CN110462538B - 信息处理装置、信息处理方法以及存储介质 - Google Patents

信息处理装置、信息处理方法以及存储介质 Download PDF

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CN110462538B
CN110462538B CN201880020864.6A CN201880020864A CN110462538B CN 110462538 B CN110462538 B CN 110462538B CN 201880020864 A CN201880020864 A CN 201880020864A CN 110462538 B CN110462538 B CN 110462538B
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value
values
state
target device
time series
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CN110462538A (zh
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熊野信太郎
岸真人
安部克彦
山本圭介
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Mitsubishi Heavy Industries Ltd
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    • G—PHYSICS
    • G05—CONTROLLING; REGULATING
    • G05B—CONTROL OR REGULATING SYSTEMS IN GENERAL; FUNCTIONAL ELEMENTS OF SUCH SYSTEMS; MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS OR ELEMENTS
    • G05B23/00—Testing or monitoring of control systems or parts thereof
    • G05B23/02—Electric testing or monitoring
    • G05B23/0205—Electric testing or monitoring by means of a monitoring system capable of detecting and responding to faults
    • G05B23/0218—Electric testing or monitoring by means of a monitoring system capable of detecting and responding to faults characterised by the fault detection method dealing with either existing or incipient faults
    • G05B23/0224—Process history based detection method, e.g. whereby history implies the availability of large amounts of data
    • G05B23/0227—Qualitative history assessment, whereby the type of data acted upon, e.g. waveforms, images or patterns, is not relevant, e.g. rule based assessment; if-then decisions
    • G05B23/0235—Qualitative history assessment, whereby the type of data acted upon, e.g. waveforms, images or patterns, is not relevant, e.g. rule based assessment; if-then decisions based on a comparison with predetermined threshold or range, e.g. "classical methods", carried out during normal operation; threshold adaptation or choice; when or how to compare with the threshold
    • G—PHYSICS
    • G05—CONTROLLING; REGULATING
    • G05B—CONTROL OR REGULATING SYSTEMS IN GENERAL; FUNCTIONAL ELEMENTS OF SUCH SYSTEMS; MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS OR ELEMENTS
    • G05B19/00—Program-control systems
    • G05B19/02—Program-control systems electric
    • G05B19/04—Program control other than numerical control, i.e. in sequence controllers or logic controllers
    • G05B19/042—Program control other than numerical control, i.e. in sequence controllers or logic controllers using digital processors
    • G05B19/0428—Safety, monitoring
    • G—PHYSICS
    • G05—CONTROLLING; REGULATING
    • G05B—CONTROL OR REGULATING SYSTEMS IN GENERAL; FUNCTIONAL ELEMENTS OF SUCH SYSTEMS; MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS OR ELEMENTS
    • G05B23/00—Testing or monitoring of control systems or parts thereof
    • G05B23/02—Electric testing or monitoring
    • G05B23/0205—Electric testing or monitoring by means of a monitoring system capable of detecting and responding to faults
    • G05B23/0218—Electric testing or monitoring by means of a monitoring system capable of detecting and responding to faults characterised by the fault detection method dealing with either existing or incipient faults
    • G05B23/0221—Preprocessing measurements, e.g. data collection rate adjustment; Standardization of measurements; Time series or signal analysis, e.g. frequency analysis or wavelets; Trustworthiness of measurements; Indexes therefor; Measurements using easily measured parameters to estimate parameters difficult to measure; Virtual sensor creation; De-noising; Sensor fusion; Unconventional preprocessing inherently present in specific fault detection methods like PCA-based methods
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01D—MEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE; ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVERED IN A SINGLE OTHER SUBCLASS; TARIFF METERING APPARATUS; MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR
    • G01D1/00—Measuring arrangements giving results other than momentary value of variable, of general application
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01D—MEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE; ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVERED IN A SINGLE OTHER SUBCLASS; TARIFF METERING APPARATUS; MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR
    • G01D18/00—Testing or calibrating apparatus or arrangements provided for in groups G01D1/00 - G01D15/00
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01D—MEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE; ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVERED IN A SINGLE OTHER SUBCLASS; TARIFF METERING APPARATUS; MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR
    • G01D9/00—Recording measured values
    • G—PHYSICS
    • G05—CONTROLLING; REGULATING
    • G05B—CONTROL OR REGULATING SYSTEMS IN GENERAL; FUNCTIONAL ELEMENTS OF SUCH SYSTEMS; MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS OR ELEMENTS
    • G05B19/00—Program-control systems
    • G05B19/02—Program-control systems electric
    • G05B19/04—Program control other than numerical control, i.e. in sequence controllers or logic controllers
    • G05B19/042—Program control other than numerical control, i.e. in sequence controllers or logic controllers using digital processors
    • G—PHYSICS
    • G05—CONTROLLING; REGULATING
    • G05B—CONTROL OR REGULATING SYSTEMS IN GENERAL; FUNCTIONAL ELEMENTS OF SUCH SYSTEMS; MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS OR ELEMENTS
    • G05B21/00—Systems involving sampling of the variable controlled
    • G—PHYSICS
    • G05—CONTROLLING; REGULATING
    • G05B—CONTROL OR REGULATING SYSTEMS IN GENERAL; FUNCTIONAL ELEMENTS OF SUCH SYSTEMS; MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS OR ELEMENTS
    • G05B23/00—Testing or monitoring of control systems or parts thereof
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00—Error detection; Error correction; Monitoring
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F15/00—Digital computers in general; Data processing equipment in general
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F17/00—Digital computing or data processing equipment or methods, specially adapted for specific functions
    • G06F17/40—Data acquisition and logging
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F2201/00—Indexing scheme relating to error detection, to error correction, and to monitoring
    • G—PHYSICS
    • G08—SIGNALLING
    • G08C—TRANSMISSION SYSTEMS FOR MEASURED VALUES, CONTROL OR SIMILAR SIGNALS
    • G08C15/00—Arrangements characterised by the use of multiplexing for the transmission of a plurality of signals over a common path
    • G—PHYSICS
    • G08—SIGNALLING
    • G08C—TRANSMISSION SYSTEMS FOR MEASURED VALUES, CONTROL OR SIMILAR SIGNALS
    • G08C25/00—Arrangements for preventing or correcting errors; Monitoring arrangements
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04L—TRANSMISSION OF DIGITAL INFORMATION, e.g. TELEGRAPHIC COMMUNICATION
    • H04L5/00—Arrangements affording multiple use of the transmission path

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  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Automation & Control Theory (AREA)
  • Testing And Monitoring For Control Systems (AREA)
CN201880020864.6A 2017-03-29 2018-03-26 信息处理装置、信息处理方法以及存储介质 Active CN110462538B (zh)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
JP2017065921A JP6803788B2 (ja) 2017-03-29 2017-03-29 情報処理装置、情報処理方法およびプログラム
JP2017-065921 2017-03-29
PCT/JP2018/012020 WO2018181120A1 (ja) 2017-03-29 2018-03-26 情報処理装置、情報処理方法およびプログラム

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CN110462538A CN110462538A (zh) 2019-11-15
CN110462538B true CN110462538B (zh) 2022-07-26

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US (1) US11237547B2 (https=)
JP (1) JP6803788B2 (https=)
CN (1) CN110462538B (https=)
DE (1) DE112018001726T5 (https=)
WO (1) WO2018181120A1 (https=)

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JP7367622B2 (ja) 2020-06-17 2023-10-24 横河電機株式会社 データ管理システム、データ管理方法、および、データ管理プログラム
JP7367623B2 (ja) * 2020-06-25 2023-10-24 横河電機株式会社 データ管理システム、データ管理方法、および、データ管理プログラム
US11336544B2 (en) * 2020-10-08 2022-05-17 Sony Group Corporation HDMI system speed test
US11636752B2 (en) * 2021-04-26 2023-04-25 Rockwell Automation Technologies, Inc. Monitoring machine operation with different sensor types to identify typical operation for derivation of a signature

Citations (1)

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CN103454991A (zh) * 2012-05-31 2013-12-18 横河电机株式会社 过程监视系统、装置及方法

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JPH11161327A (ja) * 1997-11-28 1999-06-18 Mitsubishi Chemical Corp プロセスの異常診断方法及び装置
US6519715B1 (en) * 1998-05-22 2003-02-11 Hitachi, Ltd. Signal processing apparatus and a data recording and reproducing apparatus including local memory processor
US20040199368A1 (en) * 2001-05-24 2004-10-07 Simmonds Precision Products, Inc. Poor data quality identification
JP2005267572A (ja) * 2004-03-22 2005-09-29 Jfe Steel Kk 流量制御の異常判定方法及び装置
JP4458349B2 (ja) * 2004-08-27 2010-04-28 日立アプライアンス株式会社 機器診断装置、その動作プログラム、機器診断方法
US7869888B2 (en) * 2006-05-31 2011-01-11 Tokyo Electron Limited Information processing apparatus, semiconductor manufacturing system, information processing method, and storage medium
WO2009096519A1 (ja) * 2008-01-31 2009-08-06 Nec Corporation フィードフォーワード制御方法、サービス提供品質制御装置、システム、プログラム及びその記録媒体
JP5244686B2 (ja) * 2009-04-24 2013-07-24 株式会社東芝 監視装置およびサーバー
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JP5791563B2 (ja) * 2012-05-15 2015-10-07 三菱電機ビルテクノサービス株式会社 データ処理装置及びプログラム
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JP6387777B2 (ja) * 2014-06-13 2018-09-12 富士通株式会社 評価プログラム、評価方法、および評価装置
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Publication number Publication date
US20200110393A1 (en) 2020-04-09
CN110462538A (zh) 2019-11-15
JP2018169754A (ja) 2018-11-01
WO2018181120A1 (ja) 2018-10-04
JP6803788B2 (ja) 2020-12-23
DE112018001726T5 (de) 2019-12-19
US11237547B2 (en) 2022-02-01

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