CN105628215B - A kind of infrared detector list Blackbody response sensitivily test method - Google Patents
A kind of infrared detector list Blackbody response sensitivily test method Download PDFInfo
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- CN105628215B CN105628215B CN201610088982.3A CN201610088982A CN105628215B CN 105628215 B CN105628215 B CN 105628215B CN 201610088982 A CN201610088982 A CN 201610088982A CN 105628215 B CN105628215 B CN 105628215B
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- blackbody
- temperature
- infrared detector
- reference voltage
- response
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- 238000010998 test method Methods 0.000 title claims abstract description 7
- 238000012360 testing method Methods 0.000 claims abstract description 13
- 239000011159 matrix material Substances 0.000 claims description 5
- 238000000034 method Methods 0.000 abstract description 7
- 238000005259 measurement Methods 0.000 description 3
- 238000007796 conventional method Methods 0.000 description 2
- 230000003287 optical effect Effects 0.000 description 2
- 230000007812 deficiency Effects 0.000 description 1
- 238000001514 detection method Methods 0.000 description 1
- 230000005611 electricity Effects 0.000 description 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J5/00—Radiation pyrometry, e.g. infrared or optical thermometry
Abstract
A kind of infrared detector list Blackbody response sensitivily test method, it is related to the calibration and measuring technique of photodetector, by in the detector output for testing different blackbody temperatures, the data of same datum level are acquired first, test data is corrected using the detector output data of the datum level, and then the response rate of test is calculated, calculation formula is as follows:
Description
Technical field
The present invention relates to the calibration of photodetector and measuring techniques, especially prevent infrared detector response rate with temperature
Single Blackbody response sensitivily test method of variation.
Background technique
Response rate refers under specified wavelength, the ratio of signal caused by detector and the incident wavelength optical power,
Realize the optical power for the wavelength that its absolute measurement needs accurate measurement to obtain being incident on detector and the letter that detector generates
Number.
The principle of single Blackbody response sensitivily test are as follows: under the premise of optic test structure meets condition, different blackbody temperatures
The ratio of the difference of the difference and temperature and blackbody temperature of the output of lower detector；But single black matrix is during switching temperature,
Infrared detector itself can reduce the measuring accuracy of response rate there is a phenomenon where output shift；Have much room for improvement.
Summary of the invention
Prevent infrared detector itself from showing for output shift occurs in view of the deficiencies of the prior art, the present invention provides a kind of
As improving the infrared detector list Blackbody response sensitivily test method of the measuring accuracy of response rate.
Purpose to realize the present invention provides following technical scheme: a kind of infrared detector list Blackbody response sensitivily test side
Method, when the infrared detector when testing single black matrix different temperatures exports, it is characterised in that the following steps are included:
A. the reference voltage Vt1 that single blackbody temperature is T1 is acquired first, and single blackbody temperature is the reference voltage Vt2 of T2；
B. output voltage V1 at that time then is detected when single blackbody temperature switches to T1, when single blackbody temperature switches
When at T2, output voltage V2 at that time is detected；
C. using the reference voltage Vt1, T2 of T1 reference voltage Vt2 to the data of temperature to be tested be corrected,
And then the response rate of test is calculated, calculation formula is as follows:
In formula: Vr is the response rate of infrared detector, and V1 is detector to the output voltage for being T1 in single blackbody temperature,
Vt1 is the reference voltage for being T1 in blackbody temperature, and V2 is detector against the output voltage for being T2 in blackbody temperature, Vt2 be
Blackbody temperature is the reference voltage of T2, and Δ T is the temperature difference of T1-T2.
The invention has the advantages that: the present invention by setting detection reference data, is carried out by reference data to measurement data
It corrects line by line, effectivelying prevent infrared detector itself, there is a phenomenon where output shifts, improve the measuring accuracy of response rate.
Specific embodiment
Embodiment 1: a kind of infrared detector list Blackbody response sensitivily test method, it is red when testing single black matrix different temperatures
When external detector exports, it is characterised in that the following steps are included: the reference voltage Vt1 that single blackbody temperature is T1 is acquired first, it is single
Blackbody temperature is the reference voltage Vt2 of T2；Then when single blackbody temperature switches to T1, output voltage V1 at that time is detected,
When single blackbody temperature switches to T2, output voltage V2 at that time is detected；Utilize the benchmark electricity of the reference voltage Vt1, T2 of T1
Pressure Vt2 to the data of temperature to be tested be corrected, and then calculate the response rate of test, calculation formula is as follows:
Blackbody temperature is respectively set to 20 DEG C and 35 DEG C, is shown in Table 1 using the response rate that conventional method is tested are as follows:
The response rate that table 1 is tested using conventional method:
Blackbody temperature is respectively set to 20 DEG C and 35 degrees Celsius, is shown in Table 2 using the response rate that the patented method is tested are as follows:
The response rate that table 2 is tested using this application method:
Compare Tables 1 and 2 response rate standard deviation restrain, using the patented method test response rate repeatability more
It is high.
Claims (1)
1. a kind of infrared detector list Blackbody response sensitivily test method, the infrared detector when testing single black matrix different temperatures is defeated
When out, it is characterised in that the following steps are included: acquiring the reference voltage Vt1 that single blackbody temperature is T1 first, single blackbody temperature is
The reference voltage Vt2 of T2；
Then when single blackbody temperature switches to T1, output voltage V1 at that time is detected, when single blackbody temperature switches to T2,
Detect output voltage V2 at that time；
Using T1 reference voltage Vt1, T2 reference voltage Vt2 to the data of temperature to be tested be corrected, Jin Erji
The response rate of test is calculated, calculation formula is as follows:
In formula: Vr is the response rate of infrared detector, and V1 is detector to the output voltage when single blackbody temperature is T1, Vt1
For the reference voltage for being T1 in blackbody temperature, V2 is detector to the output voltage when blackbody temperature is T2, and Vt2 is in black matrix
Reference voltage when temperature is T2, Δ T are the temperature difference of T1-T2.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201610088982.3A CN105628215B (en) | 2016-02-17 | 2016-02-17 | A kind of infrared detector list Blackbody response sensitivily test method |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
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| CN201610088982.3A CN105628215B (en) | 2016-02-17 | 2016-02-17 | A kind of infrared detector list Blackbody response sensitivily test method |
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| Publication Number | Publication Date |
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| CN105628215A CN105628215A (en) | 2016-06-01 |
| CN105628215B true CN105628215B (en) | 2019-02-19 |
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| Application Number | Title | Priority Date | Filing Date |
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| CN201610088982.3A Active CN105628215B (en) | 2016-02-17 | 2016-02-17 | A kind of infrared detector list Blackbody response sensitivily test method |
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Families Citing this family (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN109990822B (en) * | 2019-04-29 | 2022-04-22 | 中国电子科技集团公司第四十一研究所 | Frequency response calibration device and method for photoelectric detection module |
| CN111579081B (en) * | 2020-04-30 | 2021-12-21 | 烟台艾睿光电科技有限公司 | Infrared temperature measurement method, device and equipment |
| CN115016076B (en) * | 2021-03-04 | 2023-08-08 | 青岛海信宽带多媒体技术有限公司 | Optical module and optical module shell temperature calculation method |
| CN113532663A (en) * | 2021-06-28 | 2021-10-22 | 深圳市景阳科技股份有限公司 | Method, device and equipment for acquiring responsivity of infrared detector and storage medium |
Citations (4)
| Publication number | Priority date | Publication date | Assignee | Title |
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| CN101181902A (en) * | 2007-12-03 | 2008-05-21 | 北京康拓红外技术有限公司 | Method for improving temperature measurement accuracy of modem probe |
| CN103063312A (en) * | 2012-12-29 | 2013-04-24 | 南京理工大学 | Measuring system and method for measuring object emissivity |
| JP2015001388A (en) * | 2013-06-13 | 2015-01-05 | 独立行政法人産業技術総合研究所 | Calibration method of optical sensor |
| CN104266762A (en) * | 2014-09-19 | 2015-01-07 | 南京理工大学 | Site target emissivity measuring system and method based on environmental radiation change |
Family Cites Families (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US8247774B2 (en) * | 2009-04-29 | 2012-08-21 | Tyntek Corporation | Output ratio adjusting method for optic sensor |
| US9199838B2 (en) * | 2013-10-25 | 2015-12-01 | Robert Bosch Gmbh | Thermally shorted bolometer |
-
2016
- 2016-02-17 CN CN201610088982.3A patent/CN105628215B/en active Active
Patent Citations (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN101181902A (en) * | 2007-12-03 | 2008-05-21 | 北京康拓红外技术有限公司 | Method for improving temperature measurement accuracy of modem probe |
| CN103063312A (en) * | 2012-12-29 | 2013-04-24 | 南京理工大学 | Measuring system and method for measuring object emissivity |
| JP2015001388A (en) * | 2013-06-13 | 2015-01-05 | 独立行政法人産業技術総合研究所 | Calibration method of optical sensor |
| CN104266762A (en) * | 2014-09-19 | 2015-01-07 | 南京理工大学 | Site target emissivity measuring system and method based on environmental radiation change |
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| CN105628215A (en) | 2016-06-01 |
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Effective date of registration: 20190313 Address after: 214203 north of Wen Zhuang Road, Yixing economic and Technological Development Zone, Wuxi, Jiangsu Patentee after: Yong Zhuo Defense Technology Co., Ltd. Address before: 214200 No. 15 Wenzhuang Road, Yixing Economic Development Zone, Wuxi City, Jiangsu Province Patentee before: WUXI YCM CHIP MICRO-ELECTRO-MECHANICAL CO., LTD. |
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