CN111596202A - Integrated circuit tester - Google Patents
Integrated circuit tester Download PDFInfo
- Publication number
- CN111596202A CN111596202A CN202010450829.7A CN202010450829A CN111596202A CN 111596202 A CN111596202 A CN 111596202A CN 202010450829 A CN202010450829 A CN 202010450829A CN 111596202 A CN111596202 A CN 111596202A
- Authority
- CN
- China
- Prior art keywords
- test
- voltage
- power supply
- integrated circuit
- chip
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
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Classifications
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/317—Testing of digital circuits
- G01R31/3181—Functional testing
- G01R31/3183—Generation of test inputs, e.g. test vectors, patterns or sequences
- G01R31/318307—Generation of test inputs, e.g. test vectors, patterns or sequences computer-aided, e.g. automatic test program generator [ATPG], program translations, test program debugging
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/317—Testing of digital circuits
- G01R31/31704—Design for test; Design verification
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- Engineering & Computer Science (AREA)
- Computer Hardware Design (AREA)
- General Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Tests Of Electronic Circuits (AREA)
Abstract
Description
Claims (3)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
CN202010450829.7A CN111596202A (en) | 2020-05-25 | 2020-05-25 | Integrated circuit tester |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
CN202010450829.7A CN111596202A (en) | 2020-05-25 | 2020-05-25 | Integrated circuit tester |
Publications (1)
Publication Number | Publication Date |
---|---|
CN111596202A true CN111596202A (en) | 2020-08-28 |
Family
ID=72181551
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
CN202010450829.7A Pending CN111596202A (en) | 2020-05-25 | 2020-05-25 | Integrated circuit tester |
Country Status (1)
Country | Link |
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CN (1) | CN111596202A (en) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN112557875A (en) * | 2020-12-08 | 2021-03-26 | 苏州英嘉通半导体有限公司 | Test development method and device for selecting through AD conversion result |
Citations (8)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN101458302A (en) * | 2007-12-13 | 2009-06-17 | 上海华虹Nec电子有限公司 | Semiconductor tester |
CN201311447Y (en) * | 2008-08-19 | 2009-09-16 | 比亚迪股份有限公司 | Voltage and current testing system |
CN202008657U (en) * | 2011-01-31 | 2011-10-12 | 杭州士兰微电子股份有限公司 | Vector generation device for simulation test of integrated circuit |
CN102520343A (en) * | 2011-12-14 | 2012-06-27 | 电子科技大学 | Graphical test method of semiconductor devices |
CN102540060A (en) * | 2010-12-27 | 2012-07-04 | 北京中电华大电子设计有限责任公司 | Digital integrated circuit chip testing system |
CN105807202A (en) * | 2014-12-30 | 2016-07-27 | 珠海全志科技股份有限公司 | Integrated circuit test board card |
CN107886997A (en) * | 2017-12-15 | 2018-04-06 | 北京京存技术有限公司 | A kind of EMMC test devices and method |
CN109346119A (en) * | 2018-08-30 | 2019-02-15 | 武汉精鸿电子技术有限公司 | A kind of semiconductor memory burn-in test core board |
-
2020
- 2020-05-25 CN CN202010450829.7A patent/CN111596202A/en active Pending
Patent Citations (8)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN101458302A (en) * | 2007-12-13 | 2009-06-17 | 上海华虹Nec电子有限公司 | Semiconductor tester |
CN201311447Y (en) * | 2008-08-19 | 2009-09-16 | 比亚迪股份有限公司 | Voltage and current testing system |
CN102540060A (en) * | 2010-12-27 | 2012-07-04 | 北京中电华大电子设计有限责任公司 | Digital integrated circuit chip testing system |
CN202008657U (en) * | 2011-01-31 | 2011-10-12 | 杭州士兰微电子股份有限公司 | Vector generation device for simulation test of integrated circuit |
CN102520343A (en) * | 2011-12-14 | 2012-06-27 | 电子科技大学 | Graphical test method of semiconductor devices |
CN105807202A (en) * | 2014-12-30 | 2016-07-27 | 珠海全志科技股份有限公司 | Integrated circuit test board card |
CN107886997A (en) * | 2017-12-15 | 2018-04-06 | 北京京存技术有限公司 | A kind of EMMC test devices and method |
CN109346119A (en) * | 2018-08-30 | 2019-02-15 | 武汉精鸿电子技术有限公司 | A kind of semiconductor memory burn-in test core board |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN112557875A (en) * | 2020-12-08 | 2021-03-26 | 苏州英嘉通半导体有限公司 | Test development method and device for selecting through AD conversion result |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
PB01 | Publication | ||
PB01 | Publication | ||
SE01 | Entry into force of request for substantive examination | ||
SE01 | Entry into force of request for substantive examination | ||
TA01 | Transfer of patent application right |
Effective date of registration: 20220111 Address after: 201306 2nd floor, no.979 Yunhan Road, Lingang New Area, China (Shanghai) pilot Free Trade Zone, Pudong New Area, Shanghai Applicant after: Shanghai LiLang integrated circuit Co.,Ltd. Address before: No. 778, West Chuangxin Road, China (Shanghai) pilot Free Trade Zone, Pudong New Area, Shanghai, 201210 Applicant before: Shanghai Daisi IC Co.,Ltd. |
|
TA01 | Transfer of patent application right | ||
TA01 | Transfer of patent application right |
Effective date of registration: 20220222 Address after: No. 500, Linyang Road, Qidong Economic Development Zone, Nantong City, Jiangsu Province Applicant after: LiLang semiconductor technology (Qidong) Co.,Ltd. Address before: 201306 2nd floor, no.979 Yunhan Road, Lingang New Area, China (Shanghai) pilot Free Trade Zone, Pudong New Area, Shanghai Applicant before: Shanghai LiLang integrated circuit Co.,Ltd. |
|
TA01 | Transfer of patent application right | ||
WD01 | Invention patent application deemed withdrawn after publication |
Application publication date: 20200828 |
|
WD01 | Invention patent application deemed withdrawn after publication |