CN202909967U - Testing and sorting equipment for semi-conductors - Google Patents
Testing and sorting equipment for semi-conductors Download PDFInfo
- Publication number
- CN202909967U CN202909967U CN 201220571800 CN201220571800U CN202909967U CN 202909967 U CN202909967 U CN 202909967U CN 201220571800 CN201220571800 CN 201220571800 CN 201220571800 U CN201220571800 U CN 201220571800U CN 202909967 U CN202909967 U CN 202909967U
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- China
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- testing
- pin
- test
- measured device
- pawl
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- Expired - Lifetime
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Abstract
Testing and sorting equipment for semi-conductors comprises testing claws, as well as testing claw driving mechanisms driving the testing claws to be contacted with or be separated from tested device pins, wherein the testing claws are connected with a controller of the equipment through testing wires, and are merely arranged on one lateral surfaces of the tested device pins; insulators capable of bearing the tested device pins are arranged on the other lateral surfaces of the tested device pins; and the testing claws are contacted with the tested device pins in a surface contact manner. The testing and sorting equipment can guarantee both the testing stability, and the appearance and the coplanarity of the tested device pins.
Description
Technical field
The utility model relates to a kind of equipment that semi-conductor discrete device is carried out testing, sorting, relates in particular to the testing, sorting equipment that is applied to semiconductor devices TO-251, TO-252 encapsulating products.
Background technology
At present, be applied to the testing, sorting equipment of semiconductor devices TO-251, TO-252 encapsulating products, its test pawl all is that the mode with a contact contacts with the pin of measured device, and all be provided with the test pawl in two sides of measured device pin, during test, the test pawl of two sides is simultaneously by on the pin that is pressed in measured device.Thus, if there is deviation in the contact point of the test pawl of two sides and measured device pin, just be easy to the pin of measured device is bent, cause the coplanarity of pin bad.Moreover the test pawl contacts with the pin point of measured device, easily damages the outward appearance of pin, and if reduce to test pawl to the pressure of measured device pin, be difficult to again to guarantee the stability of testing.
The utility model content
The purpose of this utility model provides a kind of semiconductor test screening installation, and this equipment can be guaranteed the stability of testing, and can guarantee again outward appearance and the coplanarity of measured device pin.
The technical scheme that the utility model is taked is: a kind of semiconductor test screening installation, comprise the test pawl, driving the test pawl contacts and the test pawl driving mechanism that separates with the pin of measured device, the test pawl is connected with the controller of equipment by test lead, the test pawl only is arranged in the single side of measured device pin, but be provided with the insulator of support measured device pin in the another side of measured device pin, the test pawl contacts with the pin of measured device in the mode of face contact.
The utility model has the advantages that, the test pawl is only pressed the pin of measured device from a direction, and at the another side of pin the insulator support is arranged, therefore testing pawl can not bend the pin of measured device, guarantee the coplanarity of pin, also can make simultaneously the test pawl with enough pressure by being pressed on the pin, guarantee the stability of testing.Moreover the test pawl contacts with the pin of measured device in the mode of face contact, can guarantee that the outward appearance of pin is injury-free.
Description of drawings
Fig. 1 is the structural representation of the utility model embodiment;
Longitudinal section schematic diagram when Fig. 2 is contacting with the measured device pin of test pawl.
The specific embodiment
Referring to Fig. 1, according to a kind of semiconductor test screening installation described in the utility model as shown in Figure 1, comprise branched test pawl 1, the test pawl is connected (not shown test lead and controller) by test lead with the controller of equipment.Every test pawl is installed on the unit of plastic 3 by corresponding metal stator 2, and unit of plastic 3 is fixed on the board 9 of semiconductor test screening installation.
Consist of test pawl driving mechanism by cylinder 4, carrying fixed support 5, insulating ceramics circle 6.Cylinder 4 drives insulating ceramics circles 6 by carrying fixed support 5 and moves up and down, and then drives each test pawl by insulating ceramics circle 6 and contact with the pin of measured device and separate.
Movement range for control test pawl 1, cylinder action means for adjusting limit of movement can be installed on the transmission cylinder of cylinder 4 and test pawl 1, control the amplitude of cylinder action by the adjusting of screw, thereby effectively control carrying fixed support 5 drives the movement range of test pawl 1, has also namely controlled the dynamics that contacts of test pawl 1 and device pin.
Referring to Fig. 1 and Fig. 2, test pawl 1 is arranged in the single side of measured device pin 7, but is provided with the insulator 8 of support measured device pin in the another side of pin 7 simultaneously, and test pawl 1 contacts with the pin 7 of measured device in the mode of face contact.Insulator 8 can adopt ceramic block.The pin 7 of the measured device among Fig. 2 relies on the insulator 8, but in fact insulator 8 can leave pin 7 certain intervals, as long as guarantee when the pressure of pin 7 tested person pawls 1 during bending, but insulator 8 supports are lived pin 7, make the flexural deformation of pin 7 in recoverable elastic deformation scope.
The quality of test pawl 1 is preferably done partially softlyer, with the outward appearance of protection device pin 7 better.
Claims (1)
1. semiconductor test screening installation, comprise test pawl (1), driving the test pawl contacts and the test pawl driving mechanism that separates with the pin of measured device, the test pawl is connected with the controller of equipment by test lead, feature is: described test pawl (1) only is arranged in the single side of measured device pin, but be provided with the insulator (2) of support measured device pin in the another side of measured device pin, test pawl (1) contacts with the pin of measured device in the mode of face contact.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN 201220571800 CN202909967U (en) | 2012-11-01 | 2012-11-01 | Testing and sorting equipment for semi-conductors |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN 201220571800 CN202909967U (en) | 2012-11-01 | 2012-11-01 | Testing and sorting equipment for semi-conductors |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN202909967U true CN202909967U (en) | 2013-05-01 |
Family
ID=48158312
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN 201220571800 Expired - Lifetime CN202909967U (en) | 2012-11-01 | 2012-11-01 | Testing and sorting equipment for semi-conductors |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN202909967U (en) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN111781405A (en) * | 2020-06-17 | 2020-10-16 | 西安易恩电气科技有限公司 | IPM dynamic parameter test fixture |
-
2012
- 2012-11-01 CN CN 201220571800 patent/CN202909967U/en not_active Expired - Lifetime
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN111781405A (en) * | 2020-06-17 | 2020-10-16 | 西安易恩电气科技有限公司 | IPM dynamic parameter test fixture |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| C14 | Grant of patent or utility model | ||
| GR01 | Patent grant | ||
| CX01 | Expiry of patent term |
Granted publication date: 20130501 |
|
| CX01 | Expiry of patent term |