CN111596202A - Integrated circuit tester - Google Patents

Integrated circuit tester Download PDF

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Publication number
CN111596202A
CN111596202A CN202010450829.7A CN202010450829A CN111596202A CN 111596202 A CN111596202 A CN 111596202A CN 202010450829 A CN202010450829 A CN 202010450829A CN 111596202 A CN111596202 A CN 111596202A
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CN
China
Prior art keywords
test
voltage
power supply
integrated circuit
chip
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
CN202010450829.7A
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Chinese (zh)
Inventor
徐龙华
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
LiLang semiconductor technology (Qidong) Co.,Ltd.
Original Assignee
Shanghai Daisi Ic Co ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Shanghai Daisi Ic Co ltd filed Critical Shanghai Daisi Ic Co ltd
Priority to CN202010450829.7A priority Critical patent/CN111596202A/en
Publication of CN111596202A publication Critical patent/CN111596202A/en
Pending legal-status Critical Current

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    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317Testing of digital circuits
    • G01R31/3181Functional testing
    • G01R31/3183Generation of test inputs, e.g. test vectors, patterns or sequences
    • G01R31/318307Generation of test inputs, e.g. test vectors, patterns or sequences computer-aided, e.g. automatic test program generator [ATPG], program translations, test program debugging
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317Testing of digital circuits
    • G01R31/31704Design for test; Design verification

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  • Engineering & Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Tests Of Electronic Circuits (AREA)

Abstract

The invention discloses an integrated circuit tester, which comprises a main processor, a main control module, a tested chip interface and a power supply unit, wherein the power supply unit is responsible for providing power supply for a tested chip, the voltage of the power supply unit is freely controlled by the main processor, and the test of real-time change of a dynamic power supply at any time point in the whole test flow can be realized. The integrated circuit tester can conveniently test the tested chip in the well-defined power supply voltage fluctuation range.

Description

Integrated circuit tester
Technical Field
The invention belongs to the technical field of large-scale integrated circuit production test, relates to the test of SOC (system on chip) and NVM (non-volatile memory device), and particularly relates to an integrated circuit tester.
Background
In the process of testing and developing the large-scale integrated circuit, the problem of selecting and using a testing platform is involved. For testing of SOC (system on chip), NVM (non volatile memory device), the current testers are the J750 series of Thorada, the 93000 series of Edwardten, T2000, IMS, T6/T5 series, etc. These testers are directed to voltage fluctuation testing, and generally only can test one voltage in one test item. When the voltage change test is required to be realized, the test is mainly realized by controlling in the test pattern, and the real-time voltage change test cannot be realized in the whole test flow, so that the voltage fluctuation condition of the chip in actual use is truly reflected.
Disclosure of Invention
The invention aims to provide an integrated circuit tester which can conveniently carry out voltage change test and can truly simulate the actual use scene of a tested chip (chip).
In order to solve the technical problem, the integrated circuit tester comprises a main processor, a main control module, a tested chip interface and a power supply unit, wherein the voltage of the power supply unit is freely controlled by the main processor, and the test of real-time change of the dynamic power supply voltage at any time point in the whole test flow can be realized.
Defining the voltage variation range and the voltage variation trigger signal of the tested chip in the whole process in the main program part of the test program; the time interval of each voltage change. When the test program is downloaded and the test is started, the main processor realizes the control of dynamic voltage real-time change in the test according to the definition of the test program.
In a test procedure, when a trigger signal with voltage variation is monitored, a power supply voltage signal printed on a chip to be tested is varied in real time until the trigger signal with voltage variation disappears.
When the power supply voltage of the tested chip changes, the level of the IO bus line, the address bus and the control bus which are controlled by the main control module and are printed on the tested chip also synchronously changes.
The invention has the following beneficial effects: the invention adopts a simple design concept, and can conveniently realize real-time voltage variation test.
Drawings
The present invention will be described in further detail with reference to the accompanying drawings and specific embodiments.
FIG. 1 is a schematic diagram of an integrated circuit tester of the present invention.
Detailed Description
As shown in fig. 1, a common tester of the present invention includes a main processor (MCU), a main control module (I/O BUS, Addr BUS, control Gen), a Buffer (Buffer), an input/output BUS conversion unit (I/O BUS inverter), an address BUS conversion unit (Addr BUS inverter), a power supply unit (Powersupply), and a device under test (devicendertest port), where the voltage of the power supply unit is freely controlled by the main processor, and the test of real-time variation of the dynamic power supply voltage at any time point in the whole test process can be implemented.
After the test equipment is powered on, the whole system is in a standby state, a tested chip (DUT) is placed at a corresponding port of a tested chip interface, testing is started by controlling a test start button on a tester, a test program is run by the MCU, the MCU firstly controls a power supply unit, a test voltage is set, and then a data bus signal, an address bus signal and a control signal are generated by controlling a main control module (I/O bus, Addr bus, control Gen). The generated control signal is directly connected to the interface of the chip to be tested to directly control the chip to be tested (DUT), and the generated address bus signal is applied to the corresponding address of the chip to be tested (DUT) through the address bus by the address bus conversion unit (AddrBUS inverter).
The voltage variation ranges V1 and V2 of the tested chip in the whole process and the voltage variation trigger signal Vflag are defined in the main program part of the test program; the time interval Vgap of each voltage change. When the test program is downloaded and the test is started, the main processor realizes the control of dynamic voltage real-time change in the test according to the definition of the test program. No changes and controls are required in the test pattern.
In the testing process of a testing program, when the trigger signal Vlag with voltage variation is monitored to be effective, the power supply voltage signal printed on the tested chip is varied in real time until the trigger signal Vlag with voltage variation is ineffective. During the voltage variation, the voltage variation is realized in a well-defined time interval.
When the voltage of the tested chip changes, the level of the IO bus line, the address bus and the control bus which are controlled by the main control module and are printed on the tested chip also synchronously changes.

Claims (3)

1. An integrated circuit tester is characterized by comprising a main processor, a main control module, a tested chip interface and a power supply unit, wherein the voltage of the power supply unit is freely controlled by the main processor, so that the test of real-time change of dynamic power supply voltage at any time point in the whole test flow can be realized;
defining the voltage variation range and the voltage variation trigger signal of the tested chip in the whole process in the main program part of the test program; the time interval of each voltage change; when the test program is downloaded and the test is started, the main processor realizes the control of dynamic voltage real-time change in the test according to the definition of the test program.
2. The IC tester of claim 1, wherein during a test sequence of a test program, when a voltage-varying trigger signal is monitored, the power supply voltage signal applied to the chip under test varies in real time until the voltage-varying trigger signal disappears.
3. The integrated circuit tester as claimed in claim 1, wherein when the power supply voltage of the chip under test varies, the levels of the IO bus, the address bus, and the control bus printed on the chip under test controlled by the main control module also vary synchronously.
CN202010450829.7A 2020-05-25 2020-05-25 Integrated circuit tester Pending CN111596202A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
CN202010450829.7A CN111596202A (en) 2020-05-25 2020-05-25 Integrated circuit tester

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
CN202010450829.7A CN111596202A (en) 2020-05-25 2020-05-25 Integrated circuit tester

Publications (1)

Publication Number Publication Date
CN111596202A true CN111596202A (en) 2020-08-28

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Application Number Title Priority Date Filing Date
CN202010450829.7A Pending CN111596202A (en) 2020-05-25 2020-05-25 Integrated circuit tester

Country Status (1)

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CN (1) CN111596202A (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN112557875A (en) * 2020-12-08 2021-03-26 苏州英嘉通半导体有限公司 Test development method and device for selecting through AD conversion result

Citations (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN101458302A (en) * 2007-12-13 2009-06-17 上海华虹Nec电子有限公司 Semiconductor tester
CN201311447Y (en) * 2008-08-19 2009-09-16 比亚迪股份有限公司 Voltage and current testing system
CN202008657U (en) * 2011-01-31 2011-10-12 杭州士兰微电子股份有限公司 Vector generation device for simulation test of integrated circuit
CN102520343A (en) * 2011-12-14 2012-06-27 电子科技大学 Graphical test method of semiconductor devices
CN102540060A (en) * 2010-12-27 2012-07-04 北京中电华大电子设计有限责任公司 Digital integrated circuit chip testing system
CN105807202A (en) * 2014-12-30 2016-07-27 珠海全志科技股份有限公司 Integrated circuit test board card
CN107886997A (en) * 2017-12-15 2018-04-06 北京京存技术有限公司 A kind of EMMC test devices and method
CN109346119A (en) * 2018-08-30 2019-02-15 武汉精鸿电子技术有限公司 A kind of semiconductor memory burn-in test core board

Patent Citations (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN101458302A (en) * 2007-12-13 2009-06-17 上海华虹Nec电子有限公司 Semiconductor tester
CN201311447Y (en) * 2008-08-19 2009-09-16 比亚迪股份有限公司 Voltage and current testing system
CN102540060A (en) * 2010-12-27 2012-07-04 北京中电华大电子设计有限责任公司 Digital integrated circuit chip testing system
CN202008657U (en) * 2011-01-31 2011-10-12 杭州士兰微电子股份有限公司 Vector generation device for simulation test of integrated circuit
CN102520343A (en) * 2011-12-14 2012-06-27 电子科技大学 Graphical test method of semiconductor devices
CN105807202A (en) * 2014-12-30 2016-07-27 珠海全志科技股份有限公司 Integrated circuit test board card
CN107886997A (en) * 2017-12-15 2018-04-06 北京京存技术有限公司 A kind of EMMC test devices and method
CN109346119A (en) * 2018-08-30 2019-02-15 武汉精鸿电子技术有限公司 A kind of semiconductor memory burn-in test core board

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN112557875A (en) * 2020-12-08 2021-03-26 苏州英嘉通半导体有限公司 Test development method and device for selecting through AD conversion result

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Effective date of registration: 20220111

Address after: 201306 2nd floor, no.979 Yunhan Road, Lingang New Area, China (Shanghai) pilot Free Trade Zone, Pudong New Area, Shanghai

Applicant after: Shanghai LiLang integrated circuit Co.,Ltd.

Address before: No. 778, West Chuangxin Road, China (Shanghai) pilot Free Trade Zone, Pudong New Area, Shanghai, 201210

Applicant before: Shanghai Daisi IC Co.,Ltd.

TA01 Transfer of patent application right
TA01 Transfer of patent application right

Effective date of registration: 20220222

Address after: No. 500, Linyang Road, Qidong Economic Development Zone, Nantong City, Jiangsu Province

Applicant after: LiLang semiconductor technology (Qidong) Co.,Ltd.

Address before: 201306 2nd floor, no.979 Yunhan Road, Lingang New Area, China (Shanghai) pilot Free Trade Zone, Pudong New Area, Shanghai

Applicant before: Shanghai LiLang integrated circuit Co.,Ltd.

TA01 Transfer of patent application right
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Application publication date: 20200828

WD01 Invention patent application deemed withdrawn after publication