CN110426380B - Transmission-type temperature-controllable testing device for laser-excited remote fluorescent material - Google Patents
Transmission-type temperature-controllable testing device for laser-excited remote fluorescent material Download PDFInfo
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- CN110426380B CN110426380B CN201910929473.2A CN201910929473A CN110426380B CN 110426380 B CN110426380 B CN 110426380B CN 201910929473 A CN201910929473 A CN 201910929473A CN 110426380 B CN110426380 B CN 110426380B
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/62—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
- G01N21/63—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light optically excited
- G01N21/64—Fluorescence; Phosphorescence
- G01N21/6402—Atomic fluorescence; Laser induced fluorescence
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N25/00—Investigating or analyzing materials by the use of thermal means
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Abstract
The design relates to the technical field of semiconductor laser testing, in particular to a transmission type temperature-controllable testing device for laser-excited remote fluorescent materials, which can realize the testing of the laser-excited remote fluorescent materials and comprises an integrating sphere I, an integrating sphere II, an integrating sphere III, a temperature-controlled platform, a slide rail I, a slide rail II and an optical platform, the laser diode, a first sliding block, a second sliding block, a third sliding block, a first spectrometer, a second spectrometer, a third spectrometer and a driving power supply, wherein a first integrating sphere is installed on the third sliding block and is respectively in sliding fit with the first sliding rail and the second sliding rail through the third sliding block, a second integrating sphere is installed on the second sliding block and is respectively in sliding fit with the first sliding rail and the second sliding rail through the second sliding block, a third integrating sphere is installed on the first sliding block and is respectively in sliding fit with the first sliding rail and the second sliding rail through the first sliding block, the laser diode is placed beside the integrating sphere, and a light beam emitted by the laser diode irradiates on a temperature control platform for placing fluorescent.
Description
Technical Field
The design relates to the technical field of semiconductor laser testing, in particular to a testing device for a transmission type temperature-controllable laser excitation remote fluorescent material.
Background
The traditional semiconductor white light illumination mainly adopts a mode of matching a blue light LED chip with fluorescent powder, but along with the continuous rising of blue light power, the problems of heating and heat dissipation which become more serious have appeared. In recent years, with the development of laser diode technology, a light emitting scheme combining blue laser and a fluorescence conversion material appears in succession. As a new generation technology in the field of third generation semiconductor lighting, laser diode lighting has unique advantages over LED lighting: the LED lamp has the advantages of long service life, higher brightness, smaller volume, higher photoelectric conversion efficiency and longer irradiation distance. The device for exciting the remote fluorescent material by the laser can well measure the parameters of reflectivity and transmissivity and can simultaneously test the thermal stability phenomenon of the fluorescent material.
However, there is no experimental device for such tests, so it is necessary to design a device capable of measuring reflected light, scattered light and transmitted light and testing the thermal stability of the fluorescent material.
Disclosure of Invention
The invention aims to solve the technical defects and provides a transmission type temperature-controllable testing device for laser-excited remote fluorescent materials, which can realize the testing of the laser-excited remote fluorescent materials.
In order to solve the technical problems, the technical scheme adopted by the invention is as follows: a testing device for a transmission-type temperature-controllable laser excitation remote fluorescent material is characterized in that: the device comprises an integrating sphere I, an integrating sphere II, an integrating sphere III, a temperature control platform, a slide rail I, a slide rail II, an optical platform, a laser diode, a slide block I, a slide block II, a slide block III, a spectrometer I, a spectrometer II, a spectrometer III and a driving power supply, wherein the integrating sphere I is arranged on the slide block III and is respectively in sliding fit with the slide rail I and the slide rail II through the slide block III, the integrating sphere II is arranged on the slide block II and is respectively in sliding fit with the slide rail I and the slide rail II through the slide block II, the laser diode is arranged beside the integrating sphere, a light beam emitted by the laser diode irradiates the temperature control platform for placing fluorescent materials through the integrating sphere I, the spectrometer I for collecting reflected light inside the integrating sphere I is arranged on the optical platform and is positioned beside the integrating sphere, the spectrometer II for collecting scattered light inside the integrating sphere II is arranged on the optical platform and is positioned beside the integrating sphere II, the spectrometer III used for collecting the transmission light inside the integrating sphere III is installed on the optical platform and located beside the integrating sphere III, the sliding rail I and the sliding rail II are installed on the optical platform, and the driving power supply is installed on the optical platform and is respectively and electrically connected with the spectrometer I, the spectrometer II, the spectrometer III, the laser diode and the temperature control platform.
Preferably, the first slide rail and the second slide rail are detachably connected with the optical platform.
Preferably, the volumes and densities of the first integrating sphere, the second integrating sphere and the third integrating sphere are the same.
Preferably, the laser diode laser device further comprises a clamp, and the laser diode is mounted on the optical platform through the clamp.
Preferably, the temperature control platform comprises a copper plate, a semiconductor refrigerator TEC, a radiator, a support, a fluorescent material placing area, a temperature sensor, a temperature measuring instrument, a driving power supply and a lead, wherein the copper plate is installed on the support, the fluorescent material placing area is arranged on the front surface of the copper plate, the temperature sensor is arranged above the fluorescent material placing area, the semiconductor refrigerator TEC and the radiator are sequentially arranged on the back surface of the copper plate, through holes are formed in the copper plate, the semiconductor refrigerator TEC and the radiator, the temperature sensor is in signal connection with the temperature measuring instrument, and the driving power supply is electrically connected with the.
Preferably, the temperature control platform further comprises a fan, the fan is arranged on the support and faces the copper plate, and the driving power supply is electrically connected with the fan through a lead.
Preferably, the fluorescent material placing area on the copper plate is coated with a heat conducting glue.
Preferably, the through hole of the radiator, the through hole of the semiconductor cooler TEC and the through hole on the radiator are coaxial, and the aperture of the through hole is the same.
The invention achieves the following beneficial effects: when the testing device for the transmission-type temperature-controllable laser excitation remote fluorescent material is used, reflected light, scattered light and transmitted light can be measured simultaneously in a test of laser excitation of the remote fluorescent material, and the thermal stability test of the fluorescent material is realized by controlling the temperature of the fluorescent material through the temperature control platform.
Drawings
Fig. 1 is a schematic diagram of a testing structure of a testing apparatus for exciting a remote fluorescent material by a transmission-type temperature-controllable laser.
FIG. 2 is a schematic structural diagram of a temperature control platform of a transmission-type temperature-controllable laser-excited remote fluorescent material testing device
Fig. 3 is a schematic view of a testing process of a temperature-controlled stage of the testing apparatus for testing the transmission-type temperature-controllable laser-excited remote fluorescent material.
Detailed Description
The invention is further described below with reference to the accompanying drawings. The following examples are only for illustrating the technical solutions of the present invention more clearly, and the protection scope of the present invention is not limited thereby.
As shown in FIG. 1 ~, the testing device for the transmission-type temperature-controllable laser excitation remote fluorescent material comprises a first integrating sphere 1, a second integrating sphere 2, a third integrating sphere 3, a temperature-controlled platform 4, a first slide rail 5, a second slide rail 6, an optical platform 7, a laser diode 8, a first slide block 9, a second slide block 10, a third slide block 11, a first spectrometer 12, a second spectrometer 13, a third spectrometer 14 and a driving power supply 15, wherein the first integrating sphere 1 is installed on the third slide block 11 and is in sliding fit with the first slide rail 5 and the second slide rail 6 through the third slide block 11, the second integrating sphere 2 is installed on the second slide block 10 and is in sliding fit with the first slide rail 5 and the second slide rail 6 through the second slide block 10 respectively, the third integrating sphere 3 is installed on the first slide block 9 and is in sliding fit with the first slide rail 5 and the second slide rail 6 respectively, the position of the first slide rail 2 and the second slide rail 6 is limited, so that the first integrating sphere 1, the second integrating sphere 2 and the integrating sphere 7 are all positioned on the integrating sphere 411, the integrating sphere 7 and the thermoelectric heat sink 7, the thermoelectric heat sink 7 are positioned on the thermoelectric element 7, the thermoelectric element 7 is positioned on the thermoelectric element, the thermoelectric element 4, the thermoelectric element 4 is positioned on the thermoelectric element, the thermoelectric element 4, the thermoelectric element 4 is positioned on the thermoelectric element 4, the thermoelectric element 4 is positioned on the thermoelectric element, the thermoelectric element 4, the thermoelectric element 4 is positioned on the thermoelectric element, the thermoelectric element 4 is positioned on the thermoelectric element, the thermoelectric element 4, the thermoelectric element is positioned on the thermoelectric element 4 is positioned on the thermoelectric element, the thermoelectric element 4 is positioned on the thermoelectric element, the thermoelectric element 4 is positioned on the thermoelectric element 4, the thermoelectric element 6, the thermoelectric element 4, the thermoelectric element 4 is positioned on the thermoelectric element 4 and the thermoelectric element, the thermoelectric element 4 is positioned on the thermoelectric element, the thermoelectric element 6, the thermoelectric element 4 is positioned on the thermoelectric element, the thermoelectric element 6, the thermoelectric element 4 is positioned on the thermoelectric element 6 is positioned.
The temperature sensor 41 is in signal connection with the temperature measuring instrument 42, and the driving power supply 15 is electrically connected with the semiconductor refrigerator TEC45 through a lead 49; the semiconductor cooler TEC45 is powered by the driving power supply 15, and the PLC control module directly controls the semiconductor cooler TEC45 to heat the copper plate 44, so that the thermal stability of the fluorescent material can be detected by the temperature sensor 41;
the fan 48 is arranged on the bracket 47 and faces the copper plate 44, and the driving power supply 15 is electrically connected with the fan 48 through a lead 49; the fluorescent material placing area 43 on the copper plate 44 is coated with heat conductive glue; the heat sink 46 is provided with a through hole, the through hole 411 of the heat sink 46, the through hole 411 of the semiconductor cooler TEC45 and the through hole 411 of the heat sink 46 are coaxial, and the aperture of the through hole 411 is the same.
The fluorescent material is coated with heat-conducting glue and fixed on the copper plate 44, during testing, the laser diode 8 excites the remote fluorescent material, the temperature control platform 4 can realize temperature control of the fluorescent material, when the fluorescent material needs to be heated, the PLC control module acts on the semiconductor refrigerator TEC45 to change the power of the semiconductor refrigerator TEC45, the temperature of the copper plate 44 is heated, the temperature measuring instrument 42 collects the surface temperature of the copper plate 44 through the temperature sensor 41, when the collected temperature is lower than the set temperature, the driving power supply 15 continues to act on the semiconductor refrigerator TEC45 to heat until the set temperature is reached, and when the collected temperature reaches the set temperature, the driving power supply 15 is closed; when the fluorescent material needs to be cooled, the PLC control module acts on the semiconductor cooler TEC45 to change the power of the fluorescent material, the copper plate 44 is cooled, the fan 48 is started to accelerate cooling of the radiator 46, the temperature measuring instrument 42 collects the surface temperature of the copper plate 44 through the temperature sensor 41, when the collected temperature is higher than the set temperature, the driving power supply 15 continues to act on the semiconductor cooler TEC45, the fan 48 continues to work to cool until the set temperature is reached, and when the collected temperature reaches the set temperature, the driving power supply 15 is turned off; the temperature control platform 4 can realize temperature control on the fluorescent material, thereby evaluating the thermal stability phenomenon of the fluorescent material.
During testing, the laser diode 8 is placed at the left end of the outer side of the integrating sphere, light irradiates the temperature control platform 4 where the fluorescent material is placed through the laser diode 8, and reflected light, scattered light and transmitted light inside the integrating sphere are collected through the spectrometer. When the fluorescent material needs to be heated, the temperature is raised by changing the current of the semiconductor cooler TEC45, and the temperature of the surface of the copper plate 44 is collected by the temperature measuring instrument 42; when the fluorescent material needs to be cooled, the temperature is reduced by changing the current of the semiconductor cooler TEC45, the fan 48 is started at the same time, the cooling process is accelerated, and the temperature of the surface of the copper plate 48 is collected by the temperature measuring instrument 42. The invention not only can simultaneously collect the reflected light, the scattered light and the transmitted light of the laser excitation remote fluorescent material, but also can carry out temperature control treatment on the fluorescent material and evaluate the thermal stability performance of the fluorescent material.
The above is only a preferred embodiment of the present invention, and it should be noted that, for those skilled in the art, several modifications and variations can be made without departing from the technical principle of the present invention, and these modifications and variations should also be regarded as the protection scope of the present invention.
Claims (8)
1. A testing device for a transmission-type temperature-controllable laser excitation remote fluorescent material is characterized in that: comprises an integrating sphere I (1), an integrating sphere II (2), an integrating sphere III (3), a temperature control platform (4), a slide rail I (5), a slide rail II (6), an optical platform (7), a laser diode (8), a slide block I (9), a slide block II (10), a slide block III (11), a spectrometer I (12), a spectrometer II (13), a spectrometer III (14) and a driving power supply (15), wherein the integrating sphere I (1) is arranged on the slide block III (11) and is respectively in sliding fit with the slide rail I (5) and the slide rail II (6) through the slide block III (11), the integrating sphere II (2) is arranged on the slide block II (10) and is respectively in sliding fit with the slide rail I (5) and the slide rail II (6) through the slide block II (10), the integrating sphere III (3) is arranged on the slide block I (9) and is respectively in sliding fit with the slide rail I (5) and the slide rail II (6) through the slide block, a laser diode (8) is placed beside an integrating sphere I (1), a light beam emitted by the laser diode (8) irradiates a temperature control platform (4) for placing a fluorescent material through the integrating sphere I (1), a spectrometer I (12) for collecting reflected light inside the integrating sphere I (1) is installed on an optical platform (7) and is beside the integrating sphere I (1), a spectrometer II (13) for collecting scattered light inside the integrating sphere II (2) is installed on the optical platform (7) and is beside the integrating sphere II (2), a spectrometer III (14) for collecting transmitted light inside the integrating sphere III (3) is installed on the optical platform (7) and is beside the integrating sphere III (3), a slide rail I (5) and a slide rail II (6) are installed on the optical platform (7), a driving power supply (15) is installed on the optical platform (7) and is respectively connected with the spectrometer I (12), The spectrometer II (13), the spectrometer III (14), the laser diode (8) and the temperature control platform (4) are electrically connected.
2. The apparatus for testing remote fluorescence material excited by transmission type temperature controllable laser according to claim 1, wherein: the first slide rail (5) and the second slide rail (6) are detachably connected with the optical platform (7).
3. The apparatus for testing remote fluorescence material excited by transmission type temperature controllable laser according to claim 1, wherein: the volumes and densities of the first integrating sphere (1), the second integrating sphere (2) and the third integrating sphere (3) are the same.
4. The apparatus for testing remote fluorescence material excited by transmission type temperature controllable laser according to claim 1, wherein: the laser diode laser device is characterized by further comprising a clamp (16), and the laser diode (8) is installed on the optical platform (7) through the clamp (16).
5. The apparatus for testing remote fluorescence material excited by transmission type temperature controllable laser according to claim 1, wherein: temperature control platform (4) include copper (44), semiconductor cooler TEC (45), radiator (46), support (47), fluorescent material places district (43), temperature sensor (41), temperature-measuring instrument (42) and wire (49), copper (44) are installed on support (47), be equipped with fluorescent material on copper (44) are positive and place district (43), fluorescent material places district (43) top and is equipped with temperature sensor (41), copper (44) back is equipped with semiconductor cooler TEC (45) and radiator (46) in proper order, copper (44), all be equipped with through-hole (411) on semiconductor cooler TEC (45) and radiator (46), temperature sensor (41) and temperature-measuring instrument (42) signal connection, drive power supply (15) are connected with semiconductor cooler TEC (45) electricity through wire (49).
6. The apparatus for testing remote fluorescence material excited by transmission type temperature controllable laser according to claim 5, wherein: the temperature control platform (4) further comprises a fan (48), the fan (48) is arranged on the support (47) and faces towards the copper plate (44), and the driving power supply (15) is electrically connected with the fan (48) through a lead (49).
7. The apparatus for testing remote fluorescence material excited by transmission type temperature controllable laser according to claim 5, wherein: the fluorescent material placing area (43) on the copper plate (44) is coated with heat conducting glue.
8. The apparatus for testing remote fluorescence material excited by transmission type temperature controllable laser according to claim 5, wherein: the through hole (411) of the radiator (46), the through hole (411) of the semiconductor cooler TEC (45) and the through hole (411) on the radiator (46) are coaxial, and the aperture of the through hole (411) is the same.
Priority Applications (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201910929473.2A CN110426380B (en) | 2019-09-29 | 2019-09-29 | Transmission-type temperature-controllable testing device for laser-excited remote fluorescent material |
| PCT/CN2020/088858 WO2021057032A1 (en) | 2019-09-29 | 2020-05-07 | Transmissive temperature-controllable laser-excited remote phosphor material testing device |
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| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201910929473.2A CN110426380B (en) | 2019-09-29 | 2019-09-29 | Transmission-type temperature-controllable testing device for laser-excited remote fluorescent material |
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| CN110426380A CN110426380A (en) | 2019-11-08 |
| CN110426380B true CN110426380B (en) | 2020-01-21 |
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| WO (1) | WO2021057032A1 (en) |
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| Publication number | Priority date | Publication date | Assignee | Title |
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| CN110426380B (en) * | 2019-09-29 | 2020-01-21 | 常州星宇车灯股份有限公司 | Transmission-type temperature-controllable testing device for laser-excited remote fluorescent material |
| CN111860987B (en) * | 2020-07-08 | 2024-05-31 | 江苏科慧半导体研究院有限公司 | Method and device for predicting emission spectrum of mixed fluorescent material |
| CN113848464B (en) * | 2021-11-25 | 2022-02-15 | 河北圣昊光电科技有限公司 | Chip double integrating sphere testing device and testing method |
Citations (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN101526465A (en) * | 2009-04-22 | 2009-09-09 | 天津大学 | Quick multi-wavelength tissue optical parameter measuring device and trans-construction method |
| CN201740737U (en) * | 2010-05-18 | 2011-02-09 | 中国计量学院 | Integrating sphere fluoroscopic detection device based on LED light source |
| CN105403548A (en) * | 2015-12-08 | 2016-03-16 | 厦门稀土材料研究所 | Temperature variable spectral measurement device |
| CN207198042U (en) * | 2017-08-28 | 2018-04-06 | 重庆光遥光电科技有限公司 | LD excites the test device of long-distance fluorescent powder in a kind of integrating sphere |
| CN110186889A (en) * | 2019-06-03 | 2019-08-30 | 常州星宇车灯股份有限公司 | Laser remote excitation test device and its test method |
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| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP6656210B2 (en) * | 2017-07-21 | 2020-03-04 | 株式会社日立ハイテクサイエンス | Spectrofluorometer |
| CN109540844B (en) * | 2018-11-06 | 2021-03-16 | 中国计量科学研究院 | Liquid scattering measurement device and measurement method thereof |
| CN110161010B (en) * | 2019-07-01 | 2021-10-08 | 河海大学常州校区 | Reflective temperature-controllable laser excitation remote fluorescent material testing device |
| CN110426380B (en) * | 2019-09-29 | 2020-01-21 | 常州星宇车灯股份有限公司 | Transmission-type temperature-controllable testing device for laser-excited remote fluorescent material |
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- 2019-09-29 CN CN201910929473.2A patent/CN110426380B/en active Active
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- 2020-05-07 WO PCT/CN2020/088858 patent/WO2021057032A1/en active Application Filing
Patent Citations (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN101526465A (en) * | 2009-04-22 | 2009-09-09 | 天津大学 | Quick multi-wavelength tissue optical parameter measuring device and trans-construction method |
| CN201740737U (en) * | 2010-05-18 | 2011-02-09 | 中国计量学院 | Integrating sphere fluoroscopic detection device based on LED light source |
| CN105403548A (en) * | 2015-12-08 | 2016-03-16 | 厦门稀土材料研究所 | Temperature variable spectral measurement device |
| CN207198042U (en) * | 2017-08-28 | 2018-04-06 | 重庆光遥光电科技有限公司 | LD excites the test device of long-distance fluorescent powder in a kind of integrating sphere |
| CN110186889A (en) * | 2019-06-03 | 2019-08-30 | 常州星宇车灯股份有限公司 | Laser remote excitation test device and its test method |
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| CN110426380A (en) | 2019-11-08 |
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