TWM565798U - Dual-use detachable test pin structure - Google Patents

Abstract

The present invention provides a dual-purpose detachable test pin structure for electrical detection of a test object, including a body and a test joint. The first end of the body has at least one first card portion, and the system is hollow for receiving the probe; the detecting connector is hollow, and one end of the detecting connector is provided with at least one second corresponding to the first card portion The card portion is rotated so that the body and the detecting joint can be assembled or disengaged in a rotatable manner, and the other end of the detecting joint has an electrical contact portion and a through hole, and the through hole is for the probe to pass through, and the electrical contact portion Then, it is contacted with the object to be tested to form a conduction, thereby effectively improving the replacement rate, and having sufficient rigidity and collimation after assembly to facilitate the test structure to detect the electrical state of the object under test.

Description

Dual-use detachable test pin structure

This creative department is related to the field of electrical test structures, especially a detachable test pin structure that can be quickly disassembled and assembled, and which facilitates the replacement of the corresponding test probe according to the detection requirements, thereby improving the detection rate and performance.

In order to facilitate the knowledge of whether the electrical status of various electronic products is in compliance with the requirements, it is generally possible to use the articles such as electrical test pins as test instruments. A single electrical detection needle itself has a detection function. However, the actual number of electrical contacts to be detected in an electronic product is often required to install a large number of electrical detection needles on the inspection machine to increase the overall detection rate.

Generally speaking, the electrical detecting needle refers to a device that is disposed on the machine table for electrical connection with the electronic product to be tested, and the whole is an integrally formed structure, one end is in contact with the product to be tested, and the other end is transmitted through the wire. The welding is fixed on the machine, and the current status and other electrical parameters of the product to be tested can be verified. According to different electrical detection requirements, the machine for detecting electronic products is mostly divided into a plurality of load zones. In each load zone, a large number of electrical test pins are arranged, and the electronic products can be moved one by one to each load zone. Corresponding detection.

However, in actual application, based on the detection accuracy and safety requirements, the electrical detection needle must be replaced after a certain number of uses. Since the machine has a large number of electrical detection joints in each load zone, More than tens of thousands, and limited by the structure of the electrical detection joint, so the welding wire should be cut off or removed during the removal and replacement, and then the electrical detection needle is removed, and then replaced with new electrical properties. When the needle is detected, the wire bonding work needs to be performed, which is rather inconvenient and requires a lot of labor and time costs. On the other hand, when the tester's various load areas need to be replaced with corresponding electrical test pins in response to different products to be tested, the same problem is encountered that requires a large amount of cost.

In view of this, the inventors have accumulated years of experience in related industries, and conceived a dual-use detachable test pin structure, which can solve the current lack of electrical detection.

One of the aims of this creation is to provide a dual-use detachable test pin structure to effectively reduce the time required for replacement work, and to quickly replace the required joints according to the type of the test object, thereby greatly improving the applicability.

In order to achieve the above object, the present invention discloses a dual-purpose detachable test pin structure for electrical detection of an object to be tested, comprising: a body having at least one first card portion at one end thereof, and the system is Hollow for receiving the probe; and a detecting joint, which is hollow, and one end of the detecting joint is provided with at least one second screw portion corresponding to the first screw portion, so that the body and the detecting joint The other end of the detecting joint has an electrical contact portion and a through hole, and the through hole is for the probe to pass through, and the electrical contact portion is in contact with the object to be tested. To form a conduction. Thereby, the first card portion and the second card portion can be effectively used for quick disassembly and assembly, the working time required for replacing the connector is greatly reduced, and the dual-purpose detachable test pin structure can be thereby obtained. Quickly match the specifications of various types of objects to be tested.

In one embodiment, the first card portion is a sliding hole, the second card portion is a protrusion, and the first card portion has a fastening end and a connecting end, and the fastening end is The width is smaller than the width of the connecting end, and the second card portion is inserted into the first card portion from the connecting end and moved to the locking end, even if the body and the detecting joint are fixed to each other. Thereby, the detection joint can be assembled or disassembled quickly and stably.

Wherein, when the number of the second card-shaped portions is N, they are arranged at equal intervals in a ring shape, and the angle of the adjacent second card-clamping portions is 360/N, and the first card-clamping portion is Then, the second card portion is disposed, so that the force is more stably applied during assembly or disassembly, and the phenomenon of axial misalignment can be further prevented during the detection process.

In one embodiment, the electrical contact portion is a plurality of conductive metal strips arranged in a ring shape along the circumference of the perforation, whereby the dual-purpose detachable test needle structure is permeable to the Conductive metal strips achieve shunting and can be used in high current sensing applications.

In an embodiment, the dual-purpose detachable test pin structure further has a conductive elastic piece, and the conductive elastic piece is disposed at the electrical contact portion, and the electric device is provided for the purpose of effectively improving the detection performance of the dual-purpose detachable test pin structure. The surface of the contact portion has a plurality of grooves and a plurality of sharp ribs, and the sharp ribs are disposed in a region where the grooves are not provided, and the grooves are radially arranged around the hole; the conductive The elastic piece has a plurality of guiding legs, and the guiding legs are arranged such that the grooves are radially arranged to be correspondingly placed in the grooves, and when the electrical contact is in contact with the object to be tested, The guide legs are slidable outward along the surface of the object to be tested. Thereby, the conductive elastic piece and the sharp ribs can effectively eliminate the formation of an oxide layer on the surface of the object to be detected, thereby improving the accuracy of the electrical detection.

Preferably, each of the guiding portions has a second upper portion and a lower portion, and the lower portion is connected between the upper portions and has a concave arc shape, so that the guiding portions and the object to be tested are When contacting, the arc surface of the lower section slides along the surface of the object to be tested to effectively scrape off the oxide layer by the curved surface structure.

In order to facilitate the rotation of the detecting joint, in an embodiment, the outer surface of the detecting joint is provided with a plurality of grooves to facilitate the holding force.

Preferably, the detecting connector itself has an outer casing and an inner base. The outer casing is sleeved on the outer side of the inner base and has a plurality of grooves, and the inner base has the second screw portion and The electrical contact portion can thereby reduce the replacement cost when the article is damaged.

In addition, in order to facilitate quick confirmation of the assembled state, the detecting joint has a pair of bit gaps, and the body has a pair of bit holes. When the detecting joint group is disposed on the body, the alignment notch corresponds to the matching hole system. It can be inserted and fixed through a positioning member.

Preferably, the end of the body corresponding to the detecting joint is extended to the inside of the detecting joint after being rotated and assembled with the detecting joint to enhance the assembly strength of the body and the detecting joint.

In summary, the dual-use detachable test pin structure of the present invention utilizes a detachable group structure to effectively increase the replacement operation rate, and can quickly replace the corresponding test connector according to various specifications of the object to be tested. Up to the body, the scope of application of the dual-use detachable test pin structure can be improved. Moreover, through the structural design of the electrical contact portion, the dual-use detachable test pin structure can be surely applied to large current detection, and further, for an oxide layer which is easily formed on the surface of the object to be tested, The electrical contact portion and the conductive elastic structure prevent the influence of the oxide layer on the test, and further improve the accuracy of the electrical detection.

In order for your review board to have a clear understanding of the content of this creation, please use the following instructions to match the drawings.

Please refer to Figures 1, 2, 3 and 4, which are schematic exploded view (1), exploded view (II), assembled schematic diagram and probe provided for the dual-use detachable test pin structure of the first embodiment of the present invention. Assembly diagram. The present invention discloses a dual-purpose detachable test pin structure 1 for electrical detection of components such as ICs, wafers, batteries, and the like, including a body 10 and a detecting joint 11. One end of the body 10 has at least one first card portion 101, and the body 10 is hollow to accommodate a probe 2. The body 10 is opposite to the end of the first card portion 101 for mounting on the detecting machine. Generally, the body 10 can be fixed to the detecting machine by means of welding of nuts and wires. One end of the detecting connector 11 is provided with at least one second card portion 111 corresponding to the first card portion 101, so that the body 10 and the detecting connector 11 can be assembled or disengaged in a rotatable manner with each other. The other end of the 11 has an electrical contact portion 112 and a through hole 113. The through hole 113 communicates with the hollow region of the body 10 for the probe 2 to pass through. The electrical contact portion 112 is in contact with the object to be tested. To form a conduction. Thereby, through the structure of the first card portion 101 and the second card portion 111, the detecting joint 11 can be quickly disassembled or assembled relative to the body 10, thereby facilitating replacement of maintenance according to requirements, or following the requirements. The detecting joint 11 of the corresponding specification is replaced by the difference of the object to be tested.

According to the detection requirement, if the probe 10 is not placed, the body 10 can be applied to electrical detection such as a large current range, and the electrical contact portion 112 is used to contact the object to be tested. The detachable test pin structure 1 integrally forms an electrical conduction state with the object to be tested, and is connected to the detecting machine of the body 10 to thereby understand the electrical state of the object to be tested. When the probe 2 is placed in the hollow area of the body 10 and the detecting probe 11, the sensing detection can be performed together with the high current detection to know other electrical states of the object to be tested, for example, the object to be tested is a battery. In addition to the utility of the body 10 and the detecting connector 11 for the current state detection, the portion of the probe 2 that is pierced is also in contact with the object to be tested, and the probe 2 can confirm the battery state, and further Can have dual-use detection, as shown in Figure 4. When the probe 2 is mounted on the dual-use detachable test pin structure 1, in order to avoid short circuit, an insulating member can be placed between the probe 2 and the detachable test pin structure 1 (in the figure) Not shown).

In particular, all types of electrical test structures are designed to correspond to the specifications and types of the object to be tested, and each test structure is provided for contact with the electrical contacts of the object to be tested, so that the dimensions are substantially equivalent. Tiny, in the past, when manufacturing, they are mainly oriented directly into one. In addition, when the electrical property is to be tested, it is tested by each loading area on the testing machine, and a large number of test structures must be installed in each loading area of the testing machine, and at least the number of test structures in each carrying area is Ten hundred or more. Under the premise of the current application state, the integrated test structure has great inconvenience in replacement, and it does not meet the economic cost considerations. For example, when the test structure is manufactured and used for a rare specific test object specification, if the test structure of the specification is no longer needed, the test structures are not reused, thereby causing a large amount of cost waste. The dual-purpose detachable test pin structure 1 of the present invention can effectively solve the defects and inconveniences, and achieve the effects of rapid rotation assembly and disassembly through the first card portion 101 and the second card portion 111. When the new detecting joint 11 is replaced or the corresponding detecting joint 11 is replaced according to the specification of the object to be tested, the replacement working time of the detecting machine can be effectively reduced to less than half, and even if the detecting joint 11 is only for rare The development and manufacture of specific specifications can also significantly reduce the cost waste compared to the past. And the structure of the first card portion 101 and the second card portion 111 can balance the rigidity of the dual-use detachable test pin structure 1 and allow the detecting connector 11 to be assembled to the body 10 The detection of the object to be tested is collimated to reduce the occurrence of the axial shift phenomenon, and has an unpredictable effect compared to the conventional technique. Due to the small size limitation of the dual-purpose detachable test pin structure 1 and the particularity of the application range, it is necessary to consider the need to collimate and press down when the test joint 11 and the body 10 are assembled and tested. The condition of the offset is based on the structure and overall design motivation of the rotating assembly and disassembly disclosed herein, which is different from the structural design that simply seeks to rotate and assemble and disassemble, so that it is determined that the creation is achieved by screwing. The technical features of rapid assembly and disassembly are easily considered from other fields.

In detail, the first card portion 101 is a sliding hole, the second card portion 111 is a protruding post, and the first card portion 101 has a locking end 1011 and a connecting end 1012, and the card The width of the fixed end 1011 is smaller than the width of the connecting end 1012. The second card portion 111 is inserted into the first card portion 101 from the connecting end 1012 and moved to the locking end 1011 even after assembly, even if The body 10 and the detecting joint 11 are assembled and fixed to each other. Of course, the first card portion 101 can be a protruding post, and the second card portion 111 can be implemented corresponding to the structure of the sliding hole. Similarly, the detecting joint 11 can be tightly and stably assembled with the body 10. And in order to facilitate the combination of the first card portion 101 and the second card portion 111, the top end of the second card portion 111 may be spherical, and the locking end 1011 and the connecting end 1012 correspond to the first The top end of the second card portion 111 is formed into a circular shape having unequal diameters, that is, preferably, the diameter of the locking end 1011 is smaller than the diameter of the top end of the second card portion 111, and the second card portion is The diameter of the top end of the 111 is smaller than the diameter of the connecting end 1012 to facilitate assembly and fixation. During assembly, the second card portion 111 only needs to be inserted into the connecting end 1012 and moved to the locking end 1011 to be fixed. The body 10 corresponding to the end of the detecting joint 11 is rotated and assembled to the detecting joint 11 to extend inside the detecting joint 11 to strengthen the fixing strength of the joint.

Preferably, when the number of the second card portions 111 is N, they are arranged at equal intervals in a ring shape, and the angle of the adjacent second card portions 111 is 360/N. The first card portion 101 is disposed corresponding to the second card portion 111. Therefore, the second screw portion 111 and the first card portion 101 disposed at equal intervals can make the detecting joint 11 and the body 10 more stable during assembly or disassembly, thereby preventing insufficient assembly strength. The detecting joint 11 is detached from the body 10, or is disadvantageous for problems such as rotational disassembly. In this embodiment, three second card portions 111 and three first card portions 101 are provided as an example, and the angles of the second card portions 111 are 120 degrees.

In addition, in order to facilitate contact with the object to be tested, the electrical contact portion 112 is a plurality of conductive metal strips, and the conductive metal strips are arranged in a ring shape along the circumference of the through hole 113, thereby transmitting the conductive metal strips. The electrical connection between the test object and the test object can be performed to perform the required electrical test, and each of the conductive metal strips can achieve the function of shunting, so that the dual-purpose detachable test pin structure 1 can be applied to the high current range. Test. Each of the conductive metal strips may be slightly S-shaped with one end protruding from the detecting joint 11 and the other end being disposed in the detecting joint 11.

On the other hand, in order to facilitate the disassembly and replacement of the detecting joint 11, the outer surface of the detecting joint 11 may be provided with a plurality of grooves 114 to facilitate the holding force. The frictional force of the tool or the hand relative to the detecting joint 11 can be improved through the grooves 114, and the force is more easily grasped and rotated to assemble the detecting joint 11 to the body 10 or unload from the body 10. except.

In addition, the detecting joint 11 as a whole may be an integrally formed structure, or in view of the convenience of replacement, the detecting joint 11 may have an outer casing 115 and an inner base 116, and the outer casing 115 is sleeved on the inner base. The outer surface of the housing 116 has a plurality of grooves 114, and the inner base 116 has the second card portion 111 and the electrical contact portion 112. The outer housing 115 and the electrical contact portion 112 can be combined in a tight manner. Therefore, if the detecting joint 11 is partially damaged, only the outer casing 115 needs to be replaced or the inner base 116 is replaced, and the component maintenance cost can be further reduced.

Further, the detecting joint 11 has a pair of bit notches 117, and the body 10 has a pair of bit holes 102. When the detecting joint 11 is assembled to the body 10, the alignment notch 117 is in phase with the matching hole 102. Correspondingly, it can be inserted and fixed through a positioning member 3. Therefore, after the detecting connector 11 is fixed to the body 10, the alignment notch 117 and the alignment hole 102 can be used to confirm the function of the setting, and the positioning member 3 is inserted into the alignment notch 117 and After the alignment hole 102, the positioning member 3 can be engaged with the alignment notch 117 to avoid displacement of the detecting joint 11.

Please refer to FIGS. 5 and 6 for the assembly diagram of the dual-purpose detachable test pin structure of the second embodiment of the present invention and a schematic cross-sectional view of the test joint. The details of the first embodiment are the same as those of the detailed description, and the same components are denoted by the same reference numerals. In this embodiment, a conductive elastic piece 12 is further disposed on the electrical contact portion 112, and the surface of the electrical contact portion 112 has a plurality of grooves 1121 and a plurality of sharp ribs 1122. The sharp edges are sharp. The ribs 1122 are disposed in a region where the grooves 1121 are not provided. The grooves 1121 are radially arranged around the hole 113. The conductive elastic piece 12 has a plurality of leg portions 121, and the leg portions are The 121-shaped pair of the corresponding recesses 1121 are disposed so as to be corresponding to the recesses 1121, and when the electrical contact portion 112 is in contact with the object to be tested, the lead-leg portions 121 can be along the surface of the object to be tested. Sliding outside. In other words, the guiding portions 121 are in a non-planar state for the area in contact with the object to be tested, so as to achieve the sliding deformation action by using the structure. In order to make the dual-purpose detachable test pin structure 1 have better detection performance, the surface of the electrical contact portion 112 is provided with the sharp ribs 1122 and the conductive elastic piece 12 to facilitate piercing and scraping. The oxide layer on the surface of the object to be tested is such that the electrical contact portion 112 and the object to be tested reliably form an electrically conductive state. More specifically, when the dual-purpose detachable test pin structure 1 is pressed against the object to be tested, the sharp ribs 1122 can pierce the oxide layer, and the conductive elastic piece 12 is transmitted through the lead portions. The pressure received by the electrical contact portion 112 when pressed against the surface of the object to be tested is combined with the elasticity of the leg portions 121 to achieve an outward sliding movement along the surface of the object to be tested. During the test, the influence of the surface oxide layer of the object to be tested on the electrical conduction is effectively eliminated, and the accuracy of the detection is improved. The sharp ribs 1122 can be arranged in a densely connected manner so that the surface of the electrical contact portion 112 forms an approximately rough surface structure, so as to achieve the effect of scraping off the oxide layer. The electrical contact portion 112 is detachable from the detecting joint 11 . In other words, the electrical contact portion 112 can be externally assembled to the detecting joint 11 and assembled thereon. Conductive elastic piece 12. Therefore, when the repair or the electrical contact portion 112 is worn out, only the electrical contact portion 112 can be replaced to reduce the component installation cost.

Preferably, each of the guiding portions 121 has a second upper portion 1211 and a lower portion 1212. The lower portion 1212 is connected between the upper portions 1211 and has a concave arc shape, thereby making the guiding legs When the portion 121 is in contact with the object to be tested, the curved surface of the lower portion 1212 slides along the surface of the object to be tested. As shown in FIG. 6, the upper sections 1211 of the guide legs 121 are slightly horizontally disposed, and the ends of the lower section 1212 are respectively connected to the upper section 1211 and present an approximate U. a concave arc of the type, whereby when the guiding portion 121 is in contact with the object to be tested, the lower portion 1212 is firstly in contact with the object to be tested, and then the lower portion 1212 is subjected to force and deformation to slip. The effect of scraping off the oxide layer. The conductive elastic piece 12 is permeable to the electrical contact portion 112 through an object such as a gasket to strengthen the assembly strength of the conductive elastic piece 12 to avoid offset. In addition, in order to highlight the features of the conductive elastic piece 12 and the electrical contact portion 112, only part of the detecting joint 11 is drawn in FIG. 6, and the probe 2 is not illustrated.

In summary, the dual-use detachable test pin structure of the present invention utilizes a detachable group structure to effectively increase the replacement operation rate, and can quickly replace the corresponding test connector according to various specifications of the object to be tested. Up to the body, the scope of application of the dual-use detachable test pin structure can be improved. Moreover, through the structural design of the electrical contact portion, the dual-use detachable test pin structure can be surely applied to large current detection, and further, for an oxide layer which is easily formed on the surface of the object to be tested, The electrical contact portion and the conductive elastic structure prevent the influence of the oxide layer on the test, and further improve the accuracy of the electrical detection.

However, the above descriptions are only for the preferred embodiment of the present invention and are not intended to limit the scope of the present invention; therefore, the equivalent changes and modifications made without departing from the spirit and scope of the present invention should be Within the scope of this creation's patent.

1‧‧‧Two-use detachable test needle structure
10‧‧‧ Ontology
101‧‧‧The first card
1011‧‧‧Kartian
1012‧‧‧Connected end
102‧‧‧ alignment hole
11‧‧‧Detection joint
111‧‧‧Second card
112‧‧‧Electrical contact
1121‧‧‧ Groove
1122‧‧‧ Sharp ribs
113‧‧‧ holes
114‧‧‧ trench
115‧‧‧Outer casing
116‧‧‧ Inner base
117‧‧‧ alignment gap
12‧‧‧Electrical shrapnel
121‧‧‧Leading
Upper section of 1211‧‧
1212‧‧‧Next section
2‧‧‧ probe
3‧‧‧ Positioning parts

Fig. 1 is an exploded perspective view (1) of the structure of the dual-use detachable test pin of the first embodiment of the present invention. Fig. 2 is an exploded perspective view (2) of the structure of the dual-purpose detachable test pin of the first embodiment of the present invention. Fig. 3 is a schematic view showing the assembly of the dual-use detachable test pin structure of the first embodiment of the present invention. Fig. 4 is a schematic view showing the assembly of a probe provided in the structure of the dual-purpose detachable test pin according to the first embodiment of the present invention. Fig. 5 is a schematic view showing the assembly of the dual-purpose detachable test pin structure of the second embodiment of the present invention. Figure 6 is a cross-sectional view showing a portion of the dual-use detachable test pin structure detecting joint of the second embodiment of the present invention.

Claims (10)

The utility model relates to a dual-purpose detachable test pin structure, which is electrically detected for an object to be tested, comprising: a body having at least one first screwing portion at one end thereof, and the system is hollow for receiving the probe And a detecting joint is hollow, and one end of the detecting joint is provided with at least one second screw portion corresponding to the first screw portion, so that the body and the detecting joint can be coupled to each other in a rotatable manner. Alternatively, the other end of the detecting connector has an electrical contact portion and a through hole for the probe to pass through, and the electrical contact portion is in contact with the object to be tested to form a conductive. The dual-use detachable test pin structure according to the first aspect of the invention, wherein the first card portion is a sliding hole, the second card portion is a protrusion, and the first card portion has a card fixing end and a connecting end, and the width of the fixing end is smaller than the width of the connecting end, and the second card portion is inserted into the first card portion from the connecting end and moved to the card during assembly After the solid end, even the body and the detecting joint are fixed to each other. The dual-use detachable test pin structure according to claim 2, wherein when the number of the second card-clamping portions is N, they are arranged at equal intervals in a ring shape, and adjacent to the second The clamping angle of the card portion is 360/N, and the first card portion corresponds to the second card portion. The dual-use detachable test pin structure of claim 2, wherein the electrical contact portion is a plurality of conductive metal strips, and the conductive metal strips are arranged in a ring shape along a circumference of the perforation. The detachable test pin structure of claim 2, further comprising a conductive elastic piece, wherein the conductive elastic piece is disposed on the electrical contact portion, and the surface of the electrical contact portion has a plurality of grooves and plural a sharp rib, the sharp ribs are disposed in a region where the grooves are not provided, and the grooves are radially arranged around the hole; the conductive elastic piece has a plurality of guide legs, and the guide pins The pair of grooves are radially disposed so as to be correspondingly located in the grooves, and when the electrical contact portion is in contact with the object to be tested, the leg portions are outwardly along the surface of the object to be tested. Slip. The dual-use detachable test pin structure according to claim 5, wherein each of the guide legs has two upper sections and a lower section, and the lower section is connected between the upper sections. And the concave surface is concave, so that when the guiding portions are in contact with the object to be tested, the curved surface of the lower portion can slide along the surface of the object to be tested. The dual-use detachable test pin structure according to any one of claims 1 to 6, wherein the outer surface of the detecting joint is provided with a plurality of grooves to facilitate the holding force. The dual-use detachable test pin structure according to any one of claims 1 to 6, wherein the test joint has an outer casing and an inner base, and the outer casing is sleeved on the inner base The outer side has a plurality of grooves, and the inner base has the second card portion and the electrical contact portion. The dual-use detachable test pin structure according to any one of claims 1 to 6, wherein the detecting joint has a pair of bit gaps, and the body has a pair of bit holes, and the detecting joint is set After the body, the alignment gap corresponds to the alignment hole and can be fixed by a positioning member. The dual-use detachable test pin structure according to any one of claims 1 to 6, wherein the body is coupled to the end of the detecting joint and is extended after being assembled with the detecting joint. To the inside of the test connector.