CN111736094B - PCI-E test card - Google Patents
PCI-E test card Download PDFInfo
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- CN111736094B CN111736094B CN202010714169.9A CN202010714169A CN111736094B CN 111736094 B CN111736094 B CN 111736094B CN 202010714169 A CN202010714169 A CN 202010714169A CN 111736094 B CN111736094 B CN 111736094B
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/50—Testing of electric apparatus, lines, cables or components for short-circuits, continuity, leakage current or incorrect line connections
- G01R31/52—Testing for short-circuits, leakage current or ground faults
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R19/00—Arrangements for measuring currents or voltages or for indicating presence or sign thereof
- G01R19/25—Arrangements for measuring currents or voltages or for indicating presence or sign thereof using digital measurement techniques
- G01R19/2503—Arrangements for measuring currents or voltages or for indicating presence or sign thereof using digital measurement techniques for measuring voltage only, e.g. digital volt meters (DVM's)
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R27/00—Arrangements for measuring resistance, reactance, impedance, or electric characteristics derived therefrom
- G01R27/02—Measuring real or complex resistance, reactance, impedance, or other two-pole characteristics derived therefrom, e.g. time constant
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/50—Testing of electric apparatus, lines, cables or components for short-circuits, continuity, leakage current or incorrect line connections
- G01R31/54—Testing for continuity
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- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F13/00—Interconnection of, or transfer of information or other signals between, memories, input/output devices or central processing units
- G06F13/38—Information transfer, e.g. on bus
- G06F13/40—Bus structure
- G06F13/4063—Device-to-bus coupling
- G06F13/4068—Electrical coupling
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- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F2213/00—Indexing scheme relating to interconnection of, or transfer of information or other signals between, memories, input/output devices or central processing units
- G06F2213/0026—PCI express
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- General Physics & Mathematics (AREA)
- Engineering & Computer Science (AREA)
- General Engineering & Computer Science (AREA)
- Theoretical Computer Science (AREA)
- Computer Hardware Design (AREA)
- Tests Of Electronic Circuits (AREA)
Abstract
The invention relates to the technical field of electronic test, in particular to a PCI-E test card, which comprises a microprocessor, a power interface circuit, an open-short circuit test circuit, a resistance test circuit, a voltage test circuit, an IO expansion circuit, an RS485 communication circuit, a USART communication circuit, a Micro-USB interface circuit, a PCI-E interface circuit, a JTAG interface circuit and a dial switch, wherein the power interface circuit is connected with the microprocessor; the invention can simultaneously carry out open-short circuit test, resistance test and voltage test on the mainboard, the display card and the like, can also carry out communication function test on the mainboard, the display card and the like, has complete test types, can simultaneously test various data, and has the advantages of simple operation, high test efficiency, wide application range and strong practicability.
Description
The technical field is as follows:
the invention relates to the technical field of electronic test, in particular to a PCI-E test card.
Background art:
PCI-E (peripheral component interconnect express) is a high-speed serial computer expansion bus standard, originally named "3 GIO", which was proposed by Intel in 2001, to replace the old PCI, PCI-X and AGP bus standards. The PCI-E belongs to high-speed serial point-to-point double-channel high-bandwidth transmission, connected devices share the allocated channel bandwidth exclusively, and the functions of active power management, error reporting, end-to-end reliable transmission, hot plug, quality of service (QOS) and the like are mainly supported.
In order to ensure that no abnormality exists in the main board, the display card and the like in industrial production, detailed tests are required before the main board, the display card and the like are put into use. Most of related testing instruments such as a resistance tester, an open-short circuit tester and the like in the existing market have single functions and cannot test various data simultaneously. The mainboard, the display card and the like to be tested are tested by various testing instruments such as a resistance tester, an open-short circuit tester and the like, so that the operation is troublesome and the testing efficiency is low.
The invention content is as follows:
the invention aims to provide a PCI-E test card aiming at the defects in the prior art, which has complete test types, can test various data simultaneously, and has the advantages of simple operation, high test efficiency, wide application range and strong practicability.
In order to achieve the purpose, the invention adopts the technical scheme that: a PCI-E test card comprises a microprocessor, a power interface circuit, an open short circuit test circuit, a resistance test circuit, a voltage test circuit, an IO expansion circuit, an RS485 communication circuit, a USART communication circuit, a Micro-USB interface circuit, a PCI-E interface circuit, a JTAG interface circuit and a dial switch; the power interface circuit comprises a power interface, and the output end of the power interface circuit is electrically connected with the power input end of the microprocessor; the open short circuit test circuit is used for testing the open short circuit of the mainboard and is electrically connected with the microprocessor; the resistance test circuit is used for testing the resistance of the mainboard and is electrically connected with the microprocessor; the voltage test circuit is used for testing the voltage of the mainboard and is electrically connected with the microprocessor; the IO expansion circuit is used for expanding an IO interface and is connected with the microprocessor in a bidirectional mode; the RS485 communication circuit comprises an RS485 interface and is used for cascading and remote monitoring of the test card, and the RS485 communication circuit is connected with the microprocessor in a bidirectional mode; the USART communication circuit comprises a USART interface and is in bidirectional connection with the microprocessor; the Micro-USB interface circuit comprises a Micro-USB interface and is used for setting test parameters and monitoring the operation of a test card, and the Micro-USB interface circuit is bidirectionally connected with the microprocessor; the PCI-E interface circuit comprises a PCI-E interface, and is bidirectionally connected with the microprocessor; the JTAG interface circuit comprises a JTAG interface, and is in bidirectional connection with the microprocessor; the dial switch is used for configuring the communication address of the test card and is electrically connected with the microprocessor.
The scheme is further improved in that the IO expansion circuit comprises an IO expansion port chip, and the IO expansion port chip is a CAT955YI-T2 chip.
The further improvement of the scheme is that the open short circuit test circuit comprises a control switch integrated circuit, the input end of the control switch integrated circuit is electrically connected with the open short circuit test point on the PCI-E interface, and the output end of the control switch integrated circuit is electrically connected with the microprocessor.
The further improvement of the above scheme is that the open-short circuit test circuit further comprises a first multiplexer, an input end of the first multiplexer is electrically connected with the open-short circuit test point on the PCI-E interface, and an output end of the first multiplexer is electrically connected with an input end of the control switch integrated circuit.
In a further improvement of the above solution, the first multiplexer includes seven input terminals, and the seven input terminals of the first multiplexer are electrically connected to the seven open-short test points on the PCI-E interface, respectively.
In a further improvement of the above scheme, the resistance test circuit comprises a precision operational amplifier and a buffer.
The resistance test circuit comprises a resistance test range selection chip which is an ADG1404 chip.
In a further improvement of the above solution, the voltage test circuit includes a second multiplexer, an input terminal of the second multiplexer is electrically connected to the voltage test point on the PCI-E interface, and an output terminal of the second multiplexer is electrically connected to the microprocessor.
In a further improvement of the above solution, the voltage test circuit further comprises a voltage follower connected in series between the output terminal of the second multiplexer and the microprocessor.
In a further improvement of the above scheme, the PCI-E is PCI-E X16.
The invention has the beneficial effects that: the invention provides a PCI-E test card, which comprises a microprocessor, a power interface circuit, an open short circuit test circuit, a resistance test circuit, a voltage test circuit, an IO expansion circuit, an RS485 communication circuit, a USART communication circuit, a Micro-USB interface circuit, a PCI-E interface circuit, a JTAG interface circuit and a dial switch, wherein the resistance test circuit is connected with the power interface circuit; the power interface circuit comprises a power interface, and the output end of the power interface circuit is electrically connected with the power input end of the microprocessor; the open short circuit test circuit is used for testing the open short circuit of the mainboard and is electrically connected with the microprocessor; the resistance test circuit is used for testing the resistance of the mainboard and is electrically connected with the microprocessor; the voltage test circuit is used for testing the voltage of the mainboard and is electrically connected with the microprocessor; the IO expansion circuit is used for expanding an IO interface and is connected with the microprocessor in a bidirectional mode; the RS485 communication circuit comprises an RS485 interface and is used for cascading and remote monitoring of the test card, and the RS485 communication circuit is connected with the microprocessor in a bidirectional mode; the USART communication circuit comprises a USART interface and is in bidirectional connection with the microprocessor; the Micro-USB interface circuit comprises a Micro-USB interface and is used for setting test parameters and monitoring the operation of a test card, and the Micro-USB interface circuit is bidirectionally connected with the microprocessor; the PCI-E interface circuit comprises a PCI-E interface, and is bidirectionally connected with the microprocessor; the JTAG interface circuit comprises a JTAG interface, and is in bidirectional connection with the microprocessor; the dial switch is used for configuring the communication address of the test card and is electrically connected with the microprocessor; the invention has the following advantages:
1. the test device comprises an open short circuit test circuit, a resistance test circuit, a voltage test circuit, an RS485 communication circuit and a USART communication circuit, can be used for simultaneously carrying out open short circuit test, resistance test and voltage test on a mainboard, a display card and the like, can also be used for carrying out communication function test on the mainboard, the display card and the like, is complete in test type, can be used for simultaneously testing various data, and is simple to operate, high in test efficiency, wide in application range and high in practicability;
2. the open short circuit test circuit comprises a first multiplexer, wherein the first multiplexer comprises seven input ends, the seven input ends of the first multiplexer are respectively and electrically connected with seven open short circuit test points on a PCI-E interface, the open short circuit test circuit can simultaneously test the seven test points, the test efficiency is high, and the practicability is high.
Description of the drawings:
fig. 1 is a control schematic block diagram of the present invention.
Fig. 2 is a schematic structural diagram of the present invention.
Fig. 3 is a first schematic circuit diagram of the present invention.
Fig. 4 is a second schematic circuit diagram of the present invention.
Fig. 5 is a third schematic circuit diagram of the present invention.
Fig. 6 is a fourth schematic circuit diagram of the present invention.
Description of reference numerals: the device comprises a microprocessor 1, a power interface circuit 2, a power interface 21, an open short circuit test circuit 3, a control switch integrated circuit 31, a first multiplexer 32, a resistance test circuit 4, a precision operational amplifier 41, a buffer 42, a resistance test range selection chip 43, a voltage test circuit 5, a second multiplexer 51, a voltage follower 52, an IO expansion circuit 6, an IO expansion port chip 61, an RS485 communication circuit 7, an RS485 interface 71, a USART communication circuit 8, a USART interface 81, a Micro-USB interface circuit 9, a Micro-USB interface 91, a PCI-E interface circuit 10, a PCI-E interface 101, a JTAG interface circuit 11, a JTAG interface 111, a dial-up switch 12 and an indicator light 13.
The specific implementation mode is as follows:
the invention is further explained with reference to the accompanying drawings, as shown in fig. 1-6, the invention comprises a microprocessor 1, a power interface circuit 2, an open short circuit test circuit 3, a resistance test circuit 4, a voltage test circuit 5, an IO extension circuit 6, an RS485 communication circuit 7, a USART communication circuit 8, a Micro-USB interface circuit 9, a PCI-E interface circuit 10, a JTAG interface circuit 11, and a dial switch 12; the PCI-E is PCI-E X16 and has higher bandwidth, the power interface circuit 2 comprises a power interface 21, the output end of the power interface circuit 2 is electrically connected with the power input end of the microprocessor 1, and the power interface 21 is externally connected with a DC 12V power supply for supplying power; the invention also comprises an indicator light 13, when the test card works normally, a red light in the indicator light 13 is normally on, and when the test card works abnormally, a green light in the indicator light 13 is on, so that problems can be found conveniently; the open short circuit test circuit 3 is used for testing the open short circuit of the mainboard, and the open short circuit test circuit 3 is electrically connected with the microprocessor 1; the resistance test circuit 4 is used for testing the resistance of the mainboard, and the resistance test circuit 4 is electrically connected with the microprocessor 1; the voltage test circuit 5 is used for testing the voltage of the mainboard, and the voltage test circuit 5 is electrically connected with the microprocessor 1; the IO expansion circuit 6 is used for expansion of an IO interface, and the IO expansion circuit 6 is connected with the microprocessor 1 in a bidirectional mode; the RS485 communication circuit 7 comprises an RS485 interface 71 used for cascading and remote monitoring of the test card, and the RS485 communication circuit 7 is connected with the microprocessor 1 in a bidirectional mode; the USART communication circuit 8 comprises a USART interface 81, and the USART communication circuit 8 is bidirectionally connected with the microprocessor 1; the Micro-USB interface circuit 9 comprises a Micro-USB interface 91 for setting test parameters and monitoring the operation of a test card, and the Micro-USB interface circuit 9 is bidirectionally connected with the microprocessor 1; the PCI-E interface circuit 10 comprises a PCI-E interface 101, and the PCI-E interface circuit 10 is bidirectionally connected with the microprocessor 1; the JTAG interface circuit 11 comprises a JTAG interface 111, and the JTAG interface circuit 11 is bidirectionally connected with the microprocessor 1; the dial switch 12 is used for configuring the communication address of the test card, and the dial switch 12 is electrically connected with the microprocessor 1 and can be used for cascading more than 10 test cards; the test device comprises an open short circuit test circuit 3, a resistance test circuit 4, a voltage test circuit 5, an RS485 communication circuit 7 and a USART communication circuit 8, can simultaneously carry out open short circuit test, resistance test and voltage test on a mainboard, a display card and the like, can also carry out communication function test on the mainboard, the display card and the like, is complete in test types, can simultaneously test various data, and is simple in operation, high in test efficiency, wide in application range and strong in practicability.
The IO expansion circuit 6 comprises an IO expansion port chip 61, the IO expansion port chip 61 is a CAT955YI-T2 chip, and a single IO expansion port chip 61 can expand 16 IO interfaces, so that the use is very convenient and fast.
The open-short circuit test circuit 3 comprises a control switch integrated circuit 31, the input end of the control switch integrated circuit 31 is electrically connected with the open-short circuit test point on the PCI-E interface 101, and the output end of the control switch integrated circuit 31 is electrically connected with the microprocessor; the open-short circuit test circuit 3 further comprises a first multiplexer 32, an input end of the first multiplexer 32 is electrically connected with the open-short circuit test point on the PCI-E interface 101, and an output end of the first multiplexer 32 is electrically connected with an input end of the control switch integrated circuit 31; the first multiplexer 32 comprises seven input ends, and the seven input ends of the first multiplexer 32 are respectively electrically connected with seven open short circuit test points on the PCI-E interface 101; the open short circuit testing circuit 3 adopts an IO (input/output) overturning method to test the open short circuit of any point on the PCI-E interface 101, selects any point on the PCI-E as an input source and inputs a high level, controls and selects any open short circuit testing point on the PCI-E by the first multiplexer 32, sends the output of the open short circuit testing point to the microprocessor 1 by controlling the switch integrated circuit 31, the microprocessor 1 processes the level output by the open short circuit testing point, and if the level of the open short circuit testing point is opposite to the level input by the input source, no short circuit occurs; the circuit can simultaneously perform seven-path arbitrary point matrix test, any seven points on the PCI-E are selected as input sources and high levels are simultaneously input, then any seven open short circuit test points on the PCI-E are controlled and selected by the multiplexer, the outputs of the seven open short circuit test points are sent to the microprocessor 1 through the control switch integrated circuit 31, the microprocessor 1 processes the levels output by the seven open short circuit test points, and if the levels of the seven open short circuit test points are all opposite to the level input by the input sources, no short circuit occurs; the open short circuit test circuit 3 can test seven test points at the same time, and has high test efficiency and strong practicability.
The resistance test circuit 4 comprises a precision operational amplifier 41 and a buffer 42; the resistance test circuit 4 comprises a resistance test range selection chip 43, and the resistance test range selection chip 43 is an ADG1404 chip; the resistance test is divided into 4 grades: 10R, 1K, 100K and 1M, the ADG1404 chip can select the resistance test range, and the resistance value between any two points in the range of 10R-10M can be measured; the resistance test circuit 4 adopts a constant current method for testing, adopts +7.5V voltage as a constant current source, generates stable voltage after a point to be tested passes through the constant current source, collects the voltage through an A/D interface of the microprocessor 1, and calculates corresponding resistance value by ohm's law; the resistance test circuit 4 has an overvoltage protection function, and an overvoltage value can be set by the microprocessor 1, so that normal test can be ensured.
The voltage test circuit 5 comprises a second multiplexer 51, the input end of the second multiplexer 51 is electrically connected with the voltage test point on the PCI-E interface 101, and the output end of the second multiplexer 51 is electrically connected with the microprocessor 1; the voltage test circuit 5 further comprises a voltage follower 52, the voltage follower 52 being connected in series between the output of the second multiplexer 51 and the microprocessor 1.
The working principle is as follows:
connecting the test card with a mainboard, a display card and the like through an RS485 interface 71, a USART interface 81, a Micro-USB interface 91, a PCI-E interface 101 and a JTAG interface 111; connecting a power supply with a power supply interface 21, electrifying and dialing a dial switch 12 to configure a communication address, and correspondingly testing a mainboard and a display card through an open short circuit testing circuit 3, a resistance testing circuit 4 and a voltage testing circuit 5; the invention can simultaneously carry out open-short circuit test, resistance test and voltage test on the mainboard, the display card and the like, can also carry out communication function test on the mainboard, the display card and the like, has complete test types, can simultaneously test various data, and has the advantages of simple operation, high test efficiency, wide application range and strong practicability.
It is understood that the above description is only a preferred embodiment of the present invention, and all equivalent changes or modifications of the structure, features and principles described in the present invention are included in the scope of the present invention.
Claims (7)
1. A PCI-E test card, characterized in that: the device comprises a microprocessor (1), a power interface circuit (2), an open-short circuit test circuit (3), a resistance test circuit (4), a voltage test circuit (5), an IO expansion circuit (6), an RS485 communication circuit (7), a USART communication circuit (8), a Micro-USB interface circuit (9), a PCI-E interface circuit (10), a JTAG interface circuit (11) and a dial switch (12); the power interface circuit (2) comprises a power interface (21), and the output end of the power interface circuit (2) is electrically connected with the power input end of the microprocessor (1); the open short circuit test circuit (3) is used for testing the open short circuit of the mainboard, and the open short circuit test circuit (3) is electrically connected with the microprocessor (1); the resistance test circuit (4) is used for testing the resistance of the mainboard, and the resistance test circuit (4) is electrically connected with the microprocessor (1); the voltage testing circuit (5) is used for testing the voltage of the mainboard, and the voltage testing circuit (5) is electrically connected with the microprocessor (1); the IO expansion circuit (6) is used for expanding an IO interface, and the IO expansion circuit (6) is connected with the microprocessor (1) in a bidirectional mode; the RS485 communication circuit (7) comprises an RS485 interface (71) for cascading of the test card and remote monitoring, and the RS485 communication circuit (7) is connected with the microprocessor (1) in a bidirectional mode; the USART communication circuit (8) comprises a USART interface (81), and the USART communication circuit (8) is connected with the microprocessor (1) in a bidirectional mode; the Micro-USB interface circuit (9) comprises a Micro-USB interface (91) for setting test parameters and monitoring the operation of a test card, and the Micro-USB interface circuit (9) is bidirectionally connected with the microprocessor (1); the PCI-E interface circuit (10) comprises a PCI-E interface (101), and the PCI-E interface circuit (10) is connected with the microprocessor (1) in a bidirectional way; the JTAG interface circuit (11) comprises a JTAG interface (111), and the JTAG interface circuit (11) is in bidirectional connection with the microprocessor (1); the dial switch (12) is used for configuring a communication address of the test card, and the dial switch (12) is electrically connected with the microprocessor (1);
the open-short circuit test circuit (3) comprises a control switch integrated circuit (31), the input end of the control switch integrated circuit (31) is electrically connected with an open-short circuit test point on the PCI-E interface (101), and the output end of the control switch integrated circuit (31) is electrically connected with the microprocessor;
the open-short circuit test circuit (3) further comprises a first multiplexer (32), wherein the input end of the first multiplexer (32) is electrically connected with the open-short circuit test point on the PCI-E interface (101), and the output end of the first multiplexer (32) is electrically connected with the input end of the control switch integrated circuit (31);
the first multiplexer (32) comprises seven input ends, and the seven input ends of the first multiplexer (32) are respectively electrically connected with seven open-short test points on the PCI-E interface (101).
2. The PCI-E test card of claim 1, wherein: the IO expansion circuit (6) comprises an IO expansion port chip (61), and the IO expansion port chip (61) is a CAT955YI-T2 chip.
3. The PCI-E test card of claim 1, wherein: the resistance test circuit (4) comprises a precision operational amplifier (41) and a buffer (42).
4. The PCI-E test card of claim 1, wherein: the resistance test circuit (4) comprises a resistance test range selection chip (43), and the resistance test range selection chip (43) is an ADG1404 chip.
5. The PCI-E test card of claim 1, wherein: the voltage test circuit (5) comprises a second multiplexer (51), the input end of the second multiplexer (51) is electrically connected with a voltage test point on the PCI-E interface (101), and the output end of the second multiplexer (51) is electrically connected with the microprocessor (1).
6. The PCI-E test card of claim 5, wherein: the voltage test circuit (5) further comprises a voltage follower (52), and the voltage follower (52) is connected between the output end of the second multiplexer (51) and the microprocessor (1) in series.
7. A PCI-E test card according to any of claims 1 to 6, wherein: the PCI-E is PCI-EX 16.
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| Application Number | Priority Date | Filing Date | Title |
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| CN202010714169.9A CN111736094B (en) | 2020-07-23 | 2020-07-23 | PCI-E test card |
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| CN202010714169.9A CN111736094B (en) | 2020-07-23 | 2020-07-23 | PCI-E test card |
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| CN111736094B true CN111736094B (en) | 2021-05-25 |
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| CN112669898A (en) * | 2020-12-21 | 2021-04-16 | 杭州海兴电力科技股份有限公司 | Multifunctional test tool structure and method |
| US11768253B1 (en) * | 2022-03-28 | 2023-09-26 | Cypress Semiconductor Corporation | Floating ground architectures in USB type-C controllers for fault detection |
| TWI826248B (en) * | 2023-02-01 | 2023-12-11 | 神雲科技股份有限公司 | Computer system |
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| CN208444286U (en) * | 2018-08-08 | 2019-01-29 | 深圳市联瑞电子有限公司 | A kind of NVMe back plate testing device |
| CN209841947U (en) * | 2019-03-25 | 2019-12-24 | 武汉大学 | Intelligent multimeter with automatic range switching function |
| CN210955038U (en) * | 2020-03-11 | 2020-07-07 | 苏州耀国电子有限公司 | PCI-E signal integrity detection module |
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