CN110161010B - Reflective temperature-controllable laser excitation remote fluorescent material testing device - Google Patents
Reflective temperature-controllable laser excitation remote fluorescent material testing device Download PDFInfo
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- CN110161010B CN110161010B CN201910585195.3A CN201910585195A CN110161010B CN 110161010 B CN110161010 B CN 110161010B CN 201910585195 A CN201910585195 A CN 201910585195A CN 110161010 B CN110161010 B CN 110161010B
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01M—TESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
- G01M11/00—Testing of optical apparatus; Testing structures by optical methods not otherwise provided for
- G01M11/02—Testing optical properties
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/62—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
- G01N21/63—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light optically excited
- G01N21/64—Fluorescence; Phosphorescence
- G01N21/6402—Atomic fluorescence; Laser induced fluorescence
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Abstract
The invention discloses a reflective temperature-controllable laser excitation remote fluorescent material testing device which comprises an optical platform, an integrating sphere, a spectrometer, a laser diode, a temperature control platform, a circular slide rail and a slide block, wherein the temperature control platform consists of a copper plate, a TEC (thermoelectric cooler), a radiator, a temperature sensor, a fan, a driving power supply, a lead and a temperature measuring instrument. During testing, the circular slide rail is placed on the right half part of the integrating sphere, the laser diode is placed on the sliding block, the angle between the laser diode and the fluorescent material is adjusted through the movement of the sliding block on the circular slide rail, light is irradiated to the temperature control platform for placing the fluorescent material through the laser diode, and reflected light inside the integrating sphere is collected through the spectrometer. When the fluorescent material needs to be heated, the temperature is raised by changing the current of the TEC, and the temperature of the surface of the copper plate is collected by a temperature measuring instrument; when the fluorescent material needs to be cooled, the temperature is reduced by changing the current of the TEC, and meanwhile, the fan is started to accelerate the cooling process, and the temperature of the surface of the copper plate is collected by the temperature measuring instrument.
Description
Technical Field
The invention belongs to the technical field of semiconductor laser testing, and particularly relates to a reflective temperature-controllable laser excitation remote fluorescent material testing device.
Background
The traditional semiconductor white light illumination mainly adopts a mode of matching a blue light LED chip with fluorescent powder, but along with the continuous rising of blue light power, the problems of heating and heat dissipation which become more serious have appeared. In recent years, with the development of laser diode technology, a light emitting scheme combining blue laser and a fluorescence conversion material appears in succession. As a new generation technology in the field of third generation semiconductor lighting, laser diode lighting has unique advantages over LED lighting: the LED lamp has the advantages of long service life, higher brightness, smaller volume, higher photoelectric conversion efficiency and longer irradiation distance. The device for exciting the remote fluorescent material by the laser can well measure parameters of reflectivity, transmissivity and collimation transmissivity and can simultaneously test the thermal stability phenomenon of the fluorescent material. However, there is no experimental device for such tests, so it is necessary to design a device capable of measuring the reflected light and testing the thermal stability of the fluorescent material.
Disclosure of Invention
The invention aims to solve the problems in the prior art, and provides a reflective temperature-controllable laser excitation remote fluorescent material testing device which is convenient and fast to operate and can realize the test of laser excitation remote fluorescent materials.
In order to achieve the purpose, the invention adopts the technical scheme that:
the utility model provides a long-range fluorescent material testing arrangement of controllable temperature laser excitation of reflective, the device includes integrating sphere, accuse temperature platform, optical platform, laser diode, spectrum appearance, circular slide rail and slider, the integrating sphere is placed on optical platform, circular slide rail is fixed in integrating sphere right side diameter department, laser diode passes through the slider and realizes the angle removal on circular slide rail, and light is shone by laser diode and is placed fluorescent material's accuse temperature platform, the inside reverberation of integrating sphere is gathered to the spectrum appearance.
Preferably, the temperature control platform is fixed on the optical platform through a threaded hole. The optical platform is set to be high in precision and the surface of the optical platform is provided with threaded holes with the same size.
Further, the integrating sphere is horizontally placed on the optical platform.
Further, the laser diode is arranged at the left end inside the integrating sphere.
Further, the spectrometer is connected with the integrating sphere.
Preferably, the temperature control platform is arranged on the left side of the integrating sphere, and one surface of the temperature control platform, on which the fluorescent material is arranged, is attached to the integrating sphere.
Preferably, the surfaces of the circular slide rail and the slide block are respectively coated with a layer of diffuse reflection material consistent with the inner wall of the integrating sphere.
Preferably, the temperature control platform is composed of a copper plate, a TEC (thermal electric Cooler), a heat sink, a temperature sensor, a fan, a driving power supply, a lead and a temperature measuring instrument.
Specifically, the driving power supply of the temperature control platform supplies power to the TEC. The temperature measuring instrument is used for collecting the temperature of the temperature sensor.
Preferably, the center of the copper plate is coated with heat conducting glue for fixing the fluorescent material.
Preferably, the temperature sensor is arranged on the surface of the copper plate.
Preferably, the fan is fixed at the left end of the temperature control platform. And when the temperature needs to be reduced, the fan is started.
Preferably, the copper plate is polished at the center so that the light is totally reflected inside the integrating sphere.
Compared with the prior art, the invention has the beneficial effects that: the device provided by the invention can collect reflected light in the integrating sphere under different angles by adjusting the angles of the laser diode and the fluorescent material in the test of laser-excited remote fluorescent material, thereby realizing the test of parameters such as reflectivity, transmissivity, collimation transmissivity and the like; in addition, the temperature of the fluorescent material is controlled through the temperature control platform, and the test of the thermal stability of the fluorescent material is realized.
Drawings
FIG. 1 is a three-dimensional view of a testing device of the present invention according to an embodiment;
FIG. 2 is a three-dimensional view of a temperature-controlled platen according to an embodiment of the present invention;
fig. 3 is a schematic view of the testing device of the present invention according to an embodiment.
Detailed Description
The technical solutions of the present invention will be described clearly and completely with reference to the accompanying drawings, and it is obvious that the described embodiments are only some embodiments of the present invention, not all embodiments. All other embodiments, which can be derived by a person skilled in the art from the embodiments given herein without making any creative effort, shall fall within the protection scope of the present invention.
As shown in fig. 1: a reflective temperature-controllable laser excitation remote fluorescent material testing device comprises an integrating sphere 1, a temperature control platform 2, an optical platform 3, a laser diode 4, a spectrometer 5, a circular slide rail 6 and a slide block 7. The integrating sphere 1 is placed on the optical platform 3, the temperature control platform 2 is fixed on the optical platform 3 through a threaded hole, the circular slide rail 6 is fixed at the right diameter of the integrating sphere 1, and the laser diode 4 moves on the circular slide rail 6 through the slide block 7. During testing, light irradiates the temperature control platform 2 for placing fluorescent materials through the laser diode 4, reflected light inside the integrating sphere 1 is collected through the spectrometer 5, and parameters such as reflectivity, transmissivity, collimation transmissivity and the like are measured; when the next angle is tested, the sliding block 7 is only required to be moved to drive the laser diode 4, so that the angle between the laser diode 4 and the fluorescent material can be shifted, the reflected light inside the integrating sphere 1 is collected by the spectrometer 5, and the measurement of parameters such as reflectivity, transmissivity, collimation transmissivity and the like under different angle shifts is realized.
As shown in fig. 2: temperature control platform 2 includes: the temperature measuring device comprises a temperature sensor 201, a temperature measuring instrument 202, a fluorescent material 203, a copper plate 204, a TEC 205, a heat radiator 206, a bracket 207, a fan 208, a lead 209 and a driving power supply 210. The fluorescent material 203 is coated with heat-conducting glue and fixed on the copper plate 204, the center of the copper plate 204 is polished, so that light is completely reflected inside the integrating sphere 1, during testing, laser excites the remote fluorescent material, the temperature control platform 2 can realize temperature control of the remote fluorescent material, when the fluorescent material needs to be heated, the driving power supply 210 acts on the TEC 205 to change the current of the TEC, the temperature of the copper plate 204 is raised, the temperature measuring instrument 202 collects the surface temperature of the copper plate 204 through the temperature sensor 201, when the collected temperature is lower than a set temperature, the driving power supply 210 continues to act on the TEC 205 to raise the temperature until the set temperature is reached, and when the collected temperature reaches the set temperature, the driving power supply 210 is closed; when the fluorescent material 203 needs to be cooled, the driving power supply 210 acts on the TEC 205 to change the current of the TEC 205, the copper plate 204 is cooled, the fan 208 is started to accelerate cooling of the heat sink 206, the temperature measuring instrument 202 collects the surface temperature of the copper plate 204 through the temperature sensor 201, when the collected temperature is higher than the set temperature, the driving power supply 210 continues to act on the TEC 205 while the fan 208 continues to work to cool until the set temperature is reached, and when the collected temperature reaches the set temperature, the driving power supply 210 is turned off. The temperature control platform 2 can realize temperature control on the fluorescent material, so that the thermal stability phenomenon of the fluorescent material can be evaluated.
As shown in fig. 3: the slider drives the laser diode to move on the circular slide rail, angle conversion is realized, light irradiates on the fluorescent material through the laser diode, the spectrometer collects light signals, reflected light inside the integrating sphere is obtained, and measurement of parameters such as reflectivity, transmissivity and collimation transmissivity under different angle deviations is realized.
As shown in fig. 3: when the fluorescent material needs to be heated, the PLC controls the triggering TEC to start, the driving power supply acts on the TEC to change the current of the TEC, the copper plate is heated, the temperature measuring instrument collects a thermal signal through the temperature sensor and collects the surface temperature of the copper plate, when the collected temperature is lower than the set temperature, the driving power supply continues to act on the TEC to heat until the set temperature is reached, and when the collected temperature reaches the set temperature, the driving power supply is closed; when the fluorescent material needs to be cooled, the PLC controls the triggering TEC to start, the driving power supply acts on the TEC to change the current of the TEC, the copper plate is cooled, the fan is started to accelerate cooling of the radiator, the temperature measuring instrument collects the surface temperature of the copper plate through the temperature sensor, when the collected temperature is higher than the set temperature, the driving power supply continues to act on the TEC and the fan continues to work to cool until the set temperature is reached, and when the collected temperature reaches the set temperature, the driving power supply is turned off. The temperature control platform can realize temperature control on the fluorescent material, so that the thermal stability phenomenon of the fluorescent material is evaluated. Wherein, the driving power supply is a voltage-stabilizing direct-current power supply.
The invention relates to a reflective temperature-controllable laser excitation remote fluorescent material testing device which mainly comprises an optical platform, an integrating sphere, a spectrometer, a laser diode, a temperature control platform, a circular slide rail and a slide block. The temperature control platform consists of a copper plate, a TEC, a radiator, a temperature sensor, a fan, a driving power supply, a lead and a temperature measuring instrument. During testing, the circular slide rail is placed on the right half part of the integrating sphere, the laser diode is placed on the sliding block, and the angle between the laser diode and the fluorescent material is adjusted by moving the sliding block on the circular slide rail. The light is irradiated to the temperature control platform for placing the fluorescent material by the laser diode, and the reflected light inside the integrating sphere is collected by the spectrometer. When the fluorescent material needs to be heated, the temperature is raised by changing the current of the TEC, and the temperature of the surface of the copper plate is collected by a temperature measuring instrument; when the fluorescent material needs to be cooled, the temperature is reduced by changing the current of the TEC, and meanwhile, the fan is started to accelerate the cooling process, and the temperature of the surface of the copper plate is collected by the temperature measuring instrument. The invention not only can collect the reflected light of the laser excited remote fluorescent material by adjusting the angle between the laser diode and the fluorescent material, but also can carry out temperature control treatment on the fluorescent material and evaluate the thermal stability performance of the fluorescent material.
Although embodiments of the present invention have been shown and described, it will be appreciated by those skilled in the art that changes, modifications, substitutions and alterations can be made in these embodiments without departing from the principles and spirit of the invention, the scope of which is defined in the appended claims and their equivalents.
Claims (6)
1. The utility model provides a long-range fluorescent material testing arrangement of controllable temperature laser excitation of reflective which characterized in that: the device comprises an integrating sphere, a temperature control platform, an optical platform, a laser diode, a spectrometer, a circular slide rail and a slide block, wherein the integrating sphere is placed on the optical platform, the circular slide rail is fixed at the diameter of the right side of the integrating sphere, the laser diode realizes angular movement on the circular slide rail through the slide block, light is irradiated to the temperature control platform on which a fluorescent material is placed by the laser diode, and the spectrometer collects reflected light inside the integrating sphere; the temperature control platform is fixed on the optical platform through a threaded hole; the temperature control platform is arranged on the left side of the integrating sphere, and one side of the temperature control platform, on which the fluorescent material is arranged, is attached to the integrating sphere; and the surfaces of the circular slide rail and the slide block are respectively coated with a layer of diffuse reflection material consistent with the inner wall of the integrating sphere.
2. The device for testing the reflective controllable-temperature laser-excited remote fluorescent material according to claim 1, wherein: the temperature control platform consists of a copper plate, a TEC, a radiator, a temperature sensor, a fan, a driving power supply, a lead and a temperature measuring instrument.
3. The device for testing the reflective controllable-temperature laser-excited remote fluorescent material according to claim 2, wherein: and the center of the copper plate is coated with heat-conducting glue for fixing the fluorescent material.
4. The device for testing the reflective controllable-temperature laser-excited remote fluorescent material according to claim 2, wherein: the temperature sensor is arranged on the surface of the copper plate.
5. The device for testing the reflective controllable-temperature laser-excited remote fluorescent material according to claim 2, wherein: the fan is fixed at the left end of the temperature control platform.
6. The device for testing the reflective controllable-temperature laser-excited remote fluorescent material according to claim 2, wherein: the center of the copper plate is polished, so that light is completely reflected inside the integrating sphere.
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| CN110426380B (en) * | 2019-09-29 | 2020-01-21 | 常州星宇车灯股份有限公司 | Transmission-type temperature-controllable testing device for laser-excited remote fluorescent material |
| CN112763189A (en) * | 2020-12-24 | 2021-05-07 | 松山湖材料实验室 | Measuring device for EBCMOS resolution parameter |
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