CN111722085A - PCB function test device and system - Google Patents
PCB function test device and system Download PDFInfo
- Publication number
- CN111722085A CN111722085A CN202010607785.4A CN202010607785A CN111722085A CN 111722085 A CN111722085 A CN 111722085A CN 202010607785 A CN202010607785 A CN 202010607785A CN 111722085 A CN111722085 A CN 111722085A
- Authority
- CN
- China
- Prior art keywords
- pcb
- connecting plate
- clamp
- test device
- pad
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 238000012360 testing method Methods 0.000 title claims abstract description 29
- 238000011990 functional testing Methods 0.000 claims description 7
- 238000003466 welding Methods 0.000 claims description 2
- 239000012634 fragment Substances 0.000 abstract description 16
- 230000005611 electricity Effects 0.000 abstract description 2
- 230000000694 effects Effects 0.000 abstract 1
- 238000001514 detection method Methods 0.000 description 5
- 230000002950 deficient Effects 0.000 description 3
- 238000010586 diagram Methods 0.000 description 3
- 238000012986 modification Methods 0.000 description 3
- 230000004048 modification Effects 0.000 description 3
- DCPDZFRGNJDWPP-UHFFFAOYSA-N 1,2,3,4,5-pentachloro-6-(2,4,5-trichlorophenyl)benzene Chemical compound C1=C(Cl)C(Cl)=CC(Cl)=C1C1=C(Cl)C(Cl)=C(Cl)C(Cl)=C1Cl DCPDZFRGNJDWPP-UHFFFAOYSA-N 0.000 description 2
- 230000006835 compression Effects 0.000 description 2
- 238000007906 compression Methods 0.000 description 2
- 238000009434 installation Methods 0.000 description 2
- 239000000463 material Substances 0.000 description 2
- 230000003746 surface roughness Effects 0.000 description 2
- SMZOUWXMTYCWNB-UHFFFAOYSA-N 2-(2-methoxy-5-methylphenyl)ethanamine Chemical compound COC1=CC=C(C)C=C1CCN SMZOUWXMTYCWNB-UHFFFAOYSA-N 0.000 description 1
- NIXOWILDQLNWCW-UHFFFAOYSA-N 2-Propenoic acid Natural products OC(=O)C=C NIXOWILDQLNWCW-UHFFFAOYSA-N 0.000 description 1
- RYGMFSIKBFXOCR-UHFFFAOYSA-N Copper Chemical compound [Cu] RYGMFSIKBFXOCR-UHFFFAOYSA-N 0.000 description 1
- 239000011889 copper foil Substances 0.000 description 1
- 230000007797 corrosion Effects 0.000 description 1
- 238000005260 corrosion Methods 0.000 description 1
- 230000006866 deterioration Effects 0.000 description 1
- 239000000428 dust Substances 0.000 description 1
- 230000007613 environmental effect Effects 0.000 description 1
- 230000001771 impaired effect Effects 0.000 description 1
- 238000000034 method Methods 0.000 description 1
- 239000000758 substrate Substances 0.000 description 1
Images
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2801—Testing of printed circuits, backplanes, motherboards, hybrid circuits or carriers for multichip packages [MCP]
- G01R31/2803—Testing of printed circuits, backplanes, motherboards, hybrid circuits or carriers for multichip packages [MCP] by means of functional tests, e.g. logic-circuit-simulation or algorithms therefor
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2801—Testing of printed circuits, backplanes, motherboards, hybrid circuits or carriers for multichip packages [MCP]
- G01R31/2806—Apparatus therefor, e.g. test stations, drivers, analysers, conveyors
- G01R31/2808—Holding, conveying or contacting devices, e.g. test adapters, edge connectors, extender boards
Abstract
The invention discloses a PCB function testing device and system, comprising: anchor clamps, the connecting plate, PCB, anchor clamps are equipped with spring pin Pogo pin towards one side of connecting plate, the connecting plate is located between PCB and the anchor clamps, be equipped with first pad towards one side of anchor clamps, first pad contacts with Pogo pin, the connecting plate is equipped with the preset distance with anchor clamps, the preset distance is confirmed according to the minimum interval between PCB and the anchor clamps, PCB is equipped with the shell fragment towards one side of connecting plate, the connecting plate is equipped with the second pad towards one side of PCB, the shell fragment contacts with the second pad, first pad is connected with the second pad electricity, the shell fragment of connecting plate on to PCB is tested under the effect of anchor clamps. The elastic sheet is not crushed when the contact of the connecting plate and the elastic sheet is ensured, the reject ratio and the rejection rate of the PCB function test are reduced, and the error of the PCB function test caused by the damage of the elastic sheet is reduced.
Description
Technical Field
The invention relates to the field of machinery, in particular to a Printed Circuit Board (PCB) function testing device and system.
Background
The PCB is the provider of electrical connections for electronic components, and therefore, the connections of the wires in the PCB are not lost. In the prior art, the detection of the PCB is to press down the elastic sheet on the PCB through a pogo pin (spring pin) on the clamp so as to connect the pogo pin with the elastic sheet, and the function test is performed on the PCB according to whether the pogo pin is conducted with the elastic sheet.
However, the prior art has the disadvantages that the pogo pin directly presses down the spring plate, and the elasticity of the pogo pin is difficult to control, so that the spring plate is crushed due to the overlarge elasticity of the pogo pin, as shown in fig. 1, the spring plate is deformed due to the overlarge elasticity, and thus, the detection result has errors, so that the reject ratio and the rejection ratio of the PCB are increased, and the cost is increased. Therefore, it is demanded to reduce the reject ratio and the rejection rate of the PCB function test and reduce the cost.
Disclosure of Invention
The embodiment of the invention provides a PCB function testing device and a PCB function testing system, which are used for reducing the reject ratio and the rejection rate of PCB function testing and reducing errors of PCB function testing caused by damage of spring pieces.
In a first aspect, an embodiment of the present invention provides a PCB function testing apparatus, including: the fixture, the connecting plate and the PCB;
one side of the clamp facing the connecting plate is provided with a Pogo pin;
the connecting plate is positioned between the PCB and the clamp, and a first welding disc is arranged on one side facing the clamp; the first pad is in contact with the Pogo pin; the connecting plate and the clamp are arranged at a preset distance; the preset distance is determined according to the minimum distance between the PCB and the clamp;
an elastic sheet is arranged on one side, facing the connecting plate, of the PCB, a second bonding pad is arranged on one side, facing the PCB, of the connecting plate, the elastic sheet is in contact with the second bonding pad, and the first bonding pad is electrically connected with the second bonding pad; and the connecting plate tests the elastic sheet on the PCB under the action of the clamp.
Among the above-mentioned technical scheme, be connected with the pogo pin through the connecting plate, the connecting plate rethread shell fragment is connected with PCB, first pad and second pad through being equipped with on the connecting plate again, realize being connected of pogo pin and PCB, carry out the function detection to PCB, guarantee to carry out the function detection time measuring at PCB according to the minimum distance between presetting distance and PCB and the anchor clamps, there is minimum distance between connecting plate and the PCB, do not crush the shell fragment when guaranteeing connecting plate and shell fragment contact, the defective rate and the disability rate of PCB function test have been reduced, reduce the error that leads to PCB function test because of the shell fragment damages.
Optionally, the fixture is provided with a positioning column and a first through hole, and the positioning column and the first through hole are used for fixing the connecting plate.
Among the above-mentioned technical scheme, set up reference column and first through-hole fixed connection board through setting up on the anchor clamps, reduce the difficult complexity of technology of device, realize that the device is simple and with low costs.
Optionally, the connecting plate is provided with a positioning hole and a second through hole, the positioning hole is matched with the positioning column, and the connecting plate is connected with the clamp through the first through hole and the second through hole.
Among the above-mentioned technical scheme, through setting up the locating hole to the connecting plate and realizing being connected with anchor clamps with the second through-hole, make device simple process, the installation of being convenient for is dismantled, reduce cost.
Optionally, the connecting plate is connected with the clamp through threads.
Among the above-mentioned technical scheme, be connected through the screw thread so that anchor clamps and connecting plate, the installation of being convenient for is dismantled, reduce cost.
Optionally, the connecting plate is a double-sided plate.
Among the above-mentioned technical scheme, it is impaired through the surface roughness who uses the double sided board to reduce the connecting plate to have high insulating nature, so that the connecting plate carries out the circuit through setting up the pad and switches on.
Optionally, the clamp and the PCB are provided with a minimum distance;
the preset distance is determined by the difference between the minimum distance and the minimum height of the elastic sheet and the sum of the thicknesses of the connecting plates.
Among the above-mentioned technical scheme, through setting up the distance of predetermineeing between connecting plate and the anchor clamps, guarantee the distance between connecting plate and the PCB, reduce PCB functional test's that the damage of shell fragment leads to error when PCB functional test.
Optionally, the thickness of the connecting plate is 1.98mm-2.03 mm.
Among the above-mentioned technical scheme, set up the thickness of connecting plate, reduce the material cost of connecting plate.
Optionally, the connecting plate is provided with a plurality of first pads; the clamp is provided with a plurality of Pogo pins;
the plurality of first bonding pads correspond to the plurality of Pogo pins one to one.
Among the above-mentioned technical scheme, realize the circuit through first pad and switch on between Pogo pin and the connecting plate, no longer use Pogo pin and shell fragment lug connection for reduce PCB functional test's defective rate and disability rate.
Optionally, the connecting plate is provided with a plurality of second pads; the PCB is provided with a plurality of spring pieces;
the plurality of second bonding pads correspond to the plurality of elastic sheets one by one.
Among the above-mentioned technical scheme, realize through the second pad that the circuit switches on between shell fragment and the connecting plate, and then make Pogopin and shell fragment indirect continuous, no longer use Pogo pin and shell fragment lug connection, reduced PCB functional test's defective rate and disability rate.
In a second aspect, an embodiment of the present invention provides a PCB function testing system, including:
printed circuit board PCB functional test device.
Drawings
In order to more clearly illustrate the technical solutions in the embodiments of the present invention, the drawings needed to be used in the description of the embodiments will be briefly introduced below, and it is obvious that the drawings in the following description are only some embodiments of the present invention, and it is obvious for those skilled in the art to obtain other drawings based on these drawings without creative efforts.
Fig. 1 is a schematic view illustrating a damaged elastic sheet according to an embodiment of the present invention;
fig. 2 is a schematic diagram of a PCB function testing apparatus according to an embodiment of the present invention;
fig. 3 is a schematic structural diagram of a connecting plate according to an embodiment of the present invention;
fig. 4 is a schematic structural diagram of a connection plate according to an embodiment of the present invention.
Detailed Description
In order to make the objects, technical solutions and advantages of the present invention clearer, the present invention will be described in further detail with reference to the accompanying drawings, and it is apparent that the described embodiments are only a part of the embodiments of the present invention, not all of the embodiments. All other embodiments, which can be derived by a person skilled in the art from the embodiments given herein without making any creative effort, shall fall within the protection scope of the present invention.
Fig. 2 schematically shows a PCB function testing apparatus to which an embodiment of the present invention is applied, and the apparatus includes a clamp 201, a connection board 202 and a PCB 203.
The clamp 201 is provided with Pogo pins 2011 on one side facing the connection board 202, the connection board 202 is located between the PCB203 and the clamp 201, first pads are arranged on one side facing the clamp 201 and are in contact with the Pogo pins 2011, and the connection board 202 is provided with a preset distance from the clamp 201, wherein the preset distance is determined according to the minimum distance between the PCB203 and the clamp 201.
The spring plate 2031 is arranged on one side, facing the connecting plate 202, of the PCB203, the second bonding pad is arranged on one side, facing the PCB203, of the connecting plate 202, the spring plate 2031 is in contact with the second bonding pad, the first bonding pad is electrically connected with the second bonding pad, and the spring plate 2031 on the PCB203 is tested by the connecting plate 202 under the action of the clamp 201.
In the embodiment of the present invention, the Pogo pin2011 disposed on the clamp 201 contacts with the first pad disposed on the connection board 202, so that the Pogo pin2011 is electrically connected to the first pad, and the spring plate 2031 disposed on the PCB203 contacts with the second pad disposed on the connection board 202, so that the spring plate 2031 is electrically connected to the second pad, thereby achieving circuit conduction between the Pogo pin2011 and the spring plate 2031, and detecting performance of the PCB. The connection plate 202 is also provided with a second through hole 301 and a positioning hole 302. Wherein the side that connecting plate 202 was equipped with first pad 303 faces anchor clamps 201, and the side that connecting plate 202 was equipped with second pad 304 faces PCB203, and first pad 303 and second pad 304 electricity are connected, confirm through bolt 2021 between connecting plate 202 and the anchor clamps 201 and preset the distance, realize that Pogo pin2011 contacts with first pad 303 to keep fixed. When anchor clamps 201 descend to make the second pad 304 that connecting plate 202 was equipped with descend to contact shell fragment 2031, through external power to PCB203, the external user equipment of spring needle Pogo pin2011, if when the circuit switched on, the user equipment normal operating, then confirm that PCB203 is functional intact.
Further, the fixture 201 is provided with a positioning column 2012 and a first through hole for fixing the connection plate 202.
In the embodiment of the present invention, the positioning hole 302 formed in the connection plate 202 is matched with the positioning post 2012 formed in the clamp 201, so that the connection plate 202 is fixed to the clamp 201 when the connection plate 202 is connected to the clamp 201, and then the bolt 2021 is used to fix the predetermined distance between the connection plate 202 and the clamp 201.
It should be noted that the first through hole may be a threaded hole, and may be a through hole, if the first through hole is a threaded hole, the clamp 201 and the connecting plate 202 are connected by a thread, and if the first through hole is a through hole, the bolt 2021 is inserted through the first through hole, and the preset distance between the connecting plate 202 and the clamp 201 is fixed by a nut.
Specifically, according to a preset minimum distance between the clamp 201 and the PCB203, a preset distance between the connection plate 202 and the clamp 201 is determined according to a difference between the minimum distance and a sum of a minimum height of the elastic pieces 2031 and a thickness of the connection plate 202, when the function of the PCB203 is detected, the whole device circuit needs to be conducted by lowering the clamp 201, and in order to lower the clamp 201, the connection plate 202 does not damage the elastic sheet 2031, thus, the minimum pitch is preset, and a preset distance is determined, for example, the height of the elastic pieces 2031 in a normal state is 14mm, the limit compression amount of the elastic pieces 2031 is 5mm, that is, the height after the limit compression is 9mm (the minimum height of the elastic sheet 2031), and the minimum distance is 15mm, the preset distance between the connection board 202 and the clamp 201 is 15mm- (9mm +2mm) ═ 4mm, and the preset distance is determined on the basis of ensuring the contact between the first pad 303 provided on the connection board and the Pogo pin 2011. Wherein 2mm is the thickness of web 202.
In the embodiment of the present invention, the thickness of the connection board 202 may be 1.98mm to 2.03mm, the material may be a double-sided board, fig. 4 exemplarily shows an illustration of the connection board, and as shown in fig. 4, the connection board 202 is composed of a copper foil, green oil and a substrate sheet, wherein the green oil is an acrylic acid oligomer for preventing surface deterioration and corrosion due to external environmental factors such as dust and moisture, and reducing damage of surface roughness.
Further, the connecting plate is provided with a plurality of first pads 303 and a plurality of second pads 304, and anchor clamps 301 are provided with a plurality of Pogo pins 2011, and PCB203 is provided with a plurality of shell fragments 2031. And a plurality of first pads 303 and a plurality of Pogo pins 2011 one-to-one to make first pad 303 contact with a plurality of Pogo pins 2011 one-to-one, realize that the circuit between connecting plate 202 and anchor clamps 201 switches on, a plurality of second pads 304 and a plurality of shell fragment 2031 one-to-one, so that when anchor clamps 201 descend, second pad 304 and a plurality of shell fragment 2031 one-to-one contact, realize that the circuit switches on between PCB203 and connecting plate 202, and then PCB203 is connected with Pogo pins 2011, carry out the function detection to PCB 203.
It will be apparent to those skilled in the art that various changes and modifications may be made in the present application without departing from the spirit and scope of the application. Thus, if such modifications and variations of the present application fall within the scope of the claims of the present application and their equivalents, the present application is intended to include such modifications and variations as well.
Claims (10)
1. A PCB functional test device, comprising: the fixture, the connecting plate and the PCB;
one side of the clamp facing the connecting plate is provided with a Pogo pin;
the connecting plate is positioned between the PCB and the clamp, and a first welding disc is arranged on one side facing the clamp; the first pad is in contact with the Pogo pin; the connecting plate and the clamp are arranged at a preset distance; the preset distance is determined according to the minimum distance between the PCB and the clamp;
an elastic sheet is arranged on one side, facing the connecting plate, of the PCB, a second bonding pad is arranged on one side, facing the PCB, of the connecting plate, the elastic sheet is in contact with the second bonding pad, and the first bonding pad is electrically connected with the second bonding pad; and the connecting plate tests the elastic sheet on the PCB under the action of the clamp.
2. The PCB functional test device of claim 1, wherein the clamp is provided with a positioning column and a first through hole for fixing the connection board.
3. The PCB function testing device of claim 2, wherein the connecting plate is provided with a positioning hole and a second through hole, the positioning hole is matched with the positioning column, and the connecting plate is connected with the clamp through the first through hole and the second through hole.
4. The PCB function test device of claim 3, wherein the connection plate is screw-coupled with the clamp.
5. The PCB function test device of claim 3, wherein the connection board is a double-sided board.
6. The PCB functionality test device of claim 1, wherein the clip is provided with a minimum spacing from the PCB;
the preset distance is determined by the difference between the minimum distance and the minimum height of the elastic sheet and the sum of the thicknesses of the connecting plates.
7. The PCB function test device of claim 6, wherein the connection plate has a thickness of 1.98mm-2.03 mm.
8. The PCB function test device of claim 1, wherein the connection board is provided with a plurality of the first pads; the clamp is provided with a plurality of Pogo pins;
the plurality of first bonding pads correspond to the plurality of Pogo pins one to one.
9. The PCB function test device of claim 1, wherein the connection board is provided with a plurality of the second pads; the PCB is provided with a plurality of spring pieces;
the plurality of second bonding pads correspond to the plurality of elastic sheets one by one.
10. A PCB functionality test system comprising a PCB functionality test device according to any of claims 1 to 9.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202010607785.4A CN111722085A (en) | 2020-06-29 | 2020-06-29 | PCB function test device and system |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202010607785.4A CN111722085A (en) | 2020-06-29 | 2020-06-29 | PCB function test device and system |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN111722085A true CN111722085A (en) | 2020-09-29 |
Family
ID=72570269
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN202010607785.4A Pending CN111722085A (en) | 2020-06-29 | 2020-06-29 | PCB function test device and system |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN111722085A (en) |
Citations (12)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US20060121752A1 (en) * | 2003-07-29 | 2006-06-08 | Advantest Corporation | Socket and test apparatus |
| US20070152689A1 (en) * | 2006-01-03 | 2007-07-05 | Chipmos Technologies (Bermuda) Ltd. | Modular probe card |
| JP2008014730A (en) * | 2006-07-04 | 2008-01-24 | Nec Electronics Corp | Semiconductor inspection device |
| CN101226224A (en) * | 2008-01-16 | 2008-07-23 | 深圳国人通信有限公司 | Test system and method for circuit board |
| CN101458297A (en) * | 2007-12-12 | 2009-06-17 | 康佳集团股份有限公司 | Printed circuit board test system and test method |
| CN102866268A (en) * | 2011-07-04 | 2013-01-09 | 鸿富锦精密工业（深圳）有限公司 | Testing fixture |
| CN103941047A (en) * | 2014-04-21 | 2014-07-23 | 国家电网公司 | Circuit board signal testing clamp |
| CN104515874A (en) * | 2013-09-26 | 2015-04-15 | 北大方正集团有限公司 | Adapter plate used for circuit board testing and test method and test device |
| CN106526452A (en) * | 2016-11-17 | 2017-03-22 | 中国电子科技集团公司第二十九研究所 | System and method for achieving PCBA automatic detection by use of probe |
| CN207799019U (en) * | 2017-12-27 | 2018-08-31 | 西门子数控（南京）有限公司 | Circuit board test clamp and system |
| CN208780734U (en) * | 2018-08-30 | 2019-04-23 | 武汉光为通信科技有限公司 | Test fixture for optical assembly |
| CN210803536U (en) * | 2019-08-30 | 2020-06-19 | 深圳市翔宇电路有限公司 | PCB board flying probe test fixture without technical edge |
-
2020
- 2020-06-29 CN CN202010607785.4A patent/CN111722085A/en active Pending
Patent Citations (12)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US20060121752A1 (en) * | 2003-07-29 | 2006-06-08 | Advantest Corporation | Socket and test apparatus |
| US20070152689A1 (en) * | 2006-01-03 | 2007-07-05 | Chipmos Technologies (Bermuda) Ltd. | Modular probe card |
| JP2008014730A (en) * | 2006-07-04 | 2008-01-24 | Nec Electronics Corp | Semiconductor inspection device |
| CN101458297A (en) * | 2007-12-12 | 2009-06-17 | 康佳集团股份有限公司 | Printed circuit board test system and test method |
| CN101226224A (en) * | 2008-01-16 | 2008-07-23 | 深圳国人通信有限公司 | Test system and method for circuit board |
| CN102866268A (en) * | 2011-07-04 | 2013-01-09 | 鸿富锦精密工业（深圳）有限公司 | Testing fixture |
| CN104515874A (en) * | 2013-09-26 | 2015-04-15 | 北大方正集团有限公司 | Adapter plate used for circuit board testing and test method and test device |
| CN103941047A (en) * | 2014-04-21 | 2014-07-23 | 国家电网公司 | Circuit board signal testing clamp |
| CN106526452A (en) * | 2016-11-17 | 2017-03-22 | 中国电子科技集团公司第二十九研究所 | System and method for achieving PCBA automatic detection by use of probe |
| CN207799019U (en) * | 2017-12-27 | 2018-08-31 | 西门子数控（南京）有限公司 | Circuit board test clamp and system |
| CN208780734U (en) * | 2018-08-30 | 2019-04-23 | 武汉光为通信科技有限公司 | Test fixture for optical assembly |
| CN210803536U (en) * | 2019-08-30 | 2020-06-19 | 深圳市翔宇电路有限公司 | PCB board flying probe test fixture without technical edge |
Non-Patent Citations (1)
| Title |
|---|
| 钟元: "面向成本的产品设计", pages: 157 - 159 * |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| US7679385B2 (en) | Probe card for inspecting electric properties of an object | |
| KR20050073511A (en) | Probe card | |
| SG178656A1 (en) | Direct-docking probing device | |
| KR20040103956A (en) | Conductive contact | |
| CN111722085A (en) | PCB function test device and system | |
| US20010043075A1 (en) | Apparatus for inspecting IC wafer | |
| KR20110015902A (en) | Examination apparatus for printed circuit board | |
| US20060121750A1 (en) | Contactor, frame comprising such a contactor, electrical measuring and testing apparatus and method of contacting by means of such a contactor | |
| CN1916643A (en) | Device for testing integrated electric apparatus | |
| JP2004279046A (en) | Contact sheet for electronic device inspection and its manufacturing method | |
| US6563332B2 (en) | Checker head | |
| JP2009193710A (en) | Anisotropic connector, and apparatus for inspecting circuit device using the same | |
| KR100765490B1 (en) | PCB electrode plate | |
| CN2836018Y (en) | Integrated circuit tester | |
| WO2024018535A1 (en) | Anisotropically conductive connector, anisotropically conductive connector having frame, and inspection apparatus | |
| CN213457002U (en) | Multi-terminal capacitor test fixture | |
| CN215728622U (en) | PCBA test fixture | |
| CN108680773A (en) | A kind of test contact chip connector | |
| CN212514717U (en) | Small-interval compression joint detects uses elasticity flat probe and detection instrument | |
| JPH04206752A (en) | Inspecting device for surface-mounting type ic | |
| CN113533924A (en) | Double-sided electrode high-power device testing device | |
| JP2948802B2 (en) | Electrical connection members | |
| KR19990056599A (en) | Socket for semiconductor chip inspection | |
| JP2001066341A (en) | Method and device for continuity inspection | |
| US6603663B2 (en) | Electronic unit |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| PB01 | Publication | ||
| PB01 | Publication | ||
| SE01 | Entry into force of request for substantive examination | ||
| SE01 | Entry into force of request for substantive examination | ||
| CB02 | Change of applicant information | ||
| CB02 | Change of applicant information |
Address after: 201210 Building 1, 399 Keyuan Road, Zhangjiang High Tech Park, Pudong New Area, Shanghai Applicant after: Huaqin Technology Co.,Ltd. Address before: 201210 Building 1, 399 Keyuan Road, Zhangjiang High Tech Park, Pudong New Area, Shanghai Applicant before: Huaqin Technology Co.,Ltd. Address after: 201210 Building 1, 399 Keyuan Road, Zhangjiang High Tech Park, Pudong New Area, Shanghai Applicant after: Huaqin Technology Co.,Ltd. Address before: 201210 Building 1, 399 Keyuan Road, Zhangjiang High Tech Park, Pudong New Area, Shanghai Applicant before: HUAQIN TELECOM TECHNOLOGY Co.,Ltd. |
|
| RJ01 | Rejection of invention patent application after publication | ||
| RJ01 | Rejection of invention patent application after publication |
Application publication date: 20200929 |