CN203350302U - A testing probe structure with inclined detecting planes - Google Patents

A testing probe structure with inclined detecting planes Download PDF

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Publication number
CN203350302U
CN203350302U CN 201320357734 CN201320357734U CN203350302U CN 203350302 U CN203350302 U CN 203350302U CN 201320357734 CN201320357734 CN 201320357734 CN 201320357734 U CN201320357734 U CN 201320357734U CN 203350302 U CN203350302 U CN 203350302U
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CN
China
Prior art keywords
testing
plane
probe
probe structure
probes
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
CN 201320357734
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Chinese (zh)
Inventor
冯白华
贾延蝶
王振波
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Shenzhen Sunyilg Intelligent Equipment Co ltd
Original Assignee
Shenzhen Sanyilianguang Automation Equipment Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Shenzhen Sanyilianguang Automation Equipment Co Ltd filed Critical Shenzhen Sanyilianguang Automation Equipment Co Ltd
Priority to CN 201320357734 priority Critical patent/CN203350302U/en
Application granted granted Critical
Publication of CN203350302U publication Critical patent/CN203350302U/en
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

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Abstract

The utility model discloses a testing probe structure with inclined detecting planes and relates to the technical field of component testing. The testing probe structure comprises two probe sleeves in each of which a testing probe is fixed. The two testing probes are arranged oppositely and respectively have an inclined plane on the top thereof. The intersection angles between the inclined planes and a horizontal plane are less than 90 degrees. The two testing probes are capable of clamping and testing a tested component. The testing probe structure has beneficial effects of guaranteeing line contact between the testing probes and the tested component, eliminating unstable factors, and substantially increasing testing precision. When contacting the tested component, the testing probes generate downward component force on the tested component in order to prevent one end of the tested component from being buoyed or warped for increasing testing precision.

Description

The test probe structure that a kind of inclined-plane is surveyed
[technical field]
The utility model relates to the test probe technical field, and in particular, the utility model relates to the test probe structure that a kind of inclined-plane is surveyed.
[background technology]
In the component testing technical field, often need to carry out with test probe the test of various parameters to components and parts.Existing test probe 10 mostly is vertical plane, shown in Fig. 1, it while contacting with element 20, is the face contact, the deviation of position due to the difference of element 20 pins and while surveying, test probe 10 being contacted with element 20 pins and be than the contact of larger area face sometimes, be the face contact of small size sometimes, may be also line contact or some contact sometimes, so just there are the factors of instability, affect measuring accuracy.In addition, while when the test probe 10 on both sides is different, touching element, also can make element float or an end sticks up, so also make test result inaccurate.
[utility model content]
The purpose of this utility model is effectively to overcome the deficiency of above-mentioned technology, the test probe structure that provides a kind of inclined-plane that improves measuring accuracy to survey, when this probe structure is the testing element contact, can prevent that testing element from floating or being upturned, improve the precision of test.
The technical solution of the utility model is achieved in that it includes two probe sets, its improvements are: in described two probe sets, be fixed with respectively a test probe, two test probes are oppositely arranged, the top of described two test probes all has an inclined-plane, the angle of this inclined-plane and surface level is less than 90 °, and described two test probes can clamp testing element tested;
In above-mentioned structure, described test probe also has end face and bottom surface, and the angle on described end face and inclined-plane is A, and the angle on described bottom surface and inclined-plane is B, wherein, described included angle A<90 °, included angle B > 90 °;
In above-mentioned structure, described included angle A=80 °, described included angle B=100 °.
The beneficial effects of the utility model are: the utility model arranges an inclined-plane by the top at test probe, the angle of this inclined-plane and surface level is less than 90 °, the design of this kind of structure, can guarantee that test probe is the line contact while contacting with testing element, there are not the factors of instability, improved greatly measuring accuracy, simultaneously, design due to this kind of inclined-plane, when test probe contacts with testing element, test probe can produce a downward component to testing element, one end that can prevent testing element floats or perk, improve measuring accuracy, the utility model is by the design of simple structure, can increase the cost of product hardly, make the raising that measuring accuracy is very large.
[accompanying drawing explanation]
Fig. 1 is test probe structure of the prior art;
Fig. 2 is front view of the present utility model;
The partial enlarged drawing that Fig. 3 is C place in Fig. 2.
[embodiment]
Below in conjunction with drawings and Examples, the utility model will be further described.
Shown in Fig. 2, the utility model has disclosed the test probe structure that a kind of inclined-plane is surveyed, this test probe structure includes two probe sets 30, and two probe sets 30 are symmetrical arranged, interior test probe 40, two test probes 40 that are fixed with respectively of two probe sets 30 are oppositely arranged, shown in Fig. 3, the top of two test probes 40 all has a 401,Gai inclined-plane, inclined-plane 401 and is less than 90 ° with the angle of surface level, and two test probes 40 can clamp testing element 50 tested.In the present embodiment, test probe 40 has end face 402 and bottom surface 403, and end face 402 is A with the angle on inclined-plane 401, and the angle on 403Yu inclined-plane, bottom surface 401 is B, wherein, described included angle A<90 °, included angle B > 90 °, preferably, described included angle A=80 °, described included angle B=100 °.
The utility model is by the design of said structure, when testing element 50 is tested, can guarantee that test probe 40 is the line contact while contacting with testing element 50, there are not the factors of instability, improved greatly measuring accuracy, simultaneously, design due to this kind of inclined-plane 401, when test probe 40 contacts with testing element 50, test probe 40 can produce a downward component to testing element 50, one end that can prevent testing element 50 floats or perk, improve measuring accuracy, the utility model is by the design of simple structure, can increase the cost of product hardly, make the raising that measuring accuracy is very large.
Described above is only preferred embodiment of the present utility model, and above-mentioned specific embodiment is not to restriction of the present utility model.In technological thought category of the present utility model, various distortion and modification can appear, the retouching that all those of ordinary skill in the art make according to above description, revise or be equal to replacement, all belong to the scope that the utility model is protected.

Claims (3)

1. the test probe structure that an inclined-plane is surveyed, it includes two probe sets, it is characterized in that: in described two probe sets, be fixed with respectively a test probe, two test probes are oppositely arranged, the top of described two test probes all has an inclined-plane, the angle of this inclined-plane and surface level is less than 90 °, and described two test probes can clamp testing element tested.
2. the test probe structure that a kind of inclined-plane according to claim 1 is surveyed, it is characterized in that: described test probe also has end face and bottom surface, and the angle on described end face and inclined-plane is A, the angle on described bottom surface and inclined-plane is B, wherein, described included angle A<90 °, included angle B > 90 °.
3. the test probe structure that a kind of inclined-plane according to claim 2 is surveyed, is characterized in that: described included angle A=80 °, described included angle B=100 °.
CN 201320357734 2013-06-21 2013-06-21 A testing probe structure with inclined detecting planes Expired - Fee Related CN203350302U (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
CN 201320357734 CN203350302U (en) 2013-06-21 2013-06-21 A testing probe structure with inclined detecting planes

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
CN 201320357734 CN203350302U (en) 2013-06-21 2013-06-21 A testing probe structure with inclined detecting planes

Publications (1)

Publication Number Publication Date
CN203350302U true CN203350302U (en) 2013-12-18

Family

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Family Applications (1)

Application Number Title Priority Date Filing Date
CN 201320357734 Expired - Fee Related CN203350302U (en) 2013-06-21 2013-06-21 A testing probe structure with inclined detecting planes

Country Status (1)

Country Link
CN (1) CN203350302U (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN111781405A (en) * 2020-06-17 2020-10-16 西安易恩电气科技有限公司 IPM dynamic parameter test fixture

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN111781405A (en) * 2020-06-17 2020-10-16 西安易恩电气科技有限公司 IPM dynamic parameter test fixture

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Legal Events

Date Code Title Description
C14 Grant of patent or utility model
GR01 Patent grant
C56 Change in the name or address of the patentee

Owner name: SHENZHEN SANYI LIANGUANG INTELLIGENT EQUIPMENT CO.

Free format text: FORMER NAME: SHENZHEN SUNYI LIANGUANG AUTOMATION EQUIPMENT CO., LTD.

CP03 Change of name, title or address

Address after: 518000 Guangdong city of Shenzhen province Baoan District Baoan road and Haicheng Road Interchange labor building (Dexin business center) one to seven floor (F7-22)

Patentee after: SHENZHEN SUNYILG INTELLIGENT EQUIPMENT CO.,LTD.

Address before: 518000 Guangdong city of Shenzhen province Baoan District Xixiang Street Dongcai Industrial Zone guwu community compound No. 6 No. 3 building E building 7 floor

Patentee before: Shenzhen Sunyi Lianguang Automation Equipment Co.,Ltd.

CF01 Termination of patent right due to non-payment of annual fee
CF01 Termination of patent right due to non-payment of annual fee

Granted publication date: 20131218