CN111670354B - 通过双重照明分析气体的方法 - Google Patents
通过双重照明分析气体的方法 Download PDFInfo
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- CN111670354B CN111670354B CN201980011321.2A CN201980011321A CN111670354B CN 111670354 B CN111670354 B CN 111670354B CN 201980011321 A CN201980011321 A CN 201980011321A CN 111670354 B CN111670354 B CN 111670354B
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
- G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
- G01N21/31—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry
- G01N21/35—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light
- G01N21/3504—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light for analysing gases, e.g. multi-gas analysis
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
- G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
- G01N21/31—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry
- G01N21/314—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry with comparison of measurements at specific and non-specific wavelengths
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
- G01J3/28—Investigating the spectrum
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
- G01J3/28—Investigating the spectrum
- G01J3/42—Absorption spectrometry; Double beam spectrometry; Flicker spectrometry; Reflection spectrometry
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
- G01J3/28—Investigating the spectrum
- G01J3/42—Absorption spectrometry; Double beam spectrometry; Flicker spectrometry; Reflection spectrometry
- G01J3/427—Dual wavelengths spectrometry
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
- G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
- G01N21/27—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands using photo-electric detection ; circuits for computing concentration
- G01N21/274—Calibration, base line adjustment, drift correction
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
- G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
- G01N21/31—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry
- G01N21/314—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry with comparison of measurements at specific and non-specific wavelengths
- G01N2021/3166—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry with comparison of measurements at specific and non-specific wavelengths using separate detectors and filters
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
- G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
- G01N21/31—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry
- G01N21/314—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry with comparison of measurements at specific and non-specific wavelengths
- G01N2021/317—Special constructive features
- G01N2021/3177—Use of spatially separated filters in simultaneous way
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
- G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
- G01N21/31—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry
- G01N2021/3196—Correlating located peaks in spectrum with reference data, e.g. fingerprint data
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
- G01N21/59—Transmissivity
- G01N21/61—Non-dispersive gas analysers
Landscapes
- Physics & Mathematics (AREA)
- Spectroscopy & Molecular Physics (AREA)
- General Physics & Mathematics (AREA)
- Biochemistry (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Life Sciences & Earth Sciences (AREA)
- General Health & Medical Sciences (AREA)
- Health & Medical Sciences (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Engineering & Computer Science (AREA)
- Mathematical Physics (AREA)
- Theoretical Computer Science (AREA)
- Investigating Or Analysing Materials By Optical Means (AREA)
Applications Claiming Priority (3)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| FR1850956 | 2018-02-05 | ||
| FR1850956A FR3077640B1 (fr) | 2018-02-05 | 2018-02-05 | Procede d'analyse d'un gaz par une double illumination |
| PCT/FR2019/050230 WO2019150053A1 (fr) | 2018-02-05 | 2019-02-01 | Procédé d'analyse d'un gaz par une double illumination |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| CN111670354A CN111670354A (zh) | 2020-09-15 |
| CN111670354B true CN111670354B (zh) | 2024-01-23 |
Family
ID=62067698
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201980011321.2A Active CN111670354B (zh) | 2018-02-05 | 2019-02-01 | 通过双重照明分析气体的方法 |
Country Status (6)
| Country | Link |
|---|---|
| US (1) | US11448590B2 (https=) |
| EP (1) | EP3749948B1 (https=) |
| JP (1) | JP7381475B2 (https=) |
| CN (1) | CN111670354B (https=) |
| FR (1) | FR3077640B1 (https=) |
| WO (1) | WO2019150053A1 (https=) |
Families Citing this family (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US12510485B2 (en) * | 2021-03-10 | 2025-12-30 | Arcelormittal | System and method for determining the chemical composition of liquid metallurgical products |
| CN116046708A (zh) * | 2022-11-22 | 2023-05-02 | 江西江投电力技术与试验研究有限公司 | 一种基于ndir原理的二氧化碳传感装置及其控制方法 |
Citations (16)
| Publication number | Priority date | Publication date | Assignee | Title |
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| DE3508027A1 (de) * | 1985-03-07 | 1986-09-11 | Franz-Rudolf Dipl.-Phys. Dr. 5106 Roetgen Block | Verfahren und einrichtung zum ermitteln der konzentration oder der massenanteile bestimmter gase in gasmischungen |
| US5063275A (en) * | 1989-06-25 | 1991-11-05 | Spegas Industries Ltd. | Method and apparatus for gas analysis |
| US5369278A (en) * | 1992-01-30 | 1994-11-29 | Vaisala Oy | Calibration method for gas concentration measurements |
| EP1408325A2 (en) * | 2002-09-13 | 2004-04-14 | Delphi Technologies, Inc. | Method of measuring exhaust flow constituents |
| US6843102B1 (en) * | 1999-05-26 | 2005-01-18 | Gasbeetle Gmbh | Gas sensor arrangement |
| WO2007064370A2 (en) * | 2005-08-04 | 2007-06-07 | Airware Inc. | Ultra low cost ndir gas sensors |
| CN101063655A (zh) * | 2006-04-27 | 2007-10-31 | Ir微系统股份有限公司 | 气体检测方法和气体检测装置 |
| DE102009059962A1 (de) * | 2009-12-22 | 2011-07-14 | Siemens Aktiengesellschaft, 80333 | NDIR-Zweistrahl-Gasanalysator und Verfahren zur Bestimmung der Konzentration einer Messgaskomponente in einem Gasgemisch mittels eines solchen Gasanalysators |
| CN102656441A (zh) * | 2010-10-21 | 2012-09-05 | 光学传感器公司 | 具有验证单元的光谱仪 |
| CN102809546A (zh) * | 2012-08-21 | 2012-12-05 | 南京埃森环境技术有限公司 | 一种低浓度烟气红外分析仪及检测方法 |
| CN202974862U (zh) * | 2012-07-11 | 2013-06-05 | 重庆市电力公司电力科学研究院 | 一种激光器光源波长校准器和一种气体浓度测量器 |
| CN104730021A (zh) * | 2013-12-24 | 2015-06-24 | 北京万联达信科仪器有限公司 | 一种非分光红外气体传感器的标定方法 |
| CN105181672A (zh) * | 2015-09-25 | 2015-12-23 | 东北大学 | 一种拉曼光谱波数及强度实时校正方法 |
| CN105738309A (zh) * | 2016-02-04 | 2016-07-06 | 杭州巨之灵科技有限公司 | 一种甲烷检测器及方法 |
| CN106501192A (zh) * | 2015-09-08 | 2017-03-15 | 富士电机株式会社 | 气体分析仪 |
| CN107014760A (zh) * | 2016-01-18 | 2017-08-04 | 株式会社堀场制作所 | 分析装置和分析方法 |
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| US3790797A (en) * | 1971-09-07 | 1974-02-05 | S Sternberg | Method and system for the infrared analysis of gases |
| US5026992A (en) | 1989-09-06 | 1991-06-25 | Gaztech Corporation | Spectral ratioing technique for NDIR gas analysis using a differential temperature source |
| US5252060A (en) * | 1992-03-27 | 1993-10-12 | Mckinnon J Thomas | Infrared laser fault detection method for hazardous waste incineration |
| FI101749B (fi) * | 1996-12-30 | 1998-08-14 | Instrumentarium Oy | Kaasukomponentin pitoisuuden tarkka mittaaminen kaasuseoksessa, jossa muut komponentit vaikuttavat pitoisuusmääritykseen |
| JPH11304706A (ja) * | 1998-04-24 | 1999-11-05 | Horiba Ltd | 赤外線ガス分析装置 |
| US6160832A (en) * | 1998-06-01 | 2000-12-12 | Lambda Physik Gmbh | Method and apparatus for wavelength calibration |
| JP2002055049A (ja) | 2000-08-14 | 2002-02-20 | Horiba Ltd | 連続測定装置 |
| DE102004044142B3 (de) * | 2004-09-13 | 2006-06-01 | Robert Bosch Gmbh | Spektroskopischer Gassensor |
| CN100494983C (zh) * | 2005-08-12 | 2009-06-03 | 深圳迈瑞生物医疗电子股份有限公司 | 利用红外光吸收特性自动校准和测量气体浓度的方法和装置 |
| US7414727B2 (en) * | 2006-04-28 | 2008-08-19 | Ir Microsystems Sa | Gas detection method and gas detection device |
| EP2000792B1 (en) * | 2007-06-06 | 2011-08-03 | Siemens Aktiengesellschaft | Method for measuring the concentration of a gas component in a measuring gas |
| IL190756A0 (en) * | 2008-04-09 | 2009-08-03 | Rafael Advanced Defense Sys | Gas detection, identification and concentration estimation based on spectral spatial misregistration |
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| DE102016012970A1 (de) * | 2016-10-28 | 2018-05-03 | Drägerwerk AG & Co. KGaA | Vorrichtung zur Konzentrationsbestimmung mindestens einer Gaskomponente in einem Atemgasgemisch |
| JP6791214B2 (ja) * | 2018-07-13 | 2020-11-25 | 横河電機株式会社 | 分光分析装置 |
-
2018
- 2018-02-05 FR FR1850956A patent/FR3077640B1/fr not_active Expired - Fee Related
-
2019
- 2019-02-01 JP JP2020542309A patent/JP7381475B2/ja active Active
- 2019-02-01 EP EP19707861.1A patent/EP3749948B1/fr active Active
- 2019-02-01 CN CN201980011321.2A patent/CN111670354B/zh active Active
- 2019-02-01 US US16/967,209 patent/US11448590B2/en active Active
- 2019-02-01 WO PCT/FR2019/050230 patent/WO2019150053A1/fr not_active Ceased
Patent Citations (16)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| DE3508027A1 (de) * | 1985-03-07 | 1986-09-11 | Franz-Rudolf Dipl.-Phys. Dr. 5106 Roetgen Block | Verfahren und einrichtung zum ermitteln der konzentration oder der massenanteile bestimmter gase in gasmischungen |
| US5063275A (en) * | 1989-06-25 | 1991-11-05 | Spegas Industries Ltd. | Method and apparatus for gas analysis |
| US5369278A (en) * | 1992-01-30 | 1994-11-29 | Vaisala Oy | Calibration method for gas concentration measurements |
| US6843102B1 (en) * | 1999-05-26 | 2005-01-18 | Gasbeetle Gmbh | Gas sensor arrangement |
| EP1408325A2 (en) * | 2002-09-13 | 2004-04-14 | Delphi Technologies, Inc. | Method of measuring exhaust flow constituents |
| WO2007064370A2 (en) * | 2005-08-04 | 2007-06-07 | Airware Inc. | Ultra low cost ndir gas sensors |
| CN101063655A (zh) * | 2006-04-27 | 2007-10-31 | Ir微系统股份有限公司 | 气体检测方法和气体检测装置 |
| DE102009059962A1 (de) * | 2009-12-22 | 2011-07-14 | Siemens Aktiengesellschaft, 80333 | NDIR-Zweistrahl-Gasanalysator und Verfahren zur Bestimmung der Konzentration einer Messgaskomponente in einem Gasgemisch mittels eines solchen Gasanalysators |
| CN102656441A (zh) * | 2010-10-21 | 2012-09-05 | 光学传感器公司 | 具有验证单元的光谱仪 |
| CN202974862U (zh) * | 2012-07-11 | 2013-06-05 | 重庆市电力公司电力科学研究院 | 一种激光器光源波长校准器和一种气体浓度测量器 |
| CN102809546A (zh) * | 2012-08-21 | 2012-12-05 | 南京埃森环境技术有限公司 | 一种低浓度烟气红外分析仪及检测方法 |
| CN104730021A (zh) * | 2013-12-24 | 2015-06-24 | 北京万联达信科仪器有限公司 | 一种非分光红外气体传感器的标定方法 |
| CN106501192A (zh) * | 2015-09-08 | 2017-03-15 | 富士电机株式会社 | 气体分析仪 |
| CN105181672A (zh) * | 2015-09-25 | 2015-12-23 | 东北大学 | 一种拉曼光谱波数及强度实时校正方法 |
| CN107014760A (zh) * | 2016-01-18 | 2017-08-04 | 株式会社堀场制作所 | 分析装置和分析方法 |
| CN105738309A (zh) * | 2016-02-04 | 2016-07-06 | 杭州巨之灵科技有限公司 | 一种甲烷检测器及方法 |
Non-Patent Citations (3)
| Title |
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| A Research of Stability Method for Non-Dispersive Infrared Gas Analysis Based on Multi-Parameter Model;Li, CP ; Han, JQ ; Dong, XQ ; Ding, YM ; Zhang, DG ; Mu, N;SPECTROSCOPY AND SPECTRAL ANALYSIS;第32卷(第11期);2976-2980 * |
| 基于光谱吸收原理的光纤甲烷传感器检测方法研究;贺玉凯;王汝琳;张丽;王建;吴久晏;;工矿自动化(05);1-4页 * |
| 差分吸收式光纤NO_2气体传感器;张景超,刘瑾,王玉田,杨海马;仪表技术与传感器(05);4-5页 * |
Also Published As
| Publication number | Publication date |
|---|---|
| EP3749948B1 (fr) | 2023-06-07 |
| FR3077640B1 (fr) | 2023-06-30 |
| WO2019150053A1 (fr) | 2019-08-08 |
| JP7381475B2 (ja) | 2023-11-15 |
| US20200363328A1 (en) | 2020-11-19 |
| JP2021512328A (ja) | 2021-05-13 |
| EP3749948A1 (fr) | 2020-12-16 |
| US11448590B2 (en) | 2022-09-20 |
| FR3077640A1 (fr) | 2019-08-09 |
| CN111670354A (zh) | 2020-09-15 |
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