CN110687324B - Dual-purpose detachable test needle structure - Google Patents
Dual-purpose detachable test needle structure Download PDFInfo
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- CN110687324B CN110687324B CN201810732627.4A CN201810732627A CN110687324B CN 110687324 B CN110687324 B CN 110687324B CN 201810732627 A CN201810732627 A CN 201810732627A CN 110687324 B CN110687324 B CN 110687324B
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/06—Measuring leads; Measuring probes
- G01R1/067—Measuring probes
- G01R1/06711—Probe needles; Cantilever beams; "Bump" contacts; Replaceable probe pins
- G01R1/06733—Geometry aspects
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Abstract
The invention provides a dual-purpose detachable test needle structure for carrying out electrical detection on an object to be detected. One end of the body is provided with at least one first rotary clamping part, and the body is hollow and is used for accommodating the probe; the detection joint is hollow, one end of the detection joint is provided with at least one second rotary clamping part corresponding to the first rotary clamping part so that the body and the detection joint can be mutually clamped and assembled or disassembled in a rotary mode, the other end of the detection joint is provided with an electric contact part and a through hole, the through hole is used for a probe to penetrate out, and the electric contact part is in contact with an object to be detected to form conduction, so that the replacement speed can be effectively improved, and the detection joint has enough rigidity and collimation after being assembled and is favorable for the test structure to press down to detect the electric state of the object to be detected.
Description
Technical Field
The present invention relates to an electrical testing structure, and more particularly, to a dual-purpose detachable testing probe structure capable of being disassembled and assembled quickly and facilitating replacement of a corresponding testing probe according to a testing requirement, thereby improving a testing rate and efficiency.
Background
In order to know whether the electrical state of various electronic products meets the requirement, the electrical detection needle can be used as a detection tool. The single electrical detection pin has a detection function, but the actual electronic product has a large number of electrical contacts to be detected, so that a large number of electrical detection pins are often required to be installed on the detection machine to improve the overall detection rate.
Generally, the electrical detection pin is a device disposed on the machine for electrically connecting to the electronic product to be detected, and the whole structure is integrally formed, one end of the electrical detection pin is in contact with the product to be detected, and the other end of the electrical detection pin is mounted on the machine by welding and fixing wires, so as to detect electrical parameters such as current state of the product to be detected. The machine for detecting the electronic products is mostly divided into a plurality of loading areas according to different electrical detection requirements, a large number of electrical detection needles are arranged in each loading area, and the electronic products can be moved to each loading area one by one to carry out corresponding detection.
However, in practical detection applications, based on the requirements of detection accuracy and safety, the electrical detection pins need to be replaced after being used for a certain number of times, and since each loading area of the machine is provided with a large number of electrical detection connectors, which is tens of or more than ten thousands, and is limited by the integrally formed structure of the electrical detection connectors, the welding wires need to be cut or removed during disassembly and replacement, then the electrical detection pins are taken down, and then wire welding and jointing operations need to be performed when new electrical detection pins are replaced, which is quite inconvenient, and needs to consume a large amount of labor cost and time cost. On the other hand, when each loading area of the inspection machine needs to be replaced to the electrical inspection pin with the corresponding specification according to different products to be inspected, the inspection machine also suffers from the dilemma of consuming a large amount of cost.
Accordingly, the present inventors have integrated the experience of related industries for many years, and have conceived a dual-purpose detachable test pin structure, so as to solve the current defects in electrical testing.
Disclosure of Invention
An objective of the present invention is to provide a dual-purpose detachable testing needle structure, so as to effectively reduce the time required for replacement, and quickly replace the required connector according to the specification and type of the object to be tested, thereby greatly improving the applicability.
To achieve the above object, the present invention discloses a dual-purpose detachable testing needle structure for performing electrical testing on an object to be tested, comprising: a body, one end of which is provided with at least one first rotary clamping part, and the body is hollow and is used for accommodating the probe; and a detection joint which is hollow, one end of the detection joint is provided with at least one second rotary clamping part corresponding to the first rotary clamping part so that the body and the detection joint can be mutually clamped and assembled or disassembled in a rotary mode, the other end of the detection joint is provided with an electric contact part and a through hole, the through hole is used for a probe to penetrate out, and the electric contact part is contacted with an object to be detected so as to form conduction. Therefore, the first rotary clamping part and the second rotary clamping part can be utilized to effectively achieve the purpose of quick assembly and disassembly, the man-hour required for replacing the joint is greatly reduced, and the dual-purpose detachable testing needle structure can be rapidly matched with various specifications of objects to be tested for detection.
In one embodiment, the first rotation locking portion is a sliding hole, the second rotation locking portion is a protruding column, the first rotation locking portion has a locking end and a connection end, and the locking end has a width smaller than that of the connection end, when assembling, the second rotation locking portion is inserted into the first rotation locking portion from the connection end and moves to the locking end, even if the body and the detection connector are mutually assembled and fixed, the detection connector can be quickly and stably assembled or disassembled.
When the number of the second rotary clamping parts is N, the second rotary clamping parts are annularly arranged at equal intervals, the clamping angle of the adjacent second rotary clamping parts is 360/N, and the first rotary clamping part is arranged corresponding to the second rotary clamping part, so that the force is more stably applied during assembly or disassembly, and the phenomenon of axial center deviation can be prevented during detection.
In one embodiment, the electrical contact portion is a plurality of conductive metal strips, and the plurality of conductive metal strips are arranged in a ring shape along the periphery of the through hole, so that the dual-purpose detachable test pin structure can achieve a shunt function through the plurality of conductive metal strips and can be applied to the field of large current detection.
In order to effectively improve the detection efficiency of the dual-purpose detachable test pin structure, in one embodiment, the dual-purpose detachable test pin structure further comprises a conductive elastic sheet, the conductive elastic sheet is arranged on the electrical contact part, the surface of the electrical contact part is provided with a plurality of grooves and a plurality of sharp convex ribs, the plurality of sharp convex ribs are arranged in the area where the plurality of grooves are not arranged, and the plurality of grooves are radially arranged by taking the hole as the center; the conductive elastic sheet is provided with a plurality of guide pins which are arranged in a radial shape corresponding to the plurality of grooves so as to be correspondingly positioned in the plurality of grooves, and when the electrical contact part is in contact conduction with an object to be detected, the plurality of guide pins can slide outwards along the surface of the object to be detected. Therefore, the oxide layer which is formed on the surface of the object to be detected and obstructs the detection can be effectively eliminated through the conductive elastic sheet and the plurality of sharp convex ribs, and the accuracy of the electrical detection is improved.
Preferably, each of the lead portions has two upper sections and a lower section, and the lower section is connected between the two upper sections and is in a concave arc shape, so that when the plurality of lead portions contact the object to be tested, the arc surface of the lower section slides along the surface of the object to be tested, thereby effectively scraping the oxide layer by using the arc surface structure.
In order to facilitate the holding and rotation of the inspection connector, in one embodiment, a plurality of grooves are formed on the outer surface of the inspection connector to facilitate the holding and force application.
Preferably, the detecting connector itself may also have an outer casing and an inner base, the outer casing is sleeved outside the inner base and has a plurality of grooves, and the inner base has the second rotation-locking portion and the electrical contact portion, so as to reduce the replacement cost when the object is damaged.
In addition, in order to facilitate the quick confirmation of the assembly state, the detection joint is provided with an alignment notch, the body is provided with an alignment hole, and after the detection joint is assembled on the body, the alignment notch corresponds to the alignment hole and can be inserted and fixed through a positioning piece.
Preferably, the body is corresponding to an end assembled with the detection joint, and extends into the detection joint after being rotationally assembled with the detection joint, so as to enhance the assembly strength of the body and the detection joint.
In summary, the dual-purpose detachable testing pin structure of the present invention utilizes the detachable structure to effectively increase the replacing operation speed, and the corresponding testing connector can be quickly replaced onto the body according to various specifications of the object to be tested, thereby increasing the applicable scope of the dual-purpose detachable testing pin structure. Moreover, through the structural design of the electrical contact part, the dual-purpose detachable test needle structure can be really applied to large current detection, and further, aiming at an oxide layer which is easy to form on the surface of an object to be tested, the influence of the oxide layer during testing can be prevented through the electrical contact part and the conductive elastic sheet structure, so that the accuracy of electrical detection is improved.
Drawings
Fig. 1 is an exploded view of a dual-purpose detachable test pin structure according to a first embodiment of the present invention.
Fig. 2 is an exploded view of the dual-purpose detachable test pin structure according to the first embodiment of the present invention.
FIG. 3 is an assembly view of the dual-purpose detachable test pin structure according to the first embodiment of the present invention.
FIG. 4 is an assembly view of the dual-purpose detachable test pin structure with a probe according to the first embodiment of the present invention.
FIG. 5 is an assembly view of a dual-purpose detachable test pin structure according to a second embodiment of the present invention.
Fig. 6 is a schematic sectional view of a test joint portion of a dual-purpose detachable test pin structure according to a second embodiment of the present invention.
Description of reference numerals: 1-dual-purpose detachable test needle structure; 10-a body; 101-a first rotation clamping part; 1011-clamping end; 1012-connecting end; 102-alignment holes; 11-a detection junction; 111-a second rotation clamping part; 112-electrical contacts; 1121-grooves; 1122-sharp ribs; 113-holes; 114-a trench; 115-an outer shell; 116-an inner base; 117-alignment gap; 12-a conductive spring; 121-a lead part; 1211-upper section; 1212-a lower section; 2-a probe; 3-positioning piece.
Detailed Description
In order to make the content of the invention clear, please refer to the accompanying drawings, while keeping in mind the following description.
Please refer to fig. 1, 2, 3, and 4, which are an exploded view (a) and an assembled view of a dual-purpose detachable test pin structure and an assembled view of a probe according to a first embodiment of the present invention. The present invention discloses a dual-purpose detachable testing needle structure 1 for performing electrical testing on devices such as ICs, wafers, batteries, etc., which comprises a main body 10 and a testing connector 11. One end of the body 10 has at least one first rotary-locking portion 101, and the body 10 is hollow and can accommodate a probe 2. The end of the body 10 opposite to the end having the first rotation locking portion 101 is provided for being installed at a detection machine, and the body 10 can be fixed on the detection machine generally by a nut and a wire welding manner. One end of the detecting joint 11 is provided with at least one second rotary clamping part 111 corresponding to the first rotary clamping part 101 so as to enable the body 10 and the detecting joint 11 to be mutually clamped and assembled or disassembled in a rotary manner, the other end of the detecting joint 11 is provided with an electric contact part 112 and a through hole 113, the through hole 113 is communicated with the hollow area of the body 10 so as to allow the probe 2 to penetrate out, and the electric contact part 112 is contacted with an object to be detected to form conduction. Thus, the structure of the first rotary-locking portion 101 and the second rotary-locking portion 111 can allow the detection joint 11 to be quickly disassembled or assembled with respect to the body 10, thereby facilitating regular replacement and maintenance according to requirements or replacing the detection joint 11 with corresponding specifications according to different objects to be detected.
If the probe 2 is not disposed on the body 10 according to the detection requirement, the dual-purpose detachable test pin structure 1 can be applied to the electrical detection in the heavy current range, and the electrical contact portion 112 is in contact with the object to be detected, so that the whole dual-purpose detachable test pin structure 1 and the object to be detected form an electrically conductive state, and the detection machine connected to the body 10 can know the electrical state of the object to be detected accordingly. After the probe 2 is placed in the hollow area of the body 10 and the detection probe 11, the sensing detection can be performed at the same time of detecting the large current so as to know other electrical states of the object to be detected, for example, when the object to be detected is a battery, the body 10 and the detection connector 11 can be used to achieve the effect of detecting the current state, and the part of the probe 2 penetrating out can also contact with the object to be detected, so that the probe 2 can confirm the battery state, and further, the dual-purpose detection effect can be achieved, as shown in fig. 4. When the probe 2 is installed on the dual-purpose detachable testing needle structure 1, an insulating member (not shown) can be placed between the probe 2 and the dual-purpose detachable testing needle structure 1 to avoid short circuit.
Particularly, various electrical test structures are designed and manufactured according to the specification and type of the object to be tested, and each test structure is in contact with an electrical contact of the object to be tested, so that the size is very small in practice, and the direct integral molding is mainly performed in the past manufacturing process. In addition, when the object to be tested is electrically tested, the object to be tested is tested through each loading area on the testing machine, and each loading area on the testing machine needs to be provided with a large number of testing structures, and the number of testing structures in each loading area is at least dozens of and hundreds of. Under the current application state, the integrally formed test structure is not convenient to replace, and does not meet the economic cost consideration. For example, after the test structures are manufactured and used according to a certain rarely-seen specification of the object to be tested, if the test structures with the certain specification are not needed, the test structures are not reused, and thus a lot of cost is wasted. The dual-purpose detachable test needle structure 1 of the present invention can effectively solve the defects and inconvenience, achieve the effect of fast rotating assembly and disassembly through the first rotary clamping part 101 and the second rotary clamping part 111, and even when replacing a new test connector 11 or replacing a corresponding test connector 11 according to the specification of an object to be tested, the replacement man-hour of a test machine can be effectively reduced to less than half, and even if part of the test connectors 11 are developed and manufactured only according to rare specific specifications, the cost waste can be greatly reduced relatively to the past. Moreover, the first rotary locking portion 101 and the second rotary locking portion 111 can give consideration to the rigidity of the dual-purpose detachable testing needle structure 1, and the testing connector 11 can be aligned to the object to be tested after being assembled on the body 10, so as to reduce the occurrence of the axle center deviation phenomenon, which is unexpected compared with the prior art. Because of the small size limitation of the dual-purpose detachable test pin structure 1 and the specificity of the application scope, the design needs to consider the condition that the test joint 11 and the body 10 need to be aligned and pressed down and not allowed to shift when being assembled and tested, so that the rotary assembling and disassembling structure and the whole design motivation disclosed herein are different from the structural design of simply seeking rotary assembling and disassembling, and the technical characteristics of the invention for achieving quick assembling and disassembling by using a rotary connection mode cannot be considered easily from other fields.
In detail, the first rotation locking portion 101 is a sliding hole, the second rotation locking portion 111 is a convex column, the first rotation locking portion 101 has a locking end 1011 and a connection end 1012, and the locking end 1011 has a width smaller than that of the connection end 1012, when assembling, the second rotation locking portion 111 passes through the first rotation locking portion 101 from the connection end 1012 and moves to the locking end 1011, even if the main body 10 and the detection connector 11 are assembled and fixed with each other. Of course, the first rotation locking portion 101 can be a convex column, and the second rotation locking portion 111 can be implemented by a sliding hole structure, so that the detecting joint 11 and the body 10 can be tightly and stably assembled. To facilitate the assembly of the first rotation-locking portion 101 and the second rotation-locking portion 111, the top end of the second rotation-locking portion 111 can be spherical, and the locking end 1011 and the connecting end 1012 form a circular state with different diameters corresponding to the top end structure of the second rotation-locking portion 111, i.e. preferably, the diameter of the locking end 1011 is smaller than the diameter of the top end of the second rotation-locking portion 111, and the diameter of the top end of the second rotation-locking portion 111 is smaller than the diameter of the connecting end 1012, so as to facilitate the assembly and fixation. During assembly, the second rotation locking portion 111 is only required to penetrate the connecting end 1012 and move to the locking end 1011 for fixing. The body 10 is corresponding to the end assembled with the detection joint 11, and extends to the inside of the detection joint 11 after being rotationally assembled with the detection joint 11, so as to enhance the fixing strength of the two.
Preferably, when the number of the second rotation-locking portions 111 is N, the second rotation-locking portions 111 are arranged in an equally spaced ring shape, and the clamping angle of the adjacent second rotation-locking portions 111 is 360/N, the first rotation-locking portion 101 is disposed corresponding to the second rotation-locking portion 111. Therefore, the second rotary clamping parts 111 and the first rotary clamping parts 101 arranged at equal intervals can stabilize the detection joint 11 and the body 10 during assembly or disassembly, and prevent the problems that the detection joint 11 is separated from the body 10 due to insufficient assembly strength or the rotation disassembly is not facilitated, and the like. In the present embodiment, three second rotation locking portions 111 and three first rotation locking portions 101 are taken as an example, and the clamping angle of the second rotation locking portions 111 is 120 degrees.
In addition, in order to facilitate the contact with the object to be tested, the electrical contact portion 112 is a plurality of conductive metal strips, the plurality of conductive metal strips are arranged in a ring shape along the periphery of the through hole 113, so that the electrical test can be performed by tightly electrically connecting the plurality of conductive metal strips with the object to be tested, and each conductive metal strip can achieve the effect of shunting, so that the dual-purpose detachable test pin structure 1 can be applied to the test in the heavy current category. Each conductive metal strip may be of a substantially S-shape, such that one end thereof protrudes from the detection connector 11 and the other end thereof is assembled in the detection connector 11.
On the other hand, to facilitate the removal and replacement of the inspection connector 11, the outer surface of the inspection connector 11 may be provided with a plurality of grooves 114 to facilitate the application of force for holding. The grooves 114 can increase the friction force of the tool or hand relative to the detection joint 11, so as to be easier to hold and rotate for applying force, so as to assemble the detection joint 11 on the body 10 or disassemble the detection joint from the body 10.
In addition, the whole detection joint 11 can be an integrated structure, or in view of convenience in replacement, the detection joint 11 can have an outer housing 115 and an inner base 116, the outer housing 115 is sleeved outside the inner base 116 and has a plurality of grooves 114, the inner base 116 has the second rotation locking portion 111 and the electrical contact portion 112, the outer housing 115 and the electrical contact portion 112 can be tightly combined, so that if the detection joint 11 is partially damaged, only the outer housing 115 needs to be replaced, or the inner base 116 needs to be replaced, and the component maintenance cost can be further reduced.
Furthermore, the detecting joint 11 has a pair of alignment notches 117, the main body 10 has a pair of alignment holes 102, and after the detecting joint 11 is assembled to the main body 10, the alignment notches 117 correspond to the alignment holes 102 and can be inserted and fixed by a positioning member 3. Thus, after the detecting joint 11 is fixed to the body 10, the alignment notch 117 and the alignment hole 102 can be used to achieve the effect of confirming that the assembly is completed, and after the positioning element 3 is inserted into the alignment notch 117 and the alignment hole 102, the positioning element 3 can be clamped against the alignment notch 117, so as to prevent the detecting joint 11 from moving.
Please refer to fig. 5 and 6, which are an assembly diagram and a cross-sectional diagram of a testing connector portion of a dual-purpose detachable testing pin structure according to a second embodiment of the present invention. In keeping with the first embodiment, the same detailed technical features are not repeated here, and the same elements are denoted by the same reference numerals. In this embodiment, a conductive elastic piece 12 is further provided, the conductive elastic piece 12 is disposed on the electrical contact portion 112, the surface of the electrical contact portion 112 has a plurality of grooves 1121 and a plurality of sharp ribs 1122, the plurality of sharp ribs 1122 are disposed in the region where the plurality of grooves 1121 are not disposed, the plurality of grooves 1121 are radially arranged with the hole 113 as the center, the conductive elastic piece 12 has a plurality of lead portions 121, the plurality of lead portions 121 are disposed corresponding to the plurality of grooves 1121 to be correspondingly located in the plurality of grooves 1121, and when the electrical contact portion 112 is in contact with an object to be tested, the plurality of lead portions 121 can slide outwards along the surface of the object to be tested. In other words, the contact area between the plurality of leads 121 and the object to be tested is in a non-planar state, so as to achieve the deformation operation of sliding by using the structure. In order to make the dual-purpose detachable testing probe structure 1 have better testing performance, the electrical contact portion 112 is provided with the plurality of sharp protruding ribs 1122 and the conductive elastic sheet 12 on the surface thereof, which is helpful to pierce and scrape the oxide layer formed on the surface of the object to be tested, so that the electrical contact portion 112 and the object to be tested can be electrically conducted. More specifically, when the dual-purpose detachable test pin structure 1 is pressed against and contacts with the object to be tested, the plurality of sharp ribs 1122 can pierce through the oxide layer, and the conductive elastic piece 12 is moved to slide outward along the surface of the object to be tested by the pressure received by the plurality of conductive pins 121 when the electrical contact portion 112 is pressed against the surface of the object to be tested, in combination with the elasticity of the plurality of conductive pins 121, so that the influence of the oxide layer on the electrical conduction of the surface of the object to be tested can be effectively eliminated during the test, and the precision of the test can be improved. The plurality of sharp ribs 1122 can be densely and continuously arranged to form a rough surface structure on the surface of the electrical contact 112 for scraping the oxide layer. Moreover, the electrical contact portion 112 can be detachable relative to the detecting connector 11, in other words, the electrical contact portion 112 can be a base assembled to the detecting connector 11 and the conductive elastic piece 12 is assembled thereon. Therefore, when the electrical contact part 112 is repaired or worn, only the electrical contact part 112 can be replaced, thereby reducing the installation cost of the device.
Preferably, each of the lead parts 121 has two upper sections 1211 and a lower section 1212, and the lower section 1212 is connected between the two upper sections 1211 and has a concave arc shape, so that when the plurality of lead parts 121 contact the object to be tested, the arc surface of the lower section 1212 slides along the surface of the object to be tested. As shown in fig. 6, the upper sections 1211 of each lead portion 121 may be disposed in a substantially horizontal manner, and two ends of the lower section 1212 are respectively connected to the upper sections 1211 and present a concave arc similar to a U shape, such that when the plurality of lead portions 121 contact the object to be tested, the lower section 1212 first contacts the object to be tested, and then the lower section 1212 is deformed and slid by the force, thereby achieving the effect of scraping the oxide layer. The conductive elastic sheet 12 can be assembled with the electrical contact portion 112 through a gasket or the like, so as to enhance the assembling strength of the conductive elastic sheet 12 and prevent the conductive elastic sheet from deviating. In order to highlight the characteristics of the conductive elastic sheet 12 and the electrical contact portion 112, only a portion of the detecting contact 11 is drawn in fig. 6, and the probe 2 is not illustrated.
In summary, the dual-purpose detachable testing pin structure of the present invention utilizes the detachable structure to effectively increase the replacing operation speed, and the corresponding testing connector can be quickly replaced onto the body according to various specifications of the object to be tested, thereby increasing the applicable scope of the dual-purpose detachable testing pin structure. Moreover, through the structural design of the electrical contact part, the dual-purpose detachable test needle structure can be really applied to large current detection, and further, aiming at an oxide layer which is easy to form on the surface of an object to be tested, the influence of the oxide layer during testing can be prevented through the electrical contact part and the conductive elastic sheet structure, so that the accuracy of electrical detection is improved.
The foregoing description is intended to be illustrative rather than limiting, and it will be appreciated by those skilled in the art that many modifications, variations or equivalents may be made without departing from the spirit and scope of the invention as defined in the appended claims.
Claims (4)
1. A dual-purpose detachable testing needle structure for performing electrical detection on an object to be tested is provided, which is characterized by comprising:
a body, one end of which is provided with at least one first rotary clamping part, and the body is hollow and is used for accommodating the probe; and
the detection joint is hollow, at least one second rotary clamping part is arranged at the end face position of one end of the detection joint corresponding to the first rotary clamping part so that the body and the detection joint can be mutually clamped, assembled or disassembled in a rotating mode, the other end of the detection joint is provided with an electric contact part and a through hole, the through hole is used for a probe to penetrate out, and the electric contact part is contacted with an object to be detected to form conduction; the detection joint is provided with a contraposition gap, the body is provided with a contraposition hole, and after the detection joint is assembled to the body, the contraposition gap corresponds to the contraposition hole and can be inserted and fixed through a positioning piece;
the detection joint is provided with an outer shell and an inner base, the outer shell is sleeved outside the inner base and provided with a plurality of grooves, and the inner base is provided with the second rotary clamping part and the electric contact part;
the first rotary clamping part is a sliding hole formed on the end face of the body, the second rotary clamping part is a convex column formed on the end face of the detection joint, the first rotary clamping part is provided with a clamping end and a connecting end, the width of the clamping end is smaller than that of the connecting end, and the second rotary clamping part penetrates through the first rotary clamping part from the connecting end and moves to the clamping end during assembly, so that the body and the detection joint can be mutually assembled and fixed;
the conductive elastic sheet is arranged on the electrical contact part, the surface of the electrical contact part is provided with a plurality of grooves and a plurality of sharp convex ribs, the plurality of sharp convex ribs are distributed in the area without the plurality of grooves, and the plurality of grooves are arranged in a radial shape by taking the through hole as the center; the conductive elastic sheet is provided with a plurality of guide pins which are arranged in a radial shape corresponding to the plurality of grooves so as to be correspondingly positioned in the plurality of grooves, and the plurality of guide pins can slide outwards along the surface of the object to be detected when the electrical contact part is in contact conduction with the object to be detected;
each guide foot part is provided with two upper sections and a lower section, the lower section is connected between the two upper sections and is in a concave arc shape, and therefore when the plurality of guide foot parts are contacted with an object to be measured, the arc surface of the lower section can slide along the surface of the object to be measured.
2. The dual-purpose detachable test pin structure of claim 1, wherein the second rotation locking portions are arranged in an annular shape with equal intervals when the number of the second rotation locking portions is N, the clamping angle of the adjacent second rotation locking portions is 360/N, and the first rotation locking portion is disposed corresponding to the second rotation locking portion.
3. The dual-purpose detachable test pin structure of claim 1 or 2, wherein the outer surface of the test pin is provided with a plurality of grooves to facilitate gripping and applying force.
4. The dual-purpose detachable test pin structure of claim 1 or 2, wherein an end of the body corresponding to the assembling with the test connector extends to the interior of the test connector after being rotatably assembled with the test connector.
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| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201810732627.4A CN110687324B (en) | 2018-07-05 | 2018-07-05 | Dual-purpose detachable test needle structure |
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| CN201810732627.4A CN110687324B (en) | 2018-07-05 | 2018-07-05 | Dual-purpose detachable test needle structure |
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| CN110687324B true CN110687324B (en) | 2023-01-31 |
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| CN1641527A (en) * | 2004-01-09 | 2005-07-20 | 顺德市顺达电脑厂有限公司 | Circuit board fastening unit |
| JP2009042090A (en) * | 2007-08-09 | 2009-02-26 | Sankei Engineering:Kk | Electrically conductive contact pin |
| CN201115131Y (en) * | 2007-08-22 | 2008-09-10 | 英业达股份有限公司 | Card fixing component |
| CN102929354A (en) * | 2011-08-08 | 2013-02-13 | 鸿富锦精密工业（深圳）有限公司 | Hard disk fixing device |
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| CN110687324A (en) | 2020-01-14 |
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