CN111989629A - 故障预兆诊断系统以及故障预兆诊断方法 - Google Patents

故障预兆诊断系统以及故障预兆诊断方法 Download PDF

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Publication number
CN111989629A
CN111989629A CN201980022894.5A CN201980022894A CN111989629A CN 111989629 A CN111989629 A CN 111989629A CN 201980022894 A CN201980022894 A CN 201980022894A CN 111989629 A CN111989629 A CN 111989629A
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operation mode
sensor data
data table
sensor
data
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CN201980022894.5A
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Chinese (zh)
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藤本祥平
小高俊之
野口纯司
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Hitachi Ltd
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Hitachi Ltd
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    • GPHYSICS
    • G06COMPUTING OR CALCULATING; COUNTING
    • G06FELECTRIC DIGITAL DATA PROCESSING
    • G06F16/00Information retrieval; Database structures therefor; File system structures therefor
    • G06F16/20Information retrieval; Database structures therefor; File system structures therefor of structured data, e.g. relational data
    • G06F16/23Updating
    • G06F16/2365Ensuring data consistency and integrity
    • GPHYSICS
    • G05CONTROLLING; REGULATING
    • G05BCONTROL OR REGULATING SYSTEMS IN GENERAL; FUNCTIONAL ELEMENTS OF SUCH SYSTEMS; MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS OR ELEMENTS
    • G05B23/00Testing or monitoring of control systems or parts thereof
    • G05B23/02Electric testing or monitoring
    • G05B23/0205Electric testing or monitoring by means of a monitoring system capable of detecting and responding to faults
    • G05B23/0218Electric testing or monitoring by means of a monitoring system capable of detecting and responding to faults characterised by the fault detection method dealing with either existing or incipient faults
    • G05B23/0243Electric testing or monitoring by means of a monitoring system capable of detecting and responding to faults characterised by the fault detection method dealing with either existing or incipient faults model based detection method, e.g. first-principles knowledge model
    • G05B23/0254Electric testing or monitoring by means of a monitoring system capable of detecting and responding to faults characterised by the fault detection method dealing with either existing or incipient faults model based detection method, e.g. first-principles knowledge model based on a quantitative model, e.g. mathematical relationships between inputs and outputs; functions: observer, Kalman filter, residual calculation, Neural Networks
    • GPHYSICS
    • G05CONTROLLING; REGULATING
    • G05BCONTROL OR REGULATING SYSTEMS IN GENERAL; FUNCTIONAL ELEMENTS OF SUCH SYSTEMS; MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS OR ELEMENTS
    • G05B23/00Testing or monitoring of control systems or parts thereof
    • G05B23/02Electric testing or monitoring
    • G05B23/0205Electric testing or monitoring by means of a monitoring system capable of detecting and responding to faults
    • G05B23/0259Electric testing or monitoring by means of a monitoring system capable of detecting and responding to faults characterized by the response to fault detection
    • G05B23/0297Reconfiguration of monitoring system, e.g. use of virtual sensors; change monitoring method as a response to monitoring results
    • GPHYSICS
    • G06COMPUTING OR CALCULATING; COUNTING
    • G06FELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00Error detection; Error correction; Monitoring
    • G06F11/22Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing
    • G06F11/2252Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing using fault dictionaries
    • GPHYSICS
    • G06COMPUTING OR CALCULATING; COUNTING
    • G06FELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00Error detection; Error correction; Monitoring
    • G06F11/22Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing
    • G06F11/2257Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing using expert systems
    • GPHYSICS
    • G06COMPUTING OR CALCULATING; COUNTING
    • G06FELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00Error detection; Error correction; Monitoring
    • G06F11/22Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing
    • G06F11/2263Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing using neural networks
    • GPHYSICS
    • G06COMPUTING OR CALCULATING; COUNTING
    • G06FELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00Error detection; Error correction; Monitoring
    • G06F11/22Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing
    • G06F11/2268Logging of test results
    • GPHYSICS
    • G06COMPUTING OR CALCULATING; COUNTING
    • G06FELECTRIC DIGITAL DATA PROCESSING
    • G06F16/00Information retrieval; Database structures therefor; File system structures therefor
    • G06F16/20Information retrieval; Database structures therefor; File system structures therefor of structured data, e.g. relational data
    • G06F16/22Indexing; Data structures therefor; Storage structures
    • G06F16/2282Tablespace storage structures; Management thereof
    • GPHYSICS
    • G06COMPUTING OR CALCULATING; COUNTING
    • G06FELECTRIC DIGITAL DATA PROCESSING
    • G06F16/00Information retrieval; Database structures therefor; File system structures therefor
    • G06F16/20Information retrieval; Database structures therefor; File system structures therefor of structured data, e.g. relational data
    • G06F16/24Querying
    • G06F16/242Query formulation
    • G06F16/2433Query languages
    • G06F16/244Grouping and aggregation
    • GPHYSICS
    • G06COMPUTING OR CALCULATING; COUNTING
    • G06NCOMPUTING ARRANGEMENTS BASED ON SPECIFIC COMPUTATIONAL MODELS
    • G06N20/00Machine learning

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  • Engineering & Computer Science (AREA)
  • Theoretical Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Engineering & Computer Science (AREA)
  • General Physics & Mathematics (AREA)
  • Data Mining & Analysis (AREA)
  • Computer Hardware Design (AREA)
  • Quality & Reliability (AREA)
  • Databases & Information Systems (AREA)
  • Software Systems (AREA)
  • Mathematical Physics (AREA)
  • Evolutionary Computation (AREA)
  • Artificial Intelligence (AREA)
  • Automation & Control Theory (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • Medical Informatics (AREA)
  • Computing Systems (AREA)
  • Computational Linguistics (AREA)
  • Computer Security & Cryptography (AREA)
  • Testing And Monitoring For Control Systems (AREA)
CN201980022894.5A 2018-04-23 2019-01-18 故障预兆诊断系统以及故障预兆诊断方法 Withdrawn CN111989629A (zh)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
JP2018082178A JP2019191799A (ja) 2018-04-23 2018-04-23 故障予兆診断システム及び故障予兆診断方法
JP2018-082178 2018-04-23
PCT/JP2019/001441 WO2019207855A1 (ja) 2018-04-23 2019-01-18 故障予兆診断システム及び故障予兆診断方法

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CN111989629A true CN111989629A (zh) 2020-11-24

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US (1) US20210149875A1 (https=)
JP (1) JP2019191799A (https=)
CN (1) CN111989629A (https=)
WO (1) WO2019207855A1 (https=)

Families Citing this family (3)

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Publication number Priority date Publication date Assignee Title
JP7660292B2 (ja) * 2021-06-14 2025-04-11 パナソニックIpマネジメント株式会社 劣化判定方法及び装置
JP7688127B2 (ja) * 2021-06-21 2025-06-03 ファナック株式会社 ロボットシステムで発生した異常に対する手順を提供する異常処理装置、ネットワークシステム、及び方法
JP7840824B2 (ja) * 2022-08-31 2026-04-06 株式会社日立産機システム 予兆検知システム及び予兆検知方法

Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20020133320A1 (en) * 2001-01-19 2002-09-19 Wegerich Stephan W. Adaptive modeling of changed states in predictive condition monitoring
US20040002776A1 (en) * 2000-06-09 2004-01-01 Bickford Randall L. Surveillance system and method having an operating mode partitioned fault classification model
US20180017960A1 (en) * 2016-07-15 2018-01-18 Ricoh Company, Ltd. Diagnostic apparatus, diagnostic system, diagnostic method, and recording medium

Family Cites Families (11)

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Publication number Priority date Publication date Assignee Title
JP2001217169A (ja) * 1999-11-26 2001-08-10 Matsushita Electric Ind Co Ltd データ変動監視方法と監視装置
JP4437513B2 (ja) * 2000-04-26 2010-03-24 豊和工業株式会社 異常検出システム
JP2007165721A (ja) * 2005-12-15 2007-06-28 Omron Corp プロセス異常分析装置及びプログラム
IN2013DE02965A (https=) * 2013-10-04 2015-04-10 Samsung India Electronics Pvt Ltd
JP5684941B1 (ja) 2014-07-31 2015-03-18 株式会社日立パワーソリューションズ 異常予兆診断装置及び異常予兆診断方法
JP6234359B2 (ja) * 2014-12-15 2017-11-22 日立建機株式会社 作業機械のオイル性状の診断システム
JP6148316B2 (ja) 2015-07-31 2017-06-14 ファナック株式会社 故障条件を学習する機械学習方法及び機械学習装置、並びに該機械学習装置を備えた故障予知装置及び故障予知システム
JP6156566B2 (ja) * 2015-12-25 2017-07-05 株式会社リコー 診断装置、診断方法、プログラムおよび診断システム
JP6154523B1 (ja) * 2016-07-05 2017-06-28 山本 隆義 対象物の状態変化の原因探索方法
JP6939053B2 (ja) * 2016-07-15 2021-09-22 株式会社リコー 診断装置、プログラムおよび診断システム
JP6862130B2 (ja) * 2016-09-08 2021-04-21 株式会社東芝 異常検知装置、異常検知方法、およびプログラム

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20040002776A1 (en) * 2000-06-09 2004-01-01 Bickford Randall L. Surveillance system and method having an operating mode partitioned fault classification model
US20020133320A1 (en) * 2001-01-19 2002-09-19 Wegerich Stephan W. Adaptive modeling of changed states in predictive condition monitoring
US20180017960A1 (en) * 2016-07-15 2018-01-18 Ricoh Company, Ltd. Diagnostic apparatus, diagnostic system, diagnostic method, and recording medium

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US20210149875A1 (en) 2021-05-20
WO2019207855A1 (ja) 2019-10-31
EP3786748A1 (en) 2021-03-03
JP2019191799A (ja) 2019-10-31

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Application publication date: 20201124