CN113532663A - Method, device and equipment for acquiring responsivity of infrared detector and storage medium - Google Patents
Method, device and equipment for acquiring responsivity of infrared detector and storage medium Download PDFInfo
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Abstract
The application is applicable to the technical field of infrared detectors, and provides a method, a device, equipment and a storage medium for acquiring the responsivity of an infrared detector. The method for acquiring the responsivity of the infrared detector comprises the following steps: acquiring multiple groups of test data and target surface temperatures corresponding to each group of test data, wherein each group of test data comprises voltage data obtained by an infrared detector based on infrared radiation of two preset black bodies at the corresponding target surface temperature, the target surface temperatures corresponding to the multiple groups of test data are different, and the two preset black bodies have a preset temperature difference; and for each group of test data, calculating the difference value of the voltage data included in the test data, and obtaining the response rate at the target surface temperature corresponding to the test data according to the difference value and the preset temperature difference value. The method for acquiring the response rate of the infrared detector can improve the accuracy of the response rate calculation result.
Description
Technical Field
The present application belongs to the field of infrared detector technology, and in particular, to a method, an apparatus, a device, and a storage medium for obtaining a response rate of an infrared detector.
Background
In daily life, many devices need to be provided with infrared detectors to meet the requirements of fields such as security inspection, night photography and the like. The infrared detector can be divided into a refrigerator and a refrigerator-free infrared detector, and the refrigerator-free infrared detector gradually occupies the infrared detector market due to the high cost of the refrigerator.
The responsivity is an important parameter of the infrared detector, the temperature measurement performance of the infrared detector is represented, and the temperature of an object detected by the infrared detector can be calculated through the responsivity, so that whether the responsivity of the infrared detector is accurate or not directly influences the use effect of the infrared detector.
The temperature measurement function of the infrared detector is mainly completed by a focal plane array, which is also called a target surface and can receive infrared radiation emitted by an object due to the temperature of the object and convert the infrared radiation into other measurable physical signals. The responsivity of the infrared detector is different under different target surface temperatures, the target surface temperature of the infrared detector without the refrigerator is easily influenced by the external environment and is unstable, the obtained corresponding data is inaccurate, and the calculation result of the responsivity under the target surface temperature is further inaccurate. The existing calculation method for the response rate cannot avoid the influence of the target surface temperature on the response rate, so a method is urgently needed to improve the accuracy of the calculation result of the response rate.
Disclosure of Invention
The application provides a method, a device, equipment and a storage medium for acquiring the response rate of an infrared detector, which can solve the problem that the calculation result of the response rate is not accurate enough.
In a first aspect, an embodiment of the present application provides a method for obtaining a responsivity of an infrared detector, including:
acquiring multiple groups of test data and target surface temperatures corresponding to each group of test data, wherein each group of test data comprises voltage data obtained by an infrared detector based on infrared radiation of two preset black bodies at the corresponding target surface temperature, the target surface temperatures corresponding to the multiple groups of test data are different, and the two preset black bodies have a preset temperature difference;
and calculating the difference of the voltage data included in the test data for each group of test data, and obtaining the response rate at the target surface temperature corresponding to the test data according to the difference and the preset temperature difference.
In a possible implementation manner of the first aspect, the obtaining, according to the difference and the preset temperature difference, a response rate at a target surface temperature corresponding to the test data includes:
and determining the ratio of the difference to the preset temperature difference as the response rate of the target surface corresponding to the test data at the temperature.
In a possible implementation manner of the first aspect, the obtaining, according to the difference and the preset temperature difference, a response rate at a target surface temperature corresponding to the test data includes:
determining the ratio of the difference value to the preset temperature difference value as an intermediate response rate;
determining the ratio of the intermediate response rate to a reference response rate as the response rate of the test data at the target surface temperature; and the reference response rate is an intermediate response rate corresponding to the target surface temperature in the target surface temperatures respectively corresponding to the multiple groups of test data.
In a possible implementation manner of the first aspect, after obtaining the response rate at the target surface temperature corresponding to the test data, the method further includes:
and fitting the response rates of the multiple groups of test data at the target surface temperature respectively to obtain response rate fitting curves.
In a possible implementation manner of the first aspect, after the fitting the responsivities of the multiple sets of test data at the target surface temperature respectively to obtain a responsivity fitting curve, the method further includes:
judging whether the fitted curve has an inflection point or a pole in a preset target surface temperature range;
and if the inflection point or the pole exists, correcting the fitting curve.
In a possible implementation manner of the first aspect, the modifying the fitted curve includes:
removing abnormal data in the multiple groups of test data;
and fitting the response rates of the plurality of groups of test data with the abnormal data removed at the target surface temperature respectively to obtain a corrected response rate fitting curve.
In a possible implementation manner of the first aspect, the modifying the fitted curve includes:
and re-executing the steps of obtaining the multiple groups of test data and the target surface temperature corresponding to each group of test data, and fitting the response rates of the multiple groups of newly obtained test data at the target surface temperatures respectively corresponding to the target surface temperatures to obtain a corrected response rate fitting curve.
In a second aspect, an embodiment of the present application provides an apparatus for obtaining a responsivity of an infrared detector, including:
the data acquisition module is used for acquiring a plurality of groups of test data and target surface temperatures corresponding to each group of test data, each group of test data comprises voltage data obtained by an infrared detector based on infrared radiation of two preset black bodies at the corresponding target surface temperature, the target surface temperatures corresponding to the plurality of groups of test data are different, and the two preset black bodies have preset temperature difference values;
and the response rate calculation module is used for calculating the difference value of the voltage data included in the test data for each group of test data, and obtaining the response rate at the target surface temperature corresponding to the test data according to the difference value and the preset temperature difference value.
In a third aspect, an embodiment of the present application provides a terminal device, including: a memory, a processor and a computer program stored in the memory and executable on the processor, wherein the processor implements the method for obtaining the responsivity of the infrared detector according to any one of the first aspect.
In a fourth aspect, the present application provides a computer-readable storage medium, where a computer program is stored, and when the computer program is executed by a processor, the method for acquiring the responsivity of the infrared detector in any one of the above first aspects is implemented.
According to the method, the device, the equipment and the storage medium for acquiring the responsivity of the infrared detector, stable temperature data of two preset black bodies with preset temperature difference values are received, so that errors of test data obtained by converting the infrared detector at the same target surface temperature are the same. The response rate under the target surface temperature corresponding to the test data is obtained by obtaining multiple groups of test data and the target surface temperature corresponding to each group of test data and calculating according to the difference value of the multiple groups of test data and the preset temperature difference value of two preset black bodies. Under the condition that the errors of the test data obtained by conversion under the same target surface temperature are the same, the difference value of the test data is used for calculating the response rate, so that the errors of the target surface temperature on the test data can be eliminated, and the calculated response rate is more accurate.
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In order to more clearly illustrate the technical solutions in the embodiments of the present application, the drawings needed to be used in the embodiments or the prior art descriptions will be briefly described below, and it is obvious that the drawings in the following description are only some embodiments of the present application, and it is obvious for those skilled in the art to obtain other drawings based on these drawings without inventive exercise.
Fig. 1 is a schematic flowchart of a method for acquiring a responsivity of an infrared detector according to an embodiment of the present application;
fig. 2 is a schematic diagram of a test scenario provided in an embodiment of the present application;
fig. 3 is a block diagram of a device for acquiring a responsivity of an infrared detector according to an embodiment of the present application;
fig. 4 is a schematic structural diagram of a terminal device according to an embodiment of the present application.
Detailed Description
In order to make the objects, technical solutions and advantages of the present application more apparent, the present application is described in further detail below with reference to the accompanying drawings and embodiments. It should be understood that the specific embodiments described herein are merely illustrative of the present application and are not intended to limit the present application. In the present application, different technical features may be combined with each other without conflict.
Fig. 1 is a schematic flowchart of a method for acquiring a responsivity of an infrared detector according to an embodiment of the present disclosure, and as shown in fig. 1, the method for acquiring a responsivity according to an embodiment of the present disclosure includes:
s101, obtaining multiple groups of test data and target surface temperatures corresponding to each group of test data, wherein each group of test data comprises voltage data obtained by an infrared detector based on infrared radiation of two preset black bodies at the corresponding target surface temperature, the target surface temperatures corresponding to the multiple groups of test data are different, and the two preset black bodies have preset temperature difference values.
Exemplarily, fig. 2 is a schematic diagram of a test scenario provided in an embodiment of the present application, and as shown in fig. 2, in the method for obtaining a responsivity of an infrared detector provided in an embodiment of the present application, required test equipment includes: black body 11, black body 12, infrared detector target surface 21 and temperature sensor 22. The black body 11 and the black body 12 are heat sources with stable temperature, the infrared detector target surface 21 is arranged in the vacuum environment 20, and the infrared detector target surface 21 is connected with the temperature sensor 22.
It should be understood that the temperature measurement function of the infrared detector is mainly performed by the target surface of the infrared detector, and therefore, the response rate of the infrared detector in the embodiment of the present application, specifically, the response rate of the target surface of the infrared detector, should be mentioned.
Specifically, as shown in fig. 2, the black body 11 and the black body 12 continuously generate constant infrared radiation, the infrared detector target surface 21 may receive the infrared radiation generated by the black body 11 and the black body 12, respectively, and convert the infrared radiation into voltage data, and the target surface temperature of the infrared detector target surface 21 may be changed by changing the ambient temperature of the vacuum environment 20. Therefore, in the testing process, the terminal device 4 may obtain the voltage data obtained by converting the target surface 21 of the infrared detector, and obtain the current target surface temperature acquired by the temperature sensor 22, so as to obtain a set of testing data and the target surface temperature corresponding to the set of testing data. And changing the target surface temperature of the target surface 21 of the infrared detector for multiple times to obtain multiple groups of test data and the target surface temperature corresponding to each group of test data.
It can be understood that the amount of infrared radiation generated by the black body is determined by the temperature of the black body, and therefore, in order to ensure that two preset black bodies can continuously generate constant infrared radiation, the temperature of the two preset black bodies is not changed in the test process, that is, the difference value between the preset temperatures of the two preset black bodies is not changed in the test process. For example, the temperature of the black body 11 may be 50 ℃, the temperature of the black body 12 may be 30 ℃, and the preset temperature difference between the two preset black bodies is 20 ℃.
Optionally, the voltage data is a converted digital signal value, the resolution of the voltage data may be 14 bits, and the voltage data is used as gray data in a temperature measurement result by the infrared detector during temperature measurement to display a temperature measurement image.
And S102, calculating a difference value of voltage data included in the test data for each group of test data, and obtaining the response rate at the target surface temperature corresponding to the test data according to the difference value and the preset temperature difference value.
Specifically, the target surface temperatures corresponding to the multiple groups of test data are different, each target surface temperature corresponds to one group of test data, the response rate of the target surface temperature corresponding to the group of test data can be obtained according to one group of test data and a preset temperature difference value, and the response rate of the multiple groups of test data at the corresponding target surface temperature can be obtained according to the multiple groups of test data and the preset temperature difference value.
The embodiment of the application receives stable temperature data of two preset blackbodies with preset temperature difference values, so that the errors of test data obtained by converting the infrared detector under the same target surface temperature are the same. The response rate under the target surface temperature corresponding to the test data is obtained by obtaining multiple groups of test data and the target surface temperature corresponding to each group of test data and calculating according to the difference value of the multiple groups of test data and the preset temperature difference value of two preset black bodies. Under the condition that the errors of the test data obtained by conversion under the same target surface temperature are the same, the difference value of the test data is used for calculating the response rate, so that the errors of the target surface temperature on the test data can be eliminated, and the calculated response rate is more accurate.
Optionally, an embodiment of the present application provides a possible implementation manner of S102, where S102 includes:
and determining the ratio of the difference to the preset temperature difference as the response rate of the target surface temperature corresponding to the test data.
Specifically, in this implementation, the calculation formula of the response rate may be:
wherein T represents the target surface temperature, kTDenotes the response, Δ AD, at the target surface temperature TTAnd the difference value of the voltage data acquired under the target surface temperature T is represented, and the delta T represents the preset temperature difference value of the two preset black bodies.
For infrared detectors without a refrigerator, the target surface temperature affects the value of the voltage data, thereby making the responsivity calculated based on the voltage data inaccurate. When the response rate corresponding to the target surface temperature is calculated, the difference value of the voltage data at the target surface temperature is selected as the test data, and because the influence on the voltage data at the same target surface temperature is the same, the technical scheme adopted by the embodiment of the application can subtract the error of the voltage data caused by the target surface temperature, and the ratio of the test data to the preset temperature difference value is used as the response rate, so that the error caused by the target surface temperature to the response rate can be eliminated, and the calculated response rate is more accurate.
Optionally, another possible implementation manner of S102 is further provided in this embodiment, where S102 includes:
and determining the ratio of the difference value to the preset temperature difference value as the intermediate response rate.
And determining the ratio of the intermediate response rate to the reference response rate as the response rate of the target surface corresponding to the test data. And the reference response rate is an intermediate response rate corresponding to the target surface temperature in the target surface temperatures respectively corresponding to the multiple groups of test data.
Optionally, the target surface temperature may be any one of the target surface temperatures corresponding to the test data, or may be a preset target surface temperature.
Illustratively, the target surface temperature in the test data can include 5 ℃, 10 ℃, 15 ℃, 20 ℃, 25 ℃, 30 ℃, 35 ℃, 40 ℃, and the plurality of intermediate responsivities at the corresponding target surface temperature include k5、k10、k15、k20、k25、k30、k35、k40If the preset target surface temperature is 25 ℃, the response rate corresponding to the target surface temperature at the room temperature of 25 ℃, namely k25As the reference response rate, the response rate of the finally obtained test data at the target surface temperature comprises
1、
The reference response rate is selected, the ratio of the reference response rate to the intermediate response rate is used as the final response rate, the response rate at the ambient temperature familiar to the user can be conveniently selected by the user as the reference response rate, the difference between the response rates at other target surface temperatures and the reference response rate familiar to the user can be visually observed through the ratio, the response rate is simplified, the simplified response rate is provided for the subsequent fitting of the response rate, and the calculated amount is reduced.
Optionally, on the basis of the foregoing embodiment, after S102, the method for acquiring the responsivity of the infrared detector provided in the embodiment of the present application may further include:
s103, fitting the response rates of the multiple groups of test data at the target surface temperature respectively to obtain response rate fitting curves.
Optionally, the response fitting curve is a third-order curve. Illustratively, the formula of the response-fit curve before fitting is:
k(T)＝a·T3+b·T2+c·T+d
wherein k (T) is the responsivity of the target surface temperature T, a, b, c and d are fitting coefficients to be determined, and T is the target surface temperature.
Optionally, after S103, the embodiment of the present application may further include:
and judging whether the fitted curve has an inflection point or a pole in a preset target surface temperature range. And if the inflection point or the pole exists, modifying the fitting curve.
Optionally, the preset target surface temperature range is a target surface temperature range in which the user wants to obtain the response rate. For example-20 ℃ to 60 ℃.
The function curve has a first derivative of 0 at the poles and a second derivative of 0 at the inflection points. The pole refers to the maximum or minimum value of the curve mathematically, and if the pole exists in the curve, the curve is represented as a non-monotone increasing or monotone decreasing curve. An inflection point mathematically refers to a point that changes the curve in the upward or downward direction, and if an inflection point exists in the curve, it means that the curve is not a monotonically increasing or monotonically decreasing curve. According to the physical characteristics of the responsivity of the infrared detector, the responsivity curve is in a monotone decreasing trend along with the rise of the temperature of the target surface, so that a qualified responsivity fitting curve is a monotone decreasing curve, and no pole is arranged in a preset temperature range of the target surface.
For example, taking the fitting curve as a third-order curve as an example, the calculation formulas of the inflection point and the pole are respectively as follows:
k″(T)＝6a·T+2b
k′(T)＝3a·T2+2b·T+c
solving, the abscissa of the inflection point is-b/3 a, and the calculation method of the abscissa of the pole is as follows:
wherein none represents no pole.
Thus, taking the inflection point as an example, when the target surface temperature is equal to-b/3 a, the inflection point appears in the curve fitted to the responsivity. If the inflection point falls within a predetermined target surface temperature range, for example, -20 ℃ or more and-b/3 a or more and 60 ℃ or less, it means that the fitting curve is not qualified and the fitting curve needs to be corrected.
Optionally, modifying the fitted curve may include:
and removing abnormal data in the plurality of groups of test data. And fitting the response rates of the plurality of groups of test data with the abnormal data removed at the target surface temperature respectively to obtain a corrected response rate fitting curve.
Optionally, whether the test data is abnormal data is judged according to the characteristic that the response rate curve is in a monotone decreasing trend along with the rise of the target surface temperature.
Specifically, the response rate represents the response degree of the infrared detector to the received infrared radiation, and the test data obtained by converting the received infrared radiation represents the magnitude of the response degree, so that the response rate is positively correlated with the magnitude of the test data, that is, the test data also has a monotonically decreasing trend along with the rise of the temperature of the target surface. Therefore, if a certain group or a certain test data in a certain group of the plurality of groups of test data does not accord with the monotone decreasing trend, the abnormal data is regarded as abnormal data and removed. For example, if a certain test data is larger or smaller than both the previous and subsequent test data, the test data is removed.
Whether the acquired test data are abnormal or not is judged according to the theoretical increase and decrease trend of the test data, so that abnormal data are removed in time, the accuracy of a response rate fitting curve is improved, and the accuracy of the response rate is improved.
Optionally, removing abnormal data in the plurality of sets of test data may also be performed after S101 and before S102. Abnormal data are removed before the response rate is calculated, and the accuracy of the response rate fitting curve is improved.
Optionally, modifying the fitted curve may further include:
and re-executing the steps of obtaining the multiple groups of test data and the target surface temperature corresponding to each group of test data, and fitting the response rates of the multiple groups of newly obtained test data at the target surface temperatures respectively corresponding to the target surface temperatures to obtain a corrected response rate fitting curve.
It should be understood that the two ways of modifying the fitted curve may be either optional or used in combination. For example, abnormal data in multiple sets of test data may be removed, the step of obtaining multiple sets of test data and the target surface temperature corresponding to each set of test data may be performed again, the abnormal data in multiple sets of test data may be removed after the step of obtaining multiple sets of test data and the target surface temperature corresponding to each set of test data is performed again, the abnormal data in multiple sets of test data may be removed after S101 and before S102, and in this case, if an inflection point or a pole exists in the fitting curve within the preset target surface temperature range, the step of obtaining multiple sets of test data and the target surface temperature corresponding to each set of test data is performed again to correct the response rate fitting curve. The embodiment of the present application does not limit this.
The test data can be directly updated by reacquiring the test data, the response rates of the multiple groups of test data at the target surface temperature respectively corresponding to the target surface temperature are refitted, the step of exploring abnormal data is omitted, and the aim of correcting the fitting curve can be achieved by directly covering the new test data when the abnormal data are not found well.
Optionally, after the response rate fitting curve or the corrected response rate fitting curve is obtained, the response rate of the infrared detector in the preset target surface temperature range can be obtained according to the preset target surface temperature range and the response rate fitting curve or the corrected response rate fitting curve.
Optionally, after the response rate fitting curve or the corrected response rate fitting curve is obtained, the terminal device may display the response rate fitting curve or the corrected response rate fitting curve, and the user may obtain the target surface temperature and the response rate corresponding to the point through a point-taking operation. The target surface temperature and the response rate of the point to be known can be directly obtained through point taking operation, and the response rate curve can be more visually observed by a user through displaying the fitting curve.
Fig. 3 shows a block diagram of a device for acquiring the responsivity of an infrared detector according to an embodiment of the present application. As shown in fig. 3, the apparatus for obtaining the responsivity of the infrared detector provided in this embodiment may include:
the data obtaining module 301 is configured to obtain multiple sets of test data and target surface temperatures corresponding to each set of test data, where each set of test data includes voltage data obtained by an infrared detector based on infrared radiation of two preset black bodies at a corresponding target surface temperature, the target surface temperatures corresponding to the multiple sets of test data are different, and the two preset black bodies have a preset temperature difference;
and a response rate calculating module 302, configured to calculate, for each group of test data, a difference between voltage data included in the test data, and obtain, according to the difference and the preset temperature difference, a response rate at a target surface temperature corresponding to the test data.
Optionally, the response rate calculating module 302 is specifically configured to:
and determining the ratio of the difference to the preset temperature difference as the response rate of the target surface corresponding to the test data at the temperature.
Optionally, the response rate calculating module 302 is specifically configured to:
determining the ratio of the difference value to the preset temperature difference value as an intermediate response rate;
determining the ratio of the intermediate response rate to a reference response rate as the response rate of the test data at the target surface temperature; and the reference response rate is an intermediate response rate corresponding to the target surface temperature in the target surface temperatures respectively corresponding to the multiple groups of test data.
Optionally, the apparatus for obtaining the responsivity of the infrared detector provided in this embodiment may further include:
and the curve fitting module 303 is configured to fit the responsivities of the multiple groups of test data at the target surface temperatures respectively to obtain a responsivity fitting curve.
Optionally, the curve fitting module 303 may further be configured to:
judging whether the fitted curve has an inflection point or a pole in a preset target surface temperature range;
and if the inflection point or the pole exists, correcting the fitting curve.
Optionally, the curve fitting module 303 is specifically configured to:
removing abnormal data in the multiple groups of test data;
and fitting the response rates of the plurality of groups of test data with the abnormal data removed at the target surface temperature respectively to obtain a corrected response rate fitting curve.
Optionally, the curve fitting module 303 is further specifically configured to:
and re-executing the steps of obtaining the multiple groups of test data and the target surface temperature corresponding to each group of test data, and fitting the response rates of the multiple groups of newly obtained test data at the target surface temperatures respectively corresponding to the target surface temperatures to obtain a corrected response rate fitting curve.
Optionally, the apparatus for obtaining the responsivity of the infrared detector provided in this embodiment may further include:
and the display module is used for displaying the response rate fitting curve or the corrected response rate fitting curve.
The apparatus for obtaining the responsivity of the infrared detector provided in this embodiment is used to execute the method for obtaining the responsivity of the infrared detector provided in this embodiment of the present application, and the technical principle and the technical effect are similar to each other.
It will be apparent to those skilled in the art that, for convenience and brevity of description, only the above-mentioned division of the functional units and modules is illustrated, and in practical applications, the above-mentioned function distribution may be performed by different functional units and modules according to needs, that is, the internal structure of the apparatus is divided into different functional units or modules to perform all or part of the above-mentioned functions. Each functional unit and module in the embodiments may be integrated in one processing unit, or each unit may exist alone physically, or two or more units are integrated in one unit, and the integrated unit may be implemented in a form of hardware, or in a form of software functional unit. In addition, specific names of the functional units and modules are only for convenience of distinguishing from each other, and are not used for limiting the protection scope of the present application. The specific working processes of the units and modules in the system may refer to the corresponding processes in the foregoing method embodiments, and are not described herein again.
An embodiment of the present application further provides a terminal device, fig. 4 is a schematic structural diagram of the terminal device provided in the embodiment of the present application, and as shown in fig. 4, the terminal device 4 includes: at least one processor 40, a memory 41 and a computer program 42 stored in said memory and executable on said at least one processor, said processor 40 implementing the steps of any of the method embodiments described above when executing said computer program 42.
Optionally, the terminal device 4 may further include a display.
Embodiments of the present application further provide a computer-readable storage medium, which stores a computer program, and when the computer program is executed by a processor, the computer program can implement the steps in any of the above method embodiments.
It will be appreciated by those of ordinary skill in the art that any reference to memory, storage, databases, or other media used in the embodiments provided herein may include non-volatile and/or volatile memory. Non-volatile Memory may include Read-Only Memory (ROM), Programmable ROM (PROM), Electrically Programmable ROM (EPROM), Electrically Erasable Programmable ROM (EEPROM), or flash Memory. Volatile Memory can include Random Access Memory (RAM) or external cache Memory. By way of illustration and not limitation, RAM is available in many forms, such as Static RAM (SRAM), Dynamic RAM (DRAM), Synchronous DRAM (SDRAM), Double Data Rate SDRAM (DDRSDRAM), Enhanced SDRAM (ESDRAM), Sync Link DRAM (SLDRAM), bused Direct RAM (Direct Rambus DRAM, DRDRAM), and bused Dynamic RAM (RDRAM), among others.
The above-mentioned embodiments are only used for illustrating the technical solutions of the present application, and not for limiting the same; although the present application has been described in detail with reference to the foregoing embodiments, it should be understood by those of ordinary skill in the art that: the technical solutions described in the foregoing embodiments may still be modified, or some technical features may be equivalently replaced; such modifications and substitutions do not substantially depart from the spirit and scope of the embodiments of the present application and are intended to be included within the scope of the present application.
Claims (10)
1. A method for acquiring the responsivity of an infrared detector is characterized by comprising the following steps:
acquiring multiple groups of test data and target surface temperatures corresponding to each group of test data, wherein each group of test data comprises voltage data obtained by an infrared detector based on infrared radiation of two preset black bodies at the corresponding target surface temperature, the target surface temperatures corresponding to the multiple groups of test data are different, and the two preset black bodies have a preset temperature difference;
and calculating the difference of the voltage data included in the test data for each group of test data, and obtaining the response rate at the target surface temperature corresponding to the test data according to the difference and the preset temperature difference.
2. The method of claim 1, wherein obtaining the response rate at the target surface temperature corresponding to the test data according to the difference and the preset temperature difference comprises:
and determining the ratio of the difference to the preset temperature difference as the response rate of the target surface corresponding to the test data at the temperature.
3. The method of claim 1, wherein obtaining the response rate at the target surface temperature corresponding to the test data according to the difference and the preset temperature difference comprises:
determining the ratio of the difference value to the preset temperature difference value as an intermediate response rate;
determining the ratio of the intermediate response rate to a reference response rate as the response rate of the test data at the target surface temperature; and the reference response rate is an intermediate response rate corresponding to the target surface temperature in the target surface temperatures respectively corresponding to the multiple groups of test data.
4. The method of any one of claims 1 to 3, wherein the obtaining the response rate at the target surface temperature corresponding to the test data further comprises:
and fitting the response rates of the multiple groups of test data at the target surface temperature respectively to obtain response rate fitting curves.
5. The method according to claim 4, wherein after the fitting the responsivity of the multiple sets of test data at the target surface temperature respectively to obtain a responsivity fitting curve, the method further comprises:
judging whether the fitted curve has an inflection point or a pole in a preset target surface temperature range;
and if the inflection point or the pole exists, correcting the fitting curve.
6. The method of claim 5, wherein said modifying said fitted curve comprises:
removing abnormal data in the multiple groups of test data;
and fitting the response rates of the plurality of groups of test data with the abnormal data removed at the target surface temperature respectively to obtain a corrected response rate fitting curve.
7. The method of claim 5, wherein said modifying said fitted curve comprises:
and re-executing the steps of obtaining the multiple groups of test data and the target surface temperature corresponding to each group of test data, and fitting the response rates of the multiple groups of newly obtained test data at the target surface temperatures respectively corresponding to the target surface temperatures to obtain a corrected response rate fitting curve.
8. An apparatus for obtaining responsivity of an infrared detector, comprising:
the data acquisition module is used for acquiring a plurality of groups of test data and target surface temperatures corresponding to each group of test data, each group of test data comprises voltage data obtained by an infrared detector based on infrared radiation of two preset black bodies at the corresponding target surface temperature, the target surface temperatures corresponding to the plurality of groups of test data are different, and the two preset black bodies have preset temperature difference values;
and the response rate calculation module is used for calculating the difference value of the voltage data included in the test data for each group of test data, and obtaining the response rate at the target surface temperature corresponding to the test data according to the difference value and the preset temperature difference value.
9. A terminal device, comprising: memory, a processor and a computer program stored in the memory and executable on the processor, the processor implementing the method according to any of claims 1 to 7 when executing the computer program.
10. A computer-readable storage medium, characterized in that the computer-readable storage medium stores a computer program which, when executed by a processor, implements the method of any one of claims 1 to 7.
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Application publication date: 20211022 |