CN111007052A - Measuring device and measuring method for low-damage threshold defect of large-caliber fused quartz glass - Google Patents

Measuring device and measuring method for low-damage threshold defect of large-caliber fused quartz glass Download PDF

Info

Publication number
CN111007052A
CN111007052A CN202010025626.3A CN202010025626A CN111007052A CN 111007052 A CN111007052 A CN 111007052A CN 202010025626 A CN202010025626 A CN 202010025626A CN 111007052 A CN111007052 A CN 111007052A
Authority
CN
China
Prior art keywords
fused quartz
quartz glass
computer
caliber
laser
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
CN202010025626.3A
Other languages
Chinese (zh)
Inventor
王圣浩
李灵巧
刘世杰
倪开灶
邵建达
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Shanghai Institute of Optics and Fine Mechanics of CAS
Original Assignee
Shanghai Institute of Optics and Fine Mechanics of CAS
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Shanghai Institute of Optics and Fine Mechanics of CAS filed Critical Shanghai Institute of Optics and Fine Mechanics of CAS
Publication of CN111007052A publication Critical patent/CN111007052A/en
Pending legal-status Critical Current

Links

Images

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/62Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
    • G01N21/63Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light optically excited
    • G01N21/64Fluorescence; Phosphorescence

Abstract

A measuring device and a measuring method for low-threshold defects of a large-caliber fused quartz element are disclosed, and a system identifies the low-threshold defects on the large-caliber fused quartz element by detecting fluorescence spectra of the defects. Compared with the existing commonly adopted photo-thermal weak absorption measurement method, the method can improve the measurement speed of the low threshold defect by tens of thousands of times.

Description

Measuring device and measuring method for low-damage threshold defect of large-caliber fused quartz glass
Technical Field
The invention relates to the field of measurement of defects of optical elements, in particular to a device and a method for measuring low damage threshold defects of large-caliber fused quartz glass.
Background
The large-caliber fused quartz optical glass is an important base stone of optical components in a strong laser device, and the processing quality of the surface and the sub-surface of the large-caliber fused quartz optical glass directly influences and determines the comprehensive performance indexes (such as peak power, beam quality and the like) of a strong laser system. At present, various types of defects are generated on the surface and the subsurface of fused quartz glass by mainstream fused quartz processing technology, wherein the low damage threshold defect can cause fatal damage to optical components in a strong laser device, so that the improvement of various performances of a strong laser system is seriously restricted, and therefore, the accurate measurement of the low threshold defect on the large-caliber fused quartz processing surface has very important significance.
The existing common method for detecting the low-threshold defect on the processed surface of the small-caliber fused quartz glass is a photo-thermal weak absorption measurement method, but because the area of a single measurement by the method is too small (10 multiplied by 10 mu m), for the large-caliber fused quartz glass (such as 400 multiplied by 400mm), if a measuring mode of two-dimensional point-by-point scanning is adopted, the photo-thermal weak absorption measurement method needs about 50000 hours to complete the measurement of the low-threshold defect in the full caliber of the large-caliber fused quartz glass, and the method is obviously not practical. In view of this, the large-caliber fused quartz component produced at present often does not have the process flow of defect detection, so that in a strong laser device, a plurality of potential safety hazards exist.
Disclosure of Invention
In order to solve the defect that the speed of measuring the low-threshold defect by the existing method is very low, the invention provides the measuring device and the measuring method for the low-threshold defect of the large-caliber fused quartz element, and the measuring device can improve the measuring speed of the existing low-threshold defect by tens of thousands of times.
The technical solution of the invention is as follows:
a measuring device for the low threshold defect of large-caliber fused quartz glass is characterized by comprising a two-dimensional mechanical scanning mechanism, a laser source, a light filter, a spectrometer, a stepping motor controller, a data collector, a laser controller and a computer, the two-dimensional mechanical scanning mechanism is used for placing large-caliber fused quartz glass to be measured, laser emitted by the laser source irradiates the surface of the large-caliber fused quartz glass to be measured, the direction of the fluorescence emitted by the surface defect of the large-caliber fused quartz glass to be detected is sequentially the optical filter and the spectrometer, the output end of the spectrometer is connected with the input end of the computer, the output end of the computer is respectively connected with the control end of the two-dimensional mechanical scanning mechanism through the stepping motor controller, and is connected with the control end of the laser source through the laser controller.
The laser is used for providing an excitation light source for the measuring system, the spectrometer is used for detecting a fluorescence spectrum of a low-threshold defect (through early experimental research, the fact that almost all low-threshold defects have fluorescence peaks at specific wavelength positions on the surface of fused quartz glass is found, therefore, whether the low-threshold defects exist on the surface of a fused quartz sample can be judged in reverse through measuring the fluorescence spectrum), the optical filter is used for filtering out environment stray light with other wavelengths, the two-dimensional scanning mechanism is used for scanning large-caliber fused quartz glass to be measured in two dimensions, the stepping motor controller is used for controlling mechanical movement of the two-dimensional scanning mechanism, the laser controller is used for controlling the laser, the data collector is used for collecting electric signals output by the detector, and the computer is used for achieving automatic measurement and control functions such as hardware control, data collection and data storage.
The method for measuring the large-caliber fused quartz glass low-threshold defect by using the measuring device for the large-caliber fused quartz glass low-threshold defect mainly comprises the following measuring steps:
1) placing the large-caliber fused quartz glass to be detected on the two-dimensional mechanical scanning mechanism, irradiating the surface of the large-caliber fused quartz glass to be detected with laser output by the laser source, and adjusting the spectrometer and the optical filter to align with fluorescence emitted by the surface defect of the large-caliber fused quartz glass to be detected;
2) starting the computer, and under the control of the computer, controlling the two-dimensional mechanical scanning mechanism by the stepping motor controller to move the large-caliber fused quartz glass to be detected to an initial position, wherein laser output by the laser source irradiates the initial position on the surface of the large-caliber fused quartz glass to be detected, N is 1, and the number of positions irradiated by the large-caliber fused quartz glass to be detected by laser scanning is N;
3) under the control of the computer, the laser output by the laser source 3 irradiates on the surface n of the large-caliber fused quartz glass to be detected, and the spectrometer measures the fluorescence spectrum emitted from the surface n of the large-caliber fused quartz glass to be detected and inputs the fluorescence spectrum into the computer;
4) the computer judges whether the position n has a fluorescence spectrum corresponding to the low threshold defect, if so, the computer records the coordinate of the position n, namely the position n has the low threshold defect;
5) the computer controls the two-dimensional mechanical scanning mechanism 1 through the stepping motor controller, moves the large-caliber fused quartz glass to be detected to a position N +1, and enables N to be N +1, and when N is less than or equal to N, the computer returns to the step 3); when N is greater than N, entering the next step;
6) and the computer outputs the coordinates of all the low-threshold defects, namely the measurement and the coordinate positioning of the large-caliber fused quartz glass low-threshold defects are realized in the full-caliber range, and the measurement is finished.
The invention has the following advantages:
compared with the existing photothermal weak absorption measurement method (the size of a single measurement area is about 10 multiplied by 10 microns), the single measurement area of the invention can reach 5 multiplied by 5mm, so the measurement speed can be improved by tens of thousands of times.
Drawings
FIG. 1 is a schematic view of a measuring apparatus for measuring a low threshold defect in large caliber fused silica glass.
Fig. 2 is a schematic diagram of a laser two-dimensional scanning track.
Detailed Description
The invention is described in detail below with reference to the drawings and examples, but the scope of the invention should not be limited thereto.
Example 1:
referring to fig. 1, fig. 1 is a schematic structural diagram of a measuring device for large-caliber fused silica glass low-threshold defects according to the present invention. As can be seen from the figure, the measuring device for the large-caliber fused silica glass low-threshold defect is characterized by comprising a two-dimensional mechanical scanning mechanism 1, a laser light source 3, a light filter 4, a spectrometer 5, a stepping motor controller 6, a data collector 7, a laser controller 8 and a computer 9, wherein the two-dimensional mechanical scanning mechanism 1 is used for placing the large-caliber fused silica glass 2 to be measured, the laser emitted by the laser light source 3 is irradiated on the surface of the large-caliber fused silica glass 2 to be measured, the light filter 4 and the spectrometer 5 are sequentially arranged in the direction of the fluorescence emitted by the surface defect of the large-caliber fused silica glass 2 to be measured, the output end of the spectrometer 5 is connected with the input end of the computer 9, the output end of the computer 9 is respectively connected with the control end of the two-dimensional mechanical scanning mechanism 1 through the stepping motor controller 6, and is connected with the control end of the laser light source 3 through the laser controller 8.
The laser light emitted by the laser light source 3 irradiates the surface of the large-caliber fused quartz glass 2 to be detected, and the fluorescence emitted by the defect on the surface of the large-caliber fused quartz glass 2 to be detected is collected by the spectrometer 5 after the action of the optical filter 4.
The laser controller 8 is used for controlling the laser light source 3.
The data collector 7 is used for collecting the signal output by the spectrometer 5.
The stepper motor controller 6 controls the two-dimensional mechanical scanning mechanism 1.
The working process of the measuring device is as follows:
1) placing the large-caliber fused quartz glass 2 to be detected on the two-dimensional mechanical scanning mechanism 1, irradiating the surface of the large-caliber fused quartz glass 2 to be detected with laser output by the laser source 3, and adjusting the spectrometer 5 and the optical filter 4 to align fluorescence emitted by the surface defect of the large-caliber fused quartz glass 2 to be detected;
2) starting the computer 9, under the control of the computer 9, controlling the two-dimensional mechanical scanning mechanism 1 by the stepping motor controller 6, moving the large-caliber fused quartz glass 2 to be measured to an initial position, irradiating the initial position on the surface of the large-caliber fused quartz glass 2 to be measured by the laser output by the laser source 3, and setting N to 1, wherein the number of positions irradiated by the large-caliber fused quartz glass 2 to be measured in laser scanning is N;
3) under the control of the computer 9, the laser output by the laser source 3 irradiates on the surface n of the large-caliber fused quartz glass 2 to be measured, and the spectrometer 5 measures the fluorescence spectrum emitted from the surface n of the large-caliber fused quartz glass 2 to be measured and inputs the fluorescence spectrum into the computer 9;
4) the computer 9 judges whether a fluorescence spectrum corresponding to the low threshold defect exists at the position n, if so, the computer 9 records the coordinate of the position n, namely the position has the low threshold defect;
5) the computer 9 controls the two-dimensional mechanical scanning mechanism 1 through the stepping motor controller 6, moves the large-caliber fused quartz glass 2 to be detected to a position N +1, and makes N equal to N +1, and when N is less than or equal to N, returns to the step 3); when N is greater than N, entering the next step;
6) and the computer 9 outputs the coordinates of all the low-threshold defects, namely the measurement and the coordinate positioning of the large-caliber fused quartz glass low-threshold defects are realized in the full-caliber range, and the measurement is finished.
Experiments show that the method can improve the measurement speed of the low-threshold defect by tens of thousands of times.
The above-mentioned embodiments are intended to illustrate the objects, technical solutions and advantages of the present invention in further detail, and it should be understood that the above-mentioned embodiments are only exemplary embodiments of the present invention and are not intended to limit the present invention, and any modifications, equivalents, improvements and the like made within the spirit and principle of the present invention should be included in the protection scope of the present invention.

Claims (2)

1. The measuring device is characterized by comprising a two-dimensional mechanical scanning mechanism (1), a laser light source (3), an optical filter (4), a spectrometer (5), a stepping motor controller (6), a data collector (7), a laser controller (8) and a computer (9), wherein the two-dimensional mechanical scanning mechanism (1) is used for placing large-caliber fused quartz glass (2) to be measured, laser emitted by the laser light source (3) irradiates on the surface of the large-caliber fused quartz glass (2) to be measured, the direction of fluorescence emitted by the surface defect of the large-caliber fused quartz glass (2) to be measured is sequentially the optical filter (4) and the spectrometer (5), the output end of the spectrometer (5) is connected with the input end of the computer (9), and the output end of the computer (9) is respectively connected with the stepping motor controller (6) and the two-dimensional mechanical scanner (9) The control end of the structure (1) is connected with the control end of the laser light source (3) through the laser controller (8).
2. The method for measuring the large-caliber fused silica glass low-threshold defect by using the measuring device of the large-caliber fused silica glass low-threshold defect as claimed in claim 1, characterized by comprising the following steps:
1) placing the large-caliber fused quartz glass (2) to be detected on the two-dimensional mechanical scanning mechanism (1), irradiating the laser output by the laser source (3) on the surface of the large-caliber fused quartz glass (2) to be detected, and adjusting the spectrometer (5) and the optical filter (4) to align to the fluorescence emitted by the surface defect of the large-caliber fused quartz glass (2) to be detected;
2) starting the computer (9), wherein under the control of the computer (9), the stepping motor controller (6) controls the two-dimensional mechanical scanning mechanism (1) to move the large-caliber fused quartz glass (2) to be detected to an initial position, laser output by the laser source (3) irradiates the initial position on the surface of the large-caliber fused quartz glass (2) to be detected, the position is N-1, and the number of positions irradiated by the large-caliber fused quartz glass (2) to be detected in a laser scanning mode is N;
3) under the control of the computer (9), the laser output by the laser source (3) irradiates the position n on the surface of the large-caliber fused quartz glass (2) to be measured, and the spectrometer (5) measures the fluorescence spectrum emitted by the position n on the surface of the large-caliber fused quartz glass (2) to be measured and inputs the fluorescence spectrum into the computer (9);
4) the computer (9) judges whether the position n has a fluorescence spectrum corresponding to the low threshold defect, if so, the computer (9) records the coordinate of the position n, namely the position has the low threshold defect;
5) the computer (9) controls the two-dimensional mechanical scanning mechanism (1) through the stepping motor controller (6), moves the large-caliber fused quartz glass (2) to be detected to a position N +1, and enables N to be N +1, and when N is less than or equal to N, the step 3 is returned; when N is greater than N, entering the next step;
6) and the computer (9) outputs the coordinates of all the low-threshold defects, namely the measurement and the coordinate positioning of the large-caliber fused quartz glass low-threshold defects are realized in the full-caliber range, and the measurement is finished.
CN202010025626.3A 2019-10-10 2020-01-10 Measuring device and measuring method for low-damage threshold defect of large-caliber fused quartz glass Pending CN111007052A (en)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
CN2019109571294 2019-10-10
CN201910957129.4A CN110736726A (en) 2019-10-10 2019-10-10 Measuring device and measuring method for low-damage threshold defect of large-caliber fused quartz glass

Publications (1)

Publication Number Publication Date
CN111007052A true CN111007052A (en) 2020-04-14

Family

ID=69269861

Family Applications (2)

Application Number Title Priority Date Filing Date
CN201910957129.4A Pending CN110736726A (en) 2019-10-10 2019-10-10 Measuring device and measuring method for low-damage threshold defect of large-caliber fused quartz glass
CN202010025626.3A Pending CN111007052A (en) 2019-10-10 2020-01-10 Measuring device and measuring method for low-damage threshold defect of large-caliber fused quartz glass

Family Applications Before (1)

Application Number Title Priority Date Filing Date
CN201910957129.4A Pending CN110736726A (en) 2019-10-10 2019-10-10 Measuring device and measuring method for low-damage threshold defect of large-caliber fused quartz glass

Country Status (1)

Country Link
CN (2) CN110736726A (en)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN117705827B (en) * 2024-02-06 2024-04-12 上海强华实业股份有限公司 Method for optimizing quartz glass defect detection based on multivariable fine burning energy consumption

Citations (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2005031076A (en) * 2003-07-09 2005-02-03 Carl-Zeiss-Stiftung Method for quantitatively determining durability of synthetic fused quartz to pulsed laser
CN102680447A (en) * 2012-05-31 2012-09-19 中国科学院上海光学精密机械研究所 Device for detecting defects and laser induced damages of optical material
JP2012197220A (en) * 2005-03-01 2012-10-18 Nikon Corp Method for inspecting synthetic quartz glass molded product, method for inspecting synthetic quartz glass member, and method for manufacturing the synthetic quartz glass member
US20130270458A1 (en) * 2012-04-12 2013-10-17 Government Of The United States, As Represented By The Secretary Of The Air Force All Fiber Coupled Ultraviolet Planar Laser Induced Fluorescence Detection System
CN204855406U (en) * 2015-08-20 2015-12-09 中国工程物理研究院激光聚变研究中心 Fused quartz sublayer microdefect detecting device
CN106066318A (en) * 2016-06-14 2016-11-02 中国科学院长春光学精密机械与物理研究所 A kind of method and device of on-line testing optical element laser damage
CN106596491A (en) * 2016-12-23 2017-04-26 中国科学院光电技术研究所 Apparatus and method for measuring hydroxyl content of UV-grade fused silica material
CN106770128A (en) * 2017-01-11 2017-05-31 中国工程物理研究院激光聚变研究中心 Quick three-dimensional detects the detection means and detection method of subsurface defect of optical element
CN109060816A (en) * 2018-06-13 2018-12-21 中国科学院上海光学精密机械研究所 Fast detection device for defects of membrane and method in heavy-calibre element body

Patent Citations (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2005031076A (en) * 2003-07-09 2005-02-03 Carl-Zeiss-Stiftung Method for quantitatively determining durability of synthetic fused quartz to pulsed laser
JP2012197220A (en) * 2005-03-01 2012-10-18 Nikon Corp Method for inspecting synthetic quartz glass molded product, method for inspecting synthetic quartz glass member, and method for manufacturing the synthetic quartz glass member
US20130270458A1 (en) * 2012-04-12 2013-10-17 Government Of The United States, As Represented By The Secretary Of The Air Force All Fiber Coupled Ultraviolet Planar Laser Induced Fluorescence Detection System
CN102680447A (en) * 2012-05-31 2012-09-19 中国科学院上海光学精密机械研究所 Device for detecting defects and laser induced damages of optical material
CN204855406U (en) * 2015-08-20 2015-12-09 中国工程物理研究院激光聚变研究中心 Fused quartz sublayer microdefect detecting device
CN106066318A (en) * 2016-06-14 2016-11-02 中国科学院长春光学精密机械与物理研究所 A kind of method and device of on-line testing optical element laser damage
CN106596491A (en) * 2016-12-23 2017-04-26 中国科学院光电技术研究所 Apparatus and method for measuring hydroxyl content of UV-grade fused silica material
CN106770128A (en) * 2017-01-11 2017-05-31 中国工程物理研究院激光聚变研究中心 Quick three-dimensional detects the detection means and detection method of subsurface defect of optical element
CN109060816A (en) * 2018-06-13 2018-12-21 中国科学院上海光学精密机械研究所 Fast detection device for defects of membrane and method in heavy-calibre element body

Also Published As

Publication number Publication date
CN110736726A (en) 2020-01-31

Similar Documents

Publication Publication Date Title
CN106770128B (en) Detection device and detection method for rapidly detecting subsurface defects of optical element in three dimensions
CN106383105B (en) Raman spectrum measuring device and method capable of automatically adjusting sample measuring distance
CN103123320B (en) Laser-induced breakdown spectroscopy analysis method and implementation device based on single-light beam splitting
CN101587074B (en) Component analyzer for laser probe micro-area
CN106248347B (en) A kind of MEMS scanning mirror performance parameter measuring system and method
CN201434840Y (en) Laser probe micro-zone composition analyzer
KR101855616B1 (en) Nano raman spectrum analysis apparatus for point-of-care using optical drive
CN110238547A (en) It is a kind of for measuring the system and measurement method of high power laser focal position
CN206348270U (en) Quick three-dimensional detects the detection means of subsurface defect of optical element
CN109632721A (en) A kind of LRSPR- fluorescence imaging parallel detection device and LRSPR chip manufacture method
CN111007052A (en) Measuring device and measuring method for low-damage threshold defect of large-caliber fused quartz glass
CN116359249A (en) Line scanning dark field scattering wafer surface defect detection device and method based on TDI
CN104111241A (en) Linear scanning-based fluorescence confocal detection device
CN105067570A (en) Dual-axis laser differential confocal LIBS (laser-induced breakdown spectroscopy), RS (Raman spectroscopy) and MS (mass spectrometry) imaging method and device
CN102519905A (en) Method for detecting automobile exhaust gas
CN106404189A (en) Method for measuring terahertz beam parameter
CN205844186U (en) A kind of portable capillary pipe electrophoresis laser induced fluorescence detector
CN202522518U (en) Handheld Raman spectrometer focusing device
CN1226611C (en) Multi-photon excitation capillary electrophoresis fluoroscopic detector based on continuous light
CN203824908U (en) Laser-induced breakdown spectroscopy elemental analyzer capable of positioning target spots accurately
CN102297866B (en) Nano-gold quantitative detection analyzer
CN110966929B (en) Laser processing morphological performance time-resolved confocal spectrum measurement method and device
CN113740315A (en) Method and system for accurately positioning laser focusing position of LIBS (laser induced breakdown Spectroscopy) system
CN104048915A (en) Real-time monitoring device and method of optical material and laser interaction process
CN209167131U (en) A kind of signal enhancing collection device in laser induced breakdown spectrograph

Legal Events

Date Code Title Description
PB01 Publication
PB01 Publication
SE01 Entry into force of request for substantive examination
SE01 Entry into force of request for substantive examination
RJ01 Rejection of invention patent application after publication
RJ01 Rejection of invention patent application after publication

Application publication date: 20200414