CN201110883Y - Semiconductor lighting device thermal performance measuring apparatus - Google Patents
Semiconductor lighting device thermal performance measuring apparatus Download PDFInfo
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- CN201110883Y CN201110883Y CNU2007203030127U CN200720303012U CN201110883Y CN 201110883 Y CN201110883 Y CN 201110883Y CN U2007203030127 U CNU2007203030127 U CN U2007203030127U CN 200720303012 U CN200720303012 U CN 200720303012U CN 201110883 Y CN201110883 Y CN 201110883Y
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Abstract
The utility model relates to a thermal performance measuring device for semiconductor light-emitting devices, which is used to measure the junction temperature, the thermal resistance and other thermal performance parameters of semiconductor light-emitting devices. The utility model works with a device to be tested and comprises an optical measuring device, a temperature control device, as well as an electric drive and a measuring circuit which are electrically connected with the optical measuring device and the temperature control device; the optical measuring device and the temperature control device are arranged on top and bottom respectively; the electric drive and the measuring circuit can be electrically connected with the device to be tested. The thermal performance measuring device of the utility model has the advantages that firstly, as the optical measuring device and the temperature control device are arranged on top and bottom respectively, when the semiconductor light-emitting device is positioned on or taken from the devices, the relative positions of the optical measuring device and the temperature control device can be adjusted and the operation is simple and convenient; secondly, a photoelectric measuring instrument can accurately measure the values of photometry and radiometry and other optical parameters; thirdly, a radiator has rational structure and good convection environment during working, as well as god heat radiation effect; fourthly, a positioning measuring device is arranged to detect the relative positions of the optical measuring device and the temperature control device so as to avoid abnormal operations.
Description
[affiliated technical field]
The utility model relates to a kind of measurement mechanism, relates in particular to a kind of heat performance measuring apparatus of semiconductor lighting device that is used to measure thermal behavior parameters such as light emitting semiconductor device junction temperature and thermal resistance.
[background technology]
Junction temperature and thermal resistance are to weigh one of light emitting semiconductor device and the most important performance index of application product.The core of light emitting semiconductor device is a PN junction, and junction temperature is meant the temperature of PN junction, and thermal resistance is meant the ratio of temperature difference with the thermal power of dissipation of point-to-point transmission, and it mainly is to measure the thermal resistance of PN junction to shell that the thermal behavior of light emitting semiconductor device is measured.PN junction is positioned at the inside of light emitting semiconductor device, can't directly measure its temperature with temp probe, also can't record thermal resistance.Therefore, the general at present junction temperature that adopts indirect test method measuring semiconductor luminescent device utilizes junction temperature, thermal power, reference point temperature to obtain the thermal resistance of PN junction to reference point then.The method of measuring semiconductor luminescent device junction temperature mainly contains at present: blue Bai Bifa, infrared thermal imagery method, electrometric method.
Blue Bai Bifa utilizes the blue light emitting of light emitting semiconductor device and light-emitting phosphor to determine junction temperature with the inconsistent of variations injunction temperature, and the power that is defined as whole white light in the spectrum is W, and B is the power of blue light part, and ratio R=W/B should be the function of junction temperature so.Lan Bai is the globality that does not need to destroy device than method biggest advantage, is a kind of non-contacting junction temperature measurement method, but blue Bai Bifa can only be used to test the LED that blue chip excites, and can not test all light emitting semiconductor devices.Lan Bai than method mainly based on optical measurement instrument.
The infrared thermal imagery method adopts infrared imaging device measuring junction temperature to distribute, and convenient test is quick, but measuring accuracy is not high.
Electrometric method is to utilize the semiconductor devices junction temperature to become the principle of fixed relationship with junction voltage, records junction temperature by the semiconductor test junction voltage.But traditional measurement mechanism based on electrometric method can only be tested electrical quantity, does not comprise optical measurement instrument.But light emitting semiconductor device is different from general semiconductor devices, except heating, light emitting semiconductor device is also luminous, the electric power part of input is transformed into thermal power, another part has been transformed into the luminous power of output, therefore, the thermal behavior of correct measurement light emitting semiconductor device, must increase optical measurement instrument and measure the luminous power of its output.
[summary of the invention]
The purpose of this utility model is to provide a kind of heat performance measuring apparatus of semiconductor lighting device that can accurately measure the light emitting semiconductor device thermal behavior, optical measurement instrument on this device, attemperating unit, electricity drive and metering circuit is integrated into an assembly of devices, compact conformation, and can measure each required parameter simultaneously, it is accurately convenient to measure, it is bigger to solve the measuring error that prior art exists, and the device of measuring each parameter is scattered, and operation is the problem of facility etc. very not.
The technical scheme that the prior art problem that solves the utility model is adopted is: heat performance measuring apparatus of semiconductor lighting device, it can match with test specimen, it is characterized in that it comprises optical measurement instrument and attemperating unit, the electricity that is electrically connected with optical measurement instrument, attemperating unit drives, metering circuit, described optical measurement instrument and attemperating unit are up and down to be arranged, described electricity drives, metering circuit can be electrically connected with test specimen.Optical measurement instrument and attemperating unit are up and down to be arranged, when test specimen (light emitting semiconductor device) is installed, adjusts the relative position relation of attemperating unit and optical measurement instrument, can directly install, simple to operation; When measuring test specimen, attemperating unit makes test specimen be in relative temperature constant state, reduces measuring error, the accuracy that helps measuring; Electricity drives and metering circuit is lighted test specimen and tested test specimen electrical quantity and thermal behavior parameter, optical measurement instrument is measured the optical parameters such as luminous power of test specimen.
As the further of technique scheme improved and replenish, the utility model adopts following technical measures:
Described attemperating unit comprises heating radiator, the temperature regulator that matches with heating radiator, the constant temperature seat that matches with temperature regulator, signals collecting end on the temperature sensor can directly be connected with the test specimen housing on being placed on the constant temperature seat, perhaps be connected with the constant temperature seat, signal output part drives with electricity and is connected with metering circuit, the exposed part of described constant temperature seat and temperature regulator is coated with thermofin, has test specimen on this thermofin and places mouth.Temperature sensor is used for measuring the temperature of constant temperature seat or test specimen base shell, and when the temperature that records was lower than the target temperature of setting, temperature regulator work was in heated condition, thereby improves the temperature of constant temperature seat and test specimen, makes its temperature that makes it; Otherwise when the temperature that records was higher than the target temperature of setting, temperature regulator work was in refrigerating state, thereby reduced the temperature of constant temperature seat and test specimen, made its temperature that makes it.In brief, attemperating unit makes test specimen be in relative temperature constant state all the time, and test result is accurate.
Described optical measurement instrument comprises light-measuring integrating sphere, the light detection device that matches with light-measuring integrating sphere, having printing opacity on the wall body of described light-measuring integrating sphere surveys mounting hole and is subjected to unthreaded hole, described printing opacity is surveyed mounting hole and is matched with light detection device, and the described position that is provided with of unthreaded hole that is subjected to can be corresponding with test specimen.Integrating sphere is made up of two hemisphere up and down, and seam is in horizontal direction or tilts from the horizontal by 45 degree is good, drops on seam crossing and influences the accuracy of measurement with the luminescent center of avoiding test specimen.Light detection device and being installed on the light-measuring integrating sphere that printing opacity detection mounting hole matches, and be subjected to the position that is provided with of unthreaded hole can be corresponding with test specimen, purpose is to receive smoothly tested light emitting semiconductor device and injects the interior light of light-measuring integrating sphere, and analyzes.
The inside of described light-measuring integrating sphere is provided with the auxiliary light emission body, inwall is covered with the diffuse-reflective material layer, described light detection device comprises light conducting piece, the photoelectric measuring instrument that is connected with the light outlet end of light conducting piece, described smooth conducting piece is optical fiber or light conducting cylinder, its light receiving end is surveyed mounting hole with printing opacity and is connected on the light-measuring integrating sphere with matching, enter photoelectric measuring instrument from the light of integrating sphere side-wall hole outgoing through the light conduction device, described auxiliary light emission body can be opened and closed by the switch control of being located at the light-measuring integrating sphere outside.The light conducting piece is surveyed mounting hole with printing opacity and is matched, and can smoothly the light in the light-measuring integrating sphere be sent on the photoelectric measuring instrument and analyze.
Heat performance measuring apparatus of semiconductor lighting device also comprises translation stage and pedestal, described optical measurement instrument is arranged on the translation stage, described translation stage comprises the driving guide rail that matches with pedestal, the guide rail sliding sleeve that cooperates with the driving guide rail, link with guide rail sliding sleeve Joint, described light-measuring integrating sphere is fixed on the link, and described translation stage can move up and down by motor or manual control.Drive guide rail and can be drive screw.When on the constant temperature seat, placing test specimen, mobile optical measurement instrument, make the certain space of formation between integrating sphere and the attemperating unit, the convenient test specimen of placing, after the placement action was finished, mobile optical measurement instrument made integrating sphere closely contact with attemperating unit, when the test specimen electrified light emitting, the light that is sent is all injected in the integrating sphere.
Heat performance measuring apparatus of semiconductor lighting device also comprises translation stage and pedestal, described attemperating unit is arranged on the translation stage, described translation stage comprises the driving guide rail that matches with pedestal, the guide rail sliding sleeve that cooperates with the driving guide rail, link with guide rail sliding sleeve Joint, described attemperating unit is arranged on the link, and translation stage can move up and down by motor or manual control.This scheme is the another kind of scheme of the relative position of adjusting optical measurement instrument and attemperating unit.When on the constant temperature seat, placing test specimen, mobile attemperating unit, make the certain space of formation between integrating sphere and the attemperating unit, the convenient test specimen of placing, after the placement action was finished, mobile attemperating unit made integrating sphere closely contact with attemperating unit, when the test specimen electrified light emitting, the light that is sent is all injected in the integrating sphere.
Described translation stage is provided with positioning measuring device.Be used to detect the relative position of optical measurement instrument and attemperating unit.When attemperating unit closely contacted with optical measurement instrument, positioning measuring device restriction optical measurement instrument and attemperating unit continued to do near motion; When attemperating unit and optical measurement instrument relative distance reached maximum, positioning measuring device restriction optical measurement instrument and attemperating unit continued to do disengaging movement.
At least the end at described heating radiator is provided with the thermal convection fan, forms the heatsink transverse mode, makes the radiating airflow cross flow.The thermal convection fan can be set in the one or both ends of heating radiator, and being provided with to be beneficial to of heating radiator carried out good heat radiation to attemperating unit, helps attemperating unit and works smoothly.Position relation is set forms good convection environment, the raising radiating effect of radiator fan and heating radiator.
The inside of described light-measuring integrating sphere is provided with the auxiliary light emission body, and this auxiliary light emission body can be opened and closed by the switch control of being located at the light-measuring integrating sphere outside.The auxiliary light emission body can be bulb, auxiliary lamp when being test light power, be used to revise measured device and be light emitting semiconductor device the absorption difference of light is caused influence of measurement error, whether luminous it can be according to actual needs regulate brightness and state such as by gauge tap.
Described photoelectric measuring instrument comprises the spectral radiant emittance meter, integrating photometer or light power meter.Spectral radiant emittance meter, integrating photometer or light power meter all have data processing equipments such as computing machine to be connected respectively.Integrating photometer or light power meter can be the photometer or the light power meters of band silicon photodiode detector.Even under the unmatched situation of spectral response, photoelectric measuring instrument is accurate optical parameters such as measuring light tolerance, radiometric quantities also, have avoided carrying out the processing of spectral response coupling.
The beneficial effect that the utlity model has: 1, optical measurement instrument on this device and attemperating unit are layout up and down, when on device, picking and placeing light emitting semiconductor device, and scalable optical measurement instrument and attemperating unit relative position, simple to operation; 2, do not needing to carry out under the situation of spectral response coupling optical parameters such as the accurate measuring light tolerance of photoelectric measuring instrument energy, radiometric quantities; 3, heating radiator is rational in infrastructure, and convection environment is good during work, good heat dissipation effect; 4, be provided with positioning measuring device, be used to detect the relative position of optical measurement instrument and attemperating unit, avoid the appearance of operation exception phenomenon.
[description of drawings]
Fig. 1 is a kind of structural representation of the present utility model;
Fig. 2 is an another kind of structural representation of the present utility model;
Fig. 3 is a kind of structural representation of attemperating unit among Fig. 1 or Fig. 2.
Among the figure: the 1-1. heating radiator; 1-2. temperature regulator; 1-3. temperature sensor; 1-4. constant temperature seat; 1-5. thermofin; 2. electricity driving, metering circuit; 3-1. integrating sphere; 3-21. light conduction device; 3-22. photoelectric measuring instrument; 4. test specimen; 5. radiator fan; 6-1. link, 6-2. guide rail sliding sleeve, 6-3. drives guide rail; 7. auxiliary light emission body; 8. pedestal; 9. printing opacity is surveyed mounting hole; 10. be subjected to unthreaded hole; 11. locating device.
[embodiment]
Below in conjunction with the drawings and specific embodiments the utility model is further described.
Embodiment 1: heat performance measuring apparatus of semiconductor lighting device, as shown in figures 1 and 3, it comprises pedestal 8, be located at optical measurement instrument and attemperating unit on the pedestal 8, the electricity that is electrically connected with optical measurement instrument, attemperating unit drives, metering circuit, optical measurement instrument and attemperating unit are up and down to be arranged, electricity drives, metering circuit can be electrically connected with test specimen 4.
Optical measurement instrument comprises light-measuring integrating sphere 3-1, the light detection device that matches with light-measuring integrating sphere 3-1, be located at the auxiliary light emission body 7 in the light-measuring integrating sphere 3-1, have printing opacity on the sidewall of light-measuring integrating sphere 3-1 and survey mounting hole 9, have on the wall body of below and be subjected to unthreaded hole 10, printing opacity is surveyed mounting hole 9 and is matched with light detection device, is subjected to the position that is provided with of unthreaded hole 10 can be corresponding with test specimen 4.Light-measuring integrating sphere 3-1 inwall is covered with the diffuse-reflective material layer, light detection device comprises light conducting piece 3-21, the photoelectric measuring instrument 3-22 that is connected with the light outlet end of light conducting piece 3-21, light conducting piece 3-21 is optical fiber or light conducting cylinder, its light receiving end and being connected on the light-measuring integrating sphere 3-1 that printing opacity detection mounting hole 9 matches, enter photoelectric measuring instrument 3-22 from the light of integrating sphere side-wall hole outgoing through light conduction device 3-21, auxiliary light emission body 7 can be opened and closed by the switch control of being located at light-measuring integrating sphere 3-1 outside.Auxiliary light emission body 7 can be common bulb, and the absorption difference that is used to revise 4 pairs of light of test specimen causes influence of measurement error and proofreaies and correct photoelectric measuring instrument 3-22.Photoelectric measuring instrument comprises the spectral radiant emittance meter, integrating photometer or light power meter.Spectral radiant emittance meter, integrating photometer or light power meter all have data processing equipments such as computing machine to be connected respectively.Integrating photometer or light power meter can be the photometer or the light power meters of band silicon photodiode detector.The structure of photoelectric measuring instrument accurate optical parameters such as measuring light tolerance, radiometric quantities just under the situation that need not to carry out the spectral response coupling.
Attemperating unit comprises heating radiator 1-1, temperature sensor 1-3, the temperature regulator 1-2 that matches with heating radiator 1-1, the constant temperature seat 1-4 that matches with temperature regulator 1-2, signals collecting end on the temperature sensor 1-3 can directly be connected with constant temperature seat 1-4 or test specimen 4 housings that are placed on the constant temperature seat 1-4, signal output part drives with electricity, metering circuit 2 is connected, the exposed part of constant temperature seat 1-4 and temperature regulator 1-2 is coated with thermofin 1-5, has test specimen on this thermofin 1-5 and places mouth.Heating radiator 1-1 is provided with a plurality of horizontal radiating grooves, is provided with thermal convection fan 5 at the two ends of radiating groove, forms the heatsink transverse mode, makes the radiating airflow cross flow.
Optical measurement instrument is arranged on the translation stage, described translation stage comprises the driving guide rail 6-3 (as drive screw) that matches with pedestal 8, the guide rail sliding sleeve 6-2 that cooperates with driving guide rail 6-3, link 6-1 with guide rail sliding sleeve 6-2 Joint, described light-measuring integrating sphere 3-1 is fixed on the link 6-1, and described translation stage can move up and down by motor or manual control.Positioning measuring device 11 is installed on the translation stage, is used to detect the relative position of optical measurement instrument and attemperating unit.
During use, test specimen 4 (being light emitting semiconductor device, as the LED lamp) is installed on the constant temperature seat 1-4, and is electrically connected with electricity driving, metering circuit, to test specimen 4 power supplies, makes it luminous, and at this moment, metering circuit can be measured the electrical quantity on the test specimen 4.Temperature sensor is used for measuring the temperature of test specimen 4, when the temperature that records was lower than the target temperature of setting, electricity drove, metering circuit control temperature regulator heats constant temperature seat 1-4, thereby test specimen 4 is heated, temperature improves, and temperature makes it; Otherwise when the temperature that records was higher than the target temperature of setting, electricity drove, metering circuit control temperature regulator freezes to constant temperature seat 1-4, thereby test specimen 4 temperature are reduced, the temperature that makes it, and test specimen 4 is in the state of relative constant temperature all the time.In the photo measure process, be subjected to unthreaded hole 10 and constant temperature seat 1-4 on the wall body of integrating sphere 3-1 below closely cooperate, the light that tested sample 4 is sent is all injected in the light-measuring integrating sphere by being subjected to unthreaded hole 10, after the reflection by the light-measuring integrating sphere inwall, by the light conduction device that matches with printing opacity detection mounting hole light is sent on the photoelectric measuring instrument again light is analyzed, obtain luminous power, by calculating thermal power, utilize voltage parameter to calculate junction temperature, utilize junction temperature, the gentle thermal power of shell to calculate thermal resistance.
Embodiment 2: heat performance measuring apparatus of semiconductor lighting device, as shown in Figure 2, attemperating unit is arranged on the translation stage, described translation stage comprises the driving guide rail 6-3 that matches with pedestal 8, the guide rail sliding sleeve 6-2 that cooperates with driving guide rail 6-3, with the link 6-1 of guide rail sliding sleeve 6-2 Joint, described attemperating unit is arranged on the link 6-1, and translation stage can move up and down by motor or manual control.
Claims (10)
1. heat performance measuring apparatus of semiconductor lighting device, it can match with test specimen (4), it is characterized in that it comprises optical measurement instrument and attemperating unit, the electricity that is electrically connected with optical measurement instrument, attemperating unit drives, metering circuit, described optical measurement instrument and attemperating unit are up and down to be arranged, described electricity drives, metering circuit can be electrically connected with test specimen (4).
2. heat performance measuring apparatus of semiconductor lighting device according to claim 1, it is characterized in that described attemperating unit comprises heating radiator (1-1), the temperature regulator (1-2) that matches with heating radiator (1-1), the constant temperature seat (1-4) that matches with temperature regulator (1-2), signals collecting end on the temperature sensor (1-3) can directly be connected with test specimen (4) housing on being placed on constant temperature seat (1-4), perhaps be connected with constant temperature seat (1-4), signal output part drives with electricity, metering circuit (2) is connected, the exposed part of described constant temperature seat (1-4) and temperature regulator (1-2) is coated with thermofin (1-5), has test specimen (4) on this thermofin (1-5) and places mouth.
3. heat performance measuring apparatus of semiconductor lighting device according to claim 1 and 2, it is characterized in that described optical measurement instrument comprises light-measuring integrating sphere (3-1), the light detection device that matches with light-measuring integrating sphere (3-1), having printing opacity on the wall body of described light-measuring integrating sphere (3-1) surveys mounting hole (9) and is subjected to unthreaded hole (10), described printing opacity is surveyed mounting hole (9) and is matched with light detection device, and the described position that is provided with of unthreaded hole (10) that is subjected to can be corresponding with test specimen (4).
4. light emitting semiconductor device thermal behavior parameter measuring apparatus according to claim 3, the inwall that it is characterized in that described light-measuring integrating sphere (3-1) is covered with the diffuse-reflective material layer, described light detection device comprises light conducting piece (3-21), the photoelectric measuring instrument (3-22) that is connected with the light outlet end of light conducting piece (3-21), described smooth conducting piece (3-21) is optical fiber or light conducting cylinder, its light receiving end and printing opacity are surveyed mounting hole (9) and are connected on the light-measuring integrating sphere (3-1) with matching, enter photoelectric measuring instrument (3-22) from the light of integrating sphere side-wall hole outgoing through light conduction device (3-21).
5. light emitting semiconductor device thermal behavior parameter measuring apparatus according to claim 4, it is characterized in that heat performance measuring apparatus of semiconductor lighting device also comprises translation stage, described optical measurement instrument is arranged on the translation stage, described translation stage comprises the driving guide rail (6-3) that matches with pedestal (8), the guide rail sliding sleeve (6-2) that cooperates with driving guide rail (6-3), link (6-1) with guide rail sliding sleeve (6-2) Joint, described light-measuring integrating sphere (3-1) is fixed on the link (6-1), and described translation stage can move up and down by motor or manual control.
6. light emitting semiconductor device thermal behavior parameter measuring apparatus according to claim 4, it is characterized in that heat performance measuring apparatus of semiconductor lighting device also comprises translation stage, described attemperating unit is arranged on the translation stage, described translation stage comprises the driving guide rail (6-3) that matches with pedestal (8), the guide rail sliding sleeve (6-2) that cooperates with driving guide rail (6-3), link (6-1) with guide rail sliding sleeve (6-2) Joint, described attemperating unit is arranged on the link (6-1), and translation stage can move up and down by motor or manual control.
7. according to claim 5 or 6 described light emitting semiconductor device thermal behavior parameter measuring apparatus, it is characterized in that described translation stage is provided with positioning measuring device (11).
8. light emitting semiconductor device thermal behavior parameter measuring apparatus according to claim 7 is characterized in that at least being provided with thermal convection fan (5) at an end of described heating radiator (1-1), forms the heatsink transverse mode, makes the radiating airflow cross flow.
9. light emitting semiconductor device thermal behavior parameter measuring apparatus according to claim 8, the inside that it is characterized in that described light-measuring integrating sphere (3-1) is provided with auxiliary light emission body (7), and this auxiliary light emission body (7) can open and close by being located at the outside switch control of light-measuring integrating sphere (3-1).
10. light emitting semiconductor device thermal behavior parameter measuring apparatus according to claim 9 is characterized in that described photoelectric measuring instrument (3-22) comprises the spectral radiant emittance meter, integrating photometer or light power meter.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CNU2007203030127U CN201110883Y (en) | 2007-12-05 | 2007-12-05 | Semiconductor lighting device thermal performance measuring apparatus |
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| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CNU2007203030127U CN201110883Y (en) | 2007-12-05 | 2007-12-05 | Semiconductor lighting device thermal performance measuring apparatus |
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| CN201110883Y true CN201110883Y (en) | 2008-09-03 |
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| CNU2007203030127U Expired - Lifetime CN201110883Y (en) | 2007-12-05 | 2007-12-05 | Semiconductor lighting device thermal performance measuring apparatus |
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Cited By (6)
| Publication number | Priority date | Publication date | Assignee | Title |
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| CN105403548A (en) * | 2015-12-08 | 2016-03-16 | 厦门稀土材料研究所 | Temperature variable spectral measurement device |
| CN106949410A (en) * | 2017-05-18 | 2017-07-14 | 信利光电股份有限公司 | A kind of light supply apparatus |
| CN107478966A (en) * | 2017-07-26 | 2017-12-15 | 国网上海市电力公司 | A kind of partial-discharge measuring device and measuring method using integration photometry |
| CN108132552A (en) * | 2018-02-09 | 2018-06-08 | 国网江苏省电力有限公司电力科学研究院 | A kind of Online and how to use test device of liquid crystal display device temperature performance |
| CN109297687A (en) * | 2018-11-27 | 2019-02-01 | 上海应用技术大学 | LED light system for detecting electrical property and detection method |
| CN110178039A (en) * | 2017-01-13 | 2019-08-27 | 赫普塔冈微光有限公司 | The method of equipment and the operation equipment for testing photoelectronic device |
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2007
- 2007-12-05 CN CNU2007203030127U patent/CN201110883Y/en not_active Expired - Lifetime
Cited By (8)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN105403548A (en) * | 2015-12-08 | 2016-03-16 | 厦门稀土材料研究所 | Temperature variable spectral measurement device |
| CN110178039A (en) * | 2017-01-13 | 2019-08-27 | 赫普塔冈微光有限公司 | The method of equipment and the operation equipment for testing photoelectronic device |
| CN110178039B (en) * | 2017-01-13 | 2021-10-26 | 赫普塔冈微光有限公司 | Apparatus for testing optoelectronic devices and method of operating the same |
| CN106949410A (en) * | 2017-05-18 | 2017-07-14 | 信利光电股份有限公司 | A kind of light supply apparatus |
| CN107478966A (en) * | 2017-07-26 | 2017-12-15 | 国网上海市电力公司 | A kind of partial-discharge measuring device and measuring method using integration photometry |
| CN108132552A (en) * | 2018-02-09 | 2018-06-08 | 国网江苏省电力有限公司电力科学研究院 | A kind of Online and how to use test device of liquid crystal display device temperature performance |
| CN108132552B (en) * | 2018-02-09 | 2023-11-24 | 国网江苏省电力有限公司电力科学研究院 | Online testing device for temperature performance of liquid crystal display device and using method |
| CN109297687A (en) * | 2018-11-27 | 2019-02-01 | 上海应用技术大学 | LED light system for detecting electrical property and detection method |
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