CN204044184U - Ipm test fixture - Google Patents
Ipm test fixture Download PDFInfo
- Publication number
- CN204044184U CN204044184U CN201420334843.0U CN201420334843U CN204044184U CN 204044184 U CN204044184 U CN 204044184U CN 201420334843 U CN201420334843 U CN 201420334843U CN 204044184 U CN204044184 U CN 204044184U
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- pin
- probe base
- ipm
- pin probe
- cam
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- 238000012360 testing method Methods 0.000 title claims abstract description 50
- 239000000523 sample Substances 0.000 claims abstract description 79
- 230000033001 locomotion Effects 0.000 claims abstract description 13
- 230000001105 regulatory effect Effects 0.000 claims description 3
- 238000012858 packaging process Methods 0.000 abstract description 3
- 238000011056 performance test Methods 0.000 abstract description 3
- 238000012797 qualification Methods 0.000 abstract description 3
- 238000013461 design Methods 0.000 description 6
- 238000010586 diagram Methods 0.000 description 6
- 238000000034 method Methods 0.000 description 5
- 230000008901 benefit Effects 0.000 description 2
- 238000001514 detection method Methods 0.000 description 2
- 238000009434 installation Methods 0.000 description 2
- 238000005259 measurement Methods 0.000 description 2
- 230000009471 action Effects 0.000 description 1
- 230000009286 beneficial effect Effects 0.000 description 1
- 230000008859 change Effects 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 230000006872 improvement Effects 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- 230000008569 process Effects 0.000 description 1
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Abstract
The utility model provides a kind of IPM test fixture, comprises pin module, and test products is arranged in pin module, and the input and output pin of test products inserts in pin module; Output pin probe base, is arranged on the side that pin module output pin inserts, output pin probe base is provided with output pin probe; Input pin probe base, is arranged on the side that pin module input pin inserts, input pin probe base is provided with input pin probe; Motion, driver output pin probe base and input pin probe base contact with pin module simultaneously or depart from.The properties of product quality of pin forming after test step, outward appearance, packaging process has been controlled according to IPM test fixture of the present utility model; The electric performance test of IPM capable of being compatible with multi-type.Improve finished product shipment qualification rate; Reduce Customer Quality to complain.
Description
Technical field
The utility model relates to electric test field, especially, relates to a kind of IPM test fixture.
Background technology
IPM Intelligent Power Module is because each producer is to mould envelope body profile structural design difference, and the required means of detection of finished product, the difference of test item, the design of test fixture by difference, for IPM Intelligent Power Module type, the current domestic Universal clamp without test product.
Utility model content
The utility model object is to provide a kind of IPM test fixture, to solve in prior art the technical matters not having IPM test fixture.
For achieving the above object, the utility model provides a kind of IPM test fixture, comprises pin module, and test products is arranged in pin module, and the input and output pin of test products inserts in pin module; Output pin probe base, is arranged on the side that pin module output pin inserts, output pin probe base is provided with output pin probe; Input pin probe base, is arranged on the side that pin module input pin inserts, input pin probe base is provided with input pin probe; Motion, driver output pin probe base and input pin probe base contact with pin module simultaneously or depart from.
Further, output pin probe adopts biserial linear structure.
Further, input pin probe is double-row type cross structure.
Further, also comprise guide rail, pin module installation is on guide rail, and output pin probe base and input pin probe base are slidably disposed on guide rail.
Further, motion comprises double-cam structure and syndeton, and syndeton is connected with input pin probe base with output pin probe base simultaneously.
Further, double-cam structure comprises the first cam and the second cam that are crisscross arranged in 90 degree.
Further, the first cam and the second cam coaxial are arranged on operating rod.
Further, syndeton comprises mutually vertically disposedly opens arm and swing arm, opens arm and is connected with contiguous block with swing arm simultaneously.
Further, motion also comprises the abutting part abutted with the first cam and the second cam slide respectively, and abutting part comprises the first abutting part and the second abutting part, and the first abutting part and the first cam abut against, and the second abutting part and the second cam abut against.
Further, also comprise adjustment fixed block, be connected with pin module, adjustment fixed block comprises interconnective fixed block and regulating block.
Further, between output pin probe base and guide rail, be provided with slide block, between input pin probe base and guide rail, be provided with slide block.
The utility model has following beneficial effect:
The application has controlled the properties of product quality of pin forming after test step, outward appearance, packaging process; The electric performance test of IPM capable of being compatible with multi-type.Improve finished product shipment qualification rate; Reduce Customer Quality to complain.
Except object described above, feature and advantage, the utility model also has other object, feature and advantage.Below with reference to figure, the utility model is described in further detail.
Accompanying drawing explanation
The accompanying drawing forming a application's part is used to provide further understanding of the present utility model, and schematic description and description of the present utility model, for explaining the utility model, is not formed improper restriction of the present utility model.In the accompanying drawings:
Fig. 1 is according to IPM test fixture schematic diagram of the present utility model;
Fig. 2 is the schematic diagram of the pin module according to IPM test fixture of the present utility model;
Fig. 3 is the schematic diagram of the output pin probe base according to IPM test fixture of the present utility model;
Fig. 4 is the schematic diagram of the output pin probe base according to IPM test fixture of the present utility model;
Fig. 5 is the schematic diagram of the motion according to IPM test fixture of the present utility model; And
Fig. 6 is the rear side over glaze side schematic diagram of the motion according to IPM test fixture of the present utility model.
Embodiment
Below in conjunction with accompanying drawing, embodiment of the present utility model is described in detail, but the multitude of different ways that the utility model can be defined by the claims and cover is implemented.
See Fig. 1 to Fig. 6, according to IPM test fixture of the present utility model, comprise pin module 10, test products is arranged in pin module 10, and the input and output pin of test products inserts in pin module 10; Output pin probe base 20, is arranged on the side that pin module 10 output pin inserts, output pin probe base 20 is provided with output pin probe 21; Input pin probe base 30, is arranged on the side that pin module 10 input pin inserts, input pin probe base 30 is provided with input pin probe 31; Motion, driver output pin probe base 20 and input pin probe base 30 contact with pin module 10 simultaneously or depart from.The utility model provides a kind of fixture detected IPM Intelligent Power Module electrical property, and timely and effective testing product quality ensures the qualified shipment of product.Compatible aspect, this structure can directly be applicable to 4 kinds of IPM module testings; And by according to dissimilar IPM module, design different pin modules, output pin probe base, input pin probe base, and change and use, can the IPM module testing of compatible number of different types.
See Fig. 3 to Fig. 4, output pin probe 21 adopts biserial linear structure.Input pin probe 31 is double-row type cross structure.
See Fig. 1, Fig. 5 and Fig. 6, IPM test fixture also comprises guide rail 40, and pin module 10 is arranged on guide rail 40, and output pin probe base 20 and input pin probe base 30 are slidably disposed on guide rail 40.Motion comprises double-cam structure 51 and syndeton 52, and syndeton 52 is connected with input pin probe base 30 with output pin probe base 20 simultaneously.Double-cam structure 51 comprises two in 90 degree of cams be crisscross arranged.Two cam coaxials are arranged on operating rod.
See Fig. 1, Fig. 5 and Fig. 6, syndeton 52 comprises mutually vertically disposedly opens arm 521 and swing arm 522, opens arm 521 and is connected with contiguous block 523 with swing arm 522 simultaneously, hang with extension spring, strained by both sides probe to centre between two contiguous blocks 523 of both sides.IPM test fixture also comprises adjustment fixed block, is connected with pin module 10, and adjustment fixed block comprises interconnective fixed block 61 and regulating block 62.Be provided with slide block 70 between output pin probe base 20 and guide rail 40, between on input pin probe base 30 and guide rail 40, be provided with slide block 70.
See Fig. 1, Fig. 5 and Fig. 6, motion also comprises the abutting part 53 abutted that slides with the first cam 511 and the second cam 512 respectively, abutting part 53 comprises the first abutting part 531 and the second abutting part 532, first abutting part 531 and the first cam 511 abut against, and the second abutting part 532 and the second cam 512 abut against.First abutting part 531 is fixed in swing arm 522, and the second abutting part 532 is fixed on base plate by column.
Wherein detect the probe totally 44 of IPM input pin, output pin probe 14, all probe tail ends weld out connecting line on special test machine.
Testing process:
Put into tested IP M and close up contact IPM pin → startup testing apparatus → test end to pin module → rotation operating rod 90 degree → both sides input and output detections probe, then swivel lever 90 degree → input and output detector probe oppositely departs from IPM pin → taking-up tested IP M → analysis to measure data.
As shown in Figure 1, designed by tested IP M module, intermediate groove is that IPM is spacing to described 9 pin modules, and dentation fringe is that IPM output pin inserts die cavity, and many circular holes side is that IPM input pin inserts die cavity, and adopt chamfering to enter limit, smooth and easy importing IPM locates.Described alternating method, is illustrated in fig. 3 shown below, and IPM input pin inserts die cavity and adopts biserial probe aperture alternating method, and inside and outside pin first row probe aperture is staggered 1.5mm up and down, and inside and outside pin secondary series is staggered 1.5mm up and down, effectively expands Single probe diameter to φ 1.1mm.
Wherein input pin probe base is illustrated in fig. 5 shown below, same and pin module same design, adopts biserial probe cross structure.Double column structure doubles than common single-row measurement point, can detect by entry simultaneously; Cross structure makes probe diameter maximize, and ensures contact area and contact reliability.Wherein 3 output pin probe bases are illustrated in fig. 6 shown below, according to thick pin-pitch feature, set by count the in line method of biserial probe, upper and lower column pitch is designed to 4mm, and single hole diameter is designed to φ 3.65mm.Double column structure doubles than common single-row measurement point, can detect by entry simultaneously; Because output pin spacing is large, the probe diameter of line spread structure can cover pin widths.
Its middle probe closes up and detects and open employing and be illustrated in fig. 5 shown below double cam 90 degree of interlace modes, cam adopts the two location of symmetrical expression, realize managing output pin and input detecting simultaneously, another cam adopts suitable structure, stagger installation in 90 degree, θ direction, be that probe opens positioning states during location, this position, both sides fork adopts extension spring traction.Conjunction is disturbed all has location with expansion action, is unlikely to random Chu Touch handle and makes misoperation; 90 degree of switching motions, simple to operate.
Output pin probe detecting head diameter design is φ 3mm.Input pin probe detecting head diameter design is φ 0.9mm.
As can be seen from the above description, the utility model the above embodiments achieve following technique effect:
The application has controlled the properties of product quality of pin forming after test step, outward appearance, packaging process; The electric performance test of IPM capable of being compatible with multi-type.Improve finished product shipment qualification rate; Reduce Customer Quality to complain.
The foregoing is only preferred embodiment of the present utility model, be not limited to the utility model, for a person skilled in the art, the utility model can have various modifications and variations.All within spirit of the present utility model and principle, any amendment done, equivalent replacement, improvement etc., all should be included within protection domain of the present utility model.
Claims (11)
1. an IPM test fixture, is characterized in that, comprising:
Pin module (10), test products is arranged on described pin module (10), and the input and output pin of described test products inserts in described pin module (10);
Output pin probe base (20), is arranged on the side that described pin module (10) output pin inserts, described output pin probe base (20) is provided with output pin probe (21);
Input pin probe base (30), is arranged on the side that described pin module (10) input pin inserts, described input pin probe base (30) is provided with input pin probe (31);
Motion, drives described output pin probe base (20) and described input pin probe base (30) contact with described pin module (10) or depart from simultaneously.
2. IPM test fixture according to claim 1, is characterized in that, described output pin probe (21) adopts biserial linear structure.
3. IPM test fixture according to claim 1, is characterized in that, described input pin probe (31) is double-row type cross structure.
4. IPM test fixture according to claim 1, it is characterized in that, also comprise guide rail (40), described pin module (10) is arranged on described guide rail (40), and described output pin probe base (20) and described input pin probe base (30) are slidably disposed on described guide rail (40).
5. IPM test fixture according to claim 1, it is characterized in that, described motion comprises double-cam structure (51) and syndeton (52), and described syndeton (52) is connected with described input pin probe base (30) with described output pin probe base (20) simultaneously.
6. IPM test fixture according to claim 5, is characterized in that, described double-cam structure (51) comprises the first cam (511) and the second cam (512) that are crisscross arranged in 90 degree.
7. IPM test fixture according to claim 6, is characterized in that, described first cam (511) and described second cam (512) are coaxially arranged on operating rod.
8. IPM test fixture according to claim 5, it is characterized in that, described syndeton (52) comprises mutually vertically disposedly opens arm (521) and swing arm (522), described in open arm (521) and be connected with contiguous block (523) with described swing arm (522) simultaneously.
9. IPM test fixture according to claim 6, it is characterized in that, described motion also comprises the abutting part (53) abutted that slides with described first cam (511) and described second cam (512) respectively, described abutting part (53) comprises the first abutting part (531) and the second abutting part (532), described first abutting part (531) and described first cam (511) abut against, and described second abutting part (532) and described second cam (512) abut against.
10. IPM test fixture according to claim 1, it is characterized in that, also comprise adjustment fixed block, be connected with described pin module (10), described adjustment fixed block comprises interconnective fixed block (61) and regulating block (62).
11. IPM test fixtures according to claim 4, it is characterized in that, be provided with slide block (70) between described output pin probe base (20) and described guide rail (40), between described input pin probe base (30) and described guide rail (40), be provided with slide block (70).
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201420334843.0U CN204044184U (en) | 2014-06-20 | 2014-06-20 | Ipm test fixture |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201420334843.0U CN204044184U (en) | 2014-06-20 | 2014-06-20 | Ipm test fixture |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN204044184U true CN204044184U (en) | 2014-12-24 |
Family
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Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201420334843.0U Expired - Lifetime CN204044184U (en) | 2014-06-20 | 2014-06-20 | Ipm test fixture |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN204044184U (en) |
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN105589036A (en) * | 2016-02-29 | 2016-05-18 | 惠州金源精密自动化设备有限公司 | Relay aging tester |
| CN111781405A (en) * | 2020-06-17 | 2020-10-16 | 西安易恩电气科技有限公司 | IPM dynamic parameter test fixture |
-
2014
- 2014-06-20 CN CN201420334843.0U patent/CN204044184U/en not_active Expired - Lifetime
Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN105589036A (en) * | 2016-02-29 | 2016-05-18 | 惠州金源精密自动化设备有限公司 | Relay aging tester |
| CN105589036B (en) * | 2016-02-29 | 2019-02-26 | 惠州金源精密自动化设备有限公司 | Relay Aging test machine |
| CN111781405A (en) * | 2020-06-17 | 2020-10-16 | 西安易恩电气科技有限公司 | IPM dynamic parameter test fixture |
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| Date | Code | Title | Description |
|---|---|---|---|
| C14 | Grant of patent or utility model | ||
| GR01 | Patent grant | ||
| CX01 | Expiry of patent term |
Granted publication date: 20141224 |