KR20210013822A - socket structure for preventing damage of the terminal and the circuit - Google Patents

Abstract

The present invention relates to a probe for preventing damage to a terminal and a circuit, and a pin block structure using the same and, more specifically, to a probe for preventing damage to a terminal and a circuit, which is caused by pressing a terminal pin by the probe above the terminal pin when the probe comes in contact and is circuit-connected to the terminal pin through the upward or downward movement or rotational movement of an inspection socket; and a pin block structure using the same. Moreover, the probe for preventing damage to the terminal and the circuit, which is caused when the probe comes in contact and is circuit-connected to the terminal pin through the upward or downward movement or rotational movement of the inspection socket, comprises: a first contact point part disposed on the upper portion thereof to be circuit-connected to an inspection device; a second contact point part disposed on the lower portion thereof to be circuit-connected to a terminal of an object to be inspected; an elastic part for applying a transverse elasticity to the second contact point part so that the second contact point part rotates toward one side or the other side, thereby transversely coming in contact or released from the terminal pin disposed in the terminal of the object to be inspected; and a pressurizing part protruding from one side or the other side of the second contact point part and pressurized by the upward/downward movement or rotational movement of the inspection socket, thereby rotating the second contact point part.

Description

A probe for preventing damage to a terminal and a circuit, and a pin block structure using the same (socket structure for preventing damage of the terminal and the circuit)

The present invention relates to a probe for preventing damage to a terminal and a circuit, and a pin block structure using the same, and more particularly, when a probe contacts a terminal pin and a circuit is connected through an up/down operation or a rotation operation of an inspection socket. , A probe for preventing damage to a terminal and a circuit caused by pressing a terminal pin from an upper portion thereof, and a pin block structure using the same.

In general, a circuit board composed of electronic devices has many electronic parts arranged, and defects occurring in the process of installing many electronic parts are made by connecting the circuit board electrically to form a circuit, and then determining whether or not there is a defect through an electrical signal. do.

In addition, it is possible to inspect not only the circuit board of the electronic device, but also individual parts in the manufacturing process for defects.

For example, not only the circuit board of the completed wireless communication terminal, but also each individual component such as a display and a camera module constituting the wireless communication terminal is inspected during the manufacturing process.

In other words, not only the finished shape, but also continuous inspection is performed for each part during the manufacturing process.

Such circuit boards and components are configured such that each terminal for circuit connection is arranged so that the inspection socket of the inspection device can be coupled, and inspection as in Korean Patent No. 10-1291871 "Flexible Circuit Board Test Tool" The socket for use makes the probe in contact with the terminal pin disposed on the terminal through an up/down operation or a rotation operation to connect the test object and the test device to the circuit.

Recently, due to the thinning and weight reduction of electronic devices, the size of terminals for inspection and the thickness of circuit boards are becoming extremely thin, and flexible circuit boards have characteristics that are vulnerable to external shocks because the thickness of conductors constituting the circuit is extremely thin.

On the other hand, in the conventional test socket, as shown in FIG. 1 through an up/down operation or a rotation operation, the probe 100 is pressed and pressed against the terminal pin 300a of the terminal 300. Deformation or damage of the terminal pin 300a is caused, and there is a problem in that the circuit 300b of the flexible circuit board disposed below is disconnected as in 300c.

Accordingly, the necessity of developing a technology for preventing damage to terminals, terminal pins, and flexible circuit boards of an object under test has been raised.

Korean Patent Registration No. 10-1291871 "Flexible circuit board test tool"

An object of the present invention was conceived to solve the above-described problems, and circuits the test object and the test apparatus by contacting a probe with a terminal pin disposed on a terminal through an up/down operation or a rotation operation of an inspection socket. When connecting, a probe for preventing damage to a terminal and a circuit caused by pressing a terminal pin by the probe, and a pin block structure using the same.

In order to achieve the above object, a probe for preventing damage to a terminal and a circuit according to the present invention and a pin block structure using the same are provided when the probe contacts the terminal pin and is connected to the circuit through an up/down operation or a rotation operation of the test socket. , In a probe for preventing damage to terminals and circuits, a first contact portion disposed at an upper portion for connection to a circuit with an inspection device, a second contact portion disposed at a lower portion for connection to a circuit with a terminal of the test object, and the The second contact part and the second contact part for imparting lateral elasticity to the second contact part so that the second contact part is rotated to the other side or one side so that the terminal pin disposed inside the terminal of the test object can be contacted or released in the transverse direction. It is characterized in that it comprises a pressing portion protruding to one side or the other side of the portion and pressed by an up/down operation or a rotation operation of the inspection socket to rotate the second contact portion.

In addition, the elastic part is disposed between the first contact part and the second contact part to provide elasticity in a vertical direction between the first contact part and the second contact part, and the first elastic part and the second contact part to the other side or one side. It is characterized in that it is composed of a second elastic portion for imparting elasticity in the transverse direction so that it can be rotated.

In addition, when the second contact portion is protruded to the other side of the second contact portion and the second contact portion is rotated to the other side or one side, the second contact portion further includes a support portion supporting the upper end so that the second contact portion is not lifted above a predetermined height.

In addition, a pin block structure using a probe for preventing damage to a terminal and a circuit according to the present invention includes a probe plate in which at least one probe for preventing damage to a terminal and circuit is vertically arranged, and a terminal arranged on the probe plate. And a cover plate coupled to an upper portion of the probe plate so as to expose the first contact portion of the probe for preventing circuit breakage, terminals arranged on the probe plate, and a probe such that a second contact portion of the probe for preventing damage to the circuit is exposed. Including a floating plate that is coupled to the lower part of the plate so as to be able to move up and down, and presses or releases the pressurization of the probe to prevent damage to the terminal and circuit when the test socket is vertically operated or rotated. It is characterized.

Further, it characterized in that it further comprises an elastic body disposed between the probe plate and the floating plate to elastically support the floating plate downward.

As described above, according to the probe for preventing damage to the terminal and circuit according to the present invention and the pin block structure using the same, the up/down operation or rotation operation of the inspection socket without pressing the terminal pin disposed on the terminal By rotating the probe in the transverse direction through the contact with the side surface of the terminal pin, there is an effect of preventing damage to the terminal and the circuit.

1 is a view showing the damage of the circuit according to the operation of the conventional inspection socket.
2 is a view showing a first embodiment of a probe for preventing damage to a terminal and a circuit according to the present invention.
3 or 4 is a view showing a first embodiment and operation form of a pin block structure using a probe for preventing damage to a terminal and a circuit according to the present invention.
5 is a view showing a second embodiment of a probe for preventing damage to a terminal and a circuit according to the present invention.
6 or 7 is a view showing a second embodiment and operation form of a pin block structure using a probe for preventing damage to a terminal and a circuit according to the present invention.
8 is a view showing a third embodiment of a probe for preventing damage to a terminal and a circuit according to the present invention.
9 is a view showing a third embodiment of a pin block structure using a probe for preventing damage to a terminal and a circuit according to the present invention.

Specific structural or functional descriptions of the embodiments according to the concept of the present invention disclosed in the present specification are merely illustrative for the purpose of describing the embodiments according to the concept of the present invention, and the embodiments according to the concept of the present invention are It may be implemented in various forms and is not limited to the embodiments described herein.

Since the embodiments according to the concept of the present invention can apply various changes and have various forms, embodiments are illustrated in the drawings and will be described in detail in the present specification. However, this is not intended to limit the embodiments according to the concept of the present invention to specific disclosed forms, and includes all changes, equivalents, or substitutes included in the spirit and scope of the present invention.

Terms such as first or second may be used to describe various elements, but the elements should not be limited by the terms. The terms are only for the purpose of distinguishing one component from other components, for example, without departing from the scope of the rights according to the concept of the present invention, the first component may be named as the second component and similarly the second component. The component may also be referred to as a first component.

When a component is referred to as being "connected" or "connected" to another component, it is understood that it is directly connected to or may be connected to the other component, but other components may exist in the middle. Should be. On the other hand, when a component is referred to as being "directly connected" or "directly connected" to another component, it should be understood that there is no other component in the middle. Other expressions describing the relationship between components, such as "between" and "directly between" or "adjacent to" and "directly adjacent to" should be interpreted as well.

Terms used in the present specification are used only to describe specific embodiments, and are not intended to limit the present invention. Singular expressions include plural expressions unless the context clearly indicates otherwise. In the present specification, terms such as "comprise" or "have" are intended to designate the presence of features, numbers, steps, actions, components, parts, or combinations thereof described herein, but one or more other features. It is to be understood that the possibility of addition or presence of elements or numbers, steps, actions, components, parts, or combinations thereof is not preliminarily excluded.

Unless otherwise defined, all terms used herein, including technical or scientific terms, have the same meaning as commonly understood by one of ordinary skill in the art to which the present invention belongs. Terms as defined in a commonly used dictionary should be interpreted as having a meaning consistent with the meaning in the context of the related technology, and should not be interpreted as an ideal or excessively formal meaning unless explicitly defined in this specification. Does not.

Hereinafter, preferred embodiments of the present invention will be described with reference to the accompanying drawings.

2 is a diagram showing a first embodiment of a probe for preventing damage to a terminal and a circuit according to the present invention, and FIG. 3 or 4 is a diagram showing a probe for preventing damage to a terminal and a circuit according to the present invention. FIG. 5 is a diagram showing a first embodiment of a pin block structure and an operation form, and FIG. 5 is a view showing a second embodiment of a probe for preventing damage to a terminal and a circuit according to the present invention, and FIG. 6 or FIG. 7 Is a diagram showing a second embodiment and operation form of a pin block structure using a probe for preventing damage to a terminal and a circuit according to the present invention, and FIG. 8 is a diagram for preventing damage to a terminal and a circuit according to the present invention. A diagram showing a third embodiment of a probe, and FIG. 9 is a diagram showing a third embodiment of a pin block structure using a probe for preventing damage to a terminal and a circuit according to the present invention.

As shown in Figure 2, the probe 100 for preventing damage to the terminal and circuit according to the present invention, the probe 100 is in contact with the terminal pin through the up/down operation or rotation operation of the test socket. When connected, the probe 100 does not press and press the terminal pin 300a of the terminal 300 from the top, but the probe 100 is configured to come into close contact with the side surface of the terminal pin 300a.

To this end, elasticity is imparted to the body 3 between the first contact unit 1 disposed at the top and the second contact unit 2 disposed at the lower portion so that the second contact unit 2 can rotate in the transverse direction. An elastic portion for doing so is arranged.

More specifically, a first contact part 1 disposed at the top for connection to the test device and a circuit through the test socket and a second contact part disposed at the lower part for circuit connection with the terminal 300 of the test object (2) and the second contact part 2 is rotated to the other side or one side so that the terminal pin 300a disposed inside the terminal 300 of the test object can be contacted or released in the transverse direction. (2) At least one elastic portion (4, 5) for imparting lateral elasticity to the second contact portion (2) protrudes to one side or the other side of the test socket by an up/down operation or a rotational operation. It is configured to include a pressing portion 6 that is pressed and rotates the second contact portion 2.

The elastic portion (4, 5) disposed on the body (3), depending on the direction and elastic modulus to impart elasticity, only one is arranged, or two or more such as the first elastic portion (4) and the second elastic portion (5) It may be configured as, and its shape and location may be changed.

In addition, one or more tension grooves 9 may be formed in each of the elastic parts 4 and 5 according to the elastic modulus.

As one of the preferred embodiments, the second embodiment shown in FIG. 2 is a horizontal direction of the second contact part 2 on the upper part of the pressing part 6 that is pressed by an up/down operation or a rotational operation of the inspection socket. A second elastic part 5 for rotation is arranged so that when the pressing part 6 is pressed upward, the second elastic part 5 is rotated to one side and is in close contact with the terminal pin 300a of the terminal 300 It can be configured to be.

Along with this, it further includes a first elastic portion 4 between the first contact portion 1 and the second elastic portion 5, and is vertical between the first contact portion 1 and the second contact portion 2 It may be configured to support elastically against an impact or external force acting in a way.

In addition, the upper portion of the second elastic portion 5 supports the upper portion of the second elastic portion 5 so that the second contact portion 2 can rotate smoothly when the pressing portion 6 is pressed upward. It may be configured to further include a support (7) for doing.

The support part 7 protrudes to the other side of the second contact part 2 so that when the second contact part 2 is rotated to one side, the upper end of the second contact part 2 is not lifted above a certain height. The structure in which the support is supported and the support 7 is supported will be described in more detail with reference to FIGS. 3 and 4 below.

In addition, the second contact portion 2 protrudes to one side of the second contact portion 2 so that it does not rotate more than a certain distance, and is supported on the inner surface of the floating plate (see FIG. 3 or 4) described below. It may be configured to further include a contact end (8).

3 or 4 shows a first embodiment and operation form of the pin block structure 200 using the probe 100 for preventing damage to the terminal and circuit described above, and the terminal according to the present invention and A probe plate 12 in which at least one probe (100, hereinafter referred to as a probe) for preventing breakage of a circuit is vertically arranged and a first contact portion 1 of the probe 100 arranged on the probe plate 12 A probe plate so that the cover plate 11 coupled to the upper portion of the probe plate 12 so as to be exposed through and the second contact portion 2 of the probe 100 arranged on the probe plate 12 penetrate through and are exposed downward A floating plate 13 that is coupled to the lower part of 12 so as to be able to move up and down, and presses the pressing part 6 of the probe 100 upward or releases the pressure when the test socket is vertically or rotated. ).

More specifically, when the pin block is in close contact with the terminal 300 of the test object by the vertical motion or the rotational motion of the test socket, the floating plate 13 is the terminal 300 of the test object. Is supported by the jig of the test socket on which is raised and is lifted by a predetermined height.

In addition, it may be configured to further include an elastic body disposed between the probe plate 12 and the floating plate 13 to elastically support the floating plate 13 downward.

As the floating plate 13 is lifted upward, the pressing portion 14 disposed above the floating plate 13 presses and presses the protruding pressing portion 6 of the probe 100 upward. .

When the pressing portion 6 is pressed, the supporting portion 7 of the probe 100 is supported by the cover plate 11 or the probe plate 12 so that the second contact portion 2 rotates in the transverse direction. It supports the upper portion of the elastic portion (5).

In particular, in the first embodiment of the probe 100 for preventing damage to the terminal and circuit according to the present invention and the pin block structure 200 using the same, the terminal 300 of the test object is disposed on both sides of the inside. For this purpose, the probe 100 is arranged on both sides, so that the probe 100 is inserted between the terminal pins disposed on both sides of the terminal 300 of the test object, and then the probe 1 is placed on both sides. It is preferable to be configured to contact the side surfaces of both terminal pins while spreading.

5 shows a second embodiment of a probe for preventing damage to a terminal and a circuit according to the present invention, and the second contact part 2 rotates in the other direction and is disposed on the terminal 300 of the test object. It is configured to be able to contact the terminal pins.

That is, the shape of the terminal 300 of the test object is a structure suitable for inspection of a terminal in which a terminal pin is formed outside the terminal 300.

More specifically, only one first elastic portion 4 is disposed on the body 3 between the first contact portion 1 and the second contact portion 2, and the first elastic portion 4 is the first It is configured to rotate the second contact part 2 in the transverse direction while elastically supporting an impact or external force acting vertically between the contact part 1 and the second contact part 2.

To this end, the body 3 extends from the first elastic body 4 to the other side in the form of a cantilever, and then the second contact part 2 is disposed downwardly, and the pressing part by the up/down motion or rotational motion of the test socket. When (6) is pressed upward, the second elastic portion 5 is rotated to the other side and is in close contact with the terminal pin 300a formed outside the terminal 300.

That is, as the cantilever-shaped body 3 is rotated upward by pressing of the pressing part 6, the second contact part 2 extending downward integrally from the body 3 is rotated to the other side.

In addition, in order to prevent the upper ends of the body 3 and the second contact part 2 from rotating above a certain height when the pressing part 6 is pressed upwardly on the upper part of the second elastic part 5 It may be configured to further include a support portion 7 for supporting the end of the body 3 and the upper portion of the second elastic portion 5.

The support part 7 protrudes to the other side of the second contact part 2 so that when the second contact part 2 is rotated to one side, the upper end of the second contact part 2 is not lifted above a certain height. It is supported, and the structure in which the support 7 is supported will be described in more detail with reference to FIGS. 6 and 7 below.

In addition, the second contact portion 2 protrudes to the other side of the second contact portion 2 so that the second contact portion 2 does not rotate over a certain distance, and is supported on the inner surface of the floating plate (see FIG. 6 or 7) described below. It may be configured to further include a contact end (8).

6 or 7 shows a second embodiment and operation form of the pin block structure 200 using the probe 100 for preventing damage to the terminals and circuits described above, and is a test socket. As the floating plate 13 is lifted by the vertical motion or rotation of the floating plate 13, the pressing portion 14 disposed above the floating plate 13 presses the protruding pressing portion 6 of the probe 100 upward. When the body 3 is elastically supported by the first elastic portion 4 is lifted, the second contact portion 2 is rotated in the transverse direction.

The support part 7 is supported by the cover plate 11 or the probe plate 12, so that the body 3 is not pressed above a certain height, so that the end of the body 3 and the upper part of the second contact part 2 Will be supported.

In particular, in the second embodiment of the probe 100 for preventing damage to the terminal and circuit according to the present invention and the pin block structure 200 using the same, the terminal 300 of the test object is arranged on both external sides. For this purpose, the probe 100 is arranged on both sides, and the terminal 300 is inserted between the probes 100 so that the probe 100 surrounds the terminal 300 of the object under test. It is preferable that (1) is configured to contact the side surfaces of both terminal pins while being closed from both sides to the center.

8 shows a third embodiment of a probe for preventing damage to a terminal and a circuit according to the present invention, and the second contact portion 2 rotates in the other direction and is disposed on the terminal 300 of the test object. It is configured to be able to contact the terminal pins.

That is, the shape of the terminal 300 of the test object is a structure suitable for inspection of a terminal in which a terminal pin is formed outside the terminal 300.

In more detail, the second elastic portion 5 is disposed between the first elastic portion 4 and the second contact portion 2, and the pressing portion 6 is disposed on the other side, so that the upper portion of the test socket, When the pressing unit 6 is pressed upward by a lower operation or a rotation operation, the second elastic unit 5 is rotated to the other side and is configured to be in close contact with the terminal pin 300a formed outside the terminal 300.

In addition, the upper portion of the second elastic portion 5, the upper portion of the second elastic portion 5 so that when the pressing portion 6 is pressed upward, the second contact portion 2 can be smoothly rotated to the other side. It may be configured to further include a support 7 for supporting the.

The support part 7 protrudes to the other side of the second contact part 2 so that when the second contact part 2 is rotated to one side, the upper end of the second contact part 2 is not lifted above a certain height. Will support you.

In addition, the second contact portion 2 protrudes to the other side of the second contact portion 2 so that the second contact portion 2 does not rotate more than a predetermined distance, and is supported on the inner surface of the floating plate (see FIG. 9) described below ( It may be configured to further include 8).

9 shows a third embodiment of the pin block structure 200 using the probe 100 for preventing damage to the terminals and circuits described above, and an up-down operation or rotation operation of the inspection socket When the floating plate 13 is lifted by the floating plate 13 and the pressing portion 14 disposed on the upper portion of the floating plate 13 presses the protruding pressing portion 6 of the probe 100 upward, the second elastic portion The second contact portion 2 that is elastically supported by (5) is rotated in the transverse direction.

When the pressing portion 6 is pressed, the supporting portion 7 of the probe 100 is supported by the cover plate 11 or the probe plate 12 so that the second contact portion 2 rotates in the transverse direction. It supports the upper portion of the elastic portion (5).

In particular, in the third embodiment of the probe 100 for preventing damage to the terminal and circuit according to the present invention and the pin block structure 200 using the same, the terminal 300 of the test object is disposed on both external sides. For this purpose, the probe 100 is arranged on both sides, and the terminal 300 is inserted between the probes 100 so that the probe 100 surrounds the terminal 300 of the object under test. It is preferable that (1) is configured to contact the side surfaces of both terminal pins while being closed from both sides to the center.

As described above, the present invention has been described based on a preferred embodiment with reference to the accompanying drawings, but it is apparent to those skilled in the art that many various obvious modifications are possible without departing from the scope of the present invention from this description. Accordingly, the scope of the invention should be interpreted by the claims set forth to include examples of such many modifications.

1: 1st contact part
2: second contact part
3: body
4: first elastic part
5: second elastic part
6: pressurization part
7: support
8: close contact
9: Tension groove
11: cover plate
12: probe plate
13: floating plate
14: pressing part
100: probe
200: pin block structure
300: terminal

Claims (5)

In the probe for preventing damage to the terminal and circuit when the probe is connected to a circuit by contacting a terminal pin through an up/down operation or a rotation operation of an inspection socket,
A first contact portion disposed on an upper portion for circuit connection with the inspection device;
A second contact portion disposed under the terminal for circuit connection with the terminal of the test object;
An elastic part for imparting lateral elasticity to the second contact part so that the second contact part is rotated to the other side or one side so that the terminal pin disposed inside the terminal of the test object can be contacted or released in a transverse direction;
It characterized in that it comprises a pressing unit that protrudes to one side or the other side of the second contact unit and is pressed by an up/down operation or a rotation operation of the inspection socket to rotate the second contact unit
Probes to prevent damage to terminals and circuits.
The method of claim 1,
The elastic part
A first elastic portion disposed between the first contact portion and the second contact portion to impart elasticity in the vertical direction between the first contact portion and the second contact portion;
It characterized in that it is composed of a second elastic portion for imparting elasticity in the transverse direction so that the second contact portion can be rotated to the other side or one side.
Probes to prevent damage to terminals and circuits.
The method of claim 1,
It characterized in that it further comprises a support portion for supporting the upper end so that the second contact portion is not lifted above a certain height when the second contact portion is protruded to the other side of the second contact portion and is rotated to the other side or one side.
Probes to prevent damage to terminals and circuits.
A probe plate in which at least one probe for preventing damage to any one terminal and circuit of any one of claims 1 to 3 is vertically arranged;
A cover plate coupled to an upper portion of the probe plate to expose a first contact portion of the probe for preventing damage to the terminals and circuits arranged on the probe plate;
The terminal arranged on the probe plate and the second contact portion of the probe to prevent damage to the circuit are coupled to the lower part of the probe plate so that the second contact portion is exposed, so that the terminal and the terminal during the vertical operation or rotation operation of the inspection socket It characterized in that it comprises a floating plate for pressing or releasing the pressing portion of the probe to prevent breakage of the circuit
Pin block structure using probes to prevent damage to terminals and circuits.
The method of claim 4,
It characterized in that it further comprises an elastic body disposed between the probe plate and the floating plate to elastically support the floating plate downward.
Pin block structure using probes to prevent damage to terminals and circuits.

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