, and the slip support plate is slided
It is dynamic to be connected on the cover board.
According to one embodiment of the disclosure, which includes common segment and private part.Private part is main
Including product to be tested support plate, test board.Product to be tested support plate, which is removably mounted at, to be slided on support plate, can realize the group of product to be tested support plate
Dress is replaced.Test board is removably mounted on the connector, can be realized the assembling of test board, be replaced.
When needing to be detected different circuit board under test, the common segment of test device can share, and be not required to set again
Meter processing.Engineer only needs to design the private parts such as product to be tested support plate, test board.Shorten the construction cycle of test device.
Save engineers design, buying hour.Improve the efficiency of volume production high-volume test device.
By referring to the drawings to the detailed description of exemplary embodiment of the present invention, other feature of the invention and its
Advantage will become apparent.
Description of the drawings
It is combined in the description and the attached drawing of a part for constitution instruction shows the embodiment of the present invention, and even
With its explanation together principle for explaining the present invention.
Fig. 1 is the structure diagram for the test device that an embodiment of the present invention provides；
Fig. 2 is the structure diagram for the test device that an embodiment of the present invention provides.
Wherein, 10：Box body；11：Cover board；12：Guide rail；13：Slide support plate；14：Product to be tested support plate；140：Location structure；
141：Location hole；15：Test board；16：Connector；17：Test circuit plate；18：Scan components；19：Second drive component；20：
Extemal plate；21：First drive component；22：Positioning column；23：Second supporting item；24：Locating piece.
Specific embodiment
Carry out the various exemplary embodiments of detailed description of the present invention now with reference to attached drawing.It should be noted that：Unless in addition have
Body illustrates that the unlimited system of component and the positioned opposite of step, numerical expression and the numerical value otherwise illustrated in these embodiments is originally
The scope of invention.
It is illustrative to the description only actually of at least one exemplary embodiment below, is never used as to the present invention
And its application or any restrictions that use.
It may be not discussed in detail for technology, method and apparatus known to person of ordinary skill in the relevant, but suitable
In the case of, the technology, method and apparatus should be considered as part for specification.
In shown here and discussion all examples, any occurrence should be construed as merely illustrative, without
It is as limitation.Therefore, other examples of exemplary embodiment can have different values.
It should be noted that：Similar label and letter represents similar terms in following attached drawing, therefore, once a certain Xiang Yi
It is defined, then it need not be further discussed in subsequent attached drawing in a attached drawing.
According to one embodiment of present invention, a kind of test device of integrated circuit plate is provided.It, should with reference to figure 1, Fig. 2
Test device includes the first supporting item, slides support plate 13, product to be tested support plate 14, the first drive component 21, connector 16, test board
15 and second drive component 19.The slip support plate 13 is slidably connected on first supporting item.The product to be tested support plate 14
For carrying circuit board under test.The product to be tested support plate 14 is removably mounted on the slip support plate 13.
First drive component 21 can drive the slip support plate 13 to be slided on first supporting item, to drive
It states slip support plate 13 and is moved to test position.First drive component 21 can be mounted on first supporting item.For example, institute
Stating the first drive component 21 may include the first cylinder.
When first drive component 21 drives the slip support plate 13 to slide, the product to be tested support plate 14 and thereon
Circuit board under test moves.For example, when the slip support plate 13 is moved to test position, on the product to be tested support plate 14
Circuit board under test can be located at the lower section of the test board 15.
The connector 16 is connected on second drive component 19.The test board 15 is removably mounted at the company
On fitting 16.Test probe is equipped on the test board 15.
The test board 15 matches with circuit board under test.Specifically, the test probe on the test board 15 with it is to be measured
Contact on circuit board is corresponding.
After the slip support plate 13 slides into the test position, second drive component 19 can drive the connection
Part 16 is moved to the direction of the product to be tested support plate 14, and makes the test probe and the contact on circuit board under test.
For example, the test probe can be with circuit board under test Elastic Contact.Second drive component 19 can be mounted on described first
In support member.For example, second drive component 19 may include the second cylinder.
In one specific embodiment, first, circuit board under test is placed on product to be tested support plate 14.Then, first drive
Dynamic component 21 drives slip support plate 13 to be moved to test position.Afterwards, the second drive component 19 with follower link 16 to product to be tested
The direction movement of support plate 14, and make test probe and the contact on circuit board under test, to be surveyed to circuit board under test
Examination.After the completion of test, the second drive component 19 is resetted with follower link 16, test probe and the contact point on circuit board under test
From.Afterwards, the first drive component 21 drives slip support plate 13 to reset, and circuit board under test is taken out.
In the disclosure, the test device includes common segment and private part.Private part mainly includes product to be tested and carries
Plate 14, test board 15 etc..The product to be tested support plate 14, which is removably mounted at, to be slided on support plate 13, can realize the product to be tested support plate
14 assembling is replaced.According to the concrete structure of circuit board under test, installation and circuit board under test phase on support plate 13 can be slided described
Matched product to be tested support plate 14, realizes the test to different circuit board under test.
The test board 15 is removably mounted on the connector 16, can be realized the assembling of the test board 15, be replaced.
According to the concrete structure of circuit board under test, the test board 15 to match with circuit board under test can be installed on the connector 16,
Realize the test to different circuit board under test.
When being detected to different circuit board under test, the common segment of the test device can share, and be not required to set again
Meter processing.Engineer only needs to design the private parts such as product to be tested support plate 14, test board 15.Shorten the exploitation week of test device
Phase.Save engineers design, buying hour.Improve the efficiency of volume production high-volume test device.
In the disclosure, the test device can realize the automatic test to integrated circuit plate, improve testing efficiency.This is logical
Also the collocation and switching that carry out manual mode, automatic test pattern can be needed according to producing with test equipment, flexibility uses, and reduces
Overlapping investment.
Optionally, with reference to figure 1, Fig. 2, the test device further includes the test being removably mounted on the connector 16
Circuit board 17.The test circuit plate 17 is electrically connected by the test probe with circuit board under test.For example, test probe includes
Double end elastic probe (that is, double end pogopin).One end of double end elastic probe remains good bullet with test circuit plate 17
Property contact, the other end test when with circuit board under test on contact Elastic Contact.The test circuit plate 17 is private part.
Further, with reference to figure 2, the connector 16 is with the frame shape of hollow structure.The test board 15 and the survey
Examination circuit board 17 is separately mounted to the both side surface of the connector 16.The test board 15 and the test circuit plate 17 are distinguished
Cover two openings of the connector 16.
The present invention is not limited between the test board 15 and connector 16, the test circuit plate 17 and connector 16 it
Between detachable mounting means.For example, the detachable mounting means can be threaded connection or clamping etc..
With reference to figure 1, the test device can also include the extemal plate being removably mounted on first supporting item
20.The interface being electrically connected with the test circuit plate 17 is equipped in the extemal plate 20.External test arrangements can connect with described
Mouth grafting, to be electrically connected with the circuit board under test, so as to fulfill the test to circuit board under test.The extemal plate 20 is special
Part.For example, it is detachable the modes such as can be connected through a screw thread or be clamped between the extemal plate 20 and first supporting item
It is installed together.For example,
Optionally, with reference to figure 1, the location structure for positioning circuit under test Board position is equipped on the product to be tested support plate 14
140.For example, the location structure 140 includes the avoiding structure opened up according to the distributed architecture of the component on circuit board under test
And/or support construction.Location structure 140 and the distributed architecture of the component on circuit board under test match, so that component energy
In embedded location structure.This, when circuit board under test is placed on location structure, to be laid flat, so as to meet it
His electronic component.
Optionally, with reference to figure 1, guide rail 12 is equipped on first supporting item.First drive component 21 can drive
The slip support plate 13 is slided along the guide rail 12.In this way, the glide direction for sliding support plate 13 determines, first driving
Component 21 can accurately drive the slip support plate 13 to be moved to test position.
Optionally, with reference to figure 1, the test device further includes stop mechanism.The stop mechanism can carry described slide
Plate 13 carries out backstop, so that the slip support plate 13 is only parked in the test position.
Further, with reference to figure 1, the stop mechanism may include the locating piece 24 being mounted on first supporting item.
When the slip support plate 13 slides, the locating piece 24 can carry out backstop to the slip support plate 13, so that described slide carries
Plate 13 is only parked in test position.
Optionally, with reference to figure 2, it is equipped with to carry second of the product to be tested support plate 14 on the slip support plate 13
Support member 23.For example, second supporting item 23 may include poly (methyl methacrylate) plate etc..
Optionally, it is described slip support plate 13 and the product to be tested support plate 14 on can be respectively equipped with matched positioning column and
Location hole.By the cooperation between the positioning column and location hole, the product to be tested support plate 14 can be positioned mounted on the slip
Position on support plate 13.Such as shown in Fig. 2, positioning column 22 is equipped on the slip support plate 13, in the product to be tested support plate 14
It is equipped with location hole 141.For example, also location hole can be equipped on the slip support plate 13, set on the product to be tested support plate 14
There is positioning column.
The present invention does not limit the concrete structure of first supporting item.In one example, with reference to figure 1, Fig. 2, described
One supporting item includes box body 10 and the cover board 11 on the box body 10.The slip support plate 13 is slidably connected at the lid
On plate 11.For example, the guide rail 12, the locating piece 24, first drive component, 21 and second drive component 19 can be installed
On the cover board 11.Solenoid electric valve, electric control panel, power switch power supply etc. can be accommodated in the box body 10.Institute
Operation button can be equipped with by stating on box body 10.
In addition, with reference to figure 1, Fig. 2, the test device can also include scan components 18.It can be set on circuit board under test
There are the identification markings such as Quick Response Code.The scan components 18 can be scanned the identification marking on circuit board under test.It is for example, described
Scan components 18 can be mounted on by connecting plate on the cover board 11.
Although some specific embodiments of the present invention are described in detail by example, the skill of this field
Art personnel it should be understood that example above merely to illustrating, the scope being not intended to be limiting of the invention.The skill of this field
Art personnel are it should be understood that can without departing from the scope and spirit of the present invention modify to above example.This hair
Bright scope is defined by the following claims.
Claims (10)
1. a kind of test device of integrated circuit plate, which is characterized in that including：
First supporting item；
The slip support plate (13) being slidably connected on first supporting item；
The product to be tested support plate (14) being removably mounted on the slip support plate (13)；
First drive component (21), first drive component (21) are configured to that the slip support plate (13) is driven to be moved to
Test position；
Second drive component (19),
The connector (16) being connected on second drive component (19)；
The test board (15) being removably mounted on the connector (16) is equipped with test probe on the test board (15),
Described in second drive component (19) is configured as being moved to after the test position and can drive in the slip support plate (13)
Connector (16) is mobile to the direction of product to be tested support plate (14) and the test probe is made to be connect with the contact on circuit board under test
It touches.
2. the test device of integrated circuit plate according to claim 1, which is characterized in that further include and be removably mounted at institute
State the test circuit plate (17) on connector (16), the test circuit plate (17) be configured to by the test probe with
Circuit board under test connects.
3. the test device of integrated circuit plate according to claim 2, which is characterized in that the connector (16) is hollow
The frame shape of structure, the test board (15) and the test circuit plate (17) are separately mounted to the both sides table of the connector (16)
Face.
4. the test device of integrated circuit plate according to claim 2, which is characterized in that further include and be removably mounted on
Extemal plate (20) on first supporting item is equipped in the extemal plate (20) and is electrically connected with the test circuit plate (17)
Interface.
5. the test device of integrated circuit plate according to claim 1, which is characterized in that in the product to be tested support plate (14)
It is equipped with the location structure (140) of positioning circuit under test Board position.
6. the test device of integrated circuit plate according to claim 1, which is characterized in that set on first supporting item
There is guide rail (12), first drive component (21) is configured to drive the slip support plate (13) sliding along the guide rail (12)
It is dynamic.
7. the test device of integrated circuit plate according to claim 1, which is characterized in that stop mechanism is further included, it is described
Stop mechanism is configured to carry out backstop to the slip support plate (13) so that the slip support plate (13) is only parked in the survey
Try position.
8. the test device of integrated circuit plate according to claim 1, which is characterized in that on the slip support plate (13)
Equipped with for carrying the second supporting item (23) of the product to be tested support plate (14).
9. the test device of integrated circuit plate according to claim 1, which is characterized in that it is described slip support plate (13) and
Matched positioning column and location hole are respectively equipped on the product to be tested support plate (14).
10. the test device of integrated circuit plate according to claim 1, which is characterized in that first supporting item includes
Box body (10) and the cover board (11) on the box body (10), the slip support plate (13) are slidably connected at the cover board
(11) on.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201810036196.8A CN108051732A (en) | 2018-01-15 | 2018-01-15 | A kind of test device of integrated circuit plate |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201810036196.8A CN108051732A (en) | 2018-01-15 | 2018-01-15 | A kind of test device of integrated circuit plate |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN108051732A true CN108051732A (en) | 2018-05-18 |
Family
ID=62127399
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201810036196.8A Pending CN108051732A (en) | 2018-01-15 | 2018-01-15 | A kind of test device of integrated circuit plate |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN108051732A (en) |
Cited By (6)
| Publication number | Priority date | Publication date | Assignee | Title |
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| CN110456252A (en) * | 2019-07-17 | 2019-11-15 | 安徽瑞佑自动化科技有限公司 | A kind of function detection equipment |
| CN111090018A (en) * | 2019-12-27 | 2020-05-01 | 苏州浪潮智能科技有限公司 | Testing device for server fan board |
| CN112130054A (en) * | 2020-08-28 | 2020-12-25 | 苏州浪潮智能科技有限公司 | Testing arrangement of server management board |
| CN113359006A (en) * | 2021-05-31 | 2021-09-07 | 潍坊歌尔电子有限公司 | Testing device for electronic device |
| CN113721125A (en) * | 2021-05-31 | 2021-11-30 | 荣耀终端有限公司 | Logistics device and test system |
| CN113960331A (en) * | 2021-09-26 | 2022-01-21 | 广东拓斯达科技股份有限公司 | Electronic product detection device convenient to maintain |
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| CN113721125A (en) * | 2021-05-31 | 2021-11-30 | 荣耀终端有限公司 | Logistics device and test system |
| CN113960331A (en) * | 2021-09-26 | 2022-01-21 | 广东拓斯达科技股份有限公司 | Electronic product detection device convenient to maintain |
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Application publication date: 20180518 |