CN110629200A - 半导体处理设备 - Google Patents
半导体处理设备 Download PDFInfo
- Publication number
- CN110629200A CN110629200A CN201910894524.2A CN201910894524A CN110629200A CN 110629200 A CN110629200 A CN 110629200A CN 201910894524 A CN201910894524 A CN 201910894524A CN 110629200 A CN110629200 A CN 110629200A
- Authority
- CN
- China
- Prior art keywords
- electrode
- semiconductor processing
- processing apparatus
- unit
- wheel
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 239000004065 semiconductor Substances 0.000 title claims abstract description 33
- 230000008021 deposition Effects 0.000 claims abstract description 62
- 239000000758 substrate Substances 0.000 claims abstract description 51
- 239000011521 glass Substances 0.000 claims abstract description 49
- 238000000151 deposition Methods 0.000 claims description 57
- 230000033001 locomotion Effects 0.000 claims description 5
- 239000004020 conductor Substances 0.000 claims description 4
- 239000012212 insulator Substances 0.000 claims description 4
- 239000011553 magnetic fluid Substances 0.000 claims description 4
- 238000000623 plasma-assisted chemical vapour deposition Methods 0.000 claims description 4
- 229910010293 ceramic material Inorganic materials 0.000 claims description 3
- 239000002184 metal Substances 0.000 claims description 3
- 239000007787 solid Substances 0.000 claims description 3
- 230000008878 coupling Effects 0.000 claims 1
- 238000010168 coupling process Methods 0.000 claims 1
- 238000005859 coupling reaction Methods 0.000 claims 1
- 238000000034 method Methods 0.000 abstract description 15
- 230000008569 process Effects 0.000 abstract description 15
- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical compound [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 abstract description 9
- 229910052710 silicon Inorganic materials 0.000 abstract description 9
- 239000010703 silicon Substances 0.000 abstract description 9
- 235000012431 wafers Nutrition 0.000 abstract description 9
- 238000004519 manufacturing process Methods 0.000 abstract description 6
- 230000005540 biological transmission Effects 0.000 description 13
- 230000009286 beneficial effect Effects 0.000 description 10
- 239000007789 gas Substances 0.000 description 10
- OKTJSMMVPCPJKN-UHFFFAOYSA-N Carbon Chemical compound [C] OKTJSMMVPCPJKN-UHFFFAOYSA-N 0.000 description 8
- 229910002804 graphite Inorganic materials 0.000 description 8
- 239000010439 graphite Substances 0.000 description 8
- 229910021419 crystalline silicon Inorganic materials 0.000 description 5
- 238000007789 sealing Methods 0.000 description 4
- 238000006243 chemical reaction Methods 0.000 description 3
- 239000011261 inert gas Substances 0.000 description 3
- 238000009413 insulation Methods 0.000 description 3
- 101001073212 Arabidopsis thaliana Peroxidase 33 Proteins 0.000 description 2
- XKRFYHLGVUSROY-UHFFFAOYSA-N Argon Chemical compound [Ar] XKRFYHLGVUSROY-UHFFFAOYSA-N 0.000 description 2
- IJGRMHOSHXDMSA-UHFFFAOYSA-N Atomic nitrogen Chemical compound N#N IJGRMHOSHXDMSA-UHFFFAOYSA-N 0.000 description 2
- 101001123325 Homo sapiens Peroxisome proliferator-activated receptor gamma coactivator 1-beta Proteins 0.000 description 2
- 102100028961 Peroxisome proliferator-activated receptor gamma coactivator 1-beta Human genes 0.000 description 2
- 230000004888 barrier function Effects 0.000 description 2
- 239000011248 coating agent Substances 0.000 description 2
- 238000000576 coating method Methods 0.000 description 2
- 230000005684 electric field Effects 0.000 description 2
- 239000007888 film coating Substances 0.000 description 2
- 238000009501 film coating Methods 0.000 description 2
- 238000012986 modification Methods 0.000 description 2
- 230000004048 modification Effects 0.000 description 2
- QGZKDVFQNNGYKY-UHFFFAOYSA-N Ammonia Chemical compound N QGZKDVFQNNGYKY-UHFFFAOYSA-N 0.000 description 1
- BLRPTPMANUNPDV-UHFFFAOYSA-N Silane Chemical compound [SiH4] BLRPTPMANUNPDV-UHFFFAOYSA-N 0.000 description 1
- 229910052786 argon Inorganic materials 0.000 description 1
- 230000000903 blocking effect Effects 0.000 description 1
- 230000008859 change Effects 0.000 description 1
- 230000008602 contraction Effects 0.000 description 1
- 238000005137 deposition process Methods 0.000 description 1
- 238000010586 diagram Methods 0.000 description 1
- 238000009792 diffusion process Methods 0.000 description 1
- 239000001307 helium Substances 0.000 description 1
- 229910052734 helium Inorganic materials 0.000 description 1
- SWQJXJOGLNCZEY-UHFFFAOYSA-N helium atom Chemical compound [He] SWQJXJOGLNCZEY-UHFFFAOYSA-N 0.000 description 1
- 230000006872 improvement Effects 0.000 description 1
- 239000000463 material Substances 0.000 description 1
- 229910052757 nitrogen Inorganic materials 0.000 description 1
- GQPLMRYTRLFLPF-UHFFFAOYSA-N nitrous oxide Inorganic materials [O-][N+]#N GQPLMRYTRLFLPF-UHFFFAOYSA-N 0.000 description 1
- 238000007747 plating Methods 0.000 description 1
- 229910000077 silane Inorganic materials 0.000 description 1
Classifications
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C16/00—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
- C23C16/44—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating
- C23C16/458—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating characterised by the method used for supporting substrates in the reaction chamber
- C23C16/4581—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating characterised by the method used for supporting substrates in the reaction chamber characterised by material of construction or surface finish of the means for supporting the substrate
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C16/00—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
- C23C16/44—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating
- C23C16/50—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating using electric discharges
- C23C16/513—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating using electric discharges using plasma jets
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L31/00—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
- H01L31/18—Processes or apparatus specially adapted for the manufacture or treatment of these devices or of parts thereof
- H01L31/1804—Processes or apparatus specially adapted for the manufacture or treatment of these devices or of parts thereof comprising only elements of Group IV of the Periodic Table
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
- Y02P—CLIMATE CHANGE MITIGATION TECHNOLOGIES IN THE PRODUCTION OR PROCESSING OF GOODS
- Y02P70/00—Climate change mitigation technologies in the production process for final industrial or consumer products
- Y02P70/50—Manufacturing or production processes characterised by the final manufactured product
Landscapes
- Chemical & Material Sciences (AREA)
- Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- Materials Engineering (AREA)
- Chemical Kinetics & Catalysis (AREA)
- Mechanical Engineering (AREA)
- Metallurgy (AREA)
- Organic Chemistry (AREA)
- General Chemical & Material Sciences (AREA)
- Plasma & Fusion (AREA)
- Manufacturing & Machinery (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- Electromagnetism (AREA)
- General Physics & Mathematics (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Chemical Vapour Deposition (AREA)
Abstract
Description
Claims (18)
Priority Applications (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
CN201910894524.2A CN110629200B (zh) | 2019-09-20 | 2019-09-20 | 半导体处理设备 |
PCT/CN2019/108637 WO2021051447A1 (zh) | 2019-09-20 | 2019-09-27 | 半导体处理设备 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
CN201910894524.2A CN110629200B (zh) | 2019-09-20 | 2019-09-20 | 半导体处理设备 |
Publications (2)
Publication Number | Publication Date |
---|---|
CN110629200A true CN110629200A (zh) | 2019-12-31 |
CN110629200B CN110629200B (zh) | 2020-04-10 |
Family
ID=68972057
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
CN201910894524.2A Active CN110629200B (zh) | 2019-09-20 | 2019-09-20 | 半导体处理设备 |
Country Status (2)
Country | Link |
---|---|
CN (1) | CN110629200B (zh) |
WO (1) | WO2021051447A1 (zh) |
Citations (14)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2000150394A (ja) * | 1998-11-17 | 2000-05-30 | Toshiba Corp | 基板処理装置及び基板位置合わせ装置 |
WO2007020139A1 (en) * | 2005-08-18 | 2007-02-22 | Nv Bekaert Sa | Substrate coated with a layered structure comprising a tetrahedral carbon layer and a softer outer layer |
CN101580341A (zh) * | 2007-12-10 | 2009-11-18 | Ofs飞泰尔公司 | 采用等温、低压等离子沉积技术制作光纤的方法 |
US20100126419A1 (en) * | 2008-11-27 | 2010-05-27 | Samsung Led Co., Ltd. | Susceptor for cvd apparatus and cvd apparatus including the same |
JP2012243861A (ja) * | 2011-05-17 | 2012-12-10 | Philtech Inc | 膜成長装置および発光ダイオード |
CN103060774A (zh) * | 2011-10-24 | 2013-04-24 | 北京北方微电子基地设备工艺研究中心有限责任公司 | 腔室装置及具有其的基片处理设备 |
CN104103549A (zh) * | 2013-04-07 | 2014-10-15 | 盛美半导体设备(上海)有限公司 | 半导体工艺腔室 |
CN104379798A (zh) * | 2012-01-13 | 2015-02-25 | 基恩科有限公司 | 真空旋转装置 |
CN105586566A (zh) * | 2014-11-03 | 2016-05-18 | 北京北方微电子基地设备工艺研究中心有限责任公司 | 一种反应腔室及半导体加工设备 |
CN205603667U (zh) * | 2016-05-20 | 2016-09-28 | 苏州协鑫集成科技工业应用研究院有限公司 | 异质结电池镀膜载板 |
CN106133873A (zh) * | 2014-03-12 | 2016-11-16 | 应用材料公司 | 在半导体腔室中的晶片旋转 |
CN106756867A (zh) * | 2016-12-05 | 2017-05-31 | 河南科技学院 | 一种金属有机化学气相沉积反应系统 |
CN206607315U (zh) * | 2017-04-19 | 2017-11-03 | 中国科学院物理研究所 | 多功能电感耦合等离子体增强化学气相沉积系统 |
CN110042362A (zh) * | 2019-05-13 | 2019-07-23 | 杨卫正 | 一种多用途化学气相沉积装置 |
Family Cites Families (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR100745130B1 (ko) * | 2006-02-09 | 2007-08-01 | 삼성전자주식회사 | 박막 증착 장치 및 방법 |
CN102796990A (zh) * | 2011-05-26 | 2012-11-28 | 鸿富锦精密工业(深圳)有限公司 | 镀膜承载架 |
CN102420272B (zh) * | 2011-12-14 | 2013-11-06 | 无锡迈纳德微纳技术有限公司 | 一种太阳能电池钝化层分层镀膜装置 |
-
2019
- 2019-09-20 CN CN201910894524.2A patent/CN110629200B/zh active Active
- 2019-09-27 WO PCT/CN2019/108637 patent/WO2021051447A1/zh active Application Filing
Patent Citations (15)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2000150394A (ja) * | 1998-11-17 | 2000-05-30 | Toshiba Corp | 基板処理装置及び基板位置合わせ装置 |
WO2007020139A1 (en) * | 2005-08-18 | 2007-02-22 | Nv Bekaert Sa | Substrate coated with a layered structure comprising a tetrahedral carbon layer and a softer outer layer |
CN101580341A (zh) * | 2007-12-10 | 2009-11-18 | Ofs飞泰尔公司 | 采用等温、低压等离子沉积技术制作光纤的方法 |
US20100126419A1 (en) * | 2008-11-27 | 2010-05-27 | Samsung Led Co., Ltd. | Susceptor for cvd apparatus and cvd apparatus including the same |
JP2012243861A (ja) * | 2011-05-17 | 2012-12-10 | Philtech Inc | 膜成長装置および発光ダイオード |
CN103060774A (zh) * | 2011-10-24 | 2013-04-24 | 北京北方微电子基地设备工艺研究中心有限责任公司 | 腔室装置及具有其的基片处理设备 |
CN104379798A (zh) * | 2012-01-13 | 2015-02-25 | 基恩科有限公司 | 真空旋转装置 |
CN104103549A (zh) * | 2013-04-07 | 2014-10-15 | 盛美半导体设备(上海)有限公司 | 半导体工艺腔室 |
CN106133873A (zh) * | 2014-03-12 | 2016-11-16 | 应用材料公司 | 在半导体腔室中的晶片旋转 |
CN110211859A (zh) * | 2014-03-12 | 2019-09-06 | 应用材料公司 | 处理基板的方法 |
CN105586566A (zh) * | 2014-11-03 | 2016-05-18 | 北京北方微电子基地设备工艺研究中心有限责任公司 | 一种反应腔室及半导体加工设备 |
CN205603667U (zh) * | 2016-05-20 | 2016-09-28 | 苏州协鑫集成科技工业应用研究院有限公司 | 异质结电池镀膜载板 |
CN106756867A (zh) * | 2016-12-05 | 2017-05-31 | 河南科技学院 | 一种金属有机化学气相沉积反应系统 |
CN206607315U (zh) * | 2017-04-19 | 2017-11-03 | 中国科学院物理研究所 | 多功能电感耦合等离子体增强化学气相沉积系统 |
CN110042362A (zh) * | 2019-05-13 | 2019-07-23 | 杨卫正 | 一种多用途化学气相沉积装置 |
Also Published As
Publication number | Publication date |
---|---|
CN110629200B (zh) | 2020-04-10 |
WO2021051447A1 (zh) | 2021-03-25 |
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PB01 | Publication | ||
PB01 | Publication | ||
SE01 | Entry into force of request for substantive examination | ||
SE01 | Entry into force of request for substantive examination | ||
GR01 | Patent grant | ||
GR01 | Patent grant | ||
CP03 | Change of name, title or address | ||
CP03 | Change of name, title or address |
Address after: Room 402, building 3, 3255 Sixian Road, Songjiang District, Shanghai, 201602 Patentee after: Ideal semiconductor equipment (Shanghai) Co.,Ltd. Address before: 201620 Shanghai city Songjiang District Sixian Road No. 3255 Building No. 3, B building four floor Patentee before: DEPOSITION EQUIPMENT AND APPLICATIONS (SHANGHAI) Ltd. |
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TR01 | Transfer of patent right | ||
TR01 | Transfer of patent right |
Effective date of registration: 20231207 Address after: Division B1, No.300 Gushui Road, Haichang Street, Haining City, Jiaxing, Zhejiang Province 314499 Patentee after: Ideal Jingyan Semiconductor Equipment (Zhejiang) Co.,Ltd. Patentee after: Ideal semiconductor equipment (Shanghai) Co.,Ltd. Address before: 201602 room 402, building 3, 3255 Sixian Road, Songjiang District, Shanghai Patentee before: Ideal semiconductor equipment (Shanghai) Co.,Ltd. |