CN111446568A - Multi-contact socket capable of preventing pins from being damaged - Google Patents
Multi-contact socket capable of preventing pins from being damaged Download PDFInfo
- Publication number
- CN111446568A CN111446568A CN201910858121.2A CN201910858121A CN111446568A CN 111446568 A CN111446568 A CN 111446568A CN 201910858121 A CN201910858121 A CN 201910858121A CN 111446568 A CN111446568 A CN 111446568A
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- Prior art keywords
- terminal
- contact
- probe
- pin
- housing
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/04—Housings; Supporting members; Arrangements of terminals
- G01R1/0408—Test fixtures or contact fields; Connectors or connecting adaptors; Test clips; Test sockets
- G01R1/0416—Connectors, terminals
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01R—ELECTRICALLY-CONDUCTIVE CONNECTIONS; STRUCTURAL ASSOCIATIONS OF A PLURALITY OF MUTUALLY-INSULATED ELECTRICAL CONNECTING ELEMENTS; COUPLING DEVICES; CURRENT COLLECTORS
- H01R13/00—Details of coupling devices of the kinds covered by groups H01R12/70 or H01R24/00 - H01R33/00
- H01R13/02—Contact members
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/04—Housings; Supporting members; Arrangements of terminals
- G01R1/0408—Test fixtures or contact fields; Connectors or connecting adaptors; Test clips; Test sockets
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/06—Measuring leads; Measuring probes
- G01R1/067—Measuring probes
- G01R1/06711—Probe needles; Cantilever beams; "Bump" contacts; Replaceable probe pins
- G01R1/06716—Elastic
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/06—Measuring leads; Measuring probes
- G01R1/067—Measuring probes
- G01R1/073—Multiple probes
- G01R1/07307—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2801—Testing of printed circuits, backplanes, motherboards, hybrid circuits or carriers for multichip packages [MCP]
- G01R31/2806—Apparatus therefor, e.g. test stations, drivers, analysers, conveyors
- G01R31/2808—Holding, conveying or contacting devices, e.g. test adapters, edge connectors, extender boards
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01R—ELECTRICALLY-CONDUCTIVE CONNECTIONS; STRUCTURAL ASSOCIATIONS OF A PLURALITY OF MUTUALLY-INSULATED ELECTRICAL CONNECTING ELEMENTS; COUPLING DEVICES; CURRENT COLLECTORS
- H01R13/00—Details of coupling devices of the kinds covered by groups H01R12/70 or H01R24/00 - H01R33/00
- H01R13/02—Contact members
- H01R13/22—Contacts for co-operating by abutting
- H01R13/24—Contacts for co-operating by abutting resilient; resiliently-mounted
- H01R13/2407—Contacts for co-operating by abutting resilient; resiliently-mounted characterized by the resilient means
- H01R13/2414—Contacts for co-operating by abutting resilient; resiliently-mounted characterized by the resilient means conductive elastomers
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01R—ELECTRICALLY-CONDUCTIVE CONNECTIONS; STRUCTURAL ASSOCIATIONS OF A PLURALITY OF MUTUALLY-INSULATED ELECTRICAL CONNECTING ELEMENTS; COUPLING DEVICES; CURRENT COLLECTORS
- H01R13/00—Details of coupling devices of the kinds covered by groups H01R12/70 or H01R24/00 - H01R33/00
- H01R13/46—Bases; Cases
- H01R13/502—Bases; Cases composed of different pieces
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01R—ELECTRICALLY-CONDUCTIVE CONNECTIONS; STRUCTURAL ASSOCIATIONS OF A PLURALITY OF MUTUALLY-INSULATED ELECTRICAL CONNECTING ELEMENTS; COUPLING DEVICES; CURRENT COLLECTORS
- H01R2201/00—Connectors or connections adapted for particular applications
- H01R2201/20—Connectors or connections adapted for particular applications for testing or measuring purposes
Abstract
The present invention relates to a multi-contact socket for preventing pin damage, and more particularly, to a multi-contact socket for preventing pin damage, which can reduce a distance between socket probes for a circuit connection detector and prevent a contact failure with terminals or a bending or damage phenomenon of plate-shaped probes due to connection with terminals, by connecting with terminals of an object to be tested. The invention discloses a multi-contact socket capable of preventing pins from being damaged, which is characterized by comprising the following components: a plurality of probes having a plurality of contact surfaces for making contact with the terminal multicontacts; a housing disposed perpendicular to the probe; and a compression molding part disposed between the probes protruding into the terminal insertion groove to prevent damage of the probes, the terminals of the housing being inserted into the terminal insertion groove.
Description
Technical Field
The present invention relates to a multi-contact socket for preventing pin damage, and more particularly, to a multi-contact socket for preventing pin damage, which can reduce a distance between socket probes for a circuit connection detector and prevent a contact failure with terminals or a bending or damage phenomenon of plate-shaped probes due to connection with terminals, by connecting with terminals of an object to be tested.
Background
In general, various electronic components are arranged on a circuit board constituting an electronic device, and a defect generated in the arrangement of the various electronic components is identified by an electrical signal after a circuit is formed by connecting the circuit board to a circuit.
In addition, defects in individual parts in the manufacturing process can be detected not only in the circuit board of the electronic device but also in the circuit board.
For example, not only the circuit board of the wireless communication terminal having completed the configuration but also various parts of the display, the camera module, and the like constituting the wireless communication terminal can be inspected in the manufacturing process.
That is, not only can the finished product be inspected, but each component can be inspected continuously during the manufacturing process.
The circuit board and its components are provided with terminals for circuit connection, respectively, so that the circuit board can be connected to a socket of a detector, and recently, the size of the terminals is greatly reduced with the reduction in thickness and weight of electronic equipment.
On the contrary, the conventional cylindrical probe has a problem that it is difficult to reduce the size of the probe or the distance between the probe and the conventional cylindrical probe.
Therefore, a socket using a thin plate-shaped probe has been developed, but in the process of repeatedly inspecting a plurality of circuit boards and components using one socket, the thin plate-shaped probe inspecting the socket is easily bent or damaged.
Accordingly, korean patent laid-open No. 10-0999864 discloses a method of replacing a damaged plate-shaped probe, such as "a probe block for inspecting a liquid crystal display panel", which is capable of facilitating the replacement of the damaged plate-shaped probe, but has a problem of excessive generation of costs required for the replacement due to the disposal of the replaced probe.
That is, the problem of damage to the probe itself cannot be prevented.
In addition, since the contact points of the plate-shaped probe are thinner than those of the cylinder-shaped probe, a problem of poor contact often occurs when the probe is connected to the terminal of the object.
Therefore, there is a need for a technique that can prevent a bending or damage phenomenon of a probe that may occur when a plate-shaped probe is used, and can solve a problem of a contact failure.
[ Prior art documents ]
[ patent document ]
Disclosure of Invention
[ problem to be solved ]
The present invention has been made to solve the above problems, and an object of the present invention is to provide a multi-contact socket preventing damage to pins so as to prevent bending or damage of a plate-shaped probe in a process of connecting the probe to a terminal of an object.
Another object of the present invention is to provide a multi-contact socket preventing damage of pins, thereby preventing a problem of poor contact when a plate-shaped probe is connected to a terminal of an object to be tested.
[ solution ]
In order to achieve the above object, a multi-contact socket for preventing damage to a pin according to the present invention includes: a plurality of probes having a plurality of contact surfaces for making contact with the terminal multicontacts; a housing disposed perpendicular to the probe; and a compression molding part disposed between the probes protruding into the terminal insertion groove to prevent damage of the probes, the terminals of the housing being inserted into the terminal insertion groove.
In one embodiment, the probe comprises: a first contact end, the lower end of which forms a first contact surface connected with the upper surface of the connecting pin of the terminal; and the inner side of the second contact end forms a second contact surface connected with the outer side surface of the connecting pin of the terminal.
In one embodiment, the probe includes a contact end having first and second contact surfaces formed on opposite sides thereof for multi-contact connection to the inner side surfaces of the connection pins of the terminal.
In one embodiment, the probe comprises: a first contact end, one side of which forms a contact surface for contacting with a connection pin of the terminal; and the other side of the second contact end forms a contact surface for contacting with a connecting pin of the terminal, and the contact surfaces of the first contact end and the second contact end are correspondingly arranged with each other so as to be respectively connected to two sides of one connecting pin.
In one embodiment, the press-molding part protrudes in a shape corresponding to the second contact end to cover the outer side surface of the connection pin of the terminal.
In one embodiment, the press-molding part may protrude in a shape corresponding to the end of the contact terminal having the contact surface formed at both sides so as to be recessed inside the connection pin of the terminal by a predetermined depth.
In one embodiment, the press-molding part protrudes inward in the shape of the end of the first contact end and the second contact end disposed to face each other corresponding to the contact surfaces to cover both sides of the connection pin of the terminal.
In one embodiment, the probe comprises: a contact end forming a plurality of contact surfaces; the contact end is arranged at the end part of the first main body; an elastic part for giving elasticity to the first body; a second body extending through the elastic part and connected to the detector through a circuit.
In one embodiment, the method further comprises: a terminal for mounting a detected body on an upper portion of the housing; an alignment part closely connected to an upper part of the terminal; and a pressing part for pressing the terminal of the detected object from the upper part through the alignment part so as to connect the terminal to the shell provided with the probe.
In one embodiment, the method further comprises: an alignment unit to which the terminal of the detected body is attached; and a pressurizing part for pressurizing the housing with the probe therein from the upper part of the terminal mounted on the aligning part, so that the probe is connected to the terminal of the detected body.
[ Effect of the invention ]
In summary, according to the multi-contact socket for preventing pin damage of the present invention, it is possible to prevent the probe from being bent or damaged by protruding between the plate-shaped probes and connecting to the terminals of the test object with the press-molded part supporting the probe.
In addition, the multi-contact socket for preventing the damage of the pins according to the present invention is configured to have a plurality of contact surfaces so as to connect the probe multi-contacts to the terminals of the object to be inspected, thereby being capable of preventing the problem of poor contact.
Drawings
Fig. 1 is a perspective view of a multi-contact socket for preventing pin damage according to the present invention;
fig. 2 is an exploded perspective view of a multi-contact socket for preventing pin damage according to the present invention;
fig. 3 is an enlarged view of a first embodiment of a multi-contact socket for preventing pin damage in accordance with the present invention;
fig. 4 is an enlarged view of a second embodiment of a multi-contact socket for preventing pin damage in accordance with the present invention;
fig. 5 is an exploded view of a third embodiment of a multi-contact socket for preventing pin damage according to the present invention;
fig. 6 is an enlarged view of a third embodiment of a multi-contact socket for preventing pin damage in accordance with the present invention;
fig. 7-9 are diagrams of the connection of the contact ends of a multi-contact pin damage prevention socket to connection pins according to the present invention;
fig. 10 is a diagram of a top mounting arrangement of a multi-contact socket to protect against pin damage according to the present invention;
fig. 11 is a diagram of a bottom mounting arrangement of a multi-contact socket for preventing pin damage according to the present invention.
Reference numerals:
1. a probe;
2. a mold pressing part;
3. a terminal insertion slot;
4. a housing;
10. a contact end;
11. a first contact end;
12. a second contact end;
20. a contact surface;
21. a first contact surface;
22. a second contact surface;
31. a first body;
32. an elastic portion;
33. a second body;
41. a floating plate;
42. a base plate;
50. an alignment section;
51. a lifting part;
22. a support portion;
100. a multi-contact socket to prevent pin damage;
101. a terminal;
102. and connecting the pins.
Detailed Description
Fig. 1 is a perspective view of a multi-contact socket for preventing pin damage according to the present invention, fig. 2 is an exploded perspective view of a multi-contact socket for preventing pin damage according to the present invention, fig. 3 is an enlarged view of a first embodiment of a multi-contact pin damage prevention socket according to the present invention, fig. 4 is an enlarged view of a second embodiment of a multi-contact pin damage prevention socket according to the present invention, fig. 5 is an exploded view of a third embodiment of a multi-contact pin damage prevention socket in accordance with the present invention, fig. 6 is an enlarged view of the third embodiment of the multi-contact pin damage prevention socket in accordance with the present invention, figures 7 through 9 are diagrams of the connection of the contact ends of a multi-contact pin header to connection pins in accordance with the present invention to prevent pin damage, fig. 10 is a view showing a top fixing manner of a multi-contact socket for preventing damage to pins according to the present invention, and fig. 11 is a view showing a bottom fixing manner of the multi-contact socket for preventing damage to pins according to the present invention.
Fig. 1 is a perspective view of a multi-contact socket for preventing pin damage according to the present invention. A terminal connected to a detected body for a multi-contact socket 100 for preventing a pin from being damaged of a circuit connection detector, comprising: a plurality of probes 1 having a plurality of contact surfaces so as to be in multi-contact with the terminals; a housing 4 provided perpendicularly to the probe 1; and a compression molding part 2 provided between the probes 1 protruding into a terminal insertion groove 3 connected with the terminal of the housing 4 to prevent the damage of the probes 1.
In one embodiment, the terminal insertion grooves 3 are shown to be directed upward with reference to fig. 1, but the multi-contact socket 100 for preventing pin damage according to the present invention can be changed in the upward or downward direction when it is detected at the lower portion of the object or at the upper portion of the object, respectively, as will be described in more detail with reference to fig. 10 and 11 below.
In one embodiment, the housing 4 may form a floating plate 41 and a bottom plate 42 provided with the terminal insertion groove 3.
More specifically, as shown in fig. 2, a plurality of grooves 5 are formed in the floating plate 41, and a plate-like probe 1 is inserted into the grooves 5.
In one embodiment, in order to prevent the probe pin 1 provided on the floating plate 41 from being detached, it is fixed by covering it with a bottom plate 42, and the terminal of the probe pin 1 is exposed on the bottom plate 42 or penetrates the bottom plate to be electrically connected to a detector.
In one embodiment, the probe 1 comprises: a contact end 10 forming a plurality of contact surfaces; a first body 31 provided with the contact end 10 at an end thereof; an elastic portion 32 that gives elasticity to the first body; and a second body 33 extended by the elastic part 32 and connected to the detector through a circuit.
The shape of the contact terminal 10, the position where the contact surface is provided, and the like may be set to different shapes according to the shape of the terminal of the object to be connected.
For example, as shown in fig. 3 or 7, in the first embodiment of the multi-contact socket for preventing probe damage according to the present invention, the press-molding part 2 may protrude in a contact end part shape corresponding to both sides forming contact surfaces according to the shape of the probe pin 1 protruding to the terminal insertion groove 3 so as to be recessed inside the connection pin of the terminal by a predetermined depth.
In one embodiment, as shown in fig. 4 or 8, in the second embodiment of the multi-contact socket for preventing probe damage according to the present invention, the press-molding part 2 may protrude in a shape corresponding to the second contact end 12 protruding more than the first contact end 11 according to the shape of the probe pin 1 protruding to the terminal insertion groove 3 so as to be able to cover the outer side surface of the connection pin of the terminal.
That is, the molding part 2 is formed in a shape corresponding to the shape of the probe pin 1 protruding into the terminal insertion groove 3, and supports the side surface of the probe pin 1 to prevent the probe pin 1 from being bent or damaged during the connection process.
Fig. 5 or 6 are exploded views of a third embodiment of a multi-contact socket for preventing pin damage according to the present invention. The housing 4 may be configured such that a housing 43 provided with a plurality of probes is inserted into and disposed inside a floating plate 41 connected to a terminal, and is covered with a bottom plate 42 to the probe housing 43.
That is, the probes are not directly connected to the floating plate 41, but can be used in such a manner that another housing 43 in which a plurality of probes are arranged is inserted, so that the probes can be changed easily and rapidly in this manner, or the order of the probes can be reconfigured.
In this case, the shape of the end portion of the probe housing 43 may be formed into a press-molding portion having various shapes according to the shapes of the contact ends of the end portions of the probes 1.
Fig. 7-9 are diagrams of the connection of the contact ends of a multi-contact socket to connection pins for preventing pin damage according to the present invention. The probe 1 comprises a contact end 10, the two sides of which are correspondingly formed with a first contact surface 21 and a second contact surface 22, so that multiple contacts are connected to the two sides of the inner side of a connection pin 102 of the terminal.
In one embodiment, as shown in fig. 8, the probe 1 includes: a first contact end 11, the lower end of which forms a first contact surface 21 for connecting with the upper surface of the connection pin 102 of the terminal; the second contact end 12 has a second contact surface 22 formed on its inner side for connection with the outer side of the connection pin 102 of the terminal.
In one embodiment, the probe 1 comprises: a first contact end 11, one side of which forms a contact surface 21 for connecting with a connection pin 102 of a terminal; a second contact end 12, the other side of which forms a contact surface 22 for connecting with a connection pin 102 of a terminal, the first contact end 11 and the second contact end 12, the respective contact surfaces 21 and 22 of which are arranged corresponding to each other so as to be connected to both sides of one connection pin 102, respectively.
Fig. 10 is a diagram of a top mounting arrangement for a multi-contact socket to protect against pin damage according to the present invention. The detection is performed in such a manner that the terminal 101 of the object is provided on the upper portion of the housing 4 in which the plurality of probes 1 are arranged.
At this time, when the terminal 101 is connected and detected, in order to prevent the terminal 101 from swelling, a pressing portion 51 may be provided at an upper portion, and the terminal 101 may be pressed downward using the pressing portion.
In particular, when the pressing portion 51 presses the terminal 101, it is preferable that the terminal 101 is pressed by the aligning portion 50, i.e., the aligning portion spaced apart in the horizontal direction or the vertical direction, or the horizontal and vertical directions, so that the housing 4 in which the probe is provided can be connected, and even if the terminal 101 is not accurately contacted in the horizontal state, the damage or the contact failure of the terminal 101 can be prevented.
In one embodiment, the method may further include: a separate elastic body between the pressing part 51 and the aligning part 50 for elastically supporting the aligning part 50.
Fig. 11 is a diagram of a bottom mounting arrangement of a multi-contact socket for preventing pin damage according to the present invention. The terminal 101 of the subject can be connected to the independent support 52 at the lower portion of the housing 4 where the plurality of probes 1 are arranged, and detection can be performed.
At this time, when the housing 4 having the probe 12 therein is pressed by the pressing part 51 and connected to the terminal 101, in order to prevent a contact failure with the terminal 101 due to a difference in distance or a protrusion, the terminal 101 is mounted on the aligning part 50, and the aligning part is spaced apart from the terminal 101 in a horizontal direction or a vertical direction, or in both horizontal and vertical directions, that is, the pressing part 51 presses the housing 4 having the probe therein from the upper part of the terminal 101 mounted on the aligning part 50, thereby connecting the probe to the terminal 100 of the subject.
In one embodiment, the method may further include: a separate elastic body between the pressing part 52 and the aligning part 50 for elastically supporting the aligning part 50.
While the present invention has been described with reference to the preferred embodiments shown in the drawings, it should be understood that various modifications can be made by those skilled in the art without departing from the scope of the present invention. The scope of the invention should, therefore, be construed in accordance with the following claims, including many such modifications.
Claims (13)
1. A multi-contact socket for preventing pin damage, comprising:
a plurality of probes having a plurality of contact surfaces for making contact with the terminal multicontacts;
a housing disposed perpendicular to the probe;
a compression molding part disposed between the probes protruding into the terminal insertion groove to prevent damage of the probes, the terminal of the housing being inserted into the terminal insertion groove;
the probe, comprising:
the lower end of the first contact end forms a first contact surface connected with the upper surface of the connecting pin of the terminal;
and the inner side of the second contact end forms a second contact surface connected with the outer side surface of the connecting pin of the terminal.
2. The multi-contact pin damage prevention socket of claim 1,
and the pressing mold part protrudes in a shape corresponding to the second contact end so as to coat the outer side surface of the connecting pin of the terminal.
3. The multi-contact pin damage prevention socket of claim 2, wherein the probe comprises:
a contact end forming a plurality of contact surfaces;
the contact end is arranged at the end part of the first main body;
an elastic part for giving elasticity to the first body;
a second body extending through the elastic part and connected to the detector through a circuit.
4. The multi-contact pin damage prevention socket of claim 3, further comprising:
a terminal for mounting a detected body on an upper portion of the housing;
an alignment part closely connected to an upper part of the terminal;
and a pressing part for pressing the terminal of the detected object from the upper part through the alignment part so as to connect the terminal to the shell provided with the probe.
5. The multi-contact pin damage prevention socket of claim 4, further comprising:
an alignment unit to which the terminal of the detected body is attached;
and a pressurizing part for pressurizing the housing with the probe therein from the upper part of the terminal mounted on the aligning part, so that the probe is connected to the terminal of the detected body.
6. A multi-contact socket for preventing pin damage, comprising:
a plurality of probes having a plurality of contact surfaces for making contact with the terminal multicontacts;
a housing disposed perpendicular to the probe;
a compression molding part disposed between the probes protruding into the terminal insertion groove to prevent damage of the probes, the terminal of the housing being inserted into the terminal insertion groove;
the probe comprises a contact end, a first contact surface and a second contact surface are formed on two sides of the contact end, so that multiple contacts are connected to the inner side surface of the connecting pin of the terminal;
the press-molding part is protruded in a shape corresponding to the end of the contact terminal having contact surfaces formed at both sides thereof so as to be recessed inside the connection pin of the terminal by a predetermined depth.
7. The multi-contact pin damage prevention socket of claim 6, wherein the probe comprises:
a contact end forming a plurality of contact surfaces;
the contact end is arranged at the end part of the first main body;
an elastic part for giving elasticity to the first body;
a second body extending through the elastic part and connected to the detector through a circuit.
8. The multi-contact pin damage prevention socket of claim 7, further comprising:
a terminal for mounting a detected body on an upper portion of the housing;
an alignment part closely connected to an upper part of the terminal;
and a pressing part for pressing the terminal of the detected object from the upper part through the alignment part so as to connect the terminal to the shell provided with the probe.
9. The multi-contact pin damage prevention socket of claim 8, further comprising:
an alignment unit to which the terminal of the detected body is attached;
and a pressurizing part for pressurizing the housing with the probe therein from the upper part of the terminal mounted on the aligning part, so that the probe is connected to the terminal of the detected body.
10. A multi-contact socket for preventing pin damage, comprising:
a plurality of probes having a plurality of contact surfaces for making contact with the terminal multicontacts;
a housing disposed perpendicular to the probe;
a compression molding part disposed between the probes protruding into the terminal insertion groove to prevent damage of the probes, the terminal of the housing being inserted into the terminal insertion groove;
the probe, comprising:
a first contact end, one side of which forms a contact surface for contacting with a connection pin of the terminal;
a second contact end, the other side of which forms a contact surface for contacting with a connection pin of the terminal,
the first contact end and the second contact end are provided with contact surfaces which correspond to each other so as to be connected to two sides of one connecting pin respectively;
the press mold part protrudes inward in a shape corresponding to end parts of the first contact end and the second contact end, which are arranged with the contact surfaces facing each other, to cover both sides of the connection pin of the terminal.
11. The multi-contact pin damage prevention socket of claim 10, wherein the probe comprises:
a contact end forming a plurality of contact surfaces;
the contact end is arranged at the end part of the first main body;
an elastic part for giving elasticity to the first body;
a second body extending through the elastic part and connected to the detector through a circuit.
12. The multi-contact pin damage prevention socket of claim 11, further comprising:
a terminal for mounting a detected body on an upper portion of the housing;
an alignment part closely connected to an upper part of the terminal;
and a pressing part for pressing the terminal of the detected object from the upper part through the alignment part so as to connect the terminal to the shell provided with the probe.
13. The multi-contact pin damage prevention socket of claim 12, further comprising:
an alignment unit to which the terminal of the detected body is attached;
and a pressurizing part for pressurizing the housing with the probe therein from the upper part of the terminal mounted on the aligning part, so that the probe is connected to the terminal of the detected body.
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| KR10-2019-0006053 | 2019-01-17 | ||
| KR1020190006053A KR101999521B1 (en) | 2019-01-17 | 2019-01-17 | pin breakage prevention type multi contact socket |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN111446568A true CN111446568A (en) | 2020-07-24 |
Family
ID=67254057
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201910858121.2A Pending CN111446568A (en) | 2019-01-17 | 2019-09-11 | Multi-contact socket capable of preventing pins from being damaged |
Country Status (2)
| Country | Link |
|---|---|
| KR (1) | KR101999521B1 (en) |
| CN (1) | CN111446568A (en) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN112134084A (en) * | 2020-10-15 | 2020-12-25 | 东莞市冠佳电子设备有限公司 | High-precision floating type power supply plug structure |
Families Citing this family (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| KR102188173B1 (en) * | 2020-10-14 | 2020-12-08 | 주식회사 프로이천 | Probe Pin Fixing Structure of Socket Device for Display Panel Inspection |
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| CN203535076U (en) * | 2013-10-16 | 2014-04-09 | 深圳市策维科技有限公司 | Flexible circuit board testing and switching clamp |
| CN206975085U (en) * | 2017-08-04 | 2018-02-06 | 健坤精密科技（深圳）有限公司 | A kind of precision measurement probe |
| CN107850623A (en) * | 2016-06-17 | 2018-03-27 | 欧姆龙株式会社 | Probe |
| KR101903319B1 (en) * | 2018-01-11 | 2018-10-01 | 오므론 가부시키가이샤 | Probe pin, inspection jig, inspection unit and inspection apparatus |
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| KR101173791B1 (en) * | 2009-09-07 | 2012-08-16 | (주)케미텍 | Connector For Test Device |
| KR100999864B1 (en) | 2010-07-06 | 2010-12-09 | 주식회사 케이티엘 | Probe block for the lcd |
| KR101715741B1 (en) * | 2012-06-22 | 2017-03-14 | 리노공업주식회사 | Test socket for electronic components |
| KR101299722B1 (en) * | 2012-06-22 | 2013-08-28 | 디플러스(주) | Inspection socket using bucking pin |
| JP6627655B2 (en) * | 2016-06-17 | 2020-01-08 | オムロン株式会社 | socket |
| KR101920824B1 (en) * | 2017-02-02 | 2018-11-21 | 리노공업주식회사 | A test probe and test socket |
-
2019
- 2019-01-17 KR KR1020190006053A patent/KR101999521B1/en active IP Right Grant
- 2019-09-11 CN CN201910858121.2A patent/CN111446568A/en active Pending
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| CN103155292A (en) * | 2010-06-28 | 2013-06-12 | 莫列斯公司 | Board-to-board connector |
| CN203535076U (en) * | 2013-10-16 | 2014-04-09 | 深圳市策维科技有限公司 | Flexible circuit board testing and switching clamp |
| CN107850623A (en) * | 2016-06-17 | 2018-03-27 | 欧姆龙株式会社 | Probe |
| CN206975085U (en) * | 2017-08-04 | 2018-02-06 | 健坤精密科技（深圳）有限公司 | A kind of precision measurement probe |
| KR101903319B1 (en) * | 2018-01-11 | 2018-10-01 | 오므론 가부시키가이샤 | Probe pin, inspection jig, inspection unit and inspection apparatus |
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| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN112134084A (en) * | 2020-10-15 | 2020-12-25 | 东莞市冠佳电子设备有限公司 | High-precision floating type power supply plug structure |
Also Published As
| Publication number | Publication date |
|---|---|
| KR101999521B1 (en) | 2019-07-12 |
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