CN105628215A - Single-blackbody responsivity testing method for infrared detector - Google Patents
Single-blackbody responsivity testing method for infrared detector Download PDFInfo
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- CN105628215A CN105628215A CN201610088982.3A CN201610088982A CN105628215A CN 105628215 A CN105628215 A CN 105628215A CN 201610088982 A CN201610088982 A CN 201610088982A CN 105628215 A CN105628215 A CN 105628215A
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- 238000012360 testing method Methods 0.000 title claims abstract description 16
- 230000004043 responsiveness Effects 0.000 claims description 16
- 230000004044 response Effects 0.000 claims description 7
- 238000010998 test method Methods 0.000 claims description 6
- 239000011159 matrix material Substances 0.000 claims description 4
- 238000000034 method Methods 0.000 abstract description 8
- 238000005259 measurement Methods 0.000 abstract description 4
- 238000007796 conventional method Methods 0.000 description 2
- 230000007812 deficiency Effects 0.000 description 1
- 238000001514 detection method Methods 0.000 description 1
Classifications
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J5/00—Radiation pyrometry, e.g. infrared or optical thermometry
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- General Physics & Mathematics (AREA)
- Spectroscopy & Molecular Physics (AREA)
- Photometry And Measurement Of Optical Pulse Characteristics (AREA)
Abstract
The invention discloses a single-blackbody responsivity testing method for an infrared detector, and relates to the technology of calibration and measurement of photoelectric detectors. The method comprises the steps: firstly collecting the data of the same reference plane during the testing of the output of a detector for detecting the temperature of different blackbodies; secondly carrying out the correction of the testing data through employing the output data of the detector of the reference plane, and calculating a testing responsivity, wherein the calculation formula is shown in the description. The method effectively avoids the output drift of the body of the infrared sensor, and improves the testing precision of responsivity.
Description
Technical field
The present invention relates to the demarcation of photodetector and measurement technology, particularly prevent single Blackbody response sensitivily method of testing that Infrared Detectors responsiveness varies with temperature.
Background technology
Responsiveness refers under specified wavelength, the ratio of signal produced by detector and this incident wavelength light power, and will realize its absolute measurement needs accurately to measure the luminous power of this wavelength obtaining inciding detector and the signal of detector generation.
The principle of single Blackbody response sensitivily test is: under the premise that optic test structure satisfies condition, the ratio of the difference of the output of detector and temperature with the difference of blackbody temperature under different blackbody temperatures; But single black matrix is in the process of switching temperature, and the phenomenon of output shift can occur Infrared Detectors itself, reduces the measuring accuracy of responsiveness; Have much room for improvement.
Summary of the invention
The present invention is directed to the deficiencies in the prior art, it is provided that a kind of phenomenon preventing Infrared Detectors itself from output shift occurring, improve the Infrared Detectors list Blackbody response sensitivily method of testing of the measuring accuracy of responsiveness.
For realizing the object of the invention, it is provided that techniques below scheme: a kind of Infrared Detectors list Blackbody response sensitivily method of testing, when the Infrared Detectors when the single black matrix different temperatures of test exports, it is characterised in that comprise the following steps:
A. first gathering single blackbody temperature is the reference voltage V t1 of T1, and single blackbody temperature is the reference voltage V t2 of T2;
B. then when single blackbody temperature switches to T1, detect output voltage V1 at that time, when single blackbody temperature switches to T2, detect output voltage V2 at that time;
The data of temperature to be tested are corrected by the reference voltage V t2 c. utilizing reference voltage V t1, the T2 of T1, and then calculate the responsiveness of test, and computing formula is as follows:
In formula: Vr is the responsiveness of Infrared Detectors, V1 is detector to being the output voltage of T1 in single blackbody temperature, Vt1 is be the reference voltage of T1 in blackbody temperature, V2 is that detector faces toward in blackbody temperature is the output voltage of T2, Vt2 is be the reference voltage of T2 in blackbody temperature, and �� T is the temperature difference of T1-T2.
The method have the benefit that the present invention passes through to arrange detection benchmark data, by benchmark data, measurement data is corrected line by line, effectively prevent Infrared Detectors itself from the phenomenon of output shift occurring, improve the measuring accuracy of responsiveness.
Detailed description of the invention
Embodiment 1: a kind of Infrared Detectors list Blackbody response sensitivily method of testing, when Infrared Detectors when the single black matrix different temperatures of test exports, it is characterized in that comprising the following steps: first gathering single blackbody temperature is the reference voltage V t1 of T1, and single blackbody temperature is the reference voltage V t2 of T2; Then when single blackbody temperature switches to T1, detect output voltage V1 at that time, when single blackbody temperature switches to T2, detect output voltage V2 at that time; The data of temperature to be tested are corrected by the reference voltage V t2 utilizing reference voltage V t1, the T2 of T1, and then calculate the responsiveness of test, and computing formula is as follows:
Blackbody temperature is respectively set to 20 DEG C and 35 DEG C, and the responsiveness of employing conventional method test in Table 1 is:
Table 1 adopts the responsiveness that conventional method is tested:
Blackbody temperature is respectively set to 20 DEG C and 35 degrees Celsius, adopts the responsiveness that this patented method is tested in Table 2 to be:
Table 2 adopts the responsiveness that this application method is tested:
The standard deviation of the responsiveness of contrast table 1 and table 2 is restrained, and the repeatability adopting the responsiveness that this patented method tests is higher.
Claims (1)
1. an Infrared Detectors list Blackbody response sensitivily method of testing, when the Infrared Detectors when the single black matrix different temperatures of test exports, it is characterised in that comprise the following steps:
First gathering single blackbody temperature is the reference voltage V t1 of T1, and single blackbody temperature is the reference voltage V t2 of T2;
Then when single blackbody temperature switches to T1, detect output voltage V1 at that time, when single blackbody temperature switches to T2, detect output voltage V2 at that time;
The data of temperature to be tested are corrected by the reference voltage V t2 utilizing reference voltage V t1, the T2 of T1, and then calculate the responsiveness of test, and computing formula is as follows:
In formula: Vr is the responsiveness of Infrared Detectors, V1 is detector to being the output voltage of T1 in single blackbody temperature, Vt1 is be the reference voltage of T1 in blackbody temperature, V2 is that detector faces toward in blackbody temperature is the output voltage of T2, Vt2 is be the reference voltage of T2 in blackbody temperature, and �� T is the temperature difference of T1-T2.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
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| CN201610088982.3A CN105628215B (en) | 2016-02-17 | 2016-02-17 | A kind of infrared detector list Blackbody response sensitivily test method |
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| Application Number | Priority Date | Filing Date | Title |
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| CN201610088982.3A CN105628215B (en) | 2016-02-17 | 2016-02-17 | A kind of infrared detector list Blackbody response sensitivily test method |
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| CN105628215A true CN105628215A (en) | 2016-06-01 |
| CN105628215B CN105628215B (en) | 2019-02-19 |
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Cited By (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN109990822A (en) * | 2019-04-29 | 2019-07-09 | 中国电子科技集团公司第四十一研究所 | A kind of the frequency response caliberating device and method of photoelectric detection module |
| CN111579081A (en) * | 2020-04-30 | 2020-08-25 | 烟台艾睿光电科技有限公司 | Infrared temperature measurement method, device and equipment |
| CN113532663A (en) * | 2021-06-28 | 2021-10-22 | 深圳市景阳科技股份有限公司 | Method, device and equipment for acquiring responsivity of infrared detector and storage medium |
| CN115016076A (en) * | 2021-03-04 | 2022-09-06 | 青岛海信宽带多媒体技术有限公司 | Optical module and optical module shell temperature calculation method |
| CN117949098A (en) * | 2024-03-25 | 2024-04-30 | 杭州海康微影传感科技有限公司 | Response rate testing method and device |
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| JP2015001388A (en) * | 2013-06-13 | 2015-01-05 | 独立行政法人産業技術総合研究所 | Calibration method of optical sensor |
| CN104266762A (en) * | 2014-09-19 | 2015-01-07 | 南京理工大学 | Site target emissivity measuring system and method based on environmental radiation change |
| US20150115160A1 (en) * | 2013-10-25 | 2015-04-30 | Robert Bosch Gmbh | Thermally Shorted Bolometer |
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| CN101181902A (en) * | 2007-12-03 | 2008-05-21 | 北京康拓红外技术有限公司 | Method for improving temperature measurement accuracy of modem probe |
| US20100276596A1 (en) * | 2009-04-29 | 2010-11-04 | Wen-Long Chou | Output ratio adjusting method for optic sensor |
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| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN109990822A (en) * | 2019-04-29 | 2019-07-09 | 中国电子科技集团公司第四十一研究所 | A kind of the frequency response caliberating device and method of photoelectric detection module |
| CN111579081A (en) * | 2020-04-30 | 2020-08-25 | 烟台艾睿光电科技有限公司 | Infrared temperature measurement method, device and equipment |
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| CN115016076A (en) * | 2021-03-04 | 2022-09-06 | 青岛海信宽带多媒体技术有限公司 | Optical module and optical module shell temperature calculation method |
| CN115016076B (en) * | 2021-03-04 | 2023-08-08 | 青岛海信宽带多媒体技术有限公司 | Optical module and optical module shell temperature calculation method |
| CN113532663A (en) * | 2021-06-28 | 2021-10-22 | 深圳市景阳科技股份有限公司 | Method, device and equipment for acquiring responsivity of infrared detector and storage medium |
| CN117949098A (en) * | 2024-03-25 | 2024-04-30 | 杭州海康微影传感科技有限公司 | Response rate testing method and device |
| CN117949098B (en) * | 2024-03-25 | 2024-06-04 | 杭州海康微影传感科技有限公司 | Response rate testing method and device |
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| CN105628215B (en) | 2019-02-19 |
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Effective date of registration: 20190313 Address after: 214203 north of Wen Zhuang Road, Yixing economic and Technological Development Zone, Wuxi, Jiangsu Patentee after: Yong Zhuo Defense Technology Co., Ltd. Address before: 214200 No. 15 Wenzhuang Road, Yixing Economic Development Zone, Wuxi City, Jiangsu Province Patentee before: WUXI YCM CHIP MICRO-ELECTRO-MECHANICAL CO., LTD. |