CN201311447Y - Voltage and current testing system - Google Patents
Voltage and current testing system Download PDFInfo
- Publication number
- CN201311447Y CN201311447Y CNU2008201327595U CN200820132759U CN201311447Y CN 201311447 Y CN201311447 Y CN 201311447Y CN U2008201327595 U CNU2008201327595 U CN U2008201327595U CN 200820132759 U CN200820132759 U CN 200820132759U CN 201311447 Y CN201311447 Y CN 201311447Y
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Abstract
The utility model discloses a voltage and current testing system comprising a test control unit and a voltage and current testing unit. The test control unit sends a voltage and/or current test control command; the voltage and current testing unit is respectively connected with the test control unit and a tested circuit, receives the voltage and/or current test control command, carries out a voltage and/or current test on the tested circuit, obtains voltage and/or current test data and sends the voltage and/or current test data to the test control unit for processing. The utility model greatly improves the voltage and/or current test efficiency of the tested circuit, reduces the test cost and is convenient to operate.
Description
Technical field
The utility model relates to the circuit test field, is specifically related to a kind of electric current and voltage test macro.
Background technology
Current, because a large amount of of electricity consumption device popularize, not only on commercial production, still in various experiments, all related to the test of voltage and current.So relevant testing apparatus also produces thereupon, for example: numeral, pointer, multi-functional or hand-held etc., not only can satisfy the various test requests that the user proposes, also be very easy to user's test.But, these testing tools mostly are single-path testings, and are single machine test equipment, promptly can only show test results on one's body certainly at testing tool, and can't be with test result output so that do further processing.Especially when needs carry out batch testing to circuit, will be very low with the testing efficiency of these testing apparatuss.If adopt a plurality of equipment to test together, can increase the cost of whole test again, add that data can't preserve output, further strengthened the workload of test result being carried out statistical treatment again, testing efficiency is low.
The utility model content
One of the purpose of this utility model provides a kind of electric current and voltage test macro that improves circuit test efficient.
The utility model provides a kind of electric current and voltage test macro, and described electric current and voltage test macro is connected with at least one circuit-under-test, and described electric current and voltage test macro comprises: unit of testing and controlling and electric current and voltage test cell; Unit of testing and controlling sends voltage and/or testing current steering order; The electric current and voltage test cell is connected with unit of testing and controlling, circuit-under-test respectively, receive voltage and/or testing current steering order, circuit-under-test is carried out voltage and/or testing current, obtain voltage and/or testing current data and be sent to unit of testing and controlling and handle.
Described electric current and voltage test macro also can comprise: adjust control module and switching gate unit; Described adjustment control module is connected with unit of testing and controlling, switching gate unit and electric current and voltage test cell respectively, voltage and/or testing current steering order that the acceptance test control module sends, according to voltage and/or testing current steering order gauge tap gating unit the test access that the electric current and voltage test cell is connected with circuit-under-test is selected, received the voltage and/or the current data of electric current and voltage test cell test and send unit of testing and controlling to and handle.
Described adjustment control module can comprise: instruction storage module and single chip control module; Described instruction storage module is connected with unit of testing and controlling, voltage that the acceptance test control module sends and/or testing current steering order and storage; Described single chip control module is connected with switching gate unit, electric current and voltage test cell and instruction storage module respectively, read voltage and/or testing current steering order, the test access that the switch gating unit is connected with circuit-under-test is selected, realized the connection of electric current and voltage test cell and circuit-under-test.
Described electric current and voltage test cell can comprise: voltage test module and testing current module; Described voltage test module is connected with adjustment control module, switching gate unit respectively, under the control of adjusting control module, switching gate unit, connect with circuit-under-test, the circuit-under-test of connecting is carried out voltage tester, obtain the voltage tester data and send the adjustment control module to; Described testing current module is connected with adjustment control module, switching gate unit respectively, under the control of adjusting control module, switching gate unit, connect with circuit-under-test, the circuit-under-test of connecting is carried out testing current, obtain the testing current data and send the adjustment control module to.
Described unit of testing and controlling can comprise: test instruction sending module and testing data processing module; Described test instruction sending module is connected with the adjustment control module, sends voltage and/or testing current steering order to adjusting control module; Described testing data processing module is connected with the adjustment control module, receives and adjusts voltage and/or the testing current data that control module transmits, and become voltage and/or current value to show voltage and/or testing current data processing.
The utility model is by the electric current and voltage test macro, voltage and/or electric current to a plurality of circuit-under-tests are tested, the value of being tested is sent to unit of testing and controlling to be handled, thereby draw the voltage and/or the current value of circuit-under-test, greatly improved testing efficiency, reduced testing cost, and easy to operate.
Description of drawings
Fig. 1 is the structured flowchart of the utility model one embodiment electric current and voltage test macro;
Fig. 2 is the structured flowchart of the another embodiment electric current and voltage of the utility model test macro;
Fig. 3 is a structured flowchart of adjusting control module among the utility model one embodiment;
Fig. 4 is the structured flowchart of electric current and voltage test cell among the utility model one embodiment;
Fig. 5 is the structured flowchart of unit of testing and controlling among the utility model one embodiment;
Fig. 6 is the schematic block circuit diagram of voltage test module among the utility model one embodiment;
Fig. 7 is the schematic block circuit diagram of testing current module among the utility model one embodiment.
The utility model purpose, function and advantage will be in conjunction with the embodiments, are described further with reference to accompanying drawing.
Embodiment
The electric current and voltage test macro that the utility model embodiment provides, voltage and/or electric current to a plurality of circuit-under-tests are tested, the value of being tested is sent to unit of testing and controlling to be handled, thereby draw the voltage and/or the current value of circuit-under-test, greatly improved testing efficiency, reduced testing cost, and easy to operate.
Fig. 1 shows the electric current and voltage test macro that the utility model one embodiment provides, and comprises unit of testing and controlling 10 and electric current and voltage test cell 20; Described unit of testing and controlling 10 sends voltage and/or testing current steering order; Described electric current and voltage test cell 20 is electrically connected with unit of testing and controlling 10, circuit-under-test 30 respectively, receive voltage and/or testing current steering order, circuit-under-test 30 is carried out voltage and/or testing current, obtain voltage and/or testing current data and be sent to unit of testing and controlling 10 and handle.
Fig. 2 shows the electric current and voltage test macro that the another embodiment of the utility model provides, and comprises unit of testing and controlling 10, electric current and voltage test cell 20, adjusts control module 40 and switching gate unit 50.
Described unit of testing and controlling 10 is connected with adjustment control module 40, sends voltage and/or testing current steering orders to adjusting control module 40.In one embodiment, unit of testing and controlling 10 is host computers of working voltage testing current software.Host computer comprises computing machine, single-chip microcomputer etc.
Described adjustment control module 40 is connected with described unit of testing and controlling 10, electric current and voltage test cell 20 and switching gate unit 50 respectively, voltage and/or testing current steering order that acceptance test control module 10 sends are selected with the test access that circuit-under-test 30 is connected according to 50 pairs of electric current and voltage test cells 20 of voltage and current test steering order gauge tap gating unit.
Adjust voltage and/or current data that control module 40 also receives 20 tests of electric current and voltage test cell, the voltage and/or the testing current data of testing are sent to unit of testing and controlling 10 by USB interface.The voltage and/or the testing current data of 10 pairs of receptions of unit of testing and controlling are handled, thereby show the voltage and/or the current value of circuit-under-test 30.
Fig. 3 shows the adjustment control module 40 among the utility model one embodiment, comprises instruction storage module 401 and single chip control module 402.
Described instruction storage module 401 is connected with unit of testing and controlling 10, voltage that acceptance test control module 10 sends and/or testing current steering order and storage.
Described single chip control module 402 is connected with switching gate unit 50, electric current and voltage test cell 20 and instruction storage module 401 respectively, reading command memory module 401 stored voltage and/or testing current steering order, according to described voltage tester steering order switch gating unit 20 is selected with the test access that circuit-under-test 30 is connected, realized the connection of electric current and voltage test cell 20 and at least one circuit-under-test 30.
In one embodiment, single chip control module 402 main employings is 8 machines of band USB interface.Leave one group 16 bus interface on the single chip control module 402, be used to receive voltage and/or current data, the voltage and/or the current data of testing sent to unit of testing and controlling 10 from 20 tests of electric current and voltage test cell.In addition, single chip control module 402 has also been reserved an external interrupt, have only after the look-at-me triggering that electric current and voltage test cell 20 sends, just begin to receive the test voltage and/or the current data of 20 outputs of electric current and voltage test cell, guarantee the voltage that receives and/or the correctness of testing current data time sequence with this.
The fundamental purpose that instruction storage module 401 is set is: because single chip control module 402 is not when powering on, can't storage data, so must have one can the static device that stores code, in outage, can also can make single chip control module 402 when powering on, can read steering order with under voltage and/or the preservation of testing current steering order from instruction storage module 401 at every turn.
Fig. 4 shows electric current and voltage test cell 20 among the utility model one embodiment, comprises voltage test module 201 and testing current module 202.
Described voltage test module 201 is connected with adjustment control module 40, switching gate unit 50 respectively, under the control of adjusting control module 40, switching gate unit 50, connect with at least one circuit-under-test 30, the circuit-under-test of connecting 30 is carried out voltage tester, obtain the voltage tester data and send to and adjust control module 40.
Described testing current module 202 is connected with adjustment control module 40, switching gate unit 50 respectively, under the control of adjusting control module 40, switching gate unit 50, connect with at least one circuit-under-test 30, the circuit-under-test of connecting 30 is carried out testing current, obtain the testing current data and send to and adjust control module 40.
Fig. 5 shows unit of testing and controlling 10 among the utility model one embodiment, comprises test instruction sending module 101 and testing data processing module 102.
Described test instruction sending module 101 is connected with adjustment control module 40, sends voltage and/or testing current steering orders to adjusting control module 40.
Described testing data processing module 102 is connected with adjustment control module 40, receives to adjust voltage and/or the testing current data that control module 40 transmits, and becomes voltage and/or current value to show voltage and/or testing current data processing.
Fig. 6 shows the voltage test module among the utility model one embodiment, comprise that ADC (Analog-to-Digital Converter, analog to digital-converter) sampling A, OR-NOT circuit and negative voltage produce chip (mainly being to provide negative supply to the ADC sampling A).
In one embodiment, if the voltage-to-ground of test circuit-under-test 30, can be with ADC sampling A negative input ground connection, electrode input end is connected to circuit-under-test 30, carries out voltage tester.Test independently voltage if desired, the both positive and negative polarity input end can be received the two ends of circuit-under-test 30 respectively, carry out voltage tester.
The process that voltage test module is tested circuit-under-test 30 is: the ADC sampling A is gathered the voltage signal at circuit-under-test 30 two ends, (reference value is 2.048V with the voltage signal of circuit-under-test 30 and a reference value, provide by 2.048V reference source) be converted to digital signal after comparing, realize the digitizing of voltage signal.The ADC sampling A generates look-at-me under the assistance of OR-NOT circuit, carry out the reception of magnitude of voltage in the effective situation of the look-at-me single chip control module 402 that sends a notice.Single chip control module 402 receives the magnitude of voltage from the output of ADC sampling A after receiving effective look-at-me, magnitude of voltage is sent to unit of testing and controlling 10 do further processing.
10 pairs of magnitude of voltage processing procedures of unit of testing and controlling are: unit of testing and controlling 10 is multiplied by corresponding multiple with the magnitude of voltage that obtains, and obtains the magnitude of voltage of circuit-under-test.Because the ceiling voltage that the ADC sampling A is supported is limited, so the magnitude of voltage of gathering is through dividing potential drop, after so the magnitude of voltage of gathering reaches unit of testing and controlling 10, need be multiplied by corresponding multiple (concrete multiple is determined according to amplifying the coefficient that dwindles in the side circuit), just obtain accurate magnitude of voltage.
Fig. 7 shows the testing current module among utility model one embodiment, comprises ADC sampling A, OR-NOT circuit, operational amplifier and sampling resistor R.
In one embodiment, need detect resistance owing to measure electric current, so in circuit-under-test, sealed in the sampling resistor R of a resistance very little (0.5 ohm～1 ohm).Operational amplifier is gathered the voltage signal at sampling resistor R two ends, exports to the ADC sampling A after the voltage of gathering is amplified.The ADC sampling A is converted to digital signal, the digitizing of realization voltage signal after the voltage signal of gathering is compared with a reference value (reference value is 2.048V, is provided by 2.048V reference source).The ADC sampling A generates look-at-me under the assistance of OR-NOT circuit, carry out the reception of magnitude of voltage in the effective situation of the look-at-me single chip control module 402 that sends a notice.Single chip control module 402 receives the magnitude of voltage from the output of ADC sampling A after receiving effective look-at-me, magnitude of voltage is sent to unit of testing and controlling 10 do further processing.Unit of testing and controlling 10 just obtains the magnitude of voltage that obtains divided by the resistance of the enlargement factor of operational amplifier and sampling resistor R the current value of circuit-under-test 30.
The foregoing description is the utility model preferred implementation; but embodiment of the present utility model is not restricted to the described embodiments; other any do not deviate from change, the modification done under spirit of the present utility model and the principle, substitutes, combination, simplify; all should be the substitute mode of equivalence, be included within the protection domain of the present utility model.
Claims (5)
1. electric current and voltage test macro, described electric current and voltage test macro is connected with at least one circuit-under-test, it is characterized in that, comprising:
Unit of testing and controlling and electric current and voltage test cell;
Unit of testing and controlling sends voltage and/or testing current steering order;
The electric current and voltage test cell is connected with unit of testing and controlling, circuit-under-test respectively, receive voltage and/or testing current steering order, circuit-under-test is carried out voltage and/or testing current, obtain voltage and/or testing current data and be sent to unit of testing and controlling and handle.
2. electric current and voltage test macro according to claim 1 is characterized in that, also comprises:
Adjust control module and switching gate unit;
Described adjustment control module is connected with unit of testing and controlling, switching gate unit and electric current and voltage test cell respectively, voltage and/or testing current steering order that the acceptance test control module sends, according to voltage and/or testing current steering order gauge tap gating unit the test access that the electric current and voltage test cell is connected with circuit-under-test is selected, received the voltage and/or the current data of electric current and voltage test cell test and send unit of testing and controlling to and handle.
3. voltage testing system according to claim 2 is characterized in that, described adjustment control module comprises:
Instruction storage module and single chip control module;
Described instruction storage module is connected with unit of testing and controlling, voltage that the acceptance test control module sends and/or testing current steering order and storage;
Described single chip control module is connected with switching gate unit, electric current and voltage test cell and instruction storage module respectively, read voltage and/or testing current steering order, the test access that the switch gating unit is connected with circuit-under-test is selected, realized the connection of electric current and voltage test cell and circuit-under-test.
4. voltage testing system according to claim 2 is characterized in that, described electric current and voltage test cell comprises:
Voltage test module and testing current module;
Described voltage test module is connected with adjustment control module, switching gate unit respectively, under the control of adjusting control module, switching gate unit, connect with circuit-under-test, the circuit-under-test of connecting is carried out voltage tester, obtain the voltage tester data and send the adjustment control module to;
Described testing current module is connected with adjustment control module, switching gate unit respectively, under the control of adjusting control module, switching gate unit, connect with circuit-under-test, the circuit-under-test of connecting is carried out testing current, obtain the testing current data and send the adjustment control module to.
5. according to each described electric current and voltage test macro of claim 2 to 4, it is characterized in that described unit of testing and controlling comprises:
Test instruction sending module and testing data processing module;
Described test instruction sending module is connected with the adjustment control module, sends voltage and/or testing current steering order to adjusting control module;
Described testing data processing module is connected with the adjustment control module, receives and adjusts voltage and/or the testing current data that control module transmits, and become voltage and/or current value to show voltage and/or testing current data processing.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CNU2008201327595U CN201311447Y (en) | 2008-08-19 | 2008-08-19 | Voltage and current testing system |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CNU2008201327595U CN201311447Y (en) | 2008-08-19 | 2008-08-19 | Voltage and current testing system |
Publications (1)
| Publication Number | Publication Date |
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| CN201311447Y true CN201311447Y (en) | 2009-09-16 |
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| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CNU2008201327595U Expired - Fee Related CN201311447Y (en) | 2008-08-19 | 2008-08-19 | Voltage and current testing system |
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| CN (1) | CN201311447Y (en) |
Cited By (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN104101745A (en) * | 2013-04-02 | 2014-10-15 | 鸿富锦精密电子(天津)有限公司 | Linear impedance stabilization network |
| CN107505504A (en) * | 2017-09-26 | 2017-12-22 | 航天科技控股集团股份有限公司 | A kind of long-range power consumption monitoring system of electric automobile |
| CN107632270A (en) * | 2017-09-26 | 2018-01-26 | 航天科技控股集团股份有限公司 | A kind of remote monitoring system of hundred kilometers of power consumption of electric automobile |
| CN111596202A (en) * | 2020-05-25 | 2020-08-28 | 上海岱矽集成电路有限公司 | Integrated circuit tester |
| CN112162141A (en) * | 2020-09-27 | 2021-01-01 | 济南浪潮高新科技投资发展有限公司 | Current detection device and circuit detection method |
-
2008
- 2008-08-19 CN CNU2008201327595U patent/CN201311447Y/en not_active Expired - Fee Related
Cited By (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN104101745A (en) * | 2013-04-02 | 2014-10-15 | 鸿富锦精密电子(天津)有限公司 | Linear impedance stabilization network |
| CN107505504A (en) * | 2017-09-26 | 2017-12-22 | 航天科技控股集团股份有限公司 | A kind of long-range power consumption monitoring system of electric automobile |
| CN107632270A (en) * | 2017-09-26 | 2018-01-26 | 航天科技控股集团股份有限公司 | A kind of remote monitoring system of hundred kilometers of power consumption of electric automobile |
| CN111596202A (en) * | 2020-05-25 | 2020-08-28 | 上海岱矽集成电路有限公司 | Integrated circuit tester |
| CN112162141A (en) * | 2020-09-27 | 2021-01-01 | 济南浪潮高新科技投资发展有限公司 | Current detection device and circuit detection method |
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Legal Events
| Date | Code | Title | Description |
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| C14 | Grant of patent or utility model | ||
| GR01 | Patent grant | ||
| CF01 | Termination of patent right due to non-payment of annual fee |
Granted publication date: 20090916 Termination date: 20150819 |
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| EXPY | Termination of patent right or utility model |