CN111596202A

CN111596202A - Integrated circuit tester

Info

Publication number: CN111596202A
Application number: CN202010450829.7A
Authority: CN
Inventors: 徐龙华
Original assignee: Shanghai Daisi Ic Co ltd
Current assignee: LiLang semiconductor technology (Qidong) Co.,Ltd.
Priority date: 2020-05-25
Filing date: 2020-05-25
Publication date: 2020-08-28

Abstract

The invention discloses an integrated circuit tester, which comprises a main processor, a main control module, a tested chip interface and a power supply unit, wherein the power supply unit is responsible for providing power supply for a tested chip, the voltage of the power supply unit is freely controlled by the main processor, and the test of real-time change of a dynamic power supply at any time point in the whole test flow can be realized. The integrated circuit tester can conveniently test the tested chip in the well-defined power supply voltage fluctuation range.

Description

Integrated circuit tester

Technical Field

The invention belongs to the technical field of large-scale integrated circuit production test, relates to the test of SOC (system on chip) and NVM (non-volatile memory device), and particularly relates to an integrated circuit tester.

Background

In the process of testing and developing the large-scale integrated circuit, the problem of selecting and using a testing platform is involved. For testing of SOC (system on chip), NVM (non volatile memory device), the current testers are the J750 series of Thorada, the 93000 series of Edwardten, T2000, IMS, T6/T5 series, etc. These testers are directed to voltage fluctuation testing, and generally only can test one voltage in one test item. When the voltage change test is required to be realized, the test is mainly realized by controlling in the test pattern, and the real-time voltage change test cannot be realized in the whole test flow, so that the voltage fluctuation condition of the chip in actual use is truly reflected.

Disclosure of Invention

The invention aims to provide an integrated circuit tester which can conveniently carry out voltage change test and can truly simulate the actual use scene of a tested chip (chip).

In order to solve the technical problem, the integrated circuit tester comprises a main processor, a main control module, a tested chip interface and a power supply unit, wherein the voltage of the power supply unit is freely controlled by the main processor, and the test of real-time change of the dynamic power supply voltage at any time point in the whole test flow can be realized.

Defining the voltage variation range and the voltage variation trigger signal of the tested chip in the whole process in the main program part of the test program; the time interval of each voltage change. When the test program is downloaded and the test is started, the main processor realizes the control of dynamic voltage real-time change in the test according to the definition of the test program.

In a test procedure, when a trigger signal with voltage variation is monitored, a power supply voltage signal printed on a chip to be tested is varied in real time until the trigger signal with voltage variation disappears.

When the power supply voltage of the tested chip changes, the level of the IO bus line, the address bus and the control bus which are controlled by the main control module and are printed on the tested chip also synchronously changes.

The invention has the following beneficial effects: the invention adopts a simple design concept, and can conveniently realize real-time voltage variation test.

Drawings

The present invention will be described in further detail with reference to the accompanying drawings and specific embodiments.

FIG. 1 is a schematic diagram of an integrated circuit tester of the present invention.

Detailed Description

As shown in fig. 1, a common tester of the present invention includes a main processor (MCU), a main control module (I/O BUS, Addr BUS, control Gen), a Buffer (Buffer), an input/output BUS conversion unit (I/O BUS inverter), an address BUS conversion unit (Addr BUS inverter), a power supply unit (Powersupply), and a device under test (devicendertest port), where the voltage of the power supply unit is freely controlled by the main processor, and the test of real-time variation of the dynamic power supply voltage at any time point in the whole test process can be implemented.

After the test equipment is powered on, the whole system is in a standby state, a tested chip (DUT) is placed at a corresponding port of a tested chip interface, testing is started by controlling a test start button on a tester, a test program is run by the MCU, the MCU firstly controls a power supply unit, a test voltage is set, and then a data bus signal, an address bus signal and a control signal are generated by controlling a main control module (I/O bus, Addr bus, control Gen). The generated control signal is directly connected to the interface of the chip to be tested to directly control the chip to be tested (DUT), and the generated address bus signal is applied to the corresponding address of the chip to be tested (DUT) through the address bus by the address bus conversion unit (AddrBUS inverter).

The voltage variation ranges V1 and V2 of the tested chip in the whole process and the voltage variation trigger signal Vflag are defined in the main program part of the test program; the time interval Vgap of each voltage change. When the test program is downloaded and the test is started, the main processor realizes the control of dynamic voltage real-time change in the test according to the definition of the test program. No changes and controls are required in the test pattern.

In the testing process of a testing program, when the trigger signal Vlag with voltage variation is monitored to be effective, the power supply voltage signal printed on the tested chip is varied in real time until the trigger signal Vlag with voltage variation is ineffective. During the voltage variation, the voltage variation is realized in a well-defined time interval.

When the voltage of the tested chip changes, the level of the IO bus line, the address bus and the control bus which are controlled by the main control module and are printed on the tested chip also synchronously changes.

Claims

1. An integrated circuit tester is characterized by comprising a main processor, a main control module, a tested chip interface and a power supply unit, wherein the voltage of the power supply unit is freely controlled by the main processor, so that the test of real-time change of dynamic power supply voltage at any time point in the whole test flow can be realized;

defining the voltage variation range and the voltage variation trigger signal of the tested chip in the whole process in the main program part of the test program; the time interval of each voltage change; when the test program is downloaded and the test is started, the main processor realizes the control of dynamic voltage real-time change in the test according to the definition of the test program.

2. The IC tester of claim 1, wherein during a test sequence of a test program, when a voltage-varying trigger signal is monitored, the power supply voltage signal applied to the chip under test varies in real time until the voltage-varying trigger signal disappears.

3. The integrated circuit tester as claimed in claim 1, wherein when the power supply voltage of the chip under test varies, the levels of the IO bus, the address bus, and the control bus printed on the chip under test controlled by the main control module also vary synchronously.