CN110487416B - Rapid testing method for NETD and MRTD of thermal infrared imager - Google Patents
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Abstract
The invention discloses a rapid test method for NETD and MRTD of a thermal infrared imager, which is applied to the field of thermal infrared imager test and aims to solve the problems that in the prior art, when NETD and MRTD are tested, detector response data at different temperature points need to be acquired, a large amount of time is needed for raising and lowering the temperature of a black body and reaching a stable state, the test time of NETD and MTRD is long, and the efficiency of the whole test process is low; according to the method, the relation between response data of the thermal infrared imager under the corresponding frame number and the temperature of the black body is deduced by acquiring the linear temperature change of the black body and the data of the thermal infrared imager at the corresponding time, and the NETD and MRTD are calculated by utilizing the response data of the thermal infrared imager of a specific frame under the continuous temperature change of the black body, so that the test efficiency of the NETD and MRTD is improved.
Description
Technical Field
The invention belongs to the field of thermal infrared imager tests, and particularly relates to a rapid test technology for testing NETD and MRTD of a thermal infrared imager.
Background
A thermal infrared imager is an infrared system that images in two dimensions. The thermal infrared imager can receive, identify and analyze infrared radiation signals of objects and convert the infrared radiation signals into electric signals to be output, so that the intensity of infrared radiation is measured. The thermal infrared imager utilizes an infrared detector and an optical imaging objective lens to receive an infrared radiation energy distribution pattern of a detected target and react the infrared radiation energy distribution pattern to a photosensitive element of the infrared detector, so that an infrared thermograph is obtained. The infrared thermal imager is widely applied in the fields of military affairs, industry, medical treatment and health, scientific research, environmental detection and the like.
The Noise Equivalent Temperature Difference (NETD) is one of main parameters of the static performance of the thermal infrared imager, objectively reflects the detection sensitivity of the thermal infrared imager to the target temperature, and can be used for predicting the detection distance of the target with the small temperature difference point. Therefore, accurately measuring the noise equivalent temperature difference of the thermal infrared imager plays a crucial role in evaluating the performance of the thermal infrared imager and guiding and improving the key components of the thermal infrared imager, namely the design, manufacture and process level of the photoelectric detector. However, when the noise equivalent temperature difference of the thermal imager is measured, the detector response data at five different temperature points need to be collected, so that the blackbody temperature needs to be continuously replaced in the process of carrying out the NETD test. Because the blackbody needs a lot of time to raise and lower the temperature and reach a stable state, the traditional NETD has long test time, and the efficiency of the whole test process is reduced.
The minimum resolvable resolution temperature difference (MRTD) is one of the main parameters of the static performance of the thermal infrared imager, objectively reflects the thermal sensitivity characteristic of the thermal imager system, and also reflects the spatial resolution of the system. The target to be measured is marked as four square bar graphs, and when the minimum resolution temperature difference of the thermal imager is measured, the clear change of the image is observed by continuously changing the temperature of the black body. This results in the continuous black body temperature change during the MRTD test, which reduces the efficiency of the whole test process.
Disclosure of Invention
In order to solve the technical problems, the invention provides a method for rapidly testing the NETD and the MRTD of the thermal infrared imagers.
The technical scheme adopted by the invention is as follows: a method for rapidly testing NETD and MRTD of a thermal infrared imager is characterized in that the corresponding relation between the black body temperature and the number of collected data frames of a detector is established, and the response and noise corresponding to different black body temperatures are calculated according to the number of the data frames of the detector corresponding to the black body temperature; thus calculating NETD and MRTD.
Further, the correspondence between the blackbody temperature and the number of the acquired data frames of the detector specifically includes: the corresponding relation between the blackbody temperature rise and the number of the collected data frames of the detector is established in the following process:
a1, setting the black body into a linear temperature changing mode through an upper computer control system;
a2, setting the blackbody temperature to be 2K through upper computer control system, after treating that the blackbody temperature is stable, setting the blackbody temperature to be 1K through upper computer control system, continuously acquiring detector data simultaneously, recording the number of detector data frames F acquired when treating that the blackbody temperature is stable from 2K to 1K0；
A3, setting the blackbody temperature to be 2K through the upper computer control system, after the blackbody temperature is stable, setting the blackbody temperature to be-2K through the upper computer control system, continuously acquiring detector data, and recordingThe number of acquired detector data frames F when the blackbody temperature is stabilized from 2K to-2K1；
A4, obtaining the increase F of the frame number of the acquired detector data when the blackbody temperature decreases by 1K according to the linear relation0。
Furthermore, when the blackbody temperature is stabilized to be 2K, the 1 st frame data of the detector is acquired; when the blackbody temperature is stabilized from 2K to 1K, the F < th > of the detector is acquired0Frame data; when the blackbody temperature is stabilized from 2K to 0K, the 2F of the detector is acquired0Frame data; when the blackbody temperature is stabilized to-1K at 2K, the 3F of the detector is acquired0Frame data; when the blackbody temperature is stabilized to-2K, the 4F of the detector is acquired0And (4) frame data.
Further, when calculating NETD, the method further includes: calculating the response and the noise corresponding to the blackbody temperature according to the data frame number of the detector corresponding to different blackbody temperatures, specifically: respectively according to the acquired 1 st frame data and F th frame data of the detector0Frame data, No. 2F0Frame data, No. 3F0Frame data, 4F0Respectively taking left and right 3 frames of data of frame data to carry out average calculation, and sequentially obtaining output signal voltages of corresponding detectors when the blackbody temperature is stabilized to be 2K, 1K, 0K, -1K and-2K; thereby calculating a signal transfer function;
when the blackbody temperature is stabilized to-2K, acquiring voltage data of output signals of the thermal infrared imager detector to be detected in F frames, and calculating the noise of the detector;
and calculating NETD according to the signal transfer function and the noise of the detector.
Further, when the MRTD is calculated for the first time, the calculation process is as follows:
b1, setting the target as a 4-rod target, setting the black body as 0K, and recording the voltage and the V of a first output signal under the detector target area of the thermal infrared imager to be tested at the moment0；
B2, heating the black body to 2K, gradually reducing the temperature of the black body from 2K after the temperature of the black body is stable, gradually reducing the radiation energy of the radiation signal entering the collimator, and immediately reducing the radiation energy when the 4-rod target is at onceWhen the area of each rod of the 4-rod target and the area of the adjacent two rods are invisible, namely when 75% of the area of each rod of the 4-rod target and 75% of the area of the adjacent two rods are just invisible, the first temperature of the corresponding black body is obtained, the difference delta T & lt + & gt between the first temperature of the black body and the ambient temperature at the moment is recorded, and the voltage V & lt + & gt of a first output signal under the detector target area of the thermal infrared imager to be measured at the0Voltage difference of (delta V)1；
B3, continuously reducing the temperature of the black body, reducing the energy of the radiation signal entering the collimator until a cold rod appears, obtaining a corresponding second temperature of the black body, recording the difference delta T between the second temperature of the black body and the ambient temperature, and recording the voltage and the V of a second output signal under the detector target area of the thermal infrared imager to be detected at the moment0Voltage difference of (delta V)2(ii) a Thereby calculating the corresponding MRTD.
Further, when calculating MRTD again, the calculation process is:
continuously reducing the temperature of the black body from 2K to-2K, and collecting continuous frame signal voltage data of the thermal infrared imager to be detected; when the target can meet the requirements that the left side and the right side are half-moon targets and 4-rod targets, the process can be calculated simultaneously with NETD test; when the voltage of a third output signal under a detector target area of the thermal infrared imager to be detected is equal to V through the acquired signal voltage data0Voltage difference and Δ V of1When the black body temperature is equal, calculating to obtain a corresponding black body third temperature according to the relation between the acquisition frame number of the detector and the black body temperature, and recording the difference between the black body third temperature and the environment temperature; when the voltage and V of the fourth output signal under the detector target area of the thermal infrared imager to be detected0Voltage difference and Δ V of2When the blackbody temperature is equal, calculating to obtain a corresponding blackbody fourth temperature according to the relation between the acquisition frame number of the detector and the blackbody temperature, and recording the difference between the blackbody fourth temperature and the environment temperature; thereby calculating the corresponding MRTD.
The invention has the beneficial effects that: according to the method, the relation between response data of the thermal infrared imager and the temperature of the black body under the corresponding frame number is deduced by acquiring the linear temperature change of the black body and the data of the thermal infrared imager at the corresponding time, the NETD is calculated by utilizing the response data of the thermal infrared imager of a specific frame under the continuous temperature change of the black body, the temperature stabilization process of five temperature points of the black body does not need to be waited in sequence, the measuring time is greatly shortened compared with the prior art, and the test efficiency of the NETD is remarkably improved; meanwhile, the relation between the response data and the black body temperature under the corresponding frame number is utilized to calculate the black body temperature under the corresponding voltage difference, the stability of the black body temperature does not need to be waited, and the MRTD testing efficiency is obviously improved.
Drawings
Fig. 1 is a flow chart of the NETD rapid test method of the present invention;
FIG. 2 is a flow chart of the MRTD rapid test method of the present invention;
fig. 3 is a schematic structural diagram of a rapid testing device for a thermal infrared imager NETD and MRTD provided in an embodiment of the present invention;
wherein, 1 is a black body, 2 is a collimator, 3 is a thermal infrared imager and a 4-position upper computer.
Detailed Description
In order to facilitate the understanding of the technical contents of the present invention by those skilled in the art, the present invention will be further explained with reference to the accompanying drawings.
As shown in fig. 1, the present invention provides a rapid test method for NETD, which includes the following steps:
step 1: pretreatment of
Setting the black body to be in a linear temperature change mode;
setting the target as a half-moon target;
setting the blackbody to be 2K by using a blackbody controller, and waiting for the temperature of the blackbody to be stable;
utilize black body controller to set up the blackbody to 1K to continuously gather detector data simultaneously, wait that the blackbody temperature stabilizes from 2K to 1K, and record this moment and gather data frame number for F0And (5) frame.
Step 2: data acquisition
Utilize the blackbody controller, set up the blackbody temperature to 2K, wait that the blackbody is stable, after the blackbody is stable, set up the blackbody to-2K to continuously gather detector data simultaneously, wait that the blackbody temperature is stable to be-2K, preserve the F that the blackbody was gathered during the cooling down1And (4) frame data.
And after the blackbody temperature is-2K and stable, collecting a group of signal voltage data of the thermal infrared imager to be tested of F frames for calculating the noise Vn.
And step 3: data computation
Obtaining the relation between the blackbody temperature rise and the frame number obtained by the preprocessing, wherein each blackbody temperature fall is 1K, and the detector acquires F in the period0Frame data, so when the blackbody temperature is reduced from 2K to stable 2K, 1K, 0K, -1K, -2K, the total frame number of the data correspondingly acquired by the detector is 1 and F respectively0、2F0、3F0、4F0(ii) a When the blackbody temperature is stabilized at 2K, 1K, 0K, -1K, -2K, the data collected by the detector are respectively the 1 st frame and the F th frame0Frame, 2F0Frame, 3F0Frame, 4F0The method comprises the steps of averaging left and right 3 frames of data of the frames to obtain signal voltage data of a corresponding detector at five temperature points of a black body;
and utilizing the acquired output signal voltage under the semilunar target area of the detector. The noise (Vn) is further calculated according to equation (1):
wherein K represents an influence factor, and the default value is 1; f represents T0The number of the acquisition frames at the temperature is 100 under the default condition; t is0Represents the temperature at-2K; vDS[(i,j),To,f]Expressed at the black body temperature T0Under the condition, the detector outputs signal voltage;
expressed at the black body temperature T0Under the condition, the detector outputs a signal voltage mean value; i represents the abscissa of a certain signal voltage in the signal voltage matrix acquired by the detector array, and j represents the ordinate of a certain signal voltage in the signal voltage matrix acquired by the detector array.
Calculating a fitting curve by using the output signal voltage under the target region of half a month under each temperature point through a least square method, and then calculating a signal transfer function (SiTF) according to a formula (2):
in the formula: Δ T represents the black body temperature difference, i.e., -2K to 2K; Δ Vs represents the signal response difference corresponding to the black body temperature difference, i.e., the voltage difference of the signal voltages at the fitting curve-2K and 2K;
calculating the final NETD according to a formula (3);
as shown in fig. 2, the MRTD testing process of the present invention is:
the temperature is changed through the black body, when the 4-rod target is not visible at once, the difference delta T + between the corresponding temperature point and the ambient temperature is recorded, and the corresponding signal voltage R at the moment is recorded1(ii) a Then gradually reducing the temperature of the black body until the difference delta T-between the corresponding temperature point and the ambient temperature is recorded when a cold rod appears, and recording the corresponding signal voltage R at the moment2(ii) a MRTD is calculated using equation (4).
The 4-bar target here is not visible at once, specifically: the observer can just not see 75% of the area of each rod and 75% of the area between two adjacent rods for the 4-rod target.
When testing MRTD again, R obtained by the first test is utilized1Voltage V at ambient temperature0Difference of delta V1，R2Voltage V at ambient temperature0Difference of delta V2. Continuously reducing the temperature of the black body from 2K to-2K, and collecting continuous frame signal voltage data of the thermal infrared imager to be detected; when the voltage of a third output signal under a detector target area of the thermal infrared imager to be detected is equal to V through the acquired signal voltage data0Voltage difference and Δ V of1When the black body temperature is equal, calculating to obtain a corresponding black body third temperature according to the relation between the acquisition frame number of the detector and the black body temperature, and recording the difference delta T & lt + & gt between the black body third temperature and the environment temperature; when the fourth output signal is under the detector target area of the thermal infrared imager to be detectedVoltage and V0Voltage difference and Δ V of2When the blackbody temperature is equal, calculating to obtain a corresponding blackbody fourth temperature according to the relation between the acquisition frame number of the detector and the blackbody temperature, and recording the difference delta T between the blackbody fourth temperature and the environment temperature; the corresponding MRTD is calculated according to the national standard GJB 2340-95.
In the formula: f represents the corresponding spatial frequency; cor (T)ba) Represents an ambient temperature correction coefficient; τ represents the transmittance of the optical channel
The 4-bar target here is not visible at once, specifically: the 4-bar cold bar target is seen at 75% of the area per bar and 75% of the area between two adjacent bars.
The NETD and MRTD quick test method is particularly suitable for a thermal infrared imager NETD and MRTD quick test device without a DMD as shown in figure 3.
The method can be controlled by an upper computer, so that a half-moon target required by NETD test is generated on one side of the picture, and a four-rod target required by MRTD is generated on the other side of the picture; when the left side and the right side of the target are respectively a half-moon target and a 4-rod target, NETD and MRTD tests can be carried out simultaneously.
It will be appreciated by those of ordinary skill in the art that the embodiments described herein are intended to assist the reader in understanding the principles of the invention and are to be construed as being without limitation to such specifically recited embodiments and examples. Various modifications and alterations to this invention will become apparent to those skilled in the art. Any modification, equivalent replacement, or improvement made within the spirit and principle of the present invention should be included in the scope of the claims of the present invention.
Claims (2)
1. A method for rapidly testing NETD and MRTD of a thermal infrared imager is characterized in that by establishing a corresponding relation between black body temperature and the number of collected data frames of a detector, responses and noises corresponding to different black body temperatures are calculated according to the number of data frames of the detector corresponding to the black body temperature; thus calculating NETD and MRTD;
the corresponding relation between the blackbody temperature and the number of the collected data frames of the detector specifically comprises the following steps: the corresponding relation between the blackbody temperature rise and the number of the collected data frames of the detector is established in the following process:
a1, setting the black body into a linear temperature change mode through an upper computer control system;
a2, setting the target as a semilunar target;
a3, setting the blackbody temperature to be 2K through upper computer control system, after treating that the blackbody temperature is stable, setting the blackbody temperature to be 1K through upper computer control system, continuously acquiring detector data simultaneously, recording the number of detector data frames F acquired when treating that the blackbody temperature is stable from 2K to 1K0；
A4, setting the blackbody temperature to be 2K through the upper computer control system, after the blackbody temperature is stable, setting the blackbody temperature to be-2K through the upper computer control system, continuously acquiring detector data, and recording the number of acquired detector data frames F when the blackbody temperature is stable from 2K to-2K1；
A5, obtaining the increase F of the frame number of the acquired detector data when the blackbody temperature decreases by 1K according to the linear relation0；
When the blackbody temperature is stabilized to be 2K, acquiring the 1 st frame data of the detector; when the blackbody temperature is stabilized from 2K to 1K, the F < th > of the detector is acquired0Frame data; when the blackbody temperature is stabilized from 2K to 0K, the 2F of the detector is acquired0Frame data; when the blackbody temperature is stabilized to-1K at 2K, the 3F of the detector is acquired0Frame data; when the blackbody temperature is stabilized from 2K to-2K, the 4F of the detector is acquired0Frame data;
calculating the expression of NETD as follows:
wherein, VNThe representation of the noise is represented by,
k represents an influence factor; f represents T0The number of frames collected at temperature; t is0Represents the temperature at-2K; vDS[(i,j),To,f]Expressed at the black body temperature T0Under the condition, the detector outputs signal voltage;
expressed at the black body temperature T0Under the condition, the detector outputs a signal voltage mean value; i represents the abscissa of a certain signal voltage in the signal voltage matrix acquired by the detector array, j represents the ordinate of a certain signal voltage in the signal voltage matrix acquired by the detector array, SiTF represents the signal transfer function,
Δ T represents the black body temperature difference; Δ Vs represents the signal response difference corresponding to the black body temperature difference;
when the MRTD is calculated for the first time, the calculation process is as follows:
b1, setting the target as a 4-rod target, setting the black body as 0K, and recording the voltage and the V of a first output signal under the detector target area of the thermal infrared imager to be tested at the moment0；
B2, heating the black body to 2K, after the temperature of the black body is stable, gradually reducing the temperature of the black body from 2K to gradually reduce the radiation energy of the radiation signal entering the collimator, when the 4-rod target is immediately invisible, namely 75% of the area of each rod of the 4-rod target and 75% of the area between two adjacent rods are just invisible, obtaining the first temperature of the corresponding black body, recording the difference delta T + between the first temperature of the black body and the ambient temperature, and recording the voltage and the V of the first output signal under the detector target area of the thermal infrared imager to be detected at the moment0Voltage difference of (delta V)1；
B3, continuously reducing the temperature of the black body, reducing the energy of the radiation signal entering the collimator until a cold rod appears, obtaining a corresponding second temperature of the black body, recording the difference delta T between the second temperature of the black body and the ambient temperature, and recording the voltage and the V of a second output signal under the detector target area of the thermal infrared imager to be detected at the moment0Voltage difference of (delta V)2(ii) a Thereby calculating a corresponding MRTD;
when MRTD is calculated again, the calculation process is:
continuously reducing the temperature of the black body from 2K to-2K, and collecting continuous frame signal voltage data of the thermal infrared imager to be detected; when the voltage of a third output signal under a detector target area of the thermal infrared imager to be detected is equal to V through the acquired signal voltage data0Voltage difference and Δ V of1When the black body temperature is equal, calculating to obtain a corresponding black body third temperature according to the relation between the acquisition frame number of the detector and the black body temperature, and recording the difference between the black body third temperature and the environment temperature;
when the voltage and V of the fourth output signal under the detector target area of the thermal infrared imager to be detected0Voltage difference and Δ V of2When the blackbody temperature is equal, calculating to obtain a corresponding blackbody fourth temperature according to the relation between the acquisition frame number of the detector and the blackbody temperature, and recording the difference between the blackbody fourth temperature and the environment temperature; thereby calculating a corresponding MRTD;
the expression for calculating MRTD is:
wherein f represents the corresponding spatial frequency; cor (T)ba) Represents an ambient temperature correction coefficient; τ represents the transmittance of the optical channel.
2. The method for rapidly testing the thermal infrared imagers, NETD and MRTD, according to claim 1, is characterized in that when calculating the NETD, the method further comprises the following steps:
calculating the response and the noise corresponding to the blackbody temperature according to the data frame number of the detector corresponding to different blackbody temperatures, specifically: respectively according to the acquired 1 st frame data and F th frame data of the detector0Frame data, No. 2F0Frame data, No. 3F0Frame data, 4F0Respectively taking left and right 3 frames of data of frame data to carry out average calculation, and sequentially obtaining output signal voltages of corresponding detectors when the blackbody temperature is stabilized to be 2K, 1K, 0K, -1K and-2K; thereby calculatingA signal transfer function;
when the blackbody temperature is stabilized to-2K, acquiring voltage data of output signals of the thermal infrared imager detector to be detected in F frames, and calculating the noise of the detector;
and calculating NETD according to the signal transfer function and the noise of the detector.
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