CN111781405A - IPM dynamic parameter test fixture - Google Patents

IPM dynamic parameter test fixture Download PDF

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Publication number
CN111781405A
CN111781405A CN202010551124.4A CN202010551124A CN111781405A CN 111781405 A CN111781405 A CN 111781405A CN 202010551124 A CN202010551124 A CN 202010551124A CN 111781405 A CN111781405 A CN 111781405A
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CN
China
Prior art keywords
test
ipm
dynamic parameter
tested
fixture
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
CN202010551124.4A
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Chinese (zh)
Inventor
杨炜光
李耀武
张永健
白晓辉
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Xi'an En Electric Technology Co ltd
Original Assignee
Xi'an En Electric Technology Co ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Xi'an En Electric Technology Co ltd filed Critical Xi'an En Electric Technology Co ltd
Priority to CN202010551124.4A priority Critical patent/CN111781405A/en
Publication of CN111781405A publication Critical patent/CN111781405A/en
Pending legal-status Critical Current

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    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02General constructional details
    • G01R1/04Housings; Supporting members; Arrangements of terminals
    • G01R1/0408Test fixtures or contact fields; Connectors or connecting adaptors; Test clips; Test sockets
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02General constructional details
    • G01R1/04Housings; Supporting members; Arrangements of terminals
    • G01R1/0408Test fixtures or contact fields; Connectors or connecting adaptors; Test clips; Test sockets
    • G01R1/0416Connectors, terminals
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/20Modifications of basic electric elements for use in electric measuring instruments; Structural combinations of such elements with such instruments
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere

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  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Measuring Leads Or Probes (AREA)

Abstract

The invention relates to an IPM dynamic parameter test fixture, which comprises a fixture bracket, a fixture support and a plurality of IPM dynamic parameter test fixture supporting frames; the test base is fixedly arranged on the clamp bracket, a test connecting end used for connecting the IPM module to be tested is arranged on the test base, the test connecting end comprises a test block and a plurality of surface contact elements arranged on the test block corresponding to pins of the IPM module to be tested, and the surface contact elements are electrically connected with a test unit; the switching device is arranged on the clamp support and used for cutting off or communicating the test unit and the tested IPM module.

Description

IPM dynamic parameter test fixture
Technical Field
The invention belongs to the field of electric appliance testing, and particularly relates to an IPM dynamic parameter testing clamp.
Background
IPM, i.e., an intelligent Power Module (intelligent Power Module), integrates a Power switch device and a driving circuit, plays an important role in Power electronic conversion, and is widely applied to the fields of electric vehicles, various inverter Power supplies, variable frequency household appliances, servo driving and the like.
The electrical parameter test, especially the dynamic parameter test, of the IPM plays an important role in ensuring the performance of the IPM. For dynamic parameter testing of power modules in the industry, probe contact type connection is commonly adopted for electrical connection between a test fixture and a module, as shown in fig. 1, probe connection of a certain terminal is adopted, and other terminals are similar. The contact surface of the probe and the electrical terminal of the module is small, point contact connection is possible, the problem of connection reliability exists, and the terminal generates an ignition phenomenon at a high probability when passing through a large test current in the test process, so that the module and the test equipment are damaged.
Disclosure of Invention
In order to solve the above problems in the background art, the present invention provides an IPM dynamic parameter testing jig, which enables the IPM module to be tested to be in surface contact with the testing connection end, thereby improving the contact stability between the IPM module to be tested and the testing connection end and eliminating the sparking phenomenon.
The invention is realized by the following technical scheme:
the IPM dynamic parameter test fixture is characterized in that: comprises that
A clamp bracket;
the test base is fixedly arranged on the clamp bracket, a test connecting end used for connecting the IPM module to be tested is arranged on the test base, the test connecting end comprises a test block and a plurality of surface contact elements arranged on the test block corresponding to pins of the IPM module to be tested, and the surface contact elements are electrically connected with a test unit;
and the switching device is arranged on the clamp bracket and is used for cutting off or communicating the test unit and the IPM module to be tested.
As a further description of the invention: the surface contact element is arranged as a copper bar, and the copper bar is positioned at the edge of one end of the peripheral wall of the test block, which is far away from the test base.
As a further description of the invention: the surface contact element is a plug pipe which is vertically arranged in the connecting block and is sleeved with the pin of the IPM module to be tested.
As a further description of the invention: the test unit comprises a test circuit arranged in the test base and a plurality of signal transmission probes arranged on two sides of the test base, and the signal transmission probes are electrically connected with the test circuit.
As a further description of the invention: the test base is provided with a plurality of closing devices in the one side that sets up the test link, be provided with the butt border on the perisporium of test piece, closing device can butt the butt border.
As a further description of the invention: the test base is provided with at least two sleeve connecting rods, and the butt joint edges or/and the test blocks correspond to the sleeve connecting rods and are provided with at least two sleeve connecting holes.
As a further description of the invention: the jig is characterized in that a reciprocating driving source is arranged on the jig support and connected with a heating body, and the reciprocating driving source can drive the heating body to abut against or be separated from the IPM module to be tested.
As a further description of the invention: and a heat insulation plate is arranged between the reciprocating driving source and the heating body, and a heat insulation cushion block is arranged between the heat insulation plate and the heating body.
As a further description of the invention: the switching device comprises a mounting plate fixedly arranged on the clamp support and a plurality of pneumatic switches arranged on the mounting plate, and the pneumatic switches are correspondingly arranged on a plurality of signal transmission probes at the bottom of the test substrate.
As a further description of the invention: the pneumatic switch comprises a switching cylinder and a short-circuit gasket arranged on a piston rod of the switching cylinder, and the switching cylinder can drive the short-circuit gasket to be abutted against or separated from the signal transmission probe.
Compared with the prior art, the invention has the following beneficial technical effects:
1. when the IPM module to be tested is installed on the test base, the pins of the IPM module to be tested are abutted with the surface contact elements on the test block in a one-to-one correspondence manner, so that surface contact is formed between the pins of the IPM module to be tested and the surface contact elements, the contact stability between the IPM module to be tested and the test connecting end is improved, and the phenomenon of sparking when the switching device is communicated with the test unit and the IPM module to be tested is eliminated.
2. Be provided with the heat insulating board between reciprocating drive source and the heating member, be provided with thermal-insulated cushion between heat insulating board and the heating member, reduced the heat of transmission to reciprocating drive source, avoid causing the influence to reciprocating drive source's flexible volume.
3. The socket rod and the socket hole enable different test connecting ends to be replaced according to different IPM modules to be tested, and applicability of the device is improved.
4. The pneumatic switch adopts the switching cylinder and the short-circuit gasket arranged on the piston rod of the switching cylinder, so that the overcurrent and pressure resistance is improved, the installation space is reduced, and the high integration degree of the clamp is improved.
Drawings
FIG. 1 is a schematic diagram of a prior art IPM module and probe connection;
FIG. 2 is a schematic view of the overall structure of the present invention;
FIG. 3 is a schematic view of a portion of the structure of the present invention, which is intended to show the test block, the abutting edge, the copper bar and the insertion hole;
FIG. 4 is a schematic diagram of a portion of the present invention, intended to show a test base and signal transmission probes;
fig. 5 is a schematic diagram of the connection between the test block and the IPM module according to the second embodiment of the present invention, which is intended to show the plug-in pipe.
Description of the reference numerals
1. A clamp bracket; 11. a reciprocating drive source; 12. a heating body; 13. a heat insulation plate; 14. a heat insulation cushion block; 2. a test base; 21. testing the connecting end; 211. a test block; 2111. an abutment edge; 212. copper bars; 213. inserting a pipe; 22. a signal delivery probe; 23. a pressing device; 24. a sleeved rod; 25. sleeving a hole; 3. a switching device; 31. mounting a plate; 32. a pneumatic switch; 321. switching the air cylinder; 322. and (6) short-circuit gaskets.
Detailed Description
In order that the above objects, features and advantages of the present invention can be more clearly understood, a detailed description of the present invention will be given below with reference to the accompanying drawings and specific embodiments. It should be noted that the embodiments and features of the embodiments of the present application may be combined with each other without conflict.
In the description of the present invention, it should be noted that the terms "center", "upper", "lower", "left", "right", "vertical", "horizontal", "inner", "outer", etc. indicate orientations or positional relationships based on the orientations or positional relationships shown in the drawings or the orientations or positional relationships that the products of the present invention are conventionally placed in use, and are only used for convenience in describing the present invention and simplifying the description, but do not indicate or imply that the devices or elements referred to must have a specific orientation, be constructed and operated in a specific orientation, and thus, should not be construed as limiting the present invention. Furthermore, the terms "first," "second," "third," and the like are used solely to distinguish one from another and are not to be construed as indicating or implying relative importance.
Furthermore, the terms "horizontal", "vertical" and the like do not imply that the components are required to be absolutely horizontal or pendant, but rather may be slightly inclined. For example, "horizontal" merely means that the direction is more horizontal than "vertical" and does not mean that the structure must be perfectly horizontal, but may be slightly inclined.
In the description of the present invention, it should also be noted that, unless otherwise explicitly specified or limited, the terms "disposed," "mounted," "connected," and "connected" are to be construed broadly and may, for example, be fixedly connected, detachably connected, or integrally connected; can be mechanically or electrically connected; they may be connected directly or indirectly through intervening media, or they may be interconnected between two elements. The specific meanings of the above terms in the present invention can be understood in specific cases to those skilled in the art.
Example one
As shown in fig. 2 to 4, an IPM dynamic parameter testing jig includes a jig support 1, a testing base 2 fixedly disposed on the jig support 1, and a switching device 3 disposed on the jig support 1; specifically, the clamp bracket 1 comprises four vertically arranged support columns and mounting base plates arranged at two ends of the support columns; the test base 2 is provided with a communication gap so that a test circuit can be conveniently connected to a main circuit line; the switching device 3 is located directly below the test base 2.
The test base 2 is provided with a test connecting end 21 for connecting the IPM module to be tested, the test connecting end 21 comprises a test block 211 and a plurality of surface contact elements arranged on the test block 211 corresponding to pins of the IPM module to be tested, and the surface contact elements are electrically connected with a test unit; the surface contact element is arranged as a copper bar 212, and the copper bar 212 is positioned at the edge of one end of the peripheral wall of the test block 211 far away from the test base 2. Specifically, the test base 2 is disposed between the two mounting plates 31, the copper bar 212 is L-shaped, one end of the copper bar 212 penetrates through the test connection end 21, and the pins of the IPM module to be tested are abutted to the peripheral wall of the test block 211 of the copper bar 212.
The test unit includes a test circuit provided in the test base 2 and a plurality of signal transfer probes 22 provided at both sides of the test base 2, the signal transfer probes 22 being electrically connected to the test circuit. The test base 2 is provided with a plurality of hold-down devices 23 on the side of setting up test connection end 21, is provided with butt border 2111 on the test piece 211, and hold-down device 23 can butt border 2111. Specifically, closing device 23 is provided with three including compressing tightly the cylinder and setting at the compact heap that compresses tightly cylinder piston rod tip, and three closing device 23 sets up in test block 211 except that being equipped with all the other three border departments of breach.
The test base 2 is provided with at least two sleeve rods 24, and the abutting edge 2111 or/and the test block 211 are provided with two sleeve holes 25 corresponding to the sleeve rods 24. Specifically, the number of the sleeve-joint rods 24 is four, the number of the corresponding sleeve-joint holes 25 is four, and the sleeve-joint holes 25 are all arranged on the abutting edge 2111.
The fixture support 1 is provided with a reciprocating drive source 11, the reciprocating drive source 11 is connected with a heating body 12, and the reciprocating drive source 11 can drive the heating body 12 to abut against or separate from the IPM module to be tested; a heat insulation plate 13 is arranged between the reciprocating drive source 11 and the heating body 12, and a heat insulation cushion block 14 is arranged between the heat insulation plate 13 and the heating body 12. Specifically, the reciprocating driving source 11 is provided as a heating cylinder, the heat insulating plate 13 is simultaneously slidably connected with four pillars, the heat insulating plate 13 and the heat insulating cushion block 14 are integrally provided, and the heating body 12 is fixedly connected with the heat insulating cushion block 14.
The switching device 3 is used for cutting off or communicating the test unit and the IPM module to be tested, the switching device 3 comprises a mounting plate 31 fixedly arranged on the clamp bracket 1 and a plurality of pneumatic switches 32 arranged on the mounting plate 31, and the plurality of pneumatic switches 32 are arranged corresponding to the plurality of signal transmission probes 22 positioned at the bottom of the test substrate; the pneumatic switch 32 comprises a switching cylinder 321 and a shorting pad 322 disposed on a piston rod of the switching cylinder 321, the shorting pad 322 being capable of abutting or disengaging the signal transmission probe 22. Specifically, the mounting plate 31 is fixedly arranged on a mounting substrate at the bottom of the test base 2, the test base 2 is fixedly arranged on the mounting plate 31, and support rods are arranged among the mounting substrate, the mounting plate 31 and the test base 2; the shorting pad 322 is made of copper and is individually controlled by a plurality of switching cylinders 321.
The specific implementation manner of this embodiment: when the device uses, will required test link 21 set up to be cup jointed to test base 2 through dead lever and fixed orifices, then will be surveyed IPM module and install to test link 21 on, make the pin of being surveyed IPM module and the copper bar 212 one-to-one butt on the test block 211, form the face contact between the pin of being surveyed IPM module and face contact element, need carry out the heating test to being surveyed IPM module, preheat heating member 12, then form the cylinder and stretch out the piston rod and make heating member 12 move down and compress tightly surveyed IPM module, then compress tightly the cylinder and stretch out the piston rod and make the compact heap support tight butt border 2111, fix test module, drive different signal transmission probe 22 that short circuit gasket 322 contact corresponds of difference through different switching cylinders 321 at last, carry out the switch-on and the shutoff of electrical signal, thereby carry out the switching between the test unit.
Example two
As shown in fig. 5, the present embodiment is the same as the first embodiment except that the surface contact element is configured as a plugging pipe 213, the plugging pipe 213 is vertically disposed in the connection block, and the plugging pipe 213 is sleeved with the pin of the IPM module to be tested. Specifically, the insertion tube 213 is made of copper, and a rectangular tube is provided corresponding to the pin of the IPM module to be tested.
The specific implementation manner of this embodiment: the pins of the IPM module to be tested are inserted into the corresponding insertion tubes 213, and the other embodiments are the same as the first embodiment.
The embodiments given above are preferable examples for implementing the present invention, and the present invention is not limited to the above-described embodiments. Any non-essential addition and replacement made by the technical characteristics of the technical scheme of the invention by a person skilled in the art belong to the protection scope of the invention.

Claims (10)

1. The IPM dynamic parameter test fixture is characterized in that: comprises that
A clamp holder (1);
the test base (2) is fixedly arranged on the clamp bracket (1), a test connecting end (21) used for connecting the IPM module to be tested is arranged on the test base (2), the test connecting end (21) comprises a test block (211) and a plurality of surface contact elements arranged on the test block (211) corresponding to pins of the IPM module to be tested, and the surface contact elements are electrically connected with a test unit;
and the switching device (3) is arranged on the clamp bracket (1) and is used for cutting off or communicating the test unit and the IPM module to be tested.
2. The IPM dynamic parameter test fixture of claim 1, wherein: the surface contact element is arranged to be a copper bar (212), and the copper bar (212) is positioned at the edge of one end, far away from the test base (2), of the peripheral wall of the test block (211).
3. The IPM dynamic parameter test fixture of claim 1, wherein: the surface contact element is arranged to be a plug pipe (213), the plug pipe (213) is vertically arranged in the connecting block, and the plug pipe (213) is sleeved with a pin of the IPM module to be tested.
4. The IPM dynamic parameter test fixture of claim 1, wherein: the test unit comprises a test circuit arranged in the test base (2) and a plurality of signal transmission probes (22) arranged on two sides of the test base (2), wherein the signal transmission probes (22) are electrically connected with the test circuit.
5. The IPM dynamic parameter test fixture of claim 1, wherein: the test base (2) is provided with a plurality of pressing devices (23) on one side of the test connecting end (21), an abutting edge (2111) is arranged on the peripheral wall of the test block (211), and the pressing devices (23) can abut against the abutting edge (2111).
6. The IPM dynamic parameter test fixture of claim 5, wherein: the test base (2) is provided with at least two sleeve-joint rods (24), and the abutting edge (2111) or/and the test block (211) are provided with at least two sleeve-joint holes (25) corresponding to the sleeve-joint rods (24).
7. The IPM dynamic parameter test fixture of claim 1, wherein: be provided with reciprocal driving source (11) on anchor clamps support (1), reciprocal driving source (11) are connected with heating body (12), reciprocal driving source (11) can drive heating body (12) butt or break away from by survey IPM module.
8. The IPM dynamic parameter test fixture of claim 7, wherein: a heat insulation plate (13) is arranged between the reciprocating drive source (11) and the heating body (12), and a heat insulation cushion block (14) is arranged between the heat insulation plate (13) and the heating body (12).
9. The IPM dynamic parameter test fixture of claim 1, wherein: the switching device (3) comprises a mounting plate (31) fixedly arranged on the clamp support (1) and a plurality of pneumatic switches (32) arranged on the mounting plate (31), and the pneumatic switches (32) are correspondingly located on a plurality of signal transmission probes (22) arranged at the bottom of the test substrate.
10. The IPM dynamic parameter test fixture of claim 9, wherein: pneumatic switch (32) are in including switching cylinder (321) and setting switching short circuit gasket (322) on cylinder (321) piston rod, switching cylinder (321) can drive short circuit gasket (322) butt or break away from signal transmission probe (22).
CN202010551124.4A 2020-06-17 2020-06-17 IPM dynamic parameter test fixture Pending CN111781405A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
CN202010551124.4A CN111781405A (en) 2020-06-17 2020-06-17 IPM dynamic parameter test fixture

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
CN202010551124.4A CN111781405A (en) 2020-06-17 2020-06-17 IPM dynamic parameter test fixture

Publications (1)

Publication Number Publication Date
CN111781405A true CN111781405A (en) 2020-10-16

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Citations (16)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
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CN202121151U (en) * 2011-06-10 2012-01-18 江苏富思特电源有限公司 Copper bar for formation of lead-acid battery
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CN205581258U (en) * 2016-04-02 2016-09-14 罗定市嘉裕电子有限公司 Transformer high pressure testing arrangement
CN206134837U (en) * 2016-09-28 2017-04-26 惠州金源精密自动化设备有限公司 Electricity core hot pressing test machine
CN207408500U (en) * 2017-06-26 2018-05-25 南通新江海动力电子有限公司 Thin-film capacitor detection device
CN208568974U (en) * 2018-08-09 2019-03-01 济南半一电子有限公司 Transistor physics aging testing apparatus
CN110089952A (en) * 2019-05-14 2019-08-06 苏州博学智能科技有限公司 A kind of intelligent electric oven of automatic tapping
CN209356436U (en) * 2018-12-21 2019-09-06 罗玉燕 A kind of TDS probe
CN110954803A (en) * 2019-11-21 2020-04-03 合肥科威尔电源系统股份有限公司 Semiconductor device test system and test method thereof

Patent Citations (16)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN2481055Y (en) * 2001-05-12 2002-03-06 洛阳市昌祺科技开发有限公司 High-voltage pulse type power source for dust cleaner
CN202121151U (en) * 2011-06-10 2012-01-18 江苏富思特电源有限公司 Copper bar for formation of lead-acid battery
CN202297820U (en) * 2011-10-28 2012-07-04 黄石市天畅输送机械有限公司 Electrophoresis surface treatment electricity receiving device
CN104025287A (en) * 2011-10-31 2014-09-03 罗姆股份有限公司 Semiconductor device
CN202909967U (en) * 2012-11-01 2013-05-01 佛山市蓝箭电子股份有限公司 Testing and sorting equipment for semi-conductors
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CN204180375U (en) * 2014-08-05 2015-02-25 美的集团股份有限公司 Circuit board assemblies
CN204392174U (en) * 2015-01-29 2015-06-10 西安黄河光伏科技股份有限公司 A kind of solar module defect test instrument integral type test probe
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CN209356436U (en) * 2018-12-21 2019-09-06 罗玉燕 A kind of TDS probe
CN110089952A (en) * 2019-05-14 2019-08-06 苏州博学智能科技有限公司 A kind of intelligent electric oven of automatic tapping
CN110954803A (en) * 2019-11-21 2020-04-03 合肥科威尔电源系统股份有限公司 Semiconductor device test system and test method thereof

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