CN110487416A - A kind of method for rapidly testing of thermal infrared imager NETD and MRTD - Google Patents
A kind of method for rapidly testing of thermal infrared imager NETD and MRTD Download PDFInfo
- Publication number
- CN110487416A CN110487416A CN201910794362.5A CN201910794362A CN110487416A CN 110487416 A CN110487416 A CN 110487416A CN 201910794362 A CN201910794362 A CN 201910794362A CN 110487416 A CN110487416 A CN 110487416A
- Authority
- CN
- China
- Prior art keywords
- temperature
- detector
- black matrix
- thermal infrared
- infrared imager
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 238000012360 testing method Methods 0.000 title claims abstract description 37
- 238000000034 method Methods 0.000 title claims abstract description 30
- 239000011159 matrix material Substances 0.000 claims abstract description 55
- 230000004044 response Effects 0.000 claims abstract description 13
- 230000008569 process Effects 0.000 claims abstract description 12
- 230000008685 targeting Effects 0.000 claims description 10
- 230000005855 radiation Effects 0.000 claims description 9
- 230000005611 electricity Effects 0.000 claims description 4
- 238000012546 transfer Methods 0.000 claims description 4
- 230000007423 decrease Effects 0.000 claims description 3
- 238000004364 calculation method Methods 0.000 claims description 2
- 238000010792 warming Methods 0.000 claims description 2
- 230000008859 change Effects 0.000 abstract description 3
- 238000001816 cooling Methods 0.000 abstract description 3
- 238000009795 derivation Methods 0.000 abstract description 2
- 238000010438 heat treatment Methods 0.000 abstract description 2
- 238000001931 thermography Methods 0.000 description 6
- 238000001514 detection method Methods 0.000 description 3
- 230000000694 effects Effects 0.000 description 2
- 238000005516 engineering process Methods 0.000 description 2
- 230000003068 static effect Effects 0.000 description 2
- 206010057040 Temperature intolerance Diseases 0.000 description 1
- 239000008186 active pharmaceutical agent Substances 0.000 description 1
- 230000009286 beneficial effect Effects 0.000 description 1
- 238000012937 correction Methods 0.000 description 1
- 238000013461 design Methods 0.000 description 1
- 238000010586 diagram Methods 0.000 description 1
- 230000036541 health Effects 0.000 description 1
- 230000008543 heat sensitivity Effects 0.000 description 1
- 238000003384 imaging method Methods 0.000 description 1
- 230000006872 improvement Effects 0.000 description 1
- 238000004519 manufacturing process Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 230000003287 optical effect Effects 0.000 description 1
- 238000012634 optical imaging Methods 0.000 description 1
- 238000011160 research Methods 0.000 description 1
- 230000000630 rising effect Effects 0.000 description 1
- 238000009738 saturating Methods 0.000 description 1
- 230000006641 stabilisation Effects 0.000 description 1
- 238000011105 stabilization Methods 0.000 description 1
- 230000000087 stabilizing effect Effects 0.000 description 1
- 238000006467 substitution reaction Methods 0.000 description 1
- 238000001757 thermogravimetry curve Methods 0.000 description 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J5/00—Radiation pyrometry, e.g. infrared or optical thermometry
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Spectroscopy & Molecular Physics (AREA)
- Radiation Pyrometers (AREA)
Abstract
The present invention discloses a kind of thermal infrared imager NETD and MRTD method for rapidly testing, applied to thermal infrared imager testing field, when being tested to solve NETD in the prior art and MRTD, need to acquire the detector response data under different temperature points, because of black matrix heating and cooling and reaches stable state and need the plenty of time, there are the testing time of NETD and MTRD are long, the problem of entire testing process low efficiency；The data that the present invention passes through acquisition black matrix linear temperature variation and thermal infrared imager under the corresponding time, derivation thermal infrared imager corresponds to response data and blackbody temperature relationship under frame number, change the response data of the thermal infrared imager of lower particular frame using black matrix continuous temperature and then calculate NETD and MRTD, improves the testing efficiency of NETD and MRTD.
Description
Technical field
The invention belongs to thermal infrared imager testing field, in particular to a kind of thermal infrared imager NETD and MRTD test are quick
Detection technique.
Background technique
Thermal infrared imager is a kind of infrared system of two-dimensional surface imaging.Thermal infrared imager can receive, identifies and analyze
The infrared radiation signal of things, and it is converted into electric signal output, to measure the power of infra-red radiation.Thermal infrared imager utilizes
The infrared radiation energy distribution pattern that infrared detector and optical imaging objective receive measured target is reacted to infrared detector
On light sensor, to obtain Infrared Thermogram.Thermal infrared imager is in military affairs, industry, health care, scientific research and environment
The fields such as detection are widely used.
Noise equivalent temperature difference (NETD) is one of the major parameter of thermal infrared imager static properties, objectively responds thermal imaging system pair
The detectivity of target temperature can be used for predicting the detection range of small temperature difference point target.Therefore, accurately measure is infrared
The noise equivalent temperature difference of thermal imaging system for evaluate thermal imaging system performance, and guidance improve thermal infrared imager critical component, i.e.,
The design and manufacture of photodetector and technological level have vital effect.However, in the noise for measuring thermal imaging system
It when equivalent temperature difference, needs to acquire the detector response data under five different temperature points, causes in the process for carrying out NETD test
In, need using do not stop replace blackbody temperature.Because of black matrix heating and cooling and reach stable state and need the plenty of time, so traditional
NETD testing time it is long, reduce entire testing process efficiency.
The minimum distinguishable rate temperature difference (MRTD) is one of the major parameter of thermal infrared imager static properties, objectively responds thermal imagery
The heat sensitivity characteristic of instrument system, and reflect the spatial resolution of system.Its common tested target is four square bar figures,
In the minimum distinguishable rate temperature difference for measuring thermal imaging system, by constantly changing blackbody temperature, carry out the clear of observed image
Variation.This causes during carrying out MRTD test, needs to reduce entire test stream using replacement blackbody temperature is not stopped
Journey efficiency.
Summary of the invention
In order to solve the above-mentioned technical problem, the present invention proposes the quick test side of thermal infrared imager NETD and MRTD a kind of
Method derives thermal infrared imager and corresponds under frame number according to the data of black matrix linear temperature variation and thermal infrared imager under the corresponding time
Response data and test of the blackbody temperature relational implementation to NETD and MRTD, improve NETD and MRTD testing efficiency.
The technical solution adopted by the present invention are as follows: a kind of thermal infrared imager NETD and MRTD method for rapidly testing pass through foundation
Blackbody temperature with the data frame number of collected detector corresponding relationship, the number of the detector according to corresponding to blackbody temperature
According to frame number, the corresponding response of different blackbody temperatures and noise are calculated；To calculate NETD and MRTD.
Further, blackbody temperature with the data frame number of collected detector corresponding relationship, specifically: black matrix temperature
Degree rise with the data frame number of collected detector corresponding relationship, establishment process are as follows:
A1, linear alternating temperature mode is set for black matrix by upper computer control system；
A2, blackbody temperature is arranged as 2K by upper computer control system, after blackbody temperature is stablized, passes through PC control
It is 1K that blackbody temperature, which is arranged, in system, while continuous collecting detector data, record are adopted when blackbody temperature is stabilized to 1K from 2K
The detector data frame number F collected0；
A3, blackbody temperature is arranged as 2K by upper computer control system, after blackbody temperature is stablized, passes through PC control
It is -2K that blackbody temperature, which is arranged, in system, while continuous collecting detector data, and record is when blackbody temperature from 2K when that is stabilized to -2K institute
Collected detector data frame number F1；
A4, according to linear relationship, obtain the every decline 1K of blackbody temperature, collected detector data frame number increases F0。
Further, when blackbody temperature stabilizes to 2K, collected is the 1st frame data of detector；Blackbody temperature from
When 2K is stabilized to 1K, collected is the F of detector0Frame data；It is collected to be when blackbody temperature is stabilized to 0K from 2K
The 2F of detector0Frame data；When blackbody temperature 2K is stabilized to -1K, collected is the 3F of detector0Frame data；Black matrix
When temperature 2K is stabilized to -2K, collected is the 4F of detector0Frame data.
Further, when calculating NETD, further includes: according to the data frame number of detector corresponding to different blackbody temperatures, meter
The corresponding response of the blackbody temperature and noise are calculated, specifically: respectively according to the 1st frame data, the F of collected detector0Frame
Data, 2F0Frame data, 3F0Frame data, 4F0Frame data respectively ask for 3 frame data of left and right and carry out average computation, successively
The output signal voltage of corresponding detector when stabilizing to 2K, 1K, 0K, -1K, -2K to blackbody temperature；To calculate signal biography
Delivery function；
It further include the output signal electricity for acquiring the tested thermal infrared imager detector of F frame when blackbody temperature stabilizes to -2K
Press data, the noise for calculating detector；
According to the noise calculation NETD of signal transfer function and detector.
Further, when first time calculating MRTD, calculating process are as follows:
B1, target is set as to 4 bar targets, black matrix is set as 0K, record is tested the detector target of thermal infrared imager at this time
The first output signal voltage and V under region0；
B2, black matrix is warming up to 2K, after blackbody temperature is stablized, blackbody temperature is gradually reduced from 2K, so that entering flat
The radiation signal radiation energy of row light pipe gradually reduces, and when 4 bar targets are at once invisible, i.e., not can be seen that 4 bar targets are every just
Between 75% and adjacent two bar of rod area area 75% when, obtain the first temperature of corresponding black matrix, record black matrix the at this time
One temperature and ambient temperature differences △ T+ record the first output under the detector targeting regions of tested thermal infrared imager at this time
Signal voltage and V0Voltage difference △ V1；
B3, continue to reduce blackbody temperature, be lowered into the radiation signal energy of parallel light tube, until being obtained when cold bar occurs
To corresponding black matrix second temperature, record black matrix second temperature and ambient temperature differences △ T- at this time, record at this time be tested it is infrared
The second output signal voltage and V under the detector targeting regions of thermal imaging system0Voltage difference △ V2；It is corresponding to calculate
MRTD。
Further, when calculating MRTD again, calculating process are as follows:
Blackbody temperature is subsequently reduced to -2K from 2K, and acquires the signal voltage number of the successive frame of tested thermal infrared imager
According to；When it is half a month target and 4 bar target that target, which can satisfy the left and right sides, process can be tested with NETD and be calculated simultaneously；
Third output signal voltage by collected signal voltage data, under the detector targeting regions of tested thermal infrared imager
With V0Voltage difference and △ V1When equal, according to detector at this time acquire frame number be calculated with blackbody temperature relationship it is corresponding black
Body third temperature records black matrix third temperature and ambient temperature differences at this time；When the detector targeting regions of tested thermal infrared imager
Under the 4th output signal voltage and V0Voltage difference and △ V2When equal, accordingly when detector acquisition frame number and blackbody temperature close
Corresponding the 4th temperature of black matrix is calculated in system, records the 4th temperature of black matrix and ambient temperature differences at this time；It is corresponding to calculate
MRTD。
Beneficial effects of the present invention: method of the invention is by obtaining infrared thermal imagery under the linear alternating temperature of black matrix and corresponding time
The data of instrument, derivation thermal infrared imager correspond to response data and blackbody temperature relationship under frame number, black matrix continuous temperature are utilized to become
Change the response data of the thermal infrared imager of lower particular frame and then calculate NETD, without successively waiting five temperature of black matrix
The temperature stabilization process of point, time of measuring greatly shorten compared with the existing technology, and significantly improve the test effect of NETD
Rate；Simultaneously using the response data and blackbody temperature relationship under corresponding frame number, the blackbody temperature under corresponding voltage difference is calculated,
Without waiting blackbody temperature to stablize, MRTD testing efficiency is significantly improved.
Detailed description of the invention
Fig. 1 is NETD method for rapidly testing flow chart of the invention；
Fig. 2 is MRTD method for rapidly testing flow chart of the invention；
Fig. 3 is the structural schematic diagram of thermal infrared imager NETD and MRTD device for quick testing provided in an embodiment of the present invention；
Wherein, 1 it is black matrix, 2 be parallel light tube, 3 is thermal infrared imager, 4 host computers.
Specific embodiment
For convenient for those skilled in the art understand that technology contents of the invention, with reference to the accompanying drawing to the content of present invention into one
Step is illustrated.
The present invention as shown in Figure 1 provides a kind of NETD method for rapidly testing, includes the following steps:
Step 1: pretreatment
Linear temperature variation pattern is set by black matrix；
Half a month target is set by target；
2K is set by black matrix using black matrix controller, blackbody temperature is waited to stablize；
Set 1K for black matrix using black matrix controller, and continuous collecting detector data simultaneously, wait blackbody temperature from
2K is stabilized to 1K, and recording collected data frame number at this time is F0Frame.
Step 2: data acquisition
Using black matrix controller, 2K is set by blackbody temperature, black matrix is waited to stablize, after black matrix is stablized, black matrix is set
It is set to -2K, and continuous collecting detector data simultaneously, blackbody temperature is waited to stabilize to -2K, acquired during saving black matrix cooling
The F arrived1Frame data.
After blackbody temperature is -2K and stablizes, then the signal voltage data of the tested thermal infrared imager of one group of F frame are acquired, used
In calculating noise Vn.
Step 3: data calculate
According to the blackbody temperature rising and frame number relationship pre-processed above, the every decline 1K of blackbody temperature, this phase are obtained
Between detector acquire F altogether0Frame data, so when blackbody temperature is cooled to stable 2K, 1K from 2K, 0K, -1K when -2K, are visited
Surveying device and corresponding to the total frame number of collected data is respectively 1, F0、2F0、3F0、4F0；So when blackbody temperature is stablized in 2K, 1K,
0K, -1K, when -2K, the collected data of detector institute are respectively the 1st frame, F0Frame, 2F0Frame, 3F0Frame, 4F0Frame,
The present invention obtains the signal electricity that detector is corresponded under five temperature spots of black matrix by taking 3 frame data of these frames or so to be averaged
Press data；
Utilize the output signal voltage under above-mentioned collected detector half a month target region.According to formula (1) and then calculate
Noise (Vn):
Wherein, K indicates impact factor, default value 1；F indicates T0At a temperature of acquisition frame number, take 100 under default situations；
T0Indicate temperature when temperature is -2K；VDS[(i,j),To, f] and it indicates in blackbody temperature T0Under the conditions of, detector output signal electricity
Pressure；It indicates in blackbody temperature T0Under the conditions of, detector output signal average voltage；I indicates detector array
The abscissa of some signal voltage in collected signal voltage matrix, j indicate the collected signal voltage square of detector array
The ordinate of some signal voltage in battle array.
Using the output signal voltage under each temperature spot the second half of the month target region, it is bent that fitting is calculated by least square method
Then line calculates signal transfer function (SiTF) according to formula (2):
In formula: Δ T indicates the black matrix temperature difference, the i.e. temperature difference of -2K and 2K；Δ Vs indicates the signal response of the corresponding black matrix temperature difference
The voltage difference of difference, i.e. matched curve -2K and the signal voltage under 2K；
Final NETD is calculated according to formula (3)；
As shown in Fig. 2, MRTD test process of the invention are as follows:
Change temperature by black matrix, when 4 bar targets are at once invisible, record corresponding temperature point and ambient temperature differences △ T
+, and record and correspond to signal voltage R at this time1；Gradually reduce blackbody temperature again, when cold bar occurs record corresponding temperature point with
Ambient temperature differences △ T-, and record and correspond to signal voltage R at this time2；MRTD is calculated using formula (4).
Here when 4 bar targets are at once invisible, specifically: observer not can be seen that the 4 every rod areas of bar target just
Between 75% and adjacent two bar area 75% when.
When testing MRTD again, the R of first time test acquisition is utilized1With the voltage V under environment temperature0Difference △ V1, R2With
Voltage V under environment temperature0Difference △ V2.Blackbody temperature is subsequently reduced to -2K from 2K, and acquires tested thermal infrared imager
The signal voltage data of successive frame；By collected signal voltage data, when the detector target zones of tested thermal infrared imager
Third output signal voltage and V under domain0Voltage difference and △ V1When equal, frame number and black matrix temperature are acquired according to detector at this time
Corresponding black matrix third temperature is calculated in degree relationship, records black matrix third temperature at this time and ambient temperature differences △ T+；When tested
The 4th output signal voltage and V under the detector targeting regions of thermal infrared imager0Voltage difference and △ V2When equal, accordingly when
Detector acquires frame number and corresponding the 4th temperature of black matrix is calculated with blackbody temperature relationship, records the 4th temperature of black matrix at this time
With ambient temperature differences △ T-；Corresponding MRTD is calculated according to national standard " GJB2340-95 ".
In formula: f indicates corresponding spatial frequency；cor(Tba) indicate environment temperature correction factor；τ indicates the saturating of optical channel
Cross rate
Here when 4 bar targets are at once invisible, specifically: it can be seen that 75% and phase of the cold every rod area of bar target of 4 bars
Between adjacent two bars area 75% when.
NETD and MRTD method for rapidly testing of the invention, is particularly suitable for the infrared thermal imagery of not DMD as shown in Figure 3
Instrument NETD and MRTD device for quick testing.
The present invention can be by PC control, half a month target needed for making picture side generate NETD test, and picture is another
Four bar targets needed for side generates MRTD；When being respectively half a month target and 4 bar target at left and right sides of target, NETD can be carried out simultaneously
With the test of MRTD.
Those of ordinary skill in the art will understand that the embodiments described herein, which is to help reader, understands this hair
Bright principle, it should be understood that protection scope of the present invention is not limited to such specific embodiments and embodiments.For ability
For the technical staff in domain, the invention may be variously modified and varied.All within the spirits and principles of the present invention, made
Any modification, equivalent substitution, improvement and etc., should be included within scope of the presently claimed invention.
Claims (6)
1. a kind of thermal infrared imager NETD and MTRD method for rapidly testing, which is characterized in that by establishing blackbody temperature and being adopted
The corresponding relationship of the data frame number of the detector collected, the data frame number of the detector according to corresponding to blackbody temperature calculate different
The corresponding response of blackbody temperature and noise；To calculate NETD and MRTD.
2. a kind of thermal infrared imager NETD according to claim 1 and MRTD method for rapidly testing, which is characterized in that black matrix
The corresponding relationship of temperature and institute's data frame number of collected detector, specifically: blackbody temperature rise with a collected spy
Survey the corresponding relationship of the data frame number of device, establishment process are as follows:
A1, linear temperature variation pattern is set for black matrix by upper computer control system；
A2, target is set to half a month target；
A3, blackbody temperature is arranged as 2K by upper computer control system, after blackbody temperature is stablized, passes through upper computer control system
Setting blackbody temperature is 1K, while continuous collecting detector data, record are collected when blackbody temperature is stabilized to 1K from 2K
Detector data frame number F0；
A4, blackbody temperature is arranged as 2K by upper computer control system, after blackbody temperature is stablized, passes through upper computer control system
Setting blackbody temperature is -2K, while continuous collecting detector data, record are acquired when blackbody temperature is stabilized to -2K from 2K
The detector data frame number F arrived1；
A5, according to linear relationship, obtain the every decline 1K of blackbody temperature, collected detector data frame number increases F0。
3. a kind of thermal infrared imager NETD according to claim 2 and MRTD method for rapidly testing, which is characterized in that black matrix
When temperature stabilizes to 2K, collected is the 1st frame data of detector；It is collected to be when blackbody temperature is stabilized to 1K from 2K
The F of detector0Frame data；When blackbody temperature is stabilized to 0K from 2K, collected is the 2F of detector0Frame data；Black matrix temperature
When degree 2K is stabilized to -1K, collected is the 3F of detector0Frame data；It is collected when blackbody temperature 2K is stabilized to -2K
It is the 4F of detector0Frame data.
4. a kind of thermal infrared imager NETD according to claim 3 and MRTD method for rapidly testing, which is characterized in that calculate
When NETD, further includes:
According to the data frame number of detector corresponding to different blackbody temperatures, the corresponding response of the blackbody temperature and noise are calculated, is had
Body are as follows: respectively according to the 1st frame data, the F of collected detector0Frame data, 2F0Frame data, 3F0Frame data,
4F0Frame data, respectively ask for left and right 3 frame data carry out average computation, successively obtain blackbody temperature stabilize to 2K, 1K, 0K, -1K, -
The output signal voltage of corresponding detector when 2K；To calculate signal transfer function；
It further include the output signal voltage number for acquiring the tested thermal infrared imager detector of F frame when blackbody temperature stabilizes to -2K
According to noise for calculating detector；
According to the noise calculation NETD of signal transfer function and detector.
5. thermal infrared imager NETD according to claim 1 and MRTD method for rapidly testing, when first time calculating MRTD,
Its calculating process are as follows:
B1, target is set as to 4 bar targets, black matrix is set as 0K, record is tested the detector targeting regions of thermal infrared imager at this time
Under the first output signal voltage and V0；
B2, black matrix is warming up to 2K, after blackbody temperature is stablized, blackbody temperature is gradually reduced from 2K, so that into directional light
The radiation signal radiation energy of pipe gradually reduces, and when 4 bar targets are at once invisible, i.e., not can be seen that the 4 every pole faces of bar target just
Between 75% long-pending and adjacent two bar area 75% when, obtain the first temperature of corresponding black matrix, record the first temperature of black matrix at this time
Degree and ambient temperature differences △ T+ record the first output signal electricity under the detector targeting regions of tested thermal infrared imager at this time
Pressure and V0Voltage difference △ V1；
B3, continue to reduce blackbody temperature, be lowered into the radiation signal energy of parallel light tube, until cold bar when occurring, obtains pair
The black matrix second temperature answered records black matrix second temperature at this time and ambient temperature differences △ T-, records tested infrared thermal imagery at this time
The second output signal voltage and V under the detector targeting regions of instrument0Voltage difference △ V2；To calculate corresponding MRTD.
6. thermal infrared imager NETD according to claim 5 and MRTD method for rapidly testing, which is characterized in that when counting again
When calculating MRTD, calculating process are as follows:
Blackbody temperature is subsequently reduced to -2K from 2K, and acquires the signal voltage data of the successive frame of tested thermal infrared imager；It is logical
Cross collected signal voltage data, when under the detector targeting regions of tested thermal infrared imager third output signal voltage with
V0Voltage difference and △ V1When equal, frame number acquired according to detector at this time, corresponding black matrix is calculated with blackbody temperature relationship
Third temperature records black matrix third temperature and ambient temperature differences at this time；
The 4th output signal voltage and V under the detector targeting regions of tested thermal infrared imager0Voltage difference and △ V2It is equal
When, accordingly when detector acquisition frame number and blackbody temperature relationship corresponding the 4th temperature of black matrix is calculated, record black matrix at this time
4th temperature and ambient temperature differences；To calculate corresponding MRTD.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201910794362.5A CN110487416B (en) | 2019-08-27 | 2019-08-27 | Rapid testing method for NETD and MRTD of thermal infrared imager |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201910794362.5A CN110487416B (en) | 2019-08-27 | 2019-08-27 | Rapid testing method for NETD and MRTD of thermal infrared imager |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| CN110487416A true CN110487416A (en) | 2019-11-22 |
| CN110487416B CN110487416B (en) | 2020-11-06 |
Family
ID=68554374
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201910794362.5A Active CN110487416B (en) | 2019-08-27 | 2019-08-27 | Rapid testing method for NETD and MRTD of thermal infrared imager |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN110487416B (en) |
Cited By (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN111076819A (en) * | 2019-12-04 | 2020-04-28 | 中国航空工业集团公司洛阳电光设备研究所 | Noise equivalent temperature difference device of infrared thermal imager with ultra-large field of view and testing method |
| CN112461376A (en) * | 2020-12-07 | 2021-03-09 | 爱沃泰科技(深圳)有限公司 | Self-adaptive infrared sensor signal sampling algorithm |
| CN113091918A (en) * | 2021-04-07 | 2021-07-09 | 无锡物联网创新中心有限公司 | Performance test method for thermal infrared detector |
| CN113503969A (en) * | 2021-07-08 | 2021-10-15 | 成都盈盛源电气科技有限公司 | Multi-station test system and method for refrigeration type infrared detector |
| CN113532663A (en) * | 2021-06-28 | 2021-10-22 | 深圳市景阳科技股份有限公司 | Method, device and equipment for acquiring responsivity of infrared detector and storage medium |
Citations (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US20020125430A1 (en) * | 2001-03-06 | 2002-09-12 | Honeywell International Inc. | Bolometer operation using fast scanning |
| CN101275870A (en) * | 2008-05-12 | 2008-10-01 | 北京理工大学 | Infrared thermal imaging system MRTD objective evaluating method |
| CN103162843A (en) * | 2013-03-21 | 2013-06-19 | 北京红源光电技术公司 | Zero shutter thermal infrared imager based on voice operated exchange (VOX) detector and use method thereof |
| CN108896189A (en) * | 2018-06-08 | 2018-11-27 | 中国电力科学研究院有限公司 | It is a kind of for automatically determining the method and system of the minimum discernable temperature difference of infrared thermoviewer |
-
2019
- 2019-08-27 CN CN201910794362.5A patent/CN110487416B/en active Active
Patent Citations (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US20020125430A1 (en) * | 2001-03-06 | 2002-09-12 | Honeywell International Inc. | Bolometer operation using fast scanning |
| CN101275870A (en) * | 2008-05-12 | 2008-10-01 | 北京理工大学 | Infrared thermal imaging system MRTD objective evaluating method |
| CN103162843A (en) * | 2013-03-21 | 2013-06-19 | 北京红源光电技术公司 | Zero shutter thermal infrared imager based on voice operated exchange (VOX) detector and use method thereof |
| CN108896189A (en) * | 2018-06-08 | 2018-11-27 | 中国电力科学研究院有限公司 | It is a kind of for automatically determining the method and system of the minimum discernable temperature difference of infrared thermoviewer |
Non-Patent Citations (1)
| Title |
|---|
| 李艳晓 等: "红外成像系统的性能测试方法研究", 《红外与激光工程》 * |
Cited By (7)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN111076819A (en) * | 2019-12-04 | 2020-04-28 | 中国航空工业集团公司洛阳电光设备研究所 | Noise equivalent temperature difference device of infrared thermal imager with ultra-large field of view and testing method |
| CN111076819B (en) * | 2019-12-04 | 2021-11-02 | 中国航空工业集团公司洛阳电光设备研究所 | Test method for noise equivalent temperature difference device of infrared thermal imager with ultra-large field of view |
| CN112461376A (en) * | 2020-12-07 | 2021-03-09 | 爱沃泰科技(深圳)有限公司 | Self-adaptive infrared sensor signal sampling algorithm |
| CN112461376B (en) * | 2020-12-07 | 2024-05-24 | 爱沃泰科技(深圳)有限公司 | Adaptive infrared sensor signal sampling algorithm |
| CN113091918A (en) * | 2021-04-07 | 2021-07-09 | 无锡物联网创新中心有限公司 | Performance test method for thermal infrared detector |
| CN113532663A (en) * | 2021-06-28 | 2021-10-22 | 深圳市景阳科技股份有限公司 | Method, device and equipment for acquiring responsivity of infrared detector and storage medium |
| CN113503969A (en) * | 2021-07-08 | 2021-10-15 | 成都盈盛源电气科技有限公司 | Multi-station test system and method for refrigeration type infrared detector |
Also Published As
| Publication number | Publication date |
|---|---|
| CN110487416B (en) | 2020-11-06 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| CN110487416A (en) | A kind of method for rapidly testing of thermal infrared imager NETD and MRTD | |
| CN100464167C (en) | Method and device for real-time correcting infrared measuring temperature | |
| CN102818636B (en) | A kind of Calibration Method of thermal infrared imager low temperature thermometric | |
| CN112050948B (en) | Non-barrier infrared temperature measurement method based on detector temperature drift model | |
| Zhang et al. | A method for reducing the influence of measuring distance on infrared thermal imager temperature measurement accuracy | |
| CN106679817B (en) | A method of for Calibration of Infrared Thermal Imager | |
| CN102538983B (en) | CCD (Charge Coupled Device) temperature measuring device | |
| CN107588854B (en) | High precision measuring temperature method based on built-in reference body | |
| CN111024238B (en) | Radiation calibration and temperature measurement method for uncooled temperature measurement thermal imager | |
| CN206146624U (en) | Blind first detection device of thermal infrared hyperspectral imager appearance | |
| CN104515599B (en) | Infrared focal plane array blind element detecting system based on FPGA and method | |
| CN105628208B (en) | A kind of thermometry based on infrared imaging system | |
| CN103162843B (en) | Zero shutter thermal infrared imager based on voice operated exchange (VOX) detector and use method thereof | |
| CN109419495A (en) | A kind of calibration method based on infrared heat image instrument measuring eye temperature | |
| CN106124062A (en) | A kind of infrared measurement of temperature automatic compensating method based on historical data | |
| CN109655161B (en) | Target infrared integral radiation intensity testing method and device based on thermal infrared imager | |
| CN103335717B (en) | A kind of thermal infrared imager high precision temperature resistance drift temp measuring method based on becoming integral mode | |
| CN107341780B (en) | Infrared image preprocessing correction method | |
| CN105043552B (en) | Colorimetric temperature measurement system is shown and scaling method | |
| CN107340064B (en) | Thermal imaging system heterogeneity based on scan rectangle black matrix evaluates means for correcting | |
| CN111076819B (en) | Test method for noise equivalent temperature difference device of infrared thermal imager with ultra-large field of view | |
| CN106289532A (en) | The temperature extracting method of a kind of thermal-induced imagery and device | |
| CN105352988A (en) | System for evaluating thermal insulation performance of exterior wall of building and method thereof | |
| CN105716721A (en) | Infrared temperature detecting precision correcting method | |
| CN106768347A (en) | A kind of temp measuring method of the uncooled ir temperature measurer of uncompensated device |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| PB01 | Publication | ||
| PB01 | Publication | ||
| SE01 | Entry into force of request for substantive examination | ||
| SE01 | Entry into force of request for substantive examination | ||
| GR01 | Patent grant | ||
| GR01 | Patent grant |